KR20210147599A - Leveler for plating including bis-aryl ammonium compound - Google Patents

Abstract

The present invention relates to a leveler for plating including a bis-aryl ammonium compound and a copper plating method using the same. According to the leveler and a plating solution including the same of the present invention, even in the case of microvias or via holes having a large aspect ratio, plating having an excellent bottom-up filling shape can be implemented and the plating time can be significantly reduced. The leveler for plating includes a bis-aryl ammonium represented by the following chemical formula 1.

Description

A leveling agent for plating containing a bis-aryl ammonium compound {LEVELER FOR PLATING INCLUDING BIS-ARYL AMMONIUM COMPOUND}

The present invention relates to a plating leveling agent comprising a bis-aryl ammonium compound and a copper plating method using the same.

As electronic devices become smaller and thinner, copper is being used as a wiring material instead of aluminum. Copper has a relatively low electrical resistance compared to aluminum, and has high resistance to generation of voids and poor wire breakage due to electromigration.

Previously used aluminum had a pattern formed through dry etching after plating, but in the case of copper, when a pattern is formed through dry etching, a copper-halogen compound (Cu-X complex) is generated and is not removed. causes Accordingly, when copper is used as a wiring material, a damascene process is applied. The damascene process is a method of forming an interlayer insulating layer first, forming via holes or trenches using a photolithography process and an etching process, and then filling the pattern with copper.

Copper electroplating is used to form metal wiring of most electronic devices, such as semiconductor substrates, PCBs, microprocessors, and memories. In particular, the most basic purpose of electroplating in the semiconductor or PCB process is to fill various patterns formed on the substrate without defects, and for this, the role of various organic additives included in the electrolyte is very important.

Organic additives are small amounts of organic compounds contained in the plating solution, and their composition and concentration are important factors that determine the properties of the electrodeposited thin film. They are classified into a suppressor and an accelerator according to their electrochemical properties, and a brightener, a carrier, a leveler, and the like, according to their effect on the properties of the thin film.

The leveling agent serves to help form a flat plating film, and materials having a functional group having a heteroatom such as nitrogen, oxygen, or sulfur are disclosed as organic compounds or polymers having a large molecular weight. In relation to this, Korea Patent No. 10-1464860 describes a metal seed layer leveling agent containing allyl alcohol and a method of forming a seed layer using the same, and Korean Patent Publication No. 10-2019-0061437 discloses a thioamide-based compound It is suggested that a leveling agent comprising a can improve smoothness.

Korean Patent Registration No. 10-1464860 (Registered on 14.11.18) Korean Patent Publication No. 10-2019-0061437 (published on June 5, 19)

The flattening agent for plating of the present invention has been devised to solve the above problems, and an object of the present invention is to provide a flattening agent for plating including a bis-aryl ammonium compound.

In addition, it is another object of the present invention to provide a copper plating solution comprising the flattening agent for plating.

Another object of the present invention is to provide a copper plating method using the flattening agent and a plating solution for plating.

The present invention may also have the object of achieving these objects and other objects that can be easily derived by a person skilled in the art from the general description of the present specification in addition to the above clear objects.

The flattening agent for plating of the present invention is characterized in that it includes a bis-aryl ammonium compound represented by the following Chemical Formula 1 in order to achieve the object as described above.

In Formula 1, A of the central chain _{may be CH 2} or O, R ¹ is a substituent selected from an aryl group, these may be the same as or different from each other, and R ² and R ³ are C1 to C7 alkyl group substituent is selected from (alkyl group) and an aryl group (aryl group) of a, these may be the same or different from each other, X ^- is a counter-ion of ammonium (ammonium), n is 8 to 50, or 10 to 40, or 11 to 30.

In addition, the ^{aryl group of R 1} may be selected from phenyl (Phenyl), benzyl (benzyl), naphthyl (naphthyl), and anthracenyl (anthracenyl).

In addition, the ^{C1 to C7 alkyl group of R 2} and R ³ is methyl (methyl), ethyl (ethyl), propyl (propyl), isopropyl (iso-propyl), butyl (butyl), isobutyl (iso-butyl), tert-butyl, pentyl, isopentyl, hexyl, and iso-hexyl, wherein the aryl group is phenyl, benzyl , naphthyl, and anthracenyl.

In addition, the X ⁻ is an iodide ion (I ⁻ ), a bromide ion (Br ⁻ ), a chloride ion (Cl ⁻ ), a fluoride ion (F ⁻ ), an iodate ion (IO ₃ ⁻ ), a chlorate ion (ClO ₃ ⁻ ), perchlorate ion (ClO ₄ ^- ), bromate ion (BrO ₃ ^- ), nitrate ion (NO ₃ ^- ), nitrite ion (NO ₂ ^- ), hexafluorophosphate ion (PF ₆ ^- ), tetrafluoroborate ion (BF ₄ ⁻ ), sulfate ions (HSO ₄ ⁻ ), and methyl sulfate ions (CH ₃ SO ₄ ⁻ ).

In addition, the flattening agent for plating may include a bis-aryl ammonium compound represented by Formula 2 or Formula 3 below:

In Formulas 2 and 3, n may be 8 to 50, or 10 to 40, or 11 to 30.

On the other hand, the copper plating solution according to the present invention is characterized in that it comprises the flattening agent for plating of the present invention.

In addition, the concentration of the leveling agent may be 0.5 to 1000 μM. In particular, it may be 10 to 1000 μM, or 20 to 800 μM, or 50 to 400 μM for a through-silicon electrode, and 0.5 to 50 μM, or 0.5 to 30 μM, or 0.5 to 15 μM for a microvia. .

In addition, the copper plating solution may further include at least one selected from deionized water, a copper ion compound, a supporting electrolyte, a chlorine ion compound, an accelerator, and an inhibitor.

And, the copper ion compound may have a concentration of 0.1 to 1.5 M, or 0.2 to 1.3 M, or 0.3 to 1.2 M, or 0.5 to 1.1 M.

In addition, the copper ion compound is copper sulfate (CuSO ₄ ), copper nitrate (Cu(NO ₃ ) ₂ ), copper acetate (Cu(CO ₂ CH ₃ ) ₂ ), copper methane sulfonate (Cu(CH ₃ SO ₃ ) _{2 )} ), copper carbonate (CuCO ₃ ), copper cyanide (CuCN), cupric chloride (CuCl ₂ ), and copper perchlorate (Cu(ClO ₄ ) ₂ ) It may be at least one selected from the group consisting of.

And, the supporting electrolyte may have a concentration of 0.1 to 1.2 M, or 0.2 to 1.0 M, or 0.3 to 0.8 M.

In addition, the supporting electrolyte is sulfuric acid (H ₂ SO ₄ ), citric acid (HOC(COOH)(CH ₂ COOH) ₂ ), perchloric acid (HClO ₄ ), methanesulfonic acid (CH ₃ SO ₃ H), sodium sulfate (Na ₂ SO _{4 )} ), potassium sulfate (K ₂ SO ₄ ), and boric acid (H ₃ BO ₃ ) It may be at least one selected from the group consisting of.

And, the chlorine ion compound may have a concentration of 0.1 to 3 mM, or 0.2 to 2 mM, or 0.5 to 1.8 mM.

In addition, the chlorine ion compound may be at least one selected from hydrochloric acid (HCl), sodium chloride (NaCl) and potassium chloride (KCl).

And, the accelerator It may have a concentration of 1 to 200 μM.

In addition, the accelerator is bis (3-sulfopropyl) disulfide (bis (3-sulfopropyl) -disulfide; SPS), 3-mercapto-1-propanesulfonic acid (3-mercapto-1-propanesulfonic acid; MPSA) , and 3-N,N-dimethylaminodithiocarbamoyl-1-propanesulfonic acid (3-N,N-dimethylaminodithiocarbamoyl-1-propanesulfonic acid; DPS).

And, the inhibitor may have a molecular weight of 700 to 10000 Da (dalton).

In addition, the inhibitor may be at least one selected from polyethylene glycol (PEG), polypropylene glycol (PPG), polyethylene imine, and copolymers thereof.

On the other hand, the copper plating method according to the present invention includes the steps of pre-processing a substrate having a via hole (via hole) formed; and plating the pretreated substrate with the copper plating solution described herein to form vias.

In addition, the substrate may be a silicon substrate or a polymer substrate, and the via may be a through silicon via (TSV) or microvia.

In addition, the pre-treatment may include at least one of an electrode portion peeling step and a cleaning step.

In addition, the via hole may have a depth of 60 to 150 μm, 80 to 140 μm, or 90 to 120 μm, and an average diameter of 80 to 180 μm, or 90 to 160 μm, or 100 to 140 μm, and an upper diameter of It may be larger than the lower diameter, in particular the upper diameter may be 100 to 200 μm, and the lower diameter may be 80 to 150 μm.

Further, the via hole has a depth of 20 to 100 μm, or 30 to 90 μm, or 40 to 80 μm, or 50 to 70 μm, and an average diameter of 0.1 to 20 μm, alternatively 1 to 10 μm, or 2 to 8 μm can be

Also, the aspect ratio of the via hole may be 0.2 to 40, or 0.5 to 30, or 0.6 to 20, or 0.8 to 16.

Also, the copper plating may be performed under one additive system.

According to the flattening agent of the present invention and the plating solution including the same, even in the case of a via hole having a large aspect ratio, such as a microvia or TSV, plating having an excellent floor-rise shape can be implemented.

In addition, according to the present invention, it is possible to realize highly reliable plating without defects such as seams or voids during plating of via holes or trenches of silicon substrates and PCB substrates.

In addition, the leveling agent of the present invention can significantly shorten the copper plating time (peeling time) without other organic additives, and can realize plating with excellent uniformity.

1 is a cross-sectional view of a TSV electrolytically plated using a copper plating solution according to an embodiment and a comparative example of the present invention.
2 is a cross-sectional view of a microvia electrolytically plated using a copper plating solution according to an embodiment and a comparative example of the present invention.
3 is a cross-sectional view of a TSV electrolytically plated using a copper plating solution according to a comparative example of the present invention.
4 is a cross-sectional view of a TSV electrolytically plated using a copper plating solution according to an embodiment of the present invention.
5 is a cross-sectional view of a microvia electrolytically plated using a copper plating solution according to a comparative example of the present invention.
6 is a cross-sectional view of a microvia electrolytically plated using a copper plating solution according to an embodiment of the present invention.
7 is a cross-sectional view of a microvia electrolytically plated using a copper plating solution according to an embodiment of the present invention.
8 is a cross-sectional view of a TSV electrolytically plated using a copper plating solution according to a comparative example of the present invention.
9 is a cross-sectional view of a TSV electrolytically plated using a copper plating solution according to an embodiment of the present invention.

Hereinafter, preferred embodiments of the present invention will be described in detail.

However, the present invention is not limited to the specific exemplary embodiments, since the following is merely a detailed description by exemplifying specific embodiments, and since the present invention may be variously changed and may have various forms. It should be understood that the present invention includes all modifications, equivalents and substitutes included in the spirit and scope of the present invention.

In addition, in the following description, many specific details such as specific components are described, which are provided to help a more general understanding of the present invention, and it is common in the art that the present invention can be practiced without these specific details. It will be self-evident to those who have the knowledge of And, in describing the present invention, if it is determined that a detailed description of a related known function or configuration may unnecessarily obscure the gist of the present invention, the detailed description thereof will be omitted.

And, the terms used in the present application are only used to describe specific embodiments, and are not intended to limit the present invention. Unless defined otherwise, all terms used herein, including technical and scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with the meaning in the context of the related art, and should not be interpreted in an ideal or excessively formal meaning unless explicitly defined in the present application. does not

In this application, the singular expression includes the plural expression unless the context clearly dictates otherwise.

In the present application, terms such as 'comprise', 'contain' or 'have' are intended to refer to the presence of a feature, component (or component), etc. described in the specification, but one or more other features or It does not mean that the component or the like is not present or cannot be added.

flattening agent for plating

The leveling agent of the present invention includes a bis-aryl ammonium compound represented by the following formula (1). The flattening agent for plating according to the present invention selectively suppresses the copper plating rate at the entrance of a via rather than at the bottom of the via hole, so that even a via hole with a high aspect ratio can be filled without defects.

[Formula 1]

In Formula 1, A of the central chain may be _{CH 2 or O.} R ¹ is a substituent selected from an aryl group, and these may be the same as or different from each other. R ² and R ³ are a substituent selected from a C1 to C7 alkyl group and an aryl group, and these may be the same as or different from each other. X ^- is the counter ion of ammonium.

The leveling agent of the present invention is characterized in that it has aryl ammonium at both ends and a central chain positioned between them. In Formula 1, n determines the length of the central chain, and n may be 8 to 50, or 10 to 40, or 11 to 30. If the n is less than the above range, uniformity may be poor in the filling of a single additive composition, whereas if it exceeds the above range, the hydrophilicity becomes strong and the manufacturing yield may be sharply reduced. By having a value, the plating time can be greatly shortened, and excellent uniformity can be achieved, thereby enabling an efficient plating process.

The planarizer having the above structure suppresses copper electrodeposition at the inlet of the via and effectively reduces the suppression action toward the bottom, so that excellent flooring can be achieved even for vias having a large aspect ratio. In addition, the plating time may be further shortened by having an n value within the above range.

The ^{aryl group of R 1} may be selected from phenyl (Phenyl), benzyl (benzyl), naphthyl, and anthracenyl. Although not limited thereto, the ^{aryl group of R 1} may be preferably benzyl or naphthyl.

The ^{C1 to C7 alkyl group of R 2} and R ³ is methyl (methyl), ethyl (ethyl), propyl (propyl), isopropyl (iso-propyl), butyl (butyl), isobutyl (iso-butyl), tertbutyl (tert-butyl), pentyl (pentyl), isopentyl (iso-pentyl), hexyl (hexyl), and iso-hexyl (iso-hexyl) is selected from, the aryl group is phenyl (Phenyl), benzyl (benzyl), naph tyl (naphthyl), and anthracenyl (anthracenyl).

X ^- is iodide ion (I ^- ), bromide ion (Br ^- ), chloride ion (Cl ^- ), fluoride ion (F ^- ), iodate ion (IO ₃ ^- ), chlorate ion (ClO ₃ ^- ), Perchlorate ion (ClO ₄ ^- ), bromate ion (BrO ₃ ^- ), nitrate ion (NO ₃ ^- ), nitrite ion (NO ₂ ^- ), hexafluorophosphate ion (PF ₆ ^- ), tetrafluoroborate ion (BF ₄ ^- ), sulfate ions (HSO ₄ ^- ), and methyl sulfate ions (CH ₃ SO ₄ ^- ). Although not limited thereto, the X ⁻ may be a bromide ion (Br ⁻ ).

The flattening agent for plating may include a bis-aryl ammonium compound represented by the following Chemical Formula 2 or Chemical Formula 3:

[Formula 2]

[Formula 3]

In Chemical Formulas 2 and 3, n determines the length of the central chain as described in Chemical Formula 1, and n may be 8 to 50, or 10 to 40, or 11 to 30.

As an embodiment of the present invention, the bis-aryl ammonium compound represented by Chemical Formula 3 may be prepared through a series of processes as shown in Scheme 1 below.

[Scheme 1]

First, a polyoxyethylene compound having an allyl end is formed by using polyethylene glycol through an allyl compound, a diglycidyl ether compound is prepared through the formed allyl group, and then a secondary amine is introduced to form a tertiary diamine compound. Thereafter, an aryl compound may be added to obtain a bis-aryl ammonium compound in which aryl ammonium is formed at both ends. In this way, another type of bis-aryl ammonium compound of the present invention can be prepared by applying the reaction process as in Scheme 1 above.

copper plating solution

The copper plating solution of the present invention includes a plating leveling agent including the bis-aryl ammonium compound disclosed herein.

The leveling agent may have a concentration of 0.5 to 1000 μM. In particular, it may be 10 to 1000 μM, or 20 to 800 μM, or 50 to 400 μM for a through-silicon electrode, and 0.5 to 50 μM, or 0.5 to 30 μM, or 0.5 to 15 μM for a microvia. . When the concentration of the leveling agent is less than the above range, selective suppression of the plating speed at the entrance of the via hole is insufficient, so it may not help to improve the floor elevation. On the other hand, if it exceeds the above range, Due to the imbalance, the plating properties may not be improved.

The copper plating solution may further include at least one selected from deionized water, a copper ion compound, a supporting electrolyte, a chlorine ion compound, an accelerator, and an inhibitor. However, in the copper plating solution including the leveling agent according to the present invention, excellent electrolytic plating is possible even with a one-additive system that does not include other organic additives such as accelerators and inhibitors. The existing problem of contaminating the copper plating, such as decomposition during the process, can be prevented. Therefore, according to the one-additive plating solution according to the present invention, the reliability of the device can be improved and the lifespan of the plating solution can be increased.

The copper ion compound is copper sulfate (CuSO ₄ ), copper nitrate (Cu(NO ₃ ) ₂ ), copper acetate (Cu(CO ₂ CH ₃ ) ₂ ), copper methane sulfonate (Cu(CH ₃ SO ₃ ) ₂ ), It may be at least one selected from copper carbonate (CuCO ₃ ), copper cyanide (CuCN), cupric chloride (CuCl ₂ ), and copper perchlorate (Cu(ClO ₄ ) _{2 ).} The copper ion compound may have a concentration of 0.1 to 1.5 M. Although not limited thereto, the concentration of the copper ion compound may be preferably 0.2 to 1.3 M, or 0.3 to 1.2 M, or 0.5 to 1.1 M.

The supporting electrolyte is sulfuric acid (H ₂ SO ₄ ), citric acid (HOC(COOH)(CH ₂ COOH) ₂ ), perchloric acid (HClO ₄ ), methanesulfonic acid (CH ₃ SO ₃ H), sodium sulfate (Na ₂ SO ₄ ), Potassium sulfate (K ₂ SO ₄ ), boric acid (H ₃ BO ₃ ) It may be at least one selected from the group consisting of. The supporting electrolyte may have a concentration of 0.1 to 1.2 M. Although not limited thereto, the concentration of the supporting electrolyte may be preferably 0.2 to 1.0 M, or 0.3 to 0.8 M.

The chlorine ion compound may be at least one selected from hydrochloric acid (HCl), sodium chloride (NaCl) and potassium chloride (KCl). The chlorine ion compound may have a concentration of 0.1 to 3 mM. Although not limited thereto, the concentration of the chlorine ion may be 0.2 to 2 mM, or 0.5 to 1.8 mM.

The accelerator is bis(3-sulfopropyl)disulfide (bis(3-sulfopropyl)-disulfide, SPS), 3-mercapto-1-propanesulfonic acid (MPSA), and It may be at least one selected from 3-N,N-dimethylaminodithiocarbamoyl-1-propanesulfonic acid (3-N,N-dimethylaminodithiocarbamoyl-1-propanesulfonic acid; DPS). The accelerator may have a concentration of 1 to 200 μM. Although not limited thereto, the concentration of the accelerator may be 1 to 150 μM, or 5 to 120 μM, or 10 to 100 μM.

The inhibitor may be at least one selected from polyethylene glycol (PEG), polypropylene glycol (PPG), polyethylene imine, and copolymers thereof. The inhibitor may have a molecular weight of 700 to 10000, or 800 to 9000, or 1000 to 8000 Da (daltons). The concentration of the inhibitor may be 1 to 2000 μM, but is not limited thereto, but 10 to 1500 μM, or 50 to 1200 μM may be suitable.

copper plating method

The copper plating method of the present invention includes the steps of pre-treating a substrate having via holes; and forming vias by plating the pretreated substrate with the copper plating solution of the present invention.

The substrate is not particularly limited as long as a copper seed layer is formed thereon. In particular, the substrate may be a silicon substrate, and the via may be a through silicon via (TSV). In addition, the substrate may be a polymer substrate, and the via may be a microvia.

The pre-treatment may include at least one of an electrode portion peeling step and a cleaning step. The electrode portion stripping step may be performed by immersing in a stripper consisting of an aqueous NaOH solution for 20 to 30 minutes, and the peeled via hole is subjected to a cleaning step using a cleaning solution containing _{sulfuric acid (H 2} SO _{4 ) and water.} can

The via hole may have a depth of 60 to 150 μm, 80 to 140 μm, or 90 to 120 μm, an average diameter of 80 to 180 μm, alternatively 90 to 160 μm, or 100 to 140 μm, and an upper diameter to a lower diameter. It may be larger, and in particular may have an upper diameter of 100 to 200 μm and a lower diameter of 80 to 150 μm, in which case the via may be a microvia.

Further, the via hole has a depth of 20 to 100 μm, or 30 to 90 μm, or 40 to 80 μm, or 50 to 70 μm, and an average diameter of 0.1 to 20 μm, alternatively 1 to 10 μm, or 2 to 8 μm , and in this case, the via may be a through-silicon electrode.

An aspect ratio of the via hole may be from 0.2 to 40, alternatively from 0.5 to 30, alternatively from 0.6 to 20, alternatively from 0.8 to 16. More specifically, the aspect ratio may be 0.2 to 2 for microvias and 10 to 16 for TSVs.

According to the present invention, even in the case of a microvia or a via hole having a large aspect ratio, it is possible to implement plating having an excellent bottom-to-bottom shape.

Hereinafter, the present invention will be described in more detail through examples. However, these examples are only for illustrating the present invention, and the scope of the present invention is not to be construed as being limited by these examples.

[Example]

Example 1: Preparation of leveling agent Lev 600 for plating

(1) Polyethylene glycol 600 (polyethylene glycol 600; 1.03 g, 1.72 mmol) was dissolved in anhydrous tetrahydrofuran (15 mL) and anhydrous dimethylformamide (dimethylformamide; 5 mL), and then sodium hydride (NaH; 3 equiv.) was slowly added and stirred for 30 minutes. Then, tetrabutylammonium iodide (nBu ₄ NI; 0.2 equiv.) and allyl bromide (allyl bromide; 3 equiv.) were added and stirred at room temperature for 8 hours. After the reaction was completed, the reactivity of sodium hydride was removed using distilled water, dissolved in ethyl acetate (EtOAc), and washed with distilled water. The collected organic solutions were distilled under reduced pressure and purified by column chromatography to obtain a yellowish liquid product (1.01 g, 86%).

Was dissolved in; (30 mL dichloromethane), meta-chloroperoxybenzoic acid benzo (2) (1) The product (1.64 g, 2.42 mmol) in dichloromethane produced from (meta -chloroperoxybenzoic acid;. 3 equiv ) to put the 6 It was stirred at reflux for hours. After the reaction was completed, 20 mL of dichloromethane was further added to dilute it, and then washed several times with an aqueous solution saturated with _{sodium hydrogen carbonate (NaHCO 3 ).} The collected organic solutions were distilled under reduced pressure and purified by column chromatography to obtain a white liquid product (889 mg, 36%).

(3) 10 mL of 2 M methanol solution (dimethyl amine in methanol; 2 M solution; 16 equiv.) in which dimethylamine is dissolved in the product (889 mg, 1.25 mmol) produced in (2) is added, and then at room temperature Stirred for 12 hours. The reaction product was distilled under reduced pressure, dissolved in 10 mL of distilled water, and washed with ethyl acetate (EtOAc, 20 mL). After collecting the aqueous layer, distillation under reduced pressure gave the product as a viscous, yellowish liquid.

(4) After dissolving the product produced in (3) in tetrahydrofuran (5 mL) and methanol (5 mL), 2-bromomethylnaphthalene (2-(bromomethyl)naphthalene; 2.2 equiv.) and stirred at room temperature for 12 hours. The reaction product was distilled under reduced pressure, dissolved in 20 mL of distilled water, and washed with ethyl acetate (EtOAc, 10 mL). After collecting the aqueous layer, the mixture was distilled under reduced pressure to obtain Lev 600 compound (1.41 g, 93%) as a viscous, yellowish liquid. The Lev 600 compound is represented by the following formula (n is 12 to 20).

Example 2: Preparation of leveling agent Lev 1000 for plating

(1) After dissolving polyethylene glycol 1000 (polyethylene glycol 1000; 5 g, 5 mmol) in anhydrous tetrahydrofuran (15 mL) and anhydrous dimethylformamide (15 mL), sodium hydride (NaH; 3 equiv.) was slowly added and stirred for 30 minutes. Then, tetrabutylammonium iodide ( n Bu ₄ NI; 0.2 equiv.) and allyl bromide (allyl bromide; 3 equiv.) were added and stirred at room temperature for 8 hours. After the reaction was completed, the reactivity of sodium hydride was removed using distilled water, dissolved in ethyl acetate (EtOAc), and washed with distilled water. The collected organic solutions were distilled under reduced pressure and purified by column chromatography to obtain a white solid product (2.36 g, 44%).

(2) The product (909 mg, 0.84 mmol) produced in (1) was dissolved in dichloromethane (30 mL), and then meta-chloroperoxybenzoic acid ( meta- chloroperoxybenzoic acid; 3 equiv.) was added 6 It was stirred at reflux for hours. After the reaction was completed, 20 mL of dichloromethane was further added to dilute it, and then washed several times with an aqueous solution saturated with _{sodium hydrogen carbonate (NaHCO 3 ).} The collected organic solutions were distilled under reduced pressure and purified by column chromatography to obtain a white solid product (430 mg, 46 %).

(3) To the product (430 mg, 0.39 mmol) produced in (2), 2 mL of a 2 M concentration of methanol solution (dimethyl amine in methanol; 2M solution; 10 equiv.) in which dimethylamine is dissolved was added, and the mixture was heated to 12 stirred for hours. The reaction product was distilled under reduced pressure, dissolved in 5 mL of distilled water, and washed with ethyl acetate (EtOAc, 5 mL). After collecting the aqueous layer, distillation was performed under reduced pressure to obtain a viscous, yellowish solid product.

(4) After dissolving the product produced in (3) in tetrahydrofuran (2 mL) and methanol (2 mL), 2-bromomethylnaphthalene (2-(bromomethyl)naphthalene; 2.2 equiv.) and stirred at room temperature for 12 hours. The reaction product was distilled under reduced pressure, dissolved in 5 mL of distilled water, and washed with ethyl acetate (EtOAc, 5 mL). After collecting the aqueous solution layer, it was distilled under reduced pressure to obtain Lev 1000 compound (540 mg, 90%) as a viscous yellowish solid. The Lev 1000 compound is represented by the following formula (n is 19 to 26).

Comparative Example 1: Preparation of leveling agent Lev 1 for plating

(1) Ethylene glycol (1.1 mL, 20.00 mmol) was dissolved in anhydrous tetrahydrofuran (40 mL), and sodium hydride (NaH; 3 equiv.) was slowly added under a nitrogen atmosphere and stirred for 30 minutes. did Then, tetrabutylammonium iodide ( n Bu ₄ NI; 0.2 equiv.) and allyl bromide (allyl bromide; 3 equiv.) were added and stirred at room temperature for 3 hours. After the reaction was completed, the reactivity of sodium hydride was removed using distilled water, dissolved in ethyl acetate (EtOAc), and washed with distilled water. The collected organic solutions were distilled under reduced pressure and purified by column chromatography to obtain a white liquid product (2.16 g, 76%).

(2) The product (1.64 g, 11.67 mmol) produced in (1) was dissolved in dichloromethane (30 mL) and then meta-chloroperoxybenzoic acid ( meta- chloroperoxybenzoic acid; 3 equiv.) was added 5 It was stirred at reflux for hours. After the reaction was completed, 20 mL of dichloromethane was further added to dilute it, and then washed several times with an aqueous solution saturated with _{sodium hydrogen carbonate (NaHCO 3 ).} The collected organic solutions were distilled under reduced pressure and purified by column chromatography to obtain a white liquid product (1.41 g, 69%).

(3) To the product (1.57 g, 8.94 mmol) produced in (2), 20 mL of a 2 M concentration of methanol solution (dimethyl amine in methanol; 2M solution; 20 eq.) in which dimethylamine is dissolved, was added, and 10 at room temperature stirred for hours. The reaction product was distilled under reduced pressure, dissolved in 40 mL of distilled water, and washed with ethyl acetate (EtOAc, 20 mL). After collecting the aqueous layer, distillation under reduced pressure gave the product as a viscous, yellowish liquid.

(4) After dissolving the product produced in (3) in tetrahydrofuran (10 mL) and methanol (10 mL), 2-bromomethylnaphthalene (2-(bromomethyl)naphthalene; 2.2 equiv.) and stirred at room temperature for 10 hours. The reaction product was distilled under reduced pressure, dissolved in 40 mL of distilled water, and washed with ethyl acetate (EtOAc, 20 mL). After collecting the aqueous solution layers, the mixture was distilled under reduced pressure to obtain Lev 1 compound (3.42 g, 72%) as a viscous, yellowish liquid. The Lev 1 compound is represented by the following formula.

Comparative Example 2: Preparation of leveling agent Lev 200 for plating

(1) After dissolving polyethylene glycol 200 (polyethylene glycol 200; 1 g, 5 mmol) in anhydrous tetrahydrofuran (20 mL), sodium hydride (NaH; 3 equiv.) was slowly added under a nitrogen atmosphere for 30 minutes stirred for a while. Then, tetrabutylammonium iodide ( n Bu ₄ NI; 0.2 equiv.) and allyl bromide (allyl bromide; 3 equiv.) were added and stirred at room temperature for 3 hours. After the reaction was completed, the reactivity of sodium hydride was removed using distilled water, dissolved in ethyl acetate (EtOAc), and washed with distilled water. The collected organic solutions were distilled under reduced pressure and purified by column chromatography to obtain a white liquid product (1.36 g, 97%).

(2) The product (1.26 g, 4.51 mmol) produced in (1) was dissolved in dichloromethane (30 mL), and then meta-chloroperoxybenzoic acid ( meta- chloroperoxybenzoic acid; 3 equiv.) was added 5 It was stirred at reflux for hours. After the reaction was completed, 20 mL of dichloromethane was further added to dilute it, and then washed several times with an aqueous solution saturated with _{sodium hydrogen carbonate (NaHCO 3 ).} The collected organic solutions were distilled under reduced pressure and purified by column chromatography to obtain a white liquid product (496 mg, 37%).

(3) To the product (496 mg, 1.67 mmol) produced in (2), 5 mL of a 2 M methanol solution (dimethyl amine in methanol; 2M solution; 20 eq.) in which dimethylamine is dissolved was added, and 10 at room temperature stirred for hours. The reaction product was distilled under reduced pressure, dissolved in 40 mL of distilled water, and washed with ethyl acetate (EtOAc, 5 mL). After collecting the aqueous layer, distillation under reduced pressure gave the product as a viscous, yellowish liquid.

(4) After dissolving the product produced in (3) in tetrahydrofuran (5 mL) and methanol (5 mL), 2-bromomethylnaphthalene (2-(bromomethyl)naphthalene; 2.2 equiv.) and stirred at room temperature for 10 hours. The reaction product was distilled under reduced pressure, dissolved in 10 mL of distilled water, and washed with ethyl acetate (EtOAc, 5 mL). After collecting the aqueous layer, the mixture was distilled under reduced pressure to obtain Lev 200 compound (1.18 g, 83%) as a viscous, yellowish liquid. The Lev 200 compound is represented by the following formula (n is 4 to 6).

Preparation of copper plating solution

Example 3

The copper plating solution of Example 3 was prepared by stirring and dissolving the components of the plating solution using deionized water as a solvent, and the component composition of the copper plating solution is as follows.

Copper ion source: 0.92 M copper sulfate (CuSO ₄ 5H ₂ O)

Supporting electrolyte: 0.43 M sulfuric acid (H ₂ SO ₄ )

Chlorine ion source: 0.82 mM hydrochloric acid (HCl)

Leveling agent: 7.0 μM of the bis-aryl ammonium compound prepared in Example 1

Example 4

The copper plating solution of Example 4 was prepared in the same composition as in Example 3, except that 7.0 μM of the bis-aryl ammonium compound prepared in Example 2 was used as a leveling agent.

Example 5

The copper plating solution of Example 5 was prepared by dissolving the components of the plating solution with agitation using deionized water as a solvent, and the component composition of the copper plating solution is as follows.

Copper ion source: 1.0 M copper sulfate (CuSO ₄ 5H ₂ O)

Supporting electrolyte: 0.5 M sulfuric acid (H ₂ SO ₄ )

Chlorine ion source: 1.4 mM hydrochloric acid (HCl)

Leveling agent: 100 μM of the bis-aryl ammonium compound prepared in Example 1

Comparative Example 3

The copper plating solution of Comparative Example 3 was prepared by using deionized water as a solvent and stirring and dissolving the components of the plating solution, and the component composition of the copper plating solution is as follows.

Copper ion source: 0.92 M copper sulfate (CuSO ₄ 5H ₂ O)

Supporting electrolyte: 0.43 M sulfuric acid (H ₂ SO ₄ )

Chlorine ion source: 0.82 mM hydrochloric acid (HCl)

Leveling agent: 7.0 μM of the bis-alkyl ammonium compound prepared in Comparative Example 1

Comparative Example 4

The copper plating solution of Comparative Example 4 was prepared in the same composition as in Comparative Example 3, except that 7.0 μM of the bis-aryl ammonium compound prepared in Comparative Example 2 was used as a leveling agent.

Comparative Example 5

The copper plating solution of Comparative Example 5 was prepared by stirring and dissolving the components of the plating solution using deionized water as a solvent, and the component composition of the copper plating solution is as follows.

Copper ion source: 1.0 M copper sulfate (CuSO ₄ 5H ₂ O)

Supporting electrolyte: 0.5 M sulfuric acid (H ₂ SO ₄ )

Chlorine ion source: 1.4 mM hydrochloric acid (HCl)

Leveling agent: 100 μM of the bis-aryl ammonium compound prepared in Comparative Example 1

Comparative Example 6

The copper plating solution of Comparative Example 6 was prepared in the same composition as in Comparative Example 5, except that 7.0 μM of the bis-aryl ammonium compound prepared in Comparative Example 2 was used as a leveling agent.

Test Example 1: Evaluation of floor elevation - TSV Filling in Single-Additives System

In order to confirm the copper plating pattern according to the plating leveling agent, the TSV having a via hole having a depth of 60 μm and a diameter of 5 μm was washed with a cleaning solution containing sulfuric acid, and then this was performed in Example 5 and Comparative Example 5 , and each immersed in the copper plating solution of Comparative Example 6, copper electrolytic plating was performed under the following plating conditions for 1000 seconds.

a. WE: TSV wafer (1.5 x 1.5 cm ² )

b. CE: Cu wire

c. Electrolyte: CuSO ₄ 1.0 M, H ₂ SO ₄ 0.5 M, HCl 1.4 mM

d. Rotation speed: 1000 rpm

e. Temperature: 25℃

f. Current conditions: 1 mA/cm ²

The result is the same as that of FIG. 1, and is a cross-sectional view of the TSV showing the plating pattern according to the type of the plating planarizer. 1 is a plating result with a copper plating solution of Comparative Example 5 (FIG. 1, left), Comparative Example 6 (FIG. 1, center), and Example 5 (FIG. 1, right), all of which are bottom-up filling ), it was confirmed that plating with excellent development could be implemented.

Test Example 2: Evaluation of floor elevation - Microvia Filling in Single-Additives System

In order to check the copper plating pattern according to the plating leveling agent, the PCB having via holes having a depth of 100 μm, an upper diameter of 130 μm, and a lower diameter of 100 μm is washed with a cleaning solution containing sulfuric acid, Each of Examples 3 to 4 and Comparative Examples 3 to 4 were immersed in the copper plating solution, and copper electrolytic plating was performed for 1 hour under the following plating conditions.

a. WE: PCB substrate (2.1 x 2.2 cm ² )

b. CE: insoluble anode

c. Electrolyte: CuSO ₄ 0.92 M, H ₂ SO ₄ 0.43 M, HCl 0.82 mM

d. Nozzle pressure: 0.5 kgf/cm ²

e. Temperature: 25℃

f. Current conditions: 15 mA/cm ²

The result is the same as that of FIG. 2, and it is a cross-sectional view of a microvia comparing plating patterns according to types of plating planarizers. Figure 2 is Comparative Example 3 (Figure 2, (a)), Comparative Example 4 (Figure 2, (b)), Example 3 (Figure 2, (c)) and Example 4 (Figure 2, (d)) As a result of plating with the copper plating solution of

Test Example 3: Evaluation of Filling Time - TSV Filling in Single-Additives System

The degree of filling over time was observed while plating was carried out in the same manner as in Test Example 1 through the plating solution according to Example 5 and Comparative Example 5. As a result of examining the cross-section when plated for 500 seconds with the plating solution according to Comparative Example 5 (FIG. 3), the overall plating was not yet completed, and it took about 1000 seconds to fill the whole. On the other hand, FIG. 4 is a result of plating with the plating solution according to Example 5, and the plating time is 100 seconds (FIG. 4, left), 200 seconds (FIG. 4, center), and 450 seconds (FIG. 4, right), respectively. It is a cross-section of , and it was confirmed that it was 100% filled in 450 seconds. Therefore, it can be seen that the leveling agent of the present invention can significantly shorten the plating time (peeling time).

Test Example 4: Evaluation of Filling Time - Microvia Filling in Single-Additives System

The degree of filling over time was observed while plating was carried out in the same manner as in Test Example 2 through the plating solutions according to Examples 3, 4, and Comparative Example 3. The results are the same as in FIGS. 5 to 7, and FIG. 5 is a result of plating with the plating solution according to Comparative Example 3, respectively, after 10 minutes (FIG. 5, left) and 20 minutes (FIG. 5, center) , is a cross-section after 30 minutes (Fig. 5, right), and Fig. 6 is a result of plating with the plating solution according to Example 3, respectively, after 10 minutes (Fig. 6, left) and after 20 minutes (Fig. 6, center), a cross-section after 30 minutes (FIG. 6, right), and FIG. 7 is a result of plating with the plating solution according to Example 4 from the left at 10 minutes, 20 minutes, 30 It is a cross section at the elapse of minutes. In the case of plating with the plating solution of Examples 3 and 4, almost 100% was filled after 30 minutes, but in the case of plating with the plating solution of Comparative Example 3, the plating solution was half filled even after 30 minutes. Through this, it can be seen that the plating solutions according to Examples 3 and 4, which are the plating solutions according to the present invention, are quickly filled with superior uniformity compared to Comparative Example 3. Therefore, it can be seen that the leveling agent of the present invention can significantly shorten the plating time (peeling time).

Test Example 5: Evaluation of Uniformity - TSV Filling in Single-Additives System

Using the plating solution according to Example 5 and Comparative Example 5, plating was performed in the same manner as in Test Example 1, and after 1000 seconds, a plurality of vias were observed to evaluate the uniformity. 8 is a cross-sectional view of a via plated with the plating solution of Comparative Example 5, and it can be seen that the degree of filling of each via is different, and the uniformity is very poor because only 68.5% of the TSV is filled. On the other hand, FIG. 9 is a cross-sectional view of a via plated with the plating solution of Example 5, wherein each via is uniformly filled with 100%. Through this, it can be seen that the uniformity of copper plating can be significantly improved according to the present invention.

In addition, according to the present invention, defects such as seams or voids during plating of via holes or trenches of silicon substrates and PCB substrates even in the absence of other additives such as accelerators or inhibitors ( Defect)-free and reliable plating can be implemented, so it is expected to be widely used and applied in related industrial fields.

In the above, preferred embodiments of the present invention have been described, but the present invention is not limited to the specific embodiments described above, and those skilled in the art can implement various modifications without departing from the gist of the present invention. Of course it is possible. Therefore, the scope of the present invention should not be construed as being limited to the above embodiments, and should be defined by the claims described below as well as the claims and equivalents.

Claims (20)

A bis-aryl ammonium compound represented by the following formula (1), comprising a flattening agent for plating:
[Formula 1]

In Formula 1,
A of the central chain is CH ₂ or O,
R ¹ is a substituent selected from an aryl group, which may be the same as or different from each other,
R ² and R ³ are each independently a substituent selected from a C1 to C7 alkyl group and an aryl group, which may be the same as or different from each other,
X ^- is a counter ion of ammonium,
n is from 8 to 50. The method according to claim 1,
The ^{aryl group of R 1} is selected from phenyl (Phenyl), benzyl (benzyl), naphthyl (naphthyl), and anthracenyl (anthracenyl), a plating leveling agent. The method according to claim 1,
The ^{C1 to C7 alkyl group of R 2} and R ³ is methyl (methyl), ethyl (ethyl), propyl (propyl), isopropyl (iso-propyl), butyl (butyl), isobutyl (iso-butyl), tertbutyl (tert-butyl), pentyl (pentyl), isopentyl (iso-pentyl), hexyl (hexyl), and iso-hexyl (iso-hexyl) is selected from, the aryl group is phenyl (Phenyl), benzyl (benzyl), naph A leveling agent for plating, selected from naphthyl, and anthracenyl. The method according to claim 1,
X ^- is iodide ion (I ^- ), bromide ion (Br ^- ), chloride ion (Cl ^- ), fluoride ion (F ^- ), iodate ion (IO ₃ ^- ), chlorate ion (ClO ₃ ^- ), Perchlorate ion (ClO ₄ ^- ), bromate ion (BrO ₃ ^- ), nitrate ion (NO ₃ ^- ), nitrite ion (NO ₂ ^- ), hexafluorophosphate ion (PF ₆ ^- ), tetrafluoroborate ion (BF ₄ ^- ), sulfate ions (HSO ₄ ^- ), and methyl sulfate ions (CH ₃ SO ₄ ^- ), a plating leveling agent. The method according to claim 1,
The bis-aryl ammonium compound is represented by the following Chemical Formula 2 or the following Chemical Formula 3, a leveling agent for plating:
[Formula 2]

[Formula 3]

In Formulas 2 and 3, n is each independently 8 to 50. A copper plating solution containing the flattening agent for plating according to any one of claims 1 to 5. 7. The method of claim 6,
The concentration of the leveling agent is characterized in that 0.5 to 1000 μM, copper plating solution. 7. The method of claim 6,
The copper plating solution further comprises at least one selected from deionized water, a copper ion compound, a supporting electrolyte, a chlorine ion compound, an accelerator, and an inhibitor. 9. The method of claim 8,
The copper ion compound is copper sulfate (CuSO ₄ ), copper nitrate (Cu(NO ₃ ) ₂ ), copper acetate (Cu(CO ₂ CH ₃ ) ₂ ), copper methanesulfonate (Cu(CH ₃ SO ₃ ) ₂ ), A copper plating solution selected from the group consisting of copper carbonate (CuCO ₃ ), copper cyanide (CuCN), cupric chloride (CuCl ₂ ), copper perchlorate (Cu(ClO ₄ ) _{2 ), and mixtures thereof.} 9. The method of claim 8,
The supporting electrolyte is sulfuric acid (H ₂ SO ₄ ), citric acid (HOC(COOH)(CH ₂ COOH) ₂ ), perchloric acid (HClO ₄ ), methanesulfonic acid (CH ₃ SO ₃ H), sodium sulfate (Na ₂ SO ₄ ), A copper plating solution selected from the group consisting of potassium sulfate (K ₂ SO ₄ ), boric acid (H ₃ BO _{3 ), and mixtures thereof.} 9. The method of claim 8,
The chloride ion compound is selected from the group consisting of hydrochloric acid (HCl), sodium chloride (NaCl), potassium chloride (KCl), and mixtures thereof, copper plating solution. 9. The method of claim 8,
The accelerator is bis (3-sulfopropyl) disulfide (bis (3-sulfopropyl) -disulfide, SPS), 3-mercapto-1-propanesulfonic acid (3-mercapto-1-propanesulfonic acid; MPSA), 3 -N,N-dimethylaminodithiocarbamoyl-1-propanesulfonic acid (3-N,N-dimethylaminodithiocarbamoyl-1-propanesulfonic acid; DPS), and a copper plating solution selected from the group consisting of mixtures thereof. 9. The method of claim 8,
The inhibitor is at least one selected from polyethylene glycol (PEG), polypropylene glycol (PPG), polyethylene imine and copolymers thereof, a copper plating solution. pre-processing the substrate on which the via hole is formed; and
and plating the pretreated substrate with the copper plating solution of claim 6 to form vias. 15. The method of claim 14,
The substrate is a silicon substrate or a polymer substrate, and the via is a through silicon via (TSV) or microvia, a copper plating method. 15. The method of claim 14,
The pre-treatment includes at least one of an electrode portion stripping step and a cleaning step, a copper plating method. 15. The method of claim 14,
The via hole has a depth of 60 to 150 μm, 80 to 140 μm, or 90 to 120 μm, and an average diameter of 80 to 180 μm, or 90 to 160 μm, or 100 to 140 μm. 15. The method of claim 14,
the via hole has a depth of 20 to 100 μm, alternatively 30 to 90 μm, alternatively 40 to 80 μm, alternatively 50 to 70 μm, and has an average diameter of 0.1 to 20 μm, alternatively 1 to 10 μm, alternatively 2 to 8 μm; copper plating method. 15. The method of claim 14,
An aspect ratio of the via hole is 0.2 to 40, a copper plating method. 15. The method of claim 14,
The copper plating method, characterized in that the copper plating is carried out under one additive system.

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