KR20200143053A - Method and Apparatus for Setting of Optimizing Condition for Manufacturing of Manufacture - Google Patents

Abstract

The present invention relates to a method for setting an optimal condition for product manufacturing, and to a method and a device for setting a control limit line in a device production process. The method for setting an optimal condition for product manufacturing comprises the steps of: checking a plurality of sample sets from a manufacturing set including at least one product for the same product type manufactured through a manufacturing process which includes unit processes in which at least one sensor is installed and enabling the manufacturing of products for a plurality of product types; checking sensing data for each time point obtained at different time points when the plurality of sample sets pass through the same unit process among the unit processes; removing upper and lower values corresponding to threshold values from the sensing data for each time point identified for each unit process; sampling at least one reference sensing data for each unit process from the sensing data for each point from which the upper and lower values are removed; and setting a management limit line for the sensor installed for each unit process based on the reference sensing data. Other embodiments can also be applied.

Description

Method and Apparatus for Setting of Optimizing Condition for Manufacturing of Manufacture}

The present invention relates to a method and apparatus for setting optimum conditions for product manufacturing.

In the case of manufacturing processes such as semiconductors, LCDs, petrochemicals, etc. that complete a single product through a series of very complex and numerous equipments, the appropriate range of sensors of the process equipment provided in each unit process by product type Depending on whether it is well managed within (range), the result of the unit process or the final yield of the product varies greatly. For this reason, by calculating a control limit including an upper control limit (UCL) or a lower control limit (LCL) using Xbar-R, Xbar-S, etc. A technique of statistical process control (SPC) that can manage the data within a certain range is commonly used.

Such an existing method of managing optimal conditions for product manufacturing requires a lot of time and experience to derive the main factors of each unit process included in the process. In particular, there is a problem in that it is impossible to properly set the condition management of manufacturing equipment by managing data up to 1/1000 second in order to monitor minute fluctuations for understanding customer needs or characteristics of unit processes. In particular, in the case of a multi-species manufacturing process, since manufacturing conditions are different depending on the variety, there is a need for a method to accurately set the management limit line, which is the standard of manufacturing conditions, and to manage manufacturing equipment more easily.

Embodiments of the present invention for solving such a conventional problem set manufacturing conditions for each product type/sensor included in the manufacturing process, but a product capable of continuously updating the management limit line based on the most recently acquired sensing data. It is to provide a method and apparatus for setting optimal conditions for manufacturing.

In addition, embodiments of the present invention provide a method and apparatus for setting optimal conditions for product manufacturing capable of improving the calculation speed of the management limit line by calculating the control limit line through sampling of sensing data acquired for each unit process included in the manufacturing process. To provide.

In addition, embodiments of the present invention provide a method and apparatus for setting an optimum condition for product manufacturing capable of continuously updating an optimum condition based on sensing data for a good product among products manufactured through a manufacturing process.

The method for setting optimal conditions for product manufacturing according to an embodiment of the present invention includes unit processes in which at least one sensor is installed, and for the same product type manufactured through a manufacturing process capable of manufacturing products for a plurality of product types. Checking a plurality of sample sets from among a manufacturing set including at least one product, checking sensing data for each time point obtained at different times when the plurality of sample sets pass through the same unit process among the unit processes , Removing an upper value and a lower value corresponding to a threshold value from the sensing data for each point identified for each unit process, at least one reference sensing for each unit process from the sensing data for each point in which the upper value and the lower value have been removed And setting a management limit line for the sensor installed for each unit process based on the data sampling and the reference sensing data.

In addition, the sampling of the at least one reference sensing data may include removing data values corresponding to an upper time and a lower time corresponding to a critical time from the data values included in the sensing data collected for each unit process, and And extracting and sampling the reference sensing data corresponding to a plurality of preset reference values from each of the sensing data for each time from which data values corresponding to time and the lower time are removed.

In addition, removing the data values corresponding to the upper time and the lower time corresponding to the critical time may include checking the total time consumed when each of the plurality of sample sets passes the same unit process, the total time Converting the time at which the data value included in each of the sensing data for each time point is acquired to a percentage value, and the threshold time corresponding to a specific percentage value in the sensing data for each time point based on the percentage value And removing the data values corresponding to the upper time and the lower time, respectively.

In addition, the sampling of the at least one reference sensing data includes extracting a data value corresponding to a plurality of percentage values, which are the plurality of reference values, from each of the sensing data for each time point from which the data value has been removed, as the reference sensing data, and sampling. It is characterized in that the step.

In addition, the step of setting the management limit line may include calculating the management limit line using the number of the plurality of reference values, an average value for the reference sensing data, and a standard deviation value for the average value.

In addition, the step of checking the plurality of sample sets is a step of checking a plurality of products having a manufacturing quality equal to or greater than a threshold value among products manufactured at the closest time point based on the time point at which the management limit line is to be set, as the plurality of sample sets. It features.

In addition, the electronic device for setting optimal conditions for product manufacturing according to an embodiment of the present invention is installed in unit processes included in a manufacturing process for manufacturing products for a plurality of product types to collect sensing data. A communication unit that receives the sensing data from a plurality of sensors and a manufacturing set including at least one product for the same product type manufactured through the manufacturing process checks a plurality of sample sets, and the plurality of sample sets are the unit Among the processes, the sensing data for each time point acquired at different times passing through the same unit process is checked, and the upper and lower values corresponding to the threshold values are removed from the sensing data for each time point checked for each unit process, and then the unit process And a control unit for sampling at least one reference sensing data for each unit and setting a management limit line for the sensor installed for each unit process.

In addition, the control unit converts the time at which the data value included in the sensing data for each time point is acquired into a percentage value based on the total time consumed when each of the plurality of sample sets passes through the same unit process After removing the data values corresponding to the upper period and the lower period corresponding to the percentage value, reference sensing data corresponding to a plurality of preset reference values from each of the sensing data for each time are extracted and sampled.

In addition, the control unit may calculate the management limit line using the number of the plurality of reference values, an average value for the reference sensing data, and a standard deviation value for the average value.

In addition, the control unit is characterized in that the plurality of products manufactured at a time closest to the time point at which the management limit line is to be set are identified with the plurality of sample sets having a manufacturing quality equal to or greater than a threshold.

As described above, in the method and apparatus for setting optimal conditions for product manufacturing according to the present invention, the manufacturing conditions are set for each product type/sensor included in the manufacturing process, but the management limit line is continuously maintained based on the most recently acquired sensing data. By updating to, it is possible to more accurately set the management limit line according to the equipment condition.

In addition, the method and apparatus for setting optimal conditions for product manufacturing according to the present invention calculates the management limit line through sampling of sensing data acquired for each unit process included in the manufacturing process, so that a plurality of facility sensors operating in a manufacturing plant It has the effect of improving the calculation speed of the management limit line and making it easier to manage the process equipment installed in the unit process.

In addition, the method and apparatus for setting optimal conditions for product manufacturing according to the present invention continuously update the management limit line based on sensing data for good products among products manufactured through the manufacturing process, thereby continuing the final quality and manufacturability of the product. There is an effect that can be improved with.

1 is a diagram illustrating an electronic device for setting an optimum condition for manufacturing a product according to an embodiment of the present invention.
2 is a flowchart illustrating a method of setting an optimum condition for manufacturing a product according to an embodiment of the present invention.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. The detailed description to be disclosed hereinafter together with the accompanying drawings is intended to describe exemplary embodiments of the present invention, and is not intended to represent the only embodiments in which the present invention may be practiced. In the drawings, parts irrelevant to the description may be omitted in order to clearly describe the present invention, and the same reference numerals may be used for the same or similar components throughout the specification.

In an embodiment of the present invention, expressions such as "or" and "at least one" may represent one of words listed together, or a combination of two or more. For example, “A or B” and “at least one of A and B” may include only one of A or B, and may include both A and B.

1 is a diagram illustrating an electronic device for setting an optimum condition for manufacturing a product according to an embodiment of the present invention.

Referring to FIG. 1, an electronic device 100 according to the present invention includes a communication unit 110, an input unit 120, a sensor unit 130, a display unit 140, a memory 150, and a control unit 160.

The communication unit 110 is provided outside the electronic device 100 and communicates with process devices installed in a manufacturing process for manufacturing various types of products. For example, when the manufacturing process includes a plurality of unit processes, the process device may be a device installed in each unit process. At this time, the manufacturing process can manufacture various types of products, and for this purpose, the unit processes included in the manufacturing process can be selectively operated according to the type of product. The communication unit 110 communicates with a process device installed in each unit process. In addition, the communication unit 110 communicates with a quality data discrimination device (not shown) provided outside of the electronic device 100, and is a product whose manufacturing quality is above a threshold value among products manufactured through a manufacturing process from a quality data discrimination device. That is, information on good products can be received.

To this end, the communication unit 110 may perform at least one of wired or wireless communication. The communication unit 110 may perform wireless communication such as wireless fidelity (Wi-Fi), Bluetooth, Bluetooth low energy (BLE), and near field communication (NFC). In addition, although the embodiment of the present invention describes that the electronic device 100 is implemented separately from the process devices to perform communication through the communication unit 110, it is not necessarily limited thereto, and the electronic device 100 is It can be implemented in a form including all devices.

The input unit 120 generates input data in response to an input of an administrator who is a user of the electronic device 100. The input unit 120 includes at least one input means. The input unit 120 may include at least one of a keypad, a dome switch, a touch panel, a jog shuttle, and a touch key. The administrator of the electronic device 100 can select a good product, for example, a product having a manufacturing quality higher than a threshold, from among products manufactured through a manufacturing process, that is, a good product through the input unit 120, and the input unit 120 responds to the selection input by the administrator. A corresponding selection signal may be provided to the controller 160.

The sensor unit 130 includes sensors provided in each unit process. In this case, the sensors may include various sensors such as a temperature sensor, an image sensor, a humidity sensor, a voltage measurement sensor, a pressure sensor, an illuminance sensor, and a vibration sensor. The sensor unit 130 acquires sensing data during a manufacturing process operation and transmits it to the control unit 160. In this case, when the electronic device 100 is implemented separately from the process devices, the sensor unit 130 may include wireless fidelity (Wi-Fi), Bluetooth, Bluetooth low energy (BLE), and near field communication (NFC). The sensing data may be transmitted to the controller 160 through the communication unit 110 by performing wireless communication.

The display unit 140 outputs display data. For example, the display unit 140 may include a liquid crystal display (LCD), a light emitting diode (LED) display, an organic light emitting diode (OLED) display, and the like. The display unit 140 may include a plurality of light emitting devices. The display unit 140 may be combined with the input unit 120 to be implemented as a touch screen.

The memory 150 may store operation programs of the electronic device 100. The memory 150 may store a program for operating each unit process. The memory 150 may store unit processes operated for each product type. For example, a unit A process and a unit B process may be operated to manufacture a first type product, and a unit B process and a unit C process may be operated to manufacture a second type product, and the third type A unit process, B unit process, and C unit process can be operated to manufacture a product. In addition, the memory 150 may store sensing data acquired in each unit process during product manufacturing for each product type, and may store a management limit line for each unit process set by the control unit 160 for each product type.

The control unit 160 sets a management limit line for sensors installed in unit processes included in the manufacturing process. More specifically, the control unit 160 receives a setting signal for setting a management limit line for a sensor installed in a unit process included in a manufacturing process related to a specific product type from the manager through the input unit 120. The control unit 160 may display a list on the display unit 140 from a manufacturing set generated immediately before the time when the setting signal is received to a manufacturing set manufactured before the critical time point, for example, 6 months. In this case, the manufacturing set means a set in which a plurality of products manufactured through a manufacturing process are formed in units such as packages, and may mean a lot used in the manufacturing process. The controller 160 may select a plurality of manufacturing sets as a sample set from among the manufacturing sets displayed as a list according to an input of the input unit 120. To this end, the control unit 160 may select a sample set based on a selection signal for at least two sample sets determined to contain good products from the list displayed on the display unit 140 received through the input unit 150, At least two sample sets may be selected based on information on the good goods received from the good data determination device through the communication unit 110. In this case, the sample set may mean that a plurality of products having a manufacturing quality equal to or higher than a threshold value, for example, 80% or higher, among products manufactured through a manufacturing process are included.

The controller 160 checks the sensing data for each time point acquired from a sensor provided in the unit process at a time point when a plurality of products included in each sample set among the selected plurality of sample sets pass through the unit process. For example, in the present invention, the manufacturing process includes A unit process and B unit process, A unit process includes a temperature sensor (not shown), and B unit process includes a humidity sensor (not shown). do. In addition, in the exemplary embodiment of the present invention, for convenience of explanation, one sensor is provided in one unit process as an example, but the present invention is not limited thereto, and a plurality of sensors may be provided in one unit process. .

When the sample set selected from the manufacturing set is the first manufacturing set and the second manufacturing set, the controller 160 is the point at which a plurality of products included in the first manufacturing set pass through the unit A process in the manufacturing process. The first temperature data obtained from the temperature sensor provided in the unit A process can be checked, and the first humidity data obtained from the humidity sensor provided in the unit B process can be checked at the point of passing through the unit B process. Further, the control unit 160 checks the second temperature data obtained from the temperature sensor provided in the unit A process at the time when the plurality of products included in the second manufacturing set pass through the unit A process during the manufacturing process, and At the time of passing through, the second humidity data obtained from the humidity sensor provided in the unit B process can be checked. In addition, the first temperature data, the first humidity data, the second temperature data, and the second humidity data may include a large amount of data values.

The controller 160 processes the checked sensing data and samples the reference sensing data from the processed sensing data. The controller 160 collects the sampled reference sensing data and calculates a management limit line for a sensor provided in a unit process. More specifically, the control unit 160 includes a large amount of data values, such as 10 temperature values, obtained from a temperature sensor provided in the unit A process while a plurality of products included in the first manufacturing set pass through the unit A process. In the first temperature data, the upper value and the lower value corresponding to the threshold value of the temperature value are removed. In addition, the control unit 160 determines the temperature value from the second temperature data including ten temperature values obtained from the temperature sensors provided in the unit A process while the plurality of products included in the second manufacturing set pass through the unit A process. The upper and lower values corresponding to the threshold are removed.

The controller 160 samples the reference sensing data from the sensing data from which the upper and lower values have been removed. More specifically, the control unit 160 adjusts the ratio of the first temperature data and the second temperature data for sampling in the first temperature data and the second temperature data having different acquired times. To this end, the controller 160 converts the total time for a plurality of products included in the first manufacturing set to pass through the unit A process into 100%, and obtains a data value included in the first temperature data based on the total time. Converted time to percentage value. In addition, the control unit 160 converts the total time for a plurality of products included in the second manufacturing set to pass through the unit A process to 100%, and obtains a data value included in the second temperature data based on the total time. Convert the time to a percentage value. The control unit 160 removes the upper time and lower time corresponding to the critical period from the first temperature data and the second temperature data converted into percentage values. For example, the control unit 160 converts the time at which the data values included in each of the first temperature data and the second temperature data are acquired to a percentage value between 0% and 100%, and then converts the data values from 0% to 9% and 91%. The lower and upper periods with a percentage value of 100% can be removed. And the control unit 160 is a preset reference value, such as 20%, 30%, 50%, among percentage values between 10% and 90% corresponding to the time at which the data values included in the first temperature data and the second temperature data are acquired. Data values acquired at times corresponding to 70% and 90%, that is, temperature values, are respectively extracted and sampled as reference sensing data.

The control unit 160 collects the reference sensing data and calculates a management limit line for the unit A process using an average value for the temperature value of the reference sensing data and a standard deviation value for the average value. The control unit 160 may calculate a management limit line for the temperature sensor included in the unit A process, that is, an upper control limit and a lower control limit LCL (lower control limit) using Equation 1 below, and , The calculated management limit line may be stored in the memory 150. At this time, the number of reference values is 20%, 30%, 50%, 70%, and 90%, a total of 5, and as the n value increases, the management limit line may become closer to the average value of the first temperature data and the second temperature data.

는 기준 센싱데이터 값의 표준편차값이다.) (However, CL is the average value of the reference sensing data value, n is the number of reference values,

Is the standard deviation value of the reference sensing data value.)

The controller 160 processes and collects the first humidity data and the second humidity data in the same way as the first temperature data and the second temperature data, and manages the humidity sensor included in the unit B process through sampling of the reference sensing data. The limit line can be calculated.

2 is a flowchart illustrating a method of setting an optimum condition for manufacturing a product according to an embodiment of the present invention.

Referring to FIG. 2, in step 201, the control unit 160 from the manager through the input unit 120 to set the management limit line for sensors installed in the unit process related to a specific product type among unit processes included in the manufacturing process. Check whether the setting signal is received. As a result of the confirmation in step 201, when the setting signal is received, the control unit 160 performs step 203, and if the setting signal is not received, the control unit 160 waits for reception of the setting signal.

In step 203, the control unit 160 selects a plurality of sample sets according to the input of the input unit 120 from among the recently manufactured manufacturing sets. In this case, the manufacturing set means a set in which a plurality of products for a specific product type manufactured through a manufacturing process are formed in units such as packages, and may mean a lot used in the manufacturing process. To this end, the control unit 160 displays a list from the manufacturing set generated immediately before the time when the setting signal is received to the manufacturing set manufactured before the critical time point. The administrator may select at least two sample sets determined to contain good products from the list displayed on the display unit 140 through the input unit 120. At this time, the good product can be checked based on the inspection information on the manufactured product, and the critical time point can be set by the manager. Although not shown, the electronic device 100 may select a sample set by receiving information on a good product from a good data determination device (not shown) provided outside the electronic device 100. In addition, the electronic device 100 may include a camera (not shown) and may select a sample set by determining whether the product is good or not based on the shape and color of the product identified through analysis of image data obtained from the camera. In addition, the manager may select a sample set containing more than one good product by a selection signal input from the manager based on the result of directly inspecting the product with the naked eye.

In step 205, the controller 160 checks the sensing data. More specifically, in the present invention, the manufacturing process may include an A unit process and a B unit process, and the A unit process includes a temperature sensor (not shown), and the B unit process includes a humidity sensor (not shown). Let me explain by example. In the embodiment of the present invention, for convenience of explanation, one sensor is provided in each of the unit A process and the unit B process as an example, but a plurality of sensors may be additionally provided for each unit process.

If the sample set selected in step 203 is the first manufacturing set and the second manufacturing set, the control unit 160 is in the process of unit A at the time when the plurality of products included in the first manufacturing set pass through the unit A process of the manufacturing process. The first temperature data obtained from the provided temperature sensor may be checked, and the first humidity data obtained from the humidity sensor provided in the B unit process may be checked at the time when the B unit process is passed. Further, the control unit 160 checks the second temperature data obtained from the temperature sensor provided in the unit A process at the time when the plurality of products included in the second manufacturing set pass through the unit A process during the manufacturing process, and At the time of passing through, the second humidity data obtained from the humidity sensor provided in the unit B process can be checked. In addition, the first temperature data, the first humidity data, the second temperature data, and the second humidity data may include a large amount of data values.

In step 207, the controller 160 processes the sensing data. More specifically, while the plurality of products included in the first manufacturing set pass through the unit A process, a large amount of data values, for example, the first temperature data including 10 temperature values, are acquired from the temperature sensor provided in the unit A process. It will be described as an example. The controller 160 removes the upper value and the lower value corresponding to the threshold value in order to remove the outliers from the ten temperature values included in the first temperature data. For example, under the assumption that the first temperature data follows a normal distribution, the control unit 160 may determine and remove the temperature values included in the upper 5% and the lower 5% among 10 temperature values as outliers, that is, noise data. At this time, the upper and lower 5% values are for convenience of explanation, are not necessarily limited thereto, and are values that can be changed by an administrator. The controller 160 may process the second temperature data, the first humidity data, and the second humidity data in the same manner.

In addition, if the number of data values included in the threshold value in the sensing data is greater than or equal to the reference value, the controller 160 may determine that an error has occurred in a corresponding unit process and provide an alarm to the manager. For example, if the number of data values included in the threshold value is 5 or more among 10 temperature values included in the first temperature data, the controller 160 may determine that an error has occurred in the unit A process. Through this, the administrator can immediately respond to an error when it occurs.

In step 209, the controller 160 samples reference sensing data from the sensing data processed for each unit process. More specifically, the control unit 160 adjusts the ratio of the first temperature data and the second temperature data for sampling in the first temperature data and the second temperature data having different acquired times. To this end, the controller 160 converts the total time for a plurality of products included in the first manufacturing set to pass through the unit A process into 100%, and obtains a data value included in the first temperature data based on the total time. Converted time to percentage value. In addition, the control unit 160 converts the total time for a plurality of products included in the second manufacturing set to pass through the unit A process to 100%, and obtains a data value included in the second temperature data based on the total time. Convert the time to a percentage value.

In addition, the control unit 160 removes the upper and lower times corresponding to the critical period from the times at which the data values are acquired from each of the first temperature data and the second temperature data converted to a percentage value. For example, the control unit 160 converts the time at which the data values included in each of the first temperature data and the second temperature data are acquired into a percentage value between 0% and 100%, and then converts the time from 0% to 9%, 91 Data values included in the lower time and upper time with percentage values from% to 100% can be removed. At this time, the lower time and upper time described as 0% to 9% and 91% to 100% can be changed and set by the administrator.

The controller 160 samples the reference sensing data from the first temperature data and the second temperature data from which data values included in the lower time and upper time are removed. More specifically, the control unit 160 includes between 10% and 90% corresponding to the time at which the data values included in each of the first temperature data and the second temperature data from which the data values included in the lower time and the upper time are removed are acquired. Data values, that is, temperature values obtained at times corresponding to preset reference values such as 20%, 30%, 50%, 70%, and 90% of the percentage values of are extracted and sampled as reference sensing data. In this case, the preset reference value may be that a tag is set to a percentage value that the administrator wants to centrally manage. Through this, the control unit 160 can reduce the amount of data used to calculate the management limit line, and the preset reference value and the number of reference values can be changed by the administrator.

In step 211, the controller 160 collects the sampled reference sensing data and performs step 213. In step 213, the control unit 160 calculates a management limit line, and in step 215, the control unit 160 applies the calculated management limit line. More specifically, the control unit 160 calculates a management limit line for the unit A process by using the average value of the temperature value of the sampled reference sensing data and the standard deviation value of the average value. That is, the controller 160 may calculate a management limit line, that is, an upper management limit line and a lower management limit line, using Equation 1 above.

In addition, the control unit 160 may determine that an error has occurred in the unit process and provide an alarm to the manager when sensing data acquired from a sensor included in each unit process is not included in the management limit line. For example, if the upper management limit line and the lower control limit line set in the unit A process are 20 degrees and 10 degrees, respectively, and the temperature measured in the unit A process is 3 degrees, the controller 160 may determine that an error has occurred in the unit A process. . Through this, the control unit 160 sets the limit control line for each sensor installed in the unit process using only the sensing data related to the good product among the latest sensing data, so that even when a lot of process equipment is provided, the management limit line for each sensor installed in the unit process It has the effect of being able to accurately set and controlling the unit process so that the final quality and manufacturability of the product can be continuously improved.

In addition, in the embodiment of the present invention, the manufacturing process includes an A-unit process and a B-unit process, a temperature sensor in the A-unit process, and a humidity sensor in the B-unit process, but is not limited thereto. . The manufacturing process may include a plurality of unit processes, and a plurality of sensors may be provided for each unit process, so that various types of sensing data may be obtained even in one unit process.

The embodiments of the present invention disclosed in the present specification and drawings are only provided for specific examples to easily explain the technical content of the present invention and to aid understanding of the present invention, and are not intended to limit the scope of the present invention. Therefore, the scope of the present invention should be construed that all changes or modified forms derived based on the technical idea of the present invention in addition to the embodiments disclosed herein are included in the scope of the present invention.

Claims (10)

Checking a plurality of sample sets from a manufacturing set including at least one product for the same product type manufactured through a manufacturing process that includes unit processes in which at least one sensor is installed and enables product manufacturing for a plurality of product types. step;
Checking sensing data for each time point obtained at different time points when the plurality of sample sets pass through the same unit process among the unit processes;
Removing an upper value and a lower value corresponding to a threshold value from the sensing data for each time point identified for each unit process;
Sampling at least one reference sensing data for each unit process from the sensing data for each point in which the upper and lower values have been removed; And
Setting a management limit line for the sensor installed for each unit process based on the reference sensing data;
Method for setting optimal conditions for manufacturing a product, comprising a. The method of claim 1,
Sampling the at least one reference sensing data,
Removing a data value corresponding to an upper time and a lower time corresponding to a critical time from the data values included in the sensing data collected for each unit process; And
Extracting and sampling the reference sensing data corresponding to a plurality of preset reference values from each of the sensing data for each time from which the data values corresponding to the upper time and the lower time have been removed;
Method for setting optimal conditions for manufacturing a product, comprising a. The method of claim 2,
The step of removing the data values corresponding to the upper time and the lower time corresponding to the threshold time,
Checking the total time consumed when each of the plurality of sample sets passes through the same unit process;
Converting a time at which the data value included in each of the sensing data for each time point is acquired based on the total time to a percentage value; And
Removing the upper time and the data values corresponding to the lower time corresponding to a specific percentage value that is the threshold time from the sensing data for each time based on the percentage value;
Method for setting optimal conditions for manufacturing a product, comprising a. The method of claim 3,
Sampling the at least one reference sensing data,
Setting optimal conditions for product manufacturing, characterized in that the step of extracting and sampling data values corresponding to a plurality of percentage values, which are the plurality of reference values, from each of the sensing data for each time point from which the data value has been removed, as the reference sensing data. Way. The method of claim 4,
The step of setting the management limit line,
Calculating the management limit line using the number of the plurality of reference values, an average value for the reference sensing data, and a standard deviation value for the average value;
Method for setting optimal conditions for manufacturing a product, comprising a. The method of claim 1,
The step of checking the plurality of sample sets,
The method for setting optimal conditions for product manufacturing, characterized in that the step of confirming a plurality of products having a manufacturing quality equal to or greater than a threshold value among products manufactured at a time point closest to the time point at which the management limit line is to be set, with the plurality of sample sets . A communication unit for receiving the sensing data from a plurality of sensors installed in unit processes included in a manufacturing process for manufacturing a product for a plurality of product types and collecting sensing data; And
Different time points at which a plurality of sample sets are identified among a manufacturing set containing at least one product for the same product type manufactured through the manufacturing process, and the plurality of sample sets pass through the same unit process among the unit processes Check the sensing data for each time point acquired
After removing the upper value and the lower value corresponding to the threshold value from the sensing data for each point identified for each unit process, at least one reference sensing data for each unit process is sampled to set a management limit line for the sensor installed for each unit process. A control unit;
Electronic device for setting optimum conditions for manufacturing a product comprising a. The method of claim 7,
The control unit,
Based on the total time consumed when each of the plurality of sample sets passes through the same unit process, the time at which the data value included in each of the sensing data for each time point is acquired is converted into a percentage value, and then corresponds to a specific percentage value. Electronic for setting optimal conditions for product manufacturing, characterized in that after removing the data values corresponding to the upper period and the lower period, extracting and sampling reference sensing data corresponding to a plurality of preset reference values from each of the sensing data for each time point Device. The method of claim 8,
The control unit,
And calculating the management limit line by using the number of the plurality of reference values, an average value for the reference sensing data, and a standard deviation value for the average value. The method of claim 7,
The control unit,
Electronic for setting optimum conditions for product manufacturing, characterized in that a plurality of products having a manufacturing quality equal to or greater than a threshold value among products manufactured at the closest point to the point at which the management limit line is to be set are checked with the plurality of sample sets Device.

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