KR830006707A - Focus detection method and device - Google Patents

Focus detection method and device Download PDF

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Publication number
KR830006707A
KR830006707A KR1019810003016A KR810003016A KR830006707A KR 830006707 A KR830006707 A KR 830006707A KR 1019810003016 A KR1019810003016 A KR 1019810003016A KR 810003016 A KR810003016 A KR 810003016A KR 830006707 A KR830006707 A KR 830006707A
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South Korea
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light
electric
electro
objective lens
reflected
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KR1019810003016A
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Korean (ko)
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KR850000421B1 (en
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도오루 무샤
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기다무라 시게오
오림파스 고오가꾸 고오교 가부시끼 가이샤
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/30—Systems for automatic generation of focusing signals using parallactic triangle with a base line
    • G02B7/32—Systems for automatic generation of focusing signals using parallactic triangle with a base line using active means, e.g. light emitter
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/08—Disposition or mounting of heads or light sources relatively to record carriers
    • G11B7/09—Disposition or mounting of heads or light sources relatively to record carriers with provision for moving the light beam or focus plane for the purpose of maintaining alignment of the light beam relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following
    • G11B7/0908—Disposition or mounting of heads or light sources relatively to record carriers with provision for moving the light beam or focus plane for the purpose of maintaining alignment of the light beam relative to the record carrier during transducing operation, e.g. to compensate for surface irregularities of the latter or for track following for focusing only

Abstract

내용 없음No content

Description

초점 검출방법Focus detection method

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제2도는 본 발명에 의한 초점 검출방법을 실시하고 광학적 판독장치의 요부의 일예의 구성을 나타내는 선도.2 is a diagram showing the configuration of an example of a main portion of an optical reading apparatus for implementing the focus detection method according to the present invention.

제3도는 일계각 근방에서의 투과광강도의 일예를 나타내는 선도.3 is a diagram showing an example of transmitted light intensity in the vicinity of a single angle.

제4도는 초점오차신호를 독출하는 회로의 일에의 구성을 나타내는 회로도.4 is a circuit diagram showing the configuration of a circuit for reading out a focus error signal.

제5도는 본 발명에 의한 초점검출 방법을 실시하는 광학적 판독장치예의 다른외의 요부의 구성을 나타내는 선도.5 is a diagram showing the configuration of other main parts of an example of an optical reading apparatus for performing a focus detection method according to the present invention.

제6도는 본 발명에 의한 초점검출방법을 실시하는 광학적 판독장치의 요부 구성의 일부 변형예를 나타내는 선도.Fig. 6 is a diagram showing some modifications of the main configuration of the optical reading device for implementing the focus detection method according to the present invention.

Claims (12)

광원으로부터 사출된 광을 대물렌즈에 의하여 피조사 물체상에 집속시켜서 그 반사광의 적어도 일부를 그 반사 광속중의 하나의 광선에 대하여 거의 임계각이 되도록 설정한 반사면을 갖는 광학부재에 입사시키고, 이 광학부재의 반사면에서 굴절된 투과광의 광량분포의 변화를 검출함으로써 전기대물렌즈의 전기피조사물체에 대하여 초점오차신호를 얻음을 특징으로 하는 초점검출방법.The light emitted from the light source is focused on the irradiated object by the objective lens, and at least a part of the reflected light is incident on an optical member having a reflecting surface set to be almost at a critical angle with respect to one of the reflected light beams. A focus detection method, characterized in that a focus error signal is obtained for an object to be irradiated of an electric objective lens by detecting a change in the light amount distribution of transmitted light refracted by the reflecting surface of the optical member. 전기광학부재에 입사시키는 전기피조사 물체로 부터의 반사광을 전기광학부재의 반사면에 대하여 P편광이 되도록 설정함을 특징으로 하는 특허청구의 범위 제1항 기재의 초점검출방법.The focus detection method according to claim 1, wherein the reflected light from the electro-irradiated object incident on the electro-optic member is set to be P-polarized light with respect to the reflecting surface of the electro-optic member. 전기광학부재에서의 반사회수를 복수회로함을 특징으로 하는 특허청구의 범위 제1항 기재의 초점검출방법.A focus detection method according to claim 1, wherein the number of times of reflection in the electro-optical member is repeated. 전기광학부재와 광원과의 사이에 편광프리즘을 배치하고, 전기광원으로부터 조사되는 편광을 이 편광프리즘을 거쳐서 전기광학부재의 반사면에서 전반사시켜서 전기피조사물체에 입사시키고, 이 피조사물체로부터의 반사광중 전기광학부재의 반사면에서 굴절된 투과광의 광량분포의 변화를 검출함을 특징으로 하는 특허청구의 범위 제1항 기재의 초점검출방법.A polarizing prism is arranged between the electro-optical member and the light source, and the polarized light irradiated from the electric light source is totally reflected on the reflecting surface of the electro-optic member via the polarizing prism to be incident on the electro-irradiated object. A focus detection method according to claim 1, characterized by detecting a change in the light quantity distribution of transmitted light refracted by the reflecting surface of the electro-optical member among the reflected light. 광원으로부터 사출된 광을 대물렌즈에 의하여 피조사물체상에 집속시켜서 그 반사광을 전기대물렌즈가 전기피조사물체에 대하여 합초상태에 있을때에 거의 평행광이 되도록 하고, 이 반사광의 적어도 일부를 그 반사광속의 광축에 대하여 거의 임계각이 되도록 설정한 반사면을 갖는 광학부재에 입사시켜서 이 광학부재의 반사면에 되굴절된 투과광의 광량분포의 변화를 검출함으로써 전기대물렌즈의 전기피조사물체에 대한 초점오차신호를 얻음을 특징으로 하는 초점검출방법.The light emitted from the light source is focused on the irradiated object by the objective lens so that the reflected light becomes almost parallel light when the electric objective lens is in a focal state with respect to the electric irradiated object, and at least a part of the reflected light is reflected light. The focal error of the electric objective lens with respect to the electric irradiated object by detecting the change in the light quantity distribution of the transmitted light refracted by the optical member having a reflecting surface set to be substantially at a critical angle with respect to the optical axis of the light. Focus detection method characterized in that a signal is obtained. 전기광학부재와 광원과의 사이에 편광프리즘을 배치하고, 전기광원으로부터 사출된 편광을 이 편광프리즘을 거쳐서 전기광학부재의 반사면에서 전반사시켜서 전기피조사물체에 입사시키고, 이 피조사물체로부터의 반사광중 전기광학부재의 반사면에서 굴절된 투과광의 광량분포의 변화를 검출함을 특징으로 하는 특허청구의 범위 제5항 기재의 초점검출방법.The polarizing prism is disposed between the electro-optical member and the light source, and the polarized light emitted from the electric light source is totally reflected on the reflecting surface of the electro-optic member via the polarizing prism, and then incident on the electro-exposed object, A focus detection method according to claim 5, characterized by detecting a change in the light quantity distribution of transmitted light refracted at the reflecting surface of the electro-optical member among the reflected light. 전기광학부재에 입사시키는 전기피조사물체로 부터의 반사광을 전기광학부재의 반사면에 대하여 P편광이 되도록 설정함을 특징으로 하는 특허청구의 범위 제5항 또는 제6항 기재의 초점검출방법.The focus detection method according to claim 5 or 6, wherein the reflected light from the electro-exposed object incident on the electro-optic member is set to be P-polarized light with respect to the reflecting surface of the electro-optic member. 전기광학부재에서의 반사회수를 복수회로함을 특징으로 하는 특허청구의 범위 제5항 또는 제6항 기재의 초점검출방법.The focus detection method according to claim 5 or 6, wherein the number of reflections in the electro-optic member is circulated. 광원으로부터 방사된 광을 집속시켜서 피조사물체에 조사하는 대물렌즈와, 이 대물렌즈와 전기광원과의 사이에 배치되어 전기광원으로 부터의 광을 그 대물렌즈에 도입함과 동시에 전기 피조사물체에서 반사되고, 그 대물렌즈에서 집광된 반사광의 적어도 일부의 광속을 입사되도록 배치되고, 전기반사광의 광축 또는 입사하는 반사광속중의 하나의 광선에 대하여 거의 임계각이 되도록 설정한 반사면을 갖는 검출 프리즘을 구비하고, 이 검출프리즘의 반사면에서 굴절된 투과광의 광량분포의 변화를 적어도 2개의 광검출기에 의하여 검출하여 전기대물렌즈의 전기피조사물체에 대한 초점오차신호를 얻도록 구성함을 특징으로 하는 초점검출장치.An objective lens that focuses the light emitted from the light source and irradiates the irradiated object, and is disposed between the objective lens and the electric light source to introduce light from the electric light source into the objective lens, A detection prism having a reflecting surface that is reflected and is arranged to receive at least a part of the light beam of the reflected light collected by the objective lens, and is set to be substantially at a critical angle with respect to one of the optical axes of the reflected light or the incident reflected light beam. And detecting a change in the light amount distribution of the transmitted light refracted by the reflecting surface of the detection prism by at least two photodetectors to obtain a focus error signal for the electric irradiated object of the electric objective lens. Focus detection device. 전기 피조사물체를 정보신호를 기록한 광학식 디스크로 하고, 전기검출 프리즘의 반사면에서 반사되는 반사광을 수광하여 전기디스크에 기록한 정보신호를 재생하는 제3의 광검출기를 설치함을 특징으로 하는 특허청구의 범위 제9항 기재의 초점검출장치.Claims characterized in that the object to be irradiated is an optical disk on which an information signal is recorded, and a third photodetector for receiving the reflected light reflected from the reflecting surface of the electrical detection prism and reproducing the information signal recorded on the electrical disk. Scope detection apparatus according to claim 9. 광원으로부터 방사된 광을 집속시켜서 피조사물체에 조사하는 대물렌즈와 이 대물렌즈와 전기광원과의 사이에 배치도고, 전기광원으로부터의 광을 대물렌즈에 도입함과 동시에 전기 피조사물체에서 반사되어 대물렌즈에서 집광된 반사광을 전기광원에 도입하도록 전기대물렌즈와 광원과의 사이에서 전기반사광의 적어도 일부의 광속을 입사하도록 배치되고, 전기반사광의 광측 또는 입사하는 반사광속중의 하나의 광선에 대하여 거의 임계각이 되도록 설정한 반사면을 갖는 검출프릴즘과 이 검출프리즘의 반사면에서 굴절된 투과광의 광량분포의 변화를 검출하는 적어도 2개의 광검출기를 구비하고, 이들 광검출기의 출력에 의하여 전기대물렌즈의 전기피조사물체에 대한 초점오차신호를 얻도록 구성함을 특징으로 하는 초점검출장치.The light emitted from the light source is focused and disposed between the objective lens and the object to be irradiated to the irradiated object, and the light from the electric light source is introduced into the objective lens and simultaneously reflected by the object to be irradiated. Disposed so as to inject a light beam of at least a portion of the electric reflection light between the electric objective lens and the light source so as to introduce the reflected light collected by the objective lens into the electric light source, and with respect to one of the light beams of the electric reflection light or the incident reflected light beam A detection prism having a reflection surface set to be substantially at a critical angle, and at least two photodetectors for detecting a change in the light quantity distribution of transmitted light refracted by the reflection surface of the detection prism, and the output of these photodetectors Focus detection device, characterized in that configured to obtain a focus error signal for the object to be irradiated of the lens. 전기광원을 반도체 레이저로 함과 동시에 전기 피조사물체를 정보신호를 기록한 광학식 디스크로하고, 전기반도체 레이저의 자기결합효과에 의하여 전기디스크로 부터의 반사광의 강도변화에 따라서 변화하는 반도체 레이저의 단자전압을 검출하여 전기정보신로르 재새어하는 수단을 구비함을 특징으로 하는 특허청구의 범위 제11항 기재의 초점검출장치.The terminal voltage of the semiconductor laser which changes as the intensity of the reflected light from the electric disk changes due to the magnetic coupling effect of the electric semiconductor laser. A focus detection apparatus according to claim 11, characterized in that it comprises means for detecting and reseating electrical information. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019810003016A 1980-08-19 1981-08-19 Forcus detecting method KR850000421B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP55-114463 1980-08-19
JP11446380A JPS5738405A (en) 1980-08-19 1980-08-19 Method and device for detection of focal point
JP114463 1981-07-23

Publications (2)

Publication Number Publication Date
KR830006707A true KR830006707A (en) 1983-10-06
KR850000421B1 KR850000421B1 (en) 1985-03-26

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ID=14638361

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019810003016A KR850000421B1 (en) 1980-08-19 1981-08-19 Forcus detecting method

Country Status (2)

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JP (1) JPS5738405A (en)
KR (1) KR850000421B1 (en)

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Publication number Publication date
KR850000421B1 (en) 1985-03-26
JPS5738405A (en) 1982-03-03
JPS6343813B2 (en) 1988-09-01

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