KR960024304U - 인쇄회로기판 검사시스템의 구동테이블 장치 - Google Patents

인쇄회로기판 검사시스템의 구동테이블 장치

Info

Publication number
KR960024304U
KR960024304U KR2019940039018U KR19940039018U KR960024304U KR 960024304 U KR960024304 U KR 960024304U KR 2019940039018 U KR2019940039018 U KR 2019940039018U KR 19940039018 U KR19940039018 U KR 19940039018U KR 960024304 U KR960024304 U KR 960024304U
Authority
KR
South Korea
Prior art keywords
circuit board
printed circuit
inspection system
table device
board inspection
Prior art date
Application number
KR2019940039018U
Other languages
English (en)
Other versions
KR0127804Y1 (ko
Inventor
강성택
Original Assignee
김정덕
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김정덕 filed Critical 김정덕
Priority to KR2019940039018U priority Critical patent/KR0127804Y1/ko
Publication of KR960024304U publication Critical patent/KR960024304U/ko
Application granted granted Critical
Publication of KR0127804Y1 publication Critical patent/KR0127804Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR2019940039018U 1994-12-30 1994-12-30 인쇄회로기판 검사시스템의 구동테이블 장치 KR0127804Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940039018U KR0127804Y1 (ko) 1994-12-30 1994-12-30 인쇄회로기판 검사시스템의 구동테이블 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940039018U KR0127804Y1 (ko) 1994-12-30 1994-12-30 인쇄회로기판 검사시스템의 구동테이블 장치

Publications (2)

Publication Number Publication Date
KR960024304U true KR960024304U (ko) 1996-07-22
KR0127804Y1 KR0127804Y1 (ko) 1999-03-20

Family

ID=19405223

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940039018U KR0127804Y1 (ko) 1994-12-30 1994-12-30 인쇄회로기판 검사시스템의 구동테이블 장치

Country Status (1)

Country Link
KR (1) KR0127804Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100702945B1 (ko) * 2000-11-07 2007-04-03 삼성테크윈 주식회사 테이프 피이더용 인식 장치

Also Published As

Publication number Publication date
KR0127804Y1 (ko) 1999-03-20

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee