KR960007149Y1 - Lead inferior device selecting apparatus - Google Patents
Lead inferior device selecting apparatus Download PDFInfo
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- KR960007149Y1 KR960007149Y1 KR2019930008458U KR930008458U KR960007149Y1 KR 960007149 Y1 KR960007149 Y1 KR 960007149Y1 KR 2019930008458 U KR2019930008458 U KR 2019930008458U KR 930008458 U KR930008458 U KR 930008458U KR 960007149 Y1 KR960007149 Y1 KR 960007149Y1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67271—Sorting devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67706—Mechanical details, e.g. roller, belt
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Abstract
내용 없음No content
Description
제1도는 본 고안 장치를 나타낸 평면도1 is a plan view showing the device of the present invention
제2도는 제1도의 평면도2 is a plan view of FIG.
* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings
3 : 디바이스3a : 리드3: device 3a: lead
4a : 제1송출트랙4b : 제2송출트랙4a: 1st delivery track 4b: 2nd delivery track
8 : 회전판11 : 램프8: rotating plate 11: lamp
12 : 카메라13 : 가동트랙12: camera 13: movable track
14 : 가동실린더16 : 취출트랙14: operation cylinder 16: take-out track
본 고안은 생산완료된 디바이스를 양품과 불량품으로 분류하는 분류기에 관한 것으로서, 좀더 구체적으로는 테스트완료된 디바이스의 언로딩시 디바이스의 리드불량(변형)여부를 동시에 검사하여 리드가 변형된 디바이스를 선별해 내는 분류기의 리드불량 디바이스 취출장치에 관한 것이다.The present invention relates to a classifier that classifies a finished device into good and bad. More specifically, it checks whether a device has a lead defect (deformation) at the same time of unloading a tested device and selects a device whose lead is deformed. A device for taking out a defective device of a classifier.
종래에는 디바이스의 소자특성, 즉 성능검사를 하기 위해 분류기의 로딩부에 디바이스가 담긴 슬리이브를 적재시켜 놓으면 상기 슬리이브에 담긴 디바이스가 순차적으로 테스터부로 이송되어 테스트완료한 다음, 테스트결과에 따라 분류되어 언로딩부의 빈슬리이브에 담기게 된다.Conventionally, when a device containing a device is loaded in the loading part of the classifier for the device characteristic, that is, the performance test, the device contained in the sleeve is sequentially transferred to the tester to complete the test, and then classified according to the test result. It is put in the empty sleeve of the unloading part.
이와같이 분류된 디바이스 중 양품의 디바이스만을 선별하여 리드의 변형상태를 검사하고자 할 경우에는 별도의 리드검사기에 디바이스를 투입하여 리드의 변형검사를 하게 되었다.In this case, when deciding the deformation state of the lead by selecting only good devices among the classified devices, the device was put into a separate lead inspection machine to perform the deformation inspection of the lead.
이에 따라 디바이스의 성능검사를 위한 분류기와, 리드변형상태를 검사하기 위한 리드검사기를 별도로 구입, 설치하여야 되었으므로 기기구입에 다른 비용이 많이 소요되었음은 물론 기기설치에 따른 면적을 많이 차지하게 되므로 공간활용률이 저하되었다.As a result, the classifier for the performance test of the device and the lead tester for inspecting the lead deformation state were separately purchased and installed. Therefore, other costs were required for the purchase of the device, and the space was occupied by the device installation. This was degraded.
또한 별개의 공정으로 디바이스의 검사가 수행되므로 인해 생산성이 저하되는 문제점도 있었다.In addition, since the inspection of the device is performed in a separate process, there is a problem in that the productivity is lowered.
본 고안은 종래의 이와같은 문제점을 해결하기 위해 안출한 것으로서, 분류기의 언로딩부에 디바이스의 리드변형여부를 검사하는 장치를 설치하여 양품으로 분류된 디바이스의 리드변형여부 검사도 동시에 실시할 수 있도록 하는데 그 목적이 있다.The present invention has been made to solve such a problem in the related art, and the device for inspecting the lead deformation of the device is installed in the unloading part of the classifier so that the lead deformation of the device classified as good can be simultaneously tested. Its purpose is to.
상기 목적을 달성하기 위한 본 고안의 형태에 따르면, 양품의 디바이스가 송출되는 제1송출트랙상에 1개의 디바이스를 홀딩하여 구동수단에 의해 회전되도록 설치된 회전판과, 상기 회전판의 양측에 각각 설치되어 리드의 변형여부를 감지하는 리드변형감지수단과, 상기 회전판의 일측에 설치되어 리드의 상태에 따라 회동되는 가동트랙과, 상기 가동트랙의 일측으로 제2송출트랙과 별도로 설치된 취출트랙으로 구성되어 리드변형감지수단에 의해 디바이스의 변형여부를 판정함에 따라 가동트랙이 송출트랙이나 제2취출트랙중 어느 하나와 일치되어 디바이스를 이송시키도록 된 분류기의 리드불량 디바이스 취출장치가 제공된다.According to an aspect of the present invention for achieving the above object, a rotary plate provided to hold one device on a first delivery track to which the good device is sent out to be rotated by a driving means, and are respectively installed on both sides of the rotary plate to lead Lead deformation sensing means for detecting the deformation of the lead, the movable track is installed on one side of the rotating plate rotated according to the state of the lead, and the take-out track installed separately from the second delivery track to one side of the movable track According to the determining means of the device deformation by the sensing means, there is provided a lead failure device taking-out device of a classifier such that the movable track is matched with either the delivery track or the second extraction track to transfer the device.
이하, 본 고안을 일실시예로 도시한 첨부된 도면 제1도 및 제2도를 참고로 하여 더욱 상세히 설명하면 다음과 같다.Hereinafter, the present invention will be described in more detail with reference to FIGS. 1 and 2 of the accompanying drawings.
첨부도면 제1도는 본 고안장치를 나타낸 평면도이고 제2도는 제1도의 정면도로서, 테스터부 (1)의 이송트랙(2) 하부에 테스트완료된 디바이스(3)를 제1송출트랙(4A) 상으로 송출시키기 위한 송출블럭(5)이 모터(6)에 의해 회전되는 리드스크류(7)에 나사결합 되어 있고, 상기 제1송출트랙(4a)의 일측에는 이송된 1개의 디바이스를 홀딩수단에 의해 홀딩하여 회전시키는 회전판(8)이 설치되어 있으며 제1송출트랙(4a) 상에는 송출블럭(5)를 통해 이송되어온 디바이스를 회전판(8)에 순차적으로 1개씩 공급하기 위한 스토퍼(9)가 설치되어 있다.FIG. 1 is a plan view showing the device of the present invention, and FIG. 2 is a front view of FIG. 1 showing the device 3 tested under the transport track 2 of the tester 1 on the first transport track 4A. A discharging block 5 for discharging is screwed to the lead screw 7 which is rotated by the motor 6, and one side of the first discharging track 4a is held by a holding means. The rotating plate 8 is rotated by a stopper, and a stopper 9 is provided on the first sending track 4a to sequentially supply one device to the rotating plate 8 which has been transferred through the sending block 5. .
상기 회전판(8)으로 공급된 디바이스를 홀딩하는 홀딩수단으로는 회전판(8)에 별도의 스토퍼(도시는 생략함)를 설치하여 디바이스가 공급되기전 상승되도록 하므로서 이송되어지는 디바이스를 지지하고 회전판(8)이 회전완료된 상태에서는 하강되도록하여 다음스텝(STEP)으로 디바이스가 이송되도록 되어 있다.As a holding means for holding a device supplied to the rotating plate 8, a separate stopper (not shown) is installed on the rotating plate 8 to support the device being transferred while being raised before the device is supplied. In the state where 8) has been rotated, the device is lowered so that the device is transferred to the next step.
또한 회전판(8)은 구동수단에 의해 2회 회전하도록 되어 있는데, 본 고안의 일실시예에서는 스탭모터(10)를 이용하여 회전판(8)을 회전시키도록 되어 있다.In addition, the rotary plate 8 is to be rotated twice by the drive means, in one embodiment of the present invention is to rotate the rotary plate 8 using the step motor 10.
또, 상기 회전판(8)의 양측에는 회전판(8)에 1개의 디바이스가 이송되어 회전될 때 디바이스(3)의 리드(3a) 변형여부를 감지하는 리드변형감지수단이 설치되어 있다.In addition, both sides of the rotating plate 8 is provided with lead deformation detecting means for detecting whether the lead 3a of the device 3 is deformed when one device is transferred to and rotated on the rotating plate 8.
상기 리드변형감지수단으로 본 고안의 일실시예에서는 회전판(8)의 좌우 또는 상하방향으로 디바이스(3)에 빛을 비추어 주는 램프(11)와, 상기 램프에 비친 리드(3a)의 그림자를 체크하여 리드의 변형여부를 식별하는 카메라(12)로 구성되어 있다.In the embodiment of the present invention as the lead deformation detection means, the lamp 11 for illuminating the device 3 in the left and right or up and down directions of the rotating plate 8 and the shadow of the lead 3a reflected on the lamp is checked. The camera 12 is configured to identify whether the lead is deformed.
그리고 상기 회전판(8)의 일측으로는 리드(3a)의 변형여부검사가 완료된 디바이스를 분류하는 가동트랙(13)이 실린더(14)의 로드와 연결되어 축(15)을 중심으로 회동하도록 되어 있고 가동트랙의 일측으로는 제2송출트랙(4b)과 별도로 취출트랙(16)이 설치되어 있으며 제2송출트랙(4b)의 끝단에는 테스트 결과에 따라 양품과 불량품으로 분류된 디바이스를 적재부(17)의 빈슬리이브(18)에 담기위한 분류블럭(19)이 모터(20)에 의해 회전되는 리드스크류(21)에 나사결합되어 있다.On one side of the rotating plate 8, a movable track 13 for classifying a device for which deformation of the lid 3a is completed is connected to a rod of the cylinder 14 to rotate about an axis 15. One side of the movable track is provided with a take-out track 16 separately from the second delivery track 4b. At the end of the second delivery track 4b, a device classified as good or defective according to the test result is loaded. The sorting block 19 for holding in the empty sleeve 18 of the) is screwed to the lead screw 21 rotated by the motor 20.
상기 제2송출트랙(4b)상에는 디바이스(3)를 순차적으로 1개씩 분류블럭(19)에 공급하도록 스토퍼(22)가 설치되어 있고 상기 분류블럭(19)에도 리드스크류(21)을 따라 분류블럭(19)이 이송되어 빈슬리이브(18)와 일치된 상태에서 디바이스의 제어상태를 해제시키는 스토퍼(23)가 설치되어 있다.A stopper 22 is provided on the second delivery track 4b to sequentially supply the devices 3 to the sorting block 19 one by one, and the sorting block 19 also has a sorting block along the lead screw 21. A stopper 23 is provided for releasing the control state of the device in the state where the 19 is transferred to coincide with the empty sleeve 18.
상기 제2송출트랙(4b)에 스토퍼(22)를 설치한 이유는 적재부(17)의 빈슬리이브(18)에 디바이스가 가득 채워짐에 따라 이를 적재판(24) 사이에 적개시킴과 동시에 새로운 빈슬리이브를 위치시킬 경우에도 리드변형감지수단에 의해 양품의 디바이스가 계속해서 제2송출트랙(4b)으로 송출되므로 이송된 디바이스를 대기시키기 위함이다.The reason why the stopper 22 is installed on the second delivery track 4b is that the device is filled in the empty sleeve 18 of the loading part 17, and the new stopper 22 is caught between the loading plate 24 and at the same time. Even when the empty sleeve is placed, the device of good quality continues to be sent to the second delivery track 4b by the lead deformation detection means, so as to wait for the transferred device.
이와같이 구성된 본 고안은 테스터부(1)의 이송트랙(2) 하부로 설치되는 제1, 2송출트랙(4a)(4b)이 수평면으로 부터 약 15°정도 경사를 갖도록 설치되므로(제2도는 편의상 수평상태로 도시되었음) 디바이스가 자중에 의해 이송되는 것으로 그 작용효과를 설명하면 다음과 같다.The present invention configured as described above is installed so that the first and second delivery tracks 4a and 4b installed below the transfer track 2 of the tester 1 have an inclination of about 15 ° from the horizontal plane (FIG. 2 is for convenience. The device is transported by its own weight, and its effect is explained as follows.
먼저 테스터부(1)에서 테스트완료된 1개의 디바이스(3)가 어느 하나의 이송트랙(2)을 따라 이송되면 콘트롤부(도시는 생략함)의 신호의 의해 모터(6)가 구동하게 되므로 송출블럭(5)이 리드스크류(7)를 따라 디바이스가 송출되는 이송트랙(2)과 일치되게 이송되어 정지한다.First, when one device 3 tested in the tester 1 is transported along one of the transport tracks 2, the motor 6 is driven by a signal of a control unit (not shown). (5) is conveyed and stopped in accordance with the transfer track 2 to which the device is fed along the lead screw 7.
이에따라 송출블럭(5)으로 이송된 디바이스(3)는 별도의 스토퍼수단에 의해 하방으로의 이송이 제어된다.Accordingly, the device 3 transferred to the delivery block 5 is controlled to be transported downward by a separate stopper means.
그후 모터(6)의 역회전으로 송출블럭(5)이 최초의 상태인 제1도와 같이 환원되어 제1송출트랙(4a)과 일치되면 스토퍼수단이 동작되므로 송출블럭(5)상의 디바이스(3)는 자중에 의해 제1송출트랙(4a)을 따라 하방으로 이송되고, 이송된 디바이스는 제1송출트랙(4a)상에 설치된 스토퍼(9)에 의해 이송이 중단된다.Then, when the discharge block 5 is reduced as shown in FIG. 1 as a first state by the reverse rotation of the motor 6 and coincides with the first discharge track 4a, the stopper means is operated, so that the device 3 on the discharge block 5 is operated. Is transported downward along the first delivery track 4a by its own weight, and the transferred device is stopped by the stopper 9 provided on the first delivery track 4a.
이와같이 이송된 디바이스(3)는 스토퍼(9)의 동작으로 인해 1개씩 분리되어 회전판(8)에 공급되는데, 상기 회전판(8)으로 공급되어진 디바이스는 회전판에 설치된 별도의 홀딩수단에 의해 이송이 제어된다.The devices 3 thus conveyed are separated one by one by the operation of the stopper 9 and are supplied to the rotating plate 8. The devices supplied to the rotating plate 8 are controlled by a separate holding means installed on the rotating plate. do.
상기 회전판(8)으로 디바이스가 공급됨을 별도의 센싱수단이 감지하면 회전판의 구동수단인 스탭모터(10)가 구동을 하게 되므로 상기 회전판(8)이 회전된다.When a separate sensing means detects that the device is supplied to the rotating plate 8, the step motor 10, which is a driving means of the rotating plate, is driven, thereby rotating the rotating plate 8.
이때 상기 회전판(8)의 양측으로 설치된 리드변형감지수단인 램프(11)에 의해 비추어진 리드(3a)의 그림자를 램프(11)의 반대편측에 설치된 카메라(12)가 실별하여 리드(3a)의 변형여부를 판정하게 되는데, 더욱 활실한 판정을 위해 회전판(8)을 2회이상 회전시키는 것이 더욱 바람직하다.At this time, the camera 12 installed on the opposite side of the lamp 11 separates the shadow of the lead 3a projected by the lamp 11, which is a lead deformation detection means installed on both sides of the rotating plate 8, and leads the lead 3a. It is more preferable to rotate the rotating plate 8 two or more times in order to determine whether the deformation of.
상기 동작에 따라 디바이스(3)의 리드변형여부를 판정하여 리드상태가 양호한 경우에는 가동트랙(13)에 연결된 가동실린더(14)가 동작하지 않은 상태에서 회전판(8)의 홀딩수단이 디바이스의 제어상태를 해제시키게 된다.According to the above operation, it is determined whether or not the lead 3 is deformed, and when the lead state is good, the holding means of the rotating plate 8 is controlled by the device while the movable cylinder 14 connected to the movable track 13 is not operated. Will release the state.
이에따라 회전판(8)상에 있던 디바이스는 가동트랙(13)을 통해 제2송출트랙(4b)으로 송출된다.Accordingly, the device on the rotating plate 8 is sent out to the second delivery track 4b via the movable track 13.
상기한 바와같은 동작으로 제2송출트랙(4b)을 따라 송출되는 디바이스는 스토퍼(22)에 의해 순차적으로 1개씩 분리되어 제2송출트랙(4b)의 끝부분에 제2송출트랙과 일치되게 위치된 분류블럭(19)내로 이송되어 스트퍼(도시는 생략함)에 의해 정지된다.The devices sent along the second delivery track 4b by the operation as described above are separated one by one by the stopper 22, and are positioned at the end of the second delivery track 4b so as to match the second delivery track. It is conveyed into the sorting block 19 and stopped by a stripper (not shown).
이와같이 분류블럭(19)에 디바이스(3)가 이송되면 모터(20)가 구동하여 리드스크류(21)를 회전시키게 되므로 테스터부(1)의 테스트 결과에 따라 분류블럭(19)이 이송되어 빈슬리이브(18)와 일치된 상태에서 정지된다.In this way, when the device 3 is transferred to the sorting block 19, the motor 20 is driven to rotate the lead screw 21. Therefore, the sorting block 19 is transferred according to the test result of the tester 1, and the binsley is moved. It stops in the state consistent with Eve 18.
즉, 테스트 결과에 따라 양품으로 판정된 디바이스가 공급되면 분류블럭(19)이 양품을 담는 빈슬리이브 측으로 이동하여 상기 빈슬리이브와 분류블럭이 일치된 상태에서 정지되고, 이와는 반대로 불량품으로 판정된 디바이스가 공급되면 불량품을 담는 빈슬리이브와 일치된 상태에서 정지된다.That is, when the device determined to be good quality is supplied according to the test result, the sorting block 19 moves to the empty sleeve containing the good quality and stops while the bin sleeve and the sorting block match with each other. When the device is supplied, it stops in line with the empty sleeve containing the defective product.
그후 디바이스의 이송을 제어하는 스토퍼(23)가 디바이스의 제어상태를 해제하면 분류블럭(19)에 얹혀져 이송되어온 디바이스는 빈슬리읍(18)내에 담겨지게 된다.Then, when the stopper 23 controlling the transfer of the device releases the control state of the device, the device placed on the sorting block 19 and transferred is contained in the binsley 18.
한편, 회전판(8)에 얹혀진 상태에서 리드변형감지수단에 의해 리드(3a)가 불량하다고 판정될 경우에는 콘트롤부의 신호에 따라 가동트랙(13)에 연결된 가동실린더(14)가 동작하게 되므로 가동트랙(13)이 화살표방향으로 회동되어 송출트랙(16)과 일치하게 된다.On the other hand, when it is determined that the lead 3a is defective by the lead deformation detection means in the state where it is mounted on the rotating plate 8, the movable cylinder 14 connected to the movable track 13 is operated in accordance with the signal of the control unit, so that the movable track 13 is rotated in the direction of the arrow to coincide with the delivery track 16.
이에따라 회전판(8)상에 얹혀져 있던 디바이스(3)의 홀딩수단의 해제로 가동트랙(13)을 통해 취출트랙(16)으로 송출되어 별도의 용기에 담겨지게 됨과 동시에 회전판(8)에 다음으로 이송되는 디바이스의 리드상태에 따라 구동실린더(14)가 동작되어 가동트랙(13)을 최초의 상태, 즉 제2송출트랙(4b)과 일치시키거나 취출트랙(16)과 일치된 상태를 유지하게 되므로 계속적인 리드변형 여부에 따라 디바이스를 분류할 수 있게 되는 것이다.Accordingly, by releasing the holding means of the device 3 mounted on the rotating plate 8, it is sent out to the takeout track 16 through the movable track 13 to be contained in a separate container and then transferred to the rotating plate 8 at the same time. According to the lead state of the device, the driving cylinder 14 is operated to match the movable track 13 to the first state, that is, the second delivery track 4b or to maintain the state consistent with the ejection track 16. The device can be classified according to continuous lead deformation.
이상에서와 같이 본 고안장치는 테스트가 완료되어 송출되는 송출트랙상에 리드의 변형여부를 식별하기 위한 회전판(8)과 리드변형감지수단을 설치하여 리드의 변형여부를 검사함과 동시에 검사결과에 따라 디바이스를 제2송출트랙(4b)과 취출트랙(16) 중 어느 하나로 송출시키도록 되어 있어 분류기외에 별도의 리드검사기를 설치할 필요가 없게 되므로 기기구입비를 절감시키게 됨은 물론 기기의 설치공간을 줄일 수 있게 되는 효과를 얻게된다.As described above, the device of the present invention is equipped with a rotary plate 8 and a lead deformation detection means for identifying whether the lead is deformed on the delivery track that has been tested and sent out. Accordingly, the device is sent out to one of the second delivery track 4b and the extraction track 16, thereby eliminating the need to install a separate lead tester in addition to the classifier, thereby reducing the equipment purchase cost and reducing the installation space of the device. You will get the effect.
Claims (3)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019930008458U KR960007149Y1 (en) | 1993-05-19 | 1993-05-19 | Lead inferior device selecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019930008458U KR960007149Y1 (en) | 1993-05-19 | 1993-05-19 | Lead inferior device selecting apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR940027610U KR940027610U (en) | 1994-12-10 |
| KR960007149Y1 true KR960007149Y1 (en) | 1996-08-22 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR2019930008458U KR960007149Y1 (en) | 1993-05-19 | 1993-05-19 | Lead inferior device selecting apparatus |
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| KR (1) | KR960007149Y1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180086041A (en) * | 2017-01-20 | 2018-07-30 | 주식회사 엘지화학 | Defect inspection device of electrode lead for secondary battery |
-
1993
- 1993-05-19 KR KR2019930008458U patent/KR960007149Y1/en not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20180086041A (en) * | 2017-01-20 | 2018-07-30 | 주식회사 엘지화학 | Defect inspection device of electrode lead for secondary battery |
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| Publication number | Publication date |
|---|---|
| KR940027610U (en) | 1994-12-10 |
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