KR870015237U - 트랜지스터의 전류이득률 측정회로 - Google Patents

트랜지스터의 전류이득률 측정회로

Info

Publication number
KR870015237U
KR870015237U KR2019860003598U KR860003598U KR870015237U KR 870015237 U KR870015237 U KR 870015237U KR 2019860003598 U KR2019860003598 U KR 2019860003598U KR 860003598 U KR860003598 U KR 860003598U KR 870015237 U KR870015237 U KR 870015237U
Authority
KR
South Korea
Prior art keywords
transistor
circuit
current gain
measuring current
measuring
Prior art date
Application number
KR2019860003598U
Other languages
English (en)
Other versions
KR890004530Y1 (ko
Inventor
감도영
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR2019860003598U priority Critical patent/KR890004530Y1/ko
Publication of KR870015237U publication Critical patent/KR870015237U/ko
Application granted granted Critical
Publication of KR890004530Y1 publication Critical patent/KR890004530Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019860003598U 1986-03-25 1986-03-25 트랜지스터의 전류이득률 측정회로 KR890004530Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019860003598U KR890004530Y1 (ko) 1986-03-25 1986-03-25 트랜지스터의 전류이득률 측정회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019860003598U KR890004530Y1 (ko) 1986-03-25 1986-03-25 트랜지스터의 전류이득률 측정회로

Publications (2)

Publication Number Publication Date
KR870015237U true KR870015237U (ko) 1987-10-24
KR890004530Y1 KR890004530Y1 (ko) 1989-07-08

Family

ID=19249854

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019860003598U KR890004530Y1 (ko) 1986-03-25 1986-03-25 트랜지스터의 전류이득률 측정회로

Country Status (1)

Country Link
KR (1) KR890004530Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100446390B1 (ko) * 1997-12-22 2004-12-03 비오이 하이디스 테크놀로지 주식회사 액정표시소자의트랜지스터의동작체크회로

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100446390B1 (ko) * 1997-12-22 2004-12-03 비오이 하이디스 테크놀로지 주식회사 액정표시소자의트랜지스터의동작체크회로

Also Published As

Publication number Publication date
KR890004530Y1 (ko) 1989-07-08

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Payment date: 19970829

Year of fee payment: 11

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