KR950019758A - Operation and malfunction measurement method during power switching test - Google Patents

Operation and malfunction measurement method during power switching test Download PDF

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Publication number
KR950019758A
KR950019758A KR1019930031568A KR930031568A KR950019758A KR 950019758 A KR950019758 A KR 950019758A KR 1019930031568 A KR1019930031568 A KR 1019930031568A KR 930031568 A KR930031568 A KR 930031568A KR 950019758 A KR950019758 A KR 950019758A
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KR
South Korea
Prior art keywords
malfunction
power
measurement method
power switching
during power
Prior art date
Application number
KR1019930031568A
Other languages
Korean (ko)
Other versions
KR0175826B1 (en
Inventor
오상윤
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
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Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019930031568A priority Critical patent/KR0175826B1/en
Publication of KR950019758A publication Critical patent/KR950019758A/en
Application granted granted Critical
Publication of KR0175826B1 publication Critical patent/KR0175826B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

본 발명은 전원개폐 시험시의 동작및 오동작 계측방법에 관한 것으로, 특히 시스템 내부의 비휘발성 메모리로부터 데이타, 예컨데 정전발생 이전까지의 전원 개폐 수행횟수 및 오동작 발생횟수를 리드(Read)하는 단계와, 이 단계에서 데이타를 리드한 후 전원개폐를 수행하고 이에 따른 오동작의 발생여부를 판단하는 단계와, 이 단계에서 오동작의 발생여부에 따라 상기 전원개폐 수행횟수와 오동작의 발생횟수를 변경하여 상기 비휘발성 메모리에 저장하는 단계로 이루어져 정확한 전원 개폐의 실행횟수와 오동작 발생횟수를 카운트하여 비휘발성 메모리에 저장하여 정전시에도 상기 메모리에 저장되어 있는 정보를 보유함에 따라 정전발생후 복구시 상기 메모리에 저장되어 있는 수행횟수부터 시험을 재개할 수 있어 처음부터 시험을 재수행하지 않아도 된다.The present invention relates to a method for measuring the operation and malfunction in the power-switching test, and in particular, the step of reading the data, such as the number of times the power is opened and closed until the occurrence of power failure, such as from the non-volatile memory inside the system, In this step, after the data is read, power is switched off and a malfunction is determined accordingly. In this step, the power switching operation frequency and the frequency of malfunction are changed according to whether a malfunction occurs. It is stored in the memory and counts the number of times of accurate power on / off and malfunction occurs and stores the information in the non-volatile memory to retain the information stored in the memory even in the event of a power failure. You can resume the test from the number of times you have it. It may be used.

Description

전원개폐 시험시의 동작및 오동작 계측방법Measurement method of operation and malfunction during power-switching test

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명을 설명하기 위한 구성 블럭도.1 is a block diagram illustrating the present invention.

제2도는 본 발명의 제어 흐름도.2 is a control flowchart of the present invention.

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

10 : 램 또는 하드디스크 20 : 검출부10: RAM or hard disk 20: Detection unit

30 : 프로세서 40 : 비휘발성 메모리30 processor 40 nonvolatile memory

50 : 표시부50: display unit

Claims (1)

시스템의 내부에 설치되어 있는 비휘발성 메모리로부터 정전발생 이전까지 수행되었던 전원개폐 수행횟수 및 오동작 발생횟수의 데이타를 리드(Read)하는 단계와, 이 단계에서 데이타를 리드한 후 전원개폐를 수행하고, 이에 따른 오동작의 발생여부를 판단하는 단계와, 이 단계에서 오동작의 발생여부에 따라 상기 전원개폐 수행횟수와 오동작의 발생횟수를 변경하여 상기 비휘발성 메모리에 저장하는 단계로 이루어진 것을 특징으로 하는 전원개폐 시험시의 동작및 오동작 계측방법.Read data of the number of times of power on / off and the number of malfunctions that were performed until the power failure occurred from the nonvolatile memory installed in the system, and at this stage, the power is switched off after reading the data. Determining whether or not a malfunction occurs according to this, and changing the frequency of performing the power switch and the occurrence of the malfunction in accordance with whether or not the malfunction occurs in this step and storing in the non-volatile memory Method of measuring operation and malfunction during test. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019930031568A 1993-12-30 1993-12-30 Operation and malfunction measurement method during power switching test KR0175826B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019930031568A KR0175826B1 (en) 1993-12-30 1993-12-30 Operation and malfunction measurement method during power switching test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019930031568A KR0175826B1 (en) 1993-12-30 1993-12-30 Operation and malfunction measurement method during power switching test

Publications (2)

Publication Number Publication Date
KR950019758A true KR950019758A (en) 1995-07-24
KR0175826B1 KR0175826B1 (en) 1999-04-01

Family

ID=19374517

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930031568A KR0175826B1 (en) 1993-12-30 1993-12-30 Operation and malfunction measurement method during power switching test

Country Status (1)

Country Link
KR (1) KR0175826B1 (en)

Also Published As

Publication number Publication date
KR0175826B1 (en) 1999-04-01

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