KR930022918A

KR930022918A - Thermistor Circuit and Cooker

Info

Publication number: KR930022918A
Application number: KR1019930002625A
Authority: KR
Inventors: 슈이찌 다까다
Original assignee: 최창선; 린나이코리아 주식회사; 나이또 스스무; 린나이 가부시기가이샤
Priority date: 1992-04-22
Filing date: 1993-02-24
Publication date: 1993-11-24
Also published as: KR950010632B1; JPH0765742B2; JPH05299169A

Abstract

본 발명은 광범위하게 또 고정밀도의 온도검출이 가능하며, 동시에 반도체소자의 기능검사를 할 수 있는 서미스터회로의 제공을 목적으로 하는 것으로서, 마이크로컴퓨터(7)가 증온영역판독용신호(S_M)를 송출하였을 때의 단자전압(E)을 E_H으로 하고, 고온영역판독용 신호(S_H)를 송촐하였을때의 전자전압(E)을 E_M로 하고, 신호(S_M,S_H)를 송출하지 않았을 때의 단자전압(E)를 E₀로 하고, 판정치를 a로 하고서, 「|E₀-E_M|＜a」 혹은「|E₀-E_H|＜a」 중 어느 하나가 성립한 경우, 마이크로컴퓨터 (7)는 트랜지스터(5,6)중 어느 한개가 불량상태로 되어 있다고 판정하는 구성으로 된 서미스터회로이다.The present invention is widely also temperature detection with high accuracy is possible and, at the same time as for the purpose of provision of a thermistor circuit capable of the function test of the semiconductor device, the microcomputer 7 is jeungon area read signal (S _M) for The terminal voltage (E) at the time of sending is set to E _H , the electronic voltage (E) at the time of sending the signal for reading high temperature area (S _H ) is set at E _M , and the signals (S _M , S _H ) The terminal voltage (E) at the time of not sending is set to E ₀ , and the judgment value is set to a, so that either "| E ₀ -E _M | <a" or "| E ₀ -E _H | <a" If so, the microcomputer 7 is a thermistor circuit configured to determine that any one of the transistors 5 and 6 is in a bad state.

Description

Thermistor Circuit and Cooker

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명에 관한 서미스터회로(A)를 채용한 가스테이블(B)의 구조도, 제2도는 상기 서미스터회로(A)의 원리 설명도, 제3도는 상기 서미스터회로(A)작동 표시도.1 is a structural diagram of a gas table B employing a thermistor circuit A according to the present invention, FIG. 2 is a principle explanatory diagram of the thermistor circuit A, and FIG. 3 is an operation display diagram of the thermistor circuit A. .

Claims

A plurality of resistors are connected in series so as to lower the electric resistance value step by step, a resistor group having a high resistance terminal connected to one pole side of the DC power supply circuit, and one connected to a resistance terminal of the resistance group, the other of the DC power supply circuit. A plurality of semiconductor devices having a thermistor connected to the other polar axis, a terminal group which is turned on when a reading signal is input, at both ends of the resistor, signal sending means for sending the reading signal to the semiconductor device, and And a microcomputer having a thermistor voltage input means for inputting a terminal voltage of the thermistor, wherein the thermistor voltage value in the non-operating state of the signal transmitting means is set to E ₀ , and the signal transmitting means is connected to any one of the semiconductor elements. the thermistor voltage value at the time when transmitting the read signal for the E _n, and the one with respect to each and every semiconductor device When the like by detecting the thermistor voltage value (E _n), and the determined value a la, the scan sour "| E ₀ -E _n | <a" if the any one is satisfied, the microcomputer of the plurality A thermistor circuit which determines that at least one of the semiconductor elements is in a bad state and stops temperature detection by the thermistor.

And a heating means for heating the cooking vessel containing the cooked object, a thermal tube including a thermistor for detecting the temperature of the cooking vessel, and a heating controller for controlling the heating means based on the detected temperature. A cooker, which is combined with the thermistor circuit according to claim 1.

※ Note: The disclosure is based on the initial application.