KR20170140156A - DNV magnetic field detector - Google Patents

Abstract

The system for magnetic detection includes a nitrogen vacancy (NV) diamond material comprising a plurality of NV centers, a radio frequency (RF) excitation source configured to provide an RF excitation to the NV diamond material, an optical configured to provide an optical excitation to the NV diamond material An excitation source, an optical detector configured to receive an optical signal emitted by the NV diamond material, and a controller. The optical signal is based on the ultrafine states of the NV diamond material. The controller is configured to detect an inclination of the optical signal based on ultrafine states emitted by the NV diamond material.

Description

DNV magnetic field detector

This application claims priority benefit from U.S. Provisional Patent Application No. 62 / 257,988, filed November 20, 2015, the entirety of which is incorporated herein by reference. This application claims priority benefit from U.S. Provisional Patent Application No. 62 / 190,209, filed July 8, 2015, which is hereby incorporated by reference in its entirety. This application claims priority from co-pending U.S. Application No. 62 / 261,643, filed December 1, 2015, which is hereby incorporated by reference in its entirety. This application claims priority from US Provisional Patent Application No. 62 / 109,006, filed January 28, 2015, and 62 / 109,551, filed January 29, 2015, each of which is incorporated herein by reference in its entirety. . This application claims priority benefit from U.S. Provisional Patent Application No. 62 / 214,792, filed September 4, 2015, the entirety of which is incorporated herein by reference. This application claims priority from U.S. Provisional Patent Application No. 62 / 258,003, filed November 20, 2015, which is hereby incorporated by reference in its entirety. This application claims priority from U.S. Provisional Patent Application No. 62 / 190,218, filed July 8, 2015, which is hereby incorporated by reference in its entirety. This application claims priority from U.S. Provisional Patent Application No. 62 / 107,289 filed on January 23, 2015, the entirety of which is incorporated herein by reference. This application claims priority from U.S. Serial No. 15 / 003,558, filed on January 21, 2016, entitled " APPARATUS AND METHOD FOR HYPERSENSITIVITY DETECTION OF MAGNETIC FIELD ", which is hereby incorporated by reference in its entirety. This application claims priority from U.S. Serial No. 15 / 003,062, filed on January 21, 2016, entitled " IMPROVED LIGHT COLLECTION FROM DNV SENSORS ", which is hereby incorporated by reference in its entirety. This application claims priority from U.S. Serial No. 15 / 003,652, filed on January 21, 2016, entitled " PRECISION POSITION ENCODER / SENSOR USING NITRROGEN VACANCY DIAMOND, " which is hereby incorporated by reference in its entirety. This application claims priority from U.S. Serial No. 15 / 003,677, filed on January 21, 2016, entitled " COMMUNICATION VIA A MAGNIO, " which is hereby incorporated by reference in its entirety. This application claims priority from U.S. Serial No. 15 / 003,678, filed on January 21, 2016, entitled " METHOD FOR RESOLVING NATURAL SENSOR AMBI- CHITY FOR DNY DIRECTION FINDING APPLICATIONS ", which is hereby incorporated by reference in its entirety do. This application claims priority from U.S. Serial No. 15 / 003,177, filed on January 21, 2016, entitled " HYDROPHONE, " which is hereby incorporated by reference in its entirety. This application claims priority to U.S. Serial No. 15 / 003,206, filed on January 21, 2016, entitled " MAGNETIC NAVIGATION METHODS AND SYSTEMS UTILIZING POWER GRID AND COMMUNICATION NETWORK, " do. This application is related to co-pending U. S. Serial No. 15 / 003,193, filed January 21, 2016, entitled " RAPID HIGH-RESOLUTION MAGNETIC FIELD MEASUREMENTS FOR POWER LINE INSPECTION ", which is hereby incorporated by reference in its entirety Claim priority. This application is also related to copending U.S. Serial No. 15 / 003,088, filed on January 21, 2016, entitled " IN-SITU POWER CHARGING, " which is hereby incorporated by reference in its entirety. This application is related to co-pending U.S. Serial No. 15 / 003,519, filed January 21, 2016, entitled " APPARATUS AND METHOD FOR CLOSED LOOP PROCESSING FOR A MAGNETIC DETECTION SYSTEM ", which is hereby incorporated by reference in its entirety . This application is related to co-pending U. S. Application No. < / RTI > filed on January 21, 2016, entitled " APPARATUS AND METHOD FOR RECOVERY OF THREE DIMENSIONAL MAGNETIC FIELD FROM A MAGNETIC DETECTION SYSTEM ", which is hereby incorporated by reference in its entirety 15 / 003,718. This application claims priority from co-pending U.S. Application No. 15 / 003,209, filed January 21, 2016, entitled "DIAMOND NITROGEN VACANCY SNESED FERRO-FLUID HYDROPHONE", which is hereby incorporated by reference in its entirety do. This application claims priority of co-pending U.S. Application No. 15 / 003,670, filed January 21, 2016, entitled " AC VECTOR MAGNETIC ANALYTICS DETAILS WITH DIAMOND NITROGEN VACANCIES ", which is hereby incorporated by reference in its entirety I argue. This application is related to co-pending U.S. Application No. 15, filed January 21, 2016, entitled "APPARATUS AND METHOD FOR ESTIMATING ABSOLUTE AXES ORIENTATIONS FOR A MAGNETIC DETECTION SYSTEM", which is hereby incorporated by reference in its entirety / 003,704. Filed January 21, 2016, entitled " APPARATUS AND METHOD FOR HIGH SENSITIVITY MAGNETOMETRY MEASUREMENT AND SIGNAL PROCESSING IN A MAGNETIC DETECTION SYSTEM, " filed January 21, 2016, which is incorporated herein by reference in its entirety. No. 15 / 003,590. This application claims priority from co-pending U.S. Serial No. 15 / 003,176, filed on January 21, 2016, entitled " MAGNETIC BAND-PASS FILTER ", which is hereby incorporated by reference in its entirety. This application claims the benefit of co-pending U.S. Serial No. 15 / 003,145, filed on January 21, 2016, entitled "DEFECT DETECTOR FOR CONDUCTIVE MATERIALS", which is hereby incorporated by reference in its entirety. This application claims priority from co-pending U.S. Application No. 15 / 003,309, filed on January 21, 2016, entitled "DIAMOND NITROGEN VACANCY SENSOR WITH DUAL RF SOURCES", which is hereby incorporated by reference in its entirety do. This application is related to co-pending U.S. Application No. 15 / 003,298, entitled " DIAMOND NITROGEN VACANCY SENSOR WITH COMMON RF AND MAGNETIC FIELDS GENERATOR, "filed January 21, 2016, which is hereby incorporated by reference in its entirety Claim priority. This application claims the benefit of co-pending U.S. Serial No. 15 / 003,292 filed on January 21, 2016 entitled " MAGNETOMETER WITH A LIGHT EMITTING DIODE ", which is hereby incorporated by reference in its entirety. This application claims priority from copending U.S. Serial No. 15 / 003,281, filed January 21, 2016, entitled " MAGNETOMETER WITH LIGHT PIPE ", which is hereby incorporated by reference in its entirety. This application is related to co-pending U.S. Serial No. 15 / 003,634, filed on January 21, 2016, entitled " DIAMOND WITH CIRCUITRY FOR USE IN DIAMOND NITROGEN VACANCY SENSOR ", which is hereby incorporated by reference in its entirety Claim priority. This application is related to co-pending U.S. Serial No. 15 / 003,577, filed January 21, 2016, entitled " MEASUREMENT PARAMETERS FOR QC METROLOGY OF SYNTHETICALLY GENERATED DIAMOND WITH NV CENTERS ", which is hereby incorporated by reference in its entirety . This application claims priority from co-pending U.S. Application No. 15 / 003,256, filed January 21, 2016, entitled " HIGHER MAGNETIC SENSITIVITY THROUGH FLUORESCENCE MANIPULATION BY PHONON SPECTRUM CONTROL ", which is hereby incorporated by reference in its entirety . This application claims priority from co-pending U.S. Application No. 15 / 003,396, filed January 21, 2016, entitled " MAGNETIC WAKE DETECTOR, " which is hereby incorporated by reference in its entirety. This application claims the benefit of co-pending U.S. Serial No. 15 / 003,617 filed on January 21, 2016 entitled "GENERAL PURPOSE REMOVAL OF GEOMAGNETIC NOISE", which is hereby incorporated by reference in its entirety. This application claims priority from co-pending U.S. Application No. 15 / 003,336, filed on January 21, 2016, entitled " REDUCED INSTRUCTION SET CONTROLLER FOR DIAMOND NITROGEN VACANCY SENSOR ", which is hereby incorporated by reference in its entirety I argue. This application claims priority from co-pending U.S. Application No. 15/003, filed on January 21, 2016, entitled " DNV MAGNETIC FIELD DETECTOR ", which is hereby incorporated by reference in its entirety .

This disclosure generally relates to a magnetometer.

Atomic-sized nitrogen vacancies (NV) in the diamond lattice have excellent sensitivity for magnetic field measurements and can easily replace systems and devices of existing technologies (e.g. Hall effect, SERF, SQUID, etc.) Lt; RTI ID = 0.0 > magnetic sensors. ≪ / RTI > Nitrogen vacancy diamond (DNV) magnetometers can detect very small changes in magnetic field due to changes in the red light emission of the diamond associated with the frequency through the gradient of the luminescent function and the magnetic field through the Zeman effect.

Figure 1 shows one orientation of the NV center in a diamond lattice.
Figure 1 shows one orientation of the NV center in a diamond lattice.
Figure 2 is an energy level diagram showing the energy levels of the spin states for the NV center.
3 is a schematic diagram showing an NV centered magnetic sensor system.
4 is a graph showing fluorescence as a function of the applied RF frequency at the NV center along a given direction for the zero magnetic field.
5 is a graph showing fluorescence as a function of the applied RF frequency for four different NV center orientations for a non-zero magnetic field.
6 is a schematic diagram showing a magnetic field detection system according to an embodiment of the present invention.
7 is a graph showing the fluorescence as a function of the applied RF frequency for the NV center orientation in a non-zero magnetic field and the slope of the fluorescence as a function of the applied RF frequency.
FIG. 8 is a diagram of the ringing energy level of the ultrafine structure of the spin states with respect to the NV center.
9 is a graph showing fluorescence as a function of the applied RF frequency for NV center orientation in a non-zero magnetic field using ultrafine detection and the slope of the fluorescence as a function of the applied RF frequency.
10 is a schematic of a reflector having a diamond with nitrogen vacancies.
11 is a side view of an ellipsoidal reflector and photodetector with diamond having nitrogen vacancies.
12 is a side view of an elliptical diamond having a nitrogen vacancy and a photodetector.
13 is a side view of a parabola reflector and photodetector with diamond having nitrogen vacancies.
14 is a side view of a parabola diamond having a nitrogen vacancy and a photodetector.
Figure 15 is a side view of a parabola reflector and photodetector with flat diamond having nitrogen vacancies inserted parallel to the long axis of the parabola reflector.
Figure 16 is a side view of a parabola reflector and photodetector with flat diamond with nitrogen vacancies inserted parallel to the short axis of the parabola reflector.
17 is a side view of a sensor assembly and a photodetector with parabola diamond having nitrogen vacancies.
18 is a side view of a sensor assembly having a light guide provided in a parabolic reflector.
19 is a process chart for a method for constructing a DNV sensor.
20 is another process diagram for a method for constructing a DNV sensor.
21 is a block diagram illustrating a general architecture for a computer system that may be utilized to implement various elements of the systems and methods described and illustrated herein.
22 is a schematic diagram illustrating a position sensor system in accordance with one embodiment.
23 is a schematic diagram illustrating a position sensor system including a rotational position encoder.
24 is a schematic diagram illustrating the rotation position encoder viewed from above.
25 is a schematic diagram illustrating a position sensor system including a linear position encoder.
26 is a schematic diagram illustrating a magnetic element arrangement of a position encoder in accordance with one embodiment.
27 is a schematic view illustrating a magnetic element device of a position encoder according to another embodiment.
28 is a schematic view illustrating a magnetic element device of a position encoder according to another embodiment.
29 is a schematic diagram illustrating the relationship of the magnetic elements of the position sensor head and the position encoder.
30 is a graph of the measured magnetic field strength due to the magnetic elements of the position encoder relative to the first magnetic field sensor and the second magnetic field sensor of the position sensor head.
31 is a flow diagram illustrating a process for determining a position using a position sensor system in accordance with one embodiment.
32A and 32B are graphs illustrating the frequency response of a DNV sensor according to an exemplary embodiment.
33A is a diagram of NV centered spin states in accordance with an exemplary embodiment.
Figure 33B is a graph illustrating the frequency response of a DNV sensor in response to a changed magnetic field in accordance with an exemplary embodiment.
34 is a block diagram of a magnetic communication system in accordance with an exemplary embodiment.
35A and 35B show the intensity of a magnetic field versus frequency according to an exemplary embodiment.
36 is a block diagram of a computing device in accordance with an exemplary embodiment.
37 is a graph illustrating fluorescence as a function of the applied RF frequency of four different NV center orientations for a magnetic field applied in the opposite direction to the NV centered diamond material.
Figure 38 is a graph illustrating fluorescence intensity as a function of time for NV centered diamond material with pulsed RF excitation.
39 is a graph illustrating fluorescence as a function of the applied RF frequency of four different NV center orientations for a magnetic field applied in the opposite direction to the NV centered diamond material, wherein the Lorentz pair is a graph identified in the graph.
40 is a graph illustrating fluorescence intensity as a function of time for an NV centered diamond material versus a pulse of RF excitation.
41 is a graph illustrating the fluorescence intensity normalized as a function of time for the Lorentz peak phase of the NV centered diamond material.
Figure 42 is a graph illustrating the time for 60% of the equilibrium fluorescence as a function of RF frequency for negative and positive magnetic deflection fields applied to the NV centered diamond material.
43A and 43B are diagrams illustrating a hydrophone system in accordance with an exemplary embodiment.
Figure 44 illustrates a low altitude flying object in accordance with some exemplary implementations.
45A shows the ratio of the signal strengths of two magnetic sensors A and B attached to the wings of the UAS as a function of distance x from the center line of power in accordance with some exemplary implementations.
Figure 45B illustrates a composite magnetic field (B-field) in accordance with some exemplary implementations.
46 shows a high-level block diagram of an example of a UAS navigation system in accordance with some exemplary implementations.
Figure 47 shows an example of a power line infrastructure.
48A and 48B show examples of magnetic field distribution for overhead power lines and underground power cables.
Figure 49 shows an example of the magnetic field strength of a power line as a function of distance from the centerline.
50 illustrates an example of a UAS in which a DNV sensor is installed in accordance with some exemplary implementations.
Figure 51 shows a plot of the measured differential magnetic field sensed by the DNV sensor as it approaches the power line in accordance with some exemplary implementations.
Figure 52 shows an example of measured magnetic field distribution for normal power lines and anomalous power lines in accordance with some implementations.
53 is a diagram showing the energy level of the NV center contributing to Hamiltonian.
54 is a graph illustrating fluorescence as a function of the applied RF frequency at the NV center for a zero external magnetic deflection field.
55 is a graph illustrating fluorescence as a function of the applied RF frequency of a high quality NV center sample for an applied externally biased field.
56 is a graph illustrating fluorescence as a function of the applied RF frequency of a low quality NV center sample for an applied external magnetic field.
57 is a signal processing block diagram of the open loop processing of the total incident magnetic field on the NV center magnetic sensor system.
58 is a signal flow block diagram of closed loop processing of total incident magnetic field on an NV centered magnetic sensor system.
FIG. 59 is a flowchart showing the closed loop processing method of FIG. 58; FIG.
60 is a schematic diagram illustrating a magnetic field detection system according to an embodiment of the present invention.
61 is a schematic diagram illustrating a Ramsey sequence of a photoexcitation pulse and an RF excitation pulse in accordance with the operation of the system of FIG.
62A is a free induction decay curve in which the free wash time? Is changed using the Ramsey sequence of FIG.
62B is a magnetic measurement curve in which the RF detuning frequency DELTA is changed using the Ramsey sequence of FIG.
63A is a free induction decay surface plot in which both the free car wash time? And the RF resonance frequency? Are changed using the Ramsey sequence of FIG.
63B is a plot showing the slope of the free induction decay surface plot of FIG. 63B.
64 is a schematic diagram illustrating a Rabi sequence of a photoexcitation pulse and an RF pulse in accordance with the operation of the system of FIG. 60;
65 is a comparison of a graph showing the resonant rabbit frequency according to the power of the RF excitation applied to the system of FIG.
66 is a graph showing raw pulse data collected during operation of the system of FIG. 60;
67 is a schematic diagram illustrating a portion of a DNV sensor having a coil assembly in accordance with some exemplary implementations.
68 is a schematic diagram illustrating a cross-section of a portion of a DNV sensor having a coil assembly in accordance with some exemplary implementations.
Figures 69A and 69B are schematic diagrams illustrating a coil assembly in accordance with some exemplary implementations.
70 is a cross-sectional view illustrating a coil assembly in accordance with some exemplary implementations.
71 is a schematic diagram illustrating side elements of a coil assembly in accordance with some exemplary implementations.
72 is a schematic diagram illustrating an upper or lower element of a coil assembly in accordance with some exemplary implementations.
73 is a schematic diagram illustrating a center mounting block of a coil assembly in accordance with some exemplary implementations.
74 is a cross-sectional view illustrating a portion of a DNV sensor having a coil assembly in accordance with some exemplary implementations.
75 is a schematic diagram illustrating a coil assembly in accordance with some exemplary implementations.
76 is a schematic diagram illustrating a cross-section of a coil assembly in accordance with some exemplary implementations.
77 is a schematic diagram illustrating side elements of a coil assembly in accordance with some exemplary implementations.
78 is a schematic diagram illustrating a portion of a DNV sensor having a coil assembly in accordance with some exemplary implementations.
79 is a schematic diagram illustrating a cross-section of a portion of a DNV sensor having a coil assembly in accordance with some exemplary implementations.
80 is a schematic diagram illustrating a cross-section of a portion of a DNV sensor having a coil assembly in accordance with some exemplary implementations.
81 is a schematic diagram illustrating a coil assembly in accordance with some exemplary implementations.
82 is a schematic diagram illustrating a cross-section of a coil assembly in accordance with some exemplary implementations.
83 is a schematic diagram illustrating side elements of a coil assembly in accordance with some exemplary implementations.
84A and 84B are schematic diagrams illustrating the top and bottom elements of a coil assembly in accordance with some exemplary implementations.
85 shows a geomagnetic noise model compared with empirical noise data.
86 is a graph illustrating the corresponding signal due to distortion in the magnetic field in the Z-direction as measured by a single magnetic sensor.
87A to 87C are graphs illustrating the corresponding signal due to distortion in the magnetic field in the Z-direction measured by the two-dimensional magnetic sensor array for a time of 1100, 1115, and 1120 seconds, respectively.
88 is a schematic diagram illustrating a magnetic sensor array system according to an embodiment of the present invention.
89A and 89B each show a coordinate system corresponding to the common coordinate system and one of the magnetic sensors of the array.
90 is a schematic view showing an orientation sensor attached to a magnetic field sensor according to an embodiment of the present invention.
91A-91C are graphs illustrating magnetic field measurement components along the X-direction, Y-direction and Z-direction, respectively, at a time of 500 seconds for a two-dimensional array of magnetic field sensors in the case of a single unmanned submersible (UUV).
91D-91F are graphs illustrating magnetic field measurement components along the X-direction, Y-direction, and Z-direction, respectively, at a time of 1000 seconds for a two-dimensional array of magnetic field sensors in the case of a single UUV.
91G-91I are graphs illustrating magnetic field measurement components along the X-direction, Y-direction, and Z-direction, respectively, at a time of 1500 seconds for a two-dimensional array of magnetic field sensors in the case of a single UUV.
92A to 92C are graphs illustrating magnetic field measurement components along the X-direction, Y-direction and Z-direction, respectively, at a time of 500 seconds for a two-dimensional array of magnetic field sensors in the case of two UUVs.
92D to 92F are graphs illustrating magnetic field measurement components along the X-direction, Y-direction and Z-direction, respectively, at a time of 1000 seconds for a two-dimensional array of magnetic field sensors in the case of two UUVs.
92G-92I are graphs illustrating magnetic field measurement components along the X-direction, Y-direction and Z-direction, respectively, at a time of 1500 seconds for a two-dimensional array of magnetic field sensors in the case of two UUVs.
93A is a graph illustrating noise-free and X-directional components of a measured magnetic field as a function of time for a single magnetic field sensor measurement;
93B is a graph illustrating noise null and reconstructed X-direction components of the magnetic field as a function of time for a single magnetic field sensor measurement as a function of time when noise is removed by an intermediate subtraction algorithm;
93C is a graph illustrating the difference in the noiseless and reconstructed X-direction component of the magnetic field of FIG. 93B. FIG.
94A-94C are graphs illustrating the magnetic fields for an array of sensors that include the signal in X-direction for the array at times of 500, 1000, and 1500 seconds, respectively.
95A-95C are graphs illustrating corresponding regions and corresponding expanded regions in the X-direction as a result of blocking and convex hulling at each time of 500, 1000 and 1500 seconds for a single UUV.
Figures 96a-96c are graphs illustrating the plane-to-fit of the X-directional component of the magnetic field measurement data having regions of corresponding data removed for a two-dimensional array of magnetic field sensors at times of 500, 1000, to be.
97A is a graph illustrating the noise-free and X-directional component of a measured magnetic field as a function of time for a single self-gage sensor measurement.
97B is a graph illustrating noise null and reconstructed X-direction components of the magnetic field as a function of time for a single magnetic field sensor measurement as a function of time when the noise is removed using noise pits for the plane.
97C is a graph illustrating the difference in the noiseless and reconstructed X-direction component of the magnetic field of FIG. 97B.
98a-98c are graphs illustrating the fit versus secondary splines of the X-directional components of the magnetic field measurement data having regions of corresponding data removed for a two-dimensional array of magnetic field sensors at times of 500, 1000, and 1500 seconds, respectively .
99A is a graph illustrating noise-free and X-directional components of a measured magnetic field as a function of time for a single magnetic field sensor measurement.
FIG. 99B is a graph illustrating noise-free and reconstructed X-directional components of a magnetic field as a function of time for a single magnetic field sensor measurement as a function of time when noise is removed using noise versus quadratic splines.
FIG. 99C is a graph illustrating differences in the noiseless and reconstructed X-directional components of the magnetic field of FIG.
Figures 100a-100c are graphs illustrating corresponding regions in the X-direction and corresponding expanded regions as a result of blocking and convex hulling at 500, 1000, and 1500 seconds of time for two UUVs, respectively.
Figs. 101A to 101C show the X-direction component of the magnetic field measurement data having an area of corresponding data removed for a two-dimensional array of magnetic field sensors at times of 500, 1000 and 1500 seconds for two UUVs, Fig.
102A is a graph illustrating noise-free and X-directional components of a measured magnetic field as a function of time for a single magnetic field sensor measurement for two UUVs.
102B is a graph illustrating noise null and reconstructed X-direction components of the magnetic field as a function of time for a single magnetic field sensor measurement as a function of time when noise is removed using noise versus quadratic splines.
FIG. 102C is a graph illustrating the difference between the noiseless of the magnetic field of FIG. 102B and the reconstructed X-direction component.
103A is a top perspective view of a sensor assembly in accordance with the present invention.
103B is a bottom perspective view of the sensor assembly of FIG.
Figure 104A is a top perspective view of the diamond assembly of the sensor assembly of Figure 103A.
FIG. 104B is a bottom perspective view of the diamond assembly of FIG. 104A. FIG.
104C is a side view of the assembly substrate of the sensor assembly of FIG.
105 is a plan view of the diamond assembly of FIG.
106A and 106B are side views of a diamond material having a metal layer illustrating the step of forming an RF excitation source in accordance with an embodiment.
107A is a plan view of a diamond assembly according to another embodiment viewed from above.
Figure 107b is a side view of the diamond assembly in Figure 107a.
108 is a graph showing NV0 and NV-photon intensity versus wavelength without fluorescence manipulation.
109 shows a valence band and a conduction band on an energy-to-moment (E vs. k) plot and includes a zero-photon line, an optical drive for exciting electrons on the bandgap, and an electron- Lt; / RTI > is a graph of an indirect bandgap for diamonds having nitrogen vacancies showing recombination.
110 is a graph showing NV0 and NV-photon intensity versus wavelength with fluorescence manipulation.
111 is a processing chart for fluorescence manipulation of a diamond having nitrogen vacancies through photon spectral manipulation using an acoustic driver.
112 is a process chart for determining the acoustic drive frequency for photon spectral operation.
113A is a block diagram of a magnetometer having a light pipe in accordance with an exemplary embodiment.
113B and 113C are isometric views of a light pipe and a shield according to an exemplary embodiment.
114 is a block diagram of a magnetometer having two light pipes in accordance with an exemplary embodiment.
115 is a block diagram of a magnetometer with two optical plates according to an exemplary embodiment.
116 is a flow diagram of a method for measuring a magnetic field in accordance with an exemplary embodiment.
117 is a block diagram of a magnetometer in accordance with an exemplary embodiment.
118 is an exploded view of a magnetometer in accordance with an exemplary embodiment.
119 is a flow diagram of a method for detecting a magnetic field in accordance with an exemplary embodiment.
120 is a schematic diagram illustrating a portion of a DNV sensor having dual RF arrangements in accordance with some exemplary implementations.
121 is a diagram of an enclosed DNV sensor with dual RF devices in accordance with some exemplary implementations.
122A and 122B are schematic diagrams of an assembly portion of a DNV sensor having dual RF devices in accordance with some exemplary implementations.
123 is a cross-sectional view of a portion of a DNV sensor having dual RF devices in accordance with some exemplary implementations.
124 is a schematic diagram illustrating a DNV sensor having dual RF devices in accordance with some exemplary implementations.
125 is a cross-sectional view of a DNV sensor with dual RF devices in accordance with some exemplary implementations.
126 is a schematic diagram illustrating a DNV sensor having dual RF devices and laser mounts in accordance with some exemplary implementations.
127 is a cross-sectional view of a DNV sensor having dual RF devices and laser mounts in accordance with some exemplary implementations.
128A and 128B are schematic views of an assembly portion of a DNV sensor having dual RF devices in accordance with some exemplary implementations.
129A and 129B are schematic views of an assembly portion of a DNV sensor having dual RF devices in accordance with some exemplary implementations.
130 is a block diagram of an overview of a single-cycle synthesis, control, and acquisition system for a diamond nitrogen vacancy sensor.
131 is a block circuit diagram of the single-cycle control, synthesis, and acquisition processor for the diamond nitrogen vacancy sensor of FIG. 130;
132A is a block circuit diagram of the host interface of FIG.
132B is a block circuit diagram of the program counter of FIG.
Fig. 132C is a block circuit diagram of the program memory of Fig.
132D is a block circuit diagram of the first part of the jump control with the collapse of FIG.
FIG. 132E is a block circuit diagram of the second part of the jump control of FIG.
FIG. 132f is a block circuit diagram of the Rf waveform generator of FIG.
132G is a block circuit diagram of the digital control of FIG.
132H is a block circuit diagram of the acquisition processor of FIG.
133A is a unit cell diagram of a crystal structure of a diamond lattice having a standard orientation.
133B is a unit cell diagram of a crystal structure of a diamond lattice having an unknown orientation.
Figure 134 is a schematic diagram illustrating the steps in a method for determining the unknown orientation of the diamond grating of Figure 133b.
Figure 135 is a flow chart illustrating a sine reconstruction method for a method for determining the unknown orientation of the diamond grating of Figure 133B.
Figure 136 is a schematic diagram illustrating steps in a method for determining the unknown orientation of the diamond grating of Figure 133b.
137 is a flowchart illustrating a method for restoring a three-dimensional magnetic field on an NV center magnetic sensor system.
138 is a schematic diagram of a diamond of a DNV sensor having a low-pass filter and a high-pass filter.
Figure 139 is a graph of an example of a signal detected with a DNV sensor that includes a test signal without filtering.
140 is a schematic diagram of a diamond of a DNV sensor having a low-pass filter, showing the magnetic field of the environment, the change in the magnetic field of the environment, and the induced magnetic field by a low-pass filter to filter the high-frequency signal.
141 is another schematic diagram of a diamond of a DNV sensor with two low-pass filters arranged for spatial attenuation.
Figure 142 is a schematic of a diamond of a DNV sensor for a semi-magnetic material, illustrating the alignment of the poles of the diamagnetic material with respect to the induced magnetic field.
143 is a graph of magnetism in a semi-magnetic material for an applied magnetic field.
144 is a process diagram for modifying the filtering frequency of the low-pass filter for the DNV sensor based on the detected magnetic field.
145 is a process drawing for modifying the orientation of a DNV sensor having a low-pass filter based on the detected magnetic field.
146 illustrates a low altitude flying object in accordance with some exemplary implementations.
147 shows a magnetic field detector according to some exemplary implementations.
148A and 148B illustrate portions of a detector array in accordance with some exemplary implementations.
149 is a schematic diagram illustrating a hydrophone in accordance with some exemplary implementations.
150 is a schematic diagram illustrating a portion of a vehicle having a hydrophone in accordance with some exemplary implementations.
151 is a schematic diagram illustrating a portion of a vehicle having an underwater recorder having a containment membrane in accordance with some exemplary implementations.
152 is a schematic diagram illustrating a portion of a vehicle having a hydrophone in accordance with some exemplary implementations.
153 is a schematic diagram illustrating a portion of a vehicle having a hydrophone with a containment membrane in accordance with some exemplary implementations.
154 is a schematic diagram illustrating a system for AC magnetic vector abnormal detection in accordance with an embodiment of the present invention.
FIG. 155 is a schematic diagram illustrating a sequence of a photoexcitation pulse and an RF pulse according to the operation of the system of FIG. 156; FIG.
Figure 156 is a graph illustrating the fluorescence signal of an NV diamond material as a function of RF excitation frequency over a range of RF frequencies in accordance with an embodiment of the present invention.
157A illustrates a first matched-filtered correlated code for a magnetic field component along three different diamond grating directions corresponding to the magnetic field provided by the first magnetic field generator in accordance with an embodiment of the present invention.
157B shows a first matched-filtered correlated code for a magnetic field component along three different diamond grating directions corresponding to the magnetic field provided by the second magnetic field generator in accordance with an embodiment of the present invention.
Figure 158 shows a reconstructed magnetic field vector for two different correlated codes when a ferromagnetic object is placed against a magnetic field generator and NV diamond material in accordance with an embodiment of the present invention and no object is placed.
Figures 159a and 159b are block diagrams of a system for detecting deformity in a material in accordance with an exemplary embodiment.
160 shows a current path through a deformed conductor according to an exemplary embodiment.
161 is a flow diagram of a method for detecting malformation in accordance with an exemplary embodiment.
162 is a block diagram of a vehicle system in accordance with an exemplary embodiment.
Figure 163 is a flow diagram of a method for charging a power source in accordance with an exemplary embodiment.
Figure 164 is a graph of the intensity versus distance of a magnetic field from a conductor according to an exemplary embodiment.
165A and 165B are block diagrams of a system for detecting malformations in a transmission line in accordance with an exemplary embodiment.
166 illustrates a current path through a transmission line having a malformation in accordance with an exemplary embodiment.
Figure 167 illustrates a power transmission line sag between transmission towers in accordance with an exemplary embodiment.
168 shows a vector measurement representing a power transmission line bird according to an exemplary embodiment;
Figure 169 illustrates a vector measurement along a path between adjacent towers in accordance with an exemplary embodiment.

Sensitivity detection of magnetic field

Aspects of the present disclosure are directed to an apparatus and method for describing an ultrafine transition reaction to determine an external magnetic field acting on a magnetic detection system. The ultrafine transition reaction exhibits a steeper slope than the slope of the total Lorentz reaction measured in conventional systems, which can be up to several thousand times larger. Thus, the steep slope exhibited by the ultrafine transient response allows a significant increase in the measurement sensitivity in the magnetic detection system. By using the greatest slope of the ultrafine response for measurement purposes, an external magnetic field, especially a low altitude and / or a rapidly changing magnetic field, can be detected more precisely.

NV center, electronic structure, and optical and RF interaction

The NV center in the diamond contains substituted nitrogen atoms at the lattice sites adjacent to the carbon vacancies as shown in Fig. The NV center can have four orientations, with each orientation corresponding to a different crystallographic orientation of the diamond grating.

The NV center may be in a neutral charge state or a negative charge state. Conventionally, the neutral charge state uses the nomenclature (NV ⁰ ) while the negative charge state uses the nomenclature (NV), which is adopted in this description.

The NV center has a number of electrons, each containing one hole electron from each vacancy to three hole electrons to each three carbon atoms adjacent to the vacancy, and a pair of electrons between the nitrogen and vacancies. The NV center in the negatively charged state also contains extra electrons.

The NV center has rotational symmetry and has a base state which is a spin triplet having a ³ A ₂ symmetry with one spin state (m _s = 0) and a base state as a spin triplet with two additional spin states m _s = + 1, and m _s = -1). In the absence of an external magnetic field, the m _s = +1 energy level is offset from m _s = 0 due to spin-spin interaction and the m _s = +1 energy level is degenerated, that is, they have the same energy. The m _s = 0 spin state energy level is divided from the m _s = +1 energy level by an energy of 2.87 GHz for a zero external magnetic field.

Introducing an external magnetic field having a component along the NV axis raises the degeneration of the m _s = + 1 energy level and divides the energy level (m _s = + 1) by an amount (2 g _{B B} Bz) _{B B} is the component of the external magnetic field along the NV axis. This relationship is corrected to first order and inclusion of higher order corrections is a simple matter and will not affect the calculation and logic steps in the systems and methods described below.

NV center electronic structure may further comprise a triplet state (E ³⁾ excitation, with the corresponding m _s = 0 and _s = m + 1 spin state. The optical transition between the ground state ( ³ A ₂ ) and the excited triplet ( ³ E) is primarily spin conservation, meaning that the optical transition is between the initial and final states with the same spin. For the direct transition between the excited triplet ⁽³ E) and the ground state ⁽³ A _2), red light photons are emitted as photon energy corresponding to the energy difference between the energy level of the transition.

However, the middle one quartet (singlet) state (A, E) alternative non to the ground state ⁽³ A ₂₎ from a triplet ⁽³ E), via an intermediate electronic state is considered to be having an intermediate energy level, - a copy decay root have. Importantly, the transition state to the excited triplet ⁽³ E) intermediate energy level from the m _s = + 1 spin state of is higher than the transition state of the m _s = 0 spin state of the excited triplet ⁽³ E) into an intermediate energy level, It is considerably larger. One transition to a neutral ground state, triplet state ⁽³ A ₂₎ from (A, E) is largely collapsed by m _s = 0 spin state over the m = _s + 1 spin states. Middle one neutral state (A, E) via excited triplet these features of the collapse of the ⁽³ E) a ground state triplet ⁽³ A ₂₎ from their optical here is an optical here in the end NV center, if available to the system And allows pumping to m _s = 0 spin state of base state ( ³ A ₂ ). In this way, the set of m _s = 0 spin states of base state ³ A ₂ can be "reset" to the maximum polarization determined by the decay rate from the triplet ³ E to the medium midline state.

Another feature of the collapse, the fluorescent intensity caused by the optical stimulation to a triplet ⁽³ E) excited state would is smaller for m = _s + 1 than the m _s = 0 spin state. This is so because the collapse through the intermediate state does not result in photons emitted in the fluorescent band, and that the m _s = + 1 state of the excited triplet ( ³ E) state will have a greater probability of collapsing through the non- That is why. The lower fluorescence intensity for the m _s = + 1 state than the m _s = 0 spin state allows the fluorescence intensity to be used to determine the spin state. When the population of m _s = + 1 states increases for m _s = 0 spins, the overall fluorescence intensity will be reduced.

NV-centered, or self-optical defect-centered, magnetic sensor system

3 is m = _s + a conventional magnetic sensor system NV center 1 distinguishes the state, and based on the energy difference between m = _s + 1 states with m _s = -1 states using the fluorescence intensity to measure the magnetic field ( 300). System 300 includes an optical excitation source 310 that directs the optical excitation to NV diamond material 320 having an NV center. The system further includes an RF excitation source 330, which provides RF radiation to the NV diamond material 320. The light from the NV diamond can be directed through the optical filter 350 to the optical detector 340.

The RF excitation source 330 may be, for example, a microwave coil. The RF excitation source 330 excites the transition between these spin states as it emits RF radiation through photon energy resonance with a transition energy between the base m _s = 0 spin state and the m _s = + 1 spin state. For such a resonance, the spin state is cycled between the base m _s = 0 spin state and the m _s = + 1 spin state, reducing the population at the m _s = 0 spin state and reducing the total fluorescence at the resonance. Similarly, resonance occurs between the m _s = 0 spin state of the ground state and the m _s = -1 spin state, and the photon energy of the RF radiation emitted by the RF excitation source is in the m _s = 0 spin state and m _s = -1 spin state, or a difference in energy between the m _s = 0 spin state and the m _s = + 1 spin state, there is a decrease in fluorescence intensity.

The optical excitation source 310 may be, for example, a laser or a light emitting diode that emits light in green, for example. The optical excitation source 310 induces fluorescence in red, which corresponds to the electron transition from the excited state to the ground state. Light from the NV diamond material 320 is directed through the optical filter 350 to filter light in the excitation band (e.g., in green) and pass the light in the red fluorescent band, 340). In addition to exciting the fluorescence in the diamond material 320, the optical excitation light source 310 may also be used to reset the population of m _s = 0 spin states of base state ³ A ₂ to maximum polarization, .

For continuous wave excitation, the optical excitation source 310 continuously pumps the NV center and the RF excitation source 330 includes energy at zero divide of 2.87 GHz (when m _s = + 1 spin state has the same energy) Sweep over a range of frequencies. Fluorescence for an RF sweep corresponding to a diamond material 320 having an NV center aligned along a single direction is shown in Figure 4 for a different magnetic field component (Bz) along the NV axis, where m _s = -1 spin state and The energy division between m _s = + 1 spin states increases with B z. Thus, the component (Bz) can be determined. An optical excitation configuration other than continuous wave excitation is envisioned, such as an excitation configuration involving pulsed light excitation and pulsed RF excitation. Examples of pulsed excitation configurations include a Ramsey pulse sequence, and a spin echo pulse sequence.

Generally, the diamond material 320 will have NV centers along the direction of the four different orientation gradients. Figure 5 shows fluorescence as a function of RF frequency for cases where diamond material 320 has NV centers aligned along the direction of four different orientation gradients. In this case, the component Bz along each of the different orientations can be determined. These results not only allow the magnitude of the external magnetic field to be determined along with the known orientation of the crystallographic plane of the diamond grating, but also allow the orientation of the magnetic field to be determined.

Although FIG. 3 shows an NV centered magnetic sensor system 300 having NV diamond material 320 having a plurality of NV centers, the magnetic sensor system generally uses a different magnetic-to- Optical defective center material can be used. The electron spin state energy of the self-optical defect center shifts with the magnetic field, and the optical response such as fluorescence to different spin states is not the same for all the different spin states. In this way, the magnetic field can be determined based on the RF excitation in a manner corresponding to that described above with the optical excitation, and possibly the NV diamond material.

6 is a schematic diagram of a system 600 for a magnetic field detection system in accordance with an embodiment of the present invention. The system 600 includes an optical excitation source 610 that directs the optical excitation to an NV diamond material 620 having an NV center or to another self-optical defect center material having a self-optical defect center . An RF excitation source 630 provides RF radiation to the NV diamond material 620.

As shown in FIG. 6, the first magnetic field generator 670 generates a magnetic field, which is detected in the NV diamond material 620. The first magnetic field generator 670 may be a permanent magnet positioned against the NV diamond material 620 and this may be a known magnetic field to create a desired fluorescence intensity response from the NV diamond material 620 Or control magnetic field). In some embodiments, the second magnetic field generator 675 may be provided and positioned relative to the NV diamond material 620 to provide additional deflection or control magnetic fields. The second magnetic field generator 675 may be configured to generate a magnetic field having, for example, orthogonal polarization. In this regard, the second magnetic field generator 675 may include one or more coils, such as a Hemholtz coil. The coils may be configured to provide a relatively uniform magnetic field in the NV diamond material 620, each of which may produce a magnetic field having a direction perpendicular to the direction of the magnetic field produced by the other coils. For example, in a particular embodiment, the second magnetic field generator 675 includes three Hemoltz coils, each arranged to produce a magnetic field having a direction orthogonal to the other direction of the magnetic field generated by the other two coils So that a triaxial magnetic field is generated. In some embodiments, only the first magnetic field generator 670 may be provided to generate a deflection or control magnetic field. Alternatively, only the second magnetic field generator 675 may be provided to generate a deflection or control magnetic field. In yet another embodiment, the first and / or second magnetic field generators may include a swivel assembly, which may be controlled to maintain and position the first and / or second magnetic field generators in a predetermined and well-controlled set of orientations Gimbal assembly} to establish the desired deflection or control magnetic field. In this case, the controller 680 may be configured to control the pivot assembly with the first and / or second magnetic field generators to position and maintain the first and / or second magnetic field generators in a predetermined orientation.

The system 600 includes a controller 680 configured to receive an optical detection or optical signal from the optical detector 640 and to control the optical excitation source 610, the RF excitation source 630 and the second magnetic field generator 675. [ ). The controller may be a single controller, or multiple controllers. For a controller that includes multiple controllers, each of the controllers may perform a different function, such as controlling different components of the system 600. The second magnetic field generator 675 may be controlled by the controller 680 via, for example, an amplifier 660.

The RF excitation source 630 may be, for example, a microwave coil. The RF excitation source 630 is controlled to emit RF radiation through a photon energy resonance with a transition energy between the base m _s = 0 spin state and the m _s = + 1 spin state as discussed above with respect to FIG.

The optical excitation source 610 may be, for example, a laser or a light emitting diode that emits light in green, for example. The optical excitation source 610 induces fluorescence in red from the NV diamond material 620, wherein the fluorescence corresponds to an electron excitation from the excited state to the ground state. Light from the NV diamond material 620 is filtered through the excitation band (e.g., in green) and directed through the optical filter 650 to pass the light in the red fluorescence band, 640). In addition to exciting the fluorescence in NV diamond material 620, optical excitation light source 610 also acts to reset the population of m _s = 0 spin states of base state ³ A ₂ to maximum polarity or other desired polarity do.

The controller 680 receives the light detection signal from the optical detector 640 and is arranged to control the optical excitation source 610, the RF excitation source 630 and the second magnetic field generator 675. The controller may include a processor 682 and a memory 684 to control the operation of the optical excitation source 610, the RF excitation source 630, and the second magnetic field generator 675. The memory 684, which may include non-transitory computer readable media, may store instructions to control the operation of the optical excitation source 610, the RF excitation source 630 and the second magnetic field generator 675 Can be stored. That is, the controller 680 may be programmed to provide control.

Detection of magnetic field variations

As discussed above, the interaction of the NV center with the external magnetic field is the energy between m _s = -1 spin state and m _s = + 1 spin state increasing with B z, for example, as shown in Fig. Resulting in segmentation. A pair of frequency response (also known as a Lorentzian response, profile, or dip) due to a component of the external magnetic field along a given NV axis appears as a dip in the intensity of the red light emitted from the NV center as a function of the RF carrier frequency. Thus, the pair of frequency responses for each of the four axes of the NV-centered diamond grating is shown in Figure 5 as a total of eight Lorentz profiles or m _s = -1 spin states corresponding to the components of the external magnetic field along the axis for dip And the spin state m _s = + 1. When the deflection magnetic field is applied to an NV diamond material (such as by the first and / or second magnetic field generators 670, 675 of FIG. 6) in addition to an unknown external magnetic field present outside the system, along be represented as _{B t (t) = B bias} (t) + B ext (t) and, where B _bias (t) denotes the applied bias magnetic field to the NV diamond material, B _ext (t) is an unknown Represents an external magnetic field. This total incident magnetic field is equal and linear in the Lorentz frequency profile for a given NV axis between m _s = -1 spin state and m _s = + 1 spin state for a starting carrier frequency (e.g., about 2.87 GHZ) Lt; / RTI >

)는 하부 그래프에 도시된 바와 같이 RF 인가된 주파수{f(t)}에 대해 그려진다. 지점(25)은 로렌츠 딥(20)의 가장 큰 경사도의 지점을 나타낸다. 이러한 지점은 외부 자기장에 응답할 때 총 입사 자기장에서의 변화를 검출하는데 있어서 가장 큰 측정 감도를 제공한다.The change or shift in the total incident magnetic field {B _t (t)} is due to a change in the external magnetic field {B _ext (t)} since the applied deflection magnetic field {B _bias (t)} is already known and constant . To detect changes in the total incident magnetic field, the point of greatest sensitivity in measuring such a change will occur at the point where the frequency response is at the greatest slope. For example, as shown in FIG. 7, the intensity response {I (t)} as a function of the RF applied frequency {f (t)} for a given NV axis due to the magnetic field is shown in the upper graph. Change in intensity {I (t)} for a change in RF applied frequency (

) Is plotted for the RF applied frequency {f (t)} as shown in the lower graph. The point 25 represents the point of greatest inclination of the Lorentz dip 20. These points provide the greatest measurement sensitivity in detecting changes in the total incident magnetic field in response to an external magnetic field.

Ultrafine magnetic field

As discussed above and shown in the energy level plot of Figure 2, the ground state is divided by about 2.87 GHz between m _s = 0 and m _s = + 1 spin states due to spin-spin interaction. Moreover, due to the presence of the magnetic field, the m _s = + 1 spin state divides in proportion to the magnetic field along a given axis of the NV center, which appears as the 4-pair Lorentz frequency response shown in Fig. However, the superfine structure of the NV referee is due to the hyperfine coupling between the NV spin center and the electron spin state of the nitrogen nuclei, which results in an additional energy split of the spin state. Figure 8 shows the ultrafine structure of the NV centered triplet state triplet ( ³ A ₂ ). In particular, the bond to the nitrogen nucleus ( ¹⁴ N) further splits the m _s = + 1 spin state into three ultrafine transitions (appended as m _I spin states), each with a different resonance. Thus, due to the ultra-fine resolution for each m _s = + 1 spin state, twenty-four different frequency responses can be generated (three levels for each m _s = + 1 spin state for each of the four NV center orientations) Division).

Each of the three ultrafine transitions appears within the width of one coherent Lorentz dip. Through appropriate detection, ultrafine transitions can be accounted for within a given Lorentzian response. To detect such ultrafine transitions, in certain embodiments, the NV diamond material 620 exhibits high purity (e.g., low presence of a lattice fault, broken bond, or other element beyond ¹⁴ N) , And does not have an excess concentration in the NV center. Moreover, in some embodiments, during operation of the system 600, the RF excitation source 630 operates on a low power setting to further decompose the ultrafine response. In another embodiment, the second additional optical contrast for the fine response NV sound-in can be achieved by increasing the center of concentration of the electric charge type, the optical power density (e.g., about 20 to about 1000 mW / mm ² range , And reduces the RF power to the lowest magnitude allowing sufficient ultra-fine readings (e.g., about 1 to about 10 W / mm ² ).

)가 도시된다. 도면에서 알 수 있듯이, 3개의 초미세 전이(200a 내지 200c)는 완전한 로렌츠 응답(20){예를 들어, 도 7에서의 로렌츠 응답(20)에 대응하는}을 구성한다. 최대 경사의 지점은 인가된 RF 주파수의 함수로서 형광 세기의 경사도를 통해 결정될 수 있고, 이것은 도 9에서 지점(250)에서 발생한다. 최대 경사의 이러한 지점은 주파수 스윕을 따라 최대 경사의 지점의 이동을 검출하기 위해 인가된 RF 스윕 동안 추적될 수 있다. 응집 로렌츠 응답에 대한 최대 경사(25)의 지점과 같이, 지점(250)의 대응하는 이동은 총 입사 자기장(B_t(t))에서의 변화에 대응하고, 이것은 알려진 및 일정한 편향 자기장(B_bias(t))으로 인해, 외부 자기장(B_ext(t))에서의 변화의 검출을 허용한다.Figure 9 shows an example of fluorescence intensity as a function of the applied RF frequency for NV center with ultrafine detection. In the upper graph, the magnitude response I (t) as a function of the applied RF frequency f (t) for a given spin state (e.g., m _s = -1) along a given axis of the NV center due to an external magnetic field, ). Furthermore, in the lower graph, the slope drawn for the applied RF frequency f (t) (

Are shown. As can be seen, the three ultrafine transitions 200a through 200c constitute a complete Lorentz response 20 (e.g., corresponding to the Lorentz response 20 in FIG. 7). The point of maximum slope can be determined through the slope of the fluorescence intensity as a function of the applied RF frequency, which occurs at point 250 in FIG. This point of maximum slope can be tracked during the applied RF sweep to detect movement of the point of maximum slope along the frequency sweep. The corresponding movement of point 250 corresponds to a change in the total incident magnetic field B _t (t), such as the point of maximum slope 25 for the coherent Lorentz response, which is a known and constant deflection magnetic field B _bias (t)) allows detection of a change in the external magnetic field (B _ext (t)).

However, relative to point 25, point 250 exhibits a greater degree of inclination than the cohesive Lorentz slope described above with respect to FIG. In some embodiments, the slope of point 250 may be up to 1000 times greater than the cohesive Lorentz slope of point 25. This allows point 250 and corresponding movement to be more easily detected by the measurement system, resulting in improved sensitivity, especially at very low magnitudes and / or very rapidly varying magnetic fields.

DNV  Improved light collection from sensors

In some aspects of the present technique, a method and arrangement for effective collection of fluorescence (e.g., red light) emitted by nitrogen vacancies of a diamond of a DNV sensor is disclosed. In some implementations, the technique may allow effective collection of emitted light of the diamond of a DNV sensor having a compact and low cost reflector. The reflector can focus the emitted light of the diamond of the DNV sensor to an optical or photodetector that can increase the amount of light detected from the diamond. In some implementations, such a configuration can substantially detect all the light emitted by the diamond of the DNV sensor. In some aspects, the reflector can be shaped as a parabola, ellipsoid, or other shape that can carry the light emitted from the source into the focus or focus area.

In some other implementations of the technique, the diamonds of the DNV sensor may be machined or otherwise molded to be the barbs themselves. That is, a diamond with nitrogen vacancies can be shaped to form a parabolic reflector, an ellipsoidal reflector, or other shape that can carry the light emitted from the nitrogen vacancies to the focus or focus area. For example, most of the reflectors may be parabolic or ellipsoidal, so that the light impinges on the photodetector at a 90 degree angle, e.g., 2 to 10 degrees, with some margin of error.

Nitrogen vacancies of diamond will fluoresce in response to excitation with green light, and will emit red light in a random direction. Since the red light measurement is a limited short noise, it is desirable to collect as much emitted light as possible. In some current acquisition approaches using large optical instruments, the collection efficiency was in the range of 20%. Some implementations use a large aperture lens mounted close to the die arm node or DNV sensor, which limits the light collection to a fraction of the light emitted by the diamond or DNV sensor. Other implementations utilize a plurality of photodetectors (e. G., Four) positioned at the edges of flat diamond and flat diamond. This arrangement of the photodetector can capture a large amount of emitted light conducted to the edge of a flat diamond due to the internal reflection, but it increases the number of photodetectors required and can not capture the light emitted from the plane of the flat diamond. The DNV sensors discussed herein provide an alternative for increasing collection efficiency.

10 shows an overview of an assembly 1000 having an example of a diamond 1002 with nitrogen vacancies and a reflector 1004 positioned around the diamond 1002 for a DNV light-collecting device. In the illustrated embodiment, the reflector 1004 is positioned around the diamond 1002 to reflect a portion of the light 1006 emitted from the diamond 1002. The reflector 1004 is an ellipsoidal or ellipsoidal reflector having a diamond 1002 located within the portion of the reflector 1004. In other implementations, the reflector 1004 may be a parabola or any other geometric configuration for reflecting the light emitted from the diamond 1002, as discussed in more detail herein. In some implementations, the reflector 1004 may be a monolithic reflector, a hollow reflector, or any other type of reflector to reflect the light emitted from the diamond 1002. In the illustrated implementation, the diamond 1002 is positioned at the focal point 1008 of the reflector 1004. Thus, when light 1006 is emitted from diamond 1002, light is reflected by reflector 1004 to another focal point of reflector 1004. As discussed in more detail herein, the photodetector may be located at a second focus to collect reflected light.

11 shows an assembly 1100 having an example of a diamond 1102 with nitrogen vacancies and an ellipsoidal reflector 1104 positioned around the diamond 1102 for a DNV light-collecting device. In some implementations, the ellipsoidal reflector 1104 may be a single monolithic component that may be considered to be split into two parts, such as the reflector portion 1106 and the concentrator portion 1108. In other implementations, the ellipsoidal reflector 1104 may be split into two components, such as the reflector portion 1106 and the concentrator portion 1108, which are coupled to and / or otherwise positioned with respect to each other. For example, the reflector portion 1106 and the concentrator portion 1108 can be individual parabolic components that can be combined to form an ellipsoidal reflector 1104. [ In yet another configuration, the ellipsoidal reflector 1104 can be composed of more than two components and can be combined or otherwise positioned to form an ellipsoidal reflector 1104.

The diamond 1102 is positioned at the first focus of the ellipsoidal reflector 1104 relative to the reflector portion 1106. In some implementations, diamond 1102 is positioned at a first focus using a mount for diamond 1102. In another implementation, the diamond 1102 is positioned at a first focus using a borehole through the ellipsoidal reflector 1104. The bore hole may be bnackfilled to seal the diamond 1102 in the ellipsoidal reflector 1104.

The ellipsoidal reflector 1104 may also include an opening to allow the excitation laser beam to excite the diamond 1102, such as a green excitation laser beam. The aperture can be positioned at an arbitrary location relative to the ellipsoidal reflector 1104. When the diamond 1102 is excited (e.g., by applying green light to the diamond 1102), the reflector portion 1106 directs the red light 1110 emitted from the diamond 1102 toward the concentrator portion 1108 Reflection.

Concentrator portion 1108 directs emitted light 1110 towards the second focal point of ellipsoidal reflector 1104. In the illustrated implementation, the photodetector 1120 is positioned to receive and measure light from the concentrator portion 1108. In some implementations, the photodetector 1120 is positioned at the second focal point to receive the redirected directed light. In some implementations, the photodetector 1120 is coupled to and / or sealed to a portion of the ellipsoidal reflector 1104, such as a concentrator portion 1108. In some implementations, the openings may be adjacent or proximate to the photodetector 1120, such as through the concentrator portion 1108. [ In other implementations, the aperture may face the photodetector 1120, such as through the reflector portion 1106. [ In yet another configuration, the aperture may be at any other angle and / or orientation relative to the photodetector 1120. [

In some implementations, an optical filter, such as a red filter, may be applied to and / or positioned above the photodetector 1120 to filter out the associated red light. Thus, the ellipsoidal reflector 1104 is associated with a non-focused concentrator that is capable of capturing light emitted from a light source (e.g., from a nitrogen vacancy in a diamond of a DNV sensor) to a single photodetector. In some cases, the loss of light emitted may be limited to light loss due to the mounting for the diamond and / or the small entrance for the green stimulated laser beam.

The prior solution provides high light collection efficiency to collect the light emitted from the diamond 1102 while using the reflector 1104, which may not require high precision revision. Such a reflector 1104 can be a low cost solution for increasing light collection efficiency, such as by using a reflective mirror component. Furthermore, the shape of the ellipsoidal reflector 1104 can separate the electronics of the photodetector 1120 from the diamond 1102, which reduces the magnetic interaction between the electronics of the photodetector 1120 and the diamond 1102 .

The ellipsoidal reflector 1104 may, in some implementations, include a dielectric mirror film applied to reflect emitted light 1110 or a substrate having a coating. The dielectric mirror film may be selected for a particular corresponding frequency. In some implementations, the thickness of the dielectric mirror material may affect a particular corresponding frequency. For example, the substrate may have a high clarity at the corresponding frequency for the DNV sensor. The substrate may be made of plastic, glass, diamond, quartz, and / or any other suitable material. The dielectric mirror film can be applied to the substrate so that light 1110 emitted from the diamond 1102 is reflected in the ellipsoidal reflector 1104. In some implementations, the dielectric mirror film can only reflect red light so that other colors or wavelengths of light pass through the ellipsoidal reflector 1104. For example, such a dielectric mirror film may allow the transmission of green wavelength light, such as from the excitation laser beam through the ellipsoidal reflector 1104 to the diamond 1102, to excite the diamond 1102.

In some aspects, the separation between the diamond 1102 and the electronics of the photodetector 1120, such as a precision sensor, can be extended to, for example, several feet. In some implementations, a thin dielectric mirror film is used in the ellipsoidal reflector 1104 to position the RF antenna within the ellipsoidal reflector 1104. In some applications, the antenna may instead be external to the ellipsoidal reflector 1104.

12 shows an assembly 1200 having an example of a diamond 1202 having nitrogen vacancies formed or processed in a reflector configuration for a DNV light-collecting device. The diamond 1202 in this configuration is a monolithic component that can be considered to be split into two parts, such as the reflector portion 1204 and the concentrator portion 1206, that are formed or machined into an ellipsoidal reflector.

The diamond 1202 may have a dielectric mirror film coated or applied on the diamond 1202. The dielectric mirror film may be selected for a particular corresponding frequency. In some implementations, the thickness of the dielectric mirror material may affect a particular corresponding frequency. The dielectric mirror film can be applied such that light 1210 emitted from the nitrogen vacancies in the diamond 1202 is reflected within the reflector portion 1204 and the concentrator portion 1206 of the diamond 1202. In some implementations, the dielectric mirror film can only reflect red light, so that another color or wavelength of light passes through the diamond 1202. For example, such a dielectric mirror film may allow transmission of green wavelength light, such as from an excitation laser beam, through the dielectric mirror film to the nitrogen vacancies of the diamond 1202, thereby exciting the nitrogen vacancies of the diamond 1202 .

The reflector portion 1204 of the diamond 1202 may internally reflect the light 1210 emitted through the dielectric mirror film applied to the diamond 1202. Thus, the diamond 1202 internally reflects the red light 1210 emitted from the diamond 1202 toward the concentrator portion. The concentrator portion 1206 also directs the light 1210 emitted by the nitrogen vacancy of the diamond 1202 back to the focus of the concentrator portion 1206 of the diamond 1202. In the illustrated implementation, the photodetector 1220 is positioned to receive and measure light from the concentrator 1206. In some implementations, the photodetector 1220 is positioned in focus to receive the redirected light 1210 again. In some implementations, the photodetector 1220 is coupled to and / or sealed to portions of the diamond 1202, such as the concentrator portion 1206.

In some implementations, an optical filter, such as a red filter, may be applied to and / or positioned on photodetector 1220 to filter out the light other than its associated red light.

In some implementations, a portion of the diamond 1202 may be formed without nitrogen vacancies. That is, for example, one or more layers for diamond can be formed by chemical vapor deposition without nitrogen vacancy. One or more layers may be processed or formed for the concentrator portion such that the emitted light reflected by the reflector portion 1204 is not reabsorbed by nitrogen vacancy as it travels through the concentrator portion 1206 of the diamond 1202 .

13 shows an example of a diamond 1302 with nitrogen vacancies and an assembly 1300 having a parabola reflector 1304 disposed about a diamond 1302 for a DNV light concentrator. In some implementations, the parabola reflector 1304 may be a single monolithic component. In some arrangements, the parabola reflector 1304 may be composed of more than two components and may be combined or otherwise arranged to form a parabola reflector 1304. [

The diamond 1302 is positioned at the focal point of the parabola reflector 1304. In some implementations, the diamond 1302 is positioned in focus using a mount for the diamond 1302. In another implementation, diamond 1302 may be refilled to seal the diamond 1302 in the bore hole in the parabola reflector 1304.

The parabola reflector 1304 may also include an aperture that allows the excitation laser beam, such as a green excitation laser beam, to excite the diamond 1302. The aperture may be located at any location relative to the parabola reflector 1304. [ When the diamond 1302 is excited (for example, by applying green light to the diamond 1302), the parabola reflector 1304 transmits the red light 1310 emitted from the diamond 1302 to the optical night scramble 1320 Reflection. In the illustrated implementation, the photodetector 1320 is positioned to receive and measure light from the parabola reflector 1304. In some implementations, the photodetector 1320 is coupled to and / or sealed to a portion of the parabola reflector 1304. In some implementations, the aperture can be adjacent or near the photodetector 1320. In other implementations, the aperture may face the photodetector 1320. In yet another configuration, the aperture may be at any other angle and / or orientation relative to the photodetector 1320. [

In some implementations, an optical filter, such as a red filter, may be applied to and / or positioned on the photodetector 1320 to filter out the light except for the respective corresponding red light. Thus, the parabola reflector 1304 is associated with a non-focused concentrator that is capable of capturing light emitted from a light source (e.g., a nitrogen vacancy in a diamond of a DNV sensor) into a single photodetector. In some cases, the loss of emitted light may be limited to light loss due to small openings for the mounting portion for the diamond and / or the green stimulated laser beam.

The above solution provides a high light collection efficiency for collecting the light emitted from the diamond 1302, while using a parabolic reflector 1304 that may not require high precision revision. This parabolic reflector 1304 may be a low cost solution to increase the light collection efficiency, such as using reflective mirror components. Furthermore, the shape of the parabolic reflector 1304 can separate the electronics of the photodetector 1320 from the diamond 1302, thereby reducing the magnetic interaction between the photodetector 1320 and the electronics of the diamond 1302 .

In some implementations, the parabola reflector 1304 can include a dielectric mirror film applied to reflect the emitted light 1310 or a substrate having a coating. The dielectric mirror film may be selected for a particular corresponding frequency. In some implementations, the thickness of the dielectric mirror material may affect a particular corresponding frequency. For example, the substrate may have a high sharpness at the corresponding frequency for the DNV sensor. The substrate may be made of plastic, glass, diamond, quartz, and / or any other suitable material. The dielectric mirror film can be applied to the substrate such that light 1310 emitted from the diamond 1302 is reflected within the parabola reflector 1304. [ In some implementations, the dielectric mirror film reflects only red light, and other colors or wavelengths of light pass through the parabola reflector 1304. For example, such a dielectric mirror film transmits green wavelength light, such as an excitation laser beam, to the parabolic reflector 1304 To be transmitted through the diamond 1302, thereby causing the diamond 1302 to be excited.

In some aspects, such as precision sensors, the separation between the diamond 1302 and the electronics of the photodetector 1320 can be extended to, for example, several feet. In some implementations, a thin dielectric mirror film is used for the parabola reflector 1304 such that the RF antenna can be positioned within the parabola reflector 1304. [ In some applications, the antenna may be external to the parabolic reflector 1304.

14 shows an assembly 1400 having an example of a diamond 1402 having nitrogen vacancies formed or processed in a reflector configuration for a DNV light collection device. The diamond 1402 of this configuration is formed or processed by a parabola reflector, and is a monolithic component.

The diamond 1402 may have a dielectric mirror film coated or applied on the diamond 1402. The dielectric mirror film may be selected for a particular corresponding frequency. In some implementations, the thickness of the dielectric mirror material may affect a particular corresponding frequency. The dielectric mirror film can be applied such that light 1410 emitted from the nitrogen vacancies in the diamond 1402 is reflected in the diamond 1402. In some implementations, the dielectric mirror film reflects only red light, and light of a different color or wavelength passes through the diamond 1402. For example, such a dielectric mirror film transmits green wavelength light such as an excitation laser beam through the dielectric mirror film to the nitrogen vacancies of the diamond 1402 to excite the nitrogen vacancies of the diamond 1402.

The parabola reflector configuration for diamond 1402 may internally reflect light 1410 emitted through the dielectric mirror film applied to diamond 1402. [ The diamond 1402 thus internally reflects the red light 1410 emitted from the diamond 1402 into the photodetector 1420 positioned to receive and measure the emitted light. In some implementations, the photodetector 1420 is bonded and / or sealed to portions of the diamond 1402.

In some implementations, an optical filter, such as a red filter, may be applied to and / or positioned on the photodetector 1420 to filter light except for its associated red light.

In some implementations, portions of the diamond 1402 may be formed without nitrogen vacancies. That is, for example, one or more layers for diamond can be formed by chemical vapor deposition without nitrogen vacancy. One or more of the layers may be near the junction to the photodetector 1420 such that the emitted light reflected by the parabolic reflector configuration of the diamond 1402 is not reabsorbed by nitrogen vacancies as it travels through one or more layers of the diamond 1402. [ Or may be formed or formed on the substrate.

FIG. 15 illustrates another implementation of a parabola reflector configuration for an assembly 1500 for a DNV sensor. An exemplary thin diamond 1502 with nitrogen vacancies can be inserted into the portion of the parabola reflector 1504 located around the diamond 1502 for the DNV light collection device. In some implementations, the parabola reflector 1504 may be a single monolithic component that is divided into two parts to insert the thin diamond 1502. [ In some other configurations, the parabola reflector 1504 may be composed of more than two components and may be coupled to or otherwise positioned in the parabola reflector 1504. [ In the illustrated implementation, a thin diamond 1502 is inserted parallel to (and in some cases along) the axis of symmetry with respect to the parabola reflector 1504. In an embodiment using an ellipsoidal reflector, the thin diamond 1502 may be inserted parallel to and / or along the major axis of the ellipsoidal reflector.

The parabola reflector 1504 may also include an aperture that allows the excitation laser beam to excite the diamond 1502, such as a green excitation laser beam. The aperture may be located at any location relative to the parabola reflector 1504. [ When the diamond 1502 is excited (e.g., by applying green light to the diamond 1502), the parabola reflector 1504 reflects the red light 1510 emitted from the diamond 1502 to the photodetector 1520 do. In the illustrated implementation, photodetector 1520 is positioned to receive and measure light from parabola reflector 1504. In some implementations, photodetector 1520 is coupled to and / or sealed to a portion of parabola reflector 1504. In some implementations, the aperture may be adjacent or near the photodetector 1520. In other implementations, the aperture may face the photodetector 1520. In another configuration, the aperture may be at any other angle and / or orientation relative to the photodetector 1520. [

In some implementations, an optical filter, such as a red filter, may be applied to and / or positioned on the photodetector 1520 to filter out light other than its associated red light. Thus, the parabolic reflector 1504 is associated with a non-focused concentrator that is capable of capturing light emitted from a light source (e.g., a nitrogen vacancy in a diamond of a DNV sensor) into a single photodetector. In some cases, the loss of emitted light may be limited to light loss due to small inlets for the mounting portion for the diamond and / or the green stimulated laser beam.

The above solution provides high light collection efficiency to collect the light emitted from the diamond 1502, while using the parabola reflector 1504, which may not require high precision revision. This parabola reflector 1504 may be a low cost solution to increase the light collection efficiency, such as by using reflective mirror components. The shape of the parabolic reflector 1504 can also separate the electronics of the photodetector 1520 from the diamond 1502 which reduces the magnetic interaction between the electronics of the photodetector 1520 and the diamond 1502 .

In some implementations, the parabola reflector 1504 may include a dielectric mirror film applied to reflect the emitted light 1510 or a substrate having a coating. The dielectric mirror film may be selected for a particular corresponding frequency. In some implementations, the thickness of the dielectric mirror material may affect a particular corresponding frequency. For example, the substrate may have a high sharpness at the corresponding frequency for the DNV sensor. The substrate may be made of plastic, glass, diamond, quartz, and / or any other suitable material. The dielectric mirror film may be applied to the substrate such that light 1510 emitted from the diamond 1502 is reflected within the parabola reflector 1504. In some implementations, the dielectric mirror film reflects only red light, and light of a different color or wavelength passes through the parabola reflector 1504. For example, such a dielectric mirror film may transmit green wavelength light, such as an excitation laser beam, through the parabola reflector 1504 to the diamond 1502 to excite the diamond 1502.

In some aspects, such as precision sensors, the separation between the diamond 1502 and the electronics of the photodetector 1520 can be extended to, for example, several feet. In some implementations, a thin dielectric mirror film is used for the parabola reflector 1504 to allow the RF antenna to be placed within the parabola reflector 1504. [ In some applications, the antenna may instead be external to the parabolic reflector 1504.

Figure 16 illustrates another implementation of the parabola reflector configuration for assembly 1600 for a DNV sensor. An example of a thin diamond 1602 with nitrogen vacancies can be inserted into the portion of the parabola reflector 1604 located around the diamond 1602 for the DNV light collection device. In some implementations, the parabola reflector 1604 may be a single monolithic component that is divided into two parts to insert the thin diamond 1602. [ In some other configurations, the parabola reflector 1604 may be composed of more than two components and may be combined or otherwise positioned to form the parabola reflector 1604. In the illustrated implementation, the thin diamond 1602 is inserted perpendicular to the axis of symmetry of the parabola reflector 1604. In an embodiment employing an ellipsoidal reflector, the thin diamond 1602 may be inserted parallel to and / or along the minor axis of the ellipsoidal reflector. In some implementations, the thin diamond 1602 is located at the focal point of the parabola reflector 1604.

The parabola reflector 1604 may also include an aperture that allows the excitation laser beam to excite the diamond 1602, such as a green excitation laser beam. The aperture may be located at any position relative to the parabola reflector 1604. [ When the diamond 1602 is excited (e.g., by applying green light to the diamond 1602), the parabola reflector 1604 reflects the red light 1610 emitted from the diamond 1602 to the photodetector 1620 do. In the illustrated implementation, photodetector 1620 is positioned to receive and measure light from parabola reflector 1604. In some implementations, photodetector 1620 is coupled to and / or sealed to a portion of parabola reflector 1604. In some implementations, the aperture can be adjacent or near the photodetector 1620. In other implementations, the aperture may face the photodetector 1620. In yet another configuration, the openings may be at any other angle and / or orientation relative to the photodetector 1620.

In some implementations, an optical filter, such as a red filter, may be applied to and / or positioned on the photodetector 1620 to filter out light other than its associated red light. Thus, the parabola reflector 1604 is associated with a non-focused concentrator that is capable of capturing light emitted from a light source (e.g., a nitrogen vacancy in a diamond of a DNV sensor) into a single photodetector. In some cases, the loss of emitted light may be limited to the light loss due to a small entrance for the mounting portion for the diamond and / or the green stimulated laser beam.

The above solution provides a high light collection efficiency for collecting the light emitted from the diamond 1602, while using the parabola reflector 1604, which may not require high precision revision. This parabola reflector 1604 can be a low cost solution to increase the light collection efficiency, such as using reflective mirror components. The shape of the parabolic reflector 1604 can also isolate the electronics of the photodetector 1620 from the diamond 1602 which reduces the magnetic interaction between the electronics of the photodetector 1620 and the diamond 1602 .

In some implementations, the parabola reflector 1604 may include a dielectric mirror film applied to reflect the emitted light 1610 or a substrate having a coating. The dielectric mirror film may be selected for a particular corresponding frequency. In some implementations, the thickness of the dielectric mirror material may affect a particular corresponding frequency. For example, the substrate may have a high sharpness at the corresponding frequency of the DNV sensor. The substrate may be made of plastic, glass, diamond, quartz, and / or any other suitable material. The dielectric mirror film can be applied to the substrate such that the light 1610 emitted from the diamond 1602 is reflected in the parabola reflector 1604. In some implementations, the dielectric mirror film reflects only red light, and light of a different color or wavelength passes through the parabola reflector 1604. For example, such a dielectric mirror film can transmit green wavelength light such as an excitation laser beam through the parabola reflector 1604 to the diamond 1602 to excite the diamond 1602.

In some aspects, such as precision sensors, the separation between the diamond 1602 and the electronics of the photodetector 1620 can be extended to, for example, several feet. In some implementations, a thin dielectric mirror film is used for the parabola reflector 1604 to allow the RF antenna to be placed within the parabolic reflector 1604. [ In some applications, the antenna may be external to the parabolic reflector 1604.

FIG. 17 shows an assembly 1700 for a DNV sensor incorporating the assembly 1400 of FIG. 15, wherein the diamond 1402 is formed or machined into a parabola configuration. Assembly 1700 includes light 1410 emitted from diamond 1402 and / or a positioned photodetector 1420. The diamond 1402 includes a dielectric mirror film applied to the diamond 1402 to reflect the red light 1410 emitted in the diamond 1402. In some implementations, the dielectric mirror film may reflect only red light so that light of a different color or wavelength passes through the diamond 1402. For example, this dielectric mirror film transmits green wavelength light 1710, such as an excitation laser beam, through the dielectric mirror film to the nitrogen vacancies of diamond 1402 to excite the nitrogen vacancies of diamond 1402. Assembly 1700 includes microwave coils around diamond 1402 such that when diamond 1402 is irradiated with microwaves of a particular frequency, the diamond will stop and / or reduce the emission of red light. A microwave off is performed on the DNV sensor before irradiating the diamond 1402 to emit the red light 1410. When the microwave frequency is shifted to a different frequency, the emitted red light is blurred and the frequency is related to the intensity of the magnetic field in which the DNV sensor is located.

In some implementations, the green light 1710 from the green laser can be applied to the diamond 1402 through fibers rather than free air. In some implementations, the entire device of Figure 17 may be as compact as ~ 2 mm. The assembly of the technique can be used in many applications, for example, in all magnetic measurement applications where a DNV magnetometer is used.

18 illustrates another embodiment of a reflector configuration for a DNV sensor assembly 1800 that includes a waveguide 1830 located within a reflector to direct light to a diamond 1802 with nitrogen vacancies. An example of a diamond 1802 with nitrogen vacancies can be inserted into the portion of the reflector 1804 positioned around the diamond 1802 relative to the DNV light collection device. In some implementations, reflector 1804 may be a parabola reflector or an ellipsoidal reflector. The reflector 1804 may be a single monolithic component or it may be a sheath component with or without a filler such as a plastic or optical fiber material. In the illustrated implementation, a waveguide 1830 is formed or inserted along the axis of symmetry of the parabola reflector 1804. In another implementation, waveguide 1830 is formed or inserted along the long axis of ellipsoidal reflector 1804. Waveguide 1830 may be an optical fiber component and / or may simply be a material having a refractive index different from that of filler in reflector 1804 and / or reflector 1804.

Diamond 1802 is positioned at the end of waveguide 1830 such that an excitation beam, such as a green laser beam, can be transmitted through diamond waveguide 1830 to diamond 1802. When the diamond 1802 is excited (e.g., by applying green light to the diamond 1802), the reflector 1804 reflects the red light 1810 emitted from the diamond 1802 to the photodetector 1820 . In the illustrated implementation, photodetector 1820 is positioned to receive and measure light from reflector 1804. In some implementations, the photodetector 1820 is coupled to and / or sealed to a portion of the reflector 1804. In some implementations, the aperture for transmitting the excitation beam passes through the photodetector 1820 such that the excitation beam can be transmitted through the waveguide 1830 to the diamond 1802. In another implementation, an emitter that emits light to excite the nitrogen vacancies of the diamond 1802, such as an excitation beam, has a diamond 1802 at the second end of the waveguide 1830 and is coupled to the first end of the waveguide 1830 Can be provided. In some implementations, an emitter may be formed and / or positioned within or at the center of photodetector 1820 to generate an excitation beam along waveguide 1830 and transmit it to diamond 1802. The photodetector 1820 and the emitter may be located on a single substrate. Thus, a single chip can include both the photodetector 1820 and the emitter for the excitation beam, so that both illumination and acquisition can be provided on a single chip.

In some implementations, an optical filter, such as a red filter, may be applied to the photodetector 1820 to filter out the light except its associated red light. Thus, the reflector 1804 is associated with a non-focused concentrator that is capable of capturing light emitted from a light source (e.g., in a nitrogen vacancy of a diamond of a DNV sensor) to a single photodetector. In some cases, the loss of emitted light may be limited to the loss of light due to the mounting portion for the diamond and / or any emitted light traveling back below the waveguide 1830.

The above-described solution provides a high light collection efficiency for collecting the light emitted from the diamond 1802 while using the reflector 1804, which may not require high-precision revision. This reflector 1804 may be a low cost solution to increase the light collection efficiency, such as using reflective mirror components. The shape of the parabola reflector 1804 can also separate the electronics and / or emitter of the photodetector 1820 from the diamond 1802, which can be coupled to the electronics of the photodetector 1820 and / Lt; RTI ID = 0.0 > 1802 < / RTI >

In some implementations, reflector 1804 may include a dielectric mirror film applied to reflect emitted light 1810 or a substrate having a coating. The dielectric mirror film may be selected for a particular corresponding frequency. In some implementations, the thickness of the dielectric mirror material may affect a particular corresponding frequency. For example, the substrate may have a high sharpness at the corresponding frequency of the DNV sensor. The substrate may be made of plastic, glass, diamond, quartz, and / or any other suitable material. The dielectric mirror film may be applied to the substrate such that light 1810 emitted from the diamond 1802 is reflected within the reflector 1804. In some implementations, the dielectric mirror film may reflect only red light so that light of a different color or wavelength passes through the reflector 1804.

In some aspects, such as a precision sensor, the separation between the diamond 1802 and the electronics of the photodetector 1820 can be extended up to several feet, for example. In some implementations, a thin dielectric mirror film is used for the reflector 1804 to allow the RF antenna to be placed inside the reflector 1804. In some applications, the antenna may be external to the reflector 1804.

19 shows an implementation of a process 1900 for forming a DNV sensor. The process 1900 includes providing diamond with nitrogen vacancies (block 1902), processing a portion of the diamond to form a reflector (block 1904), providing a photodetector for the diamond to receive the light emitted from the diamond (Block 1906), and / or applying a dielectric mirror film coating to a portion of the diamond (block 1908). In some implementations, the process 1900 may simply include providing diamond with nitrogen vacancies (block 1902) and applying a dielectric mirror film coating to portions of the diamond (block 1908).

In some implementations, processing of the diamond to form a reflector (block 1904) may process a portion of the diamond to form a parabolic shape, an elliptical shape, and / or any other suitable shape. In some implementations, the diamond layer may not have nitrogen vacancies.

20 shows another process 2000 for forming a DNV sensor. The process 2000 includes the steps of providing a diamond and reflector with nitrogen vacancies (block 2002), positioning the diamond in a reflector so that the reflector reflects a portion of the light from the diamond (block 2004), and / Positioning the photodetector relative to the diamond to receive the light (block 2006).

In some implementations, the reflector is monolithic and the diamond is positioned within the bore hole of the monolithic reflector. In some implementations, the bore hole may be refilled. In some implementations, the reflector may be formed of two or more parts, and placing the diamond in the reflector includes inserting diamond between the two or more parts. In some cases, the diamond can be substantially flat as in the configuration shown in Figs. 15-16. Two or more parts of the reflector may be parabolic in shape. The diamond may be positioned parallel to the axis of symmetry of the parabola reflector, or may be positioned perpendicular to the axis of symmetry. In other implementations, two or more parts of the reflector may be elliptical. The diamond may be positioned parallel to the long axis of the ellipsoidal reflector or parallel to the minor axis of the elliptical reflector. In some other implementations, positioning the diamond within the reflector can include casting a reflector around the diamond.

21 is a diagram illustrating an example of a system 2100 for implementing partial aspects of the present technique. In some implementations, the system 2100 may be a processing system for processing data output from the photodetector of the implementation described with reference to Figs. 11-19. The system 2100 includes a processing system 2102 that may include one or more processors or one or more processing systems. A processor may be one or more processors. The processing system 2102 may comprise a general purpose processor or a special purpose processor for executing instructions and may be a machine readable medium 2119 such as a volatile or nonvolatile memory for storing data and / ). The instructions that may be stored in the machine-readable media 2110 and / or 2119 may be executed by the processing system 2102 to control and manage access to the various networks, as well as to provide other communication and processing functions . The instructions may also include instructions executed by the processing system 2102 for various user interface devices such as the display 2112 and the keypad 2114. [ The processing system 2102 may include an input port 2122 and an output port 2124. Each of the input port 2122 and the output port 2124 may include one or more ports. The input port 2122 and the output port 2124 may be the same port (for example, a bidirectional port) or may be a different port.

The processing system 2102 may be implemented using software, hardware, or a combination thereof. By way of example, processing system 2102 may be implemented with one or more processors. The processor may be a general purpose microprocessor, microcontroller, digital signal processor (DSP), application specific integrated circuit (ASIC), field programmable gate array (FPGA), programmable logic device (PLD), controller, state machine, gated logic, An individual hardware component, or any other suitable device capable of performing computation or other manipulation of information.

The machine-readable medium may be one or more machine-readable media. The software can be broadly interpreted to mean instructions, data, or a combination thereof depending on whether it is referred to as software, firmware, middleware, microcode, hardware description language, or the like. The instructions may include code (e.g., source code format, binary code format, executable code format, or any other suitable format code).

The machine-readable medium (e.g., 2119) may include a storage integrated in the processing system, such as in the case of an ASIC. A machine-readable medium (e.g., 2110) may also include a random access memory (RAM), flash memory, read only memory (ROM), programmable read only memory (PROM), erasable PROM Disk, a removable disk, a CD-ROM, a DVD, or any other suitable storage device. Those skilled in the art will recognize how best to implement the described functionality for the processing system 2102. [ According to one aspect of the present disclosure, a machine-readable medium is a computer-readable medium encoded and / or stored with instructions and is a computing element, which defines the structural and functional interrelationships between the command and the rest of the system, Thereby realizing the functionality of the command. The instructions may be executable, for example, by the processing system 2102 or by one or more processors. The instructions may be, for example, a computer program containing code for performing the methods of the present technique.

The network interface 2116 may be any type of interface to a network (e.g., an Internet network interface) and may reside between any components coupled to the processor via bus 2104, .

The device interface 2118 may be any type of interface to the device and may reside between any of the components shown in FIG. The device interface 2118 may be an interface to an external device (e.g., a USB device) that plugs into a port (e.g., a USB port) of the system 2100, for example. In some implementations, the device interface 2118 may be an interface to the apparatus of Figures 10-18 where the analysis of some or all of the red light detected by the photodetector electronics is handled by the processing system 2102 .

The foregoing description is provided to enable those skilled in the art to practice the various configurations described herein. Although the present technology has been particularly described with reference to various drawings and configurations, it should be understood that it is for purposes of explanation only and is not to be construed as limiting the scope of the present technology.

One or more of the foregoing features and applications may be defined as a set of instructions recorded on a computer-readable storage medium (alternatively referred to as a computer-readable medium, a machine-readable medium, or a computer-readable storage medium) May be implemented as software processes. When these instructions are executed by one or more processing unit (s) (e.g., one or more processors, cores of processors, or other processing units), they may indicate that the processing unit (s) . In one or more implementations, the computer-readable medium does not include carrier and electronic signals, or any other transient signal, conveyed over a wireless or wired connection. For example, the computer-readable medium may be wholly limited to a physical object of the type storing information in a form readable by a computer. In one or more embodiments, the computer readable medium is a non-transitory computer readable medium, a computer readable storage medium, or a non-transitory computer readable storage medium.

In one or more implementations, a computer program product (also known as a program, software, software application, script, or code) may be written in any form of programming language including compiled or interpreted language, declarative or procedural language And may be deployed in any form including stand-alone programs or modules, components, subroutines, objects, or other units suitable for use in a computing environment. A computer program can correspond to files in the file system, but not necessarily. The program may be stored in a portion of a file that maintains other programs or data (e.g., one or more scripts stored in a markup language document), in a single file dedicated to the program, or in multiple coordination files (e.g., Module, subprogram, or file that stores portions of code). The computer programs may be executed on a single computer or on multiple computers located at a single site, or distributed across multiple sites and interconnected by communication networks.

While the above description refers primarily to microprocessors or multicore processors executing software, one or more implementations are performed by one or more integrated circuits, such as an application specific integrated circuit (ASIC) or an electric field programmable gate array (FPGA). In one or more implementations, such an integrated circuit executes instructions stored in the circuit itself.

In one or more embodiments, the present technique relates to a method and system for efficient collection of fluorescence (e. G., Red light) emitted by the NV center of a DNV sensor. In some aspects, the techniques may be used in a variety of markets including, for example, without limitation, advanced sensors and materials and structures.

Precision position encoder / sensor using nitrogen vacancy diamond

The position sensor system may include a position sensor including a magnetic field sensor. The magnetic field sensor may be a DNV magnetic field sensor capable of resolving a magnetic field vector of the type described above. The high sensitivity of the DNV magnetic field sensor in combination with the appropriate position encoder component can resolve both the discontinuous position and the proportionally determined position between discontinuous positions. Position sensor systems have small, lightweight and low power requirements.

22, the position sensor 2220 may be part of a system that also includes an actuator 2210 and a sensor component 2230. Actuator 2210 may be connected to position sensor 2220 by any suitable attachment means 2214, such as a rod or a shaft. The actuator may be any actuator that produces a desired motion, such as an electromechanical actuator. The position sensor 2220 may be connected to the sensor component 2230 by any suitable attachment means 2224 such as a rod or a shaft. Controller 2240 may be included in the system and may be coupled to position sensor 2220 and optionally actuator 2210 by electronic interconnects 2222 and 2212, respectively. The controller may be configured to receive the measured position from the position sensor 2220 and activate or deactivate the actuator to position the sensor 2230 at the desired position. According to one embodiment, the controller may be on the same substrate as the magnetic field sensor of the position sensor. The controller may comprise a processor and a memory.

The position sensor may be a rotational position sensor. 23 shows a rotational position sensor system that includes a rotational actuator 2380 configured to generate a rotation of a sensor 2390. [ The rotary position encoder 2310 is connected to the rotary actuator 2380 by connecting means 2382 such as a rod or a shaft. The connecting means 2392 is also provided between the rotational position encoder 2310 and the sensor 2390. The position sensor head 2320 is positioned to measure the magnetic field of the magnetic element located on the rotational position encoder 2310. The position sensor head 2320 is aligned with the magnetic element located on the rotational position encoder 2310 at a distance r from the center of the rotational position encoder. The surface of the rotational position encoder 2310 including the magnetic elements is shown in Fig. The center 2440 of the rotary position encoder 2310 may be configured to attach to the coupling means 2392 and 2394 connecting the rotary position encoder 2310 to the actuator 2320 or the sensor 2390. [ A magnetic element such as a uniform coarse magnetic element 2434 and a tapered micromagnetic element 2432 is positioned along the arc 2436 at a distance r from the center of the rotational position encoder to a rotational position encoder 2310 ). ≪ / RTI > The magnetic elements on the rotary position encoder 2310 may be located only in a portion of the arc, as shown in Fig. 24, or may be located all around the arc forming a circle of magnetic elements.

The spacing between the magnetic elements on the rotational position encoder 2310 is correlated with the discrete angular rotation [theta]. The distance between the magnetic elements associated with the discrete angular rotation [theta] increases as r increases. The sensitivity of the magnetic field sensor used in the position sensor allows r to be reduced while maintaining a high degree of accuracy with respect to the angular position of the rotary position encoder. The rotary position encoder may have an r of about mm, such as r of about 1 mm to about 30 mm or about 5 mm to about 20 mm. The rotary position encoder allows measurement of the rotary position with a precision of 0.5 micro-radians.

The position sensor may be a linear position sensor. 25, the linear position sensor system includes a linear position encoder 2510 and a linear actuator 2580 configured to produce a linear movement of the sensor 2590. [ The linear position encoder 2510 may be connected to the linear actuator by a connecting means 2582 such as a rod or a shaft. The linear position encoder 2510 may be connected to the sensor 2590 by a connecting means 2592 such as a rod or a shaft. The position sensor head 2520 is positioned to measure the magnetic field produced by the magnetic element disposed in the linear position encoder. In some cases, a mechanical linkage, such as a lever arm, can be used to propagate changes in the position of the linear position encoder relative to the associated movement of the sensor. The linear position sensor may have a sensitivity that allows for a change in position over several hundred nanometers to be decomposed, such as a 500 nm position change.

The magnetic element can be placed on a linear or rotational position encoder in any suitable configuration. As shown in FIG. 26, magnetic elements may include both homogeneous rough magnetic elements 2634 and tapered micromagnetic elements 2632. Uniform rough magnetic elements 2634 may have an influence on the local magnetic field that is at least two orders of magnitude greater than the maximum effect of the tapered micromagnetic elements 2634. [ The coarse magnetic elements 2634 may be formed on the position encoder by any suitable process. According to one embodiment, a polymer loaded with a magnetic material can be used to form a uniform rough magnetic element. The amount of magnetic material that can be included in the coarse magnetic element is limited by potential interference with other elements in the system.

The tapered micro-magnetic element may be formed by any suitable process on the position encoder. According to one embodiment, a polymer loaded with a magnetic material can be used to form the tapered micro-magnetic element. The loading of the magnetic material within the polymer may be increased to produce a magnetic field gradient from the first end of the tapered micro-magnetic element to the second end of the tapered micro-magnetic element. Alternatively, the geometric size of the tapered micro-magnetic element may be increased to produce the desired magnetic field gradient. The magnetic field gradient of the tapered micro-magnetic element may be about 10 nT / mm. The tapered micro-magnetic element 2632 as shown in Fig. 26 causes the position between the rough magnetic elements 2634 to be correctly resolved. The position encoder in which the magnetic element is disposed may be formed of any suitable material such as ceramic, glass, polymer or non-magnetic metal material.

The size of the magnetic element is limited by manufacturing capability. The magnetic element on the position encoder may have a geometric feature of about nanometers, such as about 5 nm.

Figure 27 shows an alternative magnetic element arrangement that may be used when additional precision provided by tapered micro-magnetic elements is not required. The magnetic element arrangement of FIG. 27 includes only the coarse magnetic elements 2634. Figure 13 shows a magnetic element arrangement that does not include coarse magnetic elements. An effect similar to the coarse magnetic element 2634 is that the coarse magnetic elements shown in Figures 26 and 27 are tapered in the same manner to represent the discrete change of the location, Can be achieved by using the transition between the minimum values as an indicator. Although FIGS. 26 to 18 illustrate magnetic element arrangements in a linear form, similar magnetic element arrangements can be applied to a rotational position encoder.

According to an alternative embodiment, a single tapered magnetic element can be used. This configuration may be particularly suitable for applications requiring a small range of positions because, for a larger range of positions, an increase in the magnetic field with an increasing gradient of magnetic elements can interfere with other components of the position sensor system to be. The use of a single tapered magnetic element can cause the position sensor to be determined without first initializing the position sensor by setting the position encoder to a known position. The ability of a magnetic field sensor to degrade a magnetic field vector allows a single magnetic field sensor to be used in the position sensor head when a single tapered micro-magnetic element is used on the position encoder.

The position sensor head 2620 may include a plurality of magnetic field sensors as shown in Fig. For magnetic element placement that includes more than one element, at least two magnetic field sensors 2624 and 2622 may be used for the position head sensor. The magnetic field sensors may be separated by a distance a. The distance a between the magnetic sensors 2622 and 2624 may be less than the distance d between the coarse magnetic elements 2634. [ According to one embodiment, the relationship between the spacing of the magnetic field sensor and the spacing of the coarse magnetic elements may be 0.1d < a < d. As shown in FIG. 29, the position sensor head 2620 may include third and fourth magnetic field sensors. The magnetic field sensor at the position sensor head may be a DNV magnetic field sensor of the type described above.

The arrangement of the magnetic field sensors in the position sensor head 2620 shown in Fig. 29 allows the direction of movement of the position encoder to be determined. As shown in FIG. 30, the spacing between the magnetic field sensors 2624 and 2622 produces a delayed response to the magnetic field element as the position encoder moves. The difference in the measured magnetic field for each magnetic field sensor allows the direction of movement of the position encoder to be determined since a different output magnetic field is measured by each magnetic field sensor for any given position of the position encoder. The increased portion of the plot in Figure 30 is produced by the tapered micro-magnetic element, and the square peak is produced by the coarse magnetic element. This measured magnetic field can be used to determine a change in the position of the position encoder, thereby the sensor connected to the position encoder.

The controller of the position sensor system can be programmed to determine the position of the position encoder using the output from the magnetic field sensor and thus the position of the sensor connected thereto. 31, the controller may include a line traversal logic 402 function that determines when coarse magnetic elements have passed through the magnetic sensor. The outputs from the two magnetic field sensors B1 and B2 determine the direction of the position change based on the order in which the magnetic elements encountered by the magnetic field sensor and count the number of coarse magnetic elements measured by the magnetic field sensor Can be used. Each coarse magnetic element adds a known amount of position variation due to the known spacing between coarse magnetic elements on the position encoder. The element gradient processing function 400 is programmed in the controller to determine the position between the coarse magnetic elements based on the magnetic field signal generated by the tapered micro-magnetic element located between the coarse magnetic elements. As shown in FIG. 31, the element gradient processing section 400 is used only when the line traversal logic determines that the position is between coarse magnetic elements or lines. If the position is determined to be between rough magnetic elements, the position correction ?? is calculated based on the magnetic field associated with the tapered micro-magnetic elements. The position correction is then added to the sum of the position changes calculated from the number of counted coarse magnetic elements. The final position can be calculated by adding the calculated position change to the start position of the position encoder. Logic processing at the controller may be performed by analog or digital circuitry.

The position sensor may be used in a method for controlling the position of the position encoder. The method includes determining a direction of movement required to reach a desired position and activating an actuator to produce a desired motion. The position sensor is used to monitor changes in the position of the position encoder and to determine when to deactivate the actuator and stop changing at the position. When the desired position is reached, the change in position can be stopped. The method may further include initializing the position sensor system by moving the position encoder to a known starting point. The end position of the position encoder may be determined after deactivation of the actuator and the end position may be stored in the memory of the position sensor controller as a start position for further movement.

The ability of the position sensor system to determine the position between the coarse magnetic elements of the position encoder provides many practical advantages. For example, the location of the position encoder and associated sensor can be more accurately known, while reducing the size, weight, and power requirements of the position sensor system. Additionally, a position control system that provides resolution of discrete position shifting can result in dithering when the desired position is between two discrete position values. Dithering may result in undesirable vibration and overheating of the actuator when the control system repeatedly attempts to reach the desired position.

The features of the position sensor system described above make it particularly suitable for applications where precision, size, weight and power requirements are important considerations. Position sensor systems are well suited for space flight applications such as spacecraft. The position sensor system is also applicable to robot arm, three-dimensional mill, machining tool and X-Y table.

The position sensor system can be used to control the position of various sensors and other devices. A non-limiting example of a sensor that can be controlled by a position sensor system is an optical sensor.

Magnoni  Communication through

Propagation can be used as a carrier for information. Thus, the transmitter can modulate the radio wave in one place, and the receiver in another place can detect the modulated radio wave, demodulate the signal, and receive the information. Several different methods can be used to transmit information through radio waves. However, all such methods use radio waves as radio waves for information to be transmitted.

However, radio waves are not suitable for all communication methods. For example, radio waves can be greatly attenuated by some substances. For example, radio waves generally do not travel well through water. Therefore, communication through water can be difficult using radio waves. Similarly, radio waves can be greatly attenuated by the ground. Thus, for example, wireless communications over the ground for coal or other mines may be difficult. It is often difficult to communicate wirelessly from a metal enclosure via radio waves. As the radio waves pass through materials such as walls, trees or other obstacles, the intensity of the radio signal can be reduced. Moreover, communication via radio waves is widely used and understood. Thus, confidential communications using radio waves require complex methods and devices to maintain the confidentiality of information.

According to some embodiments described herein, wireless communication is accomplished without using radio waves as a carrier for information. Rather, a modulated magnetic field can be used to transmit information. For example, the transmitter may comprise a coil or an inductor. When a current passes through the coil, a magnetic field is generated around the coil. The current through the coil is modulated and the magnetic field can be modulated. Thus, information converted into a modulated electrical signal (e.g., a current modulated through a coil) can be used to transfer information to the magnetic field. A magnetometer can be used to monitor the magnetic field. Thus, the modulated magnetic field can be converted to an existing electrical system (e.g., using current to convey information). Thus, the communication signal can be converted to a magnetic field, and a remote receiver (e.g., a magnetometer) can be used to retrieve the communication from the modulated magnetic field.

Diamond with nitrogen vacancy (DNV) can be used to measure the magnetic field. DNV sensors typically have a fast response to magnetic fields, consume little power, and are accurate. Diamonds can be produced centered on nitrogen vacancies (NV) in the lattice structure of the diamond. When the NV center is excited by light, for example green light and microwave radiation, the NV center emits light of a different frequency than the excitation light. For example, green light can be used to excite the NV center, and red light can be emitted from the NV center. When a magnetic field is applied to the center of the NV, the frequency of the light emitted from the center of the NV changes. In addition, when a magnetic field is applied to the center of the NV, the frequency of the microwave whose center of the NV is excited is changed. Hence, the magnetic field can be monitored by illuminating the green light (or any other suitable color) through the DNV and monitoring the frequency of the microwave radiation that excites the NV center and the light emitted from the DNV.

The NV center of the diamond is oriented in one of the four spin states. Each spin state may be positive or negative. The NV center of one spin state does not respond to the same magnetic field as the NV center of the other spin state. The magnetic field vector has a magnitude and direction. Depending on the direction of the magnetic field in the diamond (and NV center), a portion of the NV center will be excited more by the magnetic field than others based on the spin state of the NV center.

32A and 32B are graphs showing the frequency response of a DNV sensor according to an exemplary embodiment. Figures 32A and 32B are meant to be illustrative only and not intended to be limiting. Figures 32A and 32B show the frequency of the microwave applied to the DNV sensor on the x-axis versus the amount of light at a particular frequency (e. G., Red) emitted from the diamond. 32A is the frequency response of a DNV sensor with no magnetic field applied to the diamond, and FIG. 32B is the frequency response of a DNV sensor with a 70 Gauss (G) magnetic field applied to the diamond.

As shown in FIG. 32A, when a magnetic field is not applied to the DNV sensor, there are two notches in the frequency response. If the magnetic field is not applied to the DNV sensor, the spin state can not be disassembled. That is, in the absence of a magnetic field, NV centers having various spin states are equally excited and emit light of the same frequency. The two notches shown in Figure 32A are the result of positive and negative spin directions. The frequency of the two notches is an axial zero field division parameter.

When a magnetic field is applied to the DNV sensor, the spin state becomes resolvable in the frequency response. According to excitation by the NV center magnetic field of a particular spin state, notches corresponding to positive and negative directions in the frequency response graph are separated. As shown in FIG. 32B, when a magnetic field is applied to the DNV sensor, eight notches appear on the graph. The eight notches are four pairs of corresponding notches. For each notch pair, one notch corresponds to a positive spin state, and one notch corresponds to a negative spin state. Each pair of notches corresponds to one of the four spin states of the NV center. The amount by which a pair of notches deviate from the axial zero field division parameter depends on how strongly the magnetic field excites the NV center of the corresponding spin state.

As described above, the magnetic field at one point can be characterized by magnitude and direction. By changing the magnitude of the magnetic field, all NV centers will be similarly affected. Using the graph of Fig. 32A as an example, the ratio of the distance from a pair of 2.87 GHz to the other pair will remain the same when the magnitude of the magnetic field is changed. As the size increases, each pair moves at a different speed than the other pair, but each notch pair travels away from the 2.87 GHz at a constant rate.

However, when the direction of the magnetic field is changed, the pair of notches do not move in a manner similar to each other. 33A is a diagram of NV centered spin states in accordance with an exemplary embodiment. 33A conceptually shows four spin states in the NV center. The spin states are denoted as NV A, NV B, NV C and NV D. Vector 3301 is a representation of a first magnetic field vector with respect to the spin state, and vector 3302 is a representation of a second magnetic field vector with respect to the spin state. The vector 3301 and the vector 3302 are the same size but have different directions. Therefore, based on the change in direction, the various spin states will be affected differently depending on the direction of the spin state.

33B is a graph illustrating the frequency response of a DNV sensor in response to a changed magnetic field in accordance with an exemplary embodiment. The frequency response graph shows the frequency response of the DNV sensor from the magnetic field corresponding to vector 3301 and vector 3302. The notches corresponding to the NV A and NV D spin states, as shown in Figure 33B, ) To vector 3302 and a negative notch (e.g., a lower frequency notch) of the NV C spin state moves away from the axial zero field segmentation parameter and the NV C The amount of spin state (e.g., the high frequency notch) remains essentially the same, and the notch corresponding to the NV B spin state increases in frequency (e.g., moves to the right in the graph). Thus, by monitoring the change in frequency response of the notch, the DNV sensor can determine the direction of the magnetic field.

In addition, magnetic fields in different directions can be modulated simultaneously, and each modulation can be distinguished or identified by a DNV sensor. For example, the magnetic field in the NV A direction may be modulated in the first pattern, the magnetic field in the NV B direction may be modulated in the second pattern, the magnetic field in the NV C direction may be modulated in the third pattern, And the magnetic field in the direction D can be modulated into the fourth pattern. Movement of the notch in the frequency response corresponding to the various spin states can be monitored to determine each of the four patterns.

However, in some embodiments, the direction of the magnetic field corresponding to the various spin states of the DNV sensor of the receiver may not be known by the transmitter. In these embodiments, by monitoring at least three of the spin states, messages transmitted on two mutually orthogonal magnetic fields can be decrypted. Similarly, by monitoring the frequency response of the four spin states, a message transmitted in three mutually orthogonal magnetic fields can be decrypted. Thus, in some embodiments, two or three independent signals may be transmitted simultaneously to a receiver that receives and decodes two or three signals. Such embodiments may be a multiple-input multiple-output (MIMO) system. The diversity in the polarization of the magnetic field channels typically provides the entire rank channel matrix over a keyhole channel. In an exemplary embodiment, the full rank channel matrix allows the MIMO technique to use all degrees of freedom (e. G., 3 degrees of polarization). Using a magnetic field to transmit information avoids the keyhole effect that it may have to propagate through the radio frequency field.

34 is a block diagram of a magnetic communication system in accordance with an exemplary embodiment. The exemplary magneto system 3400 includes input data 3405 and 3410, a transmitter 3445, a modulated magnetic field 3450, a magnetometer 3455, a magnetoreceptor 3460 and output data 3495. In alternative embodiments, additional, fewer, and / or different elements may be used.

In an exemplary embodiment, the input data 3405 is input to the magnet system 3400 and transmitted wirelessly, and the output data 3495 is generated at a location away from the generation of the input data 3405. In an exemplary embodiment, input data 3405 and output data 3495 contain the same information.

In an exemplary embodiment, input data 3405 is transmitted to a magnitude transmitter 3410. The magnitude transmitter 3410 may prepare the information received in the input data 3405 for transmission. For example, the magnitude transmitter 3410 may encode or encrypt the information of the input data 3405. The magnitude transmitter 3410 may send information to the transmitter 3445.

Transmitter 3445 is configured to transmit information received from optical transmitter 3410 via one or more magnetic fields. The transmitter 3445 may be configured to transmit information on one, two, three, or four magnetic fields. That is, the transmitter 3445 may transmit information through a magnetic field oriented in a first direction, transmit information through a magnetic field oriented in a second direction, and transmit information through a magnetic field oriented in a third direction And / or transmit information through a magnetic field oriented in a fourth direction. In some embodiments in which the transmitter 3445 transmits information through two or three magnetic fields, the magnetic fields may be orthogonal to one another. In an alternative embodiment, the magnetic fields are not orthogonal to each other.

Transmitter 3445 may be any suitable device configured to generate a modulated magnetic field. For example, the transmitter 3445 may include one or more coils. Each coil may be a conductor wound around a central axis. For example, in an embodiment where information is transmitted via three magnetic fields, the transmitter 3445 may include three coils. The center axis of each coil may be orthogonal to the center axis of the other coil.

Transmitter 3445 generates a modulated magnetic field 3450. Magnetometer 3455 can detect modulated magnetic field 3450. Magnetometer 3455 may be located remotely from transmitter 3445. For example, through a coil (e.g., a transmitter) to a magnetometer 3455 having a current of about 10 amperes and a sensitivity of about 100 nanoseconds. The message can be fully transmitted, received, and recovered to a few meters between the transmitter and the receiver, and to the magnetometer 3455 inside the Faraday cage. Magnetometer 3455 may be configured to measure a modulated magnetic field 3450 along three or four directions. As described above, the magnetometer 3455 using the DNV sensor can measure the magnetic field along four directions associated with the four spin states. Magnetometer 3455 may send information such as frequency response information to magneto receiver 3460. [

Magneto receiver 3460 can analyze information received from magnetometer 3455 and decode information in the signal. Magneto receiver 3460 may reconstruct the information contained in input data 3405 to produce output data 3495. [

In an exemplary embodiment, the magneto transmitter 3410 includes a data packet generator 3415, an outer encoder 3420, an interleaver 3425, an inner encoder 34340, an interleaver 34345, and an output packet generator 3440 do. In alternative embodiments, additional, fewer, and / or different elements may be used. The various components of the magnitude transmitter 310 are shown in Fig. 34 as individual components and are meant to be exemplary only. However, in alternative embodiments, various components may be combined. Also, the use of arrows is not intended to be limiting with respect to the order or flow of operations or information. Any component of the magnitude transmitter 3410 may be implemented using hardware and / or software.

The input data 3405 can be sent to the data packet generator 3415. In an exemplary embodiment, the input data 3405 is a series of bits or a bit stream. The data packet generator 3415 can decompose the bit stream into information packets. The packet may be of any suitable size. In an exemplary embodiment, the data packet generator 3415 includes adding a header to the packet that includes transmission management information. In an exemplary embodiment, the header may include information used for error detection, such as a checksum. Any suitable header may be used. In some embodiments, input data 3405 is not decomposed into packets.

The data stream generated by the data packet generator 3415 may be sent to an external encoder 3420. External encoder 3420 may encrypt or encode the stream using any suitable encryption or code. Any suitable type of encryption, such as symmetric key encryption, may be used. In an exemplary embodiment, the encryption key is stored in a memory associated with the magnitude transmitter 3410. In an exemplary embodiment, the magnitude transmitter 3410 may not include an external encoder 3420. [ For example, the message may not be encrypted. In an exemplary embodiment, the outer encoder 3420 separates the stream into multiple channels. In an exemplary embodiment, outer encoder outer encoder 3420 performs forward error correction (FEC). In some embodiments, the forward error correction dramatically increases the reliability of the transmission for a given power level.

In an exemplary embodiment, the encoded stream from outer encoder 3420 is sent to interleaver 3425. [ In an exemplary embodiment, the interleaver 3425 interleaves the bits in each packet of the data stream. In this embodiment, each packet has the same bits, but the bits are shuffled according to a predetermined pattern. Any suitable interleaving method may be used. In another embodiment, the packets are interleaved. In this embodiment, the packets are shuffled according to a predetermined pattern. In some embodiments, the magnitude transmitter 3410 may not include an interleaver 3425.

In some embodiments, the interleaving data may be used to prevent loss of the data sequence. For example, if the bitstream is sequential and there is a communication loss during a portion of the stream, there is a relatively large gap in information corresponding to the lost bits. However, if the bits are interleaved (e.g., shuffled), once the stream is deinterleaved (e.g., non-shuffled) at the receiver, the lost bits are not grouped together, but spread across sequential bits . In some cases, if a lost bit is spread across a message, error correction may be more successful in determining what the lost bit is.

In an exemplary embodiment, the interleaved stream from the interleaver 3425 is sent to an inner encoder 3430. The inner encoder 3430 may encrypt or encode the stream using any suitable encryption or code. Any suitable type of encryption, such as symmetric key encryption, may be used. In an exemplary embodiment, the encryption key is stored in a memory associated with the magnitude transmitter 3410. In an exemplary embodiment, the magnitude transmitter 3410 may not include an inner encoder 3430. [ In the exemplary embodiment, the inner encoder 3430 and the outer encoder 3420 perform different functions. For example, the inner encoder 3430 can use deep convolutional code, perform most forward error correction, and the outer encoder can be used to correct the residual error, Technology (e.g., a block-parity-based encoding technique).

In an exemplary embodiment, the encoded stream from inner encoder 3430 is sent to interleaver 3435. [ In an exemplary embodiment, the interleaver 3435 interleaves the bits in each packet of the data stream. In this embodiment, each packet has the same bits, but the bits are shuffled according to a predetermined pattern. Any suitable interleaving method may be used. In an alternative embodiment, the packets are interleaved. In this embodiment, the packet is shuffled according to a predetermined pattern. In an exemplary embodiment, interleaving the data spreads the bursty error across the signal, facilitating decoding of the message. In some embodiments, the magnitude transmitter 3410 may not include an interleaver 3435.

In an exemplary embodiment, the interleaved stream from the interleaver 3435 is sent to an output packet generator 3440. Output packet generator 3440 may generate the packet to be transmitted. For example, the output packet generator 3440 may add a header to the packet that contains the transmission management information. In an exemplary embodiment, the header may include information used for error detection, such as a checksum. Any suitable header may be used.

In an exemplary embodiment, output packet generator 3440 adds a synchronization sequence to each packet. For example, a synchronization sequence may be added at the beginning of each packet. Packets may be transmitted on multiple channels. In this embodiment, each channel is associated with a unique synchronization sequence. As described in more detail below with respect to the magnitude receiver 3460, the synchronization sequence may be used to decode the channel from each other.

In an exemplary embodiment, output packet generator 3440 modulates the waveform to be transmitted. Any suitable modulation can be used. In an exemplary embodiment, the waveform is digitally modulated. In some embodiments, minimum shift keying may be used to modulate the waveform. For example, a non-differential minimum shift key may be used. In an exemplary embodiment, the waveform has a continuous phase. That is, the waveform has no phase discontinuity. In an exemplary embodiment, the waveform is a sinusoidal curve.

In an exemplary embodiment, the modulated waveform is transmitted to a transmitter 3445. In an exemplary embodiment, a plurality of modulated waveforms are transmitted to the transmitter 3445. As described above, two, three or four signals can be transmitted simultaneously through a magnetic field in different directions. In an exemplary embodiment, three modulated waveforms are sent out to a transmitter 3445. Each waveform may be used to modulate the magnetic field, and each magnetic field may be orthogonal to each other.

Transmitter 3445 can generate a modulated magnetic field 3450 using the received waveform. Modulated magnetic field 3450 may be a combination of multiple magnetic fields in different directions. The frequency used to modulate the modulated magnetic field 3450 may be any suitable frequency. In an exemplary embodiment, the carrier frequency of the modulated magnetic field 3450 may be 10 kHz. In an alternative embodiment, the carrier frequency of the modulated magnetic field 3450 may be less than or greater than 10 kHz. In some embodiments, the carrier frequency may be modulated to plus or minus the carrier frequency. That is, using the example with a carrier frequency of 10 kHz, the carrier frequency can be modulated from 0 Hz to a maximum of 20 kHz. In alternative embodiments, any suitable frequency band may be used.

35A and 35B show the intensity of a magnetic field versus frequency according to an exemplary embodiment. 35A and 35B are meant to be illustrative only and not meant to be limiting. In some cases, the magnetic spectrum is relatively noisy. As shown in Fig. 35A, the noise over a large band (for example, 0 to 200 kHz) is relatively high. Thus, communication over such a large band can be difficult. Figure 35B shows noise over a smaller band (e.g., 1 to 3 kHz). As shown in Fig. 35B, noise over a smaller band is relatively low. Therefore, modulating the magnetic field in a smaller frequency band may be less noisy and may be more effective. In an exemplary embodiment, the magnitude transmitter 3410 may determine a frequency sufficient to monitor the magnetic field and modulate the magnetic field to reduce noise. That is, the magnitude transmitter 3410 can find a frequency with a high signal-to-noise ratio. In an exemplary embodiment, the magnitude transmitter 3410 determines a frequency band having a noise below a predetermined threshold.

In an exemplary embodiment, the magnetoreceptor 3460 includes a demodulator 3465, a deinterleaver 3470, a soft internal decoder 3475, a deinterleaver 3480, an external decoder 3485, and an output data generator 3490 . In alternative embodiments, additional, fewer, and / or different elements may be used. For example, the magnet receiver 3460 may include a magnetometer 3455 in some embodiments. The various components of the magnitude receiver 3460 are shown in Figure 34 as individual components and are meant to be exemplary only. However, in alternative embodiments, various components may be combined. In addition, the use of arrows does not imply a restriction on the order or flow of operations or information. Any component of the magnetoreceptor 3460 may be implemented using hardware and / or software.

Magnetometer 3455 is configured to measure the modulated magnetic field 3450. In an exemplary embodiment, magnetometer 3455 includes a DNV sensor. Magnetometer 3455 can monitor a magnetic field 3450 modulated in up to four directions. As shown in FIG. 2A, the magnetometer 3455 may be configured to measure the magnetometer 3455 in one or more of four directions arranged in a tetrahedron. As discussed above, the magnetometer 3455 may monitor the n + 1 direction, where n is the number of channels that the transmitter 3445 transmits. For example, the transmitter 3445 may transmit on three channels and the magnetometer 3455 may monitor four directions. In an alternative embodiment, the transmitter 3445 may transmit on the same number of channels (e.g., four) as the magnetometer 3455 monitors.

The magnetometer 3455 can send information about the modulated magnetic field 3450 to the demodulator 3465. A demodulator 3465 may analyze the received information and determine the direction of the magnetic field used to generate the modulated magnetic field 3450. [ That is, the demodulator 3465 can determine the direction of the channel transmitted by the transmitter 3445. As described above, the transmitter 3445 can transmit a plurality of data streams, and each data stream is transmitted on one channel. Each data stream may be preceded by a unique synchronization sequence. In an exemplary embodiment, the synchronization sequence includes 1023 bits. In an alternate embodiment, the synchronization sequence includes more or less than 1023 bits. Each channel can be transmitted simultaneously, so that each channel is time-aligned with respect to each other. Demodulator 3465 can simultaneously monitor the magnetic field in various directions. Based on the synchronization sequence known to the magnitude receiver 3460, the demodulator 3465 can determine the directions corresponding to the channels of the transmitter 3445. [ Once the streams of synchronization sequences are time-aligned, a demodulator 3465 monitors the modulated magnetic field 3450 to determine how the multiple channels are mixed. Once the demodulator 3465 determines how the various channels are mixed, the channels may be demodulated.

For example, the transmitter 3445 transmits over three channels, with each channel corresponding to an orthogonal direction. Each channel is used to transmit an information stream. For example, the names of the channels are "Channel A "," Channel B ", and "Channel C ". Magnetometer 3455 monitors the modulated magnetic field 3450 in four directions. Demodulator 3465 can monitor three signals in an orthogonal direction. For example, the signals may be named "signal 1 "," signal 2 ", and "signal 3 ". Each of the signals may comprise a unique predetermined synchronization sequence. Demodulator 3465 may monitor the modulated magnetic field 3450 for the signal to be transmitted over the channel. There are an infinite number of possible combinations in which signals can be received at the magnetometer 3455. For example, signal 1 may be transmitted in a direction corresponding to channel A, signal 2 may be transmitted in a direction corresponding to channel B, and signal 3 may be transmitted in a direction corresponding to channel C. In an alternative example, signal 2 may be transmitted in a direction corresponding to channel A, signal 3 may be transmitted in a direction corresponding to channel B, signal 1 may be transmitted in a direction corresponding to channel C, The rest is the same. The modulated magnetic field 3450 of the synchronization sequence for each possible combination in which a signal can be received at the magnetometer 3455 may be known by the demodulator 3465. [ Demodulator 3465 may monitor the output of magnetometer 3455 for each possible combination. Thus, if one of the possible combinations is recognized by the demodulator 3465, the demodulator 3465 may monitor the additional data in a direction associated with the recognized combination. In another example, the transmitter 3445 transmits two channels and the magnetometer 3455 monitors the magnetic field 3450 modulated in three directions.

The demodulated signal (e.g., the received data stream from each channel) is sent to a deinterleaver 3470. The deinterleaver 3470 can cancel the interleaving of the interleaver 3435. [ The deinterleaved data stream may be sent to a soft inner decoder 3475 which can cancel the encoding of the deinterleaver inner encoder 3430. [ Any suitable decoding method may be used. For example, in the exemplary embodiment, the inner encoder 3430 uses a three-way, soft-crystal turbo decoding function. In an alternative embodiment, a two-way soft-decision turbo decoding function may be used. For example, the expected cluster position for the signal level is learned by the magneto receiver 3460 during the synchronization portion of the transmission. When the payload / data portion of the transmission is processed by the magnet receiver 3460, the distance from all possible signal clusters to the observed signal value is calculated for every bit position. The bits of each bit position are determined by combining the distance and the state transition probability to find the best path through the "trellis". The path through the trellis may be used to determine the most probable bit communicated.

The decoded stream may be transmitted to deinterleaver 3480. [ The deinterleaver 3480 can cancel the interleaving of the interleaver 3425. [ The deinterleaved stream may be sent to an external decoder 3485. In an exemplary embodiment, the external decoder 3485 cancels the external decoder 3420. The unencoded information stream may be sent to the output data generator 3490. [ In an exemplary embodiment, the output data generator 3490 cancels the packet generation of the data packet generator 3415 to generate output data 3495. [

36 is a block diagram of a computing device according to an exemplary embodiment. Exemplary computing device 3600 includes a memory 3610, a processor 3605, a transceiver 3615, a user interface 3620, and a power source 3625. In alternative embodiments, additional, fewer, and / or different elements may be used. The computing device 3600 may be any suitable device described herein. For example, computing device 3600 may be a desktop computer, a laptop computer, a smart phone, a special computing device, and the like. The computing device 3600 may be used to implement one or more of the methods described herein.

In an exemplary embodiment, memory 3610 is an electronic storage location or storage for information so that information can be accessed by processor 3605. [ The memory 3610 may be any type of storage medium such as a magnetic storage device (e.g., a hard disk, a floppy disk, a magnetic strip, etc.), an optical disk (e.g., a CD, a digital versatile disk But is not limited to, any type of random access memory (RAM), any type of read only memory (ROM), any type of flash memory, etc., such as a memory device and the like. Computing device 3600 may have one or more computer readable media using the same or different memory media technology. Computing device 3600 may have one or more drives that support loading of memory media such as CD, DVD, flash memory card, and the like.

In an exemplary embodiment, the processor 3605 executes the instructions. The instructions may be performed by a special purpose computer, a logic circuit, or a hardware circuit. The processor 3605 may be implemented in hardware, firmware, software, or any combination thereof. The term "execution" is, for example, a process that executes an application program or performs an operation called by the command. An instruction may be written using one or more programming languages, scripting languages, assembly language, and the like. The processor 3605 executes the instruction, which means that it performs the operation called by that instruction. The processor 3605 is operatively coupled to a user interface 3620, a transceiver 3615, a memory 3610, etc. to control the operation of the computing device 3600 and to receive, transmit, and process information. The processor 3605 may retrieve a set of instructions from a persistent memory device, such as a ROM device, and may copy executable instructions into a temporary memory device, generally some form of RAM. Exemplary computing device 3600 may comprise a plurality of processors using the same or different processing techniques. In an exemplary embodiment, the instructions may be stored in memory 3610. [

In an exemplary embodiment, transceiver 3615 is configured to receive and / or transmit information. In some embodiments, the transceiver 3615 communicates information over a wired connection, such as an Ethernet connection, one or more twisted pair wires, a coaxial cable, a fiber optic cable, or the like. In some embodiments, the transceiver 3615 communicates information over a wireless connection using microwaves, infrared waves, radio waves, spread spectrum techniques, satellites, and the like. The transceiver 3615 may be configured to communicate with other devices using a cellular network, a local area network, a wide area network, the Internet, and the like. The transceiver 3615 may be configured to communicate with other devices using a cellular network, a local area network, a wide area network, the Internet, and the like. In some embodiments, more elements of the one or more computing devices 3600 communicate via wired or wireless communication. In some embodiments, the transceiver 3615 provides an interface for providing information from the computing device 3600 to an external system, user, or memory. For example, the transceiver 3615 may include an interface with a display, a printer, a speaker, and the like. In an exemplary embodiment, the transceiver 3615 may include an alarm / indicator light, a network interface, a disk drive, a computer memory device, and the like. In an exemplary embodiment, the transceiver 3615 may receive information from an external system, user, memory, and the like.

In an exemplary embodiment, user interface 3620 is configured to receive and / or provide information from a user. The user interface 3620 may be any suitable user interface. User interface 3620 may be an interface for receiving user input and / or machine instructions for input to computing device 3600. The user interface 3620 includes a keyboard, a stylus and / or a touch screen, a mouse, a trackball, a keypad, a microphone, voice recognition, motion recognition, a disk drive, a remote controller, an input port, one or more buttons, dials, joysticks, , But are not limited to, allowing an external source, such as a user, to input information to the computing device 3600. The user interface 3620 can be used to navigate menus, adjust options, adjust settings, adjust display, and the like.

The user interface 3620 may be configured to provide an interface for providing information from the computing device 3600 to external systems, users, memory, and the like. For example, the user interface 3620 may include an interface for a display, a printer, a speaker, an alarm / indicator light, a network interface, a disk drive, a computer memory device, and the like. The user interface 3620 may include a color display, a cathode ray tube (CRT), a liquid crystal display (LCD), a plasma display, an organic light emitting diode (OLED) display,

In an exemplary embodiment, the power source 36236 is configured to provide power to one or more elements of the computing device 3600. In some embodiments, the power source 3625 includes an alternating current source such as an available line voltage (e.g., 60 Hz to 120 volts alternating current in the United States). The power source 3625 may include one or more transformers, rectifiers, etc., for converting power into power usable by one or more elements of the computing device 3600, such as 1.5 volts, 8 volts, 12 volts, 24 volts, The power source 3625 may include one or more batteries.

A method for solving natural sensor ambiguity for DNV direction finding applications

Natural ambiguity of NV-centered magnetic sensor system

The NV central magnetic sensor operating as described above can decompose the magnetic field into an unsigned vector. As shown in FIG. 37, due to the symmetry of the peaks for the ms = -1 and ms = +1 spin states around the zero-splitting photon energy, the structure of the DNV material is neglected for the positive and negative magnetic fields acting on the DNV material To produce a measured fluorescence spectrum as a function of the same RF frequency. The symmetry of the fluorescence spectrum makes the allocation of sign for the calculated magnetic field vector unreliable. The natural ambiguity introduced into the magnetic field sensor is undesirable in some applications, such as magnetic field based direction sensing.

In some situations, real-world conditions allow the intelligent assignment of codes to unsigned magnetic field vectors determined from the above-described fluorescence spectra. If a known bias magnetic field is used much more than the signal, the sign of the magnetic field vector can be determined by the total magnetic field, the accumulation of the bias magnetic field and whether the signal increases or decreases. When a magnetic sensor is used to detect a submarine on a surface ship, it is meaningless to assign a submarine located on the ground line to the detected magnetic field vector. Alternatively, if the sign of the vector is not significant, the sign may be arbitrarily assigned to the unsigned vector.

It is possible to use the DNV magnetic field sensor to unambiguously determine the magnetic field vector. The method of determining the signed magnetic field vector may be performed with a DNV magnetic field sensor of the type shown in FIG. 6 and described above. In general, restoration of vectors is described in co-pending United States patent application entitled " APPARATUS AND METHOD FOR RECOVERY OF THREE DIMENSIONAL MAGNETIC FIELD FROM A MAGNETIC DETECTION SYSTEM ", filed on January 21, 2016, Can be achieved as described in patent application number / ______.

As shown in Fig. 2, the energy levels of m _s = -1 and ms = +1 spin states are different. For this reason, the relaxation time from excited triplet state 3E to excited intermediate single state A for electrons with m _s = -1 and m _s = +1 spin states is not the same. The difference in relaxation time for electrons in the m _s = -1 and m _s = +1 spin states is about picoseconds or nanoseconds. The pulsed RF excitation can be used to measure the difference in relaxation time for electrons with m _s = -1 and m _s = +1 spin states, so that an imbalance in relaxation time accumulates over many electron cycles, It is possible to generate the difference in relaxation time in about microseconds.

As described above, the application of RF excitation to the DNV material produces a decrease in fluorescence intensity at the resonant RF frequency for m _s = -1 and m _s = +1 spin states. For this reason, at RF frequencies that excite electrons to m _s = -1 and m _s = +1 spin states, the equilibrium fluorescence intensity will be lower than the equilibrium fluorescence intensity in the absence of applied RF excitation. The time taken to transition from equilibrium fluorescence intensity without RF excitation to equilibrium fluorescence intensity with application of RF excitation can be used to calculate "equilibrium time &quot;.

As used herein, "equilibrium time" refers to the time between the start of the RF excitation pulse and when a predetermined percentage of the equilibrium fluorescence intensity is achieved. The predetermined amount of equilibrium fluorescence in which the equilibrium time is calculated may be from about 20% to about 80% of the equilibrium fluorescence, for example about 30%, 40%, 50%, 60% or 70% of the equilibrium fluorescence. The equilibrium times shown in Figures 38, 40 and 41 are actually attenuation times because the fluorescence intensity actually decreases in the presence of the RF excitation, but reversed for clarity.

As shown in Figure 38, the fluorescence intensity of the DNV material varies with the application of the pulsed RF excitation source. When the RF pulse is in the "on" state, the electrons collapse through the non-fluorescent path and a relatively dark equilibrium fluorescence is achieved. When the pulse is in the "off" state, there is relatively bright fluorescence without RF excitation. The transition between the two fluorescence equilibrium states is not instantaneous and measurement of the equilibrium time at a predetermined value of fluorescence intensity provides a repeatable indication of the relaxation time for electrons at the RF excitation frequency.

The difference in relaxation times between electrons in the m _s = -1 and m _s = +1 spin states can be measured due to the different RF excitation resonant frequencies for each spin state. As shown in FIG. 39, the fluorescence intensity spectrum of the DNV material measured as a function of the RF excitation frequency comprises four Lorentz pairs, with a pair for each crystal plane of the DNV material. The peak of the Lorentz pair corresponds to m _s = -1 and m _s = +1 spin state. By evaluating the equilibrium time for each peak in the Lorentz pair, a peak corresponding to a higher energy state can be identified. The higher energy peak provides a reliable indication of the sign of the magnetic field vector.

The Lorentz pair of fluorescence spectra located farthest from the zero-split energy can be selected to calculate the equilibrium time. This peak includes minimal signal interference and noise, allowing for more reliable measurements. A preferred Lorentz pair is boxed in Fig.

A plot of fluorescence intensity for a single RF pulse as a function of time is shown in FIG. The frequency of the pulse RF excitation is selected as the maximum value for each peak of the Lorentz pair. The other conditions for equilibrium time measurement for each peak of the Lorentz pair remain constant. As shown in FIG. 41, the peak of the Lorentz pair has an equilibrium time when it is calculated as 60% of the distinguishable equilibrium intensity value. The RF pulse duration may be set such that a desired percentage of the balanced fluorescence intensity is achieved for each "on" portion of the pulse and a complete "bright"

The equilibrium fluorescence intensity upon application of RF excitation can be set in any suitable manner. According to some embodiments, the RF excitation can be maintained until the intensity is constant, and a constant intensity can be regarded as the equilibrium intensity value used to calculate the equilibrium time. Alternatively, the equilibrium intensity can be set to the intensity at the end of the RF excitation pulse. According to another embodiment, the attenuation constant can be calculated based on the theoretical data feet used to determine the measured fluorescence intensity and equilibrium intensity values.

The peak of the Lorentz pair representing a higher measured equilibrium time is associated with a higher energy level of the electron spin state. For this reason, the peak of the Lorentz pair having a longer equilibrium time is assigned to the m _s = +1 spin state, and the other peak of the Lorentz pair is assigned to the m _s = -1 spin state. The sign of the peak of another Lorentz pair is assigned in the fluorescence spectrum of the DNV material as a function of the RF frequency, and a signed magnetic field vector can be calculated.

To demonstrate that the equilibrium time of each peak in the Lorentz pair actually varies along the direction of the magnetic field, the equilibrium time for a single peak in the Lorentz pair was measured under positive and negative magnetic fields that would otherwise be equivalent. As shown in Figure 42, a practical and measurable difference in equilibrium time was observed between the opposite bias fields.

A method of determining the sign of the magnetic field vector with the DNV magnetic sensor described in this specification can be performed with the DNV magnetic field sensor shown in Fig. No additional hardware is required.

The controller of the magnetic field sensor can be programmed to determine the position of the peak in the fluorescence spectrum of the DNV material as a function of the RF frequency. The equilibrium time for the peak of the Lorentz pair farthest from the zero field energy can be calculated. The controller can be programmed to control the optical excitation source to provide pulsed RF excitation energy by controlling the RF excitation source and also excite the DNV material with a continuous wave optical excitation. The resulting optical signal received at the optical detector may be analyzed by the controller to determine the equilibrium time associated with each peak in the manner described above. The controller can be programmed to assign a sign to each peak based on the measured equilibrium time. A peak with a larger measured equilibrium time can be assigned a ms = +1 spin state.

The method of assigning a sign to the magnetic field vector described above can also be applied to a magnetic field sensor based on a self-optically deficient core material other than DNV.

The DNV magnetic field sensor described herein for generating a magnetic field vector having a sign may be particularly useful in applications where the direction of the measured magnetic field is critical. For example, DNV magnetic field sensors can be used in magnetic field based navigation or positioning systems.

Hydrophone

43A and 43B are views showing a hydrophone system according to an exemplary embodiment. The exemplary system 4300 includes a hull 4305 and a magnetometer 4310. In alternative embodiments, additional, fewer, or other elements may be used. For example, a sound transmitter may be used to generate one or more acoustic signals. In an embodiment where a transmitter is not used, the system 4300 may be used as a passive sonar system. For example, the system 4300 can be used to detect sound produced by anything other than a transmitter (e.g., a ship, boat, engine, mammal, ice movement, etc.).

In an exemplary embodiment, hull 4305 is a hull of a vessel, such as a vessel or a boat. The hull 4305 can be any suitable material, such as steel or painted steel. In an alternative embodiment, the magnetometer 4310 is installed in an alternative structure such as a bulkhead or a part.

As shown in FIG. 43A, the magnetometer 4310 may be located within 4305. In an embodiment, the magnetometer 4310 is located on the outer surface of the hull 4305. In an alternative embodiment, the magnetometer 4310 may be located at any suitable location. For example, the magnetometer 4310 may be located near the center of the hull 4305, on the inner surface of the hull 4305, or on the inner or outer surface of the hull 4305.

In an exemplary embodiment, magnetometer 4310 is a magnetometer with a diamond having NV center. In an exemplary embodiment, magnetometer 4310 has a sensitivity of about 0.1 micro-tesla. In an alternative embodiment, the magnetometer 4310 has a sensitivity of greater or less than 0.1 micro tesla.

In the embodiment shown in Figure 43A, sonic wave 4315 propagates through a fluid having dissolved ions such as seawater. When the sound wave 4315 moves ions in the fluid, the ions generate a magnetic field. For example, as the ions move within the Earth's magnetic field, the ions produce a magnetic field that can be detected by the magnetometer 4310. In another embodiment, a magnetic field source such as a permanent magnet or an electromagnet may be used. The movement of ions to the source of a magnetic field (e.g., the earth) produces a magnetic field that can be detected by the magnetometer 4310.

In an exemplary embodiment, the sound waves 4315 travel through the seawater. The density of dissolved ions in the fluid near the magnetometer 4310 depends on where the magnetometer 4310 is located in the ocean. For example, some sites have a lower dissolved ion density than other sites. The higher the density of the dissolved ions, the larger the combined magnetic field produced by the movement of the ions. In an exemplary embodiment, the intensity of the combined magnetic field can be used to determine the density of the dissolved ions (e.g., the salinity of the seawater).

In an exemplary embodiment, hull 4305 is a hull of a ship moving through seawater. As described above, the movement of the ions relative to the source magnetic field can be measured by the magnetometer 4310. Thus, the magnetometer 4310 can be used to detect and measure the sound wave 4315 when the magnetometer 4310 moves through the sea water and when the magnetometer 4310 is fixed to the sea water.

In an exemplary embodiment, the magnetometer 4310 may measure a magnetic field caused by ions moving in any suitable direction. For example, the magnetometer 4310 can measure the magnetic field caused by the movement of the ions when the sound waves 4315 are perpendicular to the hull 4305 or at any other suitable angle. In some embodiments, the magnetometer 4310 measures the magnetic field caused by the movement of the ions caused by the sound waves 4315 parallel to the surface of the hull 4305.

Exemplary system 4350 includes hull 4305 and magnetometer array 4355. In alternative embodiments, additional, fewer, and / or different elements may be used. For example, FIG. 43B shows that four magnetometers 4355 are used. In an alternative embodiment, system 4350 may include less than four magnetometers 4355 or more magnetometers 4355. The array of magnetometers 4355 may be used to increase the sensitivity of the hydrophone. For example, by using multiple magnetometers 4355, the hydrophone has multiple measurement points.

Magnetometer array 4355 may be arranged in any suitable manner. For example, the magnetometers 4355 may be arranged in a row. In another example, the magnetometer 4355 may be arranged in a circle, a concentric circle, a grid, or the like. The magnetometer arrays 4355 may be uniformly arranged (e.g., the same distance from one another) or non-uniformly arranged. Magnetometer array 4355 can be used to determine the direction in which sound waves 4315 travel. For example, sonic waves 4315 may be generated by ionizing near the lower magnetometers of the magnetometers 4355 of the embodiment shown in system 4350 such that sonic waves 4315 produce a magnetic field before causing ions near the upper magnetometers of magnetometer 4355. [ Can be generated. Therefore, it can be determined that the sound wave 4315 moves up and down in Fig. 43B.

In an exemplary embodiment, the magnetometer 4310 or magnetometer 4355 can determine the angle at which the sound wave 4315 travels relative to the magnetometer 4310 based on the direction of the magnetic field caused by the movement of the ions. For example, the individual magnetometers of the magnetometer 4355 may be configured to measure the magnetic field of the ions in different directions. The principle of beamforming can be used to determine the direction of the magnetic field. In an alternative embodiment, any suitable magnetometer 4310 or magnetometer 4355 may be used to determine the direction of the magnetic field and / or the direction of the acoustic signal.

Self-navigation method and system using power grid and communication network

In some embodiments, methods and configurations for diamond nitrogen-vacancy (DNV) self-navigation through power transmission and distribution lines are disclosed. Characteristic self - signature of human infrastructure provides context for navigation. For example, power lines with distinctive self-signatures can serve as roads and highways for mobile platforms (e.g., UAS). Movement at relatively short distances to the power line can allow for confidential transitions, provide the potential to power the mobile platform itself, and allow point-to-point navigation at both long and local routes.

Some implementations may include one or more magnetic sensors, a self-navigating database, and a feedback loop to control UAS position and orientation. DNV magnetic sensors and related systems and methods can provide high sensitivity magnetic field measurements. DNV magnetic systems and methods can also be low cost, space, weight and power (C-SWAP) and offer fast stabilization time benefits. The DNV magnetic field measurement allows the UAS system to align with the powerline and move quickly along the powerline infrastructure route. This solution enables navigating in poor visibility conditions and / or GPS rejected environments. This self-navigation permits operation of the UAS in close proximity to the power line to facilitate covert transition. DNV-based magnetic systems and methods can be about 100 times smaller than existing systems and can have reaction times as fast as 100,000 times faster than other systems.

Figure 44 is a diagram illustrating an example of a UAS 4402 voyage along power lines 4404, 4406, and 4408 in accordance with some implementations of the present technique. The UAS 4402 can be used as a road and highway in the UAS 4402 without prior knowledge of the route magnetic characteristics by utilizing the unique magnetic signature of the navigation power line. 45A, the signal intensity ratios of the two magnetic sensors A and B (4410 and 4412 in FIG. 44) attached to the wings of the UAS 4402 correspond to the three line power transmission line structures 4404, 4406, 4408 as a function of distance x from the centerline of the example. When the ratio is near 1 (4522), UAS 4402 is centered on the power transmission line structure and x = 0 at point 4520.

(B-field) 4506 from all (3) wires shown in Figure 45B. This field is an example of the magnetic field strength measured by one or more magnetic sensors of the UAS. In this example, the peak of the field 4508 corresponds to the UAS 4402 located above the location of the midline line 4406. When UAS 4402 has two magnetic sensors, the sensor reads the intensity corresponding to points 4502 and 4504. Computing systems on the UAS or remotely on the UAS can compute combined readings. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations in the arrangement and type of components can be made and additional components, different components or fewer components can be provided.

As an example of some implementations, a vehicle such as a UAS may include one or more navigation sensors such as a DNV sensor. The mission of the vehicle is to travel to the initial destination and return to the final destination if possible. The known navigation system can be used to navigate the vehicle to an intermediate position. For example, a UAS can fly using GPS and / or man-controlled voyages as an intermediate location. The UAS can then start looking for a self-signature on a power source, such as a power line. To locate the powerline, the UAS can use the DNV sensor to perform measurements continuously. The UAS can fly in a circle, straight line, curved pattern, etc., and can monitor the recorded magnetic field. The magnetic field can be compared to known characteristics of the power line to identify if the power line is near the UAS. For example, the measured magnetic field may be compared to known magnetic field characteristics of the power line to identify the power line that produces the measured magnetic field. Information about the electrical infrastructure can also be used in combination with the measured magnetic field to identify the current source. For example, a database of magnetic measurements from previously recorded and recorded areas can be used to compare current readings to help determine the location of the UAS.

In some implementations, if the UAS identifies a powerline, the UAS is located at a known height and location relative to the powerline. For example, if a UAS follows a powerline, the magnetic field reaches its maximum and then begins to decrease as the UAS moves away from the powerline. After sweeping a known distance once, the UAS can return to the strongest point of the magnetic field. Based on the known characteristics of the power line and magnetic readings, the UAS can determine the type of power line.

Once the current source is identified, the UAS may change the height until the magnetic field is at a known reserve corresponding to the height above the identified power line. For example, as shown in FIG. 6, the magnetic field strength can be used to determine the height above the current source. The UAS can also be positioned offset directly above the power line using the measured magnetic field. For example, once the UAS is positioned above the current source, the UAS can move laterally from the current source to the offset position. For example, a UAS can travel 10 kilometers to the left or right of a current source.

The UAS may be programmed via the computer 306 to the flight path. In some implementations, once the UAS is located, the UAS can use the flight path to reach the destination. In some implementations, the magnetic field generated by the transmission line is perpendicular to the transmission line. In some implementations, the vehicle will fly perpendicular to the detected magnetic field. In one example, the UAS can follow the detected power line to its destination. In this example, the UAS will attempt to keep the detected magnetic field close to the original magnetic field value. To this end, the UAS can be moved laterally to change the elevation or maintain its position relative to the power line. For example, an elevated power line causes the intensity of the detected magnetic field to increase as the distance between the UAS and the power line decreases. The navigation system of the UAS can detect this increased magnetic intensity and increase the height of the UAS. The instrument panel of the aircraft can also provide a height indication of the UAS. The navigational system may also move to the side of the UAS to keep the UAS in place relative to the power line.

The magnetic field may become weaker or stronger as the UAS drifts away from its position in the transmission line. If a change in the magnetic field is detected, the navigation system can make an appropriate correction. For a UAS with only a single DNV sensor, if the magnetic field decreases by more than a predetermined amount, the navigation system can correct it. For example, a UAS may have an error budget such that the UAS attempts to correct the process if the measured error is greater than the error budget. If the magnetic field decreases, the navigation system can direct the UAS to move to the left. The navigation system continuously monitors the magnetic field. Move to the left to see if the error has been corrected. As the magnetic field further decreases, the navigation system may instruct the UAS to fly right to its original position with respect to the current source and then move further to the right. As the strength of the magnetic field decreases, the navigation system can infer that the UAS needs to reduce the height to increase the magnetic field. In this example, the UAS originally flows directly through the current source, but since the current source is at a lower height, the distance between the current source and the UAS has increased. Using a magnetic field feedback loop, the navigation system can center the UAS or keep it at the offset of the current source. If the intensity of the magnetic field increases, the same analysis can be performed. Navigation is. The measured magnetic field can be maneuvered until the UAS is in the appropriate range to be within the flight path.

The UAS may also use vector measurements from one or more DNV sensors to determine course calibration. The reading of the DNV sensor is a vector representing the direction of the sensed magnetic field. Once the UAS knows the location of the powerline as the sensor magnetic field decreases in size, the vector can provide an indication of the direction the UAS should move to correct that direction. For example, the intensity of the magnetic field can be reduced by a threshold value at an ideal position. The magnetic vector of this magnetic field can be used to indicate the direction that the UAS should correct to increase the strength of the magnetic field. In other words, the magnetic field represents the direction of the magnetic field, and the UAS can use this direction to determine the precise direction needed to increase the strength of the magnetic field, which can correct the flight path of the UAS to return to the transmission wire.

Using multiple sensors in a single vehicle. The required amount of maneuver can be reduced or the steering can be completely eliminated. The navigation system may use the measured magnetic field at each of the plurality of sensors to determine if the UAS needs to be moved left, right, up or down to correct the course. For example, if both DNV sensors read a stronger magnetic field, the navigation system could direct the UAS to raise the altitude. As another example, if the left sensor is stronger than expected, but the right sensor is weaker than expected, the navigation system may move the UAS to the left.

In addition to the current readings from one or more sensors, the recent history of readings may also be used by the navigation system to identify how to correct the UAS course. For example, if the intensity of the right sensor is slightly increased and then decreased, the left sensor is decreasing, while the navigation system can then determine that the UAS can move away to the left of the flight path to correct the position of the UAS.

46 shows a high-level block diagram of an example of a UAS navigation system 4600 in accordance with some implementations of the present technique. In some implementations, the UAS navigation system of the present technique includes a plurality of DNV sensors 4602a, 4602b, 4602c, a navigation database 4604, and a feedback loop that controls the location and orientation of the UAS. In another implementation, the vehicle may include a navigation control used to navigate the vehicle. For example, the navigation control unit can change the direction, height, speed, etc. of the vehicle. DNV magnetic sensors 4602a through 4602c have high sensitivity to magnetic fields, low C-SWAP, and fast settling times. The DNV magnetic field measurement allows the UAS to align with the power line through the characteristic magnetic field signal and move quickly along the power line path. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations in the arrangement and type of components can be made and additional components, different components or fewer components can be provided.

Figure 47 shows an example of a power line infrastructure. It is known that a wide range of power line infrastructures as shown in Fig. 47 connects cities, critical power system elements, homes and businesses. The infrastructure may include overhead and buried power distribution lines, transmission lines, railway lines and third rail power lines and underwater cables. Each element has a unique electromagnetic and spatial signature. It is understood that, unlike the electric field, the self signature is minimally affected by the artificial structure and electrical shielding. It is understood that certain elements of the infrastructure have distinct magnetic and spatial signatures, and discontinuities, cable deflection, power consumption, and other factors create variations of the self signature that can be exploited.

48A and 48B show examples of magnetic field distributions for overhead power lines and underground power cables. Ground and buried power cables all emit magnetic fields, which, unlike electric fields, are not easily blocked or shielded. Natural earth and other magnetic field sources created by others can provide approximate values of absolute location. However, the sensitive magnetic sensor described herein can place a powerful artificial magnet source, such as a power line, at considerable distances. As the UAS moves, measurements are used to indicate the spatial structure of the magnetic source (point source, line source, etc.), so that the power line can be identified as such. Further, once the UAS is detected, it can be guided to the power line through the magnetic intensity. Once the position of the power line is determined, its structure is determined and the power line path follows and the characteristic is compared with the magnetic way point to determine the absolute location. Fixed power lines can provide precise location criteria because pole and tower locations and relative locations are known. A compact onboard database can provide reference signature and location data for waypoints. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations in the arrangement and type of components can be made and additional components, different components or fewer components can be provided.

Figure 49 shows an example of the magnetic field strength of a power line as a function of distance from the centerline and shows that even a low current distribution line can be detected up to a distance exceeding 10 km. It is understood here that the DNV sensor provides 0.01 μT sensitivity (1e-10T) and the modeling results indicate that a high current transmission line (eg with 1000A to 4000A) can be detected at thousands of kilometers or more. These powerful magnetic sources allow the UAS to direct itself to a power line that can be aligned using the localized relative magnetic field intensity and the characteristic pattern of the power line configuration, as described below.

50 shows an example of a UAS 5002 equipped with DNV sensors 5004 and 5006. Fig. 51 is a plot of the measured differential magnetic field sensed by the DNV sensor when approaching the power line. Although powerline detection can be performed with only a single DNV sensor, precise alignment for composite wire configuration can be achieved using multiple wire sensors. For example, differential signals can eliminate the effects of day and seasonal variations in magnetic field strength. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations in the arrangement and type of components can be made and additional components, different components or fewer components can be provided.

In various other implementations, the vehicle may also be used to inspect transmission lines, power lines, and power utility equipment. For example, the vehicle may include one or more magnetic sensors, a magnetic waypoint database, and an interface to UAS flight control. The technology can take advantage of the high sensitivity to the magnetic field of the DNV magnetic sensor for magnetic field measurements. DNV magnetic sensors also offer the advantages of low cost, space, weight and power (C-SWAP) and fast settling time. The DNV magnetic field measurement allows the UAS to align with the power line, move quickly along the powerline route, and navigate in harsh visibility and / or GPS rejection environments. It is understood that the DNV-based magnetic sensor is about 100 times smaller than the conventional magnetic sensor and has about 100,000 times faster response time than the sensor with similar sensitivity to the EMDEX LLC Snap portable magnetic field measuring device.

The fast settling time and low C-SWAP of the DNV sensor enable rapid measurement of detailed power line characteristics from low C-SWAP UAS systems. In one or more implementations, power lines can be routinely metered over long distances through small unmanned aerial vehicles (UAVs), which can identify problems and issues arising from automated field anomaly identification. In another implementation, land vehicles or submarines may be used to inspect power lines. The personnel inspector does not need to perform an initial inspection. The inspection of this technique is quantitative and thus can be a remote video solution and is therefore not subject to human interpretation.

52 shows an example of a measured magnetic field distribution for a power line with power line 904 and an ideal 902 according to some implementations. The peak value of the measured magnetic field distribution for a normal power line is near the center line (e.g., d = 0). The inspection method of the present technology is a high speed anomaly mapping technique that can be used in single and multiple wire transmission systems. This solution can leverage existing software modeling tools to analyze inspection data. In one or more implementations, data from a normal set of power lines may be used as a comparison criterion for data due to inspections of other power lines (e.g., having anomalies or defects). Damage to the wire and support structure changes the nominal magnetic field characteristic and is detected by comparison with the nominal magnetic field feature of the normal set of power lines. It is understood that magnetic field measurements are minimally affected by other structures such as buildings, trees, and the like. Thus, the measured magnetic field can be compared to data from the normal set of power lines and the magnitude of the measured magnetic field, and if there is a difference from the predetermined threshold, the presence of the above can be indicated. Moreover, vector readings between difference data are also compared. Or more.

In some implementations, the vehicle may need to avoid an object in its navigation path. For example, a ground vehicle may need to maneuver around a person or object, or a flight vehicle may need to avoid building or powerline equipment. In this implementation, the vehicle may be equipped with a sensor used to locate an avoidable obstacle. Systems such as camera systems, focus arrays, radar, acoustic sensors and the like can be used to identify obstacles in the vehicle path. Navigation systems can identify path corrections to avoid identified obstacles.

Synthesis of diamond-like diamond with NV center QC  Measurement parameters for the method

Measuring the quantum energy level of a diamond nitrogen vacancy (DNV) material can provide information about the quality of the material, such as the suitability of the DNV material for use in magnetic field sensors. The impurity content, lattice strain and nitrogen vacancy (NV) concentration of the DNV material affect the quantum energy level of the DNV material. Thus, measuring the quantum energy level of a DNV material provides information about the impurity content, lattice strain, and NV content of the DNV material.

Characterization of DNV materials

Characterization of the DNV material can be achieved by measuring a number of parameters associated with the fluorescence activity described above. For example, DNV metrology can be performed by measuring various parameters associated with the zero-field-division (ZFS) of the DNV dipole coupling and the ultrafine coupling of the DNV material. The measurement of these parameters allows for the evaluation of diamond impurities. Examples of impurities are lattice dislocations, broken bonds and other elements in excess of 14-nitrogen. Measurement of these parameters can provide additional insight into DNV-centric concentrations. The impurity and excess DNV concentration directly affect the ultrafine resolution. Lattice dislocations and crystalline strains can affect ZFS levels by introducing asymmetry that destroys the degeneracy of the state. The evaluation performed by the measurement can be carried out in a reasonably short period of time and provides sufficient depth of information so that the quality of the DNV material can be verified. Such quality assurance (QA) assessments are desirable when evaluating and comparing various DNV suppliers or when verifying the properties of DNV materials.

The characterization of the DNV sample involves the measurement of the quantum properties of the sample. ZFS parameters are derived with specific precision for the DNV system in Hamilton (energy mathematical formulas). Hamilton can be expressed as:

+

+

+

+

+

+

here

,

, 및

이라는 용어의 측정은 DNV 제조 공정의 반복성 및 품질에 대한 중요한 통찰력을 제공한다.The Zeeman term refers to the interaction of the external magnetic field and the spin center.

,

, And

Is an important insight into the repeatability and quality of the DNV manufacturing process.

A schematic diagram of the energy level of DNV Hamilton is shown in FIG. 53, various separations of DNV ground state levels and energy levels due to different bonds such as dipole bonds (E = 0 and E > 0), ultrafine bonds and quadrupole bonds are shown.

, , 및

라는 용어는, 해밀턴 방정식으로부터

,

, 및

라는 용어가 DNV의 에너지 레벨을 결정하는 측정 가능한 양이기 때문에 DNV 제조 프로세스의 반복 가능성 및 품질에 대한 통찰력을 제공한다. NV 중심에 할당된 DNV 기준 프레임에서,

텐서는 다음과 같이 표현될 수 있다:

, , And

The term &quot; Hamiltonian &quot;

,

, And

Provides insight into the repeatability and quality of the DNV manufacturing process because the term is a measurable quantity that determines the energy level of DNV. In the DNV reference frame assigned to the NV center,

The tensor can be expressed as:

Where the parameter D is the ZFS amount. D generally has a value of ~ 2.870 GHz. The parameter E is an additional symmetric breakdown term and can be of the order of a few megahertz. Combining these two parameters provides information on the degree of deformation in the diamond grating. 54 is a diagram illustrating an example of a DNV fluorescence signal as described above without an applied bias field (zero Gaussian bias). The parameters E and D can be derived from the measured frequencies (v ₁ and v ₂ ) of the DNV optical signal of Figure 54 according to the following equation:

,

,

.

.

The measured frequencies (v ₁ and v ₂ ) of the DNV signal may be considered to be the location of the Lorentz peak in the DNV optical signal, as shown in FIG.

Continuous wave (CW) laser pumping and continuous wave (CW) radio frequency (RF) can be used for excitation of DNV samples in the absence of an applied bias magnetic field, to generate a fluorescent signal of the DNV material. The RF signal can be swept from ~ 2.8 GHz to 2.95 GHz to observe the fluorescence signal shown in Figure 54. [

텐서는 도 55에 도시된 초미세 분할과 연관된다. 초미세 값의 식별과 측정은 DNV 샘플의 순도와 N/NV의 농도에 관한 정보를 제공한다. 또한, 도 55 및 도 56은 1 가우스 자기 바이어스 자기장 하에서 각각 고품질 DNV 샘플 및 저품질 DNV 샘플에 대한 DNV 형광 신호를 도시하는 도면이다. 초미세 레벨의 장소는 DNV 샘플에서 ¹⁵N, ¹⁴N 및 ¹³C의 동위 원소의 존재를 나타낼 수 있다. 자연 동위 원소(¹⁴N)는 도 55에 도시된 바와 같이 쌍극 에너지 레벨에 대해 약 +2.5 MHz, 0 MHz 및 -2.5 MHz의 알려진 레벨을 갖는다. 도 55에서 알 수 있듯이, 실온에서 초미세 레벨을 분해하는 능력은 DNV 샘플의 고순도를 나타낸다. 고순도 DNV 샘플은 DNV 샘플을 극저온으로 냉각시키지 않으면서 초미세 레벨을 분해하도록 할 수 있다. 낮은 순도 또는 높은 N/NV 농도를 갖는 샘플은 도 56에 도시된 바와 같이, 초미세 피크를 분해할 수 없도록 효과적으로 흐리게 한다. 초미세 레벨을 분해할 수 없다는 것은 낮은 순도 또는 높은 결함의 DNV 샘플의 표시이다.Hamilton

The tensor is associated with the ultrafine segmentation shown in FIG. Identification and measurement of ultrafine values provides information on the purity of the DNV sample and the concentration of N / NV. 55 and 56 are diagrams showing DNV fluorescence signals for a high-quality DNV sample and a low-quality DNV sample under 1 Gauss self-bias magnetic field, respectively. Ultra-fine level locations may indicate the presence of ¹⁵ N, ¹⁴ N and ¹³ C isotopes in DNV samples. The natural isotope ¹⁴ N has a known level of about + 2.5 MHz, 0 MHz and -2.5 MHz for the bipolar energy level, as shown in FIG. As can be seen in Figure 55, the ability to decompose ultrafine levels at room temperature represents the high purity of the DNV sample. A high purity DNV sample can cause the DNV sample to decompose at ultra-fine levels without cooling to a cryogenic temperature. A sample with low purity or high N / NV concentration effectively diminishes the ultrafine peaks so that they can not decompose, as shown in FIG. Failure to disassemble ultrafine levels is an indication of low purity or high defect DNV samples.

To determine the presence of ultrafine resonance, a small biasing magnetic field is applied to the DNV sample along with continuous wave (CW) laser pumping and CW RF excitation. In some implementations, the RF power can be advantageously adjusted to the lowest possible setting while still obtaining a measurable resonance. The RF signal can be swept from ~ 2.8 GHz to 2.95 GHz to observe the fluorescence signal shown in FIG. This used a 1 Gauss magnetic field. The applied bias magnetic field for identifying and measuring the hyperfine segment can be any suitable bias magnetic field, such as at least about 1 Gauss or about 30 Gauss.

6 is a schematic diagram of an NV center sensor 600 in accordance with some embodiments. The sensor 600 includes a light excitation source 610 that directs optical excitation to an NV diamond material 620 having an NV center. An RF excitation source 630 provides RF radiation to the NV diamond material 620. The NV excitation sensor 600 may include a bias magnetic field source 670, such as a permanent magnet or electromagnet, which applies a bias magnetic field to the NV diamond material 620. Light from the NV diamond material 620 may be directed to the optical detector 650 through an optical filter 650 and an electromagnetic interference (EMI) filter 660 that suppresses conducted interference. The sensor 600 further includes a controller 680 arranged to receive the optical excitation signal from the optical detector 640 and to control the optical excitation source 610 and the RF excitation source 630.

The RF excitation source 630 may be, for example, a microwave coil. The RF excitation source 630 is controlled to emit RF radiation into the photon energy that resonates with the transition energy between the base m _s = 0 spin state and the m _s = -1 spin state, as described above for FIG.

The optical excitation source 610 may be, for example, a laser or a light emitting diode that emits light into the green band. The light excitation source 610 induces fluorescence of the red diamond band NV diamond material corresponding to the electron transition from the excited state to the ground state. Light from the NV diamond material 620 is directed through the optical filter 650 to filter out the excitation band of light (e.g., in green), and successively filters the light of the red fluorescence band detected by the optical detector 640 The EMI filter 660 is disposed between the optical filter 650 and the optical detector 640 to suppress the conducted interference. The optical excitation light source 610 serves to reset the group of m _s = 0 spin states of base state ³ A ₂ to maximum polarization or other desired polarization in addition to exciting the fluorescence of NV diamond material 620 .

Controller 680 is arranged to receive the optical detection signal from optical detector 640 and to control optical excitation source 610 and RF excitation source 630. The controller may include a processor 682 and a memory 684 to control the operation of the optical excitation source 610 and the RF excitation source 630. Memory 684, which may include non-volatile computer readable media, may store instructions that cause the operation of optical excitation source 610 and RF excitation source 630 to be controlled.

According to some embodiments of operation, the controller 680 controls the operation such that the optical excitation source 610 continuously pumps the NV center of the NV diamond material 620. The RF excitation source 630 is controlled to continuously sweep across both ends of the frequency range including photon energy (when m _s = 占 1 spin states have the same energy) at 2.87 GHz. When the photon energy of the RF radiation emitted by the RF excitation source 630 is the difference of the energy of m _s = 0 spin state and m _s = -1 or m _s = +1 spin state, Is reduced in resonance as described above. In this case, the fluorescence intensity decreases when the RF energy resonates with an energy difference of m _s = 0 spin state and m _s = -1 or m _s = +1 spin state.

According to some embodiments, the NV center sensor 600 may function as a magnetic field sensor. As described above, the diamond material 620 will have an NV center aligned along the direction of the four different orientation classes, and the component (Bz) along each of the different orientations will have m _s = -1 and can be determined based on the difference in energy between m _s = 1 and spin state. However, in certain cases, it may be difficult to determine which energy partition corresponds to which orientation class due to energy overlap or the like. The bias magnetic field source 670 provides a uniform magnetic field on the NV diamond material 620, preferably to isolate energy for different orientation classes, so that it can be more easily identified. In this way, the component of the magnetic field Bz along the NV axis can be determined by the difference in energy between m _s = -1 and m _s = +1 spin states.

DNV Material Assessment System

Evaluation of the DNV material may be performed in a dedicated test system prior to incorporating the DNV material into the sensor system or after the DNV material has been incorporated into a sensor system such as a magnetic field sensor. Use of a dedicated test system allows the DNV material to be evaluated after production or upon receipt from the supplier. In this way, it can be ensured that the DNV material exhibits the desired properties before being incorporated into the device. The evaluation after incorporating the DNV material into the sensor system allows the status of the DNV material to be monitored throughout the lifetime of the sensor system. This arrangement allows the DNV material to be monitored and alerts the user if the DNV material is damaged or degraded to such an extent that the accuracy or operation of the sensor system is negatively affected.

A dedicated test system for evaluation of the DNV material may include features of the NV sensor system shown in FIG. 6 and described above. As described above, the zero field division (ZFS) amount of the DNV material is measured in the absence of an external magnetic field. For the measurement of the amount of ZFS, the bias magnetic field source 670 may be omitted from the sensor system. Alternatively, when measuring the amount of ZFS, a switchable bias magnetic field source 670, such as an electromagnet, may be used in the off state. Magnetic shielding can be included in the sensor system to reduce or eliminate the magnetic field acting on the DNV material during the measurement of the amount of ZFS.

The test system may include a controller of the type shown in FIG. The controller can be programmed to control the optical excitation source and the RF excitation source to produce a fluorescence signal at the optical detector. The controller is also programmed to determine the amount of ZFS, D and E from the fluorescence signal received by the optical detector in the manner described above. During the measurement of the amount of ZFS, D and E, a magnetic bias magnetic field is not applied to the DNV material.

The test system may include an automated system for placing the DNV material in the test system. The automation system may include any component capable of placing the DNV material in the test system. Alternatively, the test system can be configured so that the user can place the DNV samples in the test system.

As described above, the amounts of ZFS, D and E provide insights into the deformation of the crystal lattice of the DNV material. The controller can be programmed to determine the degree of deformation in the crystal lattice of the DNV material based on the measured ZFS amount, D and E. Determining the degree of deformation in the crystal lattice may include comparing the measured amount of ZFS, D and E to a predetermined threshold value stored in the controller &apos; s memory. It is determined that the degree of deformation of the crystal lattice of the DNV material is acceptable if the measured ZFS amount, D and E, are within the range specified by the threshold value.

The amounts of ZFS, D and E also provide insights into the concentration of crystal lattice defects present in the DNV material. The controller can be programmed to determine the concentration of crystal lattice defects in the crystal lattice of the DNV material based on the measured ZFS quantities, D and E. Determining the concentration of crystal lattice defects in the crystal lattice may include comparing the measured ZFS quantities, D and E, with a predetermined threshold value stored in the controller &apos; s memory. If the measured amount of ZFS, D and E, is within the range specified by the threshold, the concentration of crystal lattice defects in the crystal lattice of the DNV material is determined to be acceptable. The threshold values for the ZFS quantities, D and E may be any suitable value associated with the DNV material representing the desired properties. For example, the threshold for D may be 2.5 to 5.5 MHz.

The controller can be programmed to determine whether ultrafine decomposition is possible in the fluorescence signal received at the optical detector when a magnetic bias is applied to the DNV material. The controller can be programmed to control the optical excitation source and the RF excitation source to produce a fluorescence signal at the optical detector. Furthermore, the controller may control the magnetic bias generator so that a magnetic bias magnetic field is applied to the DNV material. The self-bias magnetic field applied to the DNV material may be a small self-bias magnetic field, such as ~ 30 Gauss. The test system used to determine whether the ultrafine particles are resolvable may be the same test system used to measure the ZFS quantities, D and E. Alternatively, the test system used to determine whether the ultrafine particles are resolvable can be a test system different from the test system used to measure the ZFS quantities, D and E.

As described above, the ability to degrade ultrafine fluorescence in the fluorescence signal received at the optical detector provides insights as the concentration of NV centers and impurities in the DNV material. Ultrafiltration can be considered to be resolvable when it can measure the half maximum of the entire width from the fluorescence signal received at the optical detector to the ultrafine. The ability to decompose ultrafine particles indicates that the NV center and impurity concentrations of the DNV material are within an acceptable range. Impurities may be considered to include components in DNV materials that differ from their intended intent.

In some cases, the presence of ultrafine atoms other than those associated with the natural isotope ¹⁴ N shown in Figure 55 may indicate that additional impurity species are present in the DNV material. For example, ultrafiltration elsewhere in the fluorescence signal may indicate that ¹⁵ N and / or ¹³ C isotopes are present in the DNV sample. In general, the ability to degrade ultrafine particles in a fluorescent signal indicates that the DNV material has sufficient purity. According to some embodiments, when a high purity DNV material comprising ¹⁴ N and ¹² C is desired, the ¹⁵ N and ¹³ C isotopes are considered impurities. According to some other embodiments, ¹⁴ N and ¹³ C isotopes are considered impurities when a high purity DNV material comprising ¹⁵ N and ¹² C is desired.

Evaluation of the DNV material can be performed in the sensor system. For example, the controller of the DNV magnetic field sensor can be programmed to determine the amount of ZFS, D and E and to determine whether ultrafine particles can be analyzed as described above. The measured results of the ZFS quantities, D and E, can be compared with threshold values stored in the controller's memory. If the measured value is outside the desired threshold range, an error message may be communicated to the user of the sensor system. Similarly, if ultrafine particles can not be analyzed, an error message can be communicated to the user of the sensor system. The error message may be communicated to the user by appropriate means such as display, error light or wireless communication. The ability to decompose ultrafine particles can be considered to indicate that the NV center concentration in the DNV material and / or the impurity concentration in the DNV material is within a desired range. The ability to solve ultrafine particles represents a concentration of at least about one part per million.

Evaluation of the DNV material in the sensor system can be performed periodically. For example, the evaluation may be performed hourly or daily while the sensor is being used. Alternatively, evaluation of the DNV material may be performed when the sensor is moved or receives an event that may damage the DNV material. In this way, the evaluation of the DNV material can be performed throughout the lifetime of the sensor system. This allows the DNV material to provide acceptable performance during the life of the sensor system. If the DNV material exhibits deformation enhancement, crystal lattice defect concentration, impurity concentration or NV center concentration change, the performance of the sensor system may be adversely affected. The DNV material evaluation during the lifetime of the sensor system alerts the user to such an occurrence.

The result of the evaluation of the DNV material can be stored in the controller's memory. The stored evaluation results can be used to monitor trends in the properties of DNV materials over time. This information can provide insight into the potential future problems of DNV materials in the sensor system or can provide warnings about DNV material degradation. For example, an increase in the crystal lattice strain over time can indicate that the stress-induced breakdown of the DNV material is imminent.

The DNV evaluation systems and methods described herein are capable of performing rapid and non-destructive quality control testing on DNV materials. The system can have sufficient throughput to operate with the DNV sensor manufacturing line and provides sufficient information on the nature of the DNV material to ensure that the DNV material is suitable for use.

Closed loop processing apparatus and method for magnetic detection system

Hereinafter, an apparatus and a method for explaining an ultrafine transition response for determining an external magnetic field acting on a magnetic detection system will be described. The ultrafine transient response can exhibit a steep slope than the slope of the aggregate Lorentz response measured in conventional systems and can be up to three times as great. Thus, the ultrafine response can allow greater sensitivity when sensing changes in the external magnetic field. In a particular embodiment, the detection of the ultrafine response is used in closed loop processing to estimate the external magnetic field in real time. This can be accomplished by applying a compensation field through a magnetic field generator controlled by a controller that cancels the change in ultrafine response caused by changes in the external magnetic field. In closed loop processing, the controller continually monitors the ultrafine response and provides feedback to the magnetic field generator based on the computed estimated total magnetic field acting on the system so that the ultrafine response Which is the same as the vector component of the external magnetic field and the opposite sign. Which in turn provides a real-time calculation of the external magnetic field in the form of a reversed phase compensation field calculated. In addition, by fixing the ultrafine response in spite of changes in the external magnetic field, a smaller biasing magnetic field that separates the ultrafine response can be used to provide sufficient spacing for tracking purposes. The application of a smaller bias magnetic field reduces the frequency range required for the wireless excitation sweep and measurement circuitry, thus providing a more responsive and efficient system for determining the external magnetic field acting on the system.

Ultrafine field

As described above, the base states are divided by about 2.87 GHz between m _s = 0 and m _s = ± 1 spin states due to their spin-spin interaction, as shown in the energy level diagram of FIG. Also, due to the magnetic field, m _s = ± 1 spin states are divided in proportion to the magnetic field along a given axis of the NV center, which appears as the four pair Lorentz frequency response shown in FIG. However, the superfine structure of the NV center is due to the superfine bond between the NV center and the electron spin state of the nitrogen nuclei, which results in an additional energy partition of the spin state. Figure 8 shows the ultrafine structure of the NV centered triplet state triplet ( ³ A ₂ ). Specifically, the bond to the nitrogen nucleus ( ¹⁴ N) divides the m _s = ± 1 spin state into three ultrafine transitions (denoted m _I spin states), each with a different resonance. Thus, due to the ultra-fine resolution for each m _s = ± 1 spin state, twenty-four different frequency responses can be generated (for each of the four NV center orientations, m _s = ± 3 for each of the ± 1 spin states) Level split).

Each of the three ultrafine transitions appears within the width of one aggregate Lorentz dip. With appropriate detection, ultrafine transitions within a given Lorentzian response can be accounted for. To detect such ultrafine transitions, in certain embodiments, the NV diamond material 620 exhibits high purity (e. G., Low presence of lattice dislocations, broken bonds, or other elements above ¹⁴ N) . Further, in some embodiments, during operation of system 600, RF excitation source 630 is operated in a low power setting to further decompose the ultrafine response. In another embodiment, the concentration of the negative negative charge center of the NV is increased (e.g., in the range of about 20 to about 1000 mW / mm ² ) and the light output density is increased and sufficient ultra-fine readings To about 10 W / mm &lt; ² &gt;), additional optical contrast to the ultrafine response can be achieved.

)가 도시되어 있다. 도면에서 알 수 있는 바와 같이, 3개의 초미세 전이들(200a 내지 200c)은 완전한 로렌츠 응답(20)을 구성한다{예를 들어, 도 7의 로렌츠 응답(20)에 대응}. 그 다음, 최대 경사도 지점은 인가된 RF 주파수의 함수로서 형광 세기의 경사도를 통해 결정될 수 있고, 이것은 도 9의 지점(250)에서 발생한다. 이 최대 경사도 지점은 인가된 RF 스위프 동안 추적되어 주파수 스위프를 따라 최대 경사도 지점의 움직임을 검출할 수 있다. 총 로렌츠 응답에 대한 최대 경사도(25)의 지점과 같이, 지점(250)의 대응하는 이동은 총 입사 자기장{B_t(t)}의 변화에 대응하고, 이것은 알려진 및 일정한 바이어스 자기장(B_bias(t))로 인하여 외부 자기장(B_ext(t))의 변화를 검출한다.Figure 9 shows an example of fluorescence intensity as a function of applied RF frequency for NV center with ultrafine detection. In the upper graph, the magnitude response I (t) as a function of the applied RF frequency f (t) for a given spin state (e.g., m _s = -1) is represented by an external magnetic field. The lower graph also shows the slope plotted against the applied RF frequency f (t)

Are shown. As can be seen, the three ultrafine transitions 200a through 200c constitute a complete Lorentz response 20 (e.g., corresponding to the Lorentz response 20 of FIG. 7). The maximum slope point can then be determined through the slope of the fluorescence intensity as a function of the applied RF frequency, which occurs at point 250 in FIG. This maximum tilt point can be tracked during the applied RF sweep to detect movement at the maximum tilt point along the frequency sweep. The corresponding movement of point 250 corresponds to a change in the total incident magnetic field {B _t (t)}, such as the point of maximum slope 25 for the total Lorentz response, which is a known and constant bias magnetic field B _bias t)) to detect the change of the external magnetic field (B _ext (t)).

However, when compared to point 25, point 250 represents a greater slope than the above-described total Lorentz slope with respect to FIG. In some embodiments, the slope of point 250 may be up to 1000 times the total Lorentz slope of point 25. This allows point 250 and its corresponding movement to be more easily detected by the measurement system, resulting in improved sensitivity, especially in very low magnitudes and / or very rapidly varying magnetic fields.

Closed loop treatment of external magnetic field

As described above, the current method of determining the total incident magnetic field B _t (t) is to move the point of maximum gradient of the coherent Lorentz response {e.g., point 25 of the Lorentz dip 20 of FIG. 7) The fluorescence intensity is examined as an applied RF frequency function. Higher sensitivity can be achieved in this trace by fine tuning the measurement point to become a hyperfine transition. An example of an open loop or add-hock processing method for estimating the vector component of the total magnetic field (B _t (t)) on an NV centered magnetic sensor system is shown in FIG.

When in a zero magnetic field (ie, B _t (t) = 0), the Lorentz responses for each of the m _s = ± 1 spin states along the four axes of the NV center overlap at the same frequency (eg, about 2.87 GHz). A bias or control magnetic field (B _bias (t)) may be applied to pre-separate and space (e.g., equally) the eight Lorentz responses for tracking purposes. 6) and / or a second magnetic field generator (e.g., a three-axis Cartesian coordinate B _bias (t) Helmholtz), as shown in system 600 of FIG. 6, Coil system) 675 may be used to apply the desired bias magnetic field. The second magnetic field generator 675 is electrically connected to the controller 680 so that the magnetic field generated by the second magnetic field generator 675 can be controlled by the controller 680. [

57, during open loop processing, the sum of the external magnetic field B _ext (t) and the bias magnetic field B _bias (t), expressed as the total incident magnetic field B _t (t) Which acts on the magnetic sensor system 600 and which, in conjunction with the applied RF frequency f (t), results in a coherent Lorenz curve or a Lorentz superfine curve at the corresponding resonant frequency, as discussed in more detail above But it is linearly converted to the intensity response I (t) due to the effect (Z). Thereafter, processing is performed by the system controller 680 by operating on the Lorentz gradient to determine an estimate of the total incident magnetic field B (t). The total incident magnetic field can be expressed linearly as:

(One)

In Equation (1),? Represents a nitrogen vacancy self-rotation rate of about 28 GHz / T. The maximum slope or slope can be determined by the Jacobian operator at the critical frequency (f _c ), where the Lorentz aggregation or ultrafine slope is the largest:

(2)

The threshold frequency f _c is determined analytically based on the NV diamond material 620 incorporated into the sensor system and pre-stored in the controller 680 for processing purposes. Thus, the total incident magnetic field can be estimated according to the critical frequency:

(3)

)의 보다 정확한 추정을 얻을 수 있다.As can be seen from equations (1) to (3), the relationship between the actual total incident magnetic field B _t (t) and the estimated total incident magnetic field B _t (t) It is more accurate. Thus, by evaluating the critical frequency (f _c ) at the point of maximum slope of the ultrafine response that is not the point of greater inclination of the coherent Lorentz response, the total incident field

) Can be obtained.

(t))으로부터 알려진 바이어스 제어 자기장(B_bias(t))의 감산에 기초하여 외부 자계 벡터(B_ext(t))를 결정하기 위해 연속적인 추적에 의존한다. 그러나, 외부 자기장 벡터(B_ext(t))의 결정은 외부의 대역 내 및 손상 방해 자기장 또는 관련된 해밀턴 효과(예를 들어, 온도, 변형)로 인해 영향을 받을 수 있다. 더욱이, 상기 개방 루프 방법은 측정 동안 일정한 재교정 및 보상을 필요로 한다.At this point, however, calculating the difference in the effect of the bias magnetic field ( _Bbias (t)) and the external magnetic field (B _ext (t)) on the Lorentz response means that the total vector sum of the two magnetic fields is the total shift It is difficult to cause. Thus, the open-loop or add-hock method shown in FIG. 64 is based on the total estimated incident magnetic field

(B _ext (t)) based on subtraction of a known bias control magnetic field (B _bias (t)) from a known bias control magnetic field (B t (t)). However, the determination of the external magnetic field vector (B _ext (t)) can be influenced by an external in-band and an impairing interfering magnetic field or related Hamilton effect (e.g., temperature, strain). Moreover, the open-loop method requires constant recalibration and compensation during measurement.

)이 보상 자기장(B_comp(t))을 생성하기 위해 실시간으로 계산되도록 하고 제 2 자기장 발생기(675)를 통해 작동되도록 한다. 이 보상 자기장은 외부 자기장(B_ext(t))에 의한 RF 응답의 변화를 상쇄하여, 일정하고 고정된 형광 응답을 생성하는데 사용되어, 이에 따라 응답 시프트를 일정하게 추적할 필요성을 감소시킨다. 그 결과, 반전된 부호를 갖는 외부 자기장(B_ext(t))인 보상 자기장은 실시간으로 외부 자기장(B_ext(t))의 측정 및 계산을 허용한다. 도 58은 보상 자기장을 사용하여 폐루프 처리를 도시하는 개략도인 한편, 도 59는 도 58에 도시된 폐루프 처리를 수행하는 방법을 도시한 흐름도이다.58 and 59 illustrate closed loop processing performed by controller 680 in accordance with an exemplary embodiment of the present invention. The closed-loop processing described herein is based on the assumption that the estimated total incident magnetic field

) To be calculated in real time to generate the compensating magnetic field B _comp (t) and to be activated through the second magnetic field generator 675. This compensating magnetic field is used to cancel out changes in the RF response due to the external magnetic field (B _ext (t)), thereby generating a constant and fixed fluorescence response, thereby reducing the need to constantly track the response shift. As a result, the compensating magnetic field, which is the external magnetic field B _ext (t) with the inverted sign, allows measurement and calculation of the external magnetic field B _ext (t) in real time. Fig. 58 is a schematic diagram showing closed loop processing using a compensating magnetic field, while Fig. 59 is a flowchart showing a method of performing closed loop processing shown in Fig.

As shown in Figure 59, at step (S5900), the bias magnetic field _(bias B (t)) is applied to separate the Lorentz's response at the desired frequency (e.g., such as the frequency of the interval). As described above, the bias magnetic field may be applied using a known and constant first magnetic field generator 670 (e.g., a permanent magnet). However, the bias magnetic field may alternatively be applied by the second magnetic field generator 675. In this case, an initial calibration offset R (shown in FIG. 58) in the form of a constant is added to the driver G, which causes the second magnetic field generator 675 to generate a bias magnetic field required to separate the Lorentz micro- . Once this is set, closed loop processing may proceed to step S5910, where the unknown external magnetic field B _ext (t) is read. 58, this step may be performed in a manner similar to the processing described with respect to FIG. 57, where the intensity response I (t (t)) as a function of the frequency f ) Is estimated, the estimated total incident magnetic field B _t (t) is calculated.

In step S5920, a shift of the ultrafine response is observed. The largest change per predetermined sampling period can be identified to identify the vector direction of the unknown magnetic field. The observed shifts can then be used to close the loop processing as shown in FIG. Specifically, the closed-loop processing, together with the input of any calibration reference R (t), is set to zero under normal operation, but it is possible to use a Lorentz response with many vector components of the unknown external magnetic field And a driver block G, which can be adjusted to arrange a fine response (e.g., a fine response). The feedback H and driver G are _coupled to a second magnetic field generator 675 to generate a compensating magnetic field B _comp (t) indicative of the magnetic field required to ensure that the largest slope of the response remains fixed with respect to the magnitude response. ), Thereby offsetting any shift due to the external magnetic field (B _ext (t)). Therefore, as shown in Fig. 59, in step S5930, the loop is closed by increasing the controller net spectral gain. The loop closure can be accomplished by setting feedback (H) and driver (G) to a feedback set to a constant gain (e.g., a Schwarzer observer) or a state and measurement noise covariance drive variable gain (e.g., Kalman filter) (H) and driver (G), where each control system embodiment can be tailored to a particular application. In step S5940, the compensating magnetic field B _comp (t) is stored with the inverse sign for the shift observed in step S5920. Since the compensating magnetic field B _comp (t) represents a magnetic field which is the same as but opposite to the unknown external magnetic field B _ext (t), the inverse matrix of the compensating magnetic field B _comp (t) And is stored in the controller as an external magnetic field (B _ext (t)) applied on the system 600. In step S5950, the controller net spectral gain is further increased to drive the compensating magnetic field B _comp (t) to fix it to the external magnetic field B _ext (t), so that the observed intensity response remains fixed . Then, the process is repeated by continuing with step S5910. This processing allows the compensating magnetic field B _comp (t) stored by the controller 680 to offset any shift in the magnitude response caused by the external magnetic field B _ext (t) Resulting in real-time calculation of the magnetic field.

The loop logarithm for the closed loop processing can be expressed as: As mentioned above, the total incident magnetic field is the sum of the unknown external magnetic field. It is expressed as the sum of the compensating magnetic field and the bias magnetic field applied when the loop is closed. Because the bias magnetic field is constant over time, the bias magnetic field is excluded from the following loop logarithm to evaluate the required compensating magnetic field required for closed loop processing. Thus, the total incident magnetic field can be expressed by:

(4)

But because of the linear relationship between the total incident magnetic field B _t (t) acting on the NV diamond material 620 by the effect and the intensity response I (t), equation (3) have:

(5)

(t))에 기초한 루프 폐쇄는 다음과 같이 표현될 수 있다:The estimated total magnetic field (B _comp (t)) to generate the compensating magnetic field (B _comp (t)) using the feedback and driver gain and calibration criteria

(t)) can be expressed as: &lt; RTI ID = 0.0 &gt;

(6)

Combining Equations 4 through 6 leads to the following:

(7)

During normal operation of the closed loop processing, the calibration reference R does not change with time but becomes zero. Hence, Equation (7) can be reduced to:

(8)

(9)

(10)

As can be seen from equation (10), the larger the gradient of the intensity response I (t) at the critical response frequency is, the greater the relationship between the compensation area B _comp (t) and the unknown outer area Bext (t) . Therefore, B _comp (t) = - B _ext (t). Thus, by the use of an ultrafine response that exhibits a maximum slope that is three times greater than the maximum slope of the total Lorentz response, such a relationship can be achieved with closed loop processing. This is because the unknown external magnetic field Bext (t) is measured in real time by the inverse code by the loop gain equivalent operation of the second magnetic field generator 675 by the controller 680 using the compensating magnetic field B _comp (t) .

Although the transfer functions G and H are shown as constants in equations (6) to (10) and in FIG. 58, the transfer function can be expressed in the frequency domain, for example G (s): s = a + bi And can be realized by an analog circuit as a continuous, time invariant system function. Where s is the Laplace operator. Alternatively, the control system may be implemented in a digital computer that performs sampling and computation at regular time intervals of T seconds and the transfer function G (z) is a z- _domain discrete sampled data frequency domain operator z = exp ( sT).

As discussed above, the control loop processing of system 600 provides a means to lock the ultrafine response despite changes in the external magnetic field. By dynamically locking the response, a smaller biasing magnetic field can be used and at the same time a robust means of detecting and calculating changes due to the external magnetic field can be maintained. The application of a smaller bias magnetic field reduces the frequency range required for the measurement circuit of the RF excitation swept and intensity response, which provides a more responsive and efficient system for determining the external magnetic field acting on the system. In addition, the range of signal amplitudes that the system can detect and respond to quickly and accurately can be greatly improved, which can be particularly important for large amplitude magnetic field applications.

Apparatus and method for highly sensitive magnetic force measurement and signal processing in a magnetic detection system

The following describes an apparatus and method for stimulating NV diamond in a magnetic detection system using an optimized stimulation process to significantly increase the magnetic sensitivity of the detection system. The system uses a Ramsey pulse sequence to detect and measure the magnetic field acting on the system. The parameters associated with the Ramsey pulse sequence are optimized prior to measuring the magnetic field. These parameters include the resonant rabbit frequency, free wash time (tau) and detuning frequency, all of which help improve measurement sensitivity. These parameters can be optimally determined using calibration tests using other optical detection techniques such as a rabbi pulse sequence or a further Ramsey sequence. In addition, the parameters, particularly the resonant rabbit frequency, can be further optimized by the power increase of the RF exciters that can be achieved through the use of small loop antennas. During measurement of the magnetic field, the RF excitation pulse applied during the Ramsey sequence may be set to occur at a separate resonance frequency associated with a different spin state (e.g., ms = +1 or ms = -1). By using a separate resonant position, the change due to the temperature and / or strain effects of the system and the change due to the external magnetic field can be separated to improve the accuracy of the measurement. Finally, the processing of the data obtained during the measurement is further optimized using a minimum of two reference windows that use an average to obtain the signal. Or more of the magnetic field can improve the detection sensitivity of the magnetic field. In some embodiments, the optimized measurement process can result in a sensitivity of the magnetic detection system of about 9 nT / √Hz or less.

NV center, electronic structure, and optical and RF interaction

The NV center in the diamond contains substituted nitrogen atoms at the lattice sites adjacent to the carbon vacancies as shown in Fig. The NV center can have four orientations, with each orientation corresponding to a different crystallographic orientation of the diamond grating.

The NV center may be in a neutral charge state or a negative charge state. Conventionally, the neutral charge state uses the nomenclature (NV ⁰ ) while the negative charge state uses the nomenclature (NV), which is adopted in this description.

The NV center has a number of electrons, each containing one hole electron from each vacancy to three hole electrons to each three carbon atoms adjacent to the vacancy, and a pair of electrons between the nitrogen and vacancies. The NV center in the negatively charged state also contains extra electrons.

The NV center has rotational symmetry and has a base state which is a spin triplet having a ³ A ₂ symmetry with one spin state (m _s = 0) and two base spin states with two additional spin states (m _s = + 0) 1, and m _s = -1). In the absence of an external magnetic field, the m _s = +1 energy level is offset from m _s = 0 due to spin-spin interaction and the m _s = +1 energy level is degenerated, that is, they have the same energy. The m _s = 0 spin state energy level is divided from the m _s = +1 energy level by an energy of 2.87 GHz for a zero external magnetic field.

Introducing an external magnetic field having a component along the NV axis raises the degeneration of the m _s = + 1 energy level and divides the energy level (m _s = + 1) by an amount (2 g _{B B} Bz) _{B B} is the component of the external magnetic field along the NV axis. This relationship is corrected to first order and inclusion of higher order corrections is a simple matter and will not affect the calculation and logic steps in the systems and methods described below.

NV center electronic structure may further comprise a triplet state (E ³⁾ excitation, with the corresponding m _s = 0 and _s = m + 1 spin state. The optical transition between the ground state ( ³ A ₂ ) and the excited triplet ( ³ E) is primarily spin conservation, meaning that the optical transition is between the initial and final states with the same spin. For the direct transition between the excited triplet ⁽³ E) and the ground state ⁽³ A _2), red light photons are emitted as photon energy corresponding to the energy difference between the energy level of the transition.

However, the middle one quartet (singlet) state (A, E) alternative non to the ground state ⁽³ A ₂₎ from a triplet ⁽³ E), via an intermediate electronic state is considered to be having an intermediate energy level, - a copy decay root have. Importantly, the transition state of the m _s = ± 1 spin state of the triplet ⁽³ E) into an intermediate energy level here is higher than the transition state of the m _s = 0 spin state of the excited triplet ⁽³ E) into an intermediate energy level, It is considerably larger. One transition to a neutral ground state, triplet state ⁽³ A ₂₎ from (A, E) is largely collapsed by m _s = 0 spin state over the m = _s + 1 spin states. Middle one neutral state (A, E) via excited triplet these features of the collapse of the ⁽³ E) a ground state triplet ⁽³ A ₂₎ from their optical here is an optical here in the end NV center, if available to the system And allows pumping to m _s = 0 spin state of base state ( ³ A ₂ ). In this way, the set of m _s = 0 spin states of base state ³ A ₂ can be "reset" to the maximum polarization determined by the decay rate from the triplet ³ E to the medium midline state.

Another feature of the collapse, the fluorescent intensity caused by the optical stimulation to a triplet (3 ^E) excited state would is smaller for m = _s + 1 than the m _s = 0 spin state. This is so because the collapse through the intermediate state does not result in photons emitted in the fluorescent band, and that the m _s = + 1 state of the excited triplet ( ³ E) state will have a greater probability of collapsing through the non- That is why. The lower fluorescence intensity for the m _s = ± 1 state than the m _s = 0 spin state allows the fluorescence intensity to be used to determine the spin state. When the population of m _s = + 1 states increases for m _s = 0 spins, the overall fluorescence intensity will be reduced.

NV-centered, or self-optical defect-centered, magnetic sensor system

Figure 3 is a m _s = ± 1 distinguishes the state, and _s = m + 1 states with m _s = -1 centered conventional NV on the basis of the energy difference using a fluorescence intensity to measure the magnetic field between the magnetic sensor system state ( 300). System 300 includes an optical excitation source 310 that directs the optical excitation to NV diamond material 320 having an NV center. The system further includes an Rf excitation source 330, which provides RF radiation to the NV diamond material 320. [ The light from the NV diamond can be directed through the optical filter 350 to the optical detector 340.

The RF excitation source 330 may be, for example, a microwave coil. The RF excitation source 330 excites the transition between these spin states as it emits RF radiation through photon energy resonance with a transition energy between the base m _s = 0 spin state and the m _s = + 1 spin state. For such a resonance, the spin state is cycled between the base m _s = 0 spin state and the m _s = + 1 spin state, reducing the population at the m _s = 0 spin state and reducing the total fluorescence at the resonance. Similarly, resonance occurs between the m _s = 0 spin state of the ground state and the m _s = -1 spin state, and the photon energy of the RF radiation emitted by the RF excitation source is in the m _s = 0 spin state and m _s = -1 spin state, or a difference in energy between the m _s = 0 spin state and the m _s = + 1 spin state, there is a decrease in fluorescence intensity.

The optical excitation source 310 may be, for example, a laser or a light emitting diode that emits light in green, for example. The optical excitation source 310 induces fluorescence in red, which corresponds to the electron transition from the excited state to the ground state. Light from the NV diamond material 320 is directed through the optical filter 350 to filter light in the excitation band (e.g., in green) and pass the light in the red fluorescent band, 340). In addition to exciting the fluorescence in the diamond material 320, the optical excitation light source 310 may also be used to reset the population of m _s = 0 spin states of base state ³ A ₂ to maximum polarization, .

For continuous wave excitation, the optical excitation source 310 continuously pumps the NV center and the RF excitation source 330 includes energy at zero divide of 2.87 GHz (when m _s = + 1 spin state has the same energy) Sweep over a range of frequencies. Fluorescence for an RF sweep corresponding to a diamond material 320 having an NV center aligned along a single direction is shown in Figure 4 for a different magnetic field component (Bz) along the NV axis, where m _s = -1 spin state and The energy division between m _s = + 1 spin states increases with B z. Thus, the component (Bz) can be determined. An optical excitation configuration other than continuous wave excitation is envisioned, such as an excitation configuration involving pulsed light excitation and pulsed RF excitation. Examples of pulsed excitation configurations include a Ramsey pulse sequence (described in more detail below), and a spin echo pulse sequence.

Generally, the diamond material 320 will have NV centers along the direction of the four different orientation gradients. Figure 5 shows fluorescence as a function of RF frequency for cases where diamond material 320 has NV centers aligned along the direction of four different orientation gradients. In this case, the component Bz along each of the different orientations can be determined. These results not only allow the magnitude of the external magnetic field to be determined along with the known orientation of the crystallographic plane of the diamond grating, but also allow the orientation of the magnetic field to be determined.

Although FIG. 3 shows an NV centered magnetic sensor system 300 having NV diamond material 320 having a plurality of NV centers, the magnetic sensor system generally uses a different magnetic-to- Optical defective center material can be used. The electron spin state energy of the self-optical defect center shifts with the magnetic field, and optical responses such as fluorescence to different spin states are not the same for all different spin states. In this way, the magnetic field can be determined based on the RF excitation in a manner corresponding to that described above with the optical excitation, and possibly the NV diamond material.

60 is a schematic diagram of a system 6000 for a magnetic field detection system according to an embodiment of the present invention. The system 6000 includes an optical excitation source 6010 that directs the optical excitation to an NV diamond material 6020 having an NV center or to another self-optical defect center material having a self-optical defect center . An RF excitation source 6030 provides RF radiation to the NV diamond material 6020. Magnetic field generator 6070 generates a magnetic field that is detected in NV diamond material 6020.

The magnetic field generator 6070 may generate a magnetic field having, for example, orthogonal polarization. In this regard, the magnetic field generator 6070 may include two or more coils, such as two or more Hechtols coils. The two or more magnetic field generators may be configured to provide a magnetic field having a predetermined direction that provides a relatively uniform magnetic field in the NV diamond material 6020. The predetermined directions may be orthogonal to each other. Further, the two or more magnetic field generators of the magnetic field generator 6070 may be disposed at the same position, or may be separated from each other. When two or more magnetic field generators are separated from each other, the two or more magnetic field generators may be arranged in an array such as a one-dimensional or two-dimensional array, for example.

System 6000 may be arranged to include one or more optical detection systems 6005 wherein each optical detection system 6005 includes a photodetector 6040, an optical excitation source 6010 and an NV diamond material 6020 . Optical system 6005 may be placed in an environment requiring relatively low power relative to optical system 6005 while magnetic field generator 6070 may be placed in an environment requiring relatively low power relative to optical system 6005 that is available for magnetic field generator 6070 to apply a relatively strong magnetic field. And can be deployed in an environment having relatively high power.

The system 6000 further includes a controller 6080 configured to receive a light detection signal from the optical detector 6040 and to control the light excitation source 6010, the RF excitation source 6030, and the second magnetic field generator 6075 do. The controller may be a single controller or multiple controllers. In the case of a controller that includes multiple controllers, each of the controllers may perform different functions, such as controlling different components of the system 6000. The second magnetic field generator 6075 may be controlled by the controller 6080 via, for example, an amplifier 6060. [

The RF excitation source 6030 may be, for example, a microwave coil. The RF excitation source 6030 is controlled to emit RF radiation with photon energy resonating with the transition energy between the ground m _s = 0 spin state and the m _s = ± 1 spin state, as described above for FIG.

The optical excitation source 6010 may be, for example, a laser or a light emitting diode that emits light in green. Optical excitation source 6010 derives fluorescence from red from NV diamond material 6020, wherein the fluorescence corresponds to an electron transition from the excited state to the ground state. The light from the NV diamond material 6020 is directed through the optical filter 6050 to filter out the excitation band (e.g., green) light and pass the red fluorescence band light, Lt; / RTI &gt; The photoexcitation source 6010 serves to reset the population of m _s = 0 spin states of ground state ³ A ₂ to maximum polarization or other desired polarization in addition to exciting the fluorescence of NV diamond material 6020 .

The controller 6080 is arranged to receive the light detection signal from the optical detector 6040 and to control the light excitation source 6010, the RF excitation source 6030 and the second magnetic field generator 6075. The controller may include a memory 6084 for controlling the operation of the processors 6082 and 6010, the RF excitation source 6030, and the second magnetic field generator 6075. Memory 6084, which may include non-transitory computer readable media, may store instructions to allow the operation of optical excitation source 6010, RF excitation source 6030 and second magnetic field generator 6075 to be controlled. That is, the controller 6080 may be programmed to provide control.

Ramsey pulse sequence overview

According to a particular embodiment, controller 6080 controls the operation of optical excitation source 6010, RF excitation source 6030 and magnetic field generator 6070 to perform optically detected magnetic resonance (ODMR). The components of the magnetic field Bz along the NV axis of the NV center aligned along the direction of the four different orientation grades of NV center can be determined by ODMR, for example by using an ODMR pulse sequence according to the Ramsey pulse sequence. The Ramsey pulse sequence is a pulsed RF pulsed laser method that measures the free car wash of the magnetic moment of the NV diamond material 6020, both of which mechanically prepare and sample the electron spin state.

61 is a schematic diagram showing a Ramsey pulse sequence. As shown in FIG. 61, the Ramsey pulse sequence includes a photoexcitation pulse and an RF excitation pulse over a period of five stages. In a first step, during period 0, a first optical excitation pulse 710 is applied to the system to optically pump the electrons to a ground state (i.e., m _s = 0 spin state). This is followed by a first RF excitation pulse 720 (e.g. in the form of a microwave (MW) pi / 2 pulse). The first RF excitation pulse 720 sets the system to superposition of m _s = 0 and m _s = +1 spin states (or, alternatively, m _s = 0 and m _s = -1 spin state). During period 2, the system can freely process (and diphase) for a period of time, referred to as tau (tau). During this pre-session time, the system measures the local magnetic field and acts as a coherent integration. Next, a second RF excitation pulse 6140 (for example in the form of an MW? / 2 pulse) is applied during period 3 to project the system again on the basis of m _s = 0 and m _s = +1. Finally, during period 4, a second optical pulse 6130 is applied to optically sample the system, and the measurement criteria is obtained by detecting the fluorescence intensity of the system. An RF excitation pulse applied to the system 6000 is provided at a given RF frequency corresponding to a given NV center orientation. The Ramsey pulse sequence shown in FIG. 66 may be performed multiple times, and each of the MW pulses applied to the system during a given Ramsey pulse sequence includes different frequencies corresponding to different NV center orientations, respectively.

Theoretical measurement readings from a Ramsey pulse sequence can be defined as the following equation (a1): &lt; RTI ID = 0.0 &gt;

(a1)

In the above equation (a1), τ represents the free pre-session time, T ₂ ^* represents the spin de-pacing due to the inhomogeneity present in the system 6000, ω _res represents the resonant rabbit frequency, ω _eff is effective A ra denotes the ravia frequency, a _n denotes the microwave NV diamond material 620 (~ 2.14 MHz),? Denotes the MW detuning, and? Denotes the phase offset.

When measuring based on the Ramsey pulse sequence, the parameters of the duration of the MW? / 2 pulse, the frequency of the MW pulse {referred to as the amount of frequency detuned from the resonance position?), And the free wash time Lt; / RTI &gt; 62A and 62B show the effect on the change of the specific parameter of the Ramsey pulse sequence. For example, as shown in FIG. 62A, if all the parameters remain constant except for the free pre-session time?, An interference pattern known as free induction decay (FID) is obtained. The FID curve is due to construction / destructive interference of three sinusoidal waves corresponding to ultrafine debris. The collapse of the signal occurs due to non-uniform de-phasing, and the rate of this collapse is represented by T ₂ ^* (characteristic decay time). Further, as shown in Fig. 62B, if all the parameters are kept constant except for the microwave detuning (?), A magnetic field curve is obtained. In this case, the x-axis can be converted to magnetic field units through a 1 nT = 28 Hz conversion to compensate for magnetic measurements.

By changing both? and?, a two-dimensional FID surface plot can be constructed, an example of which is shown in FIG. The FID surface plot includes several characteristics that can explain the optimization of the controllable parameters of the Ramsey sequence. For example, in Figure 63A, the FID surface plot is generated using a resonance rabi frequency of about 6.25 MHz and a T ₂ ^* of about 6150 ns. The horizontal slice of Figure 63a represents a separate FID curve (e.g., Figure 62a), and the vertical slice represents a magnetic field curve (e.g., Figure 62b). As shown in FIG. 63A, a higher fundamental frequency FID curve occurs in a larger detuning. Thus a higher detuning frequency can be used to match T ₂ ^* for diamond characterization. In addition, the magnetic force measurement curve as shown in Figure 62 (b) shows that a particular region produces greater sensitivity. In particular, by taking the slope of the two-dimensional FID surface plot, a separate optimal free session interval that exhibits better sensitivity can be identified, the best of which will be determined by T ₂ ^* . 63B shows the slope of the two-dimensional FID surface plot of FIG. 63A. In Figure 63B, for a particular T ₂ ^{* used} (i.e., about 750 ns), operating at about 900 ns (represented by region 2 in Figure 63B) will yield the greatest sensitivity. However, a shorter T ₂ ^* would show better performance between about 400 ns and about 500 ns (denoted by region 1 in FIG. 63b), but a longer T ₂ ^* would give better performance at about 1400 ns Indicated by region 3 in Figure 6b3). This strong interference region indicated by the plot as shown in Fig. 63 (b) allows for optimization of tau that yields greater measurement sensitivity.

In addition, the damping of the abscissa in Figure 63 ( _b ⁾ is characterized by T ₂ ^* , and the attenuation of the vertical axis is characterized by the ratio of the resonant rabbit frequency ω _res (described in detail below) to the effective ravi frequency ω _eff . The effective rabbit frequency can be defined by the following equation a2:

(a2)

Thus, the ratio of the resonant rabbit frequency to the effective rabbi frequency can be expressed in terms of the resonant rabbit frequency as follows:

(a3)

As shown in the above equation (a3), when the resonance rabbit frequency? _Res is much larger than the MW detuning?, The ratio of the resonance rabbit frequency to the effective rabbit frequency will be approximately equal to one. The attenuation shown in the vertical axis of Figure 63b can be partially controlled by the RF excitation power. As will be described in greater detail below, as the RF excitation power increases, a larger resonant rabbit frequency can be realized while reducing the rate of change of the effective rabbi frequency due to detuning. Thus, in accordance with a particular embodiment, the magnetometric measurement is operated in a region dominated by the resonant rabbit frequency to achieve maximum contrast (such that the ratio of (a3) is close to 1).

Measurement sequence

Using the above observations, a very sensitive magnetic force measurement can generally be obtained using a three-step approach. In this general approach, a first step is performed to verify the resonance rabbit frequency? _Res . The second step measures the inhomogeneous de-phasing (T ₂ ^* ) of the system. Finally, using the measurements obtained in the first and second steps, the parameter space of equation (a1) is optimized and high sensitivity magnetic measurements are performed. These three steps are described in detail below.

Measurement of resonance ravi frequency

To verify the resonant rabbit frequency, first a bias magnetic field using a magnetic field generator 6070 is applied to the system 6000 to separate the outermost resonance of the fluorescence intensity response and the three remaining resonances to the other axes maintain. Next, a CW-CW sweep or a single π pulse sweep is applied to identify the resonant RF frequency corresponding to the axis (ie, outermost resonance). A series of rabbit pulses are then applied in response to this resonance. Fig. 64 shows an example of a rabbi pulse sequence. As shown in Fig. 64, three cycles of optical and RF excitation pulses are applied. First, a first light excitation pulse 6410 is applied and followed by an RF excitation pulse 6420 (e.g., a MW pulse). The Rabi pulse sequence is then completed by the second photoexcitation pulse 6430. During the application of a series of rabbi pulses, the time interval at which the RF pulses are applied (represented as tau in Fig. 64, this tau is different from the free precession interval? In the Ringer pulse sequence). In this process a constant optical duty cycle is maintained to minimize the thermal effects of the system. This can be accomplished with the use of a variable "guard" window shown in FIG. 64 as a period 6450 between the first optical pulse 6410 and the MW pulse 6420. The guard window 6450 ensures that the first optical pulse 6410 is completely turned off until the time that the MW pulse 6420 is applied to prevent overlap between the two pulses and the first optical pulse 6410 optical pulse is MW The NV diamond material is partially reinitialized while pulse 6420 is negative.

After application of the rabie pulse, the resonance ravi frequency (? _Res ) is defined by the frequency of the resultant curve. Figure 65 shows a measured curve AD after application of a rabbi pulse using variable RF excitation power (e.g., MW power). By increasing the MW power applied to the system 6000, as shown by the difference in the frequency of the curve AD, the obtained resonant rabbit frequency? _Res also increases. Therefore, a substantial amount of MW power must be used to obtain a practical rabbi frequency (e.g., greater than 5 MHz). In some embodiments, sufficient MW power may be applied to keep the application of pulses short while at the same time the MW power may be limited to avoid saturation. In certain embodiments, a power of about 10 watts may be applied. Depending on the RF excitation source 6030 used to apply the RF excitation, the power requirements needed to achieve a practical rabbi frequency may be difficult to achieve. However, in a particular embodiment, a small loop antenna (e.g., an antenna with a loop size of about 2 mm) may be used as the RF excitation source 6030. By applying a small loop antenna, a high MW power can be achieved. Thus, the ability to place the antenna closer to the NV diamond material 6020 significantly reduces the required antenna power. Thus, an increase in the MW power achieved by the small loop antenna allows an increase in the resonant rabbit frequency? _Res . The data obtained at this stage of the measurement procedure is used to determine the pi / 2 pulses needed to perform the Ramsey pulse sequence (described below). In this case, [pi] may be defined as the first minimum value of the obtained ravi curve (e.g., curve D in Fig. 65).

T2 ^* Measurement of

In the second stage of the measurement process, a measurement of the inhomogeneous diphase T ₂ ^* of the system is obtained using the π / 2 pulse determined by the resonance rabbit frequency and the resonance position obtained in the first stage above. The measurement is performed similarly to the rabbi measurement described above, except that the Ramsey pulse sequence is used. As described above with reference to the Ramsey pulse sequence, tau tau represents the free car wash time interval at this stage.

When estimating T ₂ ^* , the detuning frequency [Delta] is set relatively high in certain embodiments. As described above, the large detuning frequency results in a higher fundamental frequency (see, for example, FIG. 63A), allowing greater contrast and allowing the data to be more easily tailored. In some embodiments, the detuning frequency [Delta] may be set at about 10 MHz. However, in the case of a relatively large T ₂ ^* , a smaller detuning frequency can be used. 62A shows an example of a FID curve that can be used to obtain T ₂ ^* with a detuning frequency set to about 10 MHz. By determining T ₂ ^* from the FID curve as shown in FIG. 62A, the optimum free time duration? Can be determined based on the strong interference region described above with reference to FIG. 63B. Also, in a particular embodiment, a small range of &lt; RTI ID = 0.0 &gt; tau &lt; / RTI &gt; is collected on both sides of the optimal freeze time determined optimally for the setter of equation (a1).

Measurement of magnetic measurement

The measurement of the fluorescence intensity response at the end of the measurement process is performed using the parameters obtained in the above step. As noted above, the identified resonant rabbit frequency provides a duration of MW? / 2 pulses (used as RF excitation pulses 6120 and 6140), and the FID curve is used to determine the region of the optimal free- T ₂ ^* &lt; / RTI &gt; During this final step, it should be noted that, in some embodiments, the optical pulses used for optical polarization of the system and the optical pulses used for measurement reading can be merged into one pulse during the application of a series of Ramsey sequences.

Also, in order to increase the sensitivity, in some embodiments the second measurement made per fixed measurement error can be increased. Thus, in order to maximize sensitivity, the overall length of a single measurement cycle must be minimized, which can be achieved through the use of a higher light output of the light excitation source 6010. Thus, given the optical excitation source 6010 can be set to about 1.25 W, the MW? / 2 pulse can be applied for about 50 ns, and the pre-session time? Can be set to about 420 ns And the optical excitation pulse duration may be about 50 μs. Also, a "guard" window can be used before and after the MW pi / 2 pulse, which can be set to a duration of about 2.28 [micro] s and 20 ns, respectively.

In conventional measurement processes, the curve of the intensity response is generally measured only once to obtain the tilt and the fine tuning frequency, while the additional measurement is performed only at the optimum detuning frequency while the fluorescence signal is being monitored. However, the system may experience drift caused by, for example, optical excitation heating (e.g., laser induced heating) and / or variations that can contribute to inaccuracies and errors during the measurement process. Tracking a single-spin resonance does not adequately account for the conversion in the response curve due to thermal effects. Thus, in accordance with some embodiments, the data obtained from the measurement process is stored in real time and the sensitivity is determined off-line to minimize the time between measurements, in order to account for non-linearity for a band of larger magnetic fields. Also, the magnetic measurement curves are collected in both m _s = +1 and m _s = -1 spin states for the same NV symmetry axis. For example, each in a particular embodiment, Ramsey sequence for RF excitation pulse is low resonant (i.e., m = _s -1 resonance frequency of the spin state) and a high resonance (that is, m = _s resonant frequency of + 1) The spin state is used to obtain measurements related to spin states (m _s = -1 and m _s = 1 spin states). Thus, two magnetization curves (e.g., FIG. 62B) can be obtained for positive and negative spin states. By applying RF pulses at discrete frequencies it is possible to compensate for deformations due to temperature and / or strain effects. The magnetic field measurements can be made using equations a4 and a5 below, where I represents the normalized intensity of the fluorescence (e.g., red) and m ₁ and m ₂ represent m _s = +1 And m _s = -1, respectively:

(a4)

(a5)

For the measurement obtained at the opposite slope, a positive value is used in the equation (a5). m _s = +1 and m _s = -1 If the peak of the spin state is transformed, the magnitude response occurs in the opposite direction. On the other hand, if the peaks are separated outward due to a change in the magnetic field, the intensity change agrees to yield an appropriate dB measurement value. Thus, by obtaining a measurement of the curve for both m _s = +1 and m _s = -1 spin states for the same NV symmetry axis, the changes due to changes due to temperature and magnetic field can be separated. Therefore, translational movement due to temperature and / or strain effects can be considered, so that the magnetic field contribution on the system can be calculated more accurately.

Signal processing

) 이전에 A로 정의된 제 2 기준 윈도우 또는 기간을 포함하도록 확장될 수 있다. 윈도우들 또는 기간들 내의 샘플들(즉, A, B 및 C)은 각각의 윈도우 또는 기간 내에 포함된 신호의 평균값을 얻기 위해 평균될 수 있다. 또한, 몇몇 실시예에서, 윈도우 또는 기간(예를 들어, 신호 윈도우 B)의 값은 가중된 평균을 사용하여 결정될 수 있다. 또한, 특정 실시예에서, 제 1 및 제 2 기준 윈도우는 도 66에 도시된 바와 같이 신호 윈도우로부터 등 간격으로 이격된다. 이러한 참조의 확장은 신호 획득 동안의 광학 여기 전력 및 시스템의 전체 민감도의 더 나은 평가를 가능하게 한다.The processing can be performed on the raw data obtained to obtain a clean image of the measurements obtained during each of the above steps. FIG. FIG. 66 shows an example of raw pulse data segments that may be acquired during a given measurement cycle. Theoretically, the signal is defined as the first 300ns of the photoexcitation pulse. However, this definition applies to the light output density in a nearly saturated state. As the optical power density decreases in the saturated state, useful portions of the signal can be further extended. At present, in the conventional processing method, when the system is polarized, the end of the pulse is referred to to explain the power fluctuation in the optical excitation source (for example, laser). This is shown in FIG. 66, where the signal is acquired using a signal window or period defined by a first reference window or period defined by C, i. E., B (i. . However, in accordance with certain embodiments, to increase sensitivity, the reference is a microwave pulse (i.e., signal =

) May be extended to include a second reference window or period previously defined as A. Samples (i.e., A, B, and C) in windows or periods can be averaged to obtain an average value of the signals contained within each window or period. Further, in some embodiments, the value of a window or period (e.g., signal window B) may be determined using a weighted average. Also, in a particular embodiment, the first and second reference windows are equally spaced from the signal window as shown in Fig. The extension of these references enables a better evaluation of the optical excitation power during signal acquisition and the overall sensitivity of the system.

Diamond Nitrogen Vacuum Sensor with Common RF and Magnetic Field Generator

67 is a schematic diagram illustrating a portion of a DNV sensor having a coil assembly in accordance with some exemplary embodiments. The magnetic sensor shown in FIG. 6 used a single RF excitation source 630 and a bias magnet 670. The DNV sensor shown in FIG. 7 uses six separate RF elements that provide a bias magnetic field provided to the bias magnet 670 of FIG. In various implementations, the DNV sensor shown in Figure 67 does not require a separate bias magnet. Figures 67 to 73 show various components of the DNV sensor.

67, the portion of the DNV sensor shown includes a heat sink 6702 that is connectable to the remainder of the DNV sensor via a mounting clamp. Light elements such as a laser or LED located in or near the heat sink 6702 are not shown. Light from the light element travels through lens tube 6706 through focus lens tube 6718 and through coil assembly 6716, which includes NV diamond. The light passes through the NV diamond to the coil assembly 6716 and exits the coil assembly. Light exiting the coil assembly passes through the red filter to the optical sensor assembly 6714. The coil assembly 6716, the red filter, and the light sensor all may be received in a lens tube 6710 that can be coupled to the lens tube 6718 through a lens tube coupler 6708. [ The lens tube rotation mount 6712 allows a rotation adjustment element to be attached which allows the coil assembly to rotate with respect to the light element.

68 is a schematic diagram illustrating a cross-section of a portion of a DNV sensor having a coil assembly in accordance with some exemplary implementations. The portion of the DNV sensor shown includes a coil assembly 6816 and an optical sensor 6820. The coil assembly 6816 includes six RF elements. Each RF element has an RF mount that can be used to connect the RF cable 6830. Thus, each RF element may have its own RF supply. In various implementations, each RF device is supplied with a unique RF signal. In other implementations, subcombinations of RF elements receive the same RF feed signal. For example, two or three groups of RF elements may receive the same RF feed signal. Various connectors, such as a right angle connector 6832, may be used to connect the RF cable 6830 and RF elements. The coil assembly 6816, the red filter 6826, the EMI glass 6824, and the optical sensor mounting plate can be held in place using a retaining ring, such as the retaining ring 6802. The light sensor 6820 may be secured to the light sensor mounting plate 6822 and the light sensor mounting plate 6822 may be used to locate the light sensor 6820 in the path of light exiting the coil assembly 6816. [

70 is a cross-sectional view illustrating a coil assembly in accordance with some exemplary implementations. An optical path 7030 is shown in this figure. The optical path allows light from the illumination elements to pass through the coil assembly and NV diamond 7040. The light exits the NV diamond and travels through the light path 7030 out of the coil assembly.

The coil assembly includes four RF elements 7002 and two upper and lower elements 7020. NV diamond 7040 is held in place through diamond plug 7004 holding diamond in mounting block 7006. The RF elements can be secured together using various means such as element mounting screws 7032. [ Six total RF elements can be seen in Figures 69A and 69B, which illustrate a coil assembly in accordance with some exemplary implementations. Four side RF elements 6902 are shown with two upper and lower RF elements 6920. Each RF element is attached to a center mounting block 6904. Attachment mechanisms such as screws 6932 may be used to attach the RF element to the mounting block. In the illustrated embodiment, the light injection hole 6930 is the lower RF element and the light exit hole 6970 is in the upper RF element. Thus, in this implementation, light passes through the coil assembly and the diamond in a straight path. In one embodiment, light enters the face of the NV diamond and exits through the other face of the NV diamond. As described below, in other implementations, the optical path through the coil assembly is not straight and can take multiple paths at the exit.

71 schematically illustrates a side element 7100 of a coil assembly in accordance with some exemplary implementations. Side element 7100 may include an intermediate mounting hole and one other mounting hole. In this implementation, there is a side element with a different mounting hole configuration. 71, side element 7100 has three mounting holes, but not all mounting holes need to be used. In one embodiment, one of the intermediate mounting holes and the remaining two mounting holes is used, but all three mounting holes are not used. Each side element 7100 includes an RF connector 7102 that is used to provide an RF supply signal to the side element.

72 is a schematic illustration of an upper or lower element 7200 of a coil assembly in accordance with a partial exemplary embodiment. Similar to side element 7100, upper or lower element 7200 includes an RF connector 7202 for receiving an RF supply signal. However, the upper or lower element 7200 has only two mounting holes 7204. The three holes are optical path portions 7230 that allow light to enter and exit the coil assembly.

FIG. 73 schematically illustrates a central mounting block 7300 of a coil assembly in accordance with some example implementations. The NV diamond is located within the mounting block 7300. In one embodiment, a diamond plug may be used to hold the NV diamond. Mounting block 7300 may include a diamond mounting location that provides alignment of the NV diamond. For example, the mounting block 7300 may include a recess that fits the NV diamond. Once in place, the diamond plug can be inserted into the mounting block 7300 to secure the diamond in position.

Figures 74-77 illustrate another implementation. 74 is a cross-sectional view illustrating a portion of a DNV sensor with a coil assembly in accordance with a partial exemplary embodiment. Coil assembly 7416 holds the NV diamond within the NV diamond sensor. The coil assembly 7416 may include six RF elements, four side elements, and two upper and lower elements (shown in Figures 75-77). The RF cable 7430 may be connected to the RF element via an RF connection 7432. RF cable 7430 is used to provide RF signals to one or more RF elements. The RF signal may be different for each RF element or a subset of the RF elements may receive different RF signals. This RF supply signal is used by the RF element to provide a uniform microwave RF signal to the NV diamond. In addition, the arrangement of the RF elements allows the RF elements to provide a self-biasing magnetic field to the NV diamond. In the illustrated embodiment, light enters and exits through the top and bottom elements. Light exiting the NV diamond can pass through the red filter 7426 and the light pipe 7450 located within the attenuator 7440. In various implementations, at least a portion of light pipe 7450 is located within attenuator 7440. The light sensing array 7420 is positioned closer to the NV diamond and is not affected by the EMI of the sensor. A more detailed description of the benefits of accommodating portions of optical waveguides in the attenuator is set forth in U. S. Patent Application Serial No. &lt; RTI ID = 0.0 &gt; __ / ___, &quot; &Lt; / RTI &gt; Retaining ring 7402 can be used to hold the various elements together and in place.

75 is a schematic illustration of a coil assembly in accordance with some exemplary implementations. 76 is a schematic diagram illustrating a cross-section of a coil assembly in accordance with some exemplary implementations. The coil assembly includes two lower or upper RF elements 7506 and 7606. In the illustrated implementation, the upper or lower RF element is circular and larger than the side elements 7502,7602. Between the upper or lower elements, four sides 77 are schematic diagrams showing side elements of the coil assembly according to some exemplary implementations. The side element has an RF connector 7702 that is used to provide the supplied RF signal to the RF element. Side RF elements do not include mounting holes because they can be held in place by the upper and lower RF elements. In various implementations, each of the RF elements may comprise a plurality of stacked helical antenna coils. Such a stack coil can occupy a small footprint and can provide the microwave RF field required for the RF field to be uniform over the NV diamond. Additional details regarding RF devices and RF circuit boards including RF devices are described in U. S. Patent Application Serial No. &lt; RTI ID = 0.0 &gt; __ / ___, "Diamond Hollow Fiber Membrane Sensor with Dual RF Source, &quot; filed on even date herewith , The content of which is incorporated herein by reference. In various implementations, each RF side element and upper and lower RF element may comprise an RF element or an RF circuit board.

The NV diamond 7622 is located within six RF elements. The RF elements can be held together by mounting screws 7510 and 7610. [ The light injecting portion 7504 of the upper RF element allows light to enter the coil assembly and enter the NV diamond. And the lower portion includes a corresponding light emitting portion 7620. The NV diamond can be fitted into the mounting block 7608 and held in place through the diamond plug 7624. [

78-84 illustrate another implementation. In the illustrated embodiment, the light enters the NV diamond through the edge of the NV diamond and exits through the multiple sides of the NV diamond. The way in which light enters and leaves the NV diamond is based on the direction in which the NV diamond is based on the light source. Thus, in various embodiments, the NV diamond can be repositioned to allow light to enter and exit both edges, faces, and / or edges and faces.

78 is a schematic diagram showing a portion of a DNV sensor with a coil assembly in accordance with some exemplary implementations. The DNV sensor includes a light source heat sink 7802 and 7902, a mounting clamp 7804 for the heat sink 7802, a lens tube 7806, a focus lens tube 7818, a positioned coil assembly 7816, Sensor assembly 7814) and lens tube rotation mounts 7812 and 7912. 79 is a schematic diagram showing a cross section of a portion of a DNV sensor with a coil assembly in accordance with some exemplary implementations. In this embodiment, the light source is an LED 7906. In other implementations, other light sources such as lasers may be used. A thermal electric cooler 7904 may be used to provide cooling to the LED 7906. Light from LED 7906 may be focused using lens 7918. [ The condensed light enters the NV diamond located within the coil assembly 7916.

80 is a schematic diagram showing a cross-section of a portion of a DNV sensor having a coil assembly in accordance with some exemplary implementations. In this figure, NV diamond 8040 in the coil assembly can be seen. The light enters the edge of the NV diamond in this embodiment and exits the NV diamond 8040 from the two sides of the NV diamond 8040. Light exiting the NV diamond 8040 moves one of the two light pipes 7914. In various implementations, the optical axis of the light pipe is located in the attenuator. The NV diamond 8040 can be held in place in the coil assembly through the center mounting block 8050. [ The mounting block and coil assembly may be held in place using retaining ring 8052. [ The RF cable 8030 provides an RF feed signal for the RF connector 8032 RF element.

81 is a schematic illustration of a coil assembly in accordance with some exemplary implementations. 82 is a schematic diagram illustrating a cross-section of a coil assembly in accordance with some exemplary implementations. 81 shows four side elements 8014 and 8242 positioned between upper and lower RF elements 8112 and 8212. [ Central mounting blocks 8108 and 8208 and retaining plates 8106 and 8206 are also shown. The light enters the NV Diamond 8240 at the edge as described above. The light reaches the NV diamond through light injection openings 8101 and 8202. The light exits the NV diamond 8240 through the two light exit holes 8110 at a substantially right angle to the entry path. The second light exit hole is opposite to the light exit hole 8110 shown. 82, the second light exit hold is behind NV diamond 8240. [

83 is a schematic diagram illustrating side elements of a coil assembly in accordance with some exemplary implementations. The individual side elements include RF connector 8304 and light exit portion 8302. However, the side elements do not include any attachment holes. Rather, the side elements can be held in place in the coil assembly using upper and lower elements as shown in Figs. 84A and 84B.

84A and 84B are schematic diagrams illustrating the top and bottom elements of a coil assembly in accordance with some exemplary implementations. The upper element includes a slot 8406 for aligning and maintaining the position of the four RF side elements. A light injection hole 8404 is also shown. The RF connector 8404 located in both the upper RF element and the lower RF element allows separate RF feeds to be individually applied to the upper and lower RF elements.

Eliminate the general purpose of earth noise

Various aspects of the techniques of the present invention provide a method and system for universal cancellation of geomagnetic noise. This solution separates widely-spatially correlated Pc and Pi noise from the local variants using appropriate transforming means and signal processing (eg 1-D or 2-D) of highly deformed vector magnetic sensors. It has less impact on the sensors of the distributed DNV sensor array. The vector magnetic sensors of the present technology are sufficiently large and densely spaced such that the magnetic signal (SOI) sensed by the at least one sensor is below the target noise floor for a number of other sensors. Appropriate conversion means can accomplish transforming the sensor measurements into a common coordinate system by transforming each element of the array of measured magnetic field values to provide an array of modified magnetic field values. The signal processing includes signal processing of a spatially distributed sensor array.

Geomagnetic noise

The geomagnetic noise of considerable importance is due to the solar wind colliding with the outer atmosphere. This noise can be decomposed into weekly variations (slow fluctuations along the Earth's direction relative to the sun) and "Pc and Pi" noise. Pc and Pi noise is a time scale similar to the magnetic signal to be measured (a signal due to an object moving relative to a magnetic sensor when the object moves and the sensor does not move, the object does not move, the sensor moves, or some combination). Pc and Pi noise are considered to span the frequency range of 0.01 Hz and 5 Hz in a spectral shape proportional to 1 / f (f is frequency) in this band.

The characteristics of Pc and Pi noise can be investigated by comparing the generated model Pc and Pi noise with the characteristics of the empirical data. This model Pc and Pi noise can be generated, for example, by passing white Gaussian noise through a linear filter with this shape and passing a steep rolloff above and below this passband. Experimental data on amplitude are presented in J. Watermann and J. Lam, "Distribution of Magnetic Field Variations, Differences, and Residuals", SACLANTCEN, San Batrolomeo, IT, Tech. SR-304, February 1999 ("SACLANTCEN"), peak-to-peak values were measured and averaged for a time window of different length. The noise amplitude of the model data is adjusted to have similar peak-to-peak statistics. The comparison is shown in Fig. In Figure 85, the geomagnetic noise model is well compared with empirical data.

The SACLANTCEN paper also suggests that geomagnetic noise is highly spatially correlated over several tens of kilometers. Other sources discuss Pc and Pi noise at altitudes of about 100 km, and it is reasonable to expect a high correlation at distances greater than 10 km when measured at the surface or at sea level.

The signal

86 shows the corresponding signal due to the distortion of the magnetic field in the Z-direction by the unmanned underwater vehicle (UUV) against the magnetic field with time measured by a single magnetic sensor. 86 shows the measurement of the corresponding signal including noise-free corresponding signal and noise. As you can see, the signal is overwhelmed by noise.

87a-87c show the corresponding signal due to the distortion of the magnetic field in the Z direction by the unmanned underwater vehicle (UUV) for the magnetic field at three different times measured by the two-dimensional array of sensors, An array of magnetic field values. As you can see, the noise appears to be fairly flat in the area shown, except for the corresponding signal, the hill-valley pair (the presence of ferrous metal objects, the magnetic field distortion in the presence of UUV). The array used in the data set is a sensor array of 31x31 size arranged in 100x intervals, with 16 (row) and 16 (column) sensors in the center.

Removal of geomagnetic noise

In some aspects of the technique, methods and configurations for universal cancellation of geomagnetic noise are disclosed. The technique combines a precision vector magnetometer with large and dense sensor arrays, common coordinate system setting methods, high-frequency time-domain filtering, and noise cancellation using spatial correlation of noise. A large, compact sensor array is large enough so that many sensors are not affected by the signal and are positioned close enough so that the signal is detected by at least one sensor when the signal is present. In some implementations, the sensor array may include a 1-D (one-dimensional) or 2-D (two-dimensional) array of multiple precision vector magnetic fields. High-pass time-domain filtering can eliminate very slow variations in the order of a few hours or longer.

For ease of explanation, S is the signal defined by the local magnetic field change of interest to be measured, F is the signal of interest that is selected to be lower than the amplitude of S to be used in the definition of the signal of interest, . Let Rmax be the maximum influence region of S, defined by the maximum size and shape (1-D or 2-D) of the region where the amplitude of S can be greater than F. Let N be the time variance of the noise compared to S, but let S be the vector circumstance noise where the sample is spatially correlated with much less than F over a distance greater than twice the diameter of Rmax. Using the above definition, the vector magnetic sensor of this technology is more accurate than F so that the sensor noise is negligible compared to F. For this sensor array (1-D or 2-D), S is smaller than F for most sensors because S is larger than F and larger than Rmax for at least one sensor when the corresponding variation is present. The means for setting the common coordinate system can determine the orientation of the sensors relative to the local earth coordinate system to achieve a common coordinate system between the sensors. The spatial domain common mode rejection algorithm (CMRA) processes each sample of time in the array measurement and generates an array of values that preserves local variations greater than F, while reducing the residual error in N to an amplitude of less than F.

In at least one embodiment, the magnetic sensor is a DNV sensor. The measurement means of the orientation of the sensor may be a measurement of the earth's local magnetic field as one reference direction and an inclinometer (gravity) vector measurement as the second reference direction. In part, the CMRA includes subtracting the median value of the sensor array at each time point. The CMRA may further include a combination of identification of the region in which S may exist, noise estimation using measurements outside the region, and subtraction of the estimated noise. The identification of the region may be performed using a spatial gradient of a measured value that exceeds a selected threshold or a difference of a measured value from a median that exceeds the selected threshold. The noise estimate is a constant (for example, a mean of a measurement), a line (for a 1-D array), a plane (for a two-dimensional array), or a spline. In some implementations, the noise estimate may include a Kriging approach to estimate noise in the area from measured values outside that area.

Magnetic sensor array system

88 shows a magnetic sensor array system 8800 in accordance with an embodiment of the present invention. The system includes a magnetic sensor array 8830 that includes a controller 8810 and a plurality of magnetic sensors 8832. The spacing adjacent to sensor 8832 may be, for example, s. 88 shows a magnetic sensor 8832 to be arranged in a two-dimensional array, and the magnetic sensor 8832 can be arranged in a one-dimensional array or other dimensions. 88 also shows a 4 x 3 array of sensors 8832 for simplicity, and in general the array may be much larger or smaller.

The controller 8810 receives the measured magnetic field signals from each of the magnetic sensors 8832 and the magnetic field signals represent the magnetic field measured at each of the magnetic sensors 8832. Thus, the controller 8810 receives an array of magnetic field values. Controller 8810 may include a processor 8812 and a memory 8814. The magnetic field signal received by controller 8810 may be stored in memory 8814 as data. The memory 8814 is coupled to the processor 8810 such that the controller 8810 can perform various data processing operations such as establishing noise cancellation using a common coordinate system, high-frequency time- domain filtering, and spatially- You can save more commands that are executed by. Memory 8814 may include non-temporary computer readable media for storing instructions and data.

88 shows a single processor 8812 and a single memory 8814, but generally the controller 8810 may include one or more processors 8812 that perform various functions and may include more than one memory . The controller 8810 may also include sub-controllers arranged in a distributed manner.

The sensor 8832 may be, for example, a DNV sensor or other magnetic sensor, such as a Hall effect sensor.

Common coordinate system for magnetic sensors

The magnetic field measured by each of the magnetic sensors can be converted to a common coordinate system common to all the magnetic sensors. Thus, the measured magnetic field values are converted into an array of converted magnetic field values. 89A and 89B show a common coordinate system and a coordinate system corresponding to one of the magnetic sensors, respectively. As an alternative to transforming to a common coordinate system, the sensors may be arranged to be fixed relative to each other such that they are initially in a common coordinate system. This can be achieved, for example, by fixing the sensor to a rigid material.

In the coordinate system, the Z axis is considered to be "down ", i.e. the direction of the gravitational vector. In general, there may be very slight variations in the direction of the gravity vectors for different elements of the sensor array, but these changes are very small compared to the gravity sensor errors introduced in the sensor error model and are considered to be included in the sensor error model . The X axis is assumed to be perpendicular to the Z axis so that the local magnetic north vector is in the X-Z plane. Y is considered perpendicular to X and Z and provides the right coordinate system with Y pointing almost to the east.

90 shows the orientation sensor 9000 attached to the magnetic field sensor 8832. Fig. Each of the magnetic field sensors 8832 is in a common coordinate system, in the direction of the corresponding orientation sensor 9000, which measures the orientation of the magnetic field sensor 8832 relative to one or more directions, such as the Z-direction. Orientation sensor 9000 assists in achieving a common coordinate system for data from all sensors 8832. [ The orientation sensor 9000 may be a gravity sensor attached to a corresponding one of the sensors 8832. The orientation sensor 9000 may have its corresponding sensor 8832 in the same coordinate system.

It is assumed that the sensor 8832 is initially scattered in a random direction. The vector V of the general coordinate system X, Y, Z is then measured in the sensor coordinate system of the sensor as V _M = RV. Where R is the unit rotation matrix for the particular sensor 8832. In general, at the i, j positions of the array of arranged sensors, R can be specified as R ^{i, j} to represent the rotation matrix associated with the sensor at the i, j positions. Because it will be different for each i, j. When discussing a single sensor, the i, j notation can be omitted for simplicity.

The columns of R are the directions in which the X, Y, and Z components appear in the sensor coordinate system. To convert sensor measurements to X, Y, Z common coordinate system, it is simply related to R. That is, V = R ^T V _M , where R ^T R = I, is an identity matrix.

The magnetic measurement of each magnetic sensor 8832 is converted into a common coordinate system as follows. For each sensor, measure R as a coordinate system calibration step. This can be achieved in part, for example, by using a gravity sensor as orientation sensor 9000. [ Alternatively, the orientation can be taken based on the detection of the orientation of the stars. The magnetic measurement results are then obtained as transpose (R ^T ) of the rotation matrix to place the magnetic measurement in the X, Y, Z common coordinate system.

로 표시될 수 있으며, 따라서

로 표시된 추정된 R은 제 3 열의

를 갖는다. 마찬가지로,

의 제 1 열 및 제 2 열은 각각

및

로 표시될 수 있다. 따라서, 추정된

을 결정하는 것은

,

및

인

의 열을 추정함으로써 수행된다.The rotation matrix R can be estimated as follows. As mentioned, the third column of R is the vector direction of the sensor coordinate system due to the input in the Z direction. The estimated value in the Z direction in the sensor coordinates is

And therefore,

Lt; RTI ID = 0.0 &gt; R &lt; / RTI &gt;

. Likewise,

The first and second columns of

And

. &Lt; / RTI &gt; Therefore,

To determine

,

And

sign

&Lt; / RTI &gt;

값은 중력 센서일 수 있는 방위 센서(9000)로부터의 Z의 측정치로서 단순히 취해질 수 있다. 중력 센서로부터의 Z 측정은 Z의 실제 값에 센서의 회전 오차를 더한 값이 된다. 기존 비용 효율적인 중력 센서의 회전 오차에 대한 합리적인 경계는 0.01도이다.

The value may simply be taken as a measure of Z from orientation sensor 9000, which may be a gravity sensor. The Z measurement from the gravity sensor is the actual value of Z plus the rotation error of the sensor. A reasonable boundary for the rotational error of the existing cost-effective gravity sensor is 0.01 degree.

값은 지구의 국부 자기장에 의해 지배되는 센서(8832)의 자기 측정을 취하여 루틴 선형 대수학을 사용하여,

방향으로 성분을 제거한 다음 정규화함으로써 계산될 수 있다. 이것은 X에 가깝게 배열하고, 배열상의 자기 북쪽의 매우 작은 변화로 인한 사소한 오류와 작은 지자기 잡음 및 자기 센서 잡음 및

의 오류로 인해 대략 근사한다.

는

와

사이의 표준 교차 곱 계산으로 계산된다.

Value takes a magnetic measurement of the sensor 8832, governed by the earth's local magnetic field, and uses routine linear algebra,

Lt; / RTI &gt; can be computed by removing the component in the direction and then normalizing it. This is arranged in close proximity to X, with minor errors due to very small variations in magnetic north on the array, small geomagnetic noise,

Approximate due to the error of.

The

Wow

Lt; RTI ID = 0.0 &gt; cross-product &lt; / RTI &gt;

The accuracy of the conversion of the magnetic field measurements into the common coordinate system can be estimated as follows.

As an initial step, all the sensors are randomly and independently oriented, going through the following process. For each sensor: (1) a random vector having a uniform distribution is selected in the unit spheres to generate a rotation axis, (2) uniformly selected arbitrary angles in [-π / 3 radians, π / 3 radians] Determines an angle, and (3) generates an arbitrary rotation matrix for the sensor based on the selected rotation axis and rotation angle. For example, use known linear algebra techniques such as Rodrigues' rotation formula. This arbitrary rotation provides a true value for R ^{i, j} for each i, j sensor. The rotation is then applied to the magnetic field data set of the sensor to create a data set in the individual sensor coordinates that are not aligned.

는 다음과 같은 불완전성을 포함하여 개별적으로 계산되었다: (1) 각 센서마다 고유한 약 0.01 도의 중력 센서 회전 오차, (a) [-0.01도, 0.01도]에 걸쳐 균일한 분포로부터 회전 오차를 무작위로 추출하고, (b) 선택된 회전 오차만큼 Z 축으로 일렬로 나열된 단위 벡터를 Y 축 방향으로 회전하고, (c) [0, 2π]로부터 균등하게 제 2 회전 각도를 무작위로 추출하고, (d) 선택된 제 2 회전 각도만큼 원래의 Z 축을 중심으로 Z '를 회전하고, 및 (2) 모델링된 지자기 잡음 및 자기 센서 잡음의 단일 시간 샘플. 단일 시간 샘플은 지구 자기장(자기 북쪽) 값이 뉴욕시 근해의 한 위치를 기반으로 제공되도록 제공되었다. 이 위도에서는 자기 북쪽이 크게 기울어졌다. X, Y, Z 좌표에서, 사용된 지구 자기장 벡터는

마이크로 테슬러였다.For each magnetic sensor, for each i, j

(1) The gravity sensor rotation error of about 0.01 degrees unique to each sensor, (a) the rotation error from a uniform distribution over [-0.01 degrees, 0.01 degrees] (B) randomly extracting the second rotation angle from the [0, 2π] uniformly from (0), rotating the unit vector linearly aligned in the Z axis by the selected rotation error in the Y- d) rotating Z 'about the original Z axis by the selected second rotation angle, and (2) a single time sample of the geomagnetism noise and magnetic sensor noise modeled. Single time samples were provided so that the Earth's magnetic field (magnetic North) values were provided based on a location in New York City offshore. At this latitude, his northern side was greatly inclined. In the X, Y, Z coordinates, the geomagnetic field vector used is

It was a microtessler.

의 전치를 적용하여 공통 X, Y, Z 좌표계에 측정 값을배치했다. 이것이 모든 공통 모드 거부 알고리즘에 대해 아래에 사용된 데이터이다. 또한, 다음에 나오는 공통 모드 제거 알고리즘의 경우 측정된 자기장 값 배열에 적용된(시간/주파수 영역) 고역 통과 필터는 매우 느린(예를 들어, 몇 시간 동안 거의 일정한) 변동을 제거하므로 큰 자기장 북쪽 구성 요소가 없다. 여기에서 좌표계 보정의 경우 자북이 좌표 설정에 해당하므로 필터링되지 않은 자기 측정이 사용된다.For each sensor

And the measured values are arranged in the common X, Y, and Z coordinate system. This is the data used below for all common mode rejection algorithms. Also, in the case of the common-mode rejection algorithm discussed below, the (time / frequency domain) highpass filter applied to the measured magnetic field value arrays eliminates very slow (for example, There is no. Here, in the case of the coordinate system correction, since the magnetic north corresponds to the coordinate setting, unfiltered magnetic measurement is used.

. 어레이에서 E(최대 특이 값)의 유도된 2-노름(norm)은 일반적으로 약 0.0004이며 이는 1에 비해 매우 작다. 따라서 근사 R 역수는 매우 정확하다.As a final view of the accuracy of the common coordinates, the inverse of the inverse is determined by taking the following:

. The derived 2-norm of E (maximum singular value) in the array is generally about 0.0004, which is very small compared to one. The approximate R inverse is therefore very accurate.

)가 제공되고, 그런 다음 센서 측정으로 변환된 다음 센서 측정치가 실제 X, Y, Z 좌표계에서

=

인 공통 좌표계 데이터 세트로 변환된다(불완전함). In summary, applying a random sensor rotation and approximate correction to a common coordinate system results in substantially high pass (DC removal) magnetic field data in the X, Y, Z coordinate system

), Then converted to sensor measurements, and then the sensor measurements are taken from the actual X, Y, Z coordinate system

=

(Common) coordinate system data set (incomplete).

Common mode cancellation algorithm to recover the signal

Figures 91a-91i illustrate an array of measured magnetic field values comprising a noise free magnetic signal in a scenario in which one UUV moves past the sensor array, Figures 93a-93i illustrate an array of measured magnetic field values comprising two Gt; UUV &lt; / RTI &gt; 91A to 91C show magnetic field measurement components along the X direction, the Y direction and the Z direction in 500 seconds, respectively. 91D to 91F show magnetic field measurement components along the X direction, the Y direction and the Z direction at a time of 1000 seconds, respectively. 91 g to 91 i show the magnetic field measurement components along the X direction, the Y direction and the Z direction at 1500 seconds, respectively. Figs. 93A to 93I correspond to Figs. 91A to 91I in the case of two UUVs, respectively. These are the corresponding signals that need to be recovered when all sensor faults and noise are included.

When recovering the signal, all noise sources and sensor errors are first included in the magnetic field measurement data set in the manner described above. An algorithm is used to generate the common coordinate system, and various CMRAs are applied. To visualize the effect of the results, the results from a single sensor are displayed over time. Here, the left plot is the corresponding signal without measurement and the measured value at the sensor (see FIG. 93A). It is clear that the signal is not visible without the geomagnetic noise removed. An intermediate plot (see, for example, FIG. 93B) shows the results on the same sensor. This plot shows the noise-free perfect signal and the output of the CMRA after noise cancellation. For all CMRA algorithms, the reconstruction is almost perfect in the middle plot. However, the correct plot (see, for example, Figure 93c) shows the difference between the two lines of the central plot (noise-free and reconstructed) on different scales to show that the reconstruction is not really perfect. For ease of explanation, only the results of the magnetic field along the X direction are shown in the left, middle and right plots, and the magnetic field can of course be reconstructed in the Y-direction and in the Z-direction. Actual results actually vary depending on the specific noise level and other errors.

Intermediate subtraction algorithm

According to the intermediate subtraction algorithm, the median value of the magnetic field for all sensors in the array is determined for each of the X, Y, and Z coordinates, and the median is subtracted from the magnetic field data set. Thus, the median value of the magnetic field values is taken as an estimate of the spatially correlated background noise and subtracted from the converted magnetic field value to provide the noise canceling magnetic field value. Since noise is highly correlated spatially and the signal is less than half the array, the median is a reasonable measure of geomagnetic noise. FIGS. 93A-93C show the results for an intermediate subtraction approach, with FIG. 93A showing the self-measurement at one of the sensors and the corresponding noise-free signal over time. FIG. 93B shows the result on the same sensor after noise cancellation and the corresponding noise-free signal, and FIG. 93C shows the difference in the two lines (noise-free and reconstructed) of FIG. 93B. 94A to 94C show magnetic fields containing the corresponding signals in the X direction relative to the array at times of 500, 1000, and 1500 seconds, respectively, as compared to the noise free signals shown in FIGS. 91A, 91D, And exhibits excellent suitability.

Spatially correlated noise in the region

The spatially correlated noise in the region where the region provides the signal can be estimated and subtracted from the magnetic field measurements in that region. There are several ways to estimate spatially correlated noise, and examples are provided below. In general, the spacing of the sensors and the size of the array of sensors ensures that portions of the sensors 8832 are not in the area. The percentage of sensors outside that area may be, for example, 50% or more.

For each of the examples, the following steps are taken. First, the "corresponding area" is set. Here, the area is a magnetic sensor having a corresponding signal. The magnetic measurement is because the local deviation from the spatial correlation noise is displayed above a predetermined threshold. The array elements in which the corresponding signal exists in the corresponding area are adjacent to each other. Second, the region is excluded from the region where the remaining measurement is to be performed (the remaining magnetic sensor is not part of the region), providing the remaining array of converted magnetic field values, and the remaining measurements are used to estimate the geomagnetism noise . Finally, the estimated geomagnetic noise is subtracted from the entire area (corresponding area + remaining area) covered by the magnetic sensor array (all magnetic sensors) including the signal.

One way to identify the signal is as follows. The median measured magnetic field is subtracted across the array from each magnetic sensor and a predetermined amplitude threshold (such as .01 nT in this example) is applied. The magnetic sensor value exceeding the threshold value is assumed to be the corresponding signal in the corresponding region.

Optionally, the area may be slightly extended using an extension technique. Since the magnetic field change does not change suddenly, the area can be expanded. For example, the area may be expanded using a set closure algorithm based on erosion after expansion using standard morphological image processing techniques and then taking the convex hull of the resulting area.

95A to 95C show an example of the corresponding region for the magnetic field component in the X-direction at 500, 1000 and 1500 seconds, respectively. In each case, the bright color area is the "core" area, ie the value deviates from the median value of the array so that the measured value exceeds the threshold value. The darker areas are the additional sensors included in the area as a set closure and convex hull result. Alternatively to the closed and convex hull configuration of the zone, the zone takes the union of zones according to the magnetic field components in the X, Y and Z directions, or uses 2-gambling of the vector values in the critical phase.

Once the area is identified, the area is removed and the remaining data is suitable, such as for example, fitting to a plane or fitting to a secondary spline. And provides geomagnetism magnetic noise estimates that are available in the entire region including the identified regions. Instead of fitting to a plane or decimal spline, a kriging technique can be applied to the removed data to calculate the noise estimate for that region.

96A, 96B and 96C illustrate the fit of the plane to the data for the magnetic field component in the X direction, and 96A, 96B and 96C correspond to times of 500, 1000 and 1500 seconds. In Figures 96a, 96b and 96c, the mating plane is a mesh sheet and the specific sensor measurement is a dot. The dots darken the plane to some extent, but in all cases the plane is appropriate. There are several points near the area that are not near the plane. This is because it is affected by the signal but is also close to the closure and outside the convex hull, which affects the level below the threshold and increases the area. For example, in spite of the exceptional sensor measurements, there are other sensor elements that are sufficient for noise estimation to be effective. Larger extensions of the area may be used, but are not needed in this example.

97A, 97B and 97C show the results for the X-directional magnetic field components obtained by the plane estimation of the noise, and Fig. 97A shows the magnetic measurements and the corresponding noise-free signals at one of the sensors, do. FIG. 97B shows the result on the same sensor after noise reduction and the corresponding noise-free signal, and FIG. 97C shows the difference in the two lines of FIG. 97B (noise-free and reconstructed) with different accumulations. As you know, noise cancellation works well.

98A, 98B and 98C illustrate the fitting of the secondary spline to the data for the magnetic field component in the X direction, and 98A, 98B and 98C correspond to times of 500, 1000 and 1500 seconds. In Figures 98A, 98B and 98C, the fitting secondary spline is a mesh sheet and the specific sensor measurement is a dot.

Figures 99a, 99b and 99c show the results for the X-directional magnetic field components obtained by subtracting the second order spline estimate of the noise. FIG. 99A shows the self-measurement at one of the sensors and the corresponding noise-free signal over time. FIG. 99B shows the result on the same sensor after noise cancellation and the corresponding noise-free signal, and FIG. 99C shows the difference in the two lines of FIG. 99B (noise-free and reconstructed) with different accumulations.

Example with two UUVs

An example with two UUVs is now described. 100a. As described in connection with Figures 100b and 100c, the two corresponding regions corresponding to each of the two UUVs are first identified in a manner similar to that described above with respect to a single UUV. The area is expanded using a block algorithm based on the expansion followed by erosion using standard morphological image processing techniques and takes the convex hull of the resulting area.

Figures 100a to 100c show corresponding regions in the example for magnetic field components in the X-direction at 500, 1000 and 1500 seconds, respectively. In each case, the bright color area is the "core" area, ie the value deviates from the median value of the array so that the measured value exceeds the threshold value. The darker areas are the additional sensors included in the area as a set closure and convex hull result. As can be seen, the two corresponding regions are identified and each region corresponds to the other of the two UUVs. As can be seen, the regions are first separated as shown in Fig. 100A, overlapped in Fig. 100B, and then separated again in Fig. 100C, which implies that the two UUV are moving to pass each other.

Once the areas are identified, they are removed and the remaining data is suitable, such as fitting to a plane or fitting to a secondary spline. And provides geomagnetism magnetic noise estimates that are available in the entire region including the identified regions. Instead of fitting to a plane or decimal spline, a kriging technique can be applied to the data from which the corresponding region is removed to yield a noise estimate for that region.

101A, 101B and 101C illustrate the fitting of the secondary spline to the data for the magnetic field component in the X direction for both UUV cases, where 101A, 101B and 101C correspond to times of 500, 1000 and 1500 seconds. 101A, 101B and 101C, the fitting secondary spline is a mesh sheet and the specific sensor measurement is a dot.

Figures 102a, 102b and 102c show the results for the X direction magnetic field components obtained by subtracting the secondary spline estimate for two UUV cases. FIG. 102A shows the self-measurement at one of the sensors and the corresponding noise-free signal over time. FIG. 102B shows the result on the same sensor after noise cancellation and the corresponding noise-free signal, and FIG. 102C shows the difference in the two lines (noise-free and reconstructed) of FIG. 102B in different accumulations.

Diamond Nitrogen Vacuum Sensor with Diamond Circuit

A DNV magnetic sensor having a sensor assembly that provides a number of advantages over a magnetic sensor system in which an optical excitation source, an RF excitation source, and a photodetector are both formed on different substrates or individually mechanically supported is described below. The described sensor assembly provides a diamond NV sensor system in a single small homogeneous device. The optical excitation source and optical detector are provided on the same assembly substrate, such as the same silicon substrate, to reduce overall system cost, size and weight. Providing the RF excitation source directly to the NV diamond material reduces the overall system size and weight. Providing a direct optical detector to the NV diamond material improves system efficiency by reducing the amount of red fluorescence emitted from the surrounding NV center. Providing the light excitation source directly to the NV diamond material can increase the amount of optical excitation light by greatly reducing the amount of optical excitation light lost to the environment. The direct coupling of the optical excitation source, the RF excitation source and the optical detector to the NV diamond material significantly reduces the size, making it an NV diamond sensor that can be used in small consumer and industrial applications.

A base substrate 10310 and a diamond assembly 10320 of an NV centered magnetic sensor according to one embodiment or a sensor assembly 10300 generally comprising a material assembly is shown in Figures 103a, 103b, 104a, 104b, 104c And FIG. Figures 103A and 103B illustrate an upper perspective view and a lower perspective view of the sensor assembly 10300, respectively. Figs. 104A and 104B respectively show an upper perspective view and a lower perspective view of the diamond assembly 10320. Fig. Fig. 104C shows a side view of the assembly substrate 10350 of the diamond assembly 10320. Fig. 105 is a plan view of the diamond assembly 10320. FIG.

The sensor assembly 10300 includes a base substrate 10310 and a diamond assembly 10320 disposed on the base substrate 10310. The sensor assembly 10300 further includes a chip-type power / logic circuit 10330 mounted on the base which includes a top surface 10312 adjacent to the diamond assembly 10320 and a bottom All on the surface 10314, and mounted on the base substrate 10310. For example, an attachment element 10340, such as a screw, extending from the base substrate 10310 couples the sensor assembly 10300 to an additional component. The base substrate 10310 may be, for example, a printed circuit board (PCB).

The diamond assembly 10320 has an assembled substrate 10350 and an NV diamond material 10352 or other magnetically optically deficient center material having a magnetic-optical defect center, which is formed on the assembly substrate 10350. As best shown in Figs. 104A and 105, the diamond assembly 10320 includes a plurality of light excitation sources 10354 and a plurality of photodetectors 10356 embedded on or in an assembly substrate 10350. An RF excitation source 10358 is formed on the NV diamond material 10352, and an RF connector 10360. The light excitation source 10354 and the RF excitation source 10358 are generally electromagnetic excitation sources.

As shown in Figs. 103A, 104A, and 105, the optical excitation source 10354 and the optical detector 10356 can be alternately arranged like the illustrated checkerboard array. Figures 103A, 104A and 105 illustrate an arrangement with four light excitation sources 10354 and 5 light detectors 10356, and a different number of light excitation sources 10354 and light detectors 10356 are considered . The alternating arrangement of optical excitation source 10354 and photodetector 10356 improves system efficiency by reducing the amount of red fluorescence emitted by the NV diamond material 10352 lost around it. The optical excitation source 10354 and the optical detector 10356 may be alternately arranged.

In Figures 104B and 104C the lower surface 10362 of the assembly substrate 10350 opposite the upper surface 10366 adjacent to the NV diamond material 10352 has a plurality of connection pads 10364. [ A conductive piercing connection 10368 connects the connection pad 10364 to the top surface 10366 and to the optical excitation source 10354 and to the plurality of optical detectors 10356 to control the optical excitation source 10354, And receives an optical signal from the detector 10356. The power / logic circuit 10330 includes a connection pad 10364 that allows control of the optical excitation source 10354 via wiring 10334 on the base substrate 10310 and receives optical signals from the plurality of photodetectors 10356, As shown in FIG. When the power / logic circuit 10330 is mounted on the bottom surface 10314 of the base substrate 10310, the wiring 10334 may extend through the base substrate 10310 to the power / logic circuit 10330 .

The power / logic connector 10332 is electrically connected to the power / logic circuit 10330. The power / logic connector 10332 is coupled to a power / logic circuit (not shown in FIGS. 103A-105), such as controller 680 shown in FIG. 6, And a plurality of connectors 10333 for connecting the plurality of connectors 10330 to each other. The control functions can be divided between the power logic circuits 10330 and the external controller. Similarly, the RF connector 10360 is configured to couple the RF excitation source 10358 to a power source external to the sensor assembly 10300 and a controller (not shown in Figures 103a-105), such as the controller 680 shown in Figure 6 do.

Assembly substrate 10350 may be a semiconductor material, such as silicon, in which a plurality of optical excitation sources 10354 and a plurality of optical detectors 10356 are formed. The assembled substrate 10350 may be, for example, a silicon wafer. The optical excitation source 10354 may be, for example, a laser diode or a light emitting diode (LED). The optical excitation source 10354 emits fluorescence to excite the fluorescence in the NV diamond material 10352, and may emit green, for example, at a wavelength of about 532 nm or 518 nm. Preferably, the excitation light is not red light so as not to interfere with the acquired and detected red fluorescence light. Optical detector 10356 detects light and detects light in the red fluorescent zone of NV diamond material 10352 in particular. Optical excitation source 10354 and optical detector 10356 may be formed on a single silicon wafer as assembly substrate 10350 using fabrication techniques known for silicon manufacturing such as doping, ion implantation, and patterning techniques.

The power / logic circuit 10330 and the power / logic connector 10332 are mounted on a base substrate 10310, which may be a PCB. The mounting can be performed by, for example, soldering. Once the optical excitation source 10354 and optical detector 10356 are formed on the assembly substrate 10350, the NV diamond material 10352 is attached to the assembly substrate 10350.

An RF excitation source 10358 may be formed on the NV diamond material 10352 in the form of a coil, for example, as shown in Figure 104A. The RF excitation source 10358 operates as a microwave RF antenna. An RF excitation source 10358 may be formed by forming a metallic material on the NV diamond material 10352 and then patterning the metallic material. The metal material can be patterned, for example, by a photolithography technique.

106A and 106B, the metallic material is first formed by forming a thin film seed layer 10370 on the NV diamond material 10352 and then depositing film metallization 10372 on the seed layer 10370 May be formed on the NV diamond material 10352. [ Seed layer 10370 may be, for example, TiW, and film metallization 10372 may be, for example, Cu. Once the seed layer 10370 and the film metallization 10372 are formed, they are patterned to form the RF excitation source 10358 in the form of a coil, for example, by photolithography techniques. An RF connector 10360 is formed at one end of a coiled RF excitation source 10358.

The sensor assemblies described herein provide many advantages over magnetic sensor systems in which an optical excitation source, an RF excitation source, and a photodetector are both formed on different substrates or individually mechanically supported. The described sensor assembly provides a diamond NV sensor system in a single small homogeneous device. The optical excitation source and photodetector are provided on the same assembly substrate, such as the same silicon substrate, to reduce overall system cost, size and weight. Providing the RF excitation source directly to the NV diamond material reduces the overall system size and weight. Providing a direct optical detector to the NV diamond material improves system efficiency by reducing the amount of red fluorescence emitted from the surrounding NV center. Providing the optical excitation source directly to the NV diamond material can increase the amount of photoexcitation light by greatly reducing the amount of optical excitation light lost to the environment. The direct coupling of optical excitation sources, RF excitation sources and optical detectors to NV diamond materials significantly reduces size, resulting in NV diamond sensors that can be used in small consumer and industrial applications.

107A and 107B illustrate a diamond assembly according to another embodiment. In this embodiment, an RF excitation source 10358, which may include a first RF excitation source 10358a and a second RF excitation source 10358b, is disposed in a plane of the NV diamond material 10352 relative to the NV diamond material 10352, It is bigger. A first RF excitation source, a second RF excitation source 10358b, is on opposite sides of the NV diamond material 10352. The plane of the NV diamond material 10352 is horizontal and enters the Fig. 107A page, parallel to the page of Fig. 107B. Although Figures 107a and 107b illustrate two RF excitation sources 10358a and 10358b, only one RF excitation source may be provided. The diamond assemblies of FIGS. 107A and 107B may further include a photodetector 10356 and an optical excitation source 10354 in a manner similar to the previously described embodiment.

The shapes of the first RF excitation source 10358a and the second RF excitation source 10358a may be helical as shown in Figure 107a (similar to Figures 103a, 104a, and 105). The helical shape provides the highest magnetic field with low driving force to provide excellent efficiency. In addition, the helical shape allows the coils of the RF excitation source to be larger, allowing a more uniform magnetic field for larger devices.

The size of the first RF excitation source 10358a and the second RF excitation source 10358a in the plane of the upper surface 10380 of the NV diamond material 10352 is greater than the size of the upper surface 10380 in the plane. The larger size allows for a more uniform magnetic field provided by the RF excitation sources 10358a and 10358b applied to the NV diamond material 10352. [ In this regard, the RF excitation sources 10358a and 10358b include a support material 10700 that is laterally adjacent to the NV diamond material 10352 in the NV diamond material 10352 support material. The support material may be, for example, a material other than diamond, or may be a diamond that is substantially NV-free. The size of the first RF excitation source 10358a and the second RF excitation source 10358a in the plane of the top surface 10380 of the NV diamond material 10352 is greater than the size of the detector area 10702 including the photodetector 10356 Lt; / RTI &gt;

High magnetic sensitivity through fluorescence manipulation by optical spectrum control

In some aspects of the technique, methods and systems are disclosed for providing higher magnetic sensitivity magnets through fluorescence manipulation by photon spectral control. In the case of a diamond nitrogen vacancy sensor, the optical contrast between the resonant microwave frequency and the off resonant frequency basically determines the sensitivity. The total fluorescence of the system is the combination of the desired negatively charged NV center (NV-) and magnetically neutral non-charged NV center (NV ⁰ ). The technique can manipulate the photon spectra to change the photon sideband of the NV ⁰ and NV ^- centered fluorescence spectra. During operation at room temperature, the NV ⁰ fluorescence spectrum overlaps the NV ^- spectrum. Therefore, by changing the photon mediated spectrum raises the separation between these overlapping spectral filter the magnetometer system and / or is used in conjunction with the data output from the magnetometer device NV while filtering the undesired spectrum of NV ⁰ photon ^{emission-photon} emission Lt; / RTI &gt;

With respect to DNV spectroscopy, the optical contrast is defined by the ratio of NV ^- photon emission to total fluorescence. Total fluorescence is the ratio of photon emissions delivered to the scattered optical drive, such as NV ⁰ photon emission, NV ^- photon emission, and absorbed into DNV diamond or other nitrogen vacancies. Optical drives are traditionally more energy-efficient and narrower, making filtering easier. Most of the NV ⁰ center and NV ^- center fluorescence from the photon sideband is a function of energy versus momentum (E vs. k). That is, ⁰ NV center resulting from photon sideband and NV ^- the central fluorescence is a function of the momentum imparted by the photon helping electronic transition in the valence and conduction bands in the applied optical drive. Thus, the width and shape of the spectral content of photon emission is a function of the combination of the photon spectra and the deviation of E and k.

At room temperature, since the photon spectra are dominated by temperature, the fluorescence at the wavelengths of NV ⁰ photon emission and NV ^- photon emission overlap. By controlling the photon spectra, the response fluorescence spectrum can be changed to narrow the wavelength spectral profile of NV ⁰ photon emission and NV ^- photon emission. By narrowing the spectral profile, the peak of NV ⁰ photon emission at a particular wavelength and the NV-photon emission at another specific wavelength exhibit a clearer difference in fluorescence intensity peak based on the large separation of the NV ⁰ and NV ^- spectra. A more clearly defined fluorescence intensity peak allows for a filter such as a long pass filter to filter out unwanted NV ⁰ photon emissions to increase the optical contrast to the rest of the NV ^- photon emission.

NV ⁰ and NV ^- spectra can be manipulated through diamond shape optimization, which affects the photon excitation and the photon spectra experienced by NV ⁰ center and NV ^- center. For example, acoustical drive can increase and / or control the photon spectrum by generating photons within the lattice structure of the diamond at a particular frequency or a specific set of frequencies. The generation of photons at a particular frequency can narrow the photons experienced by the NV centers in the diamond, thereby reducing the effects of other photons, such as those introduced on the basis of the temperature of the material, e.g., lattice vibration. As the range of photons experienced by the NV center becomes narrower, more sophisticated wavelength intensity peaks for NV ⁰ photon emission and NV ^- photon emission may occur. Thus, by acoustically driving the diamond at a particular frequency, the bandwidth of the NV ⁰ and NV ^- spectra can be narrowed to allow optical filtering. In some implementations, the shape of the diamond can be modified to enhance the photon spectrum by correcting the resonance of the diamond. The resonance of the diamond can also narrow the photons experienced in the NV ⁰ and NV ^- centers. In some other implementations, the optical drive applied to the diamond of the DNV sensor may be matched with the NV ⁰ zero photon line to reduce photon sidebands.

108 is a graphical representation 10800 showing an example of a DNV optical fluorescence spectrum from NV ⁰ centers and NV ^- centers. For DNV-based optical detection magnetic resonance (ODMR) sensors, meaningful signals represent resonant energy levels due to NV ^- state fluorescence changes. However, the inactive NV ⁰ fluorescence spectrum 10820 overlaps with the desired signal of the NV ^- fluorescence spectrum 10810. Thus, for much of the NV ^- fluorescence spectrum 10810, the NV ⁰ fluorescence spectrum 10820 increases noise, ultimately the noise floor and reduces the magnetic field sensing sensitivity. Most of the spectral content of the NV fluorescence spectrum is the result of photon mediated transformation. In partial materials such as indirect bandgap materials, exciton recombination requires the absorption of photons and the emission of photons. The emitted photons are the fluorescence of the NV ^- fluorescence spectrum 10810 and / or the NV ⁰ fluorescence spectrum 10820 shown in FIG. Room temperature diamonds have a Boltzmann distribution of photon energies determined by the vibration and temperature experienced in the diamond lattice structure, producing a broad photon spectrum that can be experienced at the NV ⁰ and NV ^- centers of the diamond. Thus, the broad photon spectrum results in a broad bandwidth of the NV ^- fluorescence spectrum 10810 and the NV ⁰ fluorescence spectrum 10820, as shown in FIG. The NV ^- fluorescence spectrum 10810 and the NV ⁰ fluorescence spectrum 10820 are superimposed, resulting in increased signal background and lower optical contrast.

ω이며, 여기서

는 판 상수(Plank constant)이고, ω는 2πf와 같은 각 주파수이다. 여기서 f는 주파수이다. 따라서, 광학 드라이브(10930)가 제로 광자 선(zero phonon line, ZPL)(10940)을 따라 적용될 때, 형광 광자(10950)가 방출될 때 형광 스펙트럼은 ZPL 주파수에서 단일 피크를 포함할 것이다. 진동 에너지가 음향 드라이버와 같은 낮은 온도에서 다이아몬드에 도입되면, 추가된 진동 에너지는 광자 보조 전이에 대한 도면(10900)의 운동량 방향으로 전자에 전달될 수 있는 광자 에너지(

_phonon)를 발생시킨다. 광자 구동 전자들로부터 방출된 결과적인 형광 광자(10950)는 구동된 진동 주파수에 대한 제 2 피크를 초래한다. 구동된 진동 주파수는 실온에서 광자 스펙트럼을 좁히도록 조절될 수 있으며, 이에 의해 실온에서 다이아몬드로부터 방출된 광자(10950)에 대한 형광 스펙트럼을 좁힌다. 몇몇 구현에서, 다이아몬드의 형상은 다이아몬드의 공진을 개별적으로 또는 구동 진동 주파수에 추가하여 광자 스펙트럼을 조작하도록 변형될 수 있다.109 shows an energy versus momentum plot 10900 for the indirect bandgap of the diamond of the DNV sensor showing the valence band 10910 and the conduction band 10920. FIG. When the optical drive 10930 is applied to and absorbed by the electrons in the valence band 10910, the excited electrons rise to the conduction band 10920. Photons are emitted when electrons return to the ground state from the conduction band 10920 through recombination. When the electrons in the diamond of the DNV sensor recombine at various points of the conduction band 10920 due to the photon sideband, the fluorescence spectrum of the photon 10950 is emitted as shown in FIG. In some implementations, matching optical drive frequency 10930 with zero photon line (ZPL) 10940 may reduce the photon sideband, thereby increasing optical contrast. However, at low temperatures such as near 0 Kelvin, the oscillation energy due to temperature is minimized, minimizing photon sidebands. The resulting photon energy is

ω, where

Is a plank constant, and ω is an angular frequency such as 2πf. Where f is the frequency. Thus, when the optical drive 10930 is applied along a zero phonon line (ZPL) 10940, the fluorescence spectrum will contain a single peak at the ZPL frequency when the fluorescent photons 10950 are emitted. If the vibrational energy is introduced into the diamond at a low temperature, such as an acoustical driver, the added vibrational energy is the photon energy that can be transferred to the electron in the direction of the momentum of the figure 10900 for the photon-

_phonon . The resulting fluorescent photons 10950 emitted from the photon driving electrons result in a second peak to the driven oscillation frequency. The driven oscillation frequency can be adjusted to narrow the photon spectrum at room temperature, thereby narrowing the fluorescence spectrum for photons (10950) emitted from the diamond at room temperature. In some implementations, the shape of the diamond can be modified to manipulate the photon spectrum by adding the resonance of the diamond individually or in addition to the drive oscillation frequency.

110 is a graph (11000) showing the NV ⁰ and NV ^- photon intensity spectra for wavelengths by fluorescence operation. 110, since the desired signals of the NV ^- fluorescence spectrum 11010 and the inactive NV ⁰ fluorescence spectrum 11020 control the photon spectra that change the response fluorescence spectrum, a narrow bandwidth for the peak at a certain frequency . Photonic spectral manipulation can be controlled through acoustical drive and / or diamond size and / or shape optimization. Narrow bandwidth peaks allow greater separation between the NV ⁰ and NV ^- spectra, allowing filtering to be used to increase optical contrast. For example, a filter such as a long pass filter can be used to filter out unwanted NV ⁰ photon emissions while filtering the minimum amount of NV ^- photon emissions to increase optical contrast. The technique controls the spectral content by providing a device that can control the photon content in the diamond. This allows for better background suppression and overall better optical contrast. Optical contrast can be directly related to overall system sensitivity. For example, by a narrower bandwidth peak for the NV ^- fluorescence spectrum 11010, a smaller change in magnitude of the external magnetic field can be detected. In some cases, by controlling the photon spectra in the diamond, optical contrast approaching the theoretical limit of about 25% can be achieved.

111 also shows a method 11100 for fluorescence manipulation of diamond with nitrogen vacancies through photonic spectral manipulation using an acoustical driver. The method 11100 includes providing diamond and acoustic drivers with nitrogen vacancies (block 11102). The diamond with nitrogen vacancies may be part of a DNV sensor that includes a photodetector configured to detect photon emission from the diamond in response to laser excitation of the diamond. The acoustic driver may be a piezoelectric acoustic driver or any other acoustic driver for inducing vibration in the diamond. In some implementations, an acoustical actuator may be coupled to the diamond to impart vibrational energy directly to the diamond, or indirectly impart vibration energy to the diamond, spaced apart from the diamond. In some implementations, an acoustic driver can be placed relative to the diamond to drive the diamond parallel to the nitrogen vacancy in the lattice of the diamond.

The method 11100 may include changing the shape and / or size of the diamond (block 11104) to manipulate the photon spectrum based on the resonance of the diamond. The shape of the diamond can be modified to change the internal resonance of the diamond so that photons generated from the oscillation energy imparted on the basis of temperature to the photon spectrum can be narrowed. In some cases, the size of the diamond can also be modified to alter the resonance to manipulate the photon spectrum.

The method 11100 further includes acoustically driving the diamond with the acoustic driver to manipulate the photon spectrum (block 11106). Acoustically driving a diamond can include operating the acoustic driver at a specific frequency to narrow the photon spectrum. In some implementations, the acoustic driver may be a piezoelectric acoustic driver. In some implementations, an acoustic driver can be placed relative to the diamond to drive the diamond parallel to the nitrogen vacancy in the lattice of the diamond.

The method may include applying a long pass filter to filter the NV ⁰ photon emission from the NV ^- photon emission (block 11108). Filters such as the long pass filter can be used to filter unwanted NV ⁰ photon emissions while filtering the minimum amount of NV ^- photon emissions to increase optical contrast. In some implementations, the long pass filter can be integrated into the photodetector of the DNV sensor and / or can be applied to the data output from the photodetector.

112 also shows a method 11200 for determining the acoustic drive frequency for photonic spectral operation on a DNV sensor. The method 11200 may include applying the diamond of the DNV sensor to zero Kelvin (block 11202). The diamond of the DNV sensor may include nitrogen vacancies and the DNV sensor may comprise a photodetector configured to detect photon emission from the diamond in response to laser excitation of the diamond. Applying the diamond near 0 Kelvin may include cold cooling the diamond to a temperature near 0 Kelvin.

The method 11200 includes acoustically driving a diamond having a nitrogen vacancy of the DNV sensor at a first frequency using a sound driver (block 11204). Acoustically driving a diamond can include operating the acoustic driver at a specific frequency to narrow the photon spectrum. In some implementations, the acoustic driver may be a piezoelectric acoustic driver. In some implementations, an acoustic driver can be placed relative to the diamond to drive the diamond parallel to the nitrogen vacancy in the lattice of the diamond. The first frequency may be a randomly selected frequency, a frequency within the frequency range, and / or a frequency based on the frequency response output.

The method 11200 includes detecting a first set of NV ⁰ photon emissions and a first set of NV ^- photon emissions from the DNV sensor (block 11206). Detection of the first set of NV ⁰ photon emissions and the first set of NV ^- photon emissions from the DNV sensor may include receiving and processing data from the photodetector of the DNV sensor. In some implementations, a first set of NV ⁰ photon emissions and a first set of NV ^- photon emissions from the DNV sensor may form a spectrum as shown in FIGS. 108 and 110.

The method 11200 includes acoustically driving a diamond having a nitrogen vacancy of the DNV sensor to a second frequency using an acoustical driver (block 11208). The second frequency may be a randomly selected frequency, a frequency within the frequency range, and / or a frequency based on the frequency response output.

The method 11200 includes detecting a second set of NV ⁰ photon emissions and a second set of NV ^- photon emissions from the DNV sensor (block 11210). Detection of the second set of NV ⁰ photon emissions from the DNV sensor and the second set of NV ^- photon emissions may include receiving and processing data from the photodetector of the DNV sensor. In some implementations, a second set of NV ⁰ photon emissions and a second set of NV ^- photon emissions from the DNV sensor may form a spectrum as shown in FIGS. 108 and 110.

Method (11200) is NV ⁰ photon claim peak and NV of the second set of discharge from the DNV ^{sensor-driving} the diamond to acoustic driver acoustically for operating the photon spectrum on the basis of the wavelength difference between the two sets of photon release (Block 11212). &Lt; / RTI &gt; The selection of the second frequency may be based on a second frequency that produces a fluorescence spectrum similar to that of FIG. In some implementations, method 11200 may include applying a long pass filter to filter NV ⁰ photon emissions from the NV ^- photon emission detected by the photodetector. In some implementations, method 11200 may include modifying the shape of the diamond to manipulate the photon spectrum based on the resonance of the diamond.

Magnetometer with light pipe

In many cases, a light source is used to provide light to the diamond. The more light transmitted through the diamond, the more light is sensed and analyzed to determine the amount of red light emitted from the diamond. The amount of red light can be used to determine the intensity of the magnetic field applied to the diamond. In some cases, the photodetector used to detect red light (or any suitable wavelength) is sensitive to electromagnetic interference (EMI). In some cases, however, electromagnetic signals can be emitted from electrical components near the diamond. In this case, the EMI of the diamond assembly may affect the optical detector.

In some cases, the EMI glass can be used to isolate and / or absorb EMI signals from the diamond assembly (or associated electronics or signal). Thus, if EMI glass is disposed between the diamond and the optical detector, the amount of EMI affecting the optical detector can be reduced. To increase the sensitivity of the magnetometer, you can increase the amount of light emitted by the diamond that the optical detector detects. Thus, in some cases the sensitivity of the magnetometer is reduced by the inefficient transmission of light between the diamond and the optical detector. In many cases, EMI glass is an inefficient light transmitter. For example, metals embedded in an EMI glass can absorb, block, or reflect light passing through the EMI glass.

In some embodiments, the EMI shield may be used to shield EMI from the diamond assembly. In such an embodiment, the EMI shield may include holes that allow light to pass through or from the diamond. Depending on the hole size of the EMI shield, partial EMI can pass through the hole. Therefore, the smaller the hole, the less EMI will pass.

In some cases, a light pipe may be used to transmit light through the aperture in the EMI shield. For example, light from a light source may pass through a diamond and through an aperture in an EMI shield. The light is acquired by the light pipe and travels through the light pipe to the photo detector. In general, a light pipe is effective when transmitting light. Thus, a relatively high proportion of light emitted from the diamond can be transmitted to the photodetector. Any suitable light pipe (e. G., Homogenizing rod) may be used.

113A is a block diagram of a magnetometer with a light pipe according to one embodiment. The exemplary magnetometer 11300 includes a light source 11305, a diamond 11315, a light pipe 11325, a photodetector 11335, and a shield 11345. In alternative embodiments, additional, fewer and / or different elements may be used.

As described above, the magnitude of the magnetic field applied to the diamond 11315 by the magnet 11340, for example, can be determined by measuring the amount of red light of the light emitted from the diamond 11315. [ The light source 11305 emits the source light 11310 to the diamond 11315. In some embodiments, one or more components can be used to focus the source light 11310 onto the diamond 11315. [ Light passes through diamond 11315 and modulated light 11320 passes through a hole in shield 11345. To pass through the hole in the shield 11345, the modulated light 11320 passes through the light pipe 11325. The transmitted light 11330 passing through the hole of the shield 11345 exits the light pipe 11325 and the photodetector 11335.

Any suitable photodetector 11335 can be used. In an exemplary embodiment, the photodetector 11335 includes one or more light emitting diodes. In some embodiments, the photodetector 11335 may be an image sensor. The image sensor may be configured to detect light and / or electromagnetic waves. The image sensor may be a semiconductor charge coupled device (CCD) or an active pixel sensor of a complementary metal-oxide-semiconductor (CMOS) or n-type metal oxide semiconductor (NMOS) technology. Any other suitable image sensor may be used.

In a partial example, diamond 11315 is surrounded by one or more components that emit EMI. For example, Helmholtz coils can wrap diamonds. In some cases, two- or three-dimensional Helmholtz coils can be used. For example, Helmholtz coils can be used to offset the Earth's magnetic field by applying the same magnitude of magnetic field in the opposite direction of the magnitude of the Earth's magnetic field. In other embodiments, the Helmholtz coils may be used to cancel any suitable magnetic field and / or to apply any suitable magnetic field to the diamond. In another example, the microwave generator and / or modulator may be located near the diamond to excite the NV center of the diamond using microwaves. The microwave generator and / or modulator may emit EMI which may interfere with the photodetector.

Shield 11345 can shield photodetector 11335 from EMI. For example, shield 11345 may be a material that attenuates electromagnetic signals. In some embodiments, the shield 11345 may be a solid metal such as a metal foil. In another embodiment, a material such as glass, plastic or paper can be coated or injected with a metal. Protecting the photodetector 11335 from EMI is more sensitive because the magnetometer reduces the amount of noise in the signal received from the photodetector 11335 by reducing EMI. In some cases, it may be desirable to protect the photodetector 11335 from EMI using a magnetometer since the signal received from the photodetector 11335 is more accurate. That is, protecting the photodetector 11335 from EMI ensures that a reliable and accurate signal is received from the photodetector 11335 because there is less noise in the signal. For example, the noise may include a direct current (DC) offset.

The light waveguide 11325 may be made of any suitable material. For example, light pipe 11325 may be made of quartz, silica, glass, or the like. In an exemplary embodiment, light pipe 11325 is made of an optical glass such as BK7 or BK9 optical glass. In other embodiments, any suitable material may be used.

In some embodiments, one or more surfaces of light pipe 11325 may comprise a filter. For example, the surface of light pipe 11325 can filter out non-green light and allow green light to pass through light pipe 11325, e.g., diamond 11315. [ In another example, light from diamond includes a light pipe 11325 that filters out non-red light and allows red light to pass through light pipe 11325 and into photodetector 11335. [ In other embodiments, any appropriate filtering mechanism may be used.

113B and 113C are isometric views of a light pipe and a shield according to an exemplary embodiment. In alternative embodiments, additional, less, and / or different elements may be used. As shown in Fig. 113B, the light pipe 11325 is axially surrounded by a shield 11345. Fig. In an exemplary embodiment, light pipe 11325 and shield 11345 are coaxial. The cross-sectional shape of light pipe 11325 may be any suitable shape. In the embodiment shown in FIG. 113B, the sectional shape of the light pipe 11325 is circular. In the embodiment shown in FIG. 113C, the cross-sectional shape of the light pipe 11325 is octagonal. In other embodiments, the cross-sectional shape of light pipe 11325 may be triangular, square, rectangular, or any other suitable shape. Similarly, the cross-sectional shape of shield 11345 can be any suitable shape. In an exemplary embodiment, the outer shape of shield 11345 is adapted to fit the wall of the housing that houses diamond 11315, photodetector 11335, light pipe 11325, and the like.

In the embodiment shown in FIGS. 113B and 113C, alternatively, the light pipe 11325 may be longer than the shield 11345. For example, the light pipe 11325 may extend at one or both ends beyond the end surface of the shield 11345. In an exemplary embodiment, the shield 11345 is one inch long. In other embodiments, the shield 11345 may be shorter or longer than a one inch length. For example, in embodiments where greater attenuation is advantageous, such as photodetector 11335, which is more sensitive sensitive, shielding portion 11345 may be longer. In an exemplary embodiment, light pipe 11325 may be 2 inches long. In other embodiments, the light pipe 11325 may be shorter or longer than 2 inches. For example, light pipe 11325 may be of a length suitable to fit within an array of housings or elements.

In some embodiments, the light pipe 11325 may be tapered along the length of the light pipe 11325. For example, the diameter of the light pipe 11325 at one end may be greater than the diameter of the light pipe 11325 at the opposite end. Any suitable ratio of diameter may be used. In an exemplary embodiment, the light pipe 11325 may be used to transmit light from the light source 11305, which may be a light emitting diode, to the diamond 11315. Using tapered light pipe 11325 focuses light exiting light pipe 11325 to enter diamond 11315 at a more vertical angle than when light pipe untapered light pipe 11325 is used It can be helpful. In this example, the narrow end may be adjacent the light source 11305 and the broad end may be adjacent to the diamond 11315. [

The size of the opening in the middle of the shield 11345 can be sized to block one or more specific frequencies of EMI. For example, the diameter of light pipe 11325 may be between 5 and 6 millimeters. In another embodiment, the diameter of light pipe 11325 may be less than 5 millimeters or greater than 6 millimeters. In an exemplary embodiment, the light pipe 11325 is sized to have the same or slightly larger cross-sectional area as the cross-sectional diameter of the diamond 11315. [ In this embodiment, the light pipe 11325 emits as much light emitted from the diamond 11315 as possible while minimizing the inner diameter of the shield 11345 (thus maximizing the shielding effect of the shielding portion 11345) do.

In an exemplary embodiment, light from an LED entering a light pipe 11325 in a non-uniform pattern can emit light pipe 11325 in a more uniform pattern. That is, the light pipe 11325 can evenly distribute light over the surface area of the diamond 11315 or the photodetector 11335. [ The light pipe 11325 can prevent light from diverging. Thus, in some embodiments, light pipe 11325 can be used instead of a lens.

The outer diameter of the shield 11345 may be any suitable size. For example, the outer diameter of shield 11345 can be sized to shield or otherwise attenuate the photodetector by blocking or attenuating electromagnetic signals from the diamond device.

As shown in Figs. 113A to 113C, the light pipe 11325 passes through the shielding portion 11345. Fig. That is, the shielding portion 11345 surrounds the light pipe 11345 along at least the length of the light pipe 11325. In some embodiments, the shield 11345 surrounds the length of the light pipe 11302.

114 is a block diagram of a magnetometer with two light pipes according to an exemplary embodiment. The exemplary magnetometer 11400 includes two light pipes 11325, two shields 11345, a diamond 11315, a photodetector 11335, and a photodetector 11350.

The magnetometer 11400 includes a light source 11305 that transmits the source light 11310 into the light source pipe 11325. [ The portion of the light transmitted from the light source 11305 can be sensed by the photodetector 11350. In some embodiments, the photodetector 11350 is transmitted through the light pipe 11325. In another embodiment, light sensed by the photodetector 11350 does not pass through the light pipe 11325. As discussed above with respect to magnetometer 11300, diamond 11315 may be associated with an electrical component that emits EMI that may interfere with the performance of photodetector 11350. [ In such a case, one of the shields 11345 may be positioned between the diamond 11315 and the photodetector 11350. Light from the light source 11305 is transmitted to the diamond 11315 through the hole of the light pipe 11325 and the shielding portion 11345.

Shield 11345 can be used to protect photodetector 11335 from EMI emitted from circuits associated with diamond 11315, as discussed with respect to magnetometer 11300 in FIG. Thus, the magnetometer 11400 includes an electrical component associated with the side of the diamond 11315 and the diamond 11315.

115 is a block diagram of a magnetometer having two light pipes according to an exemplary embodiment. The magnetometer 11500 includes two light pipes 11325 and two photodetectors 11335 with a light source 11305, a diamond 11315, an associated shield 11345, In alternative embodiments, fewer and / or other elements may be used. In the embodiment shown in FIG. 115, source light 11310 from light source 11305 passes through diamond 11315. The light incident on diamond 11315 can be split and in two streams 11320 of modulated light the diamond 11315 embodiment the two streams of modulated light 11320 are in the opposite direction. In another embodiment, the two streams of modulated light 11320 are in any appropriate orientation with respect to each other. In some embodiments, the two streams of modulated light 11320 exit the diamond 11315 in a direction perpendicular to the direction in which the source light 11310 enters the diamond 11315.

In an alternative embodiment, the magnetometer may be used with three or more optical streams leaving diamond 11315. For example, when the diamond 11315 is a cube, the light may enter one diamond 11315 of the six surfaces. In this example, up to five light streams can exit diamond 11315 through five other sides. Each of the five optical streams may be transmitted to one of the five optical detectors 11335. May provide increased sensitivity using two or more optical streams exiting the diamond 11315 as sensed by the associated photodetector 11335. [ Each of the light streams contains the same information. That is, the same amount of red light is contained in the flow of light. Each optical stream provides a light sample to one of the plurality of photodetectors. Thus, in embodiments where multiple light streams from a diamond are used, multiple samples of the same light are obtained. Having multiple samples provides redundancy and allows the system to verify the measurements. In some embodiments, multiple measurements may be averaged or otherwise combined. The combined values can be used to determine the magnetic field applied to the diamond.

116 is a flow diagram of a method of measuring a magnetic field in accordance with an exemplary embodiment. In other embodiments, additional, fewer, and / or different operations may be performed. Also, the use of flow charts and arrows is not intended to be limiting with respect to the sequence or flow of operations. For example, in some embodiments, one or more operations may be performed concurrently.

In step 11605, light is generated by the light source. Any suitable light source may be used. For example, a laser or a light emitting diode may be used. In some embodiments, sunlight or ambient light may be used as the light source. In an exemplary embodiment, the light generated by the light source is a green light or a blue light. In some embodiments, the filter may be used to filter undesirable optical frequencies (e.g., red light).

In operation 11610, light from a light source is sensed. In an exemplary embodiment, light may be sensed using a photodetector. In some embodiments, the photodetector is sensitive to electromagnetic interference. In some embodiments, operation 11610 is not performed. For example, in some embodiments, light from a diamond is sensed and the sensed optical signal is compared to a predetermined reference value.

In operation 11615, light from the light source is transmitted through the first light pipe. In embodiments where light from a light source is sensed using a photodetector positioned between the light source and the diamond, the first light pipe may be surrounded by an EMI attenuating material. In these embodiments, EMI from electrical elements near the diamond can be attenuated through the material such that the photodetector is not or is less affected by EMI. In some embodiments, such as operation 11610 is not performed, operation 11615 may not be performed.

In operation 11620, light from the light source is transmitted through the diamond. In an embodiment in which operation 11615 is performed, light from the first light pipe is transmitted through the diamond. As mentioned above, diamonds can include NV centers that are subject to magnetic fields. The amount of red light emitted from the diamond (e.g., via the NV center) may vary based on the applied magnetic field.

In step 11625, the light emitted from the diamond is transmitted through the second light pipe. In operation 11630, light from the second light pipe is sensed. In an exemplary embodiment, light is sensed through an EMI sensitive photodetector. In this embodiment, the light pipe may be surrounded by a material that attenuates EMI from electrical components near the diamond, such as Helmholtz coils or microwave generators / modulators.

At operation 11635, a magnetic field is determined. In an exemplary embodiment, the magnetic field is a vector having magnitude and direction. In another embodiment, operation 11635 includes determining a magnitude or direction. In an embodiment in which operation 11610 is performed, operation 11635 is performed to determine the amount of green light (or any other suitable wavelength) emitted from the light source of the second light pipe as the transmitted red light (or any other suitable wavelength) To the amount of the liquid. In another embodiment, the amount of detected red light transmitted through the second optical waveguide is compared to a baseline amount. In other embodiments, any suitable method of determining the magnetic field can be used.

In operation 11610, light from a light source is sensed. In many cases, the light source is used to provide light to the diamond. The more light transmitted through the diamond, the more light is sensed and analyzed to determine the amount of red light emitted from the diamond. The amount of red light can be used to determine the intensity of the magnetic field applied to the diamond. In some cases, the photodetector used to detect red light (or any suitable wavelength) is sensitive to electromagnetic interference (EMI). In some cases, however, electromagnetic signals can be emitted from electrical components near the diamond. In this case, the EMI of the diamond assembly can affect the photodetector.

In some cases, the EMI glass can be used to intercept and / or absorb EMI signals from the diamond assembly (or associated electronics or signal). Thus, if EMI glass is disposed between the diamond and the optical detector, the amount of EMI affecting the optical detector can be reduced. To increase the sensitivity of the magnetometer, the amount of light emitted from the diamond that the photodetector senses can be increased. Thus, in some cases the sensitivity of the magnetometer is reduced by the inefficient transmission of light between the diamond and the photodetector. In many cases, EMI glass is an inefficient light transmitter. For example, metals embedded in an EMI glass can absorb, block, or reflect light passing through the EMI glass.

In some embodiments, an EMI shield may be used to shield EMI from the diamond assembly. In such an embodiment, the EMI shield may include holes that allow light to pass through or from the diamond. Depending on the size of the hole in the EMI shield, partial EMI can pass through the hole. Therefore, the smaller the hole, the less EMI will pass.

In some cases, a light pipe may be used to transmit light through the hole in the EMI shield. For example, light from a light source may pass through a diamond and through an aperture in an EMI shield. The light is acquired by the light pipe and travels through the light pipe to the photo detector. In general, light pipes are efficient when transmitting light. Thus, a relatively high proportion of light emitted from the diamond can be transmitted to the photodetector. Any suitable light pipe (e. G., Homogenizing rod) may be used.

113A is a block diagram of a magnetometer with a light pipe according to one embodiment. The exemplary magnetometer 11300 includes a light source 11305, a diamond 11315, a light pipe 11325, an optical detector 11335, and a shield 11345. In alternative embodiments, additional, fewer and / or different elements may be used.

As described above, the magnitude of the magnetic field applied to the diamond 11315 by the magnet 11340, for example, can be determined by measuring the amount of red light of the light emitted from the diamond 11315. [ Light source 11305 In some embodiments, one or more components can be used to focus source light 11310 on diamond 11315. The light passes through the diamond 11315, and the modulated light 11320 passes through the hole in the shield. Modulated light 11320 passes through light pipe 11325 to pass through the hole in shield 11345. [ The transmitted light 11330 passing through the hole of the shield 11345 exits the light pipe 11325 of the photodetector 11335.

Any suitable optical detector 11335 can be used. In an exemplary embodiment, the optical detector 11335 includes one or more light emitting diodes. In some embodiments, the optical detector 11335 may be an image sensor. The image sensor may be configured to detect light and / or electromagnetic waves. The image sensor may be a semiconductor charge coupled device (CCD) or an active pixel sensor of a complementary metal-oxide-semiconductor (CMOS) or n-type metal oxide semiconductor (NMOS) technology. Any other suitable image sensor may be used.

In some instances, diamond 11315 is surrounded by one or more components that emit EMI. For example, Helmholtz coils can wrap diamonds. In some cases, two- or three-dimensional Helmholtz coils can be used. For example, Helmholtz coils can be used to offset the Earth's magnetic field by applying the same magnitude of magnetic field in the opposite direction of the magnitude of the Earth's magnetic field. In other embodiments, the Helmholtz coils may be used to cancel any suitable magnetic field and / or to apply any suitable magnetic field to the diamond. In another example, the microwave generator and / or modulator may be located near the diamond to excite the NV center of the diamond using microwaves. The microwave generator and / or modulator may emit EMI which may interfere with the photodetector.

Shielding portion 11345 can shield optical detector 11335 from EMI. For example, the shield 11345 may be a material that attenuates electromagnetic signals. In some embodiments, shield 11345 can be a solid metal, such as a metal foil. In another embodiment, a material such as glass, plastic or paper can be coated or injected with a metal. Protecting the optical detector 11335 from EMI becomes more sensitive because the magnetometer reduces the amount of noise in the signal received from the optical detector 11335 by reducing EMI. In some cases, it may be desirable to protect the optical detector 11335 from EMI because the signal received from the optical detector 11335 is more accurate. That is, protecting the optical detector 11335 from EMI ensures that a reliable and accurate signal is received from the optical detector 11335 because there is less noise in the signal. For example, the noise may include a direct current (DC) offset.

The light waveguide 11325 may be made of any suitable material. For example, light pipe 11325 may be made of quartz, silica, glass, or the like. In an exemplary embodiment, light pipe 11325 is made of an optical glass such as BK7 or BK9 optical glass. In other embodiments, any suitable material may be used.

In some embodiments, one or more surfaces of the light pipe 11325 may comprise a filter. For example, the surface of light pipe 11325 can filter out non-green light and allow green light to pass through light pipe 11325, e.g., diamond 11315. [ In another example, light from diamond includes a light pipe 11325 that filters out non-red light and allows red light to pass through light pipe 11325 and into photodetector 11335. [ In other embodiments, any appropriate filtering mechanism may be used.

113B and 113C are isometric views of a light pipe and a shield according to an exemplary embodiment. In alternative embodiments, additional, less, and / or different elements may be used. As shown in Fig. 113B, the light pipe 11325 is axially surrounded by a shield 11345. Fig. In an exemplary embodiment, light pipe 11325 and shield 11345 are coaxial. The cross-sectional shape of light pipe 11325 may be any suitable shape. In the embodiment shown in FIG. 113B, the sectional shape of the light pipe 11325 is circular. In the embodiment shown in FIG. 113C, the cross-sectional shape of the light pipe 11325 is octagonal. In other embodiments, the cross-sectional shape of light pipe 11325 may be triangular, square, rectangular, or any other suitable shape. Similarly, the cross-sectional shape of shield 11345 can be any suitable shape. In an exemplary embodiment, the outer shape of the shield 11345 is adapted to fit the wall of the housing that houses the diamond 11315, optical detector 11335, light pipe 11325, and the like.

In the embodiment shown in FIGS. 113B and 113C, alternatively, the light pipe 11325 may be longer than the shielding portion 11345. For example, the light pipe 11325 may be provided on the surface of the shield 11345 at one or both ends of the light pipe 11325. In an exemplary embodiment, shield 11345 is one inch long. In other embodiments, shield 11345 may be shorter or longer than a one inch length. For example, in embodiments where greater attenuation is advantageous, such as photodetector 11335, which is more sensitive sensitive, shielding portion 11345 may be longer. In an exemplary embodiment, light pipe 11325 may be 2 inches long. In other embodiments, the light pipe 11325 may be shorter or longer than 2 inches. For example, light pipe 11325 may be of a length suitable to fit within an array of housings or elements.

In some embodiments, the light pipe 11325 may be tapered along the length of the light pipe 11325. For example, the diameter at one end of the light pipe 11325 may be greater than the diameter of the light pipe 11325 at the opposite end. Any suitable ratio of diameter may be used. In an exemplary embodiment, the light pipe 11325 may be used to transmit light from the light source 11305, which may be a light emitting diode, to the diamond 11315. Using a tapered light pipe 11325 allows the light pipe non-tapered light pipe 11325 to enter the diamond 11315 at a more vertical angle than is used. In this example, the narrow end may be adjacent the light source 11305 and the broad end may be adjacent to the diamond 11315. [

The size of the opening in the middle of the shield 11345 can be sized to block one or more specific frequencies of EMI. For example, the diameter of light pipe 11325 may be between 5 and 6 millimeters. In another embodiment, the diameter of light pipe 11325 may be less than 5 millimeters or greater than 6 millimeters. In an exemplary embodiment, the light pipe 11325 is sized to have the same or slightly larger cross-sectional area as the cross-sectional diameter of the diamond 11315. [ In this embodiment, the light pipe 11325 emits as much light emitted from the diamond 11315 as possible, while minimizing the inner diameter of the shield 11345 (thus maximizing the shielding effect of the shield 11345) .

In an exemplary embodiment, light from an LED entering a light pipe 11325 in a non-uniform pattern can emit light pipe 11325 in a more uniform pattern. That is, the light pipe 11325 can evenly distribute light over the surface area of the diamond 11315 or the photodetector 11335. [ The light pipe 11325 can prevent light from diverging. Thus, in some embodiments, light pipe 11325 can be used instead of a lens.

The outer diameter of the shield 11345 may be any suitable size. For example, the outer diameter of shield 11345 can be sized to shield or otherwise attenuate the photodetector by blocking or attenuating electromagnetic signals from the diamond device.

As shown in Figs. 113A to 113C, the light pipe 11325 passes through the shielding portion 11345. Fig. That is, the shielding portion 11345 surrounds the light pipe 11345 along at least a portion of the light pipe 11325. In some embodiments, the shield 11345 surrounds the length of the light pipe 11325.

114 is a block diagram of a magnetometer with two light pipes according to an exemplary embodiment. The exemplary magnetometer 11400 includes two light pipes 11325, two shields 11345, a diamond 11315, a photodetector 11335, and a photodetector 11350.

The magnetometer 11400 includes a light source 11305 that transmits the source light 11310 into the source pipe 11325. [ The portion of the light transmitted from the light source 11305 can be sensed by the photodetector 11350. In some embodiments, the photodetector 11350 is transmitted through the light pipe 11325. In another embodiment, light sensed by the photodetector 11350 does not pass through the light pipe 11325. As discussed above with respect to magnetometer 11300, diamond 11315 may be associated with an electrical component that emits EMI that can interfere with the performance of the photodetector. In such a case, one of the shields 11345 may be positioned between the diamond 11315 and the photodetector 11350. Light from the light source 11305 is transmitted to the diamond 11315 through the hole of the light pipe 11325 and the shielding portion 11345.

Shield 11345 can be used to protect photodetector 11335 from EMI emitted from a circuit associated with diamond 11315, as discussed with respect to magnetometer 11300 in FIG. Thus, magnetometer 11400 includes an electrical component associated with shield 11345 and diamond 11315 on either side of diamond 11315.

115 is a block diagram of a magnetometer having two light pipes according to an exemplary embodiment. The magnetometer 11500 includes two light pipes 11325 and two optical detectors 11335 with a light source 11305, a diamond 11315, an associated shield 11345, In alternative embodiments, fewer and / or other elements may be used. In the embodiment shown in FIG. 115, source light 11310 from light source 11305 passes through diamond 11315. The light incident on the diamond 11315 can be split and in the two streams of modulated light 11320 the diamond 11315 embodiment the two streams of modulated light 11320 are in the opposite direction. In another embodiment, the two streams of modulated light 11320 are in any appropriate orientation with respect to each other. In some embodiments, the two streams of modulated light 11320 exit the diamond 11315 in a direction perpendicular to the direction in which the source light 11310 enters the diamond 11315.

115 shows a magnetometer with two optical streams exiting the diamond 11315. Fig. In another embodiment, a magnetometer can be used with three or more optical streams exiting the diamond 11315. For example, the light of diamond 11315 may enter one of the six diamonds 11315. In this example, up to five light streams can exit diamond 11315 through five other sides. Each of the five optical streams may be transmitted to one of the five optical detectors 11335. May provide increased sensitivity using two or more optical streams exiting the diamond 11315 as sensed by the associated photodetector 11335. [ Each of the light streams contains the same information. That is, the same amount of red light is contained in the flow of light. Each optical stream provides a light sample to one of the plurality of photodetectors. Thus, in embodiments where multiple light streams from a diamond are used, multiple samples of the same light are obtained. Having multiple samples provides redundancy and allows the system to verify the measurements. In some embodiments, multiple measurements may be averaged or otherwise combined. The combined values can be used to determine the magnetic field applied to the diamond.

116 is a flow diagram of a method of measuring a magnetic field in accordance with an exemplary embodiment. In other embodiments, additional, fewer, and / or different operations may be performed. Also, the use of flow charts and arrows is not intended to be limiting with respect to the sequence or flow of operations. For example, in some embodiments, one or more operations may be performed concurrently.

In act 11605, light is generated by the light source. Any suitable light source may be used. For example, a laser or a light emitting diode may be used. In some embodiments, sunlight or ambient light may be used as the light source. In an exemplary embodiment, the light generated by the light source is a green light or a blue light. In some embodiments, the filter may be used to filter undesirable optical frequencies (e.g., red light).

In operation 11610, light from a light source is sensed. In an exemplary embodiment, light may be sensed using a photodetector. In some embodiments, the photodetector is sensitive to electromagnetic interference. In some embodiments, operation 11610 is not performed. For example, in some embodiments, light from a diamond is sensed and the sensed optical signal is compared to a predetermined reference value.

In operation 11615, light from the light source is transmitted through the first light pipe. In embodiments where light from a light source is sensed using a photodetector positioned between the light source and the diamond, the first light pipe may be surrounded by an EMI attenuating material. In these embodiments, EMI from electrical elements near the diamond can be attenuated through the material such that the photodetector is not or is less affected by EMI. In some embodiments, such as operation 11610 is not performed, operation 11615 may not be performed.

In operation 11620, light from the light source is transmitted through the diamond. In an embodiment in which operation 11615 is performed, light from the first light pipe is transmitted through the diamond. As mentioned above, diamonds can include NV centers that are subject to magnetic fields. The amount of red light emitted from the diamond (e.g., via the NV center) may vary based on the magnetic field being cited.

In step 11625, the light emitted from the diamond is transmitted through the second light pipe. In operation 11630, light from the second light pipe is sensed. In an exemplary embodiment, light is sensed through an EMI sensitive photodetector. In such an embodiment, the light pipe may be surrounded by a material that attenuates EMI from electrical components near the diamond, such as Helmholtz coils or microwave generators / modulators.

At operation 11635, a magnetic field is determined. In an exemplary embodiment, the magnetic field is a vector having magnitude and direction. In another embodiment, operation 11635 includes determining a magnitude or direction. In an embodiment in which operation 11610 is performed, operation 11635 is performed to determine the amount of green light (or any other suitable wavelength) emitted from the light source of the second light pipe as the transmitted red light (or any other suitable wavelength) To the amount of the liquid. In another embodiment, the amount of detected red light transmitted through the second optical waveguide is compared to a baseline amount. In other embodiments, any suitable method of determining the magnetic field can be used.

Magnetometer with light emitting diode

In many cases, a light source is used to provide light to the diamond. The more light transmitted through the diamond, the more light is sensed and analyzed to determine the amount of red light emitted from the diamond. The amount of red light can be used to determine the intensity of the magnetic field applied to the diamond. Thus, in some cases, a laser is used to provide light to the diamond. Lasers can provide concentrated light to the diamond and can concentrate the light relatively easily.

However, a laser may not be the most effective light source for all applications. For example, a partial laser produces polarized light. Since the axes of the NV center can not all be oriented in the same direction, the laser's polarized light can excite the NV center oriented in one direction rather than the NV center oriented in the other direction. When sensitivity is required in all directions (or in more than one direction), unpolarized light may be used. Non-polarized light can (even) more affect NV centers of different orientations. In such a case, a light source such as a light emitting diode (LED) may be used as the light source. In some cases, a laser that produces unpolarized light may be used. For example, a helium-neon (HeNe) laser can be used.

In some cases, lasers are relatively bulky and large in size compared to LEDs. In this case, LEDs can be used as the light source of a magnetometer using NV-centered diamond to provide smaller and more diverse sensors. In some cases, lasers use more power to generate light than LEDs. In such a case, the LED allows a power source such as a battery to last longer, smaller, and / or provide less power.

117 is a block diagram of a magnetometer in accordance with an exemplary embodiment. The exemplary magnetometer 11700 includes an LED 11705, a light source 11710, a diamond 11715, a red light 11720, a filter 11725, a filtered light 11730, a photodetector 11735, 11745). Or other factors may be used.

LED 11705 can be used to generate source light &lt; RTI ID = 0.0 &gt; 11710. &lt; / RTI &gt; In another embodiment, any suitable light source may be used to generate source light 11710. [ For example, a light source that generates unpolarized light may be used. In an embodiment where an LED is used, any suitable LED may be used. For example, the LED 11705 can emit primarily green light, mainly blue light, or any other suitable light having a shorter wavelength than red light.

In some embodiments, the LED 11705 emits any suitable light, such as white light. Light may pass through more than one filter before entering diamond 11715. [ The filter is capable of filtering light other than the desired wavelength.

The source light 11710 is emitted by the LED 11705. Source light 11710 may be any suitable light. In an exemplary embodiment, the source light 11710 has a wavelength between 500 nanometers (nm) and 600 nanometers. For example, the source light 11710 may have a wavelength of 532 nm (e.g., green light), 550 nm, or 518 nm. In some embodiments, source light 11710 may be blue (e.g., having a wavelength as low as 450 nm). In yet another embodiment, the source light 11710 may have a wavelength less than 450 nm. In some embodiments, source light 11710 may be a visible light of any color other than red.

Exemplary diamond 11715 includes at least one nitrogen vacancy center (NV center). As described above, each axis of the NV center can be oriented in one of several directions. In an exemplary embodiment, each NV center is oriented in one of four directions. In some embodiments, the distribution of NV centers with any particular axial direction is uniform over diamond 11715. [ Diamond 11715 may be any suitable size. In some embodiments, diamond 11715 is sized such that source light 11710 provides a relatively high light density. That is, the diamond center 11715 can be sized such that all or almost all of the NV center is excited by the source light 11710. In a partial example, LED 11705 emits less light than a laser. In such a case, thinner diamonds may be used with LED 11705 so that all or nearly all of the NV center is excited. The diamond may be "thinner " in the direction in which the source light 11710 travels. Thus, the source light 11710 travels a shorter distance through the diamond 11715. [

Magnet 11740 can be used to provide a magnetic field. When a magnetic field is applied to the diamond 11715 and light travels through the diamond 11715, the NV center can change the amount of red light emitted from the diamond 11715. For example, when the source light 11710 is pure green light and there is no magnetic field applied to the diamond 11715, the red light 11720 emitted from the diamond 11715 is used as the base line level of the red light 11720. When there is a magnetic field applied to the diamond 11715, such as through the magnet 11740, the amount of red light 11720 varies in intensity. Thus, by monitoring the amount of red light from the baseline (e.g., no magnetic field applied to diamond 11715) in red light 11720, the magnetic field applied to diamond 11715 can be measured. In a partial example, the red light 11720 emitted from the diamond 11715 may be at any suitable wavelength.

The high frequency transmitter 11745 can be used to transmit radio waves to the diamond 11715. The amount of the red light emitted from the diamond 11715 changes based on the frequency of the radio wave absorbed by the diamond 11715. [ Thus, the frequency of the radio wave emitted from the high frequency transmitter 11745 may vary in the amount of red light detected by the photodetector 11735. [ The intensity of the magnetic field applied to the diamond 11715 by the magnet 11740 can be determined by monitoring the amount of red light sensed by the photodetector 11735 with respect to the frequency of the radio wave emitted by the radio frequency transmitter 11745 have.

In the exemplary embodiment, photodetector 11735 is used to receive the light emitted from diamond 11715. [ The photodetector 11735 may be any suitable sensor configured to analyze the light emitted from the diamond 11715. For example, photodetector 11735 can be used to determine the amount of red light in red light 11720.

As shown in Figure 117, some embodiments include a filter 11725. The filter 11725 may be configured to filter the red light 11720. For example, filter 11725 may be a red filter that allows red light to pass through filter 11725. In alternative embodiments, any suitable filter 11725 may be used. In some embodiments, filter 11725 is not used. In an embodiment that includes filter 11725, red light 11720 emitted from diamond 11715 passes through filter 11725 and filtered light 11730 (emitted from filter 11725) passes through photodetector 11735 ). When the filter 11725 is used, the photodetector 11735 detects only the corresponding light (e.g., red light) and the other light (e.g., green light, blue light, Larger sensitivities can be achieved because they do not affect.

118 is an exploded view of a magnetometer in accordance with an exemplary embodiment. Exemplary magnetometer 11800 includes an LED 11805, a housing 11810, a light source optical sensor 11815, a mirror tube assembly 11820, an electromagnetic glass 11825, a concentrator 11830, a retaining ring 11835, A condenser 11845, a modulated photosensor 11850, a sensor plate 11855, and a lens tube coupler 11860. In one embodiment, In alternative embodiments, additional, fewer, and / or different elements may be used. It should also be noted that the embodiment shown in Figure 118 is for illustrative purposes only and is not intended to be limiting with respect to the orientation, size or location of the elements.

The exemplary LED 11805 includes a heat sink that is configured to dissipate into the ambient heat generated by the LED 11805. [ 118, at least a portion, e.g., a cylindrical portion, of the LED 11805) is mounted to fit within the housing 11810. In the embodiment shown in FIG. There is a mirror tube assembly 11820 adjacent to the LED 11805 in the housing 11810. Mirror tube assembly 11820 is configured to focus the light from LED 11805 onto the focused beam.

Light source optical sensor 11815 is configured to receive a portion of the light emitted from LED 11805. In some embodiments, the light source optical sensor 11815 may include a green filter. In this embodiment, the source optical sensor 11815 receives most or all of the green light. The amount of green light sensed by the source optical sensor 11815 is compared to the amount of red light sensed by the modulated optical sensor 11850 to determine the magnitude of the magnetic field applied to the diamond assembly 11840 Can be determined. As described above, in some embodiments, the source optical sensor 11815 can not be used. In this embodiment, the amount of red light sensed by the modulated light sensor 11850 may be compared to the base amount of red light to determine the magnitude of the magnetic field applied to the diamond assembly 11840. [

In some embodiments, such as using the source optical sensor 11815, the electromagnetic glass 11825 can be positioned between the source optical sensor 11815 and the diamond assembly 11840. In some embodiments, diamond assembly 11840 generates an electromagnetic interference (EMI) signal. In a partial example, the source optical sensor 11815 may be sensitive to EMI signals. That is, the source optical sensor 11815 performs better when the EMI that affects the source optical sensor 11815 is small. Electromagnetic glass 11825 allows light to pass through electromagnetic glass 11825 but inhibits the transmission of electromagnetic signals. Any suitable electromagnetic glass 11825 can be used. In other embodiments, any suitable EMI attenuator may be used.

Concentrator 11830 can be configured to focus the light from mirror tube assembly 11820 (and / or electromagnetic glass 11825) into a narrower light beam. The concentrator 11830 may be any suitable shape, such as a parabola. Diamond assembly 11840 may include a diamond having one or more NV centers. Concentrator 11830 may focus the light from LED 11805 on a beam of light having a cross-sectional area similar to the cross-sectional area of the LED. That is, the light from the LED 11805 can be focused to most effectively absorb the diamond into light so that as much light as possible from the LED 11805 passes through the diamond and / or as much NV center as possible. The concentrator 11830 may include a ring mount configured to maintain the concentrator 11830 in a secure position within the housing 11810.

Diamond assembly 11840 may comprise any suitable component. For example, as discussed above, diamond assembly 11840 may comprise diamond. The diamond assembly 11840 may be located in the center of the diamond assembly 11840. The diamond assembly 11840 may also include one or more circuit boards configured to modulate electromagnetic signals applied to the diamond. In an exemplary embodiment, diamond assembly 11840 includes a Helmholtz coil. For example, a three-dimensional Helmholtz coils can affect diamonds by canceling or interfering with unwanted magnetic fields. In an exemplary embodiment, a circuit board or other electronic device may emit an EMI signal. In some embodiments, the diamond assembly 11840 includes a red filter that allows the red light emitted from the diamond to pass through the modulated photosensor 11850. In an alternative embodiment, the red filter may be located at a suitable location between the diamond and the modulated photosensor 11850. In another embodiment, a red filter can not be used.

In some embodiments, retaining ring 11835 can be used to retain one or more elements of magnetometer 11800 within housing 11810. Figure 118 shows two retaining rings 11835, but any suitable number Staying ring (11835) familiar. In some embodiments, retaining ring 11835 can not be used.

Similar to concentrator 11830, concentrator 11845 is configured to concentrate the light emitted from diamond assembly 11840 into a narrower beam. For example, the concentrator 11830 can be configured to focus the light into a beam having a cross-sectional area that is the same as or similar to the modulated photosensor 11850. [ Concentrator 11845 may be configured to focus as much light from diamond assembly 11840 as modulated optical sensor 11850. The sensitivity of the magnetometer 11800 can be increased by increasing the amount of light emitted from the diamond assembly 11840 as sensed by the modulated light sensor 11850. [

As noted above, the electromagnetic glass 11825 is positioned between the diamond assembly 11840 and the modulated optical sensor 11850 to protect the modulated optical sensor 11850 from EMI signals emitted from the diamond assembly 11840 . The sensor plate 11855 can be used to fix the modulated photosensor 11850 in place to receive the focused light from the concentrator 11845 (and / or the diamond assembly 11840) . The lens tube coupler 11860 can be used as an end cap for the housing 11810 so that various elements can be held in place within the housing 11810. [

119 is a flow diagram of a method of detecting a magnetic field in accordance with an exemplary embodiment. In other embodiments, additional, fewer, and / or different operations may be performed. Also, the use of flow diagrams and arrows is not intended to be limiting with respect to the sequence or flow of operations. For example, in some embodiments, one or more operations may be performed concurrently.

In act 11905, power is provided to the light emitting diode (LED). Any suitable amount of power can be provided. For example, a 5 milliwatt (mW) LED can be used. The LED can be powered by two or more AA batteries. In another embodiment, the LED may use more or less power. In some embodiments, the amount of power provided to the LED is adjusted based on the particular application. In some embodiments, act 11905 provides pulsed power to the LED to alternately brighten the LED. In this embodiment, any suitable frequency and / or pattern may be used. In another embodiment, act 11905 may comprise causing any suitable device to emit unpolarized light.

In operation 11910, the light emitted from the LED is sensed. Detecting light from the LED can include using a photodetector. Operation 11910 may include determining the amount of green light emitted from the LED. In some embodiments, operation 11910 is not performed.

In operation 11915, light from the LED is focused on the diamond. The diamond may include one or more NV centers. The light can be focused to stimulate as many NV centers as possible with the light of the LED. Any suitable focusing method may be used. For example, LEDs or light pipes can be used to focus light from LEDs to diamonds.

In operation 11920, the light from the diamond is focused on the photodetector. The LED light passes through the diamond, is modulated by the diamond and is emitted from the diamond. The light emitted from the diamond focuses the detector so that as much light emitted from the diamond as possible is detected by the photodetector. At act 11925, light from the diamond is sensed by the photodetector. In an exemplary embodiment, act 11925 includes determining the amount of red light emitted from the diamond.

At act 11930, the magnetic field applied to the diamond is determined. In an embodiment in which operation 11910 is performed, the amount of red light emitted by the diamond is compared to the amount of green light emitted from the LED to determine the magnetic field. In an embodiment where operation 11910 is not performed, the amount of red light emitted from the diamond is compared to the base amount of red light. In another embodiment, any suitable method of determining the magnetic field applied to the diamond can be used.

In an exemplary embodiment, the noise of the light emitted from the LED can be compensated. In this embodiment, the noise of the light emitted from the LED can be detected by a photodetector, such as a photodetector used in operation 11910. [ The noise of the light emitted from the LED is sensed by a photodetector that senses light emitted from the diamond, such as the photodetector used in operation 11925, through the diamond. In one embodiment, the amount of light detected in operation 11910 is subtracted from the light detected in operation 11930. The result of subtraction is the change of light by the diamond.

Diamond Nitrogen Vacuum Sensor with Dual RF Source

120 is a schematic diagram showing a portion of a DNV sensor 12000 with dual RF devices in accordance with some exemplary implementations. The magnetic sensor shown in FIG. 6 used a single RF excitation source 630. The DNV sensor 12000 shown in FIG. 120 uses two separate RF elements. Upper RF element 12004 and lower RF element 12008 are used to provide microwave RF to diamond 12020. As shown in FIG. 120, diamond 12020 is sandwiched between two RF elements 12004 and 12008. A space 12006 between the RF elements 12004 and 12008 can be used to enter or exit all the light. In addition, light may enter or exit the sensor through space 12002 and / or 12010. Thus, light can be viewed on the diamond 12020 from various locations, and an optical sensor, such as a photodiode, is used in various locations to exit the red light diamond 12020.

121 is a diagram of a closed DNV sensor with dual RF devices in accordance with some exemplary implementations. In this implementation, the RF element is located on two circuit boards 12112. Although not shown in FIG. 121, the diamond shown as 12320 in FIG. 123 is located between the circuit boards 12112. RF element is one or more spiral elements n loops. For example, each RF element may include a single spiral with 2, 3, 4, etc. loops. In other implementations, the RF elements may include multiple spirals, such as 2, 3, 4, 5, etc., superimposed on one another. In this implementation, the number of loops in each spiral may be the same or different. For example, in one embodiment, each RF element includes five spirals each having four loops. These elements can be made using fusion-bonded multi-layer dielectrics.

The spacers 12114 separate the individual circuit boards. The sensor assembly also includes a retaining ring 12108 and a plastic mounting plate 12116. The illustrated sensor assembly is included with a lens tube 12104, such as a 1 inch ID lens tube. The sensor assembly also includes a DC connector 12106 that may be used to power the sensor assembly. The assembly also includes a light sensor 12140.

In this illustrated implementation, the RF components are supplied from an RF supply cable 12102, which may be a coaxial cable. RF supply cable 12102 is attached to the assembly via RF connector 12110. In other implementations, a second RF feed cable may be used. In this implementation, each RF element is supplied using a separate RF signal.

122A and 122B are schematic views of an assembly of a DNV sensor with dual RF devices in accordance with some exemplary implementations. The illustrated portion of the assembly can be used in the embodiment shown in Figure 121. Figure 122a shows one side of the assembly. The back side includes an entry portion 12202 that allows light to reach the diamond between the RF elements. In this implementation the inlet section is at the center of the assembly. In other implementations, the inlet portion may be positioned between the RF elements along the diameter of the assembly.

Figure 122B shows the opposite side of the assembly shown in Figure 122A. The circuit board element comprising the RF element 12214 is shown with a space 12212 separating the RF elements. There is shown an RF connector 12210 that provides an RF source signal to the RF element. The optical sensor 12240 is also shown in the middle of the assembly. Below the photo sensor is the exit. When light is shone through entry point 12220, light will pass through a diamond (not shown) contained within the assembly between the two RF elements. Light travels through the diamond to the opposite side of the assembly and reaches the photosensor 12240. The optical sensor can measure the characteristics of light such as the wavelength of light.

123 is a cross-sectional view of a portion of a DNV sensor having dual RF devices in accordance with some exemplary implementations. The portion of the DNV sensor is identical to the portion of the assembly shown in Figures 122a and 122b and can be used in the DNV sensor shown in Figure 121. [ A cross section of the sensor assembly is made as shown in that part of the assembly 12330 thereof. Diamond 12320 is visualized as being located between upper RF element 12304 and lower RF element 12308. Spacer 12310 separates RF elements 12304 and 12308. The entry of the assembly is shown directly above the diamond 12320. Light can enter the assembly through this entry and pass through the diamond 12320. Light exiting the diamond can reach the optical sensor 12340 through the exit portion of the assembly. Additional outlet portions through the space may also be used. Thus, light can be obtained through the faces of the diamond and / or the edges of the diamond.

As described above, the RF elements can be supplied by separate RF feeds, and light can be obtained from various sides and / or edges of the diamond. 124 is a schematic diagram illustrating a DNV sensor with dual RF devices in accordance with some exemplary implementations. The DNV sensor includes a light source and a focusing lens assembly 12402. The light source may be a variety of light sources, such as a laser or an LED. In Fig. 124, the light source is an LED. A heat sink 12408 is used to emit heat from the light source. The DNV assembly is housed in the element structure 12406 and is described in further detail below. In the illustrated implementation, device structure 12460 is fixed within the sensor. Since this implementation includes a separate RF supply, two RF cables 12404 are provided in the DNV assembly. Therefore, the RF signal provided to the RF device may be the same or the feed signal may be different. In some implementations, the RF signal is different based on the configuration of the components of the NV diamond assembly. For example, if one RF element is slightly more distant than the NV diamond compared to the other RF element, you can use different RF signals to account for the difference in distance.

125 is a cross-sectional view of the DNV sensor of FIG. 124 with dual RF devices in accordance with some exemplary implementations. Thus, the DNV sensor includes a light source heat sink 12508. [ In addition, elements and element structures within the light source and the focus lens assembly can be seen. The light source and focus lens assembly includes an LED 12502 and one or more focus lenses 12504. Light from the LED 12502 is focused on the NV diamond 12520 using one or more focus lenses 12504. In this implementation, light enters the edge of NV diamond 12520 and is emitted from one or more surfaces of NV diamond 12520. In Figure 125, light is emitted from both the top and bottom surfaces of NV diamond 12520. Thus, there are two optical sensor assemblies 12540 and 12542 located above and below the NV diamond. These photosensor assemblies 12540 and 12542 may include photodiodes that detect light emitted from NV diamond 12520.

The NV diamond is located between the two RF elements 12530 and 12532. These RF elements provide microwave RF signals uniformly throughout the NV diamond. Light is emitted through the top and bottom surfaces of the NV diamond 12520 and travels to one of the optical sensor assemblies 12540 and 12542. Between the light sensor assemblies 12540 and 12542 there is an attenuator 12534. The attenuator is sensed by the RF element to reduce or eliminate the generated RF and to avoid interference with other elements of the sensor. The emitted light travels through a light pipe 12536 between each photosensor assembly and the NV diamond. In various implementations, at least a portion of the light pipe is located within the attenuator. This configuration ensures that the photodetector array is placed closer to the NV diamond and is not affected by the EMI of the sensor. A more detailed description of the advantages of accommodating portions of optical waveguides in the attenuator can be found in U.S. Patent Application No. ______, ___, ______, entitled " Magnetometer with Optical Conduit ", filed on the same day as the present application do.

126 is a schematic diagram illustrating a DNV sensor with dual RF placement and laser mounting in accordance with some exemplary implementations. In the illustrated implementation, the light source was changed to a laser included in the laser and focal lens assembly 12602. In the illustrated embodiment, the NV diamond is housed in an adjustable structure. The rotatable adjustment assembly 12604 allows the NV diamond to be rotated. The x-y-z adjustment assembly 12606 allows NV diamond and various elements to be placed in the 3D space. There is an x-y adjustment assembly 12604 that is used to adjust the entry of light into the NV diamond assembly, as the position of the NV diamond can change.

Figure 127 is a cross-sectional view of the DNV sensor shown in Figure 126 with dual RF devices and laser mounts in accordance with some exemplary implementations. The NV diamond 12720 is located between the two RF elements 12732. Light pipe 12730 provides a path of light exiting the surface of NV diamond 12720 to move from one NV diamond to one of the two light sensing assemblies 12740. In various implementations, at least a portion of each light pipe 12730 is received with an attenuator 12734. In another implementation, the DNV sensor does not include an attenuator 12734. The rotatable adjustment assembly can change the portion of the diamond where the light enters, such as NV diamond and RF elements, e.g., the NV diamond assembly, thereby changing where light from the NV diamond 12720 is acquired have. For example, NV diamonds can be rotated to allow light to enter the diamond from the edge or sides.

The x-y-z adjustment assembly allows the location of the NV diamond and related elements in the NV diamond assembly to change. This assembly allows control over where the light enters the NV diamond and where the emitted light will be obtained. The x-y adjustment assembly allows the light source to move so that light enters the NV diamond assembly, regardless of the rotation and position of the NV diamond within the NV diamond assembly.

128A and 128B are schematic diagrams of an assembly portion of a DNV sensor with dual RF devices in accordance with some exemplary implementations. 128a shows one side of the assembly of the DNV sensor, and Fig. 128b shows the opposite side of the assembly. In the illustrated implementation, there are two light emitting sections 1280 and 12810. These portions allow the emitted light to leave the assembly and be detected by the photo element. The assembly includes two RF elements, an upper RF element 12804 and a lower RF part 12806. These RF elements may be supplied using the same RF signal or may be supplied with separate RF signals via RF connector 12802 and RF connector 12812. [ NV diamonds 12804 and 12806, respectively. Light from the light source enters the diamond through the space between the RF elements 12804 and 12806. Light is emitted from the NV diamond through the light emitting portions 12808 and 12810. [

129A and 129B are schematic views of an assembly portion of a DNV sensor with dual RF devices in accordance with some exemplary implementations. 129A and 129B further illustrate the assembly of the DNV sensor shown in Figs. 128A and 128B. NV diamond 12920 is shown as being located in a diamond alignment plate such as a spacer or plastic alignment plate. In the illustrated implementation, light enters between the RF devices. For example, light may enter the diamond through the light-penetrating portion 12910 of the assembly. RF elements 12902 and 12904 are shown in FIG. 129A together with RF feed cable connectors 12906 and 12908.

Reduced command set controller for diamond nitrogen vacancy sensors

The following is a more detailed description of the various concepts related to methods, apparatus and systems for providing synchronous control of multiple RF signals such as diamond nitrogen vacancy (DNV) and digital output signals for magnetic measurements. This technology can provide synchronous control through controlled single-cycle timing requirements for flexible and sensitive DNV magnetic measurements. In some implementations, the disclosed system includes a reduced instruction set (RISC) processor coupled to a configurable signal synthesizer. The configurable signal synthesizer may be configured to perform a single cycle instruction for frequency shift, digital output and initial synchronization pre-processing of the received data so that digital control, acquisition and waveform generation can be performed in the same clock cycle for synchronization. The technology's specially designed single-cycle operation can provide more accurate and deterministic timing for digital control, acquisition and waveform generation. In a partial implementation, the RF waveform generation and digital control outputs are adjusted to a configurable pattern ranging from a simple sequence to a complex adaptive control pattern.

130 is a block diagram illustrating an overview of an implementation of a single period synthesis, control, and acquisition system 13000. [ System 13000 is configured to control multiple RF signals and digital output signals for magnetic measurements, such as diamond nitrogen vacancies in DNV sensors. In some implementations, the system 13000 may be implemented as an FPGA (field-programmable gate array) or as an ASIC (application specific integrated circuit). System 13000 is implemented as a single-cycle integrated circuit for RF waveform synthesis, digital control and acquisition. A more detailed implementation of the single cycle synthesis, control, and acquisition system is shown in system 13100 of FIG.

System 13000 receives DNV sensing information from an external system, such as a data processing or acquisition system (not shown), and is communicatively coupled to program counter 13020, program memory 13030 and acquisition processor 13080 . Host interface 13010 may be coupled to a data processing system, such as system 13200 of FIG. 132, which may communicate with system 13000 via host interface 13010. Thus, the data processing system may output a command, such as a control command, from the reduced instruction set to the system 13000 via the host interface 13010 to the program memory 13030. The data acquisition system may also receive output from acquisition processor 13080 via host interface 13010, such as pulsed data from a DNV sensor. Thus, host interface 13010 provides communication between the components of system 13000 and external systems. A more detailed description of host interface 13010 is shown as host interface 13110 in Figures 131 and 132A. Host interface 13010 is communicatively coupled to program memory 13030 and a program counter 13020 in communication with jump control 13070. [ A more detailed implementation of the program counter 13020 is shown in the program counter 13120 of FIGS. 131 and 131B. A more detailed implementation of program memory 13030 is shown as program memory 13130a, 13130b in Figures 131 and 131c. A more detailed implementation of jump control 13070 is shown as a jump control with delay 13140a and jump control 13140b of Figure 131 and Figures 132d through 132e. The program memory 13030 includes an RF waveform generator of a CORDIC (Coordinate Rotation Digital Computer) synthesis 13050 for generating an RF waveform to which the output is applied via a decoder 13040, a digital controller 13060 for controlling the laser on / off timing And the jump control 13070 provides feedback to the program counter 13020.

CORDIC synthesis 13050 provides digital up or down conversion and can have a runtime configurable fundamental frequency and gain for RF waveform generation. The RF waveform generator of CORDIC synthesis 13050 utilizes a frequency increment and frequency base value that outputs a single value for the slope of the ramp used by the accumulator to produce a sine wave for the RF waveform. The sine wave is processed through an upconverter to produce an RF waveform signal that is applied to a magnetic field measurement component such as a DNV sensor. In some implementations, the CORDIC synthesis 13050 may phase shift the RF waveform. For example, analog or digital switches can be used to generate arbitrary waveforms. A more detailed implementation of the RF waveform generator and CORDIC synthesis 13050 is shown as RF waveform generator 13150 in FIGS. 131 and 132F.

Digital controller 13050 provides timing control for various aspects of the magnetic metrology component, such as a DNV sensor. Digital controller 13050 includes RF gating or switches and may include additional common inputs or outputs for additional control. Digital control device 13050 may output a signal to control activation of a magnetic measurement element, such as a laser, to excite a nitrogen vacancy in the DNV sensor. The digital controller may convert the CORDIC output to 0 via a multiplexer (MUX) so that the RF signal is not applied to the DNV sensor. In some implementations, the digital controller 13050 may be used in an acousto-optic modulator (AOM) to control the optical pulses of the laser and / or may be used for phase shift control. The digital control 13050 may further provide an output to an I / Q component such as a digital I / Q. A more detailed implementation of digital control 13060 is shown as digital control 13160 in Figures 131 and 132g.

Acquisition processor 13080 provides an initial synchronization pre-processing of data received from a magnetic measurement component, such as data received from a photodetector of a DNV sensor. The acquisition processor 13080 may include two coherent channels for simultaneous acquisition of data, such as acquisition of data such as red light, infrared light, laser, and the like. In some implementations, the channel may be chain-able up to a maximum of four. In an implementation with a photodetector, the data received by the acquisition processor 13080 may be 50 MHz, 100 MHz, 200 MHz, or higher. In order to reduce the amount of data transmitted from the system 13000 to the external system, the acquisition processor may pre-process the data to reduce the size of the output data. Thus, in some implementations, acquisition processor 13080 synchronously acquires samples from a magnetic field measurement component, such as a photodetector of a DNV sensor, and preprocesses data, such as decimation of the data. In some implementations, the acquisition process 13080 may include a digital output for triggering the accumulator for a predetermined number of clock cycles and then subtracting from the two integration windows for processing of the data. By providing a consistent trigger based on a single period of the system 13000, the preprocessing of acquired data can be more consistent, resulting in increased sensitivity and noise reduction of acquired data due to inconsistent triggers. In some implementations, acquisition processor 13080 may include a digitally controllable offset for DC block or AC coupling-like effects. A more detailed implementation of acquisition processor 13080 is shown as acquisition processor 13170 in FIGS. 131 and 132H.

In the illustrated embodiment, the system 13000 includes an RF waveform generator of a CORDIC synthesizer 13050 to generate an RF waveform, a digital control 13060 on / off timing for controlling the laser, and an acquisition processor 13080, Clock cycle. A main counter (not shown) drives the RF waveform generation while the program counter 13020 allows the delay to be implemented for digital control 13050 and acquisition processor 13080. The single cycle may provide laser and / or microwave deterministic timing control for adjustment of CORDIC synthesis 13050, digital control 13060 and acquisition processor 13080. Thus, a single period tightly ties the digital control 13060 to control the laser and acquisition processor with the RF waveform generation of the CORDIC synthesis 13050. The single cycle can be a CORDIC synthesis 13050, a digital control 13060 cycle allows for synchronous step frequency complex waveform synthesis by CORDIC synthesis 13050 and can be used for large frequency rebalance adjustments (e.g., > 1GHz ). The single cycle system 13000 can also provide synchronous reduced instruction set program control of frequency for RF waveform synthesis. The system 13000 of FIG. 1 with a single cycle also reduces redundant components compared to systems that use separate components for RF waveform generators, digital control and / or acquisition processors. In some implementations, the single cycle synthesis, control and acquisition system 13000 may also be configured for a two-cycle implementation.

System 13000 may use a reduced instruction set (RISC) engine that issues one instruction per clock cycle, including conditional branching. In some implementations, the reduced instruction set includes a set of unconditional jumps, a conditional jump (cjmp), a set of loop counters (setc <counter value>), a set of frequencies (setf <frequency value> <Output magnetic field value>), frequency increase (incf <incremental value>) and the number of specified cycles (del <cycle number value>).

A single cycle synthesis, control and acquisition system 13000 includes lock-step accuracy for laser on / off timing via digital control device 13060, sequenced microwave waveform synthesis, and RF waveform &lt; RTI ID = Generator and CORDIC synthesis 13050, data acquisition via acquisition processor 13070, and laser and / or microwave deterministic timing control. The single cycle synthesis, control and acquisition system 13000 enables rapid adjustment of the excitation signal and can facilitate effective experimentation by tuning over a wide frequency range without losing timing. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations of the arrangement and type of components can be made, and additional components, different components or fewer components can be provided.

131 is a circuit diagram illustrating an exemplary implementation of a single cycle synthesis, control, and acquisition system 13100. As shown in FIG. In one or more implementations, the single cycle synthesis, control, and acquisition system 13100 implemented by the circuit of FIG. 131 can be adapted to suit the unique requirements of controlling a wide variety of instruments and sensors in the RF to optical domain Dedicated hardware configured for. The reduced instruction set (RISC) engine is configured to execute one instruction per clock cycle even in the case of conditional branching. RF waveform generators provide RF waveforms for CORDIC synthesis for digital up / down conversion using runtime configurable fundamental frequencies and increments. The digital control block provides laser timing, RF gating and additional general control input / output (I / O). The acquisition processor block is configured to provide two coherent channels (potentially chainable up to 4) so that infrared, infrared (IR), laser, and other types of light acquisition can be performed simultaneously. The acquisition processing block is also configured to obtain samples synchronously and to provide a digitally controllable analog offset that allows effects such as DC blocking or AC coupling.

Examples of advantageous features of the single cycle synthesis, control and acquisition system 13100 include RF waveform generation, single cycle deterministic timing adjustment of laser control and data acquisition, synchronous step frequency complex waveform synthesis, frequency synchronous RISC program control, (For example, over 1 GHz) frequency rebalance and minimum instruction set.

By providing a small or single chip, single cycle synthesis, control and acquisition system (13000, 13100) for use in magnetic measurements, the system (13000, 13100) comprises a DNV magnetometer. Single cycle synthesis, control, The application of the system (13000, 13100) integrates a single chip into a DNV sensor, integrates a single chip into a DNV-based geolocation system, integrates a single chip into a distributed measurement point system, DNV anomaly detection system. By integrating a single chip into a small form factor unmanned system such as UAV, UAV, missile, submarine, underground and surveillance (eg satellites, Size, weight, and power) applications and performs automated experiment optimization using a single-chip, single-cycle synthesis, control, and acquisition system (13000, 13100).

132 is a diagram illustrating an example of a system 13200 for implementing partial aspects of the present technique. The system 13200 includes a processing system 13202 that may include one or more processors or one or more processing systems. A processor may be one or more processors. The processing system 13202 may include a general purpose processor or a special purpose processor for executing instructions and may further include a machine readable medium 13219 such as a volatile or nonvolatile memory for storing software and / can do. program. The instructions that may be stored in the machine-readable media 13210 and / or 13219 may be executed by the processing system 13202 to control and manage access to various networks as well as providing various communication and processing functions. The instructions may also include instructions to be executed by the processing system 13202 for various user interface devices, such as the display 13212 and the keypad 13214. The processing system 13202 may include an input port 13222 and an output port 13224. Each of the input port 13222 and the output port 13224 may include one or more ports. Input port 13222 and output port 13224 may be the same port (e.g., bidirectional port) or may be a different port.

The processing system 13202 may be implemented using software, hardware, or a combination thereof. By way of example, processing system 13202 may be implemented with one or more processors. The processor may be a general purpose microprocessor, microcontroller, DSP, ASIC, FPGA, PLD, controller, state machine, gated logic, discrete hardware component, or any other suitable device capable of performing computation or other manipulation of information have.

The machine-readable medium may be one or more machine-readable media. Software is broadly interpreted as meaning software, firmware, middleware, microcode, hardware description language or any other instruction, data, or combination thereof. The instructions may include code (e.g., source code format, binary code format, executable code format, or any other suitable format of code).

A machine-readable medium (e.g., 13219) may include a storage integrated in a processing system, such as in the case of an ASIC. The machine-readable medium (e.g., 13210) may also be embodied in a computer readable medium such as RAM, flash memory, ROM, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM) But may also include external storage of the processing system, such as any other suitable storage device. Those skilled in the art will recognize how best to implement the described functionality for processing system 13202. [ According to one aspect of the present invention, a machine-readable medium is a computer-readable medium encoded or stored with instructions that defines the structural and functional interrelationships between the instructions and other systems and may implement the functionality of the instructions. The instructions may be executable by, for example, processing system 13202 or one or more processors. The instructions may be, for example, a computer program containing code for performing the methods of the present technique.

Network interface 13216 may be any type of interface to a network (e.g., an Internet network interface) and may reside between any of the components shown in FIG. May be coupled to the processor via bus 13204.

Device interface 13218 may be any type of interface to the device and may reside between any of the components shown in FIG. Device interface 13218 may be an interface to an external device (e.g., a USB device) plugged into a port (e.g., a USB port) of system 13200, for example. In some implementations, the device interface 13218 may be the host interface of FIG. 130, wherein at least some of the functionality of the device of FIG. 130 is performed by the processing system 13202.

Reconstruction of a three-dimensional magnetic field from a magnetic detection system

Axis of diamond crystal lattice

To derive the total magnetic field vector impinging on the system 600 from the measurements obtained by the intensity response produced by the NV diamond material 620, the NV diamond material &lt; RTI ID = 0.0 &gt; It is preferable to set the orientation of the axes of the diamond gratings of the crystal grains 620. However, as described above, the NV diamond material 620 can be oriented arbitrarily and thus has an axis of unknown orientation. Thus, in this case, the controller 680 may be configured to calculate an accurate estimate of the actual orientation of the NV diamond grating, which may be performed in situ as a calibration method prior to use. This information can then be used to accurately reconstruct the full vector information of the unknown external magnetic field acting on the system 600.

To begin, a preferred geospatial coordinate reference frame for the system 600 in which the measurement of the total magnetic field vector occurs is set. As shown in Figs. 133A and 133B, a Cartesian reference frame with orthogonal axes {x, y, z} can be used, but any reference frame and orientation can be used. 133A shows a unit cell 13300 of a diamond grating having a "standard" orientation. The diamond lattice axis will fall in four directions. Thus, the four axes in the standard orientation for the desired coordinate reference frame can be defined as the corresponding unit vector:

(b1)

For simplicity, the four vectors of equation b1 can be represented by a single matrix A _s , which represents the standard orientation of the unit cell 13300:

(b2)

The angle between axis (i) and axis (j) can also be given by (i, j) ^th :

(b3)

133B is a unit cell 13300 'representing an arbitrarily placed NV diamond material having an unknown axis orientation relative to a coordinate reference frame. By defining a standard orientation matrix (A _S ) with reference to the set coordinate reference frame, 133B) can be obtained through rotation and / or reflection of the standard orientation matrix. This is defined as a general 3x3 matrix representing three-dimensional orthogonal Cartesian space. Can be achieved by applying an unknown transformation matrix R at this stage. The transformation matrix can be used to obtain the desired matrix A as follows:

(b4)

Derivation of total magnetic field vector

As described above with reference to Figures 3-5, the total magnetic field acting on the system 600 can be measured with fluorescence. These measurements can be modeled as a linear system in which the total magnetic field impinging on the sensor can be determined:

(b5)

은 센서 시스템 내부에서 작용하는 자기장 벡터를 나타내며 좌표 좌표계에 상대적인 직교 좌표로 표현된다.

4 개의 임의로배치된 NV 중심 다이아몬드 격자 축 각각으로의 자기장 벡터의 투영을 나타낸다. ;

은 센서 잡음 벡터를 나타낸다.

은 측정 벡터를 나타내며, 여기서 i^th 요소는 센서 축 i에 대한 자기장의 추정된 투영을 나타낸다. 단위로 환산하면, 측정 벡터가 DNV 센서의 고유 단위(마이크로파 공명 주파수의 관점에서)에서 자기장 세기 단위로 변환되었다고 가정한다. 또한,

용어는 결정치보다

의 요소 별 절대 값을 나타낸다.here,

Represents the magnetic field vector acting within the sensor system and is expressed in Cartesian coordinates relative to the coordinate system.

And the projection of the magnetic field vector into each of four randomly arranged NV center diamond grating axes. ;

Represents the sensor noise vector.

Represents the measurement vector, where i ^th The element represents the estimated projection of the magnetic field to the sensor axis i. , It is assumed that the measurement vector has been converted to a magnetic field intensity unit in the intrinsic unit of the DNV sensor (in terms of the microwave resonance frequency). Also,

The term

Represents the absolute value of each element.

Given a linear model for the magnetic field measurement of equation (b5), the least square estimate of the total field acting on the system 600 can be given by the following equation:

(b6)

In the above equation, the + suffix represents the pseudo-order of Moore-Penrose. Since the three 4-element columns of A ^T are linearly independent, equation (b6) can be rewritten as:

(b7)

(아래에 더 구체적으로 확립됨)가 치환되었다. R이 직교 행렬이기 때문에, 수학식(b7)은 다음으로 감소될 수 있다:In the equation (b7)

(More specifically established below). Since R is an orthogonal matrix, equation (b7) can be reduced to:

(b8)

가 측정 및 각각에 대한 양의 가중치 및

를 나타내면, 총 자기장에 대한 가중된 최소 제곱 공식은 다음과 같이 기록될 수 있다:In the equations (b7) to (b8), it was assumed that all measurements were equally weighted. However, if the portion of the axis is less favorable for different measurements or for other reasons, different weights may be used for each axis for optimal least squares estimation.

&Lt; RTI ID = 0.0 &gt; and &lt; / RTI &gt;

, The weighted least squares formula for the total magnetic field can be written as:

(b9)

Based on equation (b9), the generalized least-squares solution of equation (b6) can now be written as:

(b10)

는 b와 같아야 한다. 그러나 불완전한 시스템에서는 성능 메트릭을 사용하여 측정과 관련된 오류를 판별하는 것이 가능하다. 사용될 수 있는 하나의 가능한 메트릭은 최소 제곱 솔루션에 의해 최소화된 잔차 벡터의 2- 노름(norm)이다. 이러한 메트릭(r)은 다음에 의해 주어질 수 있다.For a complete NV diamond material 620 without any defects (e.g., lattice misalignment, impurities, etc.) and no sensor noise,

Should be equal to b. However, in an incomplete system it is possible to use performance metrics to determine errors related to measurements. One possible metric that can be used is the 2-norm of the residual vector minimized by the least squares solution. Such a metric r may be given by:

(b11)

Since the residual vector is proportional to the measured amplitude, the magnitude of the true magnetic field can be used to normalize the metric to provide a consistent metric even in the presence of a varying field of magnetic field:

(b12)

If the actual magnetic field is not known, the measurement vector magnitude can be used to normalize the metric:

(b13)

Estimation of orientation of absolute axis in NV diamond material

By a simple substitution into equation (5) in equation (4), the measurements obtained by system 600 can be represented by a standard azimuth matrix:

(b14)

As noted above, permanent magnets (e.g., first magnetic field generator 670) and / or coils (e.g., second magnetic field generator 675) may be used to properly isolate a Lorentz dip corresponding to each magnetic field measurement . However, at this time, the direction of the sensor axis is unknown. Thus, the required bias or control field, defined as b _bias , which produces the desired dip separation, is not known.

As will be described in greater detail below, there are a plurality of b- _bias vectors that can equally divide the four Lorentz dips for proper measurement purposes. Moreover, in order to determine the unknown orientation of the diamond grating, there is no need to accurately position or apply a bias magnetic field which would result in perfectly the same dip separation, which may be more appropriate during magnetic field measurements of the external magnetic field. In this case, the _bbias vector sufficiently separating the four dips may be sufficient to determine the unknown direction of the diamond lattice, so that an executable _bbiase vector suitable for this step can be increased. However, sufficient spectral dip separation can vary depending on the width of the dip and the planned size of the calibration field (see below). The width of the dip depends on the diamond configuration and sensor laser and / or RF excitation mechanism. Based on the resulting width due to inherent sensor characteristics, the size and orientation should be sufficient to ensure that the maximum spectral variation expected to result from the calibration test is sufficient to maintain adequate separation between adjacent Lorentz dips.

Figure 134 shows the step of determining an operable b _bias bias vector magnetic field. As shown in FIG. 134, the first magnetic field generator 670 may be arbitrarily disposed in one or more positions and / or orientations such that a plurality of magnetic fields are applied to the diamond having the unknown orientation 13300 '. Measurement of the fluorescence intensity response is taken for each position and / or orientation of the first magnetic field generator 670. Once a fluorescence intensity response 13400 is generated that properly separates the four Lorentz pairs, the position of the first magnetic field generator 670 is maintained and the process can proceed to a calibration test. In other cases, the separation process may be performed by the second magnetic field generator 675. In this case, the controller 680 may control the second magnetic field generator 675 to generate multiple magnetic fields until a desired separation occurs. In yet another embodiment, the first and / or second magnetic field generators are coupled to a pivot assembly (e.g., gimbal assembly) that can be controlled to hold and position the first and / or second magnetic field generators . By forming a set of controlled orientations, desired Lorentz separation and / or calibration magnetic fields are formed (described below). In this case, the controller 680 may control the pivot assembly having the first and / or second magnetic field generators to position and maintain the first and / or second magnetic field generators in a predetermined direction.

After a suitable calibration b _bias magnetic field is found to properly separate the four Lorentz dips, the measurement vector m _bias of the magnetic field projection of the corresponding bias magnet is obtained. The measurement vector can be expressed in a manner similar to the linear model described in equation (b5): &lt; EMI ID =

(b15)

As mentioned above with respect to equation (b5), the variables shown in equation (b15) are the same but are expressed in terms of the applied bias magnetic field.

At this point, you can not tell which of the four Lorentz dips corresponds to an unknown sensor axis. However, since any possible permutation of axis orders can be captured by applying the appropriate orthogonal matrix to A _S , and since the process described herein estimates an orthogonal matrix that best represents the data, Lt; / RTI &gt; For this reason, the axis can generally be assigned such that the Lorentz dip closest to the zero field division frequency is assigned to a ₁ , and the second closest is assigned to a ₂ .

Restoration of sign of magnetic field projection

Due to the symmetry of the sensor measurement, the resulting m _bias vector has no sign information unique to each of the four components. However, signature information can be recovered using the following process.

The projection of the magnetic field vectors on the four axes is given by the vector (A ^T b). The sum of the projections can be initially considered equal to 0 every time:

(b16)

은 모두 0으로 이루어진 벡터를 나타낸다. 벡터

의 원소의 합이 0과 같은 경우, 다이아몬드의 4 개 축으로의 투영이 x와 동일한 자기장 벡터 b가 발견될 수 있다. 이와 관련하여, 자기장 벡터 b는 다음과 같이 정의될 수 있다:In the above equation (b16)

Represents a vector consisting of all zeros. vector

Is equal to zero, then a magnetic field vector b with the same projection of the diamond along the four axes as x can be found. In this regard, the magnetic field vector b can be defined as:

(b17)

The projection of the magnetic field vector (b) on the four axes of the diamond can be given by:

(b18)

The values for the matrix A _s from Equations 1 through 2 can be plugged into Equation (b18) to provide:

 (b19)

 Since the sum of all elements of x is initially assumed to be zero, equation (b19) can be reduced to:

(b20)

Thus, the point where the b-axis vector exists and projected onto the axis of the diamond is equal to x and the initial estimate of equation (b16) is proved. Thus, the sum of the axial projections of all magnetic fields impinging on the diamond is equal to zero, and if there is no noise, the measured values obtained are also summed to zero. Therefore, the code information for the bias measurement can be recovered according to this basic principle. This particular step is particularly useful when the estimate of the bias field is much greater than the expected noise level.

Referring now to Figure 135, a method for recovering sign information from a bias magnetic field measurement according to one embodiment will be described. First, in step 13510, the largest of the four measurements is arbitrarily set to a positive or negative sign value. When this is selected, the next step is determined according to this symbol selection so that the principle of equation (b16) is maintained. For example, as shown in Figure 134, the largest of the four measurements, i.e., measurement 13410a, is assigned a positive value. Next, in step 13511, the second largest measurement value (e.g., measurement 13410b shown in FIG. 134) is set to a negative number. If you set the second largest measurement value to negative, the positive value assigned to the largest measurement value can be offset to zero. In step 13512, the third largest measurement (e.g., measurement 13410c in FIG. 134) is assigned a negative sign value. By definition, the second largest measurement is smaller than the largest measurement, so the negative sign of the third largest measurement further offsets the largest measurement to zero. Finally, at step 13513, the smallest measure is assigned a positive or negative value that allows the sum of the four measures to be approximately zero. In Figure 134, the smallest measurement value 13410d is assigned a positive value. Thus, after this process, an appropriately signed m _bias vector can be obtained.

A series of calibration tests can be performed after the application of the bias field to cleanly separate the four Lorentz dips and collect the measurement results of the bias field. As shown in Figure 135, a series of p known external magnetic fields are applied with the fixed b _bias magnetic field and the resulting sensor measurements are collected. In some embodiments, a series of at least three p (p? 3) weak magnetic fields are applied. In certain embodiments, at least three non-coplanar weak magnetic fields are applied. In yet another embodiment, three orthogonal p (p? 3) weak magnetic fields are applied. In certain embodiments, a weak magnetic field of 4 to 5 p (p = 4, 5, ...) is applied. This magnetic field can be applied by the second magnetic generator 675 and thus can be controlled by the controller 680. [ A known applied external magnetic field can be expressed by the following matrix:

(b21)

In equation (b21), b _k represents the k-th magnetic field for k = 1 ... p. The resulting measurement (m _k ) corresponding to each b _k can be represented by the linear model described above as:

(b22)

A portion of m _k corresponding only to the external magnetic field b _k may be isolated with an appropriate sign value by:

(b23)

는 하다마드(즉, 요소-와이즈) 매트릭스 생성물을 나타내며, sgn(□)은 요소-와이즈 부호 함수를 나타낸다. 이 단계에서 A^T는 알려지지 않은 채로 남아 있다. 하지만, A^Tb_bias가 추정될 수 있다. 이것은 수학식(23)에서 A^Tb_bias를

로 치환함으로써 가능하다:In the above equation,

Denotes a Hadamard (i.e., element-wise) matrix product, and sgn () denotes an element-wise code function. At this stage, A ^T remains unknown. However, the A ^T b _bias can be estimated. This means that A ^T b _bias in equation (23)

: &Lt; RTI ID = 0.0 &gt;

(b24)

By combining equations (22) and (23), the derived calibration measurements can be recorded as:

(b25)

.In the above equation (b25)

.

및

)을 정의함으로써, 외부 자기장 및 그 대응하는 측정치는 다음에 의해 컴팩트하게 나타날 수 있다:Matrix

And

), The external magnetic field and its corresponding measurement can be represented compactly by: &lt; RTI ID = 0.0 &gt;

(b26)

가 얻어졌으면, 수학식(b26)은 다음으로서 확장될 수 있다:Once known B and measured

Is obtained, equation (b26) can be extended as follows: &lt; RTI ID = 0.0 &gt;

(b27)

는 증명되었고, 이에 따라 위의 수학식(b27)으로 치환되었다. A_s의 단일 값이 알려지고 동일(즉, 약 1.15)하기 때문에 잡음 항(

)은 표현(

)에서 채색되거나 크게 증폭되지 않을 것이다. 따라서, 새로운 잡음 항으로서 표현(

)을 처리할 수 있다:From equation (b19),

Was proved, and thus replaced by the above equation (b27). Since the single value of A _s is known and equal (i.e., about 1.15), the noise term

) Is the expression

) Or will not be greatly amplified. Thus, as a new noise term,

) Can be processed:

(b28)

Combining Equations 27 and 28 leads to the following:

(b29)

Taking the transpose of both sides of equation (29) provides:

(b30)

와

사이에서 최소 제곱 피트를 제공하는 직교 행렬(

)이 바람직하다. 몇몇 최소 제곱 공식은 직교 행렬(

)로의 병진 및/또는 각 오류를 도입할 수 있다. 예를 들어, 오류는 표준배향으로부터 추정된 배향으로의 축의 중심의 병진의 형태로 또는 주어진 축 사이에서 수학식(b3)에 도시된 각도에서의 변화에서 행렬(

)을 표준배향 행렬(A_s)에 적용할 때 도입될 수 있다. 따라서, 표준배향으로부터 추정된 배향으로 회전할 때 서로에 대한 축의 상대 배향을 실질적으로 유지할 수 있는 최소-제곱 피트가 바람직하다. 이러한 관점에서, 직교 행렬은 다음으로서 표현될 수 있다:In the next step, in equation (b30)

Wow

An orthogonal matrix &lt; RTI ID = 0.0 &gt;

) Is preferable. Some least-squares formulas are orthogonal matrices (

) And / or introduce each error. For example, the error can be expressed in the form of a translation of the center of the axis from the standard orientation to the estimated orientation, or in a change in angle at the angle shown in equation (b3)

) To a standard orientation matrix (A _s ). Thus, a minimum-square pit is desirable that can substantially maintain the relative orientation of the axes relative to one another when rotating from a standard orientation to an estimated orientation. In this regard, an orthogonal matrix can be expressed as:

(b31)

In equation (b31), O (3) represents a group of orthogonal 3 × 3 matrices, and ∥ □ ∥ _F represents the Provenius gambling.

)을 정의함으로써, 특정한 문제는

을 해결하기 위해 직교 프로크러스트로 감소될 수 있다. 먼저, 다음이 정의된다:As described above, the orthogonal matrix (

), Then the specific problem is

Lt; RTI ID = 0.0 &gt; pro-crust &lt; / RTI &gt; First, the following is defined:

(b32)

A single devaluation decomposition of Z is performed to obtain:

(b33)

In equation (b33), U is an orthogonal 3x3 matrix containing the left singular vector of Z; [Sigma] is an orthogonal 3x3 matrix containing a single value of Z; V ^T is an orthogonal 3 × 3 matrix containing the right singular vector of Z. Given above, the solution to the orthogonal pro-crust problem of (b33) is given by:

(b34)

)가 얻어진다. 따라서, A의 추정치(

)는 다음을 산출하기 위해 수학식(b4)을 적용함으로써 얻어질 수 있다:Thus, through equation (b34), it is possible to obtain an estimate (A _s ) that can be applied to the standard orientation matrix A _s to provide a true averaged matrix A

) Is obtained. Thus, the estimate of A (

) Can be obtained by applying equation (b4) to yield:

(b35)

In the above embodiment, the Orcogonal Procrustes problem provides the advantage of reducing movement and / or angular error that can be introduced by minimum sum of squares, thus providing an accurate estimate of the required rotation matrix. By accurately estimating the rotation matrix, an accurate estimate of the orientation of the arbitrarily placed lattice structure in the magnetic field detection system with the magneto-optically defective center material is generated. This reduces the process of determining the orientation of the diamond within the magnetic detection system 600 with a simple calibration method that can be calculated and controlled by the controller 680 and can be performed before sensing begins without the need for a pre- . Orientation of the grating structure for sensors or additional equipment for visual acuity testing. Also, as above, an accurate estimate of the actual orientation of the axes of the NV diamond material 620 can be obtained, and the recovery of the external magnetic field for magnetic sensing, described further below, can be improved.

When the axes are determined using the above-described embodiment, the magnetic field of the bias magnet can be optimally redirected using the method described below with new knowledge of the axial direction.

Application of deflection magnetic field

Once the orientation of the axis of the diamond grating is determined, the bias magnetic field can be applied to cleanly separate the Lorentz dip and obtain a sign estimate of the magnetic projection on the identified diamond grating.

As described above, the base line set of the microwave resonance frequency is defined as a frequency generated when no external magnetic field is present. When no bias magnet or bias coil is present (i.e., the bias magnet or bias coil is not internally added to the system by, for example, the first and second magnetic field generators 670, 675), the baseline resonance frequency (For example, all about 2.87 GHz). When a bias magnet or coil is introduced (e.g., applied by the first magnetic field generator 670 and / or the second magnetic generator 675), the baseline resonance frequency of the four axes is set to the magnetic field of the bias magnet of 4 Only one of the axes is unique. By applying a known bias magnetic field, the magnitude and orientation of the non-zero external magnetic field can be determined by evaluating an additional shift in the microwave resonance frequency of each axis with respect to the baseline frequency offset, as will be described in greater detail below.

For an external magnetic field without a bias magnetic field, the Lorentz dip of the microwave resonance spectrum corresponding to each of the four axes can be significantly overlapped. This overlap can occur when the projection of the external magnetic field onto multiple axes is similar or when the width of the Lorentz dip is much larger than the difference in resonant frequency shift due to the external magnetic field. In this case, the externally biased magnets applied as part of the system 600 can be used to minimize the overlap by largely separating the Lorentz spectral spectra to enable a unique recovery of the external magnetic field projection on each axis.

Next, an optimal bias magnetic field through a first magnetic field generator 670 (e.g., a permanent magnet) and / or a second magnetic field generator 675 (e.g., a three axis Helmholtz coil system) Controller 680 is shown. Once the optimal bias magnetic field is determined, the direction of the bias magnet field for the diamond can be determined to produce the desired baseline shift.

로 표현된다. 위에서 언급했듯이, 다이아몬드의 4 개 축 각각에 대한 바이어스 자기장의 투영은

에 의해 주어진다. 중앙화 제로-자기장 분할 주파수(예를 들어, 약 2.87 GHz)에 대한 마이크로파 공진 주파수(f)의 시프트된 기본선 세트는 다음에 의해 주어질 수 있다:Similarly to the above when determining the orientation of the axis of the diamond grating, the magnetic field generated by the bias magnet (e.g., first magnetic field generator 670 and / or second magnetic field generator 675)

Lt; / RTI &gt; As mentioned above, the projection of the bias magnetic field to each of the four axes of the diamond

Lt; / RTI &gt; The shifted base line set of the microwave resonant frequency (f) for a centralized zero-field division frequency (e.g., about 2.87 GHz) can be given by:

(b36)

In equation (b36), it can be seen that? Represents a nitrogen vacancy magnetic field ratio of about 28 GHz / T.

Depending on the nature of the sensor and the particular application, the optimal performance of the sensor can be achieved in a variety of reference frequency sets. However, not all arbitrary fundamental frequency sets are feasible. Thus, a criterion for generating a baseline offset at which a corresponding desired bias magnetic field can be calculated can be determined.

First, f can be defined to represent a preferred set of baselines of the microwave resonant frequency with a center zero magnetic field splitting frequency, and can be expressed as:

(b37)

Using equation (b36), if the _bias b of generating f is present, the projection b of the _bias in the four axes of the diamond may be given by the following:

(b38)

의 동일한 쌍이 시스템(600)에 의해 생성될 것이다. 따라서, 각 축 투영 결과베이스 라인에 영향을 미치지 않고 양수 또는 음수가 된다.Regardless of the sign value of the axial projection (i.e., positive or negative), the microwave resonance frequency

The same pair of &lt; / RTI &gt; Thus, each axis projection result is positive or negative without affecting the baseline.

In order to verify that b _bias to produce f actually exists, the notion that the bias magnetic field _bbias exists only when the projection of _bbias for the four diamond axes is applied as 0, ) Was shown above as true. Thus, this concept can be expressed as:

(b39)

Thus equation (b39) if the sum is found to be set to be a 0 {s_1, s_2, s_3, s_4} there is a _bias vector b to generate a desired reference line f. From equation (b17) above, _bias b can be given by the following:

(b40)

Once the set {s_1, s_2, s_3, s_4} that produces the b_bias vector that produces the desired baseline f is determined, the Lorentz dip can fine tune to the desired separation by applying the appropriate bias magnetic field using the first magnetic field (670) And / or a second magnetic field generator 675. For example, in a microwave resonance spectrum, the even spacing between each pair of adjacent pairs can be represented by the following set of baselines:

(b41)

에 대해 유지된다. 인접한 딥의 쌍 사이의 거리는 2α이다. 또한 투영 합계가 0이될 수 있는 가능한 집합 {s_1, s_2, s_3, s_4}은 {1, -1, -1,1}이다. 따라서, 수학식(b40) 및(b41)로부터, 동일하게 분리된 기본선 세트를 생성할 b_bias는 다음에 의해 주어진다:The above equation is arbitrary

Lt; / RTI &gt; The distance between pairs of adjacent dips is 2 alpha. The possible set {s_1, s_2, s_3, s_4} that the projection sum can be zero is {1, -1, -1,1}. Thus, from equations (b40) and (b41), the b _bias to generate the equally-separated base line set is given by:

(b42)

Assuming that the diamond is a standard orientation for the coordinate reference frame (i.e., A = A _s ), equation (b42) will be reduced to:

(b43)

Alternatively, however, the b _bias may also be determined after the true toast flavor has been estimated using the method described above. For example, the b _bias to produce a base line set that is equally separated for arbitrarily oriented diamonds is Given by replacing equation (b35) with equation (b42), the following is calculated: &lt; EMI ID =

(44)

A maximum separation or single axis pair of dips in the microwave resonance spectrum can also be achieved. The maximum separation may be indicated by the following basic line set:

(b45)

에 대해 유지된다. 인접한 딥의 1차 쌍 및 3개의 다른 피크 쌍 사이의 분리는 2a일 것이다. 위에 기재된 바와 같이, 0으로 합산하는 투사의 합에서 초래되는 가능한 세트{s₁, s₂, s₃, s₄}는 {-1, -1, -1, 1}이다. 따라서, 수학식 40과 45로부터, 최대 단일 딥 분리된 기본선 세트를 생성할 b_bias는 다음에 의해 주어진다:The equation

Lt; / RTI &gt; The separation between the primary pair of adjacent dips and the three different peak pairs would be 2a. As described above, the possible set {s ₁ , s ₂ , s ₃ , s ₄ } resulting from the sum of the projections summing to zero is {-1, -1, -1, 1}. Thus, from equations 40 and 45, the b _bias to produce a maximum single deeply separated base line set is given by:

(b46)

Assuming that the diamond is in a standard orientation with respect to the coordinate reference frame (i.e., A = A _s ), equation (b46) will be reduced to:

(b47)

It should be noted that the equation (b47) is directly corresponding to the four toast one direction (a _4).

Alternatively, _bbias may also be determined after the true toast flavor is estimated using the method described above. For example, b _bias can create up to separate the base line setting with respect to the oriented diamond optionally jueojyeoseo by substituting the equation (b35) by the equation (b46), and calculates the following:

(b48)

Measurement of external magnetic field

로 정의하면 식(b5)이 다음으로서 표현될 수 있다:When a bias magnet and / or coil having a desired bias magnetic field is applied to the system 600 using the first and / or second magnetic field generators 670 and 675 to generate the desired microwave resonance frequency of the set of baselines, Can be measured. The external magnetic field at the position of the diamond sensor

(B5) can be expressed as: &lt; RTI ID = 0.0 &gt;

(b49)

The portion of m corresponding to the external magnetic field can be separated by comparing m with known projections of the bias magnetic field b_bias, which can be expressed as: &lt; RTI ID = 0.0 &gt;

(b50)

In equation (b50), ㅀ represents the Hadamard (element-wise) matrix multiplication. The resulting m _ext has the appropriate sign for the projection of b _ext on each axis, and if m _ext is used instead of m to estimate b _ext , we can use the approach shown in equations (b5) through (b13) To allow explicit restoration of b _ext .

Based on the above, an unknown external magnetic field vector can be accurately estimated and restored. FIG. 137 is a flow chart illustrating a method for reconstructing an external magnetic field vector as implemented by controller 680 of system 600 using the method described above. In step 13710, the bias magnetic field that will produce the desired separation between the Lorentz responses for each diamond axis is calculated using the method described above (e.g., the same separation or maximum separation calculation). Once this is determined, the first magnetic field generator 670 (e.g., a permanent magnet) may be arranged to produce a desired magnetic field or a second magnetic field generator 675 (e.g. a triaxial Helmholtz coil) 680) to produce the desired magnetic field. Next, in step 13720, directions (i.e., sign values) are assigned to the respective Lorentz pairs using the above-described code recovery method shown in FIG.

Once the Lorentz response is optimally separated by the application of the appropriate bias magnetic field and the code value of the pair is assigned, measurement data of the total magnetic field impinging on the system 600 is collected in step 13730. The change in Lorentz dip due to the external magnetic field in step 13740 then determines the linear relationship between the application of the magnetic field vector projected to the given diamond axis and the resulting energy splitting between m _s = -1 spin states and m _s = 1 spin state. In step 13750, this shift information is used in conjunction with the method described using equations (b49) to (b50) to calculate an estimate of the external magnetic field b_ext.

Although the embodiments of the inventive concepts disclosed herein have been described in detail with reference to the preferred embodiments thereof, those skilled in the art will appreciate that variations and modifications may be made within the spirit and scope of the invention.

A magnetic band-pass filter

Hereinafter, there is a more detailed description of the various concepts related to the method, apparatus and system for filtering the signal in magnetic communication and providing anomaly detection using a diamond nitrogen vacancy (DNV) sensor. The technique provides a bandpass filter to allow the user to focus on an operating frequency band that allows for limited environmental noise for communication with specific frequency signals for anomaly detection. The filtered signal increases signal to noise (SNR) for communication and anomaly detection. The filtered signal reduces unwanted signals and allows the operator to better interpret the signal. Magnetic communication using magnetic media provides advantageous features for underground penetration applications and underwater environments. The restriction on the application of magnetic communication is a noisy operating environment. The disclosed technique solves this problem by providing appropriate magnetic filtering.

In some implementations, the system of the subject technology attenuates the magnetic communication signal outside the target frequency range. In the electrical world, bandpass filters can be realized using resistors and capacitors and / or a combination of other passive or active elements. In a magnetic field, however, a solenoid and a semi-magnetic material can be used to perform the desired filtering function.

138 is a schematic diagram of a diamond 13802 with nitrogen vacancies of a DNV sensor 13800 having a low pass filter 13810 and a high pass filter 13820. As shown in FIG. 138, the low-pass filter 13810 and the high-pass filter 13820 cooperate to form a magnetic band-pass filter. Low pass filter 13810 is formed by a solenoid using diamond 13802 as a core and includes a loop of conductive material 13814 with a ring formed over resistor 13812 and portions of diamond 13802. In some implementations, loop 13814 of conductive material may comprise a plurality of loops for diamond 13802. [ The resistor 13812 is electrically connected to the first end of the loop 13814 and the second end of the loop 13814. [ In some implementations, resistor 13812 is a constant resistance. In other implementations, resistor 13812 may be a potentiometer, such as a potentiometer or other tunable resistor element. With variable resistance, the modification of the resistance can optionally damp a set of high frequency magnetic signals. That is, for example, a modification to the resistance applied by the potentiometer may change the upper frequency attenuated by the low-pass filter 13810. Thus, the higher frequency magnetic signal may be attenuated to reduce noise associated with the expected signal detected by the DNV sensor 13800. [ The solenoid formed by the loop 13814 and the resistor 13812 produces an opposite electric field that is proportional to the rate of change of the varying magnetic field and resists the changing magnetic field, which has a greater effect on the alternating magnetic field. In some implementations, the solenoid formed by the loop 13814 and resistor 13812 may include a capacitor to control the shape of the low-pass filter 13810.

The high-pass filter 13820 is formed by a diamagnetic material 13822 disposed with respect to the diamond 13802. The semi-magnetic material 13822 is repelled by an external magnetic field. Semi-magnetic material (13822) is the applied environmental magnetic field. Based on the selected semi-magnetic material 13822, the low frequency for the filtered magnetic signal can be changed. In some implementations, the semi-magnetic material 13822 may have a permeability of about 0.9. The anti-magnetic material 13822 can act as a DC breaker to filter low frequency magnetic signals emitted from the DC current or devices.

Using a combination of one or more solenoids as a lowpass filter 13810 and a semi-magnetic material 13822 as a highpass filter 13820, a bandpass filter for the DNV sensor 13800 can be formed. If low pass filter 13810 uses tunable resistor 13812, attenuation of the alternating magnetic field can be optimized for the desired frequency band. That is, changing the resistance to the low-pass filter 13810 can change the high-frequency magnetic signal attenuated while the high-pass filter 13820 filters the low-frequency magnetic signal.

Figure 139 is a graphical diagram 13900 illustrating an exemplary magnetic signal 13902 that includes a test signal 13904 without using filtering. The magnetic signal 13902 corresponds to the use of DNV sensor-based equipment located in a vehicle driven in rural areas with a manageable magnetic noise floor. The equipment was used to read magnetic signals, and vehicles with DNV sensors were very loud. This is coupled with equipment proximity, making it difficult to restore test signal 13904 from noise in exemplary magnetic signal 13902. [ Given the noise of the magnetic signal 13902, providing a filtering mechanism that removes and / or reduces the magnetic signal noise increases the signal sharpness (SNR) when receiving a particular corresponding signal, such as the test signal 13904, Can be provided clearly.

140 shows a block diagram of a DNV sensor 14002 having a low pass filter 14010 and showing the magnetic field 14050 of the environment, the change in the magnetic field of the environment 14052, and the induced magnetic field 14054 by the low- Frequency signal. In the illustrated arrangement, the diamond 14002 acts as a core of a solenoid composed of a loop 14012 of a conductive material and a resistor 14014 acting as a low-pass filter 14010. Diamond 14002 changes when the external magnetic field 14050, the B external magnetic field 14050, B is changed by the change? B of the magnetic field 14052 based on the external magnetic noise from the environment, the change? B of the magnetic field 14052, (Where DELTA Phi is the change in magnetic flux) of the conductive material 14012 that is inversely proportional to the rate of change of the magnetic field 14052 according to (EMF = -N DELTA PHI / DELTA t) Is the number of turns of the conductive material 14012 relative to the diamond 14002, and EMF is the induced electromagnetic force (EMF). The induced current 14016 due to the generated EMF has a greater influence on the high frequency magnetic signal due to the differential term ?? /? T, and the effect depends on the number N of turns in the conductive material 14012 and, in some embodiments, 14014 may be used to change the operating area of low pass filter 14010. [ In some implementations, the variable resistor 14014 may be a potentiometer. In some implementations, variable resistor 14014 may be coupled to the first end of the loop of conductive material 14012 and the second end of the loop of conductive material 14012 to form a low-pass filter 14010. [ In some implementations, 14012 and resistor 14014 may include a capacitor to control the shape of the low pass filter 14010.

In some implementations, the controller may be coupled to a component for adjusting the variable resistor 14014 and / or the variable resistor 14014. For example, a digital potentiometer may be used as the variable resistor 14014 and the controller may be configured to change the resistance of the variable resistor 14014. In some implementations, the controller may be configured to change the resistance of the variable resistor 14014 to selectively attenuate the low pass filter 14110. The selective attenuation is performed in response to the detected magnetic disturbance or the strength and / or direction of the magnetic signal.

In other implementations, the controller may be configured to change the orientation of the DNV sensor 14000. For example, the DNV sensor 14000 can be mounted to the structure to allow rotational orientation of the DNV sensor 14000 or more directional modification. For example, the DNV sensor 14000 may be mounted on a printed circuit board (PCB) or other suitable structure that may be mechanically or otherwise rotated in one or more directions. A change in orientation of the DNV sensor 14000 may be responsive to the strength and / or direction of the detected magnetic disturbance or magnetic signal.

141 also shows a diamond 14102 of a DNV sensor 14100 having a first low-pass filter 14110 and a second low-pass filter 14120. The diamond 14102 is connected to the core 14122 of the first solenoid of the first low pass filter 14110 and the core 14122 of the second solenoid of the second low pass filter 14120 composed of the second resistor 14124, And a first resistor 14122 and a second resistor 14124. In some implementations, the first loop and / or the second loop may be made of multiple loop conductive materials. In the illustrated embodiment, the first loop 14112 of conductive material is located in the first plane relative to the diamond 14102 and the second loop 14122 of conductive material is located on the second plane relative to the diamond 14102 The first and second surfaces are orthogonal. Thus, the first low-pass filter 14110 is a low-pass filter for the first spatial orientation and the second low-pass filter 14120 is a low-pass filter for the second spatial orientation. In some implementations, the first resistor 14124 formed by the first loop 14112 of conductive material and the second loop 14122 of conductive material and the second resistor 14124 and / or the first resistor 14114 formed by the second solenoid, The solenoid includes low-pass filters 14110 and 14120.

When the first resistor 14114 and the second resistor 14124 have the same resistance, attenuation from the low-pass filters 14110 and 14120 causes the first low-pass filter 14110 and the second low- And is strongest at the diagonal line between the filters 14120. If the first resistor 14114 has a greater resistance than the second resistor 14124, the attenuation from the low-pass filters 14110 and 14120 can be attenuated by the first low-pass filter 14110, It will be closer to the first side. A second low-pass filter 14120 is located. In some implementations, the first resistor 14114 and / or the second resistor 14124 may be a variable resistor. In some implementations, the first variable resistor 14114 and / or the second variable resistor 14124 may be a potentiometer. The first resistor 14114 is coupled to the first end of the first loop of conductive material 14112 and the second end of the first loop of conductive material 14112 to form a first low pass filter 14110 . The second resistor 14124 is connected to the first end (e.g., the third end) of the second loop of the conductive material 14122 and the second end of the second loop of the conductive material 14122 To form a second low-pass filter (14120).

The first variable resistor 14114 can be used to independently vary the operating region of the first low pass filter 14110 and the second variable resistor 14124 can be used to independently vary the operating region of the second low pass filter 14120 . Independent modification of the operating regions of the low pass filters 14110 and 14120 can alter the spatial orientation of the maximum attenuation to modify the spatial orientation of the maximum attenuation due to the induced EMF. Thus, in some implementations, the controller may include a component and / or a second variable resistor 14124 for adjusting the first variable resistor 14114 and / or the first variable resistor 14114 and the second variable resistor 14124 May be coupled to the component for adjustment to modify the spatial orientation of the maximum attenuation with respect to diamond 14102. [ For example, a digital potentiometer may be used as the first variable resistor 14114 and / or the second variable resistor 14124, and the controller may control the resistance of the first variable resistor 14114 and / or the second variable resistor 14124 / RTI &gt; In some implementations, as described in greater detail herein, the controller may modify the resistance of the first variable resistor 14114 and / or the second variable resistor 14124 to reduce the resistance of the first low pass filter 14110 and / And may be configured to selectively attenuate the low pass filter 14110. The selective attenuation may be responsive to the magnitude and / or direction of the detent of the magnetic interference and magnetic signal. In some implementations, a correction to the first variable resistor 14114, such as a potentiometer, attenuates the set of high frequency magnetic signals for the first low pass filter 14110 for the first spatial orientation. Correction to the second variable resistor 14124, such as a potentiometer, attenuates the set of high frequency magnetic signals for the second low pass filter 14120 for the second spatial orientation.

In a partial alternative embodiment, the diamond 14102 acts as the core of the third solenoid of the third low-pass filter consisting of the conductive material of the third loop and the third resistor. In some implementations, the third loop may be fabricated from a plurality of conductive material loops. The third loop of conductive material is positioned in a third plane relative to the diamond 14102 such that the third plane is orthogonal to the first plane of the first low-pass filter 14110 and the second plane of the second low- . Thus, the third low-pass filter is a low-pass filter for the third spatial orientation. The third resistor is coupled to the first end (e.g., the fifth end) of the third loop of conductive material and the second end (e.g., the sixth end) of the third loop of conductive material to form a third low- The third resistor of the filter may be a variable resistor such as a potentiometer. In some implementations, a change to the third variable resistor attenuates the set of high frequency magnetic signals for the third low pass filter for the third spatial orientation. The third low pass filter, the third resistor, the third loop, etc. may be further configured and / or controlled in a manner similar to the first low pass filter 14110, the first resistor 14114, the first loop 14112, Or may be used. And the third low-pass filter is positioned in the third spatial orientation. Thus, using the first low-pass filter 14110, the second low-pass filter 14120 and the third low-pass filter, the change in resistance applied to each variable resistor is determined by the spatial orientation of the maximum attenuation for the diamond 14102 Can be modified.

In any of the DNV sensors 13800, 14000, 14100 described herein, a semi-magnetic material such as a semi-magnetic material 13822 may be used for the high pass filter as described in more detail herein.

142 shows the diamond 14202 of the DNV sensor 14200 with respect to the diamagnetic material 14210 and shows the alignment of the magnetic poles 14212 of the diamagnetic material 14210 with respect to the induced magnetic field 14220. Fig. The semi-magnetic material 14210 generates an external magnetic field B and the semi-magnetic material 14210 generates an induced magnetic field B1 aligned in antiparallel with the applied environmental magnetic field.

143 shows the behavior of the semi-magnetic material for use in a high-pass filter in conjunction with an external or applied environmental field B; Curve 14300 includes the change in magneticity M of the semi-magnetic material to an external or applied environmental magnetic field, B. As shown in FIG. 143, the magnetic field of the semi-magnetic material is opposite to the applied magnetic field and includes a delay until a constant magnetic field for the semi-magnetic material is achieved. The delay is due to a semi-magnetic material, such as a semi-magnetic material 14210, which is antiparallel to the external magnetic field and has a region such as pole 14212 that requires a certain amount of time for reconstruction opposite the external magnetic field. However, this effect may not be instantaneous and the semi-magnetic material experiences a charge time similar to the charge time of the capacitor. Thus, high frequency magnetic signals consume less time in orientation than slow modulation signals. This allows a portion of the high frequency of the magnetic signal to pass through the semi-magnetic material and a portion of the low frequency portion of the magnetic signal to be filtered. The permeability and size of the semi-magnetic material can change the effect.

Referring again to Figure 142, based on the selected semi-ferromagnetic material 14210, the low frequency for the filtered magnetic signal can be changed. In some implementations, the semi-magnetic material 14210 may have a magnetic permeability of about 0.9. The anti-magnetic material 14210 may act as a DC breaker to filter low-frequency magnetic signals emitted from the DC current or devices. In some implementations, the diamagnetic material 14210 may be located at the end of the diamond 14202. In some implementations, the diamagnetic material 14210 is based on the location of one or more currents or anticipated DC currents. Diamond 14202 In another embodiment, the DNV sensor 14200 includes a current or anticipated DC current or a semi- (Not shown). For example, a pair of diamagnetic materials 14210 may be located at opposite ends of the diamond 14202 of the DNV sensor 14200. In addition, a semi-magnetic cubic of the material may be formed for the DNV sensor 14200. In addition, in a further implementation, the diamagnetic material 14210 can be a liquid material, and the diamond 14202 of the DNV sensor 14200 can be located within the liquid semi-magnetic material 14210 or otherwise surrounded by the diamagnetic material 14210. [ .

144 shows a method 14400 for changing the filtering frequency of the low pass filter for the DNV sensor based on the detected magnetic field. The method 14400 includes providing a diamond nitrogen vacancy sensor (block 14402). The DNV sensor may be any of the DNV sensors (13800, 14000, 14100, 14200). In some implementations, the DNV sensor may be similar to the DNV sensor 14000 and may include a diamond with nitrogen vacancies and a low pass filter. The low-pass filter may comprise a loop of conductive material disposed about the diamond and a variable resistor connected to the first end of the loop and the second end of the loop. In other implementations, the DNV sensor may be similar to the DNV sensor 14100 and may include a diamond having a nitrogen vacancy, a first low pass filter in a first spatial orientation, and a second low pass filter in a second spatial orientation have. The first low pass filter may comprise a first loop of conductive material disposed about a first portion of the diamond and a first variable resistor connected to a first end of the first loop and a second end of the first loop. The second low-pass filter includes a loop of a second conductive material disposed about a second portion of the diamond and a second variable resistor coupled to a first end (e.g., a third end) of the second loop and a second variable resistor For example, the fourth end). The first loop of conductive material may be disposed in a first plane and the second loop of conductive material may be disposed in a second plane. In some implementations, the first plane and the second plane are orthogonal. In some implementations, the first variable resistor and / or the second variable resistor is a potentiometer. In some other implementations, the DNV sensor may further comprise a third loop of conductive material disposed about a third portion of the diamond such that a third loop of conductive material is located in a third plane. The third plane may be perpendicular to the first plane and the second plane. In another implementation, any one of the DNV sensors 14000, 14100 may include a semi-magnetic material, such as the semi-magnetic material 14210 described herein.

The method 14400 further includes detecting an interfering magnetic signal (block 14404). Detecting the interfering magnetic signal may include detecting a magnetic signal interfering with the DNV sensor. In some implementations, detection of the interfering magnetic signal is performed with a controller in electrical communication with the DNV sensor. In other implementations, detecting the interfering magnetic signal may be in conjunction with another component in electrical communication with the controller. Detecting an interfering magnetic signal may simply include detecting the direction of the magnetic signal above a predetermined high frequency.

The method 14400 further includes varying the value of one or more of the first variable resistor or the second variable resistor based on the detected magnetic signal (block 14406). The change in value for the first variable resistor and / or the second variable resistor can be performed by the controller. In some implementations, the controller may include instructions to change the digital potentiometer for the first variable resistor and / or the second variable resistor. In other implementations, the controller may modify another component to modify the value for the resistance of the first variable resistor and / or the second variable resistor. By varying the resistance value for the first variable resistor and / or the second variable resistor to zero or substantially zero resistance value, substantially all high frequency magnetic signals can be attenuated.

In some implementations, the one or more low pass filters attenuate substantially all high frequency magnetic signals, adjust the resistance value of the variable resistor until a test signal is detected, or adjust the resistance value of the variable resistor to a predetermined frequency value for filtering And increasing the attenuation until it is achieved.

145 is another method 14500 for changing the orientation of the DNV sensor with a low-pass filter based on the detected magnetic field. The method 14500 includes providing a diamond nitrogen vacancy sensor (block 14502). The DNV sensor may be any of the DNV sensors (13800, 14000, 14100, 14200). In some implementations, the DNV sensor may be similar to the DNV sensor 14000 and may include a diamond with nitrogen vacancies and a low pass filter. The low-pass filter may comprise a loop of conductive material disposed about the diamond and a variable resistor connected to the first end of the loop and the second end of the loop. In other implementations, the DNV sensor may be similar to the DNV sensor 14100 and may include a diamond having a nitrogen vacancy, a first low pass filter in a first spatial orientation, and a second low pass filter in a second spatial orientation have. The first low pass filter may comprise a first loop of conductive material disposed about a first portion of the diamond and a first variable resistor connected to a first end of the first loop and a second end of the first loop. The second low-pass filter includes a loop of a second conductive material disposed about a second portion of the diamond and a second variable resistor coupled to a first end (e.g., a third end) of the second loop and a second variable resistor For example, the fourth end). The first loop of conductive material may be disposed in a first plane and the second loop of conductive material may be disposed in a second plane. In some implementations, the first plane and the second plane are orthogonal. In some implementations, the first variable resistor and / or the second variable resistor is a potentiometer. In some other implementations, the DNV sensor may further comprise a third loop of conductive material disposed about a third portion of the diamond such that a third loop of conductive material is located in a third plane. The third plane may be perpendicular to the first plane and the second plane. In another implementation, any one of the DNV sensors 14000, 14100 may include a semi-magnetic material, such as the semi-magnetic material 14210 described herein.

The method 14500 further includes detecting a magnetic signal (block 14504). Detection of the magnetic signal may include detecting the magnetic signal with a DNV sensor. In some implementations, the detection of the magnetic signal is performed with a controller in electrical communication with the DNV sensor. In other implementations, detecting the magnetic signal may be in conjunction with another component in electrical communication with the controller. The detection of the magnetic signal may include simply detecting the orientation of the magnetic signal above a predetermined high frequency.

The method 14500 further includes changing the orientation of the loop of the DNV sensor based on the detected magnetic signal (block 14506). Alteration of the orientation of the loop of the DNV sensor can be performed by the controller. Altering the orientation of the loop of the DNV sensor may include changing the orientation of the DNV sensor and / or changing the orientation of the loop independent of the orientation of the diamond of the DNV sensor. In some implementations, the controller may include instructions to change the orientation of the DNV sensor and / or the loop and the DNV sensor through mechanical components such as servo, actuator, and the like.

The magnetic wake detector

In some aspects of the technique, methods and configurations are disclosed for detecting small magnetic fields generated by moving charged particles. For example, fast moving particles traveling through the Earth's atmosphere produce a small magnetic field that can be detected by the disclosed embodiments. Sources of charged particles include high-speed moving vehicles such as missiles, aircraft, supersonic gliders, and the like. A highly sensitive magnetometer (eg a DNV sensor) can be used to detect small magnetic fields. DNV sensors can provide 0.01T sensitivity. Such a magnetometer may be more sensitive than a superconducting quantum interference device (SQUID) magnetometer (eg, femto-Tesla level measurement sensitivity).

As another example of a source of charged particles, a jet engine can produce ions as a by-product of the combustion process. Another example includes an ultra-sonic glider that produces a plasma field as the glider passes through the atmosphere. This plasma field can produce charged particles. The disclosed detector can also detect the magnetic field in water. Thus, a rocket-propelled torpedo can produce ion fluxes. The charged particles, e. G., Ions, are moving quite fast for a period of time until decelerated by the ambient air. These fast-moving ions (charged particles) can generate low-level magnetic fields in the atmosphere. This magnetic field can be detected by one or more detectors as described herein.

The technique may be used as an array of sensitive magnetic sensors (e.g., a DNV sensor) for detecting magnetic fields generated by charged particle sources such as jet engine exhaust. A single detector may be used to detect the magnetic field generated by the detector. In one implementation, the range of detectors is less than 10 km. In another implementation, the range of the detector is one kilometer. In this implementation, a single detector can sense a magnetic field within a 10 km slope range. In another embodiment, the magnetic sensors may be spread along the coast or away from other areas (e.g., critical infrastructure such as power plants, military bases, etc.). The system can also set missile trajectory using multiple lines of sensors. In one or more embodiments, the data from the magnetic sensor may be used (e. G., To hear the sound of the jet engine) with data from the passive acoustic sensor to improve the overall detection capability of the passive system. In some aspects, the sensors may be small enough to provide monitoring when the jet is close (e.g., at low altitudes) as the bandit is close. In various implementations, the detector may be low power and permanent (e.g., always watching without an ape). Thus, these detectors can be used for covert (e.g., passive) monitoring based on a target solution that can not be detected even by current stealth techniques.

FIG. 146 shows a vehicle 14602 in a low elevation view 14608 in accordance with some exemplary implementations. The aircraft 14602 may be a cruise missile, an aircraft, or a super-sound wave glider. The aircraft 14602 can easily avoid radar tracking due to the high clutter and latitude caused by the terrain 14606. [ Even aircraft radars may not be able to detect and track these objects because of intense confusion over scanning the earth and tracking small, covert targets. For example, high-flying surveillance radars such as AWACS and Hawkeye can sometimes detect cruise missiles, but they are expensive and must be in the air and can operate with a good signal-to-noise ratio (SNR). High chaos situation. Short-range radars provide detection capabilities, but require significant power and low missile flight altitudes, so missiles can be seen for a very short period of time. The window of limited viewing angles makes it easy for missiles to be missed by land based systems (especially when they are spinning) because they do not last long enough to build a track. The technique uses a high-sensitivity magnetic sensor, such as a DNV sensor, to detect the weak magnetic field generated by the fast movement of ions in the jet exhaust of a cruise missile. For example, the DNV sensor measures the magnetic field acting on the DNV sensor. DNV sensors measure the Earth's magnetic field when used on Earth, assuming there is no other magnetic field affecting the Earth's magnetic field. DNV measures magnetic vectors that provide both magnitude and direction of the magnetic field. If the other magnetic field is within the range of the DNV sensor, the measured magnetic field is changed. These changes represent the presence of other magnetic fields.

When using the DNV sensor, each sample is a vector representing the magnetic field affecting the DNV sensor. Thus, measurements over time can be used to determine the location in time and thus the path of the object. Multiple DNV sensors spaced apart may be used. For example, you can combine the sensed magnetic vectors of several DNV sensors that are measured simultaneously. As an example, the combined vector may constitute a tremor plot. Analysis such as Fourier Transform can be used to determine the common noise of several measurements. The common noise can then be excluded from the various measurements.

One-way measurements from single or multiple DNV sensors can be used to use vectors in various magnetic models. For example, you can use several models to estimate dimensions, mass, number of objects, location of one or more objects, and so on. Measurements can be used to determine the error of each model. The model with the lowest error can be identified as the most accurate representation of the object producing the magnetic field measured by the DNV sensor. Changes to one or more best models can be applied to reduce errors in the model. For example, genetic algorithms can be used to change a model to reduce model errors to determine a more accurate model. If the error rate of the model is lower than a predetermined threshold, the model can help to identify the number of objects generating the sensed magnetic field and the size and mass of the object.

If the air vehicle 14602 uses a combustion engine, exhaust gas 14604 will be generated. The exhaust 14604 may include charged particles moving at high speed when exiting the air body 14602. [ These charged particles produce a magnetic field that can be detected by the described implementation. Because the earth has a relatively static magnetic field, the detector can sense disturbance or change from the earth's static magnetic field. Such a change may be caused by the flying object 14602. [

147 shows a magnetic field detector according to various exemplary implementations. The sensor 14706 can detect the magnetic field 14704 of the flying object 14702 passing over the head of the sensor 14706. [ The sensor 14706 may be passive in that the sensor 14706 does not emit a signal for detecting the air vehicle 14702. [ Thus, the sensor 14706 is passive and its use is not detected by other sensors. For example, a magnetic sensor such as a DNV-based magnetic sensor can detect a magnetic field with high sensitivity without being detected. A sensor network formed by a plurality of nodes equipped with magnetic sensors (e.g., DNV sensors) may be located, for example, along the border, at a buoy at a waterfront or remote location. For example, a distant early warning line could be installed near the Arctic Circle.

148A and 148B illustrate portions of a detector array in accordance with various exemplary implementations. The detectors 14802 and 14804 can detect the magnetic field generated by the air vehicle 14806. [ Given a detector array disposed in the region, the data from multiple detectors can be combined for further analysis. For example, data from detectors 14802 and 14804 may be combined and analyzed to determine aspects such as the speed and position of the vehicle 14806. As an example, at the first time shown in FIG. 148A, the detector 14802 can detect the magnetic field generated from the airplane 14806. Detector 14804 may not be able to detect this magnetic field or detect that magnetic field, but given the farther distance, the detected magnetic field would be weaker than the magnetic field detected by detector 14802. A single point of view This data from the vehicle 14806 can be used to calculate the position of the flight 14806. Data from the third detector can also be used to triangulate the position of the air vehicle 14806. [ The data from the single detector may be useful as it can be used to detect the tilt position of the vehicle 14806. This combined data can also be used to determine the speed of the vehicle 14806.

In addition, data from one or more detectors over time can be used. In Fig. 148B, the air vehicle 14806 continued its route. The magnetic field detected by the detector 14804 increases in intensity as the air vehicle approaches the detector 14804, but the magnetic field detected by the detector 14802 will be weaker than the magnetic field detected in FIG. 148A. The difference in intensity is based on a flying object that is closer to the detector 14804 and away from the detector 14802. This information can be used to determine the orbit of the flying object 14806.

As described above, the data from the single detector can be used to calculate the inclination range of the flying object. The slope range can be calculated based on the known strength of the magnetic field of the flying object compared to the intensity of the detected magnetic field. Comparing these two values provides an estimate of the distance the object has come from the detector. However, the exact location is unknown and a list of possible locations is known (slope range). The speed of the flight vehicle can be estimated by comparing the detected magnetic field measurements over time. For example, a single detector can sense the magnetic field of a flying object for a period of time. You can calculate the anticipated speed of a flight by using how quickly the magnetic field increases or decreases as it travels toward or away from the detector. A better position estimate may be used by monitoring the magnetic field for a period of time. For example, monitoring the magnetic field from the first detection to the last detection from a single detector can be used to more accurately estimate the possible location and / or speed of the air vehicle. If a magnetic field is detected for a relatively long period of time, the object is either a fast moving object that flies over the head close to the detector, or a slow moving object that is far from the detector. The rate of change of the strength of the magnetic field can be used to determine if an object is a fast moving object or a slow moving object. Therefore, it is possible to greatly reduce the possible position of the flying object.

The time history of the magnetic field can also be used to detect the type of the vehicle. The rocket propulsion body may initially have a constant thrust. Therefore, the charged particles will move in a uniform manner for a certain period of time after being propelled from the flying body. Thus, the detected magnetic field will have a detectable amount of uniformity over time when range effects are considered. Conversely, hyperspeed objects lack such uniformity. For example, ions leaving a plasma field surrounding an hypersonic object are not emitted in a uniform manner. That is, ions move in various directions. The detected magnetic field based on these ions will have many variations that are not dependent on the range of the flying object. Therefore, by analyzing the intensity of the magnetic field in consideration of the range effect, it can be determined whether the magnetic field is uniform or has a large variation with time. Additional data can be used to materialize this analysis. For example, calculating and determining the speed of an object can be used to eliminate possible flying objects that can not fly at a determined speed. You can also use data from various types of detectors. Radar data, acoustic data, etc. may be used in conjunction with the detector data to remove the type of flying object that is possible.

Combined data from multiple sensors can also be used to more accurately calculate data associated with a craft. For example, it is a time difference in which two individual detectors can be used to calculate the speed range and the possible position of the flying object. The first detector may detect the air vehicle first at a first time. The second detector can detect the airplane first at the second time. Using the known distance between two detectors and the range of two detectors can greatly improve the speed and position estimation of the flying object compared to using data from a single detector. For example, a flying object is determined to be between two detectors rather than on the opposite side of the first detector. In addition, the direction of the flying object can be inferred. By adding a third detector, you can triangulate the position of the flying object.

Diamond Nitrogen Vacuum Detected Ferro-Fluid Hydrophone

149 schematically illustrates a hydrophone 14900 in accordance with some exemplary implementations. In various implementations, components of the hydrophone 14900 may be included within the housing 14902. The hydrophone 14900 includes the exposed ferroelectric 14904. In this embodiment, the hydrophone may be exposed to air, water, fluid, and the like. The magnet 14908 activates the ferroelectric substance 14904. In some implementations, the magnet 14908 is coupled to the ferrule 14904 via a hydrophone. In another embodiment, the film may be used to receive ferroelectric material 14904. When the ferroelectric 14904 is activated, a shape is formed based on the magnetic field from the magnet 14908. The magnet 14908 is a permanent magnet of the electromagnet. When a sound wave hits the ferroelectric 14904, the shape of the ferroelectric is changed. As the steel fluid changes, the magnetic field from the steel fluid 14904 changes. One or more DNV sensors 14906 may be used to detect such changes in the magnetic field. The magnetic field change measured by the DNV sensor 14906 can be converted to an acoustic signal. For example, one or more electrical processors may be used to convert the motion of the ferromagnetic fluid 14904 into acoustic data. The hydrophone 14900 can be used in medical devices and in vehicles.

A reservoir (not shown) may be used to hold the additional ferroelectric. If desired, the ferroelectric 14904 used for sonar detection can be supplemented by additional steel fluids from the reservoir. For example, the sensor can sense the amount of rebar currently in use and control the reservoir to inject additional rebar amounts.

150 is a schematic diagram showing a portion of a vehicle 15002 having a hydrophone in accordance with some exemplary implementations. The components of the hydrophone are similar to those described in Fig. 149. The steel fluid 15004 is activated by a magnet 15008. In this implementation, a steel fluid 15004 is included with the cavity 15010. The magnet 15008 is included in the cavity 15010 even when the vehicle is moving. Since the cavity 15010 is not closed, the steel fluid 15004 is exposed to the fluid the vehicle is traveling on. For example, if the vehicle is a submarine, the steel fluid 15004 is exposed to water. In another implementation, the vehicle moves in the air and the steel fluid 15004 is exposed to air.

The steel fluid 15004 may be stored in the vessel 15012. The steel fluid 15004 can then be injected into the cavity 15010. Also, during operation, the steel fluid (15004) 15010) can be replenished from the vessel (15012) with a steel fluid.

As the sound waves come in contact with the steel fluid 15004, the steel fluid 15004 changes shape. The change in shape can be detected by one or more DNV sensors 15006. In one embodiment, a single DNV sensor may be used. In other implementations, a DNV sensor array may be used. For example, a plurality of DNV sensors may be located in the ring around the cavity 15010. [ Readings from DNV sensor 15006 can be converted to acoustic signals.

151 is a schematic diagram illustrating a portion of a vehicle having a hydrophone with a storage membrane in accordance with some example implementations. This implementation includes components similar to the embodiment shown in FIG. Alternatively, membrane 15114 covers a portion or the entire opening of cavity 15010. Membrane 15114 includes ferromagnetic fluid 15004,

152 is a schematic diagram illustrating a portion of a vehicle with a hydrophone in accordance with some exemplary implementations. In this implementation, the steel fluid 15204 is not included in any cavities. Rather, the steel fluid 15204 is located outside the vehicle. Magnet 15008 is used to contain steel fluid 15204 in place. In one embodiment, the magnet 15008 is located in the vehicle. In other implementations, the magnet 15008 is located outside the vehicle. In another implementation, a portion of the magnet 15008 is located in the vehicle and a portion of the magnet 15008 is located outside the vehicle.

153 is a schematic diagram illustrating a portion of a vehicle having a hydrophone with a storage membrane in accordance with some exemplary implementations. 152, the steel fluid 15204 is located outside the vehicle. The steel fluid 15204 is enclosed in the membrane 15314 containing the steel fluid 15204 near the vehicle. In this embodiment, the magnet 15008 can be used to receive the steel fluid 15204, but the combination of the magnet 15008 and the membrane 15314 allows the steel fluid 15204 to be sufficiently close to the vehicle to allow DNV A sensor can be used to read a change in the steel fluid 15204.

AC vector magnetic anomaly detection with diamond nitrogen vacancies

154 is a schematic diagram of a system 15400 for AC magnetic vector anomaly detection in accordance with an embodiment of the present invention. The system 15400 includes an optical excitation source 15410 that directs the optical excitation to an NV diamond material 15420 having an NV center or another photomagnetic defect center material having a photonic defect center. An RF excitation source 15430 provides NV radiation to the NV diamond material 15420. Magnetic field generator 15470 generates a magnetic field that is detected in NV diamond material 15420.

The magnetic field generator 15470 may generate a magnetic field having, for example, orthogonality. In this regard, the magnetic field generator 15470 may include two or more magnetic field generators, such as those including a first magnetic field generator 15470a and a second magnetic field generator 15470b. The first and second magnetic field generators 15470a and 15470b may all be Helmholtz coils. The first magnetic field generator 15470a may be arranged to provide a magnetic field in the NV diamond material 15420 with a first direction 15472a. Second magnetic field generator 15470b may be arranged to provide a magnetic field in NV diamond material 15420 with a second direction 15472b. Preferably, both the first magnetic field generator 15470a and the second magnetic field generator 15470b provide a relatively uniform magnetic field in the NV diamond material 15420. The second direction 15472b may be perpendicular to the first direction 15472a, for example. System 15400 may be arranged such that object 15415 is disposed between magnetic field generator 15470 and NV diamond material 15420.

The two or more magnetic field generators of the magnetic field generator 15470 may be disposed at the same position or may be separated from each other. Where two or more magnetic field generators are separate from each other, the two or more magnetic field generators may be arranged in an array, for example a one-dimensional or two-dimensional array.

The system 15400 can be arranged to include one or more optical detection systems 15405 each including an optical detector 15440, an optical excitation source 15410 and an NV diamond material 15420 . Furthermore, the magnetic field generator of the magnetic field generator 15470 may have a relatively high power compared to the optical detection system 15405. [ In this manner, optical system 15405 may be placed in an environment that requires relatively low power for optical system 15405 while magnetic field generator 15470 may be used for magnetic field generator 15470 to apply a relatively strong magnetic field. It can be placed in an environment having a relatively high power as much as possible.

The system 15400 further includes a controller 15480 configured to receive the optical detection signal from the optical detector 15440 and to control the optical excitation source 15410, the RF excitation source 15430 and the magnetic field generator 15470. The controller can be a single controller or multiple controllers. In the case of a controller that includes multiple controllers, each of the controllers may perform different functions, such as controlling different components of the system 15400. Magnetic field generator 15470 may be controlled by controller 15480 via, for example, amplifier 15460.

The RF excitation source 15430 may be, for example, a microwave coil. The RF excitation source 15430 is controlled to emit RF radiation with photon energy that resonates with the transition energy between the ground m _s = 0 spin state and the m _s = ± 1 spin state, as described above in connection with FIG.

The optical excitation source 15410 may be, for example, a laser or a light emitting diode that emits light in green. An optical excitation source 15410 induces fluorescence in red from the NV diamond material 15420, where the fluorescence corresponds to an electron transition from the excited state to the ground state. Light from the NV diamond material 15420 is directed through the optical filter 15450 to filter out the excitation band of light (e.g., in green) and, in turn, the red fluorescence band of light detected by the photodetector 15440 . In addition to exciting the fluorescence of NV diamond material 15420, photoexcitation light source 15410 serves to reset the population of spin state m _s = 0 of base state 3A2 to maximum polarization or other desired polarization.

The controller 15480 is arranged to receive the optical detection signal from the optical detector 15440 and to control the optical excitation source 15410, the RF excitation source 15430 and the magnetic field generator 15470. The controller may include a processor 15410 and a memory 15484 to control the operation of the optical excitation source 15410, the RF excitation source 15430 and the magnetic field generator 15470. Memory 15484, which may include non-volatile computer readable media, may store instructions that can control a light excitation source 15410, an RF excitation source 15430, and a magnetic field generator 15470. That is, the controller 15480 can be programmed to provide control.

ODMR detection of magnetic field

According to one embodiment of operation, controller 15480 controls the operation of optical excitation source 15410, RF excitation source 15430 and magnetic field generator 15470 to perform optically detected magnetic resonance (ODMR). The components of the magnetic field Bz along the NV axis of the NV center aligned along the directions of the four different orientation classes at the NV center use the ODMR pulse sequence according to the Ramsey pulse scheme, , And can be determined by ODMR. FIG. 155 shows a photoexcitation pulse 15510 provided by an optical excitation source 15410 and a microwave (MW) pulse 15520 provided by an RF excitation source 15430. FIG. Between each optical pulse 15510, two MW pulses 15520 are provided separated by time &lt; RTI ID = 0.0 &gt;#, &lt; / RTI &gt; and at a given RF frequency. To facilitate understanding, three MW pulses 15520 with three different frequencies MW1, MW2 and MW3 are shown in FIG. 155, although a greater number of RF frequencies can be used. Three different frequencies, MW1, MW2 and MW3, correspond to three different NV center directions, respectively. Thereby determining the spatial direction of the detected channel.

Figure 156 shows the fluorescence signal of the diamond material 15420 detected as a function of RF frequency in the 2.9-3.0 GHz range. Figure 156 shows three dip in fluorescence where the microwave frequencies corresponding to MW1, MW2 and MW3 are shown in corresponding dips. The dips correspond to magnetic field components along the NV axis for the three diamond grating directions. Figure 156 shows a dip in fluorescence only for RF frequencies above a zero-field 2.87 GHz line (where there is no division of ms = 占 1 spin state) and also shows three corresponding dips below the 2.87 GHz line in general . Three dips in the fluorescence on the zero field 2.87 GHz line correspond to the ms = +1 spin state and three dip in the fluorescence below the zero field 2.87 GHz line correspond to the ms = -1 spin state. As discussed above, the difference in photon energies between the DIPs is given as 2gμBBz, where g is the g-factor and μB is the component of the external magnetic field along the NV axis, so that each of the Bz 3 diamond grating directions is determined . On the other hand, FIG. 156 shows a dip of fluorescence corresponding to each of three diamond grating directions, for example, four diamond grating directions can be used instead. The magnetic field vector including the magnitude and direction can be determined based on the Bz component along the different lattice directions.

The system 15400 can transfer the code packet from the magnetic field generator 15470 to the NV diamond material 15420 by modulating the code by controlling the magnetic field generator 15470. [ The transmitted code packet can be demodulated. The transmitted code packet may be transmitted along two or more channels, such as two channels, where one channel is based on the magnetic field generated by the first magnetic field generator 15470a, and the second channel may be transmitted along a channel generated by the second magnetic field And transmitted by the magnetic field generator 15470b. The magnetic field generated by the first and second magnetic field generators 15470a and 15470b may be perpendicular to each other in the NV diamond material 15420 where the material of the present invention is absent and this material may be generated by the magnetic field generator NV diamond material 15420, As shown in FIG. It should be noted that this material need not be between the magnetic field generators 15470a and 15470b and the NV diamond material 15420.

A code packet, which may include a binary sequence, is modulated by a processor 15480 that controls the magnetic field generator 15470 to generate a time varying magnetic field and transmits a code packet to the NV diamond material 15420. Specifically, the processor 15480 modulates the different correlation codes for different channels such that the correlation code is optimized for low cross-correlation (between different correlation codes) and for each channel having good autocorrelation. In the case of two channels, the processor 15480 may control the first magnetic field generator 15470a to transmit the first correlation code and further control the second magnetic field generator 15470b to transmit the second correlation code . Thus, the correlated code packet is for a first correlation code via a first magnetic field generator 15470a and the other for a second correlation code is transmitted via two channels via a second magnetic field generator 15470b. The correlated codes may be modulated by continuous phase modulation, for example modulated by MSK frequency modulation.

The transmission of code packets using correlation codes can provide a gain compared to a simple DC transmission. In particular, long codes provide increased gain, but require longer transmission times.

The modulated code packet transmitted by the magnetic field generator 15470 is detected and demodulated using the ODMR technique as described above. Processor 15480 demodulates the correlation code packet using a matched filter. The matched filter is correlated with the transmitted correlation code for each channel and for each magnetic field projection along the grating direction. It should be noted that the modulation for the different channels can be performed simultaneously. Similarly, demodulation for different channels can be performed simultaneously. 157a shows a first matched filtered correlation code for the magnetic field component along three grating directions corresponding to the magnetic field provided by the first magnetic field generator 15470a and Fig. And a second filtered correlation code for a magnetic field component along three grating directions corresponding to the provided magnetic field. The spikes shown for each of the three diamond grating directions correspond to a projected magnetic field along each of the three grating directions. The magnetic field vector including both magnitude and direction can be reconstructed based on the projected magnetic field along the three grating directions.

If the object 15415 affecting the magnetic field generated by the magnetic field generator 15470 felt by the NV diamond material 15420 is present, then the magnetic field vector detected in the NV diamond material 15420 will change. Figure 158 shows two correlation codes for the case where the object 15415 is placed between the magnetic field generator 15470 and the NV diamond material 15420 when the first correlation code is transmitted through the first magnetic field generator 15470a. And the second correlation code is transmitted via the second magnetic field generator 15470b. FIG. 158 shows both cases when the object 15415 is an iron object and when the object 15415 is not present.

However, the reconstructed magnetic field vector for the first correlation code rotates about 46 degrees relative to the absence of the object and the second correlation code rotates about 28 degrees for no object. That is, the iron object affects the magnetic field in the NV diamond material 15420 applied by the first magnetic field generator 15470a to the magnetic field in the NV diamond material 15420 applied by the second magnetic field generator 15470b. This result provides two insights: first, the system 15400 includes a magnetic field generator 15470, which acts as a transmitter, and a magnetic field generator 15470, Deviations can be detected, and the probed magnetic parameters increase because the channels providing orthogonal probing fields can be applied simultaneously. The reconstructed magnetic field vector may vary in magnitude in addition to changing direction due to the presence of the ferrous metal object. The AC characteristic of the ODMR technology employed reduces the DC bias.

Frequency-based detection

The system enables frequency-based detection based on the frequency dependent attenuation of the magnetic field provided by the magnetic field generator 15470. Figure 158 shows magnetic anomaly detection of an iron metal object, and a non-ferrous metal object, such as an object formed of an electrically conductive material, can also be detected. For example, if a non-ferrous metal object provides frequency dependent attenuation in the magnetic field provided by the magnetic field generator 15470, a non-ferrous metal object may be detected.

Frequency based detection may allow for a larger range of objects that are detected, but frequency based detection may further allow for operation in less noisy environments. In this case, the frequency range is set to a range where noise is small.

Magnetic abnormality detection

The system 15400 for AC magnetic vector anomaly detection may further include a reference library that may be stored in the memory 15484 of the controller 15480 or separately from the memory 15484. In either case, the reference library is accessible to the processor 15482. The reference library includes a reference magnetic field vector corresponding to a different object. The reference library includes a first correlation code corresponding to the magnetic field generated by the first magnetic field generator 15470a and a reference magnetic field vector for both the second correlation code corresponding to the magnetic field generated by the second magnetic field generator 15470b do.

The reference field vector for the first correlation code and the second correlation code from the reference library can be compared to the reconstructed magnetic field vector determined by the system 15400. [ The object may be identified based on a match between the reference magnetic field vector from the reference library and the reconstructed magnetic field vector determined by the system 15400. The use of two or more correlation codes corresponding to different, preferably orthogonal, polarizations of the magnetic field applied to the NV diamond material 15420 will result in an increase in the identity of the object Provides accuracy.

As described above, providing improved magnetic anomaly detection can be achieved by incorporating a magnetic field generator that generates two or more discrete magnetic fields in an NV diamond material or other magneto-optical material, and the magnetic fields are different from each other. The magnetic field can be generated in two or more different channels and the effect on the magnetic field due to adjacent magnetic objects in the two different channels provides an increased number of magnetic parameters to improve the identification of the object.

Applying a magnetic field to a different channel can be achieved by modulating the applied magnetic field and transmitting the correlated code packet and then detecting and demodulating the code packet. The different correlation codes for the different channels are binary sequences with small cross-correlation. The correlation code packet may be demodulated using matched filtering to provide a magnetic field component along a different diamond grating direction. The magnetic field can then be used to reconstruct the magnetic vector to provide a reconstructed magnetic field vector for the other channel. The reconstructed magnetic field vector of each channel may be compared with a reference magnetic field vector corresponding to an object having a different magnetic material profile to identify the object.

Defect detector for conductive material

The nitrogen-vacancy center (NV center) is a defect in the diamond crystal structure that can be intentionally produced with synthetic diamond. Generally, when excited by green light and microwave radiation, the NV center causes the diamond to generate red light. The frequency of microwave radiation where stimulated NV centered diamonds generate red light and the intensity of light changes when exposed to external magnetic fields. By measuring the change, the magnetic field strength can be accurately detected using the NV center.

In various embodiments described in more detail below, a magnetometer using one or more diamonds with NV centers can be used to detect defects in the conductive material. According to Ampere's law, the current through a conductor creates a magnetic field along the length of the conductor. Similarly, a magnetic field can induce a current through a conductor. In general, conductors with uniformly uniform size, shape, and material through which current passes create a continuous magnetic field along the length of the conductor. On the other hand, the same conductors with deformations or defects, such as cracks, broken lines, deformed parts, holes, pits, gaps, impurities, defects, etc., do not produce a continuous magnetic field along their length. conductor. For example, the area surrounding the deformation may have a different magnetic field than the area surrounding the part of the conductor without distortion. Deformation such as a conductor break may cause the magnetic field on one side of the brake to differ from the magnetic field on the other side.

For example, a railway track rail can be inspected for malformations using a magnetometer. The current can be induced in the rail, and the current creates a magnetic field around the rail. The magnetometer can be used along the length of the rail or along the rail to pass through the magnetometer. The magnetometer passes along the length of the rail and can therefore be in the same position relative to the center axis of the rail. The magnetometer detects the magnetic field along the length of the rail.

In some embodiments, the detected magnetic field can be compared to the expected magnetic field. If the detected magnetic field differs from the expected magnetic field, it can be determined that the defect is present on the rail. In some embodiments, the detected magnetic field along the length of the rails can be inspected for areas having magnetic fields that are different from most of the rails. A region having a different magnetic field than most of the rails can be determined to be related to the defects of the rails.

The above principle can be applied to many scenarios other than checking the rails of railroad tracks. The magnetometer may be used to detect malformations in any suitable conductive material. For example, a magnetometer can be used to detect malformations of mechanical components such as turbine blades, wheels, and engine components.

Figures 159a and 159b are also block diagrams of a system for detecting deformation of a material according to an exemplary embodiment. Exemplary system 15900 includes a conductor 15905, an alternating current (AC) source 15910, a coil 15915, and a magnetometer 15930. In alternative embodiments, additional, fewer, and / or different elements may be used.

Conductor 15905 is the length of the conductive material. In some embodiments, conductor 15905 is paramagnetic. In some embodiments, conductor 15905 is ferromagnetic. Conductor 15905 may be of any suitable length and may have any suitable cross-sectional shape.

The current indicated by the arrow 15920 in Figures 159a and 159b shows the direction of the induced current through the conductor 15905. [ In the embodiment shown in Figures 159a and 159b, an AC source 15910 and a coil 15915 derive an induced current 15920. For example, the current from the AC source 15920 may pass through the coil 15915, creating a magnetic field around the coil 15915. [ The coil 15915 induced current 15920 can be placed sufficiently close to the conductor 15905 to produce an induced current 15920. The induced current 15920 moves in the direction along the conductor 15905 away from the coil 15915. In an alternative embodiment, any suitable system can be used to generate the induced current 15920. [

In the embodiment shown in Figures 159a and 159b, an AC source 15910 is used to supply power to the coil 15915. [ AC source 15910 may be any suitable AC source. For example, a conventional method of obtaining a power line or AC power can be used. In another example, a third rail of the railway used to power the railway vehicle may be used as the AC source 15910. In another example, a cross gate trigger of the railroad can be used as the AC source 15910.

In an exemplary embodiment, the induced current 15920 is alternating current. In some embodiments, the frequency of the inductive current 15920 may be varied. The magnetic field generated by the induced current 15920 may vary based on the frequency of the induced current 15920. [ Thus, by using different frequencies, the conductors 15920 will be described in more detail below by measuring the magnetic field produced by the different frequencies as described. For example, a fast sequence of different frequencies may be used. In another example, multiple frequencies may be applied simultaneously and the resulting magnetic field may be demodulated. For example, the spatial shape and pattern of the vector magnetic field produced by the defective or imperfect surrounding eddy currents is altered with the frequency of the applied excitation field. A defective or imperfect surrounding three-dimensional Cartesian magnetic field pattern can be measured and imaged at one frequency at a time. The detected magnetic field pattern may be stored (e. G., On a digital medium or a continuous analog medium). The detected magnetic field pattern may be compared to a previously measured image to produce a classification or identification of the nature of the defect or defect and / or a possible defect or incomplete location.

The induced current 15920 passing through the conductor 15905 generates a magnetic field. The magnetic field has a direction around the conductor 15905, indicated by the arrow labeled 15925. Magnetometer 15930 may be passed along the length of conductor 15905. [ Figs. 159a and 159b include arrows parallel to the length of the conductor 15905 indicating the path of the magnetometer 15930. Fig. In other embodiments, any suitable path may be used. For example, in an embodiment in which conductor 15905 is curved (e.g., a railway rail around a corner), magnetometer 15930 may follow the curvature of conductor 15905.

The magnetometer 15930 may measure the magnitude and / or direction of the magnetic field vector along the length of the conductor 15905. For example, magnetometer 15930 measures the magnitude and direction of the magnetic field at multiple sample points along length L. A conductor 15905 is formed in the same direction as the conductor 15905 at the sample point. For example, magnetometer 15930 may pass along the length of conductor 15905 while over conductor 15905. [

Any suitable magnetometer can be used as the magnetometer 15930. In some embodiments, the magnetometer uses one or more diamonds having an NV center. The magnetometer 15930 may have a sensitivity suitable for detecting a change in the magnetic field around the conductor 15905 caused by the malformation. In some cases, a relatively insensitive magnetometer 15930 may be used. In such a case, the magnetic field surrounding conductor 15905 should be relatively strong. In these cases, the current required to pass through conductor 15905 to produce a relatively strong magnetic field can be impractical or dangerous. Thus, for example, the magnetometer 15930 may have a sensitivity of about 10 ^-9 tesla (1 nanometer) and may detect a defect at a distance of about 1 to 10 meters from the conductor 15905. In this example, conductor 15905 can be a steel tube with a diameter of 0.2 meters. In one embodiment, the current through conductor 15905 can be about 1 Ampere and the magnetometer 15930 can be about 1 meter away from conductor 15905. [ In another example, the current through conductor 15905 may be about 100 Amps, and the magnetometer 15930 may be about 10 meters away. Magnetometer 15930 may have any suitable measurement rate. In an exemplary embodiment, the magnetometer 15930 can measure the magnitude and / or direction of the magnetic field at a particular point in space up to one million times per second. For example, the magnetometer 15930 may take 100,000, 10,000 or 50,000 times per second.

In an embodiment in which the magnetometer 15930 measures the direction of the magnetic field, the direction of the magnetometer 15930 relative to the conductor 15905 may be maintained along the length of the conductor 15905. [ The magnetometer 15930 can monitor the direction of the magnetic field in the conductor 15905. [ If the direction of the magnetic field is changed or is different from the expected value, it can be determined that the deformation exits the conductor 15905.

In this embodiment, even though the magnetic field around the magnetic lines of force 15905 is uniform along the length of the conductor 15905, the magnetometer 15930 can be rotated about the conductor 15905 and the conductor 15905 because the direction of the magnetic field is uniform along the length of the conductor 15905 Can be maintained in the same direction. For example, referring to the induced current magnetic field direction 15925 of Figure 159a, the direction of the magnetic field on conductor 15905 points to the right side of the drawing (e.g., "right-handed"). The direction of the magnetic field under the conductor 15905 indicates the left side of the drawing. Similarly, the direction of the magnetic field falls at a point on the right side of the conductor 15905. In accordance with the same principle, the direction of the magnetic field is pointed up at the point on the left side of the conductor 15905. Inductive current 15920 is applied to conductors 15905 and 15905 along the length of conductors 15905 (e.g., under conductors 15905, below conductors 15905, 12 degrees above conductors 15905, etc.) The direction of the magnetic field may be expected to be the same or substantially similar along the length of the conductor 15905 if held in the same direction. In some embodiments, the nature of the induced current 15920 is known (e.g., amps, frequency, etc.). The magnitude and direction of the magnetic field around conductor 15905 can be calculated.

In embodiments where the magnetometer 15930 measures the magnitude of the magnetic field, rather than the direction of the magnetic field, the magnetometer 15930 may be disposed at any suitable location around the conductor 15905 along the length of the conductor 15905, 15930 may not be held in the same orientation along the length of the conductor 15905. [ In this embodiment, the magnetometer 15930 may be maintained at the same distance from the conductor 15905 along the length of the conductor 15905. Because air is the distance between the magnetometer 15930 and the conductor 15905, Along the length).

Figure 159a shows a system 15900 in which conductor 15905 does not include strain. Figure 159b shows a system 15900 in which conductor 15905 includes a disconnection 15935. [ As shown in FIG. 159b, a portion of the induced current 15920 is reflected from the disconnected portion 15935 as shown by the reflected current 15940. As shown in FIG. 159B, the induced current magnetic field direction 15925 corresponds to the induced current 15920. The reflected current magnetic field direction 15945 corresponds to the reflected current 15940. Since the induced current 15920 moves in the opposite direction to the reflected current 15940, the induced current magnetic field direction 15925 is opposite to the reflected current magnetic field direction 15945.

In some embodiments in which the brake 15935 is a full brake that breaks the conductivity between portions of the conductor 15905, the magnitude of the induced current 15920 may be the same or substantially similar to the reflected current 15940 . Thus, the magnetic field around the coupled conductor 15905 will be zero or substantially zero. That is, the magnetic field generated by the induced current 15920 is canceled by the same but opposite magnetic field generated by the reflected current 15940. [ In such an embodiment, the brake 15935 reaches the expected magnetic field (which is non-zero) that is substantially zero in the magnetometer 15930 by comparing the measured magnetic field. As the magnetometer 15930 moves closer to the brake 15935, the magnitude of the detected magnetic field decreases. In some embodiments, it can be determined that the brake 15935 is present when the measured magnetic field is below the threshold. In some embodiments, the threshold may be a percentage of an expected value such as +/- 0.1%, +/- 1%, +/- 5%, +/- 10%, +/- 15%, +/- 50%, or any other suitable portion expected. . In other embodiments, any suitable threshold value may be used.

In embodiments where the brake 15935 causes a portion of the induced current 15920 to pass through or around the brake 15935, the magnitude of the reflected current 15940 is less than the magnitude of the induced current 15920. Thus, the magnetic field generated by the reflected current 15940 is less than the magnitude of the magnetic field generated by the induced current 15920. The magnitudes of the induced current 15920 and the reflected current 15940 may not be the same, but the induced current magnetic field direction 15925 and the reflected current magnetic field direction 15945 are still the opposite. Thus, the net magnetic field is the magnetic field of the induced current magnetic field direction 15925. The magnitude of the net magnetic field is the magnitude of the magnetic field generated by the induced current 120 minus the magnitude of the magnetic field generated by the reflected current 15940. As described above, the magnetic field measured by the magnetometer 15930 may be compared to a threshold value. Depending on the severity, size, and / or shape of the brake 15935, the net magnetic field sensed by the magnetometer 15930 may not be less than or equal to the threshold value. Therefore, the sensitivity of the system can be adjusted by adjusting the threshold value. That is, as the threshold value deviates from the expected value, the deformation of the conductor 15905 makes the magnitude of the sensed magnetic field smaller than the threshold value. Thus, the smaller the threshold, the finer, smaller, less severe, etc. variants detected by the system 15900 are.

As described above, the direction of the magnetic field around conductor 15905 can be used to sense deformation of conductor 15905. [ 160 shows a current path through a modified conductor according to an exemplary embodiment. Figure 160 is intended to be illustrative and illustrative only and not limiting with respect to the functionality of the system.

As described above with respect to the conductor 15905, the current can pass through the conductor 16005. [ The current path 16020 shows the direction of the current. As shown in FIG. 160, the conductor 16005 includes a deformed portion 16035. The deformations 16035 can be any suitable deformations, such as cracks, depressions, impurities. The current passing through the conductor 16005 spreads uniformly around the conductor 16005 at the portion not including the deformed portion 16035. [ In some cases, the current may be more concentrated at the surface of the conductor 16005 than at the center of the conductor 16005.

In some embodiments, the deformations 16035 are part of the conductor 16005 that does not allow or resist current flow. Thus, the current passing through the conductor 16005 flows around the deformed portion 16035. As shown in FIG. 159A, the induced current magnetic field direction 15925 is perpendicular to the direction of the induced current 15920. 159A, the direction of the magnetic field around conductor 15905 is perpendicular to the length of conductor 15905, which kills the length of conductor 15905, when conductor 15905 does not include deformation .

As shown in FIG. 160, when the conductor 16005 includes the current flowing strain 16035, the direction of the current changes, as indicated by the current path 16020. The current flowing around the deformed portion 16035 is not parallel to the length of the conductor 16005. [ Therefore, the magnetic field generated by the current path corresponding to the curved current path 16020 is not perpendicular to the length of the conductor 16005. [ Thus, when magnetometer 15930 passes along the length of conductor 16005, a change in direction of the magnetic field around conductor 16005 may indicate that deformation 16035 is present. As the magnetometer 15930 approaches the deformation 16035, the direction of the magnetic field around the conductor 16005 changes from being perpendicular to the length of the conductor 16005. As the magnetometer 15930 passes along the deformation 16035, the magnetic field peak magnetometer 15930 decreases as it moves away from the deformation 16035. [ The change in the direction of the magnetic field may indicate the position of the deformed portion 16035. As shown in Figure 159b, in a partial example, the conductor may have a strain that reflects a portion of the current and deflects the flow of current, as shown in Figure 160. [

The size, shape, type, etc. of the deformations 16035 determine the spatial orientation of the magnetic field surrounding the deformations 16035. In some embodiments, multiple maps of the magnetic field around the deformations 16035 can be taken to generate a map. In an exemplary embodiment of a magnetic field, each of the samples includes a magnitude and direction of the magnetic field. Based on the spatial shape of the magnetic field surrounding the deformations 16035, one or more characteristics of the deformations 16035, such as size, shape, type, etc., of the deformations 16035 can be determined. For example, a magnetic field can be used to determine whether strain 16035 is a dent, a crack, an impurity in a conductor, or the like. In some embodiments, the map of the magnetic field surrounding variant 16035 can be compared to a database of known deformities. In an exemplary embodiment, variant 16035 may be determined to be similar or identical to the most similar matching variant from the database. In another embodiment, variant 16035 can be determined to be similar or identical to a variant of the database with a similarity score over the threshold score. The similarity score may be any suitable score that measures the similarity between the measured magnetic field and one or more known magnetic fields of the database.

The magnetometer can be used to detect defects in the conductive material in many different situations. In one example, the magnetometer can be used to detect faults in railway rails. In this example, the railway vehicle is positioned along the rail and can move along the track. The magnetometer can be positioned in the car at a suitable distance from the rails and can monitor the magnetic field around one or more rails as the vehicle travels along the track. In this example, the current may be induced at one or more rails at a known stop position. In another embodiment, the coils inducing currents in the rails may be located in a moving vehicle and move with the magnetometer.

In this example, the magnetometer can be located in a typical railcar or special railcar device. The magnetometer may be mounted and / or the railcar may be designed in such a way that it maintains the orientation of the magnetometer relative to one or more rails. In some cases, it may not be feasible to maintain the magnetometer's perfect orientation with the rail, for example due to bumps or dips of the terrain, movement of people or cargo in the car, incompleteness of the rail, and the like. One or more gyroscopes may be used to track the relative position of the magnetometer relative to one or more rails. In an alternative embodiment, any suitable system may be used to track the relative position of the magnetometer, such as sonar, laser or accelerometer. The system may then use a change in relative position to adjust the magnitude and / or direction of the expected magnetic field.

In another example, a magnetometer can be used to detect the malformation of the pipe. In some cases, the pipe may be buried or under water. In a scenario where a conductor is checked for deformation, the magnetometer is located relatively close to the coil and can induce a current in the conductor when surrounded by a relatively conductive material such as water. Because the conductors are surrounded by relatively conductive material, the intensity of the current through the conductor will decrease much faster as it moves away from the coil. Magnetometers are compared to conductors surrounded by relatively nonconductive materials such as air. Under these conditions, the coil can move along the conductor to the magnetometer. The magnetometer and the coil can be separated sufficiently that the magnetic field from the coil does not cause undue interference with the magnetometer.

In a partial example, the magnetometer can be used to detect leaks in the pipe. For example, the partial fluid that is transported through the pipeline has a magnetic property. In such a case, the fluid and / or the pipe may be magnetized. A magnetometer (e.g., an array of magnetometers) may move along the pipe to detect a discrepancy in the detected magnetic field around the pipe as described above. The difference or change in the magnetic field can be caused by fluid leakage from the pipe. Therefore, using a magnetometer to detect the difference or change in the magnetic field can indicate a leak in the pipe. For example, a stream or jet of fluid or gas flowing from a pipe may be detected by a magnetic field in the stream or around the jet. In some embodiments, the volume leakage rate can be determined based on the magnetic field (e.g., the magnitude of the magnetic field). For example, the leak rate can be used to prioritize leak corrections.

In some embodiments, the current may not be induced in the conductor. In such embodiments, any suitable magnetic field can be detected by the magnetometer. For example, the Earth generates a magnetic field. The material to be inspected may be deflected or otherwise affect the earth's magnetic field. If the inspected material is continuous, the deflection of the earth's magnetic field is the same or similar along the length of the material. However, in the case of deformations or defects, the deformation of the Earth's magnetic field will vary around the deformity or defect.

In some embodiments, any other suitable magnetic source may be used. For example, the source magnet can be applied to paramagnetic materials. The magnetic field around the paramagnetic material can be used to detect deformation of the material using the principles described herein. In this embodiment, the magnetometer can be positioned relatively close to the source magnet.

As described above, in some embodiments, the measured magnetic field is compared to the expected magnetic field. The expected magnetic field may be determined in any suitable manner. The following description is an example of how the expected magnetic field can be determined.

In embodiments in which coils are used to induce currents in the conductors (e.g., the embodiments shown in Figs. 159a and 159b), the ^magnitude B ^coil of the magnetic field of the coils in the conductors can be determined, c1): &lt; RTI ID = 0.0 &gt;

(c1)

In the equation (c1), μ is the magnetic permeability of the medium between the coil and conductor (eg conductor 15905) (Newtons / Amp2), I is the current passing through the coil (Amps), dl ^coil is the coil wire (meter), r_cr is the coil To the rail (meter). The magnitude of the magnetic field of the coil of equation (c1) can be transformed into a vector quantity with a circular profile symmetrical with respect to the coil alignment center, and thus is constant in the circumferential direction in a radial relationship consistent with the equation (c1).

The forward current (I ^rail ) at the ^rail can be calculated using equation (c2): &lt; RTI ID = 0.0 &gt;

(c2)

In equation (c2), a is the magnetic susceptibility of the conductor (Henry).

The magnitude of the magnetic field in the rail magnetic B-field is:

(c3)

In equation (c3), r _rm is the distance from the rail to the magnetometer, and dl _rail is the rail length and position of the magnetometer (meter) where the coil's magnetic field interacts with the rail.

In some embodiments, the magnetometer can measure the magnitude of the magnetic field in one or more directions. For example, a magnetometer can measure the magnitude of a magnetic field in three orthogonal directions (x, y, and z). Equation (c4) shows the relationship between the measured magnitudes of the magnetic fields detected in the x, y and z directions (Bx, By and Bz respectively) and the vector of the magnetic field measured by the magnetometer (B ^meas ). (For example using the dipole model):

(c4)

If the railway is homogeneous and homogeneous, B ^meas is essentially equal to B ^rail . When there is a defect, a deformation, a deformation, or the like in the rail in Equation (c5), the measured magnetic vector ^Bmeas is transformed by transformation (F _t ) due to deformation as shown in equation (c5) B ^rail .

(c5)

The linear expansion of the translation function allows an algebraic separation position δ to detect the variations caused by rail anomalies from the difference between the measured reference and the following criteria:

(c6)

(c7)

(c8)

therefore,

(c9)

In Eqs. (C6) - (c9), '' is the distance of strain along the conductor in the magnetometer, I _rail is the current through the conductor, and k is the specific measurement sample. In the exemplary embodiment, 100 samples are taken. In another embodiment, more or less than 100 samples are taken. When processed through a fast Fourier transform algorithm (or any other suitable algorithm), noise can be suppressed and echoes or non-uniform deviations from the reference magnetic field (B ^rails ) can be calculated for a magnetometer of distance & Correlates with rail brakes in known positions and orientations:

(c10)

(c11)

Using the above equation, the distance from the magnetic line to the deformation can be determined based on the current induced in the conductor I and the measured magnetic field at a specific distance from the conductor.

In the embodiment shown in Figures 159a and 159b, one magnetometer 15930 is used to pass along the length of conductor 15905 to monitor the deformation. In another embodiment, two or more magnetometers 15930 may be used. A plurality of magnetometers 15930 may be oriented around conductor 15905 in any suitable manner. Using the multiple magnetic field system 15930 provides an advantage in some cases. For example, using multiple magnetometers 15930 simultaneously provides a plurality of sample points around conductor 15905. In some instances, multiple sample points can be duplicated and used to check the accuracy of the sample. In a partial example, if a large number of sample points are spread around conductor 15905, there is an increased chance that magnetometer 15930 will be at a point around conductor 15905 with the greatest angle of departure. That is, sampling multiple points around conductor 15905 increases the chance that magnetic field 15930 will detect anomalies in conductor 15905 based on the maximum change in magnetic field around conductor 15905. [

161 is a flow diagram of a method for detecting deformation according to an exemplary embodiment. In other embodiments, additional, fewer, or different operations may be performed. Also, the use of the flowcharts and / or arrows is not intended to be limiting with regard to the sequence or flow of operations. For example, in some embodiments, two or more operations may be performed concurrently.

In step 16105, the expected magnetic field is determined. In an exemplary embodiment, the expected magnetic field may include magnitude and direction (e.g., vector). In other embodiments, the expected magnetic field includes magnitude or direction. In an exemplary embodiment, the expected magnetic field is determined based on the current induced in the conductor. For example, a power source and a coil can be used to induce currents in the conductor. Based on the current through the coil and the distance between the coil and the conductor (and any other suitable variable), the induced current through the conductor can be calculated. Since the position of the coil relative to the magnetometer can be known, the direction of the induced current can be known. If the current through the conductor is known or calculated, the magnetic field at the point around the conductor can be calculated. The magnetic field at a point around the conductor where the magnetometer is present can therefore be calculated based on the induced current assuming no deformation is present.

In another embodiment, the expected magnetic field may be determined using a magnetometer. As described above, deformation can be detected by detecting a change in the magnetic field around the conductor. In this embodiment, one or more initial measurements may be taken using a magnetometer. One or more initial measurements may be used as the expected magnetic field. That is, if the conductor is not deformed along the length of the conductor, the magnetic field along the conductor will be the same or substantially similar to the initial measurement. In other embodiments, any suitable method for determining the expected magnetic field may be used.

At operation 16110, a magnetic field is sensed. In an exemplary embodiment, the magnetometer is used to measure the magnetic field around the conductor along the length of the conductor. In operation 16115, the magnetometer moves along the length of the conductive material. The magnetometer can maintain its orientation with respect to the conductor while moving along the length of the conductor. As the magnetometer moves along the length of the conductive material, a plurality of samples can be collected along the length of the conductive material using a magnetometer.

At operation 16120, the difference between the sensed magnetic field and the expected magnetic field is compared to a threshold. In an exemplary embodiment, the absolute value of the difference between the sensed magnetic field and the expected magnetic field is compared to a threshold. In such an embodiment, the magnitude of the difference is used and is not a sign of the value (e.g., a negative value is treated as a positive value). The threshold may be any suitable threshold. For example, the difference between the magnitude of the sensed vector and the magnitude of the expected vector may be compared to a threshold intensity value. In another example, the difference between the direction of the sensed vector and the direction of the expected vector may be compared to a threshold value. The threshold value can be selected according to the desired sensitivity level. The higher the threshold, the lower the sensitivity of the system. For example, the threshold for the difference in vector angles may be 5-10 microradians. In other embodiments, the threshold may be less than 5 micro-radians or greater than 10 micro-radians.

If the difference between the sensed magnetic field and the expected magnetic field is greater than the threshold, then it may be determined at operation 16135 whether a defect exists. In an alternative embodiment, a sufficiently large difference in the sensed magnetic field and anticipated magnetic field may indicate anomalies in the conductors, deformation of the conductors, and the like. If the difference between the sensed magnetic field and the expected magnetic field is not greater than the threshold, then it can be determined that there is no defect at operation 16140. That is, if the sense magnetic field is sufficiently close to the anticipated magnetic field, it can be judged that there is no sufficiently large anomalies, breakage, deformation, etc. in the conductor.

Power charging in one position

The broad powerline infrastructure as shown in Figure 46 connects cities, critical power system components, homes and businesses. Infrastructure may include overhead and buried distribution lines, transmission lines, third rail power lines and underwater cables. In the various embodiments described herein, one or more of the various power lines may be used to charge the power system of vehicle system 16200. [ In alternative embodiments, any suitable electromagnetic field source is vehicle system 16200. A transmission tower, such as, for example, a cellular telephone transmission tower, may be used to power the system of vehicle system 16200.

In some embodiments, a conductor with direct current (DC) may be used. Current can be induced in the coil by moving the magnetic field relative to the coil. If the magnetic field does not move with respect to the coil, no current is induced. Thus, if a conductor has an AC current through the conductor, the magnetic field around the conductor is time-varying. In this example, the coil can be fixed with respect to the coil and a current can be induced in the conductor. However, when a DC current passes through a conductor, a static magnetic field is generated around the conductor. Therefore, if the coil does not move with respect to the conductor, no current flows through the coil. In such a case, when the coil moves relative to the conductor, a current will be induced in the coil. Thus, in embodiments in which the power line has DC power, the vehicle and / or the coil may move relative to the power line. For example, the vehicle can move along the length of the power line. In another example, the vehicle can vibrate its position by moving the coil within the magnetic field.

In an embodiment where the vehicle system 16200 is a public vehicle, the power line may be a machining line. In such an embodiment, vehicle system 16200 can fly sufficiently close to the overhead line to induce sufficient current in the charging device to charge the power system. In some embodiments, the power line may be an underground power line. In such an embodiment, the public vehicle system 16200 may fly near the surface. In such an embodiment, the electromagnetic field can be strong enough to pass through the earth and provide sufficient power to the vehicle system 16200. [ In an alternative embodiment, vehicle system 16200 may land on or on a power line embedded to charge the power. In embodiments where the vehicle system 16200 is a land-based vehicle, act 16305 may include locating an embedded power line.

At operation 16310, the vehicle system 16200 may be moved to the power line. For example, after identifying and / or locating the power line, the vehicle system 16200 enables the vehicle system 16200 to move sufficiently close to the power line using appropriate navigation and propulsion devices.

At act 16315, the charging system is oriented with the power line. In an exemplary embodiment, the charging system includes one or more coils. 50 is an illustration of a vehicle according to an exemplary embodiment. An exemplary unmanned aerial vehicle system (UAS) 5000 includes a body 5005 and a wing 5010. In alternative embodiments, additional, fewer, and / or different elements may be used. In an exemplary embodiment, body 5005 includes a battery system. The body 5005 can accommodate other components such as a computing system, an electronic device, a sensor, a cargo, and the like.

In an exemplary embodiment, one or more coils of the charging system may be located in the vane 5010. [ For example, each of the wings 5010 may include a coil. The coil may be positioned in the wing 5010 in any suitable manner. For example, the coil is positioned in the void in the wing 5010. [ In another example, the coils are bonded, fused, laminated or attached to the wing 5010. In this example, the coil may constitute a wing 5010, or a coil may be attached to the outer or inner surface of the wing 5010. In other embodiments, the one or more coils may be disposed at any suitable location. UAS 5000 is used for illustrative purposes only. In other embodiments, any suitable vehicle may be used and may not be a fixed wing aircraft.

Any suitable coil of conductors may be used to derive a current that can be used to charge the battery. In an exemplary embodiment, the coil is an inductive device. For example, the coil may include a conductor wound about a central axis. In other embodiments, any suitable coil may be used. For example, the coil may be wound spherically. In other embodiments, the charging device may include a dipole, a patch antenna, or the like. In an exemplary embodiment, operation 16315 includes orienting the coils to maximize the current induced in the coils. For example, operation 16315 may include orienting the coil such that the direction of the magnetic field at the coil is parallel to the central axis of the coil. In this example, the magnetometer can be used to determine the direction of the magnetic field in the coil. For example, each of the wings 5010 of the UAS 5000 includes a coil and a magnetometer. In an embodiment in which the vehicle is a rotary vehicle (e.g., a helicopter or a quad-helicopter type vehicle), the vehicle moves its own orientation to a fixed position around the power line so that the direction of the magnetic field coincides with the center axis of the coil.

In an exemplary embodiment, operation 16315 includes steering the vehicle to obtain a coil as close as possible to the power line. Figure 164 is a graph of distance versus field strength from a conductor according to an exemplary embodiment. Line 16405 represents the magnetic field strength of the 1000 A conductor and 16410 represents the magnetic field strength of the 100 A conductor. As shown in Figure 164, the magnitude of the magnetic field decreases at a rate proportional to the inverse of the distance from the source of the magnetic field. therefore,

 Where B is the magnitude of the magnetic field and r is the distance from the magnetic field source. For example, r is the distance from the power line. Thus, the closer the coil is to the power line, the more power is drawn from the coil to charge the battery.

However, in some embodiments, a substantial limitation may be indicated to maintain a minimum distance between the vehicle and the power line. For example, a vehicle can be damaged if the vehicle is broken or the power line is attacked. In this example, the vehicle may lose control or collision. In another example, the power line has a high voltage and / or a high current. For example, the voltage between the power lines can be between 5,000 and 7,000 volts, and the power line can transmit about 100 amps. In another embodiment, the power line may have a voltage of greater than 7,000 volts or less than 5,000 volts. Similarly, the power line may be less than 100 amperes or more than 100 amperes. In this example, if the vehicle is sufficiently close to the power line, an electrostatic discharge may occur. Such a discharge may be a plasma discharge which may damage the vehicle.

In an exemplary embodiment, the vehicle is about 1 meter away from the power line. For example, one or more coils may be located one meter away from the power line. In another embodiment, the vehicle may be 1 to 10 meters away from the power line. In another embodiment, the vehicle may be 10 to 20 meters away from the power line. In an alternative embodiment, the vehicle is at least 1 meter or 20 meters away from the power line.

At act 16320, the power source may be charged. For example, the power source may include one or more batteries. The induced current in the coil can be used to charge the battery. In an exemplary embodiment, the power of the power line may be alternating current (AC) power. In such an embodiment, the magnetic field produced by the AC power alternates and the current induced in the coil alternates. The vehicle may include a rectifier that converts the inductive current to direct current to charge one or more batteries.

In operation 16325, the orientation of the charging system with the power line may be maintained. For example, the vehicle can maximize the amount of current induced in the coil while maintaining a proper (e.g., safe) distance from the power line.

In embodiments in which the vehicle can be charged in a stationary position (e.g., a land vehicle or a rotating vehicle), the vehicle can maintain a consistent position near the power line. In an embodiment in which the vehicle travels along a power line (e.g., when the vehicle is charging while in motion or when the vehicle is a fixed wing type vehicle), the vehicle may follow the path of the power line. For example, overhead power lines may sag between support columns. In this example, the vehicle may follow the deflection (e.g., suspension cross-section) of the power line as the vehicle travels along the length of the power line. For example, the vehicle can maintain a certain distance from the power line.

The vehicle can maintain a distance from the power line in any suitable manner. For example, the UAS 5000 may include a magnetometer in each wing 5010. The UAS 5000 can triangulate the location of power lines using a magnetometer. For example, the direction of the magnetic field around the power line is perpendicular to the length of the power line (e.g., perpendicular to the direction of current travel). Thus, based on the direction of the measured magnetic field, the direction of the power line can be determined. The distance to the power line can be triangulated using the magnitude of the magnetic field measured in each magnetometer to determine the distance from the power line. In other embodiments, any other suitable device may be used to determine the distance from the vehicle to the power line. For example, a vehicle can use a laser, a camera, an ultrasonic sensor, a focal plane array, or an infrared sensor to sense the position of the power line.

Rapid, high-resolution magnetic field measurement for power line inspection

In partial aspects of the present technique, methods and configurations for diamond nitrogen-vacancy (DNV) application for the detection of defects in power delivery or distribution lines are disclosed. The characteristic self signature of the power infrastructure can be used for infrastructure testing. For example, a faultless power line has a characteristic self signature. The self-signature of the powerline can be measured and compared to the expected self-signature. The measured difference may indicate a fault in the transmission line.

In some implementations, a magnetic sensor may be used to measure the magnetic signature of the transmission line. For example, a magnetic sensor can be mounted on a manned vehicle. The manned vehicle can move along the transmission line to measure the self signature of the transmission line. In other implementations, the magnetic sensor may be included in an unmanned vehicle. Transmission lines can also be used to navigate unmanned vehicles, allowing unattended line monitoring. Unmanned vehicles can be started using power lines and can inspect the same power lines for defects.

Since the magnetic field is measured, the measurement of these magnetic fields is not hindered by poor visibility conditions that affect other inspection methods such as visual or visual, optical and laser inspection methods. Thus, it can detect defects such as poor visual acuity or power loss when plants grow over power lines.

In some implementations, the techniques may include one or more magnetic sensors, a self-navigating database, and a feedback loop capable of controlling the position and orientation of the unmanned vehicle. High sensitivity to the magnetic field of the DNV magnetic sensor for magnetic field measurement can be utilized. DNV magnetic sensors also offer low cost, space, weight and power (C-SWAP) and provide fast settling time benefits. With the DNV magnetic field measurement, the UAS system is aligned with the power line and moves quickly along the powerline infrastructure path. Navigation is possible in places where visibility is poor or where GPS is rejected. Also, the UAS operation may occur in proximity to a power line that facilitates covert transmission. DNV-based magnetic sensors can be about 100 times smaller than conventional magnetic sensors and can have reaction times as fast as 100,000 times faster than sensors with similar sensitivities.

Figure 44 is a conceptual diagram illustrating an example of UAS 4402 navigation along power lines 4404, 4406, and 4408 in accordance with some implementations of the present technique. UAS 4402 can be used as UAS 4402 roads and highways without prior knowledge of path magnetic characteristics by utilizing the unique self-signature of the navigation power line. 45A, the ratio of the signal intensities of the two magnetic sensors A and B (4410 and 4412 in Fig. 44) attached to the wings of the UAS 4402 is the same as that of the three-line transmission line structures 4404, 4406, 4408 as a function of distance x from the centerline. When the ratio is close to 1 at point 4522, UAS 4402 is centered on the power transmission line structure and x = 0 at point 4520.

(B-field) 4506 from all (3) wires shown in FIG. 2B. This magnetic field is an example of the magnetic field strength measured by one or more magnetic sensors of the UAS. In this example, the peak of the magnetic field 208 corresponds to the UAS 4402 that is above the position of the midline 4406. When the UAS 4402 has two magnetic sensors, the sensor will read the intensity corresponding to points 4502 and 4504. The remote device of the UAS or UAS can calculate the combined readings. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations of the arrangement and type of components can be made, and additional components, different components or fewer components can be provided.

As various implementations, a vehicle such as a UAS may include one or more navigation sensors such as a DNV sensor. The vehicle's goal is to travel to its initial destination and return to its final destination whenever possible. The known navigation system can be used to navigate the vehicle to an intermediate position. For example, the UAS can fly using GPS and / or human controlled navigation to an intermediate location. The UAS can then start looking for a self-signature on a power source, such as a power line. To locate the powerline, the UAS can use the DNV sensor to perform measurements continuously. The UAS can fly in circular, straight, curved patterns, etc., and can monitor the recorded magnetic field. The magnetic field can be compared to known characteristics of the power line to identify whether the power line is near the UAS. For example, the measured magnetic field may be compared to a known magnetic field characteristic of the power line to identify a power line that produces the measured magnetic field. Information about the electrical infrastructure can also be used to identify the current source along with the measured magnetic field. For example, a database of previously recorded and recorded magnetic measurements can be used to compare current readings to help determine the location of the UAS.

In various implementations, when the UAS identifies a powerline, the UAS is located at a known elevation and location relative to the powerline. For example, if a UAS follows a powerline, the magnetic field reaches its maximum value and then begins to decrease as the UAS moves away from the powerline. After sweeping a known distance once, the UAS can return to the strongest point of the magnetic field. Depending on the known characteristics of the power line and magnetic readings, the UAS can determine the powerline type.

Once the current source is identified, the UAS may change the altitude until the magnetic field is at a known value consistent with the elevation above the identified power line. For example, as shown in FIG. 49, the magnetic field strength can be used to determine the height above the current source. The UAS can also be placed in an offset position directly above the power line using the measured magnetic field. For example, if a UAS is placed above the current source, the UAS can move sideways from the current source to the offset location. For example, the UAS can move 10 kilometers to the left or right of the current source.

The UAS may be programmed via the computer 4606 as a flight path. In various implementations, when the UAS is located, the UAS can use the flight path to reach the destination. In various implementations, the magnetic field generated by the transmission line is perpendicular to the transmission line. In this implementation, the vehicle will fly perpendicular to the detected magnetic field. In one example, the UAS can follow the detected power line to its destination. In this example, the UAS will attempt to keep the detected magnetic field close to the original magnetic field value. To this end, the UAS can move sideways to change elevation or maintain its position relative to the power line. For example, an elevated power line increases the strength of the detected magnetic field as the distance between the UAS and the power line decreases. The navigation system of the UAS can detect this increased magnetic force and increase the altitude of the UAS. The instrument cluster can also provide an elevation display of the UAS. The navigation system may also move the UAS sideways to maintain the UAS in place relative to the power line.

The magnetic field may become weaker or stronger as the UAS deviates from the transmission line location. If changes in the magnetic field are detected, the navigation system can make appropriate corrections. For a UAS with only one DNV sensor, the navigation system can correct if the magnetic field decreases by more than a predetermined amount. For example, a UAS may have an error budget in which the UAS attempts to modify its course if the measured error is greater than the error budget. As the magnetic field decreases, the navigation system can direct the UAS to move to the left. The navigation system continues to monitor the magnetic field and move to the left to see if the error has been corrected. As the magnetic field further decreases, the navigation system can instruct the UAS to fly right to its original position for the current source and then to move further to the right. As the magnetic field strength decreases, the navigation system can infer that the UAS should lower the altitude to increase the magnetic field. In this example, the UAS originally flowed directly through the current source, but because the current source is at a lower elevation, the distance between the current source and the UAS has increased. Using this magnetic field feedback loop, the navigation system can center the UAS or keep it at the offset of the current source. If the intensity of the magnetic field increases, the same analysis can be performed. The navigation can be activated until the measured magnetic field is within the appropriate range, such as the UAS in the flight path.

The UAS may also use vector measurements from one or more DNV sensors to determine course calibration. The reading of the DNV sensor is a vector representing the direction of the sensed magnetic field. As the UAS learns the position of the power line as the size of the detector magnetic field decreases, the vector can provide an indication of the direction the UAS should move to correct that direction. For example, the intensity of the magnetic field can be reduced by a threshold value at an ideal position. The magnetic vector of this magnetic field can be used to indicate the direction that the UAS should modify to increase the strength of the magnetic field. In other words, the magnetic field represents the direction of the field, and the UAS can use this direction to determine the exact direction needed to increase the strength of the magnetic field. You can calibrate the UAS's flight path so that it can go back over the transmission line.

By using multiple sensors in a single vehicle, the required amount of maneuver can be reduced or the maneuver can be eliminated. The navigation system can use the measured magnetic field at each of the various sensors to determine if the UAS should be moved left, right, up or down to modify the path. For example, if two DNV sensors read a stronger magnetic field, the navigation system could direct the UAS to raise the altitude. As another example, if the left sensor is stronger than expected but the right sensor is weaker than expected, the navigation system can move the UAS to the left.

In addition to the current reading from one or more sensors, a recent history of reading may also be used by the navigation system to identify how to modify the UAS course. For example, if the intensity of the right sensor is slightly increased then decreasing, the left sensor will decrease, while the navigation system will be able to move the UAS farther to the left of the flight path and modify the UAS position accordingly.

46 also shows a high-level block diagram of an exemplary UAS navigation system 4600 in accordance with some implementations of the present technique. In some implementations, the UAS navigation system of the present technique includes a plurality of DNV sensors 4602a, 4602b, 4602c, a navigation database 4604, and a feedback loop to control UAS location and direction. In another implementation, the vehicle may include navigational controls used to navigate the vehicle. For example, navigational control can change the direction, altitude, speed, etc. of the vehicle. DNV magnetic sensors (4602a-4602c) have high sensitivity to magnetic fields, low C-SWAP and fast settling times. The DNV magnetic field measurement allows the UAS to align with the power line through the characteristic magnetic field and move quickly along the power line path. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations of the arrangement and type of components can be made, and additional components, different components or fewer components can be provided.

Figure 47 also shows an example of a power line infrastructure. As shown in Figure 47, a wide powerline infrastructure connects cities, critical power system components, homes and businesses. Infrastructure may include overhead and buried power lines, transmission lines, railway lines and third rail power lines and underwater cables. Each element has its own electromagnetic and spatial signature. It is understood that, unlike the electric field, the self signature is minimally affected by the artificial structure and electrical shielding. It is understood that certain elements of the infrastructure have distinct magnetic and spatial signatures, and discontinuities, cable deflections, power consumption and other factors produce variations of the self signature that can be exploited for exploration.

48A and 48B show examples of magnetic field distributions for overhead power lines and underground power cables. Ground and underground power cables all emit magnetic fields and are not easily blocked or shielded, unlike electric fields. Natural earth and other magnetic field sources can provide a coarse value of absolute position. However, the sensitive magnetic sensors described here can find powerful artificial magnet sources such as power lines at considerable distances. As the UAS moves, the measurements can be used to indicate the spatial structure of the magnetic source (point source, line source, etc.) so that the power line can be identified as such. Also, once the UAS is detected, it can be guided to the power line through the magnetic force. Once the position of the power line is determined, the structure is determined and the power line path follows and the characteristic is compared with the magnetic way point to determine the absolute position. The fixed power line can provide a precise location reference since the pole and tower positions and relative positions are known. A small onboard database can provide reference signature and location data for waypoints. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations of the arrangement and type of components can be made, and additional components, different components or fewer components can be provided.

Figure 49 also shows an example of the magnetic field strength of the power line as a function of the distance from the center line and even shows that the low current line wiring can be detected up to a distance exceeding 10 km. Here, the DNV sensor provides 0.01 μT sensitivity (1e-10T) and the modeling results indicate that it can detect high current transmission lines (eg, 1000A - 4000A) at over a dozen kilometers. This strong magnetic source allows the UAS to guide itself to a power line that can be aligned by itself using the localized relative magnetic field strength and the characteristic pattern of the power line configuration as described below.

50 shows an example of the UAS 5002 equipped with DNV sensors 5004 and 5006. [ 51 is a plot of the measured differential magnetic field sensed by the DNV sensor as it approaches the power line. A single DNV sensor can perform powerline sensing, but multiple wire sensors can be used to perform precise alignment for complex wire configurations. For example, differential signals can eliminate the effects of daytime and seasonal variations in field strength. However, not all illustrated components may be required, and one or more implementations may include additional components not shown in the figures. Variations of the arrangement and type of components can be made, and additional components, different components or fewer components can be provided.

In various other implementations, vehicles may also be used to inspect transmission lines, power lines, and power utility equipment. For example, the vehicle may include one or more magnetic sensors, a magnetic waypoint database, and an interface to UAS flight control. The technology can take advantage of the high sensitivity to the magnetic field of the DNV magnetic sensor for magnetic field measurements. DNV magnetic sensors also offer low cost, space, weight and power (C-SWAP) and provide fast settling time benefits. DNV magnetic field measurements allow the UAS to align with power lines and quickly move along the powerline path and navigate in harsh visibility and / or GPS rejection environments. The DNV-based magnetic sensor is about 100 times smaller than the conventional magnetic sensor and has a reaction time about 100,000 times faster than the sensor with the sensitivity similar to that of the EMDEX LLC Snap portable magnetic field measuring device.

The fast stabilization time and low C-SWAP of the DNV sensor enable rapid measurement of detailed power line characteristics from low C-SWAP UAS systems. In one or more implementations, power lines can be routinely metered over long distances through small unmanned aerial vehicles (UAVs), which can identify new problems and issues through automated field anomaly identification. In another embodiment, land vehicles or submersibles can be used to inspect power lines. The personnel inspector does not need to perform an initial inspection. The inspection of the target technology is quantitative and thus can be a remote video solution and is not dependent on human interpretation.

Figure 52 also shows an example of a measured magnetic field distribution for normal power line 5204 and abnormal power line 5202 according to some implementations. The peak value of the measured magnetic field distribution for a normal power line is near the centerline (e.g., d = 0). The inspection method of the present technology is a high speed anomaly mapping technique that can be used in single and multiple wire transmission systems. The solution leverages existing software modeling tools to analyze inspection data. In one or more implementations, data of a normal set of power lines may be used as a comparison criterion for data generated from testing of other power lines (e.g., with anomalies or defects). Damage to the wires and support structures is detected by changing the nominal magnetic field characteristics and comparing them to the nominal magnetic field characteristics of a set of normal power lines. Magnetic field measurements are understood to be minimally affected by other structures such as buildings, trees, and so on. Thus, the measured magnetic field can be compared to data from the normal set of power lines and the magnitude of the measured magnetic field, and if it differs from the predetermined threshold, it can indicate that anomalies are present. It can also be used to compare vector readings between difference data to determine the presence of an exception.

165A and 165B are block diagrams of a system for detecting deformation in a transmission line according to an exemplary embodiment. The exemplary system 100 includes a transmission line 16505 and a magnetometer 16530. The magnetometer can be included in the vehicle.

The current flows through the transmission line 16505 as indicated by the arrow labeled 16520. [ 165A and 165B show the direction of the current flowing through the transmission line 16505. Fig. As the current 16520 passes through the transmission line 16505, a magnetic field is generated (16525). The magnetometer 16530 can be passed along the length of the transmission line 16505. [ 165A and 165B include an arrow parallel to the length of the transmission line 16505 indicating the relative path of the magnetic line of force 16530. [ In an alternative embodiment, a suitable path may be used. For example, in some embodiments in which the transmission line 16505 is curved, the magnetometer 16530 may follow the curvature of the transmission line 16505. Further, the magnetometer 16530 need not maintain a constant distance from the transmission line 16505. [

The magnetometer 16530 can measure the magnitude and / or direction of the magnetic field along the length of the transmission line 16505. For example, the magnetometer 16530 measures the magnitude and direction of the magnetic field at multiple sample points along its length. And is connected to the transmission line 16505 of the transmission line 16505 in the same direction as the transmission line 16505 at the sample point. For example, the magnetometer 16530 may pass along the length of the transmission line 16505 while over the transmission line 16505. [

Any suitable magnetometer can be used as the magnetometer 16530. In some embodiments, the magnetometer uses one or more diamonds having an NV center. Magnetometer 16530 may have sensitivity to detect a change in magnetic field around transmission line 16505 caused by malformations. In a partial example, a relatively insensitive magnetometer 16530 may be used. In such a case, the magnetic field surrounding transmission line 16505 should be relatively strong. For example, the magnetometer 16530 may have a sensitivity of about 10 ^-9 tesla (1 nanometer). Since the transmission line can transmit a large current, the magnetic field generated from the transmission line can be detected from a long distance. For example, in the case of a high current transmission line, the magnetometer 16530 may be 10 kilometers away from the source. Magnetometer 16530 may have any suitable measurement rate. For example, the magnetometer 16530 may measure the magnitude and / or direction of the magnetic field at a particular point in space 10,000 times per second. In another example, the magnetometer 16530 can take 50,000 measurements per second. A more detailed description of the operation of the DNV sensor is provided in United States Patent Application Serial No. __ / ___, entitled " Apparatus and Method for Detecting Hypersensitivity of Magnetic Fields, " filed on even date herewith, incorporated by reference.

In some embodiments in which the magnetometer 16530 measures the direction of the magnetic field, the direction of the magnetometer 16530 relative to the transmission line 16505 can be maintained along the length of the transmission line 16505. [ By the magnetometer 16530 monitoring the direction of the magnetic field of the length transmission line 16505, the direction of the magnetic field can be monitored. If the direction of the magnetic field is changed or is different from the expected value, it can be determined that a deformation exists in the transmission line 16505. [

In some embodiments, the magnetometer 16530 may be used to determine the magnitude of the magnetic field of the transmission line 16505 because the magnetic field around the transmission line 16505 is uniform along the length of the transmission line 16505, Can be maintained in the same orientation. For example, referring to the magnetic field direction 16525 of Figure 165a, the direction of the magnetic field on transmission line 16505 points to the right of transmission line 16505 (e.g., according to Fleming's "right-hand rule"). A vehicle equipped with a magnetometer will know the relative position of the magnetometer relative to the transmission line (16505). For example, a public vehicle will know that its relative position is higher than transmission line 16505 or a known distance that is separated from its transmission line, but a ground based vehicle has its own relative position under the transmission line 16505, You will know the length. Based on the relative position of the magnetometer relative to transmission line 16505, the directional magnetic vector may be monitored to indicate a fault in transmission line 16505. [

In some embodiments, where the magnetometer 16530 measures the magnitude of the magnetic field, rather than the direction of the magnetic field, the magnetometer 16530 may be located at any appropriate location around the transmission line 16505 along the length of the transmission line 16505, The power supply line 16530 may not be held in the same direction along the length of the transmission line 16505. [ In such an embodiment, the magnetometer 16530 may be maintained at the same distance from the transmission line 16505 along the length of the transmission line 16505 (the same material, such as air, is transmitted along the length of the transmission line 16505 to the magnetometers 16530 and 16530) Transmission line 16505).

165A shows a system in which the transmission line 16505 does not include a deformation. 165B shows that the transmission line 16505 includes a defect 16535. Fig. Defects 16535 can be cracks in the transmission line, damage to the transmission line, degraded part of the transmission line, and the like. Defect 16535 is the state of the transmission line that affects current flow through the faultless transmission line. As shown in FIG. 165B, a portion of the current 16520 is reflected back from the defect 16535 as shown by the reflected current 16540. As in FIG. 10B, the direction of the magnetic field 16525 corresponds to the current 16520. FIG. The reflected current magnetic field direction 16545 corresponds to the reflected current 16540. Since the current 16520 moves in the opposite direction from the reflected current 16540, the magnetic field direction 16525 is opposite to the reflected current magnetic field direction 16545. Thus, the magnetic field measured at the transmission line will be based on both current 16520 and reflected current 16540. This magnetic field will be different in magnitude from the magnetic field (16525) and probably will be different in direction. The difference between the magnetic fields 16525 and 16545 can be calculated and used to indicate the presence of defect 16535. In some instances, as the magnetometer 16530 moves closer to the defect 16535, the magnetic field decreases. In some embodiments, it can be determined that there is a defect 16535 when the measured magnetic field is below a threshold. In some embodiments, the threshold may be +/- 5%, +/- 10%, +/- 15%, +/- 50%, or percent of expected value such as any other appropriate portion of expected value. In other embodiments, any suitable threshold value may be used.

In some embodiments where the defect 16535 is a full break that breaks the conductivity between portions of the transmission line 16505, the magnitude of the current 16520 may be the same or substantially similar to the reflected current 16540. Thus, the "0" magnetic field around the combined magnetic transmission line 16505 will be zero or substantially zero. That is, the magnetic field generated by current 16520 is canceled by the same but opposite magnetic field generated by reflected current 16540. In this embodiment, the defect 16535 can be detected using the magnetometer 16530 by comparing the measured magnetic field, which is substantially zero, with a non-zero expected magnetic field.

The magnitude of the reflected current 16540 is less than the magnitude of the current 16520 in some embodiments where a portion of the current 16520 may pass through or around the defect 16535 due to the defect 16535. Thus, the magnitude of the magnetic field produced by the reflected current 16540 is less than the magnitude of the magnetic field generated by current 16520. [ The magnitude of the current 16520 and the magnitude of the reflected current 16540 may not be the same, but the current magnetic field direction 16525 and the reflected current magnetic field direction 16545 are still opposite. Thus, the net magnetic field will be the magnetic field in the direction of the current magnetic field 16525. The magnitude of the net magnetic field is the magnitude of the magnetic field generated by the reduced current 16520 based on the magnitude of the magnetic field generated by the reflected current 16540. As described above, the magnetic field measured by the magnetometer 16530 can be compared with a threshold value. Depending on the extent, size, and / or shape of the defect 16535, the net magnetic field sensed by the magnetometer 16530 may or may not be smaller (or larger) than the threshold. Therefore, the sensitivity of the system can be adjusted by adjusting the threshold value. That is, the larger the deviation threshold value from the expected value, the larger the magnitude of the magnetic field in which the deformation of the transmission line 16505 is sensed must be equal to or greater than the threshold value. Thus, as the threshold is closer to the expected, finer, smaller, less stringent, deformation is detected by the system 100.

As described above, the direction of the magnetic field around the transmission line 16505 can be used to sense the deformation of the transmission line 16505. [ 166 shows a current path through a transmission line with a modification 16635 in accordance with an exemplary embodiment. Figure 166 is meant to be illustrative and illustrative only, and not intended to limit the functionality of the system.

As described above, the current can pass through the transmission line 16605. [ The current path 16620 shows the direction of the current. As shown in Fig. 166, the transmission line 16605 includes a deformation portion 16635. Fig. The deformations 16635 can be any suitable deformations such as cracks, depressions, impurities, and the like. The current passing through the transmission line 16605 spreads uniformly around the transmission line 16605 at a portion not including the deformation portion 16635. [ In some cases, the current may be more centered on the surface of the transmission line 16605 than the center of the transmission line 16605.

In some embodiments, deformation 16635 is part of transmission line 16605 that does not allow or resist current flow. Therefore, the current passing through the transmission line 16605 flows around the deformed portion 16635. [ As shown in FIG. 165A, the direction of the current magnetic field 16525 is perpendicular to the direction of the current 16520. Thus, as in FIG. 165A, line 16505 does not include strain, and the direction of the magnetic field around transmission line 16505 is all perpendicular to the length of transmission line 16505 along the length of transmission line 16505.

166, when the transmission line 16605 includes the deformed portion 16635 through which the current flows, the direction of the current changes as indicated by the current path 16620. [ Therefore, the current flowing around the transmission line 16605 deformed portion 16635 is not parallel to the length of the transmission line 16605. [ Therefore, the magnetic field generated by the current path corresponding to the curved current path 16620 is not perpendicular to the length of the transmission line 16605. [ As the magnetometer, such as the magnetometer 16530, passes along the length of the transmission line 16605, a change in the direction of the magnetic field around the transmission line 16605 can indicate that the deformation 16635 is present. As the magnetometer 16530 approaches the deformation portion 16635, the direction of the magnetic field around the transmission line 16605 changes from being perpendicular to the length of the transmission line 16605. [ As the magnetometer 16530 passes along the deformation portion 16635, the change in the direction of the magnetic field increases and then decreases as the magnetometer 16530 moves away from the deformation portion 16635. A change in the direction of the magnetic field may indicate the position of the deformed portion 16635. In some instances, the transmission line 16605 may have a deformation that reflects a portion of magnetic lines of force 16630. As shown in FIG. 165B, the transmission line 16605 may reflect a portion of the current and have a deformation that deflects the flow of current, as shown in FIG. 166.

The size, shape, type, etc. of the deformed portion 16635 determines the spatial direction of the magnetic field surrounding the deformed portion 16635. In some embodiments, multiple samples of the magnetic field around the deformations 16635 can be taken to create a map of the magnetic field. In an exemplary embodiment, each of the samples includes a magnitude and direction of the magnetic field. Based on the spatial shape of the magnetic field surrounding the deformations 16635, one or more characteristics of the deformations 16635, such as size, shape, type, etc., of deformations 16635 can be determined. For example, a magnetic field can be used to determine whether the deformations 16635 are dents, cracks, impurities in the transmission line, and the like. In some embodiments, the map of the magnetic field surrounding the deformations 16635 is known to be malformed. In an exemplary embodiment, the transformations 16635 may be determined to be similar or identical to the most similar matching transforms from the database. In another embodiment, the transform 16635 may be determined to be similar or identical to a variation of the database with a similarity score over the threshold score. The similarity score may be any suitable score that measures the similarity between the measured magnetic field and one or more known magnetic fields of the database.

In various implementations, a vehicle that includes one or a magnetometer can navigate through the powerline being inspected. For example, the vehicle may navigate to n known locations, e.g., a starting location, and may identify the presence of a power line based on the sensed magnetic vector. The vehicle can then determine the type of power line and can also determine if the type of power line is the type to be checked. The vehicle can be inspected autonomously or semiautomatically through the power line as above while simultaneously inspecting the power line.

In various implementations, the vehicle may need to avoid objects in its navigation path. For example, a ground vehicle may need to maneuver around a person or object, or a flight vehicle may need to avoid building or power line equipment. In such an implementation, the vehicle can be a device with sensors used to find avoidable obstacles. Systems such as camera systems, focus arrays, radar, acoustic sensors, etc. can be used to identify obstacles in the vehicle path. The navigation system can identify path corrections to avoid identified obstacles.

The power transmission line may extend between two transmission towers. In this case, the power transmission line may cause deflection between the two transmission towers. The deflection of the power transmission line depends on the weight of the wire, the tower spacing, and the wire tension, depending on the ambient temperature and the electrical load. Excessive deflection can cause a short circuit when the transmission line contacts a brush or other surface structure. This can cause the transmission line to fail.

Figure 167 shows a power transmission line loop between transmission towers in accordance with an exemplary embodiment. Transmission line 16710 is shown as a "normal" sag 16722. Here, the bird is determined based on how much the transmission line is below the tower height. The transmission line 16710 extends between the first tower 16702 and the second tower 16704. The second transmission line 16720 is shown with excessive deflection. When this occurs, the transmission line 16720 may contact vegetation 16730 or other surface structures that may occur on-board or on-board.

A vector measurement made of a magnetometer mounted on a UAV can measure the wire deflection as the UAV flies along the power line. 168 shows an instantaneous measurement of the magnetic field at point X 'at which the UAV is flying at a fixed height above the tower. The larger the horizontal component (x) of the magnetic field, the greater the deflection. Figure 169 shows the change in magnetic field components for a nominally deflected wire and a dull red excess wire as the UAV moves between towers 1 and 2. The X and Z components of the transmission line under normal / nominal deflection are displayed (16908 and 16902). Also shown are the X component 16906 and Z component 16904 of the line experiencing excessive deflection.

Cable sagging can be measured by flying a UAV along a cable along a cable. Figure 169 shows the modulation in the vector component of the magnetic field for various deflection values. The lookup table can be configured to search for deflection at these measurements for the wires between each tower pair along the UAV flight path. Or a database of dictionary vector measurements can be compared to measurements. Generally, the more flat the curve is, the less deflections will occur. The exact value of the bird's exact value depends on the distance between the tows measured by the UAV and the angle of the vector at the tower. You can use vector measurements combined with weather information and potentially past data or transmission line deflection models to determine if the expected deflection of the power line is larger or smaller. If this occurs, an indication may be displayed or reported that the power line has been deflected.

The subject matter described herein sometimes describes different components included or connected to different different components. It is to be understood that such an illustrated architecture is merely exemplary and that many different architectures can be implemented that actually achieve the same functionality. In a conceptual sense, any arrangement of components to achieve the same function is effectively "related" to achieve the desired functionality. Thus, any two components combined to achieve a particular functionality may be considered to be "related" to one another so that the desired functionality is achieved regardless of the architecture or intermediary components. Similarly, any two components so combined may be considered "operably connected" or "operably coupled" to one another to achieve the desired functionality, and any two The two components may also be "coupled to" to achieve the desired functionality. Certain embodiments operably coupleable include physically and / or physically interacting components and / or components interacting wirelessly and / or interacting wirelessly and / or logically interacting and / / RTI &gt; and / or logically interactable components. &Lt; RTI ID = 0.0 &gt;

As used herein in connection with the use of substantially any plural and / or singular, one of ordinary skill in the art may translate from plurality to singular, and / or singular to plural, as appropriate for the context and / or application. The various singular / plural permutations may be explicitly described herein for clarity.

In general, those skilled in the art will understand that the terms used herein, and particularly the appended claims (e.g., the bodies of the appended claims), are intended to be generally "open" Should be construed as including "," having "should be interpreted as having" at least ", and" including "should be interpreted as" including but not limited to "and the remainder as such). It will be further understood by those skilled in the art that the intent is intended to be expressly set forth in the claims, if a specified number of the recited claims is intended, and that such intent is not present without such recitation. For example, to facilitate understanding, the following appended claims may incorporate claim statements using "at least one" and "one or more" However, the use of such phrases is interpreted to mean that the introduction of a claim indication by the incorrect term "a" or "an" is intended to limit a particular claim, including such introduced claim, . The same claim is interpreted to mean the phrase "at least one" or "at least one" and ambiguous terms such as "a" or "an" (eg "a" and / or "an" ). The same applies to the use of the explicit provisions used to introduce the claims. Also, although the description of a specific number of the introduced claims is expressly referred to, those skilled in the art will recognize that such quotation is typically to be construed to mean at least a quoted number (e.g., "two notation" , And when there is no other modifier, usually means at least two notations or two or more notations). Also, an agreement similar to "at least one of A, B, C, etc." is generally intended to mean that a person skilled in the art can understand the conventions (e. G., A system having at least one of A, "A is alone, B is alone, C is alone, A and B are together, A and C are together, B and C are together, and / or A, B and C are together. An agreement similar to "at least one of A, B, C, etc." is generally intended to mean that a person skilled in the art can understand the convention (for example, "a system having at least one of A, B or C" A is alone, B is alone, C is alone, A and B are together, A and C are together, B and C are together, and / or A, B and C are together). Virtually any binary word and / or phrase that presents two or more alternative terms, whether in the description, the claim or the drawing, whether or not one of the terms, any one of the terms, or both It will also be understood by those of ordinary skill in the art that it is to be understood that the possibility of including both terms is included. It means one or both of the two terms. For example, the phrase "A or B" will be understood to include the possibility of "A" or "B" or "A and B". Also, unless otherwise stated, use of "about", "about", "about", "substantially", etc. means - 10%.

The foregoing description of exemplary embodiments has been presented for purposes of illustration and description. And is not intended to be exhaustive or limited with respect to the precise form disclosed, and variations and modifications may be made in light of the above teachings, or may be acquired from practice of the disclosed embodiments. The scope of the present invention should be determined by the appended claims and their equivalents.

Claims (31)

A system for magnetic detection,
Diamond nitrogen-vacancy (DNV) sensor, wherein the diamond nitrogen-vacancy (DNV) sensor
A nitrogen vacancy (NV) diamond material comprising a plurality of NV centers;
A radio frequency (RF) excitation source configured to provide RF excitation to the NV diamond material;
An optical excitation source configured to provide an optical excitation to the NV diamond material;
An optical detector configured to receive an optical signal emitted by the NV diamond material, the optical signal based on ultrafine states of the NV diamond material; And
A controller configured to detect an inclination of the optical signal based on the ultrafine states emitted by the NV diamond material
Wherein the magnetic detection system comprises: 2. The system of claim 1, wherein the DNV sensor further comprises a reflector positioned about the diamond to reflect a portion of the light emitted from the diamond. The apparatus of claim 1, wherein the DNV sensor
Further comprising a magnetic field generator configured to generate a magnetic field,
The controller
Controlling the magnetic field generator to apply a time-varying magnetic field in the NV diamond material,
Determining the magnitude and direction of the magnetic field in the NV diamond material based on the photodetection signal received from the optical detector,
And to determine a magnetic vector malformation due to the object based on the determined magnitude and direction of the magnetic field in accordance with the frequency dependent attenuation of the time varying magnetic field. The apparatus of claim 1, wherein the DNV sensor
Further comprising a magnetic field generator comprising at least two magnetic field generators comprising a first magnetic field generator configured to generate a first magnetic field and a second magnetic field generator configured to generate a second magnetic field,
The controller
Modulate a first code packet, control the first magnetic field generator to apply a first time varying magnetic field in the NV diamond material based on the modulated first code packet,
Modulating a second code packet and controlling the second magnetic field generator to apply a second time varying magnetic field in the NV diamond material based on the modulated second code packet, Wherein the code packets are binary sequences having a low cross correlation with each other and each of the binary sequences is further configured to modulate and control with good autocorrelation. 5. The system of claim 4, wherein the direction of the first time-varying magnetic field in the NV diamond material is different from the direction of the second time-varying magnetic field in the NV diamond material. 5. The apparatus of claim 4, wherein the controller
Receiving first optical detection signals from the optical detector based on the optical signal emitted by the NV diamond material based on the first code packet transmitted with the NV diamond material, Receiving second optical detection signals from the optical detector based on the optical signal emitted by the NV diamond material based on the second code packet transmitted with the NV diamond material concurrently with the first code packet,
Applying matched filters to the received first and second optical detection signals to demodulate the first and second code packets,
Determine the magnitude and direction of the first magnetic field and the second magnetic field in the NV diamond material based on the demodulated first and second code packets,
And determine a magnetic vector malformation based on the determined magnitude and direction of the first magnetic field and the second magnetic field. 5. The system of claim 4, wherein the first and second code packets are modulated by continuous phase modulation. 5. The system of claim 4, wherein the first and second code packets are modulated by MSK frequency modulation. 5. The system of claim 4, wherein the controller is further configured to control the RF excitation source and the optical excitation source to provide a sequence of pulses to the self-optically defect center material. The method according to claim 1,
Further comprising a transmitting device, wherein the transmitting device
A first processor configured to transmit data to a transmitter; And
Wherein the transmitter is configured to transmit the data via a magnetic field. 11. The method of claim 10,
As a receiving device, the receiving device
The DNV sensor configured to detect the magnetic field; And
And a second processor configured to decrypt the data from the detected magnetic field
And wherein the magnetic detection system further comprises: 12. The apparatus of claim 11, wherein the first processor
Receive a first data stream comprising the data and interleave the data into a plurality of second data streams,
Wherein the transmitter is configured to transmit each of the second data streams on one of a plurality of channels. 13. The system of claim 12, wherein each of the plurality of channels comprises one of a plurality of magnetic fields. 14. The system of claim 13, wherein each of the plurality of magnetic fields is orthogonal to each other. 13. The system of claim 12, wherein the magnetometer is configured to detect the magnetic field in a plurality of directions. 16. The system of claim 15, wherein the plurality of directions are arranged in a tetrahedron. 16. The system of claim 15, wherein the second processor
Receiving a plurality of signals from the magnetometer, each of the plurality of signals corresponding to one of the plurality of directions;
Decrypting each of the plurality of second data streams from the plurality of signals,
And de-interleave the plurality of second data streams to determine the data. 13. The method of claim 12, wherein to transmit the data via the magnetic field, the transmitter is configured to transmit two data streams through two magnetic fields, each of the two data streams being transmitted to one of the two magnetic fields Gt; a &lt; / RTI &gt; 13. The method of claim 12, wherein to transmit the data via a magnetic field, the transmitter is configured to transmit three data streams through three magnetic fields, each of the three data streams being transmitted to one of the three magnetic fields Corresponding to the magnetic field. 13. The system of claim 12, wherein the first processor
Receiving a first data stream comprising the data,
Interleaving the data into a plurality of second data streams,
And to append a synchronization sequence to each of the plurality of second data streams to form a plurality of third data streams,
Wherein the transmitter is configured to transmit each of the third data streams on one of a plurality of channels. 21. The apparatus of claim 20, wherein the magnetometer is configured to detect the magnetic field in a plurality of directions, the plurality of directions being orthogonal to each other,
The second processor
Receiving a plurality of signals from the magnetometer, each of the plurality of signals corresponding to one of the plurality of directions;
Decrypt each of the plurality of third data streams from the plurality of signals by detecting the sequence stream,
And to interleave the plurality of third data streams to determine the data. The method according to claim 1,
A first magnetic field sensor including the DNV sensor,
A second magnetic field sensor comprising a second DNV sensor, and
And a magnetic field configured to produce a magnetic field gradient from a first end of the magnetic region to a second end of the magnetic region, wherein the first magnetic field sensor and the second magnetic field sensor are smaller than the length of the magnetic region Position encoder component separated by distance
And wherein the magnetic detection system further comprises: 23. The system of claim 22, wherein the magnetic region comprises a ferromagnetic component having a cross-section at the first end of the magnetic region that is smaller than the cross-section at the second end of the magnetic region. 23. The method of claim 22, wherein the magnetic region comprises a magnetic polymer having a magnetic particle concentration at the first end of the magnetic region that is less than a magnetic particle concentration at the second end of the magnetic region. For the system. 23. The system of claim 22, further comprising a third magnetic field sensor and a fourth magnetic field sensor. 23. The system of claim 22, wherein the position encoder component is a rotational position encoder. 23. The system of claim 22, wherein the position encoder component is a linear position encoder. 23. The apparatus of claim 22, wherein the position encoder component further comprises a plurality of magnetic regions configured to generate a magnetic field gradient from the first end of the magnetic region to the second end of the magnetic region arranged at each end on the position encoder component A system for magnetic detection. 7. The system of claim 1, further comprising a sound transmitter configured to transmit acoustic signals through a fluid having dissolved ions, wherein the DNV sensor is configured to detect the acoustic signal through the fluid. 7. The system of claim 1, further comprising a sound transmitter configured to transmit acoustic signals through a fluid having dissolved ions, wherein the DNV sensor is configured to detect the acoustic signal through the fluid. The method according to claim 1,
A vehicle comprising the DNV sensor, the DNV sensor being configured to detect a magnetic vector or magnetic field;
One or more electronic processors,
Receiving the magnetic vector of the magnetic field from the DNV sensor,
One or more electronic processors configured to determine the presence of a current source based on the magnetic vector; And
A navigation controller configured to navigate the vehicle based on the presence of the current source and the magnetic vector
And wherein the magnetic detection system further comprises:

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