KR950003837A - PCB automatic inspection device by bias (B +) voltage measurement - Google Patents

PCB automatic inspection device by bias (B +) voltage measurement Download PDF

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Publication number
KR950003837A
KR950003837A KR1019930014521A KR930014521A KR950003837A KR 950003837 A KR950003837 A KR 950003837A KR 1019930014521 A KR1019930014521 A KR 1019930014521A KR 930014521 A KR930014521 A KR 930014521A KR 950003837 A KR950003837 A KR 950003837A
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KR
South Korea
Prior art keywords
pcb
overload
power supply
checking
bias
Prior art date
Application number
KR1019930014521A
Other languages
Korean (ko)
Other versions
KR960009942B1 (en
Inventor
이수원
Original Assignee
배순훈
대우전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 배순훈, 대우전자 주식회사 filed Critical 배순훈
Priority to KR1019930014521A priority Critical patent/KR960009942B1/en
Publication of KR950003837A publication Critical patent/KR950003837A/en
Application granted granted Critical
Publication of KR960009942B1 publication Critical patent/KR960009942B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Power Sources (AREA)

Abstract

본 발명은 PCB조정기에 관한 것으로, 특히 PCB어셈블리의 과부하 및 B+단을 체크하여 양,불상태를 점검하기 위한 바이어스(B+) 전압측정에 의한 PCB자동검사장치에 관한 것으로, PCB어셈블리(90) 양,불판정을 하고 제어하는 컴퓨터(10)를 GPIB보드(20)를 통해 AC전원을 출력하는 프로그래머블파우워서플라이(60)와 과부하를 점검하는 과부하점검장치(70)와 추출된 B+신호를 절환하는 멀티플렉서(50)와 B+전압을 측정하는 A/D변환장치(40)에 GPIB버스로 상호 연결되게 하고 프로그래머블파우워서플라이(60) 출력단(OUT1)를 과부하점검장치(70)와 하치구(80)를 통해 PCB어셈블리(90)에 인가하고 상기 하치구(90) TP점을 멀티플렉서(50)를 거쳐 A/D변환장치(40)에 연결하고 컴퓨터(10)에 양,불판정을 표시하는 모니터(30)을 접속되게 하여 PCB어셈블리의 B+전원동작상태를 한눈에 파악하여 불량 PCB확인이 용이하여 이를 PCB조정이 투입전 공정에 설치하므로서 과부하에 의한 장비의 파손을 방지할수 있다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a PCB regulator, and more particularly, to an apparatus for automatically checking a PCB by measuring a bias (B + ) voltage for checking an overload and a B + stage of a PCB assembly to check a quantity and a failure state. ) Programmable power supply 60 for outputting AC power through GPIB board 20 for controlling the quantity and undetermination and control, overload checking device 70 for checking overload and extracted B + signal. To the multiplexer 50 to switch the A / D converter 40 to measure the B + voltage by a GPIB bus and the output of the programmable power supply 60 OUT 1 and the overload checker 70 and It is applied to the PCB assembly 90 through the lower port 80 and the TP point 90 of the lower port 90 is connected to the A / D converter 40 through the multiplexer 50 and is positive or indeterminate to the computer 10. a monitor 30 for displaying the B + power supply operating status of the PCB assembly to be connected to at a glance It is easy to identify and check the bad PCB, and this can be installed in the process before PCB adjustment, preventing the damage of equipment by overload.

Description

바이어스(B+) 전압측정에 의한 피씨비(PCB) 자동검사장치PCB automatic inspection device by bias (B +) voltage measurement

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명의 블럭도. 제2도는 본 발명에 따른 동작흐름도.1 is a block diagram of the present invention. 2 is a flow chart according to the present invention.

Claims (1)

PCB 자동조정기에 있어서, PCB 어셈블리(90) 양, 불판정을하고 제어하는 컴퓨터(10)를 GPIB 보드(20)를 통해 AC 전원을 출력하는 프로그래머블파우워서플라이(60)과 과부하를 점검하는 과부하점검장치(70)와 추출된 B+신호를 절환하는 멀티플렉서(50)와 B+전압을 측정하는 A/D 변환장치(40)에 GPIB 버스로 상호 연결되게 하고 프로그래머블파우워서플라이(60) 출력단(OUT1)을 과부하점검장치(70)와 하치구(80)를 통해 PCB 어셈블리(90)에 인가하고 상기 하치구(90) TP점을 멀티플렉서(50)를 거쳐 A/D 변환장치(40)에 연결하고 컴퓨터(10)에 양, 불판정을 표시하는 모니터(30)를 접속한 것을특징으로 하는 바이어스(B+) 전압측정에 의한 PCB 자동검사장치.In the PCB automatic regulator, an overload check for checking the amount of the PCB assembly 90, the computer 10 for determining and controlling the overload, the programmable power supply 60 for outputting AC power through the GPIB board 20, and the overload check A device 70, a multiplexer 50 for switching the extracted B + signal, and an A / D converter 40 for measuring B + voltage are interconnected by a GPIB bus and the output of the programmable power supply 60 OUT 1 ) is applied to the PCB assembly 90 through the overload checker 70 and the lower inlet 80, and the lower inlet 90 is connected to the A / D converter 40 via the multiplexer 50. and PCB automatic inspection apparatus according to a bias (B +) measurement voltage, characterized in that the connection to the monitor 30, indicating the amount, the fire determined in the computer 10. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019930014521A 1993-07-29 1993-07-29 Pcb auto-testing apparatus by bias voltage measurement KR960009942B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019930014521A KR960009942B1 (en) 1993-07-29 1993-07-29 Pcb auto-testing apparatus by bias voltage measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019930014521A KR960009942B1 (en) 1993-07-29 1993-07-29 Pcb auto-testing apparatus by bias voltage measurement

Publications (2)

Publication Number Publication Date
KR950003837A true KR950003837A (en) 1995-02-17
KR960009942B1 KR960009942B1 (en) 1996-07-25

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930014521A KR960009942B1 (en) 1993-07-29 1993-07-29 Pcb auto-testing apparatus by bias voltage measurement

Country Status (1)

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KR (1) KR960009942B1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102033206A (en) * 2010-11-16 2011-04-27 天津市中环电子计算机有限公司 Automatic test equipment for lithium battery circuit protective board
CN109406985A (en) * 2018-10-08 2019-03-01 北方电子研究院安徽有限公司 A kind of PCB analog element Auto-Test System and test method

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Publication number Publication date
KR960009942B1 (en) 1996-07-25

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