KR960008556B1 - Contact forming method - Google Patents
Contact forming method Download PDFInfo
- Publication number
- KR960008556B1 KR960008556B1 KR93007494A KR930007494A KR960008556B1 KR 960008556 B1 KR960008556 B1 KR 960008556B1 KR 93007494 A KR93007494 A KR 93007494A KR 930007494 A KR930007494 A KR 930007494A KR 960008556 B1 KR960008556 B1 KR 960008556B1
- Authority
- KR
- South Korea
- Prior art keywords
- forming
- depositing
- metal
- thin film
- forming method
- Prior art date
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- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
forming a contact hole by etching an oxide (3) film after forming a junction part (2) and depositing the oxide film (3) on the silicon substrate (1); forming a metal oxide layer (6) after forming Ti (4) and metal thin film (5) for diffusion protection; forming a metal thin film (10) by depositing fire-proof metal after depositing and annealing a metal thin film (7), and depositing an alumina alloy (9) on a metal oxide layer (8).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR93007494A KR960008556B1 (en) | 1993-04-30 | 1993-04-30 | Contact forming method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR93007494A KR960008556B1 (en) | 1993-04-30 | 1993-04-30 | Contact forming method |
Publications (1)
Publication Number | Publication Date |
---|---|
KR960008556B1 true KR960008556B1 (en) | 1996-06-28 |
Family
ID=19354799
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR93007494A KR960008556B1 (en) | 1993-04-30 | 1993-04-30 | Contact forming method |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960008556B1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6955983B2 (en) | 2002-05-30 | 2005-10-18 | Samsung Electronics Co., Ltd. | Methods of forming metal interconnections of semiconductor devices by treating a barrier metal layer |
-
1993
- 1993-04-30 KR KR93007494A patent/KR960008556B1/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6955983B2 (en) | 2002-05-30 | 2005-10-18 | Samsung Electronics Co., Ltd. | Methods of forming metal interconnections of semiconductor devices by treating a barrier metal layer |
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E701 | Decision to grant or registration of patent right | ||
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Payment date: 20090526 Year of fee payment: 14 |
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LAPS | Lapse due to unpaid annual fee |