KR940027610U - Sorting device for lead failure device - Google Patents

Sorting device for lead failure device

Info

Publication number
KR940027610U
KR940027610U KR2019930008458U KR930008458U KR940027610U KR 940027610 U KR940027610 U KR 940027610U KR 2019930008458 U KR2019930008458 U KR 2019930008458U KR 930008458 U KR930008458 U KR 930008458U KR 940027610 U KR940027610 U KR 940027610U
Authority
KR
South Korea
Prior art keywords
lead failure
sorting
sorting device
lead
failure device
Prior art date
Application number
KR2019930008458U
Other languages
Korean (ko)
Other versions
KR960007149Y1 (en
Inventor
김규선
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019930008458U priority Critical patent/KR960007149Y1/en
Publication of KR940027610U publication Critical patent/KR940027610U/en
Application granted granted Critical
Publication of KR960007149Y1 publication Critical patent/KR960007149Y1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67271—Sorting devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67706—Mechanical details, e.g. roller, belt

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Sorting Of Articles (AREA)
KR2019930008458U 1993-05-19 1993-05-19 Lead inferior device selecting apparatus KR960007149Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930008458U KR960007149Y1 (en) 1993-05-19 1993-05-19 Lead inferior device selecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930008458U KR960007149Y1 (en) 1993-05-19 1993-05-19 Lead inferior device selecting apparatus

Publications (2)

Publication Number Publication Date
KR940027610U true KR940027610U (en) 1994-12-10
KR960007149Y1 KR960007149Y1 (en) 1996-08-22

Family

ID=19355502

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930008458U KR960007149Y1 (en) 1993-05-19 1993-05-19 Lead inferior device selecting apparatus

Country Status (1)

Country Link
KR (1) KR960007149Y1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102162874B1 (en) * 2017-01-20 2020-10-07 주식회사 엘지화학 Defect inspection device of electrode lead for secondary battery

Also Published As

Publication number Publication date
KR960007149Y1 (en) 1996-08-22

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20070720

Year of fee payment: 12

EXPY Expiration of term