KR910009934U - 측면 측정이 가능한 저배율 현미경 - Google Patents

측면 측정이 가능한 저배율 현미경

Info

Publication number
KR910009934U
KR910009934U KR2019890017415U KR890017415U KR910009934U KR 910009934 U KR910009934 U KR 910009934U KR 2019890017415 U KR2019890017415 U KR 2019890017415U KR 890017415 U KR890017415 U KR 890017415U KR 910009934 U KR910009934 U KR 910009934U
Authority
KR
South Korea
Prior art keywords
low magnification
side measurement
magnification microscope
microscope
measurement
Prior art date
Application number
KR2019890017415U
Other languages
English (en)
Other versions
KR920003026Y1 (ko
Inventor
정지영
Original Assignee
현대전자산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대전자산업 주식회사 filed Critical 현대전자산업 주식회사
Priority to KR2019890017415U priority Critical patent/KR920003026Y1/ko
Publication of KR910009934U publication Critical patent/KR910009934U/ko
Application granted granted Critical
Publication of KR920003026Y1 publication Critical patent/KR920003026Y1/ko

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Wire Bonding (AREA)
KR2019890017415U 1989-11-24 1989-11-24 측면 측정이 가능한 저배율 현미경 KR920003026Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019890017415U KR920003026Y1 (ko) 1989-11-24 1989-11-24 측면 측정이 가능한 저배율 현미경

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019890017415U KR920003026Y1 (ko) 1989-11-24 1989-11-24 측면 측정이 가능한 저배율 현미경

Publications (2)

Publication Number Publication Date
KR910009934U true KR910009934U (ko) 1991-06-29
KR920003026Y1 KR920003026Y1 (ko) 1992-05-18

Family

ID=19292211

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019890017415U KR920003026Y1 (ko) 1989-11-24 1989-11-24 측면 측정이 가능한 저배율 현미경

Country Status (1)

Country Link
KR (1) KR920003026Y1 (ko)

Also Published As

Publication number Publication date
KR920003026Y1 (ko) 1992-05-18

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