KR840003841A - 와전류 프로우브(probe)용 공급 회로 - Google Patents
와전류 프로우브(probe)용 공급 회로 Download PDFInfo
- Publication number
- KR840003841A KR840003841A KR1019830000539A KR830000539A KR840003841A KR 840003841 A KR840003841 A KR 840003841A KR 1019830000539 A KR1019830000539 A KR 1019830000539A KR 830000539 A KR830000539 A KR 830000539A KR 840003841 A KR840003841 A KR 840003841A
- Authority
- KR
- South Korea
- Prior art keywords
- terminal
- input
- amplifier
- circuit
- supply circuit
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims description 8
- 238000004804 winding Methods 0.000 claims 3
- 230000003321 amplification Effects 0.000 claims 1
- 239000004020 conductor Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 238000003199 nucleic acid amplification method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Landscapes
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Electrochemistry (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Medicines Containing Material From Animals Or Micro-Organisms (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Measuring Leads Or Probes (AREA)
- Coloring Foods And Improving Nutritive Qualities (AREA)
- Jellies, Jams, And Syrups (AREA)
- Materials For Medical Uses (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따른 와전류 프로우브용 공급 회로의 블록 다이어그램
Claims (3)
- 케이블을 통해 프로우브에 연결된 2개의 병렬 공급 회로들을 구성한 두 권선들을 가진 과전류 프로우브용 공급 회로에서, 사기 각 채널은 입, 출력 단자를 가지는 증폭 회로와 기준 권선을 합하였고, 상기 기준 권선의 한 단부 단자는 상기 증폭 회로의 출력단자에 연결되고 나머지 한 다른 단부 단자는 부귀한정항기를 통해 상기 회로의 입력단자에 연결되고, 상기 각 채널의 증폭 회로는 상기 증폭 회로의 입력을 구성하는 입력 단자의 절대 측정치 엑세스 단자에 연결된 출력 단자를 가지는 제1 증폭기와, 한 단부 단자가 제1 증폭기의 출력 단자에 연결된 제1 저항기와, 상기 제1 저항기의 다른 단부 단자에 연결된 출력 단자와 상기 증폭회로의 출력을 구성하는 출력단자를 가지는 제2 증폭기와, 상기 제2 증폭기의 입, 출력 단자 사이에 연결된 제2 저항기로 구성된 것을 특징으로 하는 과전류 프로우브용 공급회로.
- 제1항에 있어서, 공급 채널들에 프로우브를 연결하는 상기 케이블은 증폭기를 통해 상기 채널들의 한 입력단자에 연결된 가아드 링 내에 배치된 2개의 꼬여진 컨덕터들로 구성된 것을 특징으로 하는 과전류프로우브용 공급 회로.
- 제1항에 있어서, 제2 증폭기 각각의 입력 단자는 평형 입력 단자에 연결된 것을 특징으로 하는 과전류 프로우브용 공급회로.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8202171A FR2521296A1 (fr) | 1982-02-10 | 1982-02-10 | Circuit d'alimentation d'une sonde a courants de foucault |
| FR8202171 | 1982-02-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR840003841A true KR840003841A (ko) | 1984-10-04 |
Family
ID=9270860
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019830000539A KR840003841A (ko) | 1982-02-10 | 1983-02-10 | 와전류 프로우브(probe)용 공급 회로 |
Country Status (12)
| Country | Link |
|---|---|
| US (1) | US4529936A (ko) |
| EP (1) | EP0086158B1 (ko) |
| JP (1) | JPS58184541A (ko) |
| KR (1) | KR840003841A (ko) |
| AT (1) | ATE17607T1 (ko) |
| CA (1) | CA1206525A (ko) |
| DE (1) | DE3361876D1 (ko) |
| DK (1) | DK55283A (ko) |
| ES (1) | ES8401256A1 (ko) |
| FR (1) | FR2521296A1 (ko) |
| MX (1) | MX152485A (ko) |
| NO (1) | NO830418L (ko) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4855677A (en) * | 1988-03-11 | 1989-08-08 | Westinghouse Electric Corp. | Multiple coil eddy current probe and method of flaw detection |
| FR2735924B1 (fr) * | 1995-06-20 | 1997-09-12 | Intercontrole Sa | Oscillateur numerique et circuit d'alimentation d'une sonde a courants de foucault |
| CN108562641A (zh) * | 2018-04-17 | 2018-09-21 | 西南大学 | 一种基于电涡流传感器的电缆芯材质检测装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3683671A (en) * | 1970-09-14 | 1972-08-15 | Univ Kansas State | Measuring system including thermal conductivity detector means |
| US3683681A (en) * | 1971-03-19 | 1972-08-15 | Ruei E Taylor Inc | Method and apparatus for softness testing |
| IL42203A (en) * | 1973-05-04 | 1976-06-30 | Univ Bar Ilan | A bridge circuit for measuring low values of resistance |
| JPS5177378A (en) * | 1974-12-27 | 1976-07-05 | Nippon Kokan Kk | Denjudoshikikenshutsusochi |
| FR2339170A1 (fr) * | 1976-01-22 | 1977-08-19 | Commissariat Energie Atomique | Pont de mesure pour dispositif de controle par courants de foucault |
-
1982
- 1982-02-10 FR FR8202171A patent/FR2521296A1/fr active Granted
-
1983
- 1983-02-07 AT AT83400261T patent/ATE17607T1/de not_active IP Right Cessation
- 1983-02-07 EP EP83400261A patent/EP0086158B1/fr not_active Expired
- 1983-02-07 DE DE8383400261T patent/DE3361876D1/de not_active Expired
- 1983-02-09 NO NO830418A patent/NO830418L/no unknown
- 1983-02-09 DK DK55283A patent/DK55283A/da not_active Application Discontinuation
- 1983-02-09 US US06/465,058 patent/US4529936A/en not_active Expired - Fee Related
- 1983-02-10 MX MX196221A patent/MX152485A/es unknown
- 1983-02-10 ES ES519689A patent/ES8401256A1/es not_active Expired
- 1983-02-10 CA CA000421352A patent/CA1206525A/fr not_active Expired
- 1983-02-10 JP JP58019844A patent/JPS58184541A/ja active Granted
- 1983-02-10 KR KR1019830000539A patent/KR840003841A/ko not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| US4529936A (en) | 1985-07-16 |
| NO830418L (no) | 1983-08-11 |
| CA1206525A (fr) | 1986-06-24 |
| DK55283D0 (da) | 1983-02-09 |
| FR2521296B1 (ko) | 1984-04-27 |
| JPH0342428B2 (ko) | 1991-06-27 |
| JPS58184541A (ja) | 1983-10-28 |
| EP0086158B1 (fr) | 1986-01-22 |
| DE3361876D1 (en) | 1986-03-06 |
| ES519689A0 (es) | 1983-12-01 |
| ATE17607T1 (de) | 1986-02-15 |
| EP0086158A1 (fr) | 1983-08-17 |
| DK55283A (da) | 1983-08-11 |
| MX152485A (es) | 1985-08-08 |
| FR2521296A1 (fr) | 1983-08-12 |
| ES8401256A1 (es) | 1983-12-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |