KR870010807U - 프린터의 내장기능 테스트회로 - Google Patents

프린터의 내장기능 테스트회로

Info

Publication number
KR870010807U
KR870010807U KR2019850018213U KR850018213U KR870010807U KR 870010807 U KR870010807 U KR 870010807U KR 2019850018213 U KR2019850018213 U KR 2019850018213U KR 850018213 U KR850018213 U KR 850018213U KR 870010807 U KR870010807 U KR 870010807U
Authority
KR
South Korea
Prior art keywords
printer
built
test circuit
function test
function
Prior art date
Application number
KR2019850018213U
Other languages
English (en)
Other versions
KR900008092Y1 (ko
Inventor
조종원
김상무
이경섭
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR2019850018213U priority Critical patent/KR900008092Y1/ko
Publication of KR870010807U publication Critical patent/KR870010807U/ko
Application granted granted Critical
Publication of KR900008092Y1 publication Critical patent/KR900008092Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts
KR2019850018213U 1985-12-30 1985-12-30 프린터의 내장기능 테스트회로 KR900008092Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019850018213U KR900008092Y1 (ko) 1985-12-30 1985-12-30 프린터의 내장기능 테스트회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019850018213U KR900008092Y1 (ko) 1985-12-30 1985-12-30 프린터의 내장기능 테스트회로

Publications (2)

Publication Number Publication Date
KR870010807U true KR870010807U (ko) 1987-07-13
KR900008092Y1 KR900008092Y1 (ko) 1990-09-03

Family

ID=19247760

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019850018213U KR900008092Y1 (ko) 1985-12-30 1985-12-30 프린터의 내장기능 테스트회로

Country Status (1)

Country Link
KR (1) KR900008092Y1 (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010086833A (ko) * 2000-03-03 2001-09-15 이용길 지압매트 및 그 제조방법
KR100448094B1 (ko) * 2001-12-20 2004-09-13 주식회사 이이엠 유해 전자파 흡수 중화기능을 갖는 매트용 지압부재

Also Published As

Publication number Publication date
KR900008092Y1 (ko) 1990-09-03

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