KR950015659U - Unaligned semiconductor tube supply device - Google Patents

Unaligned semiconductor tube supply device

Info

Publication number
KR950015659U
KR950015659U KR2019930023448U KR930023448U KR950015659U KR 950015659 U KR950015659 U KR 950015659U KR 2019930023448 U KR2019930023448 U KR 2019930023448U KR 930023448 U KR930023448 U KR 930023448U KR 950015659 U KR950015659 U KR 950015659U
Authority
KR
South Korea
Prior art keywords
unaligned
supply device
tube supply
semiconductor tube
semiconductor
Prior art date
Application number
KR2019930023448U
Other languages
Korean (ko)
Other versions
KR200159719Y1 (en
Inventor
신덕교
송정규
정강석
이성동
Original Assignee
현대전자산업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대전자산업주식회사 filed Critical 현대전자산업주식회사
Priority to KR2019930023448U priority Critical patent/KR200159719Y1/en
Publication of KR950015659U publication Critical patent/KR950015659U/en
Application granted granted Critical
Publication of KR200159719Y1 publication Critical patent/KR200159719Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67706—Mechanical details, e.g. roller, belt

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR2019930023448U 1993-11-10 1993-11-10 Semiconductor device tube supply equipment KR200159719Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930023448U KR200159719Y1 (en) 1993-11-10 1993-11-10 Semiconductor device tube supply equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930023448U KR200159719Y1 (en) 1993-11-10 1993-11-10 Semiconductor device tube supply equipment

Publications (2)

Publication Number Publication Date
KR950015659U true KR950015659U (en) 1995-06-19
KR200159719Y1 KR200159719Y1 (en) 1999-11-01

Family

ID=19367421

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930023448U KR200159719Y1 (en) 1993-11-10 1993-11-10 Semiconductor device tube supply equipment

Country Status (1)

Country Link
KR (1) KR200159719Y1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101521873B1 (en) * 2014-11-06 2015-05-21 에스에스오트론 주식회사 Tube supply apparatus for semiconductor package fabrication apparatus
KR101541038B1 (en) * 2015-04-10 2015-08-03 티에스티(주) Substrate loading apparatus

Also Published As

Publication number Publication date
KR200159719Y1 (en) 1999-11-01

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Legal Events

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