KR20180061511A - Method For Processing Compensation Display Defect And Display Device Using The Same - Google Patents

Abstract

The present invention relates to a method for compensating for display defects and a liquid crystal display device using the same. An existing compensating method is able to detect and compensate for stains only when there is any compensating device, such that a cost for compensation is increased. In addition, skillfulness of a worker and a compensation time affect a compensation performance, and a compensation process is complicated. To solve such problems, the present invention receives a look up table (LUT) containing a correlation between a process parameter and a luminance difference for a display panel, extracts location information for a layered area of the display panel and luminance level information for the location information by using the LUT, and on the basis of the same, calculates a compensating value of the display panel to compensate for image data provided to the display panel.

Description

[0001] The present invention relates to a method of compensating display defects and a liquid crystal display using the same,

The present invention relates to a display defect compensation method and a liquid crystal display device using the same.

2. Description of the Related Art [0002] In recent years, in response to the development of information society, demands for display devices have been increasing in various forms. Recently, in response to this demand, a liquid crystal display device (LCD), a plasma display panel (PDP), an electro luminescent display (ELD) (Vacuum Fluorescent Display) have been studied, and some of them have already been used as display devices in various devices.

At present, active matrix liquid crystal displays (LCDs), in which a thin film transistor and pixel electrodes connected to the thin film transistor are arranged in a matrix manner, are attracting attention because of their excellent resolution and video realization capability.

In such a liquid crystal display device, a photolithography process is performed to form various patterns on a substrate. In this process, an exposure process is performed. Exposure equipment such as a stepper or an aligner is used for exposure. Generally, in the manufacture of a liquid crystal display device, an aligner device capable of exposure in one shot to one panel is adopted.

<5>, however, came to be as a liquid crystal display device to develop increasingly large area, the size of the units that make up the liquid crystal display panel increases as compared to the mask-aligner provided in a conventional aligner device. That is, even if the aligner device is used, the unit panel can not be exposed in one shot, and the unit panel is divided into a plurality of areas and exposed to the corresponding shots in each area.

<6> Facing Application In the exposure operation for the liquid crystal display device, the unit panel constituting the liquid crystal display device is divided into a plurality of unit areas (areas defined by exposure of the mask once), and the divided exposure is performed for each area . In this case, the unit of one exposure process is called a shot.

In the case where the shots are not accurately aligned because distortions such as shift, rotation, and distortion are generated in the actual shot, the difference in parasitic capacitance between the wiring and the pixel electrode Lt; / RTI &gt; As a result, the brightness difference occurs at the boundary between the pixels corresponding to the two shots, and streaks appear on the screen due to the discontinuity between the adjacent two shots.

<8> Referring now to the accompanying drawings to explain the stitch staining of the conventional liquid crystal display device as follows.

<9> Figure 1 is a plan view showing a large-sized liquid crystal display apparatus of the plurality of split-exposed area occurs in a single panel.

<10> As shown in FIG. 1, when a large-size liquid crystal display device is manufactured, even if an aligner exposure apparatus is used, stitch stain may occur. In particular, in the exposure method in the manufacture of a liquid crystal display device, when forming each pattern, the exposure operation is performed using a mask having the same shot size. For this reason, the boundaries of the shots at the time of forming each pattern are accumulated as the layers are accumulated to form a pattern. As a result, the difference of the aperture ratio between the exposed regions in which the shots are generated and the parasitic capacitances Cgs and Cgd A car is generated, which ultimately causes strong stitching on the screen.

<11> Figure 2 is a plan view showing the interface between the shot unit for generating a panel of a conventional liquid crystal display device.

As shown in FIG. 2, at the boundary portion between the exposure regions adjacent to each other, the brightness difference between the A shot and the B shot rapidly changes, so that the boundary portion appears as a band on the human eye. This is called a stitch spot.

<13> Figure 3 is a view for explaining an exposure method which compensates for uneven stitch of the conventional liquid crystal display device.

As shown in FIG. 3, the stitch unevenness compensation method of the conventional liquid crystal display device has a problem that the stitch unevenness felt by the user at the boundaries of the adjacent divided exposure areas is large, so that the adjacent divided exposure areas are partially overlapped, The stitch stain phenomenon occurring at the boundary is reduced. At this time, the overlapping regions of the adjacent divided exposure regions are referred to as LEGO regions.

<15> For example, the first split-exposed area (21a) and the second split-exposed area (21b) is overlapped by the first LEGO region (LEGO1), the second split-exposed area (21b) and the third divided exposure region The third divided exposure area 21b and the fourth divided exposure area 21d are overlapped by the second LEGO area LEGO2 and the third divided LEGO area LEGO3. Here, considering that four divided exposure regions are generated in one panel, the number of LEGO regions is determined by subtracting one from the number of divided exposure regions.

<16> However, a problem was observed when exposed to a couple of LEGO region between adjacent stitch stain sufficient exposure area to improve the luminance variation between blossomed LEGO region and the other region to form a vertical strip.

<17> Figure 4 is a view illustrating the automatic compensation method and manual compensating method of the conventional liquid crystal display device.

<18> Referring to Figure 4, this is a conventional method for compensating the luminance in the lower part stain automatic compensation method (a) and manual compensating method (b) was used.

The automatic compensation method (a) is a method for compensating for the gradation and luminance deviation after acquiring a blur map on the front panel using a CCD camera. The automatic compensation method (a) performs an image distortion correction preprocessing process including a noise removal algorithm generated at the time of photographing. Accordingly, the automatic compensation method (a) acquires the optimized luminance map and performs the compensation operation based on the obtained luminance map.

The manual compensation method (b) is a method in which a worker judges a stain on the naked eye and compensates by manually inputting the coordinate value for the stain position and the gradation compensation data. The manual compensation method (b) is effective in compensating for shaping irregularities in the form of a vertical band / a horizontal band. However, the manual compensation method (b) has a limitation because the number of maximum compensable stains is limited.

<21> The automatic or manual compensating method (a, b) is a separate compensating equipment because it is possible (for example, a high-priced camera, the operator for the dark, compensation) that have staining detection and compensation, and the cost required for the compensation There has been a problem of increase. In addition, there is a disadvantage that the skill level and the compensation time of the worker affects the compensation performance and the compensation process is complicated. In addition, the memory size required for compensation increases in the case of automatic compensation, and there is a limitation in expressing spatial compensation in the case of manual compensation, and there is a problem that precise compensation is impossible.

It is an object of the present invention to provide a display defect compensation method capable of automatically compensating for screen spots based on physical characteristics of a display device and analysis results of process parameters obtained in an exposure process, and a liquid crystal display device using the method The purpose.

The present invention also provides a display defect compensation method capable of automatically compensating for screen spots by using a lookup table (LUT) including a correlation between process parameters and a luminance deviation for a display panel, It is an object of the present invention to provide a liquid crystal display device.

It is to be understood that the objects of the present invention are not limited to the above-mentioned objects and other objects and advantages of the present invention which are not mentioned can be understood by the following description, Will be. Also, the objects and advantages of the invention will be readily appreciated that this can be realized by the means as claimed and combinations thereof.

A conventional liquid crystal display device is a method for compensating stitch unevenness, and a method of exposing a LEGO region between adjacent minute exposure regions is used. However, in this case, there is a problem that a luminance deviation occurs between the LEGO region and the other region and is observed in the form of a vertical band.

In addition, since the automatic or manual compensation method requires a separate compensation device, it is possible to detect and compensate for the blur, so that there is a problem that the cost required for compensation increases. In addition, there is a disadvantage that the skill level and the compensation time of the worker affects the compensation performance and the compensation process is complicated.

<27> In the case of automatic compensation increase the memory size required for the compensation, and there are limits of the spatial compensation is expressed for manual compensation, there is a problem in that precise compensation is not possible.

To <28> to solve these problems, a display defect compensation method of the present invention, receives a look-up table (LUT) which includes a relationship between process parameters and the luminance deviation of the display panel. Next, the brightness level information for the position information is extracted by using the position information of the overlapping area of the display panel and the lookup table, and the compensation value of the display panel is calculated based on the extracted brightness level information. Thereby compensating for the image data.

In this case, the step of extracting the brightness level information may include comparing the position information on the overlapping area with the coordinates of a target pixel of the display panel, comparing the target pixel included in the look- And extracting the brightness level information for the target pixel based on a correlation between the parameters and a correlation between the process parameter and the brightness deviation.

The step of compensating the image data may include calculating a final compensation value using the gray level of the input image data and the compensation value and compensating the image data using the final compensation value .

<31> In addition, the process parameters, including the aspect ratio, the pixels or critical dimension (CD) of the wiring width, the transistors of the pixels included in the display panel.

<32> The liquid crystal display device of the present invention, comprising: a data driver, a timing controller for compensation of the image data input to the data driver to output a display panel, image data received, the signal controller A data base for storing a lookup table including a correlation between a process parameter for the display panel and a luminance deviation; a data base for storing position information about the overlapping area of the display panel and the lookup table for the display panel; A detection unit for extracting luminance level information on the positional information by using a table and performing smear modeling on the display panel on the basis of the extracted luminance level information; .

Accordingly , the present invention can automatically compensate for the unevenness of the screen by using a lookup table (LUT) including a correlation between the process parameter and the luminance deviation for the display panel.

According to the present invention, it is possible to improve the uniformity of the brightness of the entire panel by automatically compensating the unevenness of the screen based on the physical characteristics of the display device and the analysis results of the process parameters obtained in the exposure process. In addition, since the compensation process is reduced, the time required for the smear detection and compensation process can be greatly reduced, and the hardware resources required for the compensation process can be reduced.

<35> Furthermore, according to the invention, using a look-up table (LUT) which includes a relationship between process parameters and the luminance deviation of the display panel, by automatically compensate for unevenness of the screen, a separate compensation devices (for example, For example, an expensive camera, a dark room, etc.), it is possible to simplify the compensation processing facility and the compensation process, and reduce the cost required for the compensation process.

In the case of the conventional manual compensation, time and labor of a skilled worker are required and the compensation method is complicated and difficult. On the other hand, according to the present invention, the previously stored look- As compensation is performed automatically, it is possible to perform optimum compensation processing suitable for various display panels, thereby saving time and cost required for compensation.

<37> Figure 1 is a plan view showing a large-sized liquid crystal display apparatus of the plurality of split-exposed area occurs in a single panel.
<38> Figure 2 is a plan view showing the interface between the shot unit for generating a panel of a conventional liquid crystal display device.
<39> Figure 3 is a view for explaining an exposure method which compensates for uneven stitch of the conventional liquid crystal display device.
<40> Figure 4 is a view illustrating the automatic compensation method and manual compensating method of the conventional liquid crystal display device.
<41> Figure 5 is a view showing a liquid crystal display according to some embodiments of the present invention.
<42> Figure 6 is a diagram for explaining the division exposing method using the XMB.
<43> Figure 7 is a view for explaining a case where occurrence of miss alignment (align miss) in the division exposing method using the XMB in Fig.
<44> Figure 8 is a block diagram for explaining a timing controller in Fig.
<45> Figure 9 is a flowchart illustrating a display defect compensation method of the signal controller of Fig.
<46> Figure 10 is a flowchart for a detailed description of a display defect compensation method of the signal controller of FIG.
<47> Figure 11 is a table showing the correlation between the correlation and the process parameters and the brightness difference between the position information and the process parameters in the overlap region.
<48> Figure 12 is a table showing a correlation between an aspect ratio and a luminance variation of a transistor included in a display panel according to another embodiment of the present invention.
<49> Figure 13 is a graph showing a compensation weight according to the gray level of the input image.
<50> Figure 14 is a flowchart illustrating a method for generating a look-up table stored in the database of FIG.
<51> Figure 15 is a view for explaining the effect of the display defect compensation method according to some embodiments of the present invention.

The above and other objects, features and advantages of the present invention will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings, which are not intended to limit the scope of the present invention. . In the following description, well-known functions or constructions are not described in detail since they would obscure the invention in unnecessary detail. Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the drawings, the same reference numerals are used to denote the same or similar elements.

<53> or less, will be described in detail with reference to the drawings show a defect compensation method and apparatus using this display according to an embodiment of the invention.

<54> Figure 5 is a view showing a liquid crystal display according to some embodiments of the present invention.

If <55> Referring to Figure 5, a liquid crystal display device of the present invention includes a timing controller 100, a data driver 200, a gate driver 300, a display panel 400.

The timing controller 100 receives the synchronizing signals (Hsync, Vsync) and the clock signals (DE, MCLK) for displaying RGB image signals, RGB image signals. The timing controller 100 outputs the compensated RGB image signals R ', G', and B 'to the data driver 200. The timing controller 100 generates a timing signal for controlling the data driver 200 and the gate driver 300 and outputs the generated timing signal to the data driver 200 and the gate driver 300, respectively.

The timing controller 100 transmits a horizontal clock signal HCLK, a horizontal synchronization start signal STH and a load signal LOAD to the data driver 200.

<58> More specifically, the horizontal clock signal (HCLK) is used to shift the data in the data driver 200. The horizontal synchronization start signal STH is used to convert the data input to the data driver 200 into analog data and apply the converted analog data to the display panel 400. The load signal LOAD instructs the data driver 200 to load the data signal.

The timing controller 100 includes a gate clock signal for setting the period of the gate-on signal applied to the gate line to the gate driver 300, a vertical synchronization start signal for starting the gate- (STV), and an output enable signal OE (Enable) for enabling the output of the gate driver 300. [

<60> the other hand, the timing control unit 100 to the luminance variation in this case for applying the normal R, G, B data signals without division of dividing an exposure area in an initial state occurs each LEGO region (LEGO1, LEGO2, LEGO3) region having And stores the information about it. The timing control unit 100 compensates the RGB image signals R, G and B based on the information on the luminance deviations of the respective LEGO regions LEGO1, LEGO2 and LEGO3 and supplies the compensated RGB image signals R 'and G' , B ') to the data driver 200.

The data driver 200 receives and stores the compensated R, G, and B digital data R ', G', and B 'from the timing controller 100. When the load signal LOAD is applied, the data driver 200 selects the voltages corresponding to the respective digital data and outputs the data signals V1, V2, V3, and Vn (not shown) to the display panel 400, .

The data driver 200 outputs the data voltages V1, V2, V3, and Vn so that the polarities of the pixels arranged on the display panel 400 are inverted for each frame. At this time, reversing the polarity of the pixel every frame is intended to prevent the deterioration of the operation that may occur when a certain polarity remains in the liquid crystal.

The gate driver 300 includes a shift register, a level shifter, a buffer, and the like. The gate driver 300 receives a gate clock signal and a vertical line start signal STV from the timing controller 100 and receives a voltage Von from the gate driving voltage generator or the timing controller 100. [ , Voff, and Vcom (not shown) to turn on or off each thin film transistor on the display panel 400 to apply or cut off the pixel voltage to the pixel.

The display panel 400 includes n data lines, m gate lines arranged orthogonally to the data lines, and a certain region arranged in a lattice between the data lines and the gate lines. The display panel 400 includes a thin film transistor having one end connected to the gate line, the other end connected to the data line, and the other end connected to the pixel electrode, and a pixel electrode. The gate voltages G1, G2, ..., Gn (not shown) provided from the gate driver 300 in the display panel 400 are applied to the corresponding pixel columns. In this case, the thin film transistors in the corresponding pixel column are activated. The data voltages D1, D2, ..., Dm (not shown) provided by the data driver 200 are applied to corresponding pixel electrodes of the display panel 400. [

In recent liquid crystal display devices, as the size of the display panel gradually becomes larger, the size of a unit panel constituting a liquid crystal display becomes larger than that of a mask for exposure provided in existing exposure equipment. That is, when the exposure process is performed on the display panel, the unit panel constituting the liquid crystal display device is divided into a plurality of regions and divided and exposed to shots corresponding to the respective regions.

<66> or less in the last division exposure method is often used in which XMB; will be described, for example, the division exposing method using the (X-axis Masking Blade below XMB). However, the present invention is not limited thereto.

<67> Figure 6 is a diagram for explaining the division exposing method using the XMB.

If <68> Referring to Figure 6, one of the divided exposure process XMB overlap block division exposure technique for exposing dividing a single panel into two or more shots (Shot). The XMB divided exposure process represents an overlay exposure method using an XMB unit. The XMB division exposure process is an exposure method that applies a gradual exposure method to improve stitch unevenness phenomenon (including LEGO) in a mask shot overlapped portion and adds the left and right shots to make the summed roughness 100%.

In the case of the XMB division exposure process, a blade is added in the X axis direction of the panel to expose the overlapped portion of the shot, thereby extending the panel in the scan orthogonal direction. In the case of using the XMB division exposure process, the problem of sharp stitch stain can be solved.

<70> However, it is the actual shot of a distortion such as a transition (shift), rotation (rotation), the torsion (distortion) may occur. Therefore, when the shots are not accurately aligned even in the XMB division exposure process, unevenness may occur in the overlapped portion where the shots overlap.

<71> Figure 7 is a view for explaining a case where occurrence of miss alignment (align miss) in the division exposing method using the XMB in Fig.

If <72> Referring to Figure 7, a first when the first condition (Case 1) is away, the distance between the first shot (shot1) and the second shot (shot2) overlap area increases. In the first case (Case 1), as the amount of exposure of the overlapped portion is shielded by the blade, the exposure energy is reduced and the combined illumination of the overlapping portion is lowered. In this case, the critical dimension (Pixel CD) of the pixel located in the overlapping portion is increased.

In the second case (Case 2), the distance between the second shot (shot 2) and the third shot (shot 3) becomes close to each other, so that the overlapping area is increased. In the second case (Case 2), the amount of exposure of the overlapped portion by the blade is reduced, so that the exposure energy is increased, and the combined illumination of the overlapping portion is increased. In this case, the critical dimension (Pixel CD) of the pixel located in the overlapping portion is reduced.

<74> In other words, if it misses the alignment time division exposure occurs using the XMB, because exposure is not uniformly formed, it becomes a luminance difference occurs between the overlapping portion and the portion of the patch was a problem in that unevenness is formed.

<75>, based on the analysis result of the process parameters obtained in the physical properties of the exposure process of a display device in the following, to describe the automatic can compensate show defect compensation method that the unevenness of display and the timing controller using the same.

<76> Figure 8 is a block diagram for explaining a timing controller in Fig.

If <77> Referring to Figure 8, as a display defect compensation system that can signal controller 100 in accordance with some embodiments of the present invention is to prevent the occurrence unevenness of the strip by the XMB divided exposure process, database 110 A detection unit 120, and a compensation unit 130.

The database 110 stores a lookup table (LUT) including data of a correlation between a process parameter and a luminance deviation for a display panel. At this time, the database 110 may store a plurality of lookup tables (LUTs) for each display panel. If the detection unit 120 requests data for a specific display panel in the database 110, the database 110 provides data of a lookup table (LUT) for the specific display panel to the detection unit 120 .

The detecting unit 120 obtains the positional coordinates of the overlapped area and the degree of luminance deviation using the parameters for the XMB divided exposure process of the individual display device, and performs the modeling of the blur of the display panel.

<80> Specifically, the detection unit 120 may use a look-up table (LUT) for the position information and the display panel to the overlapping area of the display panel, the luminance level extracted information on the location information. At this time, the detection unit 120 may extract the brightness level information for the positional information of the overlap region using the correlation between the process parameter and the brightness deviation included in the lookup table (LUT) received in the database 110. [ The detection unit 120 can model the unevenness of the display panel based on the position information and the brightness level information on the overlapping area.

The compensating unit 130 may calculate the compensation value for the display panel using the result of the smear modeling. The compensation unit 130 includes a memory 135 and may store the calculated compensation value in the memory 135. [

<82> specifically, the compensation unit 130 may compensate for the video data to generate compensation data of pixels from the position information and the brightness level information for each pixel to be output to the display panel.

<83> In addition, the compensation unit 130 may calculate the final compensation value by using a gray scale and the compensation value of the image data being input, and using the last compensating value compensating for the image data in real time. At this time, the final compensation value may be stored in the memory 135 inside the compensation unit 130.

<84> As a result, the timing controller 100 of the present invention automatically analyzes and acquires the position and the luminance difference between the two adjacent divided area exposed to the process parameter based. Then, the timing controller 100 can perform compensation by converting the acquired data into gradation-based compensation data and applying an independent data signal to the corresponding coordinates.

<85> Figure 9 is a flowchart illustrating a display defect compensation method of the signal controller of Fig.

<86> Referring to Figure 9, a display defect compensation method according to some embodiments of the invention First, the detection unit 120 receives information of the display panel, and the database for a look-up table (LUT) for received display panel (S110).

<87> At this time, the look-up table (LUT) comprises a correlation between correlation between the process parameters for the position information and the display panel of a display panel related to the process parameters and the luminance deviation. At this time, the luminance deviation represents compensation data to be compensated.

<88> Then, the detector 120 may use the location information and the received look-up table (LUT) of the overlapping area of the display panel, and extracts the luminance level information on the location information of a certain pixel (S120).

<89> Then, the detection unit 120 is location information, and on the basis of the brightness level information, and performs a stain model of the display panel, the compensating part 130 calculates a compensation value for the display panel (S130). At this time, the calculated compensation value is stored in the memory (135 in FIG. 8).

<90> Then, the compensation unit 130 using the stored compensation value compensation process of image data in real time is provided to the display panel (S140).

<91> or less, we look at the compensation processing method for such a display defect of the present invention in slightly more detail.

<92> Figure 10 is a flowchart for a detailed description of a display defect compensation method of the signal controller of FIG. 11 is a table showing the correlation between the position information of the overlap region and the process parameter and the correlation between the process parameter and the brightness deviation. 12 is a table showing the correlation between the aspect ratio of the transistor included in the display panel and the luminance deviation as another embodiment of the present invention. 13 is a graph showing compensation weights according to the gradation of an input image.

If <93> reference to Figure 10, the compensation action for display defects of the present invention First, the counting pixel coordinates of the display panel (S210).

<94> Then, the detection unit 120 compares the position information and the counted pixel coordinates for the overlapping area of the display panel (S220). At this time, information on the overlapping area of the display panel can be extracted from a lookup table (LUT) stored in the database 110. [

<95> For example, referring to <a> of Figure 11, the look-up table (LUT) is located in the overlap region and the process parameters (e.g., critical dimensions (CD PXL) of the pixel) for the correlation between Data may be included.

<96> Then, if the corresponding pixel coordinates of the detection unit 120 is a display panel consistent with the position information of the overlap region, and with reference to the value of the luminance level information of the process parameters of the pixels determine the compensation data (S230, S240 ). At this time, the correlation between the value of the process parameter and the brightness level information can be extracted using a lookup table (LUT).

<97> For example, referring to <b> in Figure 11, the look-up table (LUT) is data for the relationship between the process parameters (e.g., critical dimensions (PXL CD) of the pixel) and the luminance deviation . At this time, the luminance deviation may coincide with the luminance level information and the compensation value for a specific pixel. However, the present invention is not limited thereto, and the compensation value can be derived through additional calculation based on the luminance deviation.

<98> However, the process parameters are not limited to the critical dimension (PXL CD) of the pixel, the display wiring width of the pixels included in the panel, and the aspect ratio of the transistor (Tr W / L), the thickness of the gate or the source / drain, The critical dimension of the gate (Gate CD), the thickness of the pigment, and the like.

<99>, for example, 12, a display defect compensation method according to another embodiment of the present invention is by using a correlation between the aspect ratio of the transistor (Tr W / L) and the luminance variation determining the compensation value have. Data on the correlation between the aspect ratio (Tr W / L) of this transistor and the luminance deviation can be stored and used in a look-up table (LUT).

<100> On the other hand, if the corresponding pixel coordinates of the display panel do not coincide with the position information of the overlap area, the process moves to the next pixel of the display panel and repeats steps S220 and S230.

<101> Next, the correction unit 130 maps the previously calculated in accordance with the gradation of the image data input to the compensation value (S250).

<102> then calculates a final compensation data based on the gray level and the calculated compensation value of the input image (S260). The calculated final compensation value is stored in the memory 135 of the compensation unit 130.

<103> In this case, the compensation unit 130 determines the final compensation value by using the correlation graph on a gray level (gray) and the compensating weights shown in Fig. However, the present invention is not limited thereto.

<104> Next, the compensation unit 130 and outputs the compensation to the image data that is input using the last compensating value is stored (S270). The final compensation data corresponding to the input image data of the corresponding coordinate is read, compensated, and the compensated image data is output.

Accordingly , the display defect compensation method of the present invention can automatically compensate for the unevenness of the screen, thereby improving the uniformity of the brightness of the entire panel. In addition, the time required for the smear detection and compensation process can be greatly reduced by reducing the compensation process, and the hardware resources required for the compensation process can be reduced.

<106> In addition, by using a look-up table (LUT) which includes a relationship between process parameters and the luminance deviation of the display panel, it is possible to automatically compensate for unevenness of the screen. Accordingly, the present invention can perform the compensation process without purchasing a separate compensation device (e.g., expensive camera, darkroom, etc.), simplify the compensation process facility and the compensation process, The required cost can be reduced.

<107> Figure 14 is a flowchart illustrating a method for generating a look-up table stored in the database of FIG.

When <108> Referring to Figure 14, the process parameters used in the look-up table (LUT) stored in a database of a liquid crystal display of the present invention includes a critical dimension (CD PXL) of the pixel. However, the present invention is not limited to this, and may be applied to a case where the width of a pixel included in a display panel, the aspect ratio (Tr W / L) of a transistor, the thickness of a gate or a source / drain, And the like.

In the <109> or less for the convenience of description, a case that the process parameters of the critical dimension (CD PXL) of the pixel An example will be described a method for creating a look-up table (LUT).

<110> First, the overlapping area of the display panel which is the inspection object (for example, XBM overlapping portion of the divided exposure process), and calculates the design values (e.g., overlapping parts of position coordinates) on (S310).

<111> Then, in the XBM division exposure process, data regarding the critical dimension (CD) deviation between the overlapping area and the normal area of the display panel is collected (S320).

<112> Next, data on the deviation of the process value and the luminance deviation of the display panel are collected (S330).

<113> Next, analyze the relationship between the critical dimension (CD) variation and luminance variation (S340).

<114> Next, the obtained data for the critical dimensions (CD) the transmittance-voltage curve of the variation (TV curve) (S350).

<115> Next, a step-by-step to produce a look-up table (LUT) based on a specific threshold value (or reference value) from the derived data (S360).

Performs; (FOS Front of Screen) ( S370) <116> Then, based on a look-up table (LUT) setting the compensation values for the overlap region, and the image evaluation in accordance with the compensation value.

<117> is then stored in the database, a look-up table (LUT) the image evaluation is finished by the display panel (S380).

<118> However, the method for creating a look-up table (LUT) as described above is only an embodiment of the present invention, but the invention is not limited to this.

<119> Figure 15 is a view for explaining the effect of the display defect compensation method according to some embodiments of the present invention.

When <120> Referring to Figure 15, Figure 15 shows the transmittance-voltage curve (TV curve) for the display panel before and after the performing the display defect compensation method according to the present invention.

In general, in the case of the display panel before the compensation, there may be a difference between the target value at the time of designing and the measured value in the actual display panel.

<122> The present invention is based on the analysis result of the process parameters obtained in the physical properties of a display device and an exposure process, and determines the compensation value for achieving the target value at the time of design. Specifically, the present invention automatically compensates for screen spots by using a pre-stored look-up table (LUT) including a correlation between process parameters and luminance deviations for the display panel.

Accordingly , the present invention can greatly reduce the time required for the smear detection and compensation process by automating the compensation process, and can reduce the hardware resources required for the compensation process. In addition, compensation can be automatically performed using pre-stored look-up tables for each type of display panel, without using any compensation device (for example, expensive camera, dark room, etc.). Thus, the present invention can perform optimal compensation processing suitable for various display panels, thereby saving human resources required for compensation.

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, And are not limited by the accompanying drawings.

100: timing controller 110: database
120: Detection unit 130:
135: memory 200: data driver
300: Gate driver 400: Display panel

Claims (12)

Comprising: receiving a look-up table (LUT) including data on a correlation between a process parameter and a luminance deviation for the display panel, based on information of the display panel;
Extracting brightness level information for the position information using the position information on the overlapping area of the display panel and the lookup table;
Performing smoothing modeling on the display panel based on the position information and the brightness level information, and calculating a compensation value for the display panel; And
And compensating image data provided to the display panel using the compensation value
Display defect compensation method.
The method according to claim 1,
The step of extracting the brightness level information
Comparing the position information for the overlapping area with the coordinates of a target pixel of the display panel; And
Extracting the brightness level information for the target pixel based on a correlation between the target pixel and the process parameter included in the lookup table and a correlation between the process parameter and the brightness deviation
Display defect compensation method.
The method according to claim 1,
The step of compensating the image data
Calculating a final compensation value using the gray level of the input image data and the compensation value, and compensating the image data using the final compensation value
Display defect compensation method.
The method according to claim 1,
Wherein the overlap region is a region in which a first exposure region in the divisional exposure process of the display panel and a second exposure region different from the first exposure region overlap each other
Display defect compensation method.
The method according to claim 1,
Wherein the process parameters include a width of a pixel included in the display panel, an aspect ratio of a transistor, or a critical dimension (CD) of a pixel
Display defect compensation method.
6. The method of claim 5,
Wherein the lookup table includes data of a transmittance voltage curve (TV curve) with respect to a critical dimension deviation between the overlap region and the normal region
Display defect compensation method.
A display panel in which data lines and gate lines cross each other;
A data driver for converting input image data into data voltages and outputting the data voltages to the data lines;
A gate driver sequentially outputting a gate pulse synchronized with the data voltage to the gate lines; And
And a timing controller for compensating for the image data input to the data driver,
The timing control unit
A database for storing a lookup table including data on a correlation between a process parameter and a luminance deviation for the display panel;
A detecting unit for extracting brightness level information for the positional information using the positional information on the overlapping area of the display panel and the lookup table for the display panel and performing smear modeling on the display panel based on the extracted brightness level information; And
And a compensation unit for calculating a compensation value for the display panel using the result of the smear modeling
Liquid crystal display device.
8. The method of claim 7,
The compensation unit
Calculating a final compensation value using the gray level of the input image data and the compensation value, and compensating the image data using the final compensation value
Liquid crystal display device.
9. The method of claim 8,
The compensation unit
And a memory for storing the calculated final compensation value
And compensates the input image data in real time based on the final compensation value
Liquid crystal display device.
8. The method of claim 7,
Wherein the overlap region is a region in which different first and second exposure regions included in the display panel overlap each other
Liquid crystal display device.
8. The method of claim 7,
Wherein the process parameters include a width of a pixel included in the display panel, an aspect ratio of a transistor, or a critical dimension (CD) of a pixel
Liquid crystal display device.
12. The method of claim 11,
Wherein the lookup table includes data of a transmittance voltage curve (TV curve) with respect to a critical dimension deviation between the overlap region and the normal region
Liquid crystal display device.

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