KR930015337U - Variable extension circuit test apparatus - Google Patents

Variable extension circuit test apparatus

Info

Publication number
KR930015337U
KR930015337U KR2019910024887U KR910024887U KR930015337U KR 930015337 U KR930015337 U KR 930015337U KR 2019910024887 U KR2019910024887 U KR 2019910024887U KR 910024887 U KR910024887 U KR 910024887U KR 930015337 U KR930015337 U KR 930015337U
Authority
KR
South Korea
Prior art keywords
test apparatus
circuit test
extension circuit
variable extension
variable
Prior art date
Application number
KR2019910024887U
Other languages
Korean (ko)
Other versions
KR950007502Y1 (en
Inventor
도상기
Original Assignee
포항종합제철 주식회사
재단법인산업과학기술연구소
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 포항종합제철 주식회사, 재단법인산업과학기술연구소 filed Critical 포항종합제철 주식회사
Priority to KR2019910024887U priority Critical patent/KR950007502Y1/en
Publication of KR930015337U publication Critical patent/KR930015337U/en
Application granted granted Critical
Publication of KR950007502Y1 publication Critical patent/KR950007502Y1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019910024887U 1991-12-30 1991-12-30 A variable circuit tester KR950007502Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910024887U KR950007502Y1 (en) 1991-12-30 1991-12-30 A variable circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910024887U KR950007502Y1 (en) 1991-12-30 1991-12-30 A variable circuit tester

Publications (2)

Publication Number Publication Date
KR930015337U true KR930015337U (en) 1993-07-28
KR950007502Y1 KR950007502Y1 (en) 1995-09-13

Family

ID=19326437

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910024887U KR950007502Y1 (en) 1991-12-30 1991-12-30 A variable circuit tester

Country Status (1)

Country Link
KR (1) KR950007502Y1 (en)

Also Published As

Publication number Publication date
KR950007502Y1 (en) 1995-09-13

Similar Documents

Publication Publication Date Title
DE69219612D1 (en) Testing device
DE69033792D1 (en) Circuit for testing wire pairs
DE69117042T2 (en) Sampling circuit
DE19680290T1 (en) Circuit test device
DE69216663T2 (en) Circuit
DE69220013D1 (en) DEVELOPMENT DEVICE USING ONE COMPONENT
KR930015989U (en) Memory device test mode circuit
DE69127149D1 (en) Circuit test procedure
DE68928600D1 (en) Extended test circuit
DK0592007T3 (en) Circuit device
KR930015337U (en) Variable extension circuit test apparatus
NO942034D0 (en) Test apparatus
KR920010235U (en) ROM test circuit
DE69115733D1 (en) Circuit element measuring apparatus and method
KR920012950U (en) Device test circuit
KR930003912U (en) Test tone circuit
SE9200300D0 (en) HOT-COMPOSTING APPARATUS
KR940021372U (en) Terminal device for board test
KR920020384U (en) Dividing circuit
KR930015330U (en) IC test circuit
KR950005230U (en) Circuit board inspection device
KR910001198U (en) Circuit board tester
KR940021540U (en) Circuit board parts inspection device
SE9100243D0 (en) DATA CIRCUIT TEST
KR920012958U (en) Short / open test circuit

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20000825

Year of fee payment: 6

LAPS Lapse due to unpaid annual fee