KR940004500U - ROM test circuit - Google Patents
ROM test circuitInfo
- Publication number
- KR940004500U KR940004500U KR2019920013115U KR920013115U KR940004500U KR 940004500 U KR940004500 U KR 940004500U KR 2019920013115 U KR2019920013115 U KR 2019920013115U KR 920013115 U KR920013115 U KR 920013115U KR 940004500 U KR940004500 U KR 940004500U
- Authority
- KR
- South Korea
- Prior art keywords
- test circuit
- rom test
- rom
- circuit
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR92013115U KR0119771Y1 (en) | 1992-07-15 | 1992-07-15 | Rom test circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR92013115U KR0119771Y1 (en) | 1992-07-15 | 1992-07-15 | Rom test circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
KR940004500U true KR940004500U (en) | 1994-02-24 |
KR0119771Y1 KR0119771Y1 (en) | 1998-08-01 |
Family
ID=19336811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR92013115U KR0119771Y1 (en) | 1992-07-15 | 1992-07-15 | Rom test circuit |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0119771Y1 (en) |
-
1992
- 1992-07-15 KR KR92013115U patent/KR0119771Y1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0119771Y1 (en) | 1998-08-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20050221 Year of fee payment: 8 |
|
LAPS | Lapse due to unpaid annual fee |