KR20160116522A - Low pressure process equipment with arc plasma reactor - Google Patents
Low pressure process equipment with arc plasma reactor Download PDFInfo
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- KR20160116522A KR20160116522A KR1020150044357A KR20150044357A KR20160116522A KR 20160116522 A KR20160116522 A KR 20160116522A KR 1020150044357 A KR1020150044357 A KR 1020150044357A KR 20150044357 A KR20150044357 A KR 20150044357A KR 20160116522 A KR20160116522 A KR 20160116522A
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- vacuum
- gas
- insulator
- space
- process chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02337—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment by exposure to a gas or vapour
- H01L21/0234—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment by exposure to a gas or vapour treatment by exposure to a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
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- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
The present invention relates to a low-pressure process facility comprising a process chamber and a vacuum pump, and more particularly to a low-pressure process facility for removing particulate byproducts from the purge and scrubbing process to prolong the life of parts associated with the vacuum .
In the manufacturing line of semiconductors, displays, and solar cells, a process chamber in which processes such as etching, deposition, and cleaning are performed is installed, and the process chamber is connected to a vacuum pump through a vacuum pipe to discharge the process gas. When the process chamber is a deposition chamber, a large amount of particle byproducts are generated in the deposition process. The by-products of the particles must be discharged outside the process chamber because they act as a cause of defects in the deposition film.
Therefore, purging, cleaning, and purging operations are sequentially performed after deposition. In this case, cleaning is a process of converting particulate byproducts remaining in the process chamber into gaseous substances and discharging them even after purging with fluorine gas (F, F 2 ). For example, when a silicon oxide film (SiO 2 ) is deposited using TEOS [Si (OC 2 H 5 ) 4 ] and oxygen (O 2 ), SiO 2 particle byproducts are generated. The cleaning process converts the SiO 2 particle byproducts into SiF 4 gas and O 2 gas using fluorine (F, F 2 ) radicals.
The fluorine radicals required for the cleaning process are obtained by decomposing NF 3 , CF 4 , CHF 3 , C 2 F 6 , and C 3 H 8 into plasma. For this purpose, a glow discharge generated by microwave or high frequency (RF) . The plasma-assisted cleaning process efficiently exhausts residual particle byproducts from the post-purge process chamber, but most of the particle by-products discharged from the purge and clean process accumulate inside the vacuum line and the vacuum pump.
Especially, vacuum piping is equipped with various sensors for monitoring pressure and gas components and various valves for controlling the pressure. As time passes, particle byproducts accumulate in the sensor and the valve, causing malfunction thereof. In addition, particle byproducts accumulated in the vacuum pump are the main causes of degrading the life of the vacuum pump. Therefore, measures for preventing the malfunction of the vacuum parts and prolonging the service life thereof are required.
The present invention relates to a low pressure process equipment comprising a process chamber and a vacuum pump, wherein the byproducts of the particles discharged from the purging and cleaning process are disassembled and removed to prevent accumulation of particulate byproducts in the vacuum components, To provide a low-pressure process facility that can extend the service life.
The low pressure process equipment according to an embodiment of the present invention includes a process chamber in which at least one of etching, vapor deposition, and cleaning is performed; A vacuum pump connected to the process chamber through a vacuum line to discharge the process gas used in the process chamber; Vacuum components installed in the vacuum piping and including a sensor for monitoring the vacuum piping and a valve for controlling the pressure; And an arc plasma reactor installed between the process chamber and the vacuum components in the vacuum tube for spraying the plasma jet into the vacuum tube to clean particles byproducts discharged from the process chamber.
The sensor may comprise a first sensor for sensing the pressure of the vacuum line and a second sensor for sensing the gas component, and the valve may be located downstream of the sensor.
The arc plasma reactor includes a ground electrode forming a reaction space therein and connected to a vacuum pipe; A driving electrode having a pointed tip exposed in a reaction space; A power supply unit connected to the driving electrode and configured by an AC power source or a DC power source with a frequency of several tens kHz; And an insulator which insulates the driving electrode from the ground electrode and forms a gas injection port upstream of the front end portion.
The reaction space may include a first space immediately adjacent to the interior of the vacuum tube and a second space formed with a diameter larger than the first space and surrounding the front end. The insulator may include a first insulator and a second insulator that cover the surface of the driving electrode except for the tip portion.
The first insulator may be located closer to the tip than the second insulator, may be surrounded by the ground electrode in the second space, and may be made of ceramic. The insulator may include a third insulator that surrounds the second insulator and forms a third space that extends from the second insulator to the second insulator. The gas inlet may be formed in the third insulator and may lead to the third space.
The gas inlet may be connected to the gas supply part to receive a mixture of the discharge gas and the cleaning gas from the gas supply part. On the other hand, the gas inlet formed in the third insulator may be a first inlet for injecting a discharge gas, and the ground electrode may form a second inlet for injecting a cleaning gas downstream of the front end. The first inlet port and the second inlet port are connected to the gas supply section to receive the discharge gas and the cleaning gas from the gas supply section, respectively.
The low-pressure process equipment of this embodiment can prevent the malfunction of vacuum components due to particle byproducts and extend the service life of the vacuum components and the vacuum pump by installing an arc plasma reactor in the vacuum piping. In addition, the arc plasma reactor is capable of lowering the manufacturing cost and operating cost of the low-pressure process equipment because it has the same cleaning function as the known glow plasma reactor but has a lower power price and lower part cost.
1 is a block diagram of a low-pressure process facility according to an embodiment of the present invention.
2 is a cross-sectional view of an arc plasma reactor according to a first embodiment of the present invention.
3 is a cross-sectional view of an arc plasma reactor according to a second embodiment of the present invention.
Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings, which will be readily apparent to those skilled in the art to which the present invention pertains. The present invention may be embodied in many different forms and is not limited to the embodiments described herein.
1 is a block diagram of a low-pressure process facility according to an embodiment of the present invention. The low-pressure process equipment of FIG. 1 may be a process equipment included in a manufacturing line of semiconductor, display, solar battery, and the like.
1, the low-
The
The
Although FIG. 1 shows two
When the
Accordingly, the post-purge cleaning process is performed to convert the particulate byproducts remaining in the
SiO 2 (s) + 4F ( g) -> SiF 4 (g) + O 2 (g) or SiO 2 (s) + 2F 2 (g) -> SiF 4 (g) + O 2 (g)
The fluorine radicals required for the cleaning process are obtained by decomposing NF 3 , CF 4 , CHF 3 , C 2 F 6 , C 3 H 8 and the like into plasma. The plasma cleaning process is effective for the removal of particulate byproducts remaining in the
The low
Particles of byproducts discharged from the
Known glow plasma reactors use expensive microwave or high frequency power sources and require a significant amount of ceramic as a dielectric. On the other hand, since the
Therefore, the
Next, the detailed structure of the
2 is a cross-sectional view of an arc plasma reactor according to a first embodiment of the present invention.
1 and 2, the
The
The
The driving
The
The
The
The
Specifically, the cleaning gas may include at least one of NF 3 , SF 6 , CF 4 , CHF 3 , and C 2 F 6 , and a cleaning gas (CF 4 , CHF 3 , C 2 F 6 ) is used, the
The discharge gas and the cleaning gas simultaneously injected into the
The cleaning principle of the
The
3 is a cross-sectional view of an arc plasma reactor according to a second embodiment of the present invention.
Referring to FIG. 3, the
The
The
Since the
As described above, the low-
While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, Of course.
100: Low pressure process facility 10: Process chamber
20: Vacuum piping 30: Vacuum pump
40:
45:
51: Plasma jet 52: Reaction space
53: ground electrode 54: driving electrode
55: power supply unit 56: gas inlet
57: insulator 58: gas supply part
Claims (8)
A vacuum pump connected to the process chamber through a vacuum line to discharge the process gas used in the process chamber;
Vacuum components installed in the vacuum piping, the vacuum components including a sensor for monitoring the vacuum piping and a valve for controlling the pressure; And
An arc plasma reactor installed between the process chamber and the vacuum components of the vacuum tube for spraying a plasma jet into the vacuum tube to clean particles byproducts discharged from the process chamber;
Low pressure process equipment.
Wherein the sensor includes a first sensor for sensing the pressure of the vacuum tube and a second sensor for sensing gas components,
Wherein the valve is located downstream of the sensor.
The arc plasma reactor comprises:
A ground electrode connected to the vacuum pipe to form a reaction space therein;
A driving electrode having a pointed tip exposed in the reaction space;
A power unit connected to the driving electrode and configured by an AC power source or a DC power source having a frequency of several tens of kHz; And
An insulator which insulates the driving electrode from the ground electrode and forms a gas inlet at an upstream of the front end,
Low pressure process equipment.
Wherein the reaction space includes a first space immediately adjacent to the inside of the vacuum tube and a second space formed with a diameter larger than the first space and surrounding the front end,
Wherein the insulator includes a first insulator and a second insulator which cover the surface of the driving electrode except for the tip end.
Wherein the first insulator is located closer to the tip than the second insulator and is surrounded by the ground electrode in the second space and is made of ceramic.
Wherein the insulator includes a third insulator which surrounds the second insulator and forms a third space between the second insulator and the second space,
And the gas inlet is formed in the third insulator and connected to the third space.
Wherein the gas injection port is connected to the gas supply part and is supplied with a mixture of the discharge gas and the cleaning gas from the gas supply part.
Wherein the gas injection port formed in the third insulator is a first injection port for injecting a discharge gas and the ground electrode forms a second injection port for injecting a cleaning gas downstream of the tip,
Wherein the first injection port and the second injection port are connected to the gas supply unit to supply a discharge gas and a cleaning gas from the gas supply unit, respectively.
Priority Applications (1)
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KR1020150044357A KR101703993B1 (en) | 2015-03-30 | 2015-03-30 | Low pressure process equipment with arc plasma reactor |
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KR1020150044357A KR101703993B1 (en) | 2015-03-30 | 2015-03-30 | Low pressure process equipment with arc plasma reactor |
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KR20160116522A true KR20160116522A (en) | 2016-10-10 |
KR101703993B1 KR101703993B1 (en) | 2017-02-08 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110863989A (en) * | 2018-08-28 | 2020-03-06 | 韩国机械研究院 | Vacuum pump system with remote plasma device |
CN113042461A (en) * | 2019-12-27 | 2021-06-29 | 韩国机械研究院 | Plasma cleaning device and semiconductor processing apparatus having the same |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102078584B1 (en) | 2017-12-28 | 2020-02-19 | (주) 엔피홀딩스 | Exhaust fluid treatment apparatus and substrate treatment system |
KR102054411B1 (en) | 2017-12-28 | 2019-12-10 | (주) 엔피홀딩스 | Exhaust fluid treatment apparatus and substrate treatment system |
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KR20040079098A (en) * | 2003-03-06 | 2004-09-14 | 주식회사 테라텍 | Apparatus for cleaning exhaust portion of chemical reaction chamber |
KR20070118419A (en) * | 2006-06-12 | 2007-12-17 | 주식회사 테라텍 | Apparatus for cleaning exhaust portion and vacuum pump of the semiconductor and lcd process reaction chamber |
JP2010027836A (en) * | 2008-07-18 | 2010-02-04 | Panasonic Corp | Plasma treatment apparatus |
KR20130024028A (en) * | 2011-08-30 | 2013-03-08 | 한국기계연구원 | Remote plasma device for the improvement of vacuum pump lifetime |
-
2015
- 2015-03-30 KR KR1020150044357A patent/KR101703993B1/en active IP Right Grant
Patent Citations (4)
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KR20040079098A (en) * | 2003-03-06 | 2004-09-14 | 주식회사 테라텍 | Apparatus for cleaning exhaust portion of chemical reaction chamber |
KR20070118419A (en) * | 2006-06-12 | 2007-12-17 | 주식회사 테라텍 | Apparatus for cleaning exhaust portion and vacuum pump of the semiconductor and lcd process reaction chamber |
JP2010027836A (en) * | 2008-07-18 | 2010-02-04 | Panasonic Corp | Plasma treatment apparatus |
KR20130024028A (en) * | 2011-08-30 | 2013-03-08 | 한국기계연구원 | Remote plasma device for the improvement of vacuum pump lifetime |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN110863989A (en) * | 2018-08-28 | 2020-03-06 | 韩国机械研究院 | Vacuum pump system with remote plasma device |
KR20200024581A (en) * | 2018-08-28 | 2020-03-09 | 한국기계연구원 | Vacuum pump system with remote plasma device |
CN113042461A (en) * | 2019-12-27 | 2021-06-29 | 韩国机械研究院 | Plasma cleaning device and semiconductor processing apparatus having the same |
CN113042461B (en) * | 2019-12-27 | 2023-03-10 | 韩国机械研究院 | Plasma cleaning device and semiconductor processing apparatus having the same |
US11643722B2 (en) | 2019-12-27 | 2023-05-09 | Korea Institute Of Machinery & Materials | Plasma cleaning apparatus and semiconductor process equipment with the same |
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