KR20170071024A - Eddy current probe apparatus for testing blade - Google Patents

Eddy current probe apparatus for testing blade Download PDF

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Publication number
KR20170071024A
KR20170071024A KR1020150178862A KR20150178862A KR20170071024A KR 20170071024 A KR20170071024 A KR 20170071024A KR 1020150178862 A KR1020150178862 A KR 1020150178862A KR 20150178862 A KR20150178862 A KR 20150178862A KR 20170071024 A KR20170071024 A KR 20170071024A
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KR
South Korea
Prior art keywords
probe holder
pair
probe
holder
upper body
Prior art date
Application number
KR1020150178862A
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Korean (ko)
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KR101771995B1 (en
Inventor
신기보
박상열
이영우
하태구
Original Assignee
한전케이피에스 주식회사
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Priority to KR1020150178862A priority Critical patent/KR101771995B1/en
Publication of KR20170071024A publication Critical patent/KR20170071024A/en
Application granted granted Critical
Publication of KR101771995B1 publication Critical patent/KR101771995B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

The present invention provides an eddy current probe device for blade inspection. The eddy-current probe device for inspecting a blade includes a probe holder portion on which a plurality of probes are installed on one end; An upper body installed at an upper end of the probe holder; A lower body portion hinged to a lower end of the probe holder portion; And a sliding movement guide installed on the upper and lower body parts and sliding along an outer surface of the object to be inspected positioned between the upper and lower body parts.

Description

[0001] EDDY CURRENT PROBE APPARATUS FOR TESTING BLADE [0002]

The present invention relates to an eddy current probe device for inspecting blades, and more particularly, to an eddy current probe device for inspecting blades, which is capable of obtaining a stable and reliable inspection result value by maintaining a constant position and a constant lift- ≪ / RTI >

Generally, a gas turbine compressor introduces air through an intake filter and flows into the compressor together with moisture, which is a minute corrosion component in the atmosphere.

This causes corrosion pits to adhere to the surface of the gas turbine blade.

Conventionally, by using the eddy current test probe, it is possible to improve the reliability and promptness of the test by evaluating the occurrence of the crack, quantitative evaluation of the progress and the crack at the inspection of the compressor blade.

In the eddy-current test, when an object (conductor) having relatively good electricity is placed in an alternating magnetic field, a current flows through the object. If the object has grooves or defects, the impedance changes depending on the transmittance and conductivity of the object, The presence or absence of defects in the object is inspected.

In the case of conducting the ECT inspection, scanning is performed using a handheld pencil probe.

In such a case, since it is difficult to maintain a constant position and a lift-off, it causes problems such as a deterioration in the ability to detect a damaged portion defect and a decrease in reliability of collected data.

The lift-off is a distance between the object to be inspected and the surface probe, and a change-over period of the lift-off occurs due to the shaking of the probe in the front, back, left and right, and the shape of the blade.

In a conventional ECT test, a lift-off value is determined by the skill of a skilled worker.

Accordingly, conventionally, there is a problem that a defect is detected due to a difference in a defect signal due to a lift-off, and of course, an error occurs in the size and position of a defect.

Blade Inspection Apparatus and Inspection Method for Wind Turbine Generators (Patent Application No. 10-2012-0155269)

An object of the present invention is to provide an eddy current probe device for inspecting blades, more particularly, to a blade inspection method capable of obtaining a stable and reliable inspection result value by maintaining a constant position and a constant lift- And an eddy current probe device.

In a preferred embodiment, the present invention provides an eddy current probe device for blade inspection.

The eddy-current probe device for inspecting a blade includes a probe holder portion on which a plurality of probes are installed on one end; An upper body installed at an upper end of the probe holder; A lower body portion hinged to a lower end of the probe holder portion; And a sliding movement guide installed on the upper and lower body parts and sliding along an outer surface of the object to be inspected positioned between the upper and lower body parts.

And an elastic part is provided between the probe holder part and the upper body part.

Preferably, the resilient portion includes a spring holder and a pair of springs fitted to an upper end of the spring holder.

The lower end of the spring holder may protrude downward from the probe holder.

The upper ends of the pair of springs are preferably elastically supported on the inner upper ends of the upper body portions.

It is preferable that the probe holder portion is formed with a through hole penetrating the probe holder portion.

Preferably, the spring holder includes an upper body having a fitting groove portion into which the pair of springs are inserted, and a lower body extending stepwise from the lower end of the upper body.

The lower body is preferably disposed to pass through the through hole.

Preferably, a curved surface portion forming a convex curved surface is formed on the lower end of the one end side of the probe holder portion.

The lower body part includes a hinge plate disposed at a lower portion of the probe holder and formed in a plate shape, a hinge end formed at one end of the push plate, hinged to a lower end of the one end of the probe holder, And an elastic spring for elastically supporting the lower end and the pressing plate.

Preferably, the sliding movement guide includes a pair of first guide rollers rotatably installed at one end of the probe holder.

Preferably, the sliding guide includes a second guide roller rotatably mounted on an extension extending to one end of the pressing plate.

The pair of first guide rollers and the second guide rollers are preferably disposed to face each other with an interval therebetween so as to form the same first rotational axis.

Preferably, the extending portions extend in pairs at both ends of the one end of the pressing plate.

Preferably, a support member is disposed between the pair of extending portions, and the second guide roller is supported to form the first rotation axis.

The supporting member may be provided to form a second rotation axis line that is orthogonal to the first rotation axis line and guides the up-down rotation of the pair of extension parts.

The pair of first guide rollers and the second guide rollers are preferably made of an elastic material.

The present invention relates to an eddy current probe device for inspecting blades, and more particularly, to an eddy current probe device for inspecting blades, and more particularly, it has an effect of obtaining a stable and reliable inspection result value by maintaining a constant position and a constant lift-off value.

In addition, the present invention does not require replacement of the probe holder guide according to the inspection site in the conventional blade inspection, and it is possible to constitute one inspecting type inspecting type, It has an effect of solving the problem.

Further, the present invention can maintain a constant change in the lift-off value due to the geometric shape change of the blade and the thickness variation, and enables accurate data acquisition at a constant and precise position at all times even when a novice is scanning , It is possible to secure the reliability of the inspection result.

1 is an assembled perspective view showing an eddy current probe device for blade inspection according to the present invention.
2 is an exploded perspective view showing an eddy current probe device for blade inspection according to the present invention.
3 is a side view showing an eddy current probe device for blade inspection according to the present invention.
4 is a perspective view showing the eddy current probe device for blade inspection according to the present invention.

Hereinafter, an eddy current probe device for blade inspection according to the present invention will be described with reference to the accompanying drawings.

FIG. 1 is an exploded perspective view showing an eddy current probe apparatus for inspecting a blade of the present invention, FIG. 2 is an exploded perspective view showing an eddy current probe apparatus for inspecting a blade of the present invention, FIG. 3 is a cross- Side view.

The configuration of the eddy current probe device for blade inspection of the present invention will be described with reference to Figs. 1 to 3. Fig.

The eddy-current probe device for inspecting a blade includes a probe holder 100, an upper body part 200, a lower body part 300, and a sliding movement guide part 400.

Each of the above configurations will be described.

The probe holder unit 100 according to the present invention will be described.

The probe holder unit 100 includes a body having an upper opening and a receiving space 101 formed therein.

Three probe sensors 10 are provided on the other end or the rear end of the probe holder 100.

At the other end of the probe holder 100, three mounting holes 102 are formed.

Each of the three probe sensors 10 is fitted into the mounting holes 102 such that a part of the probe sensor 10 is located in the receiving space 101 at the other end of the probe holder 100.

Of course, the number of the probe sensors 10 is not limited to three, but may be more or less.

In addition, the probe holder 100 has a through hole (not shown).

The upper body portion 200 according to the present invention will be described.

The upper body part 200 is disposed on the upper part of the probe holder part 100.

The upper body part 200 is disposed at the upper end of the probe holder part 100 and is coupled to the probe holder part 100 through a plurality of coupling bolts 210.

Therefore, the receiving space 101 formed in the probe holder 100 is covered by the coupling of the upper body 200.

Here, the elastic part 110 is provided between the probe holder part 100 and the upper body part 200.

The elastic part 110 is composed of a spring holder 111 and a pair of springs 112 fitted in the upper end of the spring holder 111.

The pair of springs 112 may be coil springs.

The spring holder 111 includes an upper body 111a and a lower body 111b extending from the lower end of the upper body 111a and extending stepwise to have an area smaller than the area of the upper body 111a .

The upper body 111a is formed with a fitting groove portion 111c through which the lower ends of the pair of springs 112 are fitted and fixed. The fitting groove portion 111c may be formed as a respective groove so that the lower end of each spring 112 is fitted.

The lower end body 111b may be disposed to penetrate through the through holes formed in the probe holder unit 111 through the upper and lower portions.

At this time, a stepped portion formed between the upper and lower bodies 111a and 111b may extend over the peripheral region of the through hole.

At the same time, the upper ends of the pair of springs 112 fixed to the spring holder 111 can be supported and fixed to the inner upper end surface of the upper body portion 200.

Accordingly, the above-described spring holder 111 can be vertically and elastically flown by the elasticity of the pair of springs 112.

The lower body portion 300 according to the present invention will be described.

The lower body part 300 is disposed below the probe holder part 100.

At the lower end of the one end of the probe holder 100, a curved surface portion 100a forming a convex curved surface is preferably formed.

The lower body part 300 is disposed at a lower portion of the probe holder part 100 and includes a plate-shaped pushing plate 310 and a probe holder part 100 formed at one end of the pushing plate 310, And a resilient spring 330 elastically supporting the lower end of the probe holder 100 and the pressing plate 310. The hinge unit 320 is hinged to the lower end of one end of the probe holder 100,

The elastic spring 330 uses a torsion spring and elastically supports the lower end of the probe holder unit 100 and the pressing plate 310 by one end and the other end of the elastic spring 330, . That is, it can act as a claw.

Next, the sliding movement guide unit 400 according to the present invention will be described.

The sliding movement guide part 400 is installed on the upper body part 200 and the lower body part 300 and is disposed between the upper body part 200 and the lower body part 300, (See Fig. 4).

The sliding movement guide 400 according to the present invention includes a pair of first guide rollers 410 and a second guide roller 420.

The pair of first guide rollers 410 are rotatably installed at one end of the probe holder 100.

The second guide roller 420 is rotatably installed on an extension 340 extending to one end of the push plate 310.

Particularly, the pair of first guide rollers 410 and the second guide rollers 420 are disposed to face each other with an interval therebetween so as to form the same first rotational axis (1).

Each of the pair of first guide rollers 410 forms a first rotation axis line 1 through a first rotation axis 411 and the first rotation axis 411 is a rotation hole formed in the probe holder 100. [ (H).

4, when the probe 1 is placed in such a manner as to grip the edge portion of the object to be inspected 1 on the plate, that is, between the probe holder 100 and the lower body 300, The probe holder portion 100 and the upper and lower body portions 200 and 300 are rotated by the first and second guide rollers 410 and 420 along the surface of the object 1 to be inspected Can be moved.

In addition, referring to FIG. 2, the extending portions 340 extend in pairs at both ends of the one end of the pressing plate.

A support member 430 is disposed between the pair of extensions 340 so that the second guide roller 420 forms the first rotation axis?.

The support member 430 is installed on the pair of extending portions 340 so as to form a second rotation axis line 2 that is orthogonal to the first rotation axis line 1 and guides the up and down rotation.

Therefore, the support member 430 can rotate the second guide roller 420 up and down while the second guide roller 420 rotates and supports the second guide roller 420.

Here, the second guide roller 420 forms the second rotation axis line (2) by the second rotation axis 421. The second rotation shaft 421 is rotatably supported at one end of the extension 340.

A pair of auxiliary rotation shafts 431 are provided at both ends of the support member 430 and each of the auxiliary rotation shafts 431 is rotatably supported at both ends of the extended portion 340.

Therefore, the support member 430 can rotate up and down with the auxiliary rotation axis 431 as a rotation center.

The operation of the eddy current probe apparatus for blade inspection of the present invention having the above-described structure will be described.

INDUSTRIAL APPLICABILITY The eddy current probe device for blade inspection of the present invention is easily applicable to all gas turbine blades having a thickness less than or equal to a certain thickness and geometry.

The probe unit 100 according to the present invention is configured such that the inspected object 10 is inspected by the elastic member 330 located at the lower body 300 and the pair of springs 111 inserted into the spring holder 112, And the probe sensors 10 and the coils 10 are perpendicular to each other and can maintain a constant lift-off value.

The probe holder 100 is provided with a lower end of a spring holder 111 which elastically protrudes to the lower portion of the probe holder 100 when the probe and the probe holder 100 are in contact with each other, , So that the inspection position can always be compensated to be constant.

In addition, according to the present invention, the pair of first guide rollers 410 and the second guide rollers 420 are brought into rolling contact on both sides of the blade contact surface, thereby minimizing the sliding disturbance due to the surface condition and abrasion of the contact surface.

In addition, when the edge of the blade with frequent and frequent occurrence of defects is subjected to an eddy current test, the surface of the leading edge, the trailing edge, and the tip portion and the coil are perpendicular to each other using the probe device of the present invention, And is brought into contact with the surface with a constant force by the elasticity of the spring inserted into the holder portion.

At this time, the probe portion and the probe sensors are perpendicular to each other by a pair of springs inserted into the proximal body portion, the elastic body located at the lower body portion, and the spring holder, off value can be maintained.

The pair of first guide rollers 410 and the pair of second guide rollers 420 are arranged in the form of a cloud along the surface of the object to be inspected 10 when the contact surface is scanned at a constant speed after the object is contacted with the object to be inspected. It is possible to reduce the coefficient of friction generated during the movement and to obtain an accurate and constant signal.

Accordingly, in the present invention, the pair of first guide rollers 410 and the second guide rollers 420 may be formed of an elastic material.

As described above, the eddy current probe device for blade inspection according to the present invention has been described above. However, it is apparent that various modifications are possible within the scope of the present invention.

Therefore, the scope of the present invention should not be limited to the above-described embodiments, but should be determined by the scope of the appended claims and equivalents thereof.

It is to be understood that the foregoing embodiments are illustrative and not restrictive in all respects and that the scope of the present invention is indicated by the appended claims rather than the foregoing description, It is intended that all changes and modifications derived from the equivalent concept be included within the scope of the present invention.

100: probe holder part
100a:
101: reception space
102: Installation hole
110:
111: Spring holder
111a: upper body
111b: lower body
112: spring
200: upper body part
210: coupling bolt
300: Lower body part
310: pressing plate
320: Hinged end
330: Elastic spring
340: Extension
400: Sliding movement guide part
410: first guide roller
420: second guide roller
430: support member
1: First rotation axis line
2: the second rotation axis line

Claims (10)

A probe holder portion on which a plurality of probes are installed on the other end side;
An upper body installed at an upper end of the probe holder;
A lower body portion hinged to a lower end of the probe holder portion; And
And a sliding movement guide portion provided on the upper body portion and the lower body portion and slidably moving along an outer surface of the object to be inspected positioned between the upper body portion and the lower body portion, Probe device.
The method according to claim 1,
Wherein an elastic portion is provided between the probe holder portion and the upper body portion,
Wherein the resilient portion includes a spring holder and a pair of springs fitted to an upper end of the spring holder,
A lower end of the spring holder protrudes downward from the probe holder,
And the upper ends of the pair of springs are resiliently supported on an inner upper end of the upper body part.
The method of claim 3,
The probe holder portion is provided with a through hole penetrating the probe holder portion,
The spring holder
And a lower body extending stepwise from a lower end of the upper body, wherein the upper body has a fitting groove portion into which the pair of springs are inserted,
Wherein the lower end body is disposed to penetrate through the through hole.
3. The method of claim 2,
And the probe holder portion is provided at the lower end of the one-
Wherein a curved surface portion which forms a convex curved surface upward is formed on the curved surface portion of the eddy current probe.
The method according to claim 1,
The lower body portion,
A pressing plate disposed at a lower portion of the probe holder,
A hinge unit formed at one end of the push plate and hinged to a lower end of the one end of the probe holder unit,
And an elastic spring for elastically supporting the lower end of the one end of the probe holder and the pressing plate.
6. The method of claim 5,
The sliding movement guide unit includes:
And a pair of first guide rollers installed to be rotatable on one end of the probe holder part.
The method according to claim 6,
Wherein the sliding guide comprises:
And a second guide roller rotatably installed on an extension portion extending to one end of the push plate.
8. The method of claim 7,
Wherein the pair of first guide rollers and the second guide rollers are disposed to face each other with an interval therebetween so as to form the same first rotational axis.
9. The method of claim 8,
The extension
A pair of pressing plates extending from both ends of the one end of the pressing plate,
Wherein a support member, in which the second guide roller is supported to form the first rotation axis, is disposed between the pair of extensions,
Wherein the support member comprises:
Wherein the pair of extension portions are provided to form a second rotation axis line that is orthogonal to the first rotation axis and guides the up and down rotation.
The method according to claim 6,
Wherein the pair of first guide rollers and the second guide rollers,
Wherein the eddy current probe is formed of an elastic material.
KR1020150178862A 2015-12-15 2015-12-15 Eddy current probe apparatus for testing blade KR101771995B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020150178862A KR101771995B1 (en) 2015-12-15 2015-12-15 Eddy current probe apparatus for testing blade

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020150178862A KR101771995B1 (en) 2015-12-15 2015-12-15 Eddy current probe apparatus for testing blade

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KR20170071024A true KR20170071024A (en) 2017-06-23
KR101771995B1 KR101771995B1 (en) 2017-08-28

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KR102269689B1 (en) * 2021-04-27 2021-06-24 성연우 Probe assembly for electronic component inspection that is easy to maintain and electronic component inspection device using the same

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JP5024936B2 (en) 2007-01-22 2012-09-12 日本碍子株式会社 Inspection method for graphite-containing ceramic containers
JP5171535B2 (en) 2007-12-14 2013-03-27 Ｎｔｎ株式会社 Load detection device and load detection method

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