KR950031755U - 디바이스 테스트용 소켓구조 - Google Patents
디바이스 테스트용 소켓구조Info
- Publication number
- KR950031755U KR950031755U KR2019940008326U KR19940008326U KR950031755U KR 950031755 U KR950031755 U KR 950031755U KR 2019940008326 U KR2019940008326 U KR 2019940008326U KR 19940008326 U KR19940008326 U KR 19940008326U KR 950031755 U KR950031755 U KR 950031755U
- Authority
- KR
- South Korea
- Prior art keywords
- device testing
- socket structure
- socket
- testing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1092—Plug-in assemblages of components, e.g. IC sockets with built-in components, e.g. intelligent sockets
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/12—Resilient or clamping means for holding component to structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940008326U KR0110465Y1 (ko) | 1994-04-20 | 1994-04-20 | 디바이스 테스트용 소켓구조 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940008326U KR0110465Y1 (ko) | 1994-04-20 | 1994-04-20 | 디바이스 테스트용 소켓구조 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950031755U true KR950031755U (ko) | 1995-11-22 |
KR0110465Y1 KR0110465Y1 (ko) | 1998-04-14 |
Family
ID=19381370
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019940008326U KR0110465Y1 (ko) | 1994-04-20 | 1994-04-20 | 디바이스 테스트용 소켓구조 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0110465Y1 (ko) |
-
1994
- 1994-04-20 KR KR2019940008326U patent/KR0110465Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0110465Y1 (ko) | 1998-04-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20050824 Year of fee payment: 9 |
|
LAPS | Lapse due to unpaid annual fee |