KR920001210A - Die Lister (SCR) - Google Patents

Die Lister (SCR) Download PDF

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Publication number
KR920001210A
KR920001210A KR1019900008774A KR900008774A KR920001210A KR 920001210 A KR920001210 A KR 920001210A KR 1019900008774 A KR1019900008774 A KR 1019900008774A KR 900008774 A KR900008774 A KR 900008774A KR 920001210 A KR920001210 A KR 920001210A
Authority
KR
South Korea
Prior art keywords
relay
die
thyristor
display device
scr
Prior art date
Application number
KR1019900008774A
Other languages
Korean (ko)
Other versions
KR950008432B1 (en
Inventor
전찬욱
Original Assignee
김용원
대우전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김용원, 대우전자 주식회사 filed Critical 김용원
Priority to KR1019900008774A priority Critical patent/KR950008432B1/en
Publication of KR920001210A publication Critical patent/KR920001210A/en
Application granted granted Critical
Publication of KR950008432B1 publication Critical patent/KR950008432B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers

Abstract

내용 없음No content

Description

다이리스터(SCR)합부판정기Die Lister (SCR)

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 발명의 회로도.1 is a circuit diagram of the invention.

Claims (1)

마이크로컴퓨터(7)의 입출력단에 다이리스터(12)의 구동전압을 인가하는 전원단(1)과 저항(R) 차동증폭회로(3) 증폭기(4) A/D변환기(5) 버퍼회로(6)로 이루어진 전류측정회로(13)와 다이리스터(12)단자를 제어하는 릴레이(8)와 그리고 단자 표시장치(10) 또한 다이리스터(12)의 측정결과를 알려주는 양불표시부(11) 및 스타트스위치(SW)를 각각 연결하는 한편 릴레이(8)구동에 의해 접저되는 릴레이 스윗치(SW1-SW3)와 다이리스터(12)간에 소켓(9)으로 접속되도록 하고 단자표시장치(10)의 제어를 트랜지스터(Q1-Q6)턴온 상태에 따라 동작되도록 한 것을 특징으로 하는 다이리스터 합부판정기.A power supply stage 1 and a resistor R differential amplifier circuit 3 for applying the driving voltage of the thyristor 12 to the input / output terminals of the microcomputer 7, the amplifier 4, the A / D converter 5, the buffer circuit ( 6) the current measuring circuit 13 and the relay 8 for controlling the terminal of the die thruster 12, and the terminal display device 10 also the positive display unit 11 for indicating the measurement results of the die thruster 12 and The start switch SW is connected to each other, and the relay switch SW 1 -SW 3 connected by driving the relay 8 and the die thruster 12 are connected to each other by the socket 9 and the terminal display device 10 is A thyristor sum-matcher, characterized in that the control is operated in accordance with the transistor (Q 1 -Q 6 ) turn-on state. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019900008774A 1990-06-15 1990-06-15 Apparatus for testing scr KR950008432B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019900008774A KR950008432B1 (en) 1990-06-15 1990-06-15 Apparatus for testing scr

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019900008774A KR950008432B1 (en) 1990-06-15 1990-06-15 Apparatus for testing scr

Publications (2)

Publication Number Publication Date
KR920001210A true KR920001210A (en) 1992-01-30
KR950008432B1 KR950008432B1 (en) 1995-07-31

Family

ID=19300114

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019900008774A KR950008432B1 (en) 1990-06-15 1990-06-15 Apparatus for testing scr

Country Status (1)

Country Link
KR (1) KR950008432B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010037583A (en) * 1999-10-18 2001-05-15 박용종 Device of judging leakage voltage and gate control function of thyrister

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104777353A (en) * 2015-03-27 2015-07-15 桂林理工大学 Multichannel low-current collection method and system based on single chip microcomputer control

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010037583A (en) * 1999-10-18 2001-05-15 박용종 Device of judging leakage voltage and gate control function of thyrister

Also Published As

Publication number Publication date
KR950008432B1 (en) 1995-07-31

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