KR910010643A - Wafer cleaning method and apparatus - Google Patents

Wafer cleaning method and apparatus Download PDF

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Publication number
KR910010643A
KR910010643A KR1019890017104A KR890017104A KR910010643A KR 910010643 A KR910010643 A KR 910010643A KR 1019890017104 A KR1019890017104 A KR 1019890017104A KR 890017104 A KR890017104 A KR 890017104A KR 910010643 A KR910010643 A KR 910010643A
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KR
South Korea
Prior art keywords
wafer
cleaning
cleaning method
wafer cleaning
rotating
Prior art date
Application number
KR1019890017104A
Other languages
Korean (ko)
Inventor
유정식
히또시 아까오
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019890017104A priority Critical patent/KR910010643A/en
Publication of KR910010643A publication Critical patent/KR910010643A/en

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Abstract

내용 없음No content

Description

웨이퍼 세정방법 및 그 장치Wafer cleaning method and apparatus

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 이 발명의 웨이퍼 세정장치를 개략적으로 나타낸것으로서, 가)는 종단면도, 나)는 부분평면도1 is a schematic view showing the wafer cleaning apparatus of the present invention.

Claims (2)

웨이퍼(1)을 세정액에 넣고 초음파를 발생시켜 세정하는 방법에 있어서, 웨이퍼(1)를 세정용기(4)내에서 회전시키면서 세정하는 웨이퍼의 세정방법.A method for cleaning a wafer by placing the wafer (1) in a cleaning liquid and generating ultrasonic waves, wherein the wafer (1) is cleaned while rotating in the cleaning container (4). 초음파 발생을 이용해 웨이퍼(1)를 세정하는 세정장치에 있어서, 다수개의 홈(8)이 형성되어 있는 카세트(2)의 아래측에 임펠리(6)을 보유하는 축(7)을 회전 가능하게 설치하여 웨이퍼(1)를 회전시키면서 세정함을 특징으로 하는 웨이퍼 세정장치.In the cleaning apparatus for cleaning the wafer 1 using ultrasonic generation, the shaft 7 holding the impeller 6 on the lower side of the cassette 2 in which the plurality of grooves 8 are formed is rotatable. And a wafer cleaning apparatus while rotating the wafer (1). ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019890017104A 1989-11-24 1989-11-24 Wafer cleaning method and apparatus KR910010643A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019890017104A KR910010643A (en) 1989-11-24 1989-11-24 Wafer cleaning method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019890017104A KR910010643A (en) 1989-11-24 1989-11-24 Wafer cleaning method and apparatus

Publications (1)

Publication Number Publication Date
KR910010643A true KR910010643A (en) 1991-06-29

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ID=67661098

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890017104A KR910010643A (en) 1989-11-24 1989-11-24 Wafer cleaning method and apparatus

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KR (1) KR910010643A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101338797B1 (en) * 2002-09-30 2013-12-06 램 리써치 코포레이션 System for substrate processing with meniscus, vacuum, ipa vapor, drying manifold

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101338797B1 (en) * 2002-09-30 2013-12-06 램 리써치 코포레이션 System for substrate processing with meniscus, vacuum, ipa vapor, drying manifold

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A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application