KR930015337U - Variable extension circuit test apparatus - Google Patents
Variable extension circuit test apparatusInfo
- Publication number
- KR930015337U KR930015337U KR2019910024887U KR910024887U KR930015337U KR 930015337 U KR930015337 U KR 930015337U KR 2019910024887 U KR2019910024887 U KR 2019910024887U KR 910024887 U KR910024887 U KR 910024887U KR 930015337 U KR930015337 U KR 930015337U
- Authority
- KR
- South Korea
- Prior art keywords
- test apparatus
- circuit test
- extension circuit
- variable extension
- variable
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019910024887U KR950007502Y1 (en) | 1991-12-30 | 1991-12-30 | A variable circuit tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019910024887U KR950007502Y1 (en) | 1991-12-30 | 1991-12-30 | A variable circuit tester |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930015337U true KR930015337U (en) | 1993-07-28 |
KR950007502Y1 KR950007502Y1 (en) | 1995-09-13 |
Family
ID=19326437
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019910024887U KR950007502Y1 (en) | 1991-12-30 | 1991-12-30 | A variable circuit tester |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR950007502Y1 (en) |
-
1991
- 1991-12-30 KR KR2019910024887U patent/KR950007502Y1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR950007502Y1 (en) | 1995-09-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20000825 Year of fee payment: 6 |
|
LAPS | Lapse due to unpaid annual fee |