KR950006988U - Part appearance inspection device using slit light - Google Patents

Part appearance inspection device using slit light

Info

Publication number
KR950006988U
KR950006988U KR2019930016201U KR930016201U KR950006988U KR 950006988 U KR950006988 U KR 950006988U KR 2019930016201 U KR2019930016201 U KR 2019930016201U KR 930016201 U KR930016201 U KR 930016201U KR 950006988 U KR950006988 U KR 950006988U
Authority
KR
South Korea
Prior art keywords
inspection device
appearance inspection
slit light
part appearance
slit
Prior art date
Application number
KR2019930016201U
Other languages
Korean (ko)
Other versions
KR200150088Y1 (en
Inventor
이창배
Original Assignee
삼성항공산업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성항공산업주식회사 filed Critical 삼성항공산업주식회사
Priority to KR2019930016201U priority Critical patent/KR200150088Y1/en
Publication of KR950006988U publication Critical patent/KR950006988U/en
Application granted granted Critical
Publication of KR200150088Y1 publication Critical patent/KR200150088Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
KR2019930016201U 1993-08-20 1993-08-20 Electronic element inspection apparatus using light through slit KR200150088Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930016201U KR200150088Y1 (en) 1993-08-20 1993-08-20 Electronic element inspection apparatus using light through slit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930016201U KR200150088Y1 (en) 1993-08-20 1993-08-20 Electronic element inspection apparatus using light through slit

Publications (2)

Publication Number Publication Date
KR950006988U true KR950006988U (en) 1995-03-21
KR200150088Y1 KR200150088Y1 (en) 1999-07-01

Family

ID=19361647

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930016201U KR200150088Y1 (en) 1993-08-20 1993-08-20 Electronic element inspection apparatus using light through slit

Country Status (1)

Country Link
KR (1) KR200150088Y1 (en)

Also Published As

Publication number Publication date
KR200150088Y1 (en) 1999-07-01

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Legal Events

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E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
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FPAY Annual fee payment

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Year of fee payment: 9

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