KR20240005458A - Multilayer ceramic capacitor for snubber - Google Patents

Abstract

The present invention relates to a multilayer ceramic capacitor for a snubber, which includes a fired chip formed by firing a green chip, a first external electrode formed on one end of the fired chip, and a second external electrode formed on the other end of the fired chip. It includes electrodes, and the green chip includes a plurality of first green sheets sequentially stacked on each other, a plurality of second green sheets stacked on the upper or lower side of the first green sheet, and one side connected to the first external electrode. A plurality of first heavy-edge internal electrodes each formed on the surface of the first green sheet so that the end is aligned with the end of one side of the first green sheet and the end of the other side is spaced apart from the end of the other side of the first green sheet; 2 A plurality of second green sheets are formed on the surface of the second green sheet, with the other end aligned with the other end of the second green sheet to be connected to the external electrode, and the end of one side spaced apart from the end of one side of the second green sheet. It is characterized by including a heavy edge internal electrode.

Description

Multilayer ceramic capacitor for snubber}

The present invention relates to a multilayer ceramic capacitor for a snubber. In particular, the ESR characteristics are improved by increasing the contact area with the external electrode by applying a heavy edge internal electrode as the internal electrode of the multilayer ceramic capacitor, so that it can be used at high voltage, has a long life, and is suitable for SMD. It relates to a multilayer ceramic capacitor for snubbers that is easy to use and can provide temperature stability at high voltage.

For power semiconductor devices, SiC MOSFET (silicon carbide metal oxide semiconductor field effect tansistor) or IGBT (insulat gate bipolar transistor) are used. Power semiconductor devices are used in electric vehicles and industrial electronic devices and are used as switching devices to convert alternating current to direct current or direct current to alternating current. In power semiconductors, a snubber capacitor is used to prevent an excessive increase in voltage that occurs momentarily during switching, and the technology related to a device using a snubber capacitor is disclosed in Korean Patent Publication No. 10-2010-0042905 (Patent Document 1). ) is disclosed.

Patent Document 1 relates to an inverter with improved cooling performance of the snubber capacitor. The mounting structure and shape of the snubber capacitor used to prevent excessive increase in the switching voltage in the inverter and to prevent the IGBT power module from being damaged by overvoltage. By improving the cooling performance and durability of the snubber capacitor in the inverter, it is also possible to improve the power density of the inverter.

Conventional capacitors for snubbers, such as those in Patent Document 1, use film capacitors, and film capacitors with heavy edge electrodes are used to improve ESR (equivalent series resistance) characteristics when electrically connected to the outside, thereby increasing high voltage. Although it can be used in and has a long lifespan, there is a problem in that it is not easy to apply for SMD (surface mounted devices).

: Korea Patent Publication No. 10-2010-0042905

The purpose of the present invention is to solve the above-mentioned problems. By applying a heavy-edge internal electrode as the internal electrode of a multilayer ceramic capacitor to increase the contact area with the external electrode, the ESR characteristics are improved, so that it can be used at high voltage, has a long life, and is suitable for SMD use. The aim is to provide a multilayer ceramic capacitor for snubber that is easy to use and can provide temperature stability at high voltage.

Another object of the present invention is to secure a sufficient gap from the upper or lower surface of the fired chip to the heavy edge internal electrode to prevent flash over phenomenon due to insulation breakdown when an instantaneous high voltage (high surge) occurs. The present invention provides a multilayer ceramic capacitor for a snubber that can prevent heat generation or cracks due to instantaneous high current generation, and can improve moisture resistance characteristics by applying a silane layer to the surface of the fired chip.

The present invention relates to a multilayer ceramic capacitor for a snubber, which includes a fired chip formed by firing a green chip, a first external electrode formed on one end of the fired chip, and a first external electrode formed on the other end of the fired chip. It includes a second external electrode, and the green chip includes a plurality of first green sheets that are sequentially stacked on each other, a plurality of second green sheets that are stacked on an upper or lower side of the first green sheet, and , a plurality of plates each formed on the surface of the first green sheet so as to be connected to the first external electrode, the end of one side of which is aligned with the end of one side of the first green sheet, and the end of the other side is spaced apart from the end of the other side of the first green sheet. The first heavy edge internal electrode and the other end connected to the second external electrode are aligned with the other end of the second green sheet, and one end is aligned with the other end of the second green sheet. It includes a plurality of second heavy-edge internal electrodes spaced apart from each other on the surface of the second green sheet, wherein each of the plurality of first green sheets has a first heavy-edge internal electrode connected to a first external electrode and a second external electrode. They are sequentially stacked and pressed to be spaced apart from the electrodes, and the plurality of second green sheets are aligned so that the first heavy edge internal electrode is spaced apart from the first external electrode and connected to the second heavy edge internal electrode and the second external electrode, respectively. laminated and then pressed, the first heavy edge internal electrode has a thickness of one end connected to the first external electrode greater than the thickness of the other end, and the second heavy edge internal electrode is formed with a second external electrode. It is characterized in that the thickness of the other end connected to is formed to be larger than the thickness of the end of one side.

The multilayer ceramic capacitor for snubber of the present invention improves ESR characteristics by increasing the contact area with the external electrode by applying a heavy edge internal electrode as the internal electrode of the multilayer ceramic capacitor. It can be used at high voltage, has a long life, and is easy to use for SMD. It has the advantage of providing temperature stability at high voltages.

The multilayer ceramic capacitor for snubber of the present invention also secures a sufficient gap from the upper or lower surface of the fired chip to the heavy edge internal electrode to prevent flashover due to insulation breakdown when an instantaneous high voltage (high surge) occurs. over) phenomenon or prevent heat generation or cracks due to instantaneous high current generation, and have the advantage of improving moisture resistance characteristics by applying a silane layer to the surface of the fired chip.

1 is a perspective view of a multilayer ceramic capacitor for a snubber of the present invention;
Figure 2 is a cross-sectional view taken along line AA of the multilayer ceramic capacitor for snubber shown in Figure 1;
Figure 3 is a front cross-sectional view of the green chip shown in Figure 1 showing the state before firing;
Figure 4 is a perspective view of a first green sheet on which a first heavy-edge internal electrode is formed according to an embodiment shown in Figure 3;
Figure 5 is a front cross-sectional view taken along line BB of the first green sheet shown in Figure 4;
Figure 6 is a perspective view of a second green sheet on which a second heavy-edge internal electrode is formed according to an embodiment shown in Figure 3;
Figure 7 is a front cross-sectional view taken along line CC of the second green sheet shown in Figure 6;
Figure 8 is a perspective view of a first green sheet on which a first heavy-edge internal electrode is formed according to another embodiment shown in Figure 3;
Figure 9 is a perspective view of a second green sheet on which a second heavy edge internal electrode is formed according to another embodiment shown in Figure 3.

Hereinafter, an embodiment of the multilayer ceramic capacitor for a snubber of the present invention will be described with reference to the attached drawings.

1 to 3 and 5, the multilayer ceramic capacitor for a snubber of the present invention includes a fired chip 100, a first external electrode 200, and a second external electrode 300.

The fired chip 100 is formed by firing a green chip 100a, the first external electrode 200 is formed at one end of the fired chip 100, and the second external electrode 300 is It is formed at the other end of the fired chip 100. The green chip 100a includes a plurality of first green sheets 110, a plurality of second green sheets 120, a plurality of first heavy edge internal electrodes 130, and a plurality of It is configured to include a second heavy edge internal electrode 140. A plurality of first green sheets 110 are sequentially stacked in the vertical direction (Z), and a plurality of second green sheets 120 are respectively placed on the upper or lower side of the first green sheet 110. They are stacked in place. Each of the plurality of first heavy edge internal electrodes 130 is connected to the first external electrode 200, so that one end is aligned with one end of the first green sheet 110, and the other end is connected to the first green sheet ( It is formed on the surface of the first green sheet 110 to be spaced apart from the other end of 110). Each of the plurality of second heavy edge internal electrodes 140 is connected to the second external electrode 300, so that the other end is aligned with the other end of the second green sheet 120, and one end is connected to the second green sheet ( It is formed on the surface of the second green sheet 120 to be spaced apart from one end of the 120). The plurality of first green sheets 110 are sequentially stacked and pressed so that the first heavy edge internal electrode 130 is connected to the first external electrode 200 and spaced apart from the second external electrode 300, and a plurality of first green sheets 110 are formed. The second green sheet 120 is sequentially stacked with the second heavy edge internal electrodes 140 aligned to be spaced apart from the first external electrode 200 and connected to the second external electrode 300, and then pressed. The first heavy edge internal electrode 130 has a thickness (T1 + T2) of one end connected to the first external electrode 200 greater than the thickness (T12) of the other end (T1 + T32), 2 The heavy edge internal electrode 140 has a thickness (T4+T5) of the other end connected to the second external electrode 300 greater than the thickness (T4+T62) of one end.

The configuration according to an embodiment of the multilayer ceramic capacitor for a snubber of the present invention will be described as follows.

As shown in FIGS. 1 and 2, the fired chip 100 has a silane-based insulating coating layer 111 formed on the surface except for one end or the other end to improve moisture resistance, and the material of the silane-based insulating coating layer 111 is A silane-based coating agent is used, and the silane-based coating agent is used by mixing silane mixture, isopropanol group, and acetyl alcohol, and the silane mixture is used by mixing aminopropyltriethoxysilane and glycythoxypropyltriepoxysilane. This predetermined chip 100 is formed by firing the green chip 100a shown in FIG. 3.

As shown in FIG. 3, the green chip 100a includes a plurality of first green sheets 110, a plurality of second green sheets 120, a plurality of first heavy edge internal electrodes 130, and a plurality of second heavy edge electrodes. It is composed of an internal electrode 140, a green sheet 150 for the first cover, and a green sheet 160 for the second cover.

The first heavy edge internal electrode 130 is connected to the first external electrode 200 and is spaced apart from the second external electrode 300 by forming a plurality of first green sheets 110 and a plurality of second green sheets 120. The second heavy edge internal electrode 140 is spaced apart from the first external electrode 200 and is aligned and connected to the second external electrode 300, stacked, and then pressed. That is, the green chip 100a is formed by sequentially stacking and pressing a plurality of first green sheets 110, each of which has a first heavy edge internal electrode 120 connected to the first external electrode 200, formed on the upper surface. In addition, the second heavy-edge internal electrode 140 connected to the second external electrode 300 is formed on the upper surface of each, and the second heavy-edge internal electrode 140 is connected to the first heavy-edge internal electrode 120. A plurality of second green sheets 130 are sequentially stacked and pressed so that they are positioned on the upper or lower side of the first green sheet 110 so as to cross each other.

As shown in FIGS. 3 to 5, the first heavy edge internal electrode 130 has a thickness (T1+T2) of one end connected to the first external electrode 200 and a thickness (T1+T32) of the other end. It is formed larger and includes a first internal electrode 131, a first heavy edge electrode 132, and a first inclined electrode 133.

The first internal electrode 131 is connected to the first external electrode 200, so that one end is aligned with one end of the first green sheet 110, and the other end is aligned with the other end of the first green sheet 110. It is formed on the upper surface of the first green sheet 110 to be spaced apart from the end. The first heavy edge electrode 132 is formed on the upper surface of the first internal electrode 131 with one end aligned with one end of the first internal electrode 131 to be connected to the first external electrode 200. do. The first inclined electrode 133 is connected to the other end of the first heavy edge electrode 132, and the upper surface of the first internal electrode 131 is inclined in the direction from one end to the other end. ) is formed on the upper surface of the.

The sum (T1+T2) of the thickness (T1) of one end of the first internal electrode (131) of the first heavy edge internal electrode (130) and the thickness (T2) of one end of the first heavy edge electrode (132). ) That is, the thickness (T1 + T2) of one end of the first heavy edge internal electrode 130 is the thickness (T1) of the other end of the first internal electrode 131 and the thickness of the first inclined electrode 133. The sum of the thicknesses (T32) of the ends of the other side (T1 + T32), that is, is formed to be larger than the thickness (T1 + T32) of the ends of the other side. In this first heavy edge internal electrode 130, the reference for one side and the other side is set in the longitudinal direction (X: shown in FIGS. 1 to 5) of the first heavy edge internal electrode 130.

As shown in FIGS. 3, 6, and 7, the second heavy edge internal electrode 140 has a thickness (T4 + T5) of the other end connected to the second external electrode 300, and is equal to the thickness (T4) of one end. +T62) and includes a second internal electrode 141, a second heavy edge electrode 142, and a second inclined electrode 143.

The second internal electrode 141 is connected to the second external electrode 300, so that the other end is aligned with the other end of the second green sheet 120, and one end is aligned with one side of the second green sheet 120. It is formed on the upper surface of the second green sheet 120 to be spaced apart from the end. The second heavy edge electrode 142 is formed on the upper surface of the second internal electrode 141 so as to be connected to the second external electrode 300 and the other end is aligned with the other end of the second internal electrode 141. and the other end is connected to the second external electrode 300. The second inclined electrode 143 is connected from one end of the second heavy edge electrode 142 to the other end, and the upper surface of the second internal electrode 141 is inclined in the direction from the other end to the one end. ) is formed on the upper surface of the.

The sum of the thickness (T4) of the other end of the second internal electrode 141 of the second heavy edge internal electrode 140 and the thickness (T5) of the other end of the second heavy edge electrode 142 (T4 + T5) ) That is, the thickness (T4) of one end of the second internal electrode 141 and the second inclined electrode 143 are greater than the thickness (T4+T5) of the other end of the second heavy edge internal electrode 140. The sum of the thicknesses (T62) of one end (T4+T62), that is, is greater than the thickness (T4+T62) of the other end of the second heavy edge internal electrode 140. In this second heavy edge internal electrode 140, the reference for one side and the other side is the longitudinal direction (X: shown in FIGS. 1, 2, 3, 6, and 7, respectively) of the second heavy edge internal electrode 140. ) is set.

As described above, the thickness T1 of the first internal electrode 131 and the thickness of the second internal electrode 141 included in the first heavy edge internal electrode 130 and the second heavy edge internal electrode 140, respectively. (T4) are formed to be equal to each other, and the thickness (T2) of the first heavy edge electrode 132 and the thickness (T5) of the second heavy edge electrode 142 are formed to be equal to each other. The thickness T31 of one end of the first inclined electrode 133 and the thickness T32 of the other end of the second inclined electrode 143 are formed to be the same, and the first inclined electrode 133 The thickness T32 of the other end of the second inclined electrode 143 and the thickness T62 of the other end of the second inclined electrode 143 are formed to be equal to each other. The thickness T31 of one end of the first inclined electrode 133 is larger than the thickness T32 of the other end, and the thickness T62 of one end of the second inclined electrode 143 is greater than the thickness T32 of the other end. It is formed smaller than the thickness (T61) of the end. That is, the thicknesses (T2, T31) of the ends where the first heavy edge electrode 132 and the first inclined electrode 133 are in contact with each other are formed to be the same, and the second heavy edge electrode 142 and the second inclined electrode 133 are formed to be the same. The thicknesses T5 and T61 of the ends where the electrodes 143 contact each other are formed to be the same.

The respective lengths (L1, L2) of the first heavy edge electrode 132 and the second heavy edge electrode 142 are the same as the first internal electrode 131 or the second internal electrode 141, as shown in FIGS. 5 and 6. ) is formed to be 5 to 45% of each length (L3, L4). Here, the length L1 of the first heavy edge electrode 132 and the length L2 of the second heavy edge electrode 142 are formed to be equal to each other, and the length L3 of the first internal electrode 131 and the length L2 of the second heavy edge electrode 142 are formed to be equal to each other. The length L4 of the two internal electrodes 141 is formed to be equal to each other. The lengths (L5, L6) of the bases of the first inclined electrode 133 and the second inclined electrode 143 are the respective lengths of the first internal electrode 131 or the second internal electrode 141 ( It is set to the length obtained by subtracting the respective lengths (L1, L2) of the first heavy edge electrode 132 and the second heavy edge electrode 142 from L3 and L4.

The respective thicknesses T2 and T5 of the first heavy edge electrode 132 and the second heavy edge electrode 142 are the first internal electrode 131 and the second internal electrode 141, respectively, as shown in FIGS. 5 and 7. ) is formed to be 10 to 85% of the respective thicknesses (T1 and T4). For example, the thickness T2 of the first heavy edge electrode 132 is formed to be 10 to 85% of the thickness T1 of the first internal electrode 131, and the thickness of the second heavy edge electrode 142 is 10% to 85% of the thickness T1 of the first internal electrode 131. (T5) is formed to be 10 to 85% of the thickness (T4) of the second internal electrode 141. Here, the thickness T2 of the first heavy edge electrode 132 and the thickness T5 of the second heavy edge electrode 142 are formed to be the same, and the thickness T1 of the first internal electrode 131 and the thickness T5 of the second heavy edge electrode 142 are formed to be equal to each other. The thickness T4 of the two internal electrodes 141 is formed to be the same.

Horizontal surfaces H1 and H2 extending from the upper surfaces of the first heavy edge electrode 132 and the second heavy edge electrode 142, respectively, and the first inclined electrode 133 and the second inclined electrode 143. The inclination angles θ1 and θ2 between the inclined surfaces H3 and H4 are formed to be 89.996 to 89.978 degrees, as shown in FIGS. 5 and 7, respectively. For example, the inclination angle θ1 between the horizontal surface H1 extending from the upper surface of the first heavy edge electrode 132 and the inclined surface H3 of the first inclined electrode 133 is 89.996 to 89.978 degrees ( degree), and the inclination angle θ2 between the horizontal surface H2 extending from the upper surface of the second heavy edge electrode 142 and the inclined surface H4 of the second inclined electrode 143 is 89.996 to 89.996. It is formed to be 89.978 degrees. The inclination angle (θ1) between the horizontal surface (H1) extending from the upper surface of the first heavy-edge electrode (132) and the inclined surface (H3) of the first inclined electrode (133) and the second heavy-edge electrode (142) The inclination angle θ2 between the horizontal surface H2 extending from the upper surface and the inclined surface H4 of the second inclined electrode 143 is formed to be equal to each other.

As shown in FIG. 2, the first cover green sheet 150 is located on the upper side of the first heavy edge internal electrode 130 or the upper side of the second heavy edge internal electrode 140 located at the uppermost side of the green chip 100a. are placed in a stacked manner.

As shown in FIG. 2, the green sheet 160 for the second cover is located below the first heavy edge internal electrode 130 or the lower side of the second heavy edge internal electrode 140 located at the lowermost side of the green chip 100a. is placed in

Flash over (over-coating) so that the thickness of the green sheet 150 for the first cover and the green sheet 160 for the second cover is 10 to 30% of the total thickness of the fired chip 100, respectively. Prevents flash over phenomenon.

As described above, in the multilayer ceramic capacitor for snubber of the present invention, as shown in FIGS. 4 and 6, the first heavy-edge internal electrode 130 or the second heavy-edge internal electrode 140 is formed by using the first green sheet 110 or the second heavy-edge internal electrode 140, respectively. It is formed on the upper surface of the second green sheet 120 in the longitudinal direction (X: shown in FIGS. 1 to 5) of the first green sheet 110 or the second green sheet 120. For example, the first heavy-edge internal electrode 130 has an end on one side in the longitudinal direction (X) of the first heavy-edge internal electrode 130 adjacent to one end in the longitudinal direction (X) of the first green sheet 110. It is aligned at the end, and the other end in the longitudinal direction (X) is formed on the upper surface of the first green sheet 110 to be spaced apart from the other end in the longitudinal direction (X) of the first green sheet 110. The second heavy edge internal electrode 140 has an end on one side in the longitudinal direction (X) of the second heavy edge internal electrode 140 spaced apart from an end on one side in the longitudinal direction (X) of the second green sheet 120. , the other end in the longitudinal direction (X) is formed on the upper surface of the second green sheet 120 to be aligned with the other end in the longitudinal direction (X) of the second green sheet 120.

In the multilayer ceramic capacitor for snubber of the present invention, as shown in FIGS. 8 and 9, the first heavy-edge internal electrode 130 or the second heavy-edge internal electrode 140 is formed on the first green sheet 110 or the second green, respectively. The first green sheet 110 or the second green sheet 120 is formed on the upper surface of the sheet 120 in the width direction (Y) so that the length and width are reversed. For example, the first heavy-edge internal electrode 130 has an end on one side in the width direction (Y) of the first heavy-edge internal electrode 130 at one end in the width direction (Y) of the first green sheet 110. It is aligned at the end, and the other end in the width direction (Y) is spaced apart from the other end in the width direction (Y) of the first green sheet 110 and is formed on the upper surface of the first green sheet 110. The second heavy edge internal electrode 140 has an end on one side in the width direction (Y) of the second heavy edge internal electrode 140 spaced apart from an end on one side in the width direction (Y) of the second green sheet 120. , the end of the other side in the width direction (Y) is formed on the upper surface of the second green sheet 120 to be aligned with the end of the other side in the width direction (Y) of the second green sheet 120.

In this way, the first heavy-edge internal electrode 130 including the first internal electrode 131, the first heavy-edge electrode 132, and the first inclined electrode 133, the second internal electrode 141, The second heavy-edge internal electrode 140, including the 2 heavy-edge electrode 142 and the second inclined electrode 143, is prepared by mixing Ni, copper oxide, and binder to prepare an internal electrode paste, and then making an internal electrode paste. It is manufactured using

In order to confirm the electrical characteristics of the snubber capacitor of the present invention described above, the size is 5750 as shown in Table 1, and comparative examples and examples were manufactured so that the dielectric characteristics satisfied the X7R regulation.

First and second internal electrodes 1st and 2nd heavy edge electrodes First and second inclined electrodes length
[㎜] thickness
[㎛] length
[㎜] length
ratio
[%] thickness
[㎛] Thickness ratio
[%] base
length
[㎜]
Hypotenuse length [㎜] Incline angle
[θ1,θ2] Comparative example 5.7 3.00 0.0000 0% 0.00 0% 0 0 90.000 Example 1 5.7 3.00 0.0000 0% 1.50 50% 5.7000 5.70000000000020 89.985 Example 2 5.7 3.00 0.2850 5% 1.50 50% 5.4150 5.41500000000021 89.984 Example 3 5.7 3.00 0.5700 10% 1.50 50% 5.1300 5.13000000000022 89.983 Example 4 5.7 3.00 0.8550 15% 1.50 50% 4.8450 4.84500000000023 89.982 Example 5 5.7 3.00 1.1400 20% 1.50 50% 4.5600 4.56000000000025 89.981 Example 6 5.7 3.00 1.7100 30% 1.50 50% 3.9900 3.99000000000028 89.978 Example 7 5.7 3.00 2.2800 40% 1.50 50% 3.4200 3.42000000000033 89.975 Example 8 5.7 3.00 2.8500 50% 1.50 50% 2.8500 2.85000000000039 89.970 Example 9 5.7 3.00 3.4200 60% 1.50 50% 2.2800 2.28000000000049 89.962 Example 10 5.7 3.00 3.9900 70% 1.50 50% 1.7100 1.71000000000066 89.950 Example 11 5.7 3.00 0.8550 15% 0.30 10% 4.8450 4.84500000000001 89.996 Example 12 5.7 3.00 0.8550 15% 0.90 30% 4.8450 4.84500000000008 89.989 Example 13 5.7 3.00 0.8550 15% 1.50 50% 4.8450 4.84500000000023 89.982 Example 14 5.7 3.00 0.8550 15% 2.10 70% 4.8450 4.84500000000046 89.975 Example 15 5.7 3.00 0.8550 15% 2.70 90% 4.8450 4.84500000000075 89.968 Example 16 5.7 3.00 1.7100 30% 0.30 10% 3.9900 3.99000000000001 89.996 Example 17 5.7 3.00 1.7100 30% 0.90 30% 3.9900 3.99000000000010 89.987 Example 18 5.7 3.00 1.7100 30% 1.50 50% 3.9900 3.99000000000028 89.978 Example 19 5.7 3.00 1.7100 30% 2.10 70% 3.9900 3.99000000000055 89.970 Example 20 5.7 3.00 1.7100 30% 2.70 90% 3.9900 3.99000000000451 89.961

As shown in Table 1, in Comparative Example 1, the first internal electrode 131 and the second internal electrode 141 were each manufactured with a length of 5.7 mm and a thickness of 3.0 μm, and the first heavy edge electrode ( 132), the first inclined electrode 133, the second heavy edge electrode 142, and the second inclined electrode 143 were not manufactured, and as a result, the inclined angles (θ1, θ2) are the first internal electrode ( 131) or the angle between the upper surface of the second internal electrode 141 and the end surface of one side or the other, and this inclination angle (θ1, θ2) is 90 degrees. Example 1 is shown in Table 1 As shown, the first inclined electrode 133 and the second inclined electrode 143 were formed at the positions where the first heavy edge electrode 132 and the second heavy edge electrode 142 were formed, respectively. That is, in Example 1, the first internal electrode 131 and the second internal electrode 141 were each manufactured to have a length of 5.7 mm and a thickness of 3.0 μm, and the first heavy edge electrode 132 and the second internal electrode 141 were manufactured to have a length of 5.7 mm and a thickness of 3.0 μm. The 2 heavy edge electrodes 142 each have a thickness of 1.5㎛ and are manufactured so that the thickness ratio is 50% of the thickness ratio of the first internal electrode 131 and the second internal electrode 141, thereby forming the first heavy edge electrode ( 132), the second heavy edge electrode 142, the first inclined electrode 133, and the second inclined electrode 143 were formed to be inclined overall, and as a result, the first inclined electrode 133 and the second inclined electrode 143 The base length of each electrode 143 was 5.7 mm, and the inclination angles θ1 and θ2 were formed to be 89.985 degrees.

In Example 2, the first internal electrode 131 and the second internal electrode 141 were each manufactured to have a length of 5.7 mm and a thickness of 3.0 μm, and the first heavy edge electrode 132 and the second internal electrode 132 were manufactured to have a thickness of 3.0 μm. The heavy edge electrodes 142 each had a length of 0.285 mm and was formed to be 5% of the length of the first internal electrode 131 and the second internal electrode 141. The thickness of each of the first heavy edge electrode 132 and the second heavy edge electrode 142 is 1.5㎛, and the thickness ratio is 50% of the thickness ratio of the first internal electrode 131 and the second internal electrode 141. It was manufactured to be . The length of each base of the first inclined electrode 133 and the second inclined electrode 143 is the first heavy edge electrode 132 and the length of the first internal electrode 131 and the second internal electrode 141. The length of the second heavy edge electrode 142 was subtracted by 0.285 mm to make it 5.415 mm. As a result, the hypotenuse length of the inclined plane of the first inclined electrode 133 and the second inclined electrode 143 was 5.41500000000021 mm. and the inclination angles (θ1, θ2) were formed to be 89.984 degrees.

Example 3, as shown in Table 1, the first internal electrode 131, the second internal electrode 141, the first heavy edge electrode 132, the second heavy edge electrode 142, and the first inclined electrode. (133) and the second inclined electrode 143 were manufactured, and the hypotenuse length of the first inclined electrode 133 and the second inclined electrode 143 was 5.13000000000022 mm, and the inclined angle (θ1, θ2) was 89.983. It was formed to become a degree. Examples 4 to 20 were each formed with the details shown in Table 1 like Example 3, and the hypotenuse length and inclination angle (θ1) of each of the first inclined electrode 133 and the second inclined electrode 143 ,θ2) was measured with the details listed in Table 1. As shown in Table 1, the hypotenuse length and inclination angles (θ1, θ2) of the inclined surfaces of the first inclined electrode 133 and the second inclined electrode 143 were measured to have slightly changed, respectively. This includes the first internal electrode 131, the second internal electrode 141, the first heavy edge electrode 132, the second heavy edge electrode 142, the first inclined electrode 133 and the second inclined electrode ( This is due to the fact that each thickness is formed extremely thin compared to the length of each base, and by changing this minutely, each is stacked in hundreds of layers and then pressed to form the green chip 100a. It is possible to minimize shape distortion.

The electrical properties of Comparative Examples and Examples 1 to 20 prepared according to the specifications in Table 1 were tested, and the results are shown in Table 2.

Electrical characteristics before surge Electrical characteristics after surge performance Capacity [㎋] DF [%] IR [GΩ] ESR @1MHz [mΩ] BDV [kV] HALT Capacity [㎋] DF [%] IR
[GΩ] note Comparative example 199 1.01 2.98 14.60 4.02 OK 170 1.55 0.13 decrease Example 1 216 1.02 2.83 13.45 3.70 OK 184 2.50 0.08 decrease Example 2 217 1.04 2.81 13.34 3.66 OK 178 3.10 0.18 decrease Example 3 221 1.04 2.75 13.15 3.63 OK 220 1.04 2.77 normal Example 4 222 1.05 2.75 13.06 3.59 OK 222 1.05 2.75 normal Example 5 224 1.06 2.71 12.92 3.56 OK 225 1.06 2.72 normal Example 6 229 1.08 2.67 12.69 3.49 OK 229 1.08 2.67 normal Example 7 234 1.11 2.63 12.47 3.43 OK 233 1.10 2.62 normal Example 8 238 1.13 2.55 12.29 3.36 NG 238 1.12 2.57 normal Example 9 241 1.13 2.52 12.03 3.30 NG 242 1.14 2.53 normal Example 10 242 1.15 2.49 11.90 3.25 NG 153 4.50 1.22 decrease Example 11 183 0.96 3.33 15.20 4.37 OK 183 0.86 3.35 normal Example 12 203 1.00 3.02 14.34 3.94 OK 203 0.96 3.02 normal Example 13 222 1.05 2.75 13.06 3.59 OK 222 1.05 2.75 normal Example 14 242 1.14 2.53 12.99 3.30 NG 242 1.14 2.52 normal Example 15 262 1.19 2.35 11.68 3.05 NG 202 1.80 1.07 decrease Example 16 184 0.90 3.30 15.49 4.34 OK 184 0.87 3.32 normal Example 17 206 1.00 2.94 14.27 3.87 OK 206 0.98 2.96 normal Example 18 229 1.08 2.67 12.69 3.49 OK 229 1.08 2.67 normal Example 19 251 1.19 2.45 11.35 3.18 NG 251 1.19 2.43 normal Example 20 274 1.20 2.23 11.21 2.92 NG 180 1.99 0.03 decrease

As shown in Table 2, Comparative Example 1 and Examples 1 to 20 were tested before and after surge performance, respectively. The test before performing the surge was the capacity, dissipation factor (DF), insulation resistance (IR), equivalent series resistance (ESR), breakdown voltage (BDV), and highly accelerated life test (HALT) of Comparative Example 1 and Examples 1 to 20. The characteristics were tested, and the tests after performing the surge tested the capacity, DF, and IR of Comparative Example 1 and Examples 1 to 20. The description of the test device or test method for each test item is omitted as well-known devices or methods are applied. When measuring ESR, it was measured at 1 MHz, and HALT performed a test on temperature characteristics. That is, Comparative Example 1 and Examples 1 to 20 were each tested through HALT testing to determine whether electrical characteristics were maintained and reliability was maintained even when a surge, i.e., high voltage, was applied even at high temperatures. As shown in Table 2, Comparative Example 1 was measured with a capacity of 199㎋, DF 1.01%, IR 2.98GΩ, ESR 14.6mΩ, BDV 4.02kV, and HALT 'OK' before the surge, and a capacity of 170㎋, DF 1.55 after the surge. % and IR were measured at 0.13GΩ, and it was confirmed that the measured values before and after the surge were reduced as shown in the 'Remarks' item in Table 2.

As shown in Table 2, in Example 1, before the surge, the capacity was 216㎋, DF 1.02%, IR 2.83GΩ, ESR 13.45mΩ, and BDV 3.7kV were measured as 'OK', and after the surge, the capacity was 184㎋, DF 2.5. % and IR were measured at 0.08GΩ, and it was confirmed that the measured values before and after the surge were reduced as shown in the 'Remarks' item in Table 2.

As shown in Table 2, in Example 2, before the surge, the capacity was 217㎋, DF 1.04%, IR 2.81GΩ, ESR 13.34mΩ, and BDV 3.66kV were measured as 'OK', and after the surge, the capacity was 178㎋, DF 3.1. % and IR were measured at 0.18GΩ, and it was confirmed that the measured values before and after the surge were reduced as shown in the 'Remarks' item in Table 2.

As shown in Table 2, in Example 3, before the surge, the capacity was 221㎋, DF 1.04%, IR 2.75GΩ, ESR 13.15mΩ, and BDV 3.63kV were measured as 'OK', and after the surge, the capacity was 220㎋, DF 1.04. % and IR were measured at 2.77GΩ, and the measured values before and after the surge were confirmed to be normal as shown in the 'Remarks' item in Table 2.

As shown in Table 2, in Example 4, before the surge, the capacity was 221㎋, DF 1.05%, IR 2.75GΩ, ESR 13.06mΩ, and BDV 3.59kV were measured as 'OK', and after the surge, the capacity was 222㎋, DF 1.05. % and IR were measured at 2.77GΩ, and the measured values before and after the surge were confirmed to be normal as shown in the 'Remarks' item in Table 2.

In Examples 5 to 9, Examples 11 to 14, and Examples 16 to 19, the measured values before and after the surge were as shown in Table 2, respectively, as in the 'Remarks' item listed in Table 2. It was confirmed to be normal, but in Example 10, Example 15, and Example 20, the measured values before and after the surge were confirmed to be decreased as shown in the 'Remarks' item in Table 2.

In the HALT items listed in Table 2, 'OK' indicates normal, 'NG' indicates defective, and in the 'Remarks' item, normal indicates a small change in the measured value before and after the surge, and a decrease indicates a small change in the measured value before and after the surge. A large change in value indicates a defect.

As shown in Table 2, it can be seen that as the thickness of the first heavy edge electrode 132 or the second heavy edge electrode 142 increases, the capacity and DF increase, and R, BDV, and ESR decrease respectively. When the thickness or length of the first heavy edge electrode 132 or the second heavy edge electrode 142 is long, that is, when the ratio of the base length is large, the structural stability of the fired chip 100, that is, a step, etc., occurs. An inflection point occurs where reliability decreases. Here, it can be seen that HALT NG occurs at the inflection point when the length ratio of the first heavy edge electrode 132 or the second heavy edge electrode 142 is 50% or more or the thickness ratio is 90% or more.

As described above, the multilayer ceramic capacitor for a snubber of the present invention has the length of the first heavy edge electrode 132 or the second heavy edge electrode 142 divided by the length of the first internal electrode 131 or the second internal electrode 141. By forming it to be 5 to 45% of the length and 10 to 85% of the thickness of the first internal electrode 131 or the second internal electrode 141, reliability is improved due to improved electrical characteristics and the first external electrode ESR characteristics are improved by reducing contact resistance by increasing the contact area between (200) and the first heavy edge internal electrode 130 and between the second external electrode 300 and the second heavy edge internal electrode 140. It can be used at high voltage, has a long lifespan, can be easily used for SMD, and can provide temperature stability at high voltage.

The multilayer ceramic capacitor for snubber of the present invention can be applied to the capacitor manufacturing industry.

100: fired chip 100a: green chip
110: 1st green sheet 120: 2nd green sheet
130: first heavy edge internal electrode 131: first internal electrode
132: first heavy edge electrode 133: first inclined electrode
140: Second heavy edge internal electrode 141: Second internal electrode
142: second heavy edge electrode 143: second inclined electrode
150: Green sheet for first cover 160: Green sheet for second cover
200: first external electrode 300: first external electrode

Claims (8)

A fired chip formed by firing a green chip,
A first external electrode formed at one end of the fired chip,
It includes a second external electrode formed at the other end of the fired chip,
The green chip is connected to a plurality of first green sheets stacked sequentially, a plurality of second green sheets stacked above or below the first green sheets, and a first external electrode. A plurality of first heavy edge internal electrodes are formed on the surface of the first green sheet such that one end is aligned with the end of one side of the first green sheet and the other end is spaced apart from the other end of the first green sheet. edge internal electrode), the other end of which is connected to the second external electrode is aligned with the other end of the second green sheet, and one end of the second green sheet is spaced apart from one end of the second green sheet. It includes a plurality of second heavy edge internal electrodes each formed in,
The plurality of first green sheets are sequentially stacked and pressed so that the first heavy edge internal electrode is connected to the first external electrode and spaced apart from the second external electrode, and the plurality of second green sheets are each connected to the first heavy edge electrode. The internal electrode is spaced apart from the first external electrode and aligned to be connected to the second heavy-edge internal electrode and the second external electrode, sequentially stacked and then pressed, and the first heavy-edge internal electrode is connected to the first external electrode on one side. The thickness of the end is formed to be greater than the thickness of the other end, and the second heavy edge internal electrode is formed to have a thickness of the other end connected to the second external electrode to be greater than the thickness of the end of one side. A multilayer ceramic capacitor for a snubber. According to paragraph 1,
The first heavy edge internal electrode is connected to the first external electrode, so that one end is aligned with one end of the first green sheet, and the other end is spaced apart from the other end of the first green sheet. A first internal electrode formed on the upper surface, and a first heavy edge electrode formed on the upper surface of the first internal electrode with one end aligned with one end of the first internal electrode to be connected to the first external electrode. and a first inclined shape formed on the upper surface of the first internal electrode so that the other end of the first heavy edge electrode is connected to the one end and the upper surface is inclined in the direction from one end to the other end. Contains electrodes,
The second heavy edge internal electrode is connected to the second external electrode, so that the other end is aligned with the other end of the second green sheet, and one end is spaced apart from one end of the second green sheet. A second internal electrode is formed on the upper surface, and the other end is connected to the second external electrode and is formed on the upper surface of the second internal electrode so that the other end is aligned with the other end of the second internal electrode. 2 A second heavy edge electrode connected to the external electrode, and a second internal electrode where one end of the second heavy edge electrode is connected to the other end and the upper surface is inclined in the direction from the other end to the one end. A multilayer ceramic capacitor for a snubber including a second inclined electrode formed on the upper surface of. According to paragraph 2,
The thickness of the first internal electrode and the thickness of the second internal electrode are formed to be the same,
The thickness of the first heavy edge electrode and the thickness of the second heavy edge electrode are formed to be the same,
The thickness of one end of the first inclined electrode and the thickness of the other end of the second inclined electrode are formed to be the same,
The thickness of the other end of the first inclined electrode and the thickness of one end of the second inclined electrode are formed to be the same,
The thickness of one end of the first inclined electrode is greater than the thickness of the other end,
A multilayer ceramic capacitor for a snubber in which the thickness of one end of the second inclined electrode is formed to be smaller than the thickness of the other end of the second inclined electrode. According to paragraph 2,
Each length of the first heavy edge electrode and the second heavy edge electrode is formed to be 5 to 45% of each length of the first internal electrode or the second internal electrode,
A multilayer ceramic capacitor for a snubber in which each thickness of the first heavy edge electrode and the second heavy edge electrode is formed to be 10 to 85% of the respective thickness of the first internal electrode or the second internal electrode. According to paragraph 2,
The inclination angle between the horizontal plane extending from the upper surface of each of the first heavy edge electrode or the second heavy edge electrode and the inclined surface of the first inclined electrode or the second inclined electrode is 89.996 to 89.978 degrees, respectively. Multilayer ceramic capacitors for phosphor snubbers. According to paragraph 1,
One end of the first heavy edge internal electrode in the longitudinal direction is aligned with one end of the longitudinal direction of the first green sheet, and the other end of the longitudinal direction is spaced apart from the other end of the longitudinal direction of the first green sheet. formed,
One end of the second heavy edge internal electrode in the longitudinal direction is spaced apart from one end of the longitudinal direction of the second green sheet, and the other end of the second heavy edge internal electrode is aligned with the other end of the longitudinal direction of the second green sheet. A multilayer ceramic capacitor for a snubber that is formed to be. According to paragraph 2,
The end of one side in the width direction of the first heavy edge internal electrode is aligned with the end of one side in the width direction of the first green sheet, and the end of the other side in the width direction is spaced apart from the end of the other side in the width direction of the first green sheet. formed,
The end of one side in the width direction of the second heavy edge internal electrode is spaced apart from the end of one side in the width direction of the second green sheet, and the end of the other side in the width direction is aligned with the end of the other side in the width direction of the second green sheet. A multilayer ceramic capacitor for a snubber that is formed to be According to paragraph 1,
The fired chip has a silane-based insulating coating layer formed on the surface except for one end or the other end,
The green chip is disposed by stacking a first cover green sheet on the upper side of the uppermost first heavy edge internal electrode or on the upper side of the second heavy edge internal electrode, and the lowermost first heavy edge internal electrode. Green sheets for the second cover are stacked and disposed on the lower side or the lower side of the second heavy edge internal electrode, and the thickness of the green sheet for the first cover and the green sheet for the second cover is 10 to 30 times the total thickness of the fired chip, respectively. It is formed to be %,
The material of the silane-based insulating coating layer is a silane-based coating agent, and the silane-based coating agent is a mixture of silane mixture, isopropanol group, and acetyl alcohol, and the silane mixture is aminopropyltriethoxysilane and glycitoxypropyltriepoxy. Multilayer ceramic capacitor for snubber used by mixing silane.