KR950020703A - Semiconductor Memory Device - Google Patents
Semiconductor Memory Device Download PDFInfo
- Publication number
- KR950020703A KR950020703A KR1019940032411A KR19940032411A KR950020703A KR 950020703 A KR950020703 A KR 950020703A KR 1019940032411 A KR1019940032411 A KR 1019940032411A KR 19940032411 A KR19940032411 A KR 19940032411A KR 950020703 A KR950020703 A KR 950020703A
- Authority
- KR
- South Korea
- Prior art keywords
- transistor
- source
- signal
- lines
- potential
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/067—Single-ended amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
Landscapes
- Read Only Memory (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Abstract
본 발명은 센스 증폭기의 독출 동작 속도를 빠르게 하는 것을 목적으로 한다.An object of the present invention is to speed up the read operation speed of a sense amplifier.
반전 증폭기 IV31과 함께 레벨 유지 회로를 형성하는 트랜지스터 Tr32의 소스와 전원 전위 Vdd점과의 사이에 트랜지스터 Tr32보다 충분히 큰 온 저항 및 동일 정도의 전류 구동 능력을 갖고 있는 트랜지스터 Tr33을 설치한다. 트랜지스터 Tr32의 게이트 길이를 제작가능한 범위에서 최대한 짧게 한다.A transistor Tr33 having a sufficiently large on-resistance and the same degree of current driving capability as the transistor Tr32 is provided between the source of the transistor Tr32 which forms the level holding circuit together with the inverting amplifier IV31 and the power supply potential Vdd. Keep the gate length of transistor Tr32 as short as possible.
트랜지스터 Tr32의 게이트 용량 즉 반전 증폭기 IV31의 부하 용량이 적게 되어 독출 동작 속도가 빠르게 된다.The gate capacitance of transistor Tr32, that is, the load capacitance of inverting amplifier IV31, is reduced, resulting in a high read operation speed.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제1도는 본 발명의 제1실시예를 도시하는 회로도.1 is a circuit diagram showing a first embodiment of the present invention.
Claims (2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP93-301375 | 1993-12-01 | ||
JP30137593A JP2723015B2 (en) | 1993-12-01 | 1993-12-01 | Semiconductor storage device |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950020703A true KR950020703A (en) | 1995-07-24 |
KR0140025B1 KR0140025B1 (en) | 1998-07-15 |
Family
ID=17896122
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940032411A KR0140025B1 (en) | 1993-12-01 | 1994-12-01 | Semiconductor memory device |
Country Status (5)
Country | Link |
---|---|
US (1) | US5477484A (en) |
EP (1) | EP0661709B1 (en) |
JP (1) | JP2723015B2 (en) |
KR (1) | KR0140025B1 (en) |
DE (1) | DE69423329T2 (en) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0167235B1 (en) * | 1995-03-28 | 1999-02-01 | 문정환 | Data transferring apparatus for memory |
JPH09120693A (en) * | 1995-08-22 | 1997-05-06 | Mitsubishi Electric Corp | Semiconductor memory apparatus |
JP3672633B2 (en) * | 1995-09-07 | 2005-07-20 | 株式会社ルネサステクノロジ | Semiconductor memory device |
US5748015A (en) * | 1996-07-01 | 1998-05-05 | Sun Microsystems, Inc. | Low voltage single ended dynamic sense amplifier |
US5831923A (en) * | 1996-08-01 | 1998-11-03 | Micron Technology, Inc. | Antifuse detect circuit |
US5801574A (en) * | 1996-10-07 | 1998-09-01 | Micron Technology, Inc. | Charge sharing detection circuit for anti-fuses |
US5828610A (en) * | 1997-03-31 | 1998-10-27 | Seiko Epson Corporation | Low power memory including selective precharge circuit |
US5835410A (en) * | 1997-06-09 | 1998-11-10 | Microchip Technology Incorporated | Self timed precharge sense amplifier for a memory array |
US5850366A (en) * | 1997-07-24 | 1998-12-15 | Texas Instruments Incorporated | Memory array having dummy cells implemented using standard array cells |
US6279071B1 (en) | 1998-07-07 | 2001-08-21 | Mitsubishi Electric And Electronics Usa, Inc. | System and method for column access in random access memories |
EP0977204B1 (en) * | 1998-07-28 | 2004-10-06 | International Business Machines Corporation | Fast single ended sensing with configurable half-latch |
FR2793591B1 (en) * | 1999-05-12 | 2004-01-02 | St Microelectronics Sa | DEAD MEMORY WITH REDUCED STATIC CONSUMPTION |
JP3734726B2 (en) * | 2001-07-17 | 2006-01-11 | 松下電器産業株式会社 | Read-only memory |
US6594184B2 (en) * | 2001-09-06 | 2003-07-15 | Sun Microsystems, Inc. | System and method for accessing a memory array which tolerates non-exclusive read select enables |
US6618282B1 (en) | 2002-08-07 | 2003-09-09 | National Semiconductor Corporation | High density ROM architecture with inversion of programming |
US6642587B1 (en) | 2002-08-07 | 2003-11-04 | National Semiconductor Corporation | High density ROM architecture |
WO2018105719A1 (en) * | 2016-12-09 | 2018-06-14 | 国立大学法人東北大学 | Reading device and logic device |
US10090057B2 (en) * | 2017-02-23 | 2018-10-02 | Sandisk Technologies Llc | Dynamic strobe timing |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5170374A (en) * | 1981-05-13 | 1992-12-08 | Hitachi, Ltd. | Semiconductor memory |
US4982363A (en) * | 1988-12-05 | 1991-01-01 | Motorola, Inc. | Sensing structure for single ended input |
JPH0814995B2 (en) * | 1989-01-27 | 1996-02-14 | 株式会社東芝 | Semiconductor memory |
JPH0371495A (en) * | 1989-08-11 | 1991-03-27 | Sony Corp | Ultraviolet-ray erasure type nonvolatile memory device |
FR2659165A1 (en) * | 1990-03-05 | 1991-09-06 | Sgs Thomson Microelectronics | ULTRA-FAST MEMORY COMPRISING A CELL DRAIN VOLTAGE LIMITER. |
JP2586722B2 (en) * | 1990-10-11 | 1997-03-05 | 日本電気株式会社 | Semiconductor storage device |
JP2683176B2 (en) * | 1991-10-30 | 1997-11-26 | 川崎製鉄株式会社 | Read-only storage device |
-
1993
- 1993-12-01 JP JP30137593A patent/JP2723015B2/en not_active Expired - Lifetime
-
1994
- 1994-12-01 DE DE69423329T patent/DE69423329T2/en not_active Expired - Fee Related
- 1994-12-01 US US08/353,203 patent/US5477484A/en not_active Expired - Fee Related
- 1994-12-01 KR KR1019940032411A patent/KR0140025B1/en not_active IP Right Cessation
- 1994-12-01 EP EP94118967A patent/EP0661709B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69423329D1 (en) | 2000-04-13 |
JP2723015B2 (en) | 1998-03-09 |
US5477484A (en) | 1995-12-19 |
JPH07153292A (en) | 1995-06-16 |
KR0140025B1 (en) | 1998-07-15 |
EP0661709A1 (en) | 1995-07-05 |
DE69423329T2 (en) | 2000-10-19 |
EP0661709B1 (en) | 2000-03-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR950020703A (en) | Semiconductor Memory Device | |
KR910010526A (en) | Page-Erasable Flash YPIROM Device | |
KR920001542A (en) | Semiconductor Memory with Sense Amplifier | |
KR890017706A (en) | Dynamic Semiconductor Memory | |
KR960042757A (en) | Data reading circuit of nonvolatile semiconductor memory | |
KR860003603A (en) | Semiconductor memory | |
KR930001220A (en) | Semiconductor memory device | |
KR850002637A (en) | Semiconductor memory | |
KR970023395A (en) | Semiconductor memory device | |
KR960035627A (en) | High-speed semiconductor memory system | |
KR930005017A (en) | Semiconductor DRAM device | |
KR880013172A (en) | Semiconductor memory | |
KR890008826A (en) | Sense Amplifier Driving Apparatus and Sense Amplifier Driving Method in Dynamic Random Access Memory | |
US4045785A (en) | Sense amplifier for static memory device | |
KR950020704A (en) | Semiconductor memory device | |
KR970063252A (en) | Semiconductor memory device with multilayer memory cell array | |
KR880008340A (en) | High Density ROM in CMOS Gate Array | |
KR930008850A (en) | Semiconductor memory device with partitioned read data bus system | |
KR910006997A (en) | Decoder circuit of EPROM to prevent malfunction caused by parasitic capacitance | |
KR870009398A (en) | Semiconductor memory | |
KR890001095A (en) | Sense circuit having current voltage converting circuit and semiconductor memory thereof | |
KR950010084A (en) | Semiconductor memory device | |
KR920020501A (en) | Semiconductor memory | |
KR930005199A (en) | Semiconductor memory | |
JPH0574158B2 (en) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20020227 Year of fee payment: 5 |
|
LAPS | Lapse due to unpaid annual fee |