KR920022183U - 핸들러의 콘택트 핑거와 디바이스 리드의 위치감지장치 - Google Patents

핸들러의 콘택트 핑거와 디바이스 리드의 위치감지장치

Info

Publication number
KR920022183U
KR920022183U KR2019910006947U KR910006947U KR920022183U KR 920022183 U KR920022183 U KR 920022183U KR 2019910006947 U KR2019910006947 U KR 2019910006947U KR 910006947 U KR910006947 U KR 910006947U KR 920022183 U KR920022183 U KR 920022183U
Authority
KR
South Korea
Prior art keywords
position detection
lead
contact finger
detection device
finger
Prior art date
Application number
KR2019910006947U
Other languages
English (en)
Other versions
KR940000740Y1 (ko
Inventor
석주한
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019910006947U priority Critical patent/KR940000740Y1/ko
Publication of KR920022183U publication Critical patent/KR920022183U/ko
Application granted granted Critical
Publication of KR940000740Y1 publication Critical patent/KR940000740Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
KR2019910006947U 1991-05-15 1991-05-15 핸들러의 콘택트 핑거와 디바이스 리드의 위치감지장치 KR940000740Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910006947U KR940000740Y1 (ko) 1991-05-15 1991-05-15 핸들러의 콘택트 핑거와 디바이스 리드의 위치감지장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910006947U KR940000740Y1 (ko) 1991-05-15 1991-05-15 핸들러의 콘택트 핑거와 디바이스 리드의 위치감지장치

Publications (2)

Publication Number Publication Date
KR920022183U true KR920022183U (ko) 1992-12-19
KR940000740Y1 KR940000740Y1 (ko) 1994-02-14

Family

ID=19313875

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910006947U KR940000740Y1 (ko) 1991-05-15 1991-05-15 핸들러의 콘택트 핑거와 디바이스 리드의 위치감지장치

Country Status (1)

Country Link
KR (1) KR940000740Y1 (ko)

Also Published As

Publication number Publication date
KR940000740Y1 (ko) 1994-02-14

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