KR910008795A - 가열처리장치 - Google Patents
가열처리장치 Download PDFInfo
- Publication number
- KR910008795A KR910008795A KR1019890014445A KR890014445A KR910008795A KR 910008795 A KR910008795 A KR 910008795A KR 1019890014445 A KR1019890014445 A KR 1019890014445A KR 890014445 A KR890014445 A KR 890014445A KR 910008795 A KR910008795 A KR 910008795A
- Authority
- KR
- South Korea
- Prior art keywords
- thermostat
- hot air
- heat treatment
- substrate
- treatment device
- Prior art date
Links
- 238000010438 heat treatment Methods 0.000 title claims description 6
- 239000000758 substrate Substances 0.000 claims 3
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Furnace Details (AREA)
Abstract
내용 없음.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도는 본발명의 일실시예를 도시한 측면도
제3도는 제2도에 도시한 가열처리장치의 상면을 표시한 상면도
제4도는 온도조정수단을 도시한 블록도
Claims (1)
- IC를 장착한 기판을 고온조내에 넣어서 가열상태에서 가열처리를 할수 있는 가열처리장치에 있어서, 상기 항온조를, 정면으로부터 상기 기판을 삽입할 수 있는 전부항온조와 배후로부터 기판을 삽입할 수 있는 후부항온조로 분할함과 동시에, 상기 전부항온조와 상기 후부항온조에 의해서 열풍이 순환하는 열풍순환통로를 형성하고, 전부항온조와 후부항온조에 가열수단 및 열풍을 순환시키는 열풍순환수단을 배설하고, 전부항온조내 및 후부항온조내에 열풍을 균일하게 흐르게 하는 풍향조정수단을 배설하고, 전부항온조내 및 후부항온조내의 온도를 일정하게 유지하는 온도조정수단을 배설해서 이루어진 것을 특징으로 하는 가열처리장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019890014445A KR930002593B1 (ko) | 1989-10-07 | 1989-10-07 | 가열처리장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019890014445A KR930002593B1 (ko) | 1989-10-07 | 1989-10-07 | 가열처리장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR910008795A true KR910008795A (ko) | 1991-05-31 |
KR930002593B1 KR930002593B1 (ko) | 1993-04-03 |
Family
ID=19290526
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890014445A KR930002593B1 (ko) | 1989-10-07 | 1989-10-07 | 가열처리장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR930002593B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100679850B1 (ko) * | 2005-07-13 | 2007-02-07 | 오성엘에스티(주) | 기판 내열성 검사장치 |
-
1989
- 1989-10-07 KR KR1019890014445A patent/KR930002593B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR930002593B1 (ko) | 1993-04-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
LAPS | Lapse due to unpaid annual fee |