KR20230065082A - Battery inspecting apparatus - Google Patents

Abstract

Embodiments provide a battery inspecting device which comprises: a battery mounting unit on which a battery is mounted, wherein the battery mounting unit moves the battery; a wavelength emitting unit that emits a wavelength in a preset range toward the battery for a preset time according to a preset number of times and a preset cycle; and a wavelength analysis unit that detects strain data by comparing the emitted wavelength with a wavelength received from the battery and analyzes defects in the battery based on the strain data.

Description

Battery inspection device {BATTERY INSPECTING APPARATUS}

Embodiments relate to battery inspection devices. Specifically, the embodiments are applied to a battery inspection device that inspects defects occurring inside the battery.

As interest in the environment has recently increased, secondary batteries have emerged in order to realize energy saving and environmental protection.

A secondary battery refers to a battery that can be used semi-permanently by charging electricity generated in a process in which a current supplied from an external power source causes a redox reaction of a material between an anode and a cathode. A secondary battery has an advantage in that it can be recharged several times and reused, unlike a conventional primary battery that can only be used once.

The secondary battery includes a positive electrode plate, a negative electrode plate, a separator separating the positive electrode plate and the negative electrode plate, an electrolyte solution, and a case in which they are placed and sealed. A structure including a positive electrode plate, a negative electrode plate, and a separator is called an electrode assembly.

At this time, in the process of manufacturing the electrode assembly, there may be foreign matter inside or outside of the electrode assembly, or a tear or folding problem may occur. When such a defect occurs, a low voltage defect may occur in the secondary battery showing a voltage drop behavior equal to or greater than a self-discharge rate. However, defects inside the electrode assembly are difficult to observe through the opaque or translucent appearance of the electrode assembly.

Therefore, a method for detecting a defect occurring inside a battery is required.

Embodiments are intended to solve the above problems, and can provide a device for inspecting internal defects of a battery.

Embodiments may provide a device for inspecting defects in a battery by varying various conditions.

Embodiments may provide a battery testing device with maximized testing performance by amplifying the degree of data corresponding to a defect.

Technical tasks to be achieved in the embodiments are not limited to those mentioned above, and other technical tasks not mentioned will be considered by those skilled in the art from various embodiments to be described below. can

According to embodiments, the battery is mounted, the battery holder for moving the battery; a wavelength emitting unit that emits wavelengths in a predetermined range toward the battery for a predetermined time according to a predetermined number of times and a predetermined period; and a wavelength analysis unit that compares the emitted wavelength with the wavelength received from the battery, detects deformation data, and analyzes defects of the battery based on the deformation data. Including, it provides a battery inspection device.

According to embodiments, the deformation data may include a difference between the wavefront of the emitted wavelength and the wavefront of the received wavelength, a difference in density between the emitted wavelength and the received wavelength, a temperature change rate of the emitted wavelength, and an overlapping degree of the emitted wavefront. It provides a battery inspection device including at least one of.

According to embodiments, the wavelength analyzer provides a battery inspection device that detects a location of a defect in a battery based on a region in which a difference occurs between a wavefront of an emitted wavelength and a wavefront of a received wavelength.

According to embodiments, the wavelength analyzer detects a cumulative temperature change rate of the emitted wavelength based on the temperature change rate of the emitted wavelength, and based on a region in which the cumulative temperature change rate has a value greater than or equal to a preset change amount, the location of the defect in the battery. A battery inspection device for detecting is provided.

According to embodiments, the wavelength analyzer detects the frequency of the emitted wavelength based on the overlapping degree of the emitted wavefront, and detects the location of the defect in the battery based on a region in which the frequency has a value greater than or equal to a preset frequency, A battery inspection device is provided.

According to embodiments, the wavelength emitting unit provides a battery inspection device that emits a reference wave toward the battery and then emits a predetermined wavelength toward the battery again.

According to embodiments, the wavelength analyzer overlaps the wavelength received from the battery according to the reference wave and the wavelength received from the battery according to the predetermined wavelength, and the value of the wavelength generated according to the overlap has a value greater than or equal to a preset range. A battery inspection device that detects a location of a defect in a battery based on an area is provided.

According to embodiments, the wavelength emitter provides a battery inspection device that is at least one of a thermal imaging camera and an infrared camera.

According to embodiments, the wavelength analyzer, which is executed in synchronization with the wavelength emitter, provides a battery inspection device.

According to embodiments, a cooling unit for cooling at least one of a wavelength emitting unit and a wavelength analyzer; It provides a battery inspection device further comprising a.

According to embodiments, an apparatus for inspecting internal defects of a battery is provided.

Embodiments provide a battery inspection device with maximized inspection performance.

Effects obtainable from the embodiments are not limited to the effects mentioned above, and other effects not mentioned are clearly derived and understood by those skilled in the art based on the detailed description below. It can be.

BRIEF DESCRIPTION OF THE DRAWINGS Included as part of the detailed description to aid understanding of the embodiments, the accompanying drawings provide various embodiments and, together with the detailed description, describe technical features of the various embodiments.
1 schematically shows a developed view of a battery to be inspected in the embodiments.
2 schematically illustrates components included in a battery inspection device according to embodiments.
Figure 3 shows the inspection of the battery through the difference in the wavefront according to the embodiments.
4 illustrates examining a cell through temperature cumulative rate of change and/or frequency according to embodiments.
5 illustrates controlling a wavelength emitting unit through STROBE control according to embodiments.
6 illustrates controlling embodiments via spatial phase control.

Hereinafter, the embodiments disclosed in this specification will be described in detail with reference to the accompanying drawings, but the same or similar components are given the same reference numerals regardless of reference numerals, and redundant description thereof will be omitted. The suffixes "module" and "unit" for components used in the following description are given or used together in consideration of ease of writing the specification, and do not have meanings or roles that are distinct from each other by themselves.

In addition, in describing the embodiments disclosed in this specification, if it is determined that a detailed description of a related known technology may obscure the gist of the embodiment disclosed in this specification, the detailed description thereof will be omitted. In addition, the accompanying drawings are only for easy understanding of the embodiments disclosed in this specification, the technical idea disclosed in this specification is not limited by the accompanying drawings, and all changes included in the spirit and technical scope of the present invention , it should be understood to include equivalents or substitutes.

Terms including ordinal numbers, such as first and second, may be used to describe various components, but the components are not limited by the terms. These terms are only used for the purpose of distinguishing one component from another. It is understood that when an element is referred to as being "connected" or "connected" to another element, it may be directly connected or connected to the other element, but other elements may exist in the middle. It should be.

On the other hand, when an element is referred to as “directly connected” or “directly connected” to another element, it should be understood that no other element exists in the middle. Singular expressions include plural expressions unless the context clearly dictates otherwise. In this application, terms such as "comprise" or "have" are intended to designate that there is a feature, number, step, operation, component, part, or combination thereof described in the specification, but one or more other features It should be understood that the presence or addition of numbers, steps, operations, components, parts, or combinations thereof is not precluded.

A battery to be inspected in the embodiments described herein is a secondary battery, which can be reused through charging after discharging. At this time, the secondary battery includes a lead acid battery, a nickel-cadmium battery, a nickel-metal hydride battery, and a lithium ion battery.

In this specification, for convenience of description, a stacked electrode assembly is described as an example. However, the inspection subject of the present specification is not limited thereto, and may also be inspected for a jelly-roll electrode assembly and a stack/folding type electrode assembly. In addition, inspection targets of the embodiments are applicable to all of mono-cells, bi-cells, and full-cells. The inspection target of the embodiments can be applied to any object capable of transmitting or reflecting an arbitrary wavelength. For example, the inspection target of the embodiments is a translucent material such as a separator, which includes a material through which ultrasonic waves and far-infrared rays can be transmitted.

In the present specification, the Y direction represents a moving direction of an inspection target capable of being inspected according to embodiments. At this time, the moving direction of the inspection target is the longitudinal direction of the inspection target. In the present specification, the Z direction is a direction perpendicular to the Y direction, and indicates a direction from the inspection target toward the wavelength analyzer according to the embodiments. In this specification, the X direction is a direction perpendicular to the Y and Z directions, and represents the width (thickness) direction of the inspection target.

1 schematically shows a developed view of a battery to be inspected in the embodiments.

1(a) shows a side view of the battery 100. Figure 1 (b) shows the upper surface of the battery 100. Figure 1 (c) is a detailed view of A shown in Figure 1 (a) and (b).

In FIG. 1, 100 denotes a battery to be inspected in the embodiments.

As shown in (a) and (b) of FIG. 1 , the battery 100 is formed by stacking one or more monocells 110 and separators 120 alternately.

The monocell 110 includes at least one of a first electrode plate and a second electrode plate. The monocell 110 includes, for example, at least one of a negative electrode plate and a positive electrode plate.

The separator 120 is disposed between the plurality of monocells 110 . The separator 120 prevents contact between the first electrode plate and the second electrode plate. In addition, contact between the mono cells 110 is prevented. Separator 120 is an insulating material. Through this, an electrical short (short) between the first electrode plate and the second electrode plate or between the plurality of monocells 110 is prevented from occurring. The separation membrane 120 includes a plurality of pores having a predetermined size or less. Accordingly, particles smaller than the pore size may move between the separation membranes 120 . For example, when the battery 100 is a lithium ion battery, lithium ions can move between pores formed in the separator 120 .

As shown in (c) of FIG. 1 , defects 130 may be formed in the process of manufacturing the battery 100 by stacking the monocell 110 and the separator 120 . Defects 130 include, for example, foreign matter 131 formed inside or outside the battery 100, tearing 132 on a part of the inside or outside of the battery 100, inside or outside the battery 100 includes a phenomenon 133 in which a part of is folded.

However, the defect 130 shown in (c) of FIG. 1 is difficult to observe from the outside of the battery 100 or the outside of the separator 120 . Therefore, a method for detecting defects formed inside the battery 100 will be described below.

2 schematically illustrates components included in a battery inspection device according to embodiments.

The battery inspection apparatus 200 according to the embodiments is a device for detecting whether defects exist inside the battery 100 (see FIG. 1 ) and/or where the defects existing therein are located.

The battery inspection device 200 includes a battery holder 210 , a wavelength emitter 220 , and a wavelength analyzer 230 . In addition, the battery test apparatus 200 may further include at least one of an output unit 240 , a communication unit 250 , a power supply unit 260 , and a memory 270 . In addition, the battery inspection device 200 may further include a cooling unit 280 . In addition, the battery testing device 200 includes a controller 290 that controls all or some of the components of the battery testing device 200 .

In the battery holder 210 according to the embodiments, the battery 100, which is an inspection target of the embodiments, is mounted. When the battery 100 is mounted, the battery holder 210 moves the battery 100 to a position corresponding to the wavelength emitter 220 and/or the wavelength analyzer 230 . In addition, the battery holder 210 discharges the battery 100 from the battery inspection device 200 after the inspection of the battery 100 is completed.

The wavelength emitter 220 according to the embodiments emits wavelengths to the battery 100 .

The wavelength emitter 220 emits a long wavelength toward the battery 100, for example, emits infrared rays. For example, the wavelength emitter 220 emits a wavelength in the range of 0.7um to 1000um toward the battery 100 .

Waves emitted from the wavelength emitter 220 are transmitted through the cell 100 or reflected by the cell 100 .

The wavelength analyzer 230 according to embodiments acquires data on a wavelength transmitted through or reflected from the battery 100 . For example, the wavelength analyzer 230 is a device capable of analyzing emitted wavelengths and is a thermal imaging camera or an infrared camera. For example, when the wavelength analyzer 230 is a thermal imaging camera, the wavelength analyzer 230 senses heat generated from a wavelength transmitted through or reflected from the battery 100 . For example, the wavelength analyzer 230 uses a special wavelength band with high permeability such as far-infrared rays to transmit through the surface of the battery 100 made of an opaque or translucent material.

Based on the acquired data, the wavelength analyzer 230 analyzes whether or not there is a defect inside the battery inspection device 200 or, if there is a defect, the location of the defect.

The output unit 240 according to embodiments outputs the analysis result of the wavelength analyzer 230 to the outside. The output unit 240 includes, for example, a display and a sound device. For example, when the output unit 240 is a display, the display displays an image (video and/or still image) of the analyzed result on the display. For example, when the output unit 240 is an audio device, the audio device outputs the analyzed result as sound data.

The communication unit 250 according to embodiments may transmit and receive data to and from an external server or communication network. For example, the communication unit 250 transmits an inspection result of the battery inspection device 200 inspecting the battery 100 to the outside.

The communication unit 250 includes, for example, a 3G module, an LTE module, an LTE-A module, a Wi-Fi module, a WiGig module, a UWB (Ultra Wide Band) module, or a network interface for a long distance, such as a LAN card. do. In addition, the communication unit 1600 may include, for example, a Magnetic Secure Transmission (MST) module, a Bluetooth module, a Near Field Communication (NFC) module, a Radio Frequency Identification (RFID) module, a ZigBee module, and Z -Includes a network interface for short distances such as a wave module or an infrared module.

The power supply unit 260 according to embodiments supplies power to the battery test apparatus 200 .

The memory 270 according to embodiments stores various commands used in the battery test apparatus 200 . For example, the memory 270 stores commands for PWM control described in FIG. 5 . The memory 270 includes at least one of volatile storage media and non-volatile storage media. The memory 270 is at least one of read only memory (ROM) and random access memory (RAM).

The cooling unit 280 according to embodiments lowers the temperature of all or some of the components included in the battery test apparatus 200 . The cooling unit 280 cools all or some of the components included in the battery test apparatus 200 . That is, the cooling unit 280 suppresses or alleviates heat generation characteristics generated during the process of strong control of the wavelength emitter 220 so that the wavelength analyzer 230 can obtain higher sensitivity. Through this, the battery inspection device 200 maintains sufficient output, durability, and minimum ripple.

The controller 290 according to embodiments controls all or some of the components included in the battery test apparatus 200 . The controller 290 is a general processor such as, for example, a central processing unit (CPU), and is embedded in the battery test apparatus 200 . However, the controller 290 may control the battery test device 200 through the communication unit 250 without being physically located inside the battery test device 200 .

Hereinafter, examples in which a battery inspection device including all or some of the components described in FIG. 2 are implemented will be described.

Figure 3 shows the inspection of the battery through the difference in the wavefront according to the embodiments.

Although the battery holder 210 (see FIG. 2 ) is omitted in FIG. 3 , it is assumed that the battery 100 moves while being mounted on the blocking holder 210 .

The wavelength emitter 220 emits a wavelength toward the battery 100 . The wavelength emitter 220 emits wavelengths in a preset range toward the battery 100 for a predetermined time according to a preset number of times and a preset cycle.

The wavelength emitter 221 is disposed between the battery 100 and the wavelength analyzer 230 . Wavelengths emitted from the wavelength emitter 221 are reflected by the battery 100 and directed toward the wavelength analyzer 230 . At this time, when a wavelength emitted from the wavelength emitter 221 passes through the battery 100, the transmitted wavelength is reflected by the battery holder 210 or a wavelength reflector (not shown), and the wavelength analyzer 230 ) towards

Alternatively, the wavelength emitting part 222 is disposed below the battery 100 . Wavelengths emitted from the wavelength emitter 222 pass through the battery 100 and head toward the wavelength analyzer 230 .

The wavelength analyzer 230 obtains data from the wavelength received from the battery 100 . The wavelength analyzer 230 compares data on the wavelength emitted by the wavelength emitter 222 with data on the wavelength received from the battery 100 to calculate a difference. The wavelength analyzer 230 detects deformation data from the calculated difference.

The wavelength analyzer 230 detects, for example, a difference in density of wavelengths through deformation data detected from acquired data. That is, the wavelength analyzer 230 detects defects generated inside the battery 100 through overlapping characteristics of wavefronts due to density differences.

At this time, the deformation data is, for example, the difference between the wavefront of the emitted wavelength and the wavefront of the received wavelength, the difference in density between the emitted wavelength and the received wavelength, the temperature change rate of the emitted wavelength, and the overlapping degree of the emitted wavefront. contains at least one

The wavelength analyzer 230 detects whether or not there is a defect in the battery 100 and/or the location of the defect based on the deformation data. For example, the wavelength analyzer 230 detects a location of a defect in the battery 100 based on a region in which a difference occurs between a wavefront of an emitted wavelength and a wavefront of a received wavelength.

3 (a) and (b) show the wavelengths reflected from or transmitted through the battery when the wavelength emitting unit 220 emits the reference wave toward the battery 100. The reference wave is, for example, a parallel wave.

3(a) shows a fracture surface in the case where the battery inspection device 200 inspects the battery 100 having no defects.

310 is a wavefront of a wavelength that is reflected from or transmitted through the cell 100 . As shown in (a) of FIG. 3, 310 is transmitted or reflected in a collimated state without deformation of optical waves. At this time, reflection occurs when the cell 100 is an ideal flat object or in a clean state without internal defects. The wavelength analyzer 230 detects that there are no defects inside the battery 100 from a wavefront having the same wavelength as the reference wave.

3(b) shows a fracture surface in the case where the battery inspection device 200 inspects the defective battery 100. As shown in FIG.

320 is a wavefront of a wavelength that is reflected from or transmitted through the cell 100 . As shown in (b) of FIG. 3, 320 shows deformations of light waves (eg, 321, 322, and 323). That is, the wavelength analyzer 230 detects the presence of a defect in the battery 100 from a wavefront having a different wavelength from the reference wave. That is, the wavelength analyzer 230 detects a phase change generated as a result of overlapping wavefronts.

In addition, the wavelength analyzer 230 detects the position of a defect existing inside the battery 100 from the deformed wavefront. At this time, the wavelength analyzer 230 detects the location of the defect based on the point where the deformed wavefront is located at the location where the defect is deformed and propagated from the center of the defect. For example, based on 321 , the wavelength analyzer 230 detects that a defect exists at a location 131 inside the battery 100 . Also, for example, the wavelength analyzer 230 detects that a defect exists at the position 132 inside the battery 100 based on 322 . In addition, the wavelength analyzer 230 detects that a defect exists at the position 132 inside the battery 100 based on 323 .

In FIG. 3, an embodiment of inspecting the inside of a battery through detection characteristics of a wavefront generated by a density difference has been described. In FIG. 4, an embodiment of inspecting the inside of a battery through a temperature change and a frequency change caused by a density difference will be described.

4 illustrates examining a cell through temperature cumulative rate of change and/or frequency according to embodiments.

FIG. 4 shows the cumulative temperature change rate and frequency detection characteristics when the battery inspection device 200 (see FIG. 2) inspects a non-defective battery 100 (see FIG. 1) and a defective battery 100. will be.

The wavelength analyzer 230 (see FIG. 2 ) detects a cumulative temperature change rate of the emitted wavelength based on the temperature change rate of the emitted wavelength. In addition, the wavelength analyzer 230 detects the location of the defect in the battery 100 based on a region in which a cumulative temperature change rate has a value greater than or equal to a preset change amount.

Alternatively, the wavelength analyzer 230 detects the frequency of the emitted wavelength based on the degree of overlap of the emitted wavefronts, and detects the location of the defect in the battery 100 based on a region in which the frequency has a value greater than or equal to a preset frequency. do.

In FIG. 4 , 330 represents a temperature change rate or frequency characteristic of a wavelength reflected from or transmitted through the non-defective cell 100 . In the case of the non-defective battery 100, since there is little or no difference in density, the accumulated temperature change rate is also small. Accordingly, a wavelength reflected from or transmitted through the non-defective cell 100 has a low-frequency. That is, in the case of the battery 100 without defects, it can be seen that there is almost no temperature change rate and a low frequency as in 330 .

In this case, the wavelength analyzer 230 determines that the accumulated temperature change rate has a value less than a preset change amount, and detects that there is no defect inside the battery 100 .

Alternatively, the wavelength analyzer 230 determines that the detected frequency characteristic has a value less than a preset frequency and detects that there is no defect inside the battery 100 .

In FIG. 4 , 340 represents a temperature change rate or frequency characteristic of a wavelength reflected from or transmitted through the defective battery 100 . In the case of the defective battery 100, a difference in density greater than a predetermined value occurs due to the defect. In addition, the accumulated temperature change rate is also large. Accordingly, a wavelength reflected from or transmitted through the defective cell 100 has a high-frequency. That is, it can be seen that the defective battery 100 has a large temperature change rate and a high frequency, such as 340 .

In this case, the wavelength analyzer 240 determines that the accumulated temperature change rate has a value greater than or equal to the preset change amount, and detects that there is a defect inside the battery 100 . In addition, the wavelength analyzer 240 detects that a defect exists at a position corresponding to a point (eg, 341) where the degree of change in the accumulated temperature change rate is large. At this time, the wavelength analyzer 240 determines that the accumulated temperature change rate is large when it rises with a slope greater than or equal to a predetermined angle in the rising curve of the accumulated temperature change rate.

Alternatively, the wavelength analyzer 230 determines that the detected frequency characteristic has a value greater than or equal to a preset frequency, and detects that a defect exists inside the battery 100 . In addition, the wavelength analyzer 240 detects that a defect exists at a point having a high frequency. At this time, the wavelength analyzer 240, the criterion for dividing the high frequency and the low frequency is based on a preset value.

5 illustrates controlling a wavelength emitting unit through STROBE control according to embodiments.

At this time, the STROBE control includes at least one of PMW (Pulse Width Modulation) control and strobe. PMW control includes on/off control. Strobe involves passing a higher intensity current than normal current control.

In FIG. 5 , the x-axis represents time t, and the y-axis represents output or signal.

The output or signal includes 1) a trigger sync time between the wavelength emitter (220, see FIG. 2) and the wavelength analyzer (230, see FIG. 2). As shown in FIG. 5 , before the wavelength emitting unit 220 emits a wavelength, the wavelength emitting unit 220 and the wavelength analyzer 230 are synchronized with each other. Through this, the wavelength analyzer 230 may obtain information on the wavelength emitted from the wavelength emitter 220 without noise such as moisture or heat.

The output or signal includes 2) exposure time of the wavelength analyzer 230 . As shown in FIG. 5 , the wavelength analyzer 230 exposes for a longer time than the strobe time of the wavelength emitter 220 in order to obtain accurate wavelength information. Through this, it is possible to obtain more accurate information.

The output or signal includes 3) the strobe time 350 of the prior art wavelength emitter. In the case of the prior art, it can be seen that the times 2) and 3) are the same or similar. In this way, when the wavelength analyzer 230 has a long strobe time, there is a problem in that errors occur due to spatial density characteristics or heat transfer over time.

To solve this problem, the output or signal includes 4) a strobe time 360 of the wavelength emitter 220 according to the embodiments. In the case of the embodiments, it can be seen that the wavelength emitter 220 has a much shorter strobe time than the exposure time of the wavelength analyzer 230 . That is, the wavelength emitter 220 emits a wavelength for a predetermined time to have an impulse characteristic in order to minimize a characteristic of spatial density or a heat transfer error according to time. At this time, the impulse characteristic means that a strong shock wave flows within a short time.

In this way, the wavelength emitting unit 220 can minimize the amount of variation according to time by having the interval w2 of the strobe time narrower than the interval w1 of the conventional strobe time. Accordingly, the wavelength emitting unit 220 flickers at high speed during a predetermined period. That is, the wavelength emitting unit 220 emits a wavelength for a preset period of time, which is a very short time, and blinks continuously to minimize the penetration of heat change rate in the surrounding environment. Through this, the embodiments may increase visibility of internal defects by minimizing a change in spatial density and a degree of temperature change.

In addition, the embodiments provide a battery inspection device 200 in which the cycle of the wavelength emitter 220 is constant, but the blinking width is changed through PWM control. Accordingly, the battery inspection apparatus 200 may provide an environment in which the characteristics of the density difference are varied under various conditions for the inspection of the battery 100 .

6 illustrates controlling embodiments via spatial phase control.

In the graph of FIG. 6 , the X axis represents the temporal or spatial phase implementation, and the Y axis represents the spatial phase of wavelengths reflected from or transmitted through the cell 100 .

The wavelength emitter 220 emits a reference wave toward the battery 100 and then emits a predetermined wavelength toward the battery 100 again. Through this, the embodiments increase the visibility of defects of the battery 100 . For example, the wavelength emitter 220 emits a plane wave as a reference wave, and then emits a wavelength in an arbitrary direction with respect to a plane as a predetermined wavelength.

For example, the wavelength emitter 220 emits predetermined wavelengths (w1 to wn) n times at predetermined time intervals, and the predetermined wavelengths (w1 to wn) are time-division and high-speed controlled. The predetermined wavelength has, for example, the form of a sine wave.

At this time, the amount of phase change during emission of the sine wave within one period is based on a phase analysis method of 4 shifts of the sine wave.

The wavelength emitter 220 overlaps the wavelength received from the battery 100 according to the reference wave and the wavelength received from the battery 100 according to a predetermined wavelength. The wavelength analyzer 230 detects the location of the defect in the battery based on a region in which the value of the wavelength generated according to the overlap has a value greater than or equal to a preset range.

In this case, predetermined wavelengths (w1 to wn) are overlapped, thereby maximizing visibility and changing frequency characteristics due to interference of the wavelengths. Accordingly, the embodiments may provide maximized inspection performance.

Although the system and method according to the embodiment of the present invention have been described as specific embodiments, this is only an example, and the present invention is not limited thereto, and should be interpreted as having the widest scope according to the basic ideas disclosed herein. .

A person skilled in the art may implement an embodiment that is not indicated by combining or substituting the disclosed embodiments, but this also does not deviate from the scope of the present invention. In addition, those skilled in the art can easily change or modify the disclosed embodiments based on this specification, and it is clear that such changes or modifications also fall within the scope of the present invention.

100: battery
200: battery inspection device
210: battery holder
220: wavelength emitting unit
230: wavelength analysis unit
270: cooling unit
280: control unit

Claims (10)

A battery holding unit in which the battery is mounted and the battery is moved;
a wavelength emitting unit that emits wavelengths in a predetermined range toward the battery for a predetermined time according to a predetermined number of times and a predetermined period; and
a wavelength analysis unit comparing the emitted wavelength with a wavelength received from the battery to detect deformation data, and analyzing defects of the battery based on the deformation data;
including,
battery tester. According to claim 1,
The transformed data,
At least one of a difference between a wavefront of the emitted wavelength and a wavefront of the received wavelength, a difference in density between the emitted wavelength and the received wavelength, a temperature change rate of the emitted wavelength, and an overlapping degree of the emitted wavefront. doing,
battery tester. According to claim 2,
The wavelength analysis unit,
Detecting a location of a defect in the battery based on a region in which a difference occurs between a wavefront of the emitted wavelength and a wavefront of the received wavelength;
battery tester. According to claim 2,
The wavelength analysis unit,
Detecting a cumulative temperature change rate of the emitted wavelength based on the temperature change rate of the emitted wavelength;
Detecting a location of a defect in the battery based on a region in which the cumulative temperature change rate has a value greater than or equal to a preset change amount;
battery tester. According to claim 2,
The wavelength analysis unit,
Detecting the frequency of the emitted wavelength based on the overlapping degree of the emitted wavefront;
Detecting the location of the defect in the battery based on a region in which the frequency has a value equal to or greater than a preset frequency;
battery tester. According to claim 1,
The wavelength emitting part,
After emitting a reference wave toward the battery, emitting a predetermined wavelength toward the battery again,
battery tester. According to claim 6,
The wavelength analysis unit,
overlapping the wavelength received from the battery according to the reference wave and the wavelength received from the battery according to the predetermined wavelength;
Detecting the location of the defect of the battery based on a region in which the value of the wavelength generated according to the overlap has a value greater than or equal to a preset range,
battery tester. According to claim 1,
The wavelength emitting unit is at least one of a thermal imaging camera and an infrared camera,
battery tester. According to claim 1,
The wavelength analyzer is executed in synchronization with the wavelength emitter,
battery tester. According to claim 1,
a cooling unit cooling at least one of the wavelength emitting unit and the wavelength analyzer;
Including more,
battery tester.

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