KR20150098035A - Device for estimating three-dimensional shape of object and method thereof - Google Patents

Abstract

The present invention relates to a device for calculating a three-dimensional shape of an object and a method thereof. The present invention provides a device for calculating a three-dimensional shape of an object and a method thereof, which can increase an operation area capable of measuring a three-dimensional depth of the object and enables a depth resolution to be uniformly distributed in the operation area.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to an apparatus and a method for calculating a three-

The present invention relates to an apparatus for calculating a three-dimensional shape of an object, and more particularly to an apparatus and a method for calculating a three-dimensional shape of an object using structured light.

In recent years, attempts have been made to realize a three-dimensional image by reflecting the shape of an actual object in image formation of an object such as a human being or other objects.

A method using two or more visible light images and a method using infrared light using an active light source have been proposed in connection with a method of implementing a three-dimensional shape image of an object.

According to the conventional stereoscopic vision method, a disparity occurs due to a distance between two sensors of the left eye and right eye images, Information.

In the case of a structured light system, 3D depth information is calculated using a method of converting a camera in a stereovision system into an illumination system that projects a shape already known. Through this, the structural optical system calculates depth information in all regions where the structural light is captured.

In such a conventional structured optical system, the depth resolution depending on the distance varies according to a predetermined baseline, and the depth resolution for calculating the three-dimensional depth information of the object along the distance from the object is set to a desired level There is a problem that it can not be secured.

An object of the present invention is to provide an apparatus for calculating a three-dimensional shape of an object, which increases an operation region capable of measuring the three-dimensional depth of an object, and calculates a three-dimensional shape of the object capable of uniformly distributing the depth resolution in the operation region And to provide a method and an apparatus for performing the method.

The technical objects to be achieved by the present invention are not limited to the technical matters mentioned above, and other technical subjects which are not mentioned can be clearly understood by those skilled in the art from the following description. There will be.

An apparatus for calculating a three-dimensional shape of an object according to an aspect of the present invention includes a first projector for projecting a first structured light with a first pattern to an object, a second structure light A second projector for projecting the first structured light and the second structured light reflected from the object, and a sensor for sensing the first structured light and the second structured light reflected from the object, Wherein the distance between the first projector and the sensor is different from the distance between the second projector and the sensor, and wherein the distance between the first projector and the sensor is different from the distance between the second projector and the sensor .

Wherein the reference image is reflected on a reference surface at a predetermined distance from an apparatus for calculating the three-dimensional shape of the object, so that each structured light projected from the first projector and the second projector is an image sensed by the sensor .

Wherein the control unit selects one projector in accordance with the depth resolution in the set area when a predetermined distance from the apparatus for calculating the three-dimensional shape of the object is set, And calculating the three-dimensional depth of the object.

The controller may select one projector according to the depth resolution in the region where the object is sensed and calculate the three-dimensional depth of the object using the selected projector.

The control unit may include calculating the three-dimensional depth of the object by alternately using the first projector and the second projector at predetermined time intervals.

The first projector and the second projector may include adjusting the amount of light to be projected according to a distance from the sensor.

The first projector and the second projector may include adjusting at least one of a size or an interval of the pattern constituting the first pattern and the second pattern according to a distance between the first projector and the second projector.

The apparatus for calculating the three-dimensional shape of the object may further include at least one projector positioned on the basis of the sensor, the distance to the first projector and the distance to the second projector being different from each other.

According to another aspect of the present invention, there is provided a method of calculating a three-dimensional shape of an object, including the steps of projecting first structure light added with a first pattern onto an object, Projecting the second structured light with the pattern added thereto onto the object, sensing the first structured light reflected by the object and the second structured light, and comparing the first structured light and the second structured light reflected from the object with the predetermined reference image, And calculating the three-dimensional depth of the object according to a change in the pattern in at least one image of the structured light and the second structured light.

According to the present invention, in an apparatus for calculating three-dimensional shape of an object, it is possible to increase an operation region capable of measuring the three-dimensional depth of an object and distribute the depth resolution evenly in the operation region.

Further, according to the present invention, more accurate three-dimensional depth can be calculated by adjusting the light amount of the projector in accordance with the distance from the sensor based on the sensor.

Further, according to the present invention, a more accurate three-dimensional depth can be calculated by adjusting either the size or the interval of the pattern constituting the pattern added to the structured light projected from the projector according to the distance from the sensor on the basis of the sensor can do.

Further, according to the present invention, a more accurate three-dimensional depth can be calculated by using a projector having a depth resolution best suited to the area set by the user.

Further, according to the present invention, a more accurate three-dimensional depth can be calculated by using a projector having a depth resolution best suited to an area where an object is sensed.

1 is a block diagram of an apparatus for calculating a three-dimensional shape of an object according to an embodiment of the present invention.
2 is a flowchart of a method for calculating a three-dimensional shape of an object according to an embodiment of the present invention.
3 to 6 are diagrams for explaining calculation of a three-dimensional shape of an object according to an embodiment of the present invention.
FIG. 7 is a block diagram showing a configuration in which a plurality of projectors are included in an apparatus for calculating a three-dimensional shape of an object according to an exemplary embodiment of the present invention.

The above objects, features and advantages of the present invention will become more apparent from the following detailed description taken in conjunction with the accompanying drawings. It is to be understood, however, that the invention is not limited to the disclosed embodiments, but, on the contrary, is intended to cover various modifications and similarities. Like reference numerals designate like elements throughout the specification. In the following description, well-known functions or constructions are not described in detail since they would obscure the invention in unnecessary detail. In addition, numerals (e.g., first, second, etc.) used in the description of the present invention are merely an identifier for distinguishing one component from another.

1 is a block diagram of an apparatus for calculating a three-dimensional shape of an object according to an embodiment of the present invention.

The apparatus 100 for calculating the three-dimensional shape of the object may include a projector 110_1 or 110_2, a sensor 130, a controller 150, a memory 170, or the like. The apparatus 100 for calculating the three-dimensional shape of the object may be implemented in a form having additional components other than the components shown in FIG.

Hereinafter, the components will be described in order.

The projectors 110_1 and 110_2 can project structured light on an object for the purpose of three-dimensional depth measurement. Projecting light can mean emitting light for a particular object. An arbitrary pattern may be added to the structured light.

According to one example, the light may be infrared. However, the present invention is not limited thereto, and may mean at least one of visible light, infrared light, ultraviolet light, and radiation.

The projectors 110_1 and 110_2 may include a diffracting optical element (DOE) or the like in which a light source emitting light and a light emitted from a light source are incident to add an arbitrary pattern. However, the present invention is not limited thereto, and the projectors 110_1 and 110_2 may include other known structures as long as they can add a pattern to the light and project it.

According to an example, the arbitrary pattern may be a pattern in which spots of a predetermined size are randomly arranged without any rules. However, the present invention is not limited to this, and other patterns that can be used for three-dimensional depth measurement can be applied to the patterns constituting the arbitrary pattern.

The sensor 130 senses the structured light projected and reflected on the object, converts the sensed pattern of the structured light into an electrical image signal. In the case of conversion into the video signal, the sensor 130 can process the data in units of frames. The sensor 130 may output the converted video signal to the controller 150. [

The sensor 130 is not limited to the term, and any sensor may be used as long as it can detect the pattern of the structured light projected into the object, convert the image into an electrical image signal.

The control unit 150 may measure a change in the pattern from the pattern of the structured light image imaged by the sensor 130. The control unit 150 may measure a change in the pattern of the structured light projected on the object and based on the image of the pattern of the projected structured light with respect to an arbitrary reference plane.

The control unit 150 may calculate the three-dimensional depth of the object from the change in the measured structural light pattern. The control unit 150 may calculate the three-dimensional shape of the object. The control unit 150 may calculate the three-dimensional shape of the object based on the triangulation technique using the change of the structured light pattern, the positions of the projectors 110_1 and 110_2, and the position of the sensor 130. [

However, the present invention is not limited to this, and any known method can be applied as long as the three-dimensional shape of the object can be calculated from the change of the structured light pattern.

The memory 170 may store a program for the controller 150 to calculate the three-dimensional shape of the object. In addition, the memory 170 may store an image of the structured light pattern for the reference plane. In addition, the memory 170 may store the image signal for the converted structured light pattern from the sensor 130. [

The memory 170 may be a flash memory type, a hard disk type, a multimedia card micro type, a card type memory (e.g., SD or XD memory), a RAM At least one of a random access memory (RAM), a static random access memory (SRAM), a read-only memory (ROM), an electrically erasable programmable read-only memory (EEPROM), a programmable read- Type storage medium.

In the implementation of the apparatus 100 for computing the three-dimensional shape of the object of FIG. 1, embodiments such as procedures or functions may be implemented with separate software modules that perform at least one function or operation. The software code may be implemented by a software application written in a suitable programming language. Further, the software codes may be stored in the memory 170 and executed by the control unit 150. [

Hereinafter, embodiments of the present invention will be described.

2 is a flowchart of a method for calculating a three-dimensional shape of an object according to an embodiment of the present invention. 3 to 6 are diagrams for explaining calculation of a three-dimensional shape of an object according to an embodiment of the present invention.

A method for calculating a three-dimensional shape of an object according to an embodiment of the present invention may be implemented in an apparatus 100 for calculating a three-dimensional shape of an object described with reference to FIG. Hereinafter, a method of calculating a three-dimensional shape of an object according to an embodiment of the present invention and an operation of an apparatus 100 for calculating a three-dimensional shape of an object to implement the method will be described in detail with reference to necessary drawings .

Referring to FIG. 2, the controller 150 may project the first structured light having the first pattern added thereto through the first projector 110_1 onto the object (S100).

3 schematically illustrates the arrangement of the projectors 110-1 and 110_2 and the sensor 130 according to an embodiment of the present invention. As shown in FIG. 3, structured light can be projected from the first projector 110_1 to the object 200. FIG. In this case, the driving of the first projector 110_1 can be controlled by the control unit 150. [

2, the controller 150 controls the second projector 110_2 disposed at a position different from that of the first projector 110_1, which projects the first structured light, The structured light can be projected onto the object 200 (S110).

As shown in FIG. 3, the structured light can be projected from the second projector 110_2 to the object 200. FIG. In this case, the operation of the second projector 110_2 can be controlled by the control unit 150. [

Referring to FIG. 3, the first projector 110_1 and the second projector 110_2 may be disposed at different positions with respect to the sensor 130. The first projector 110_1 is closer to the sensor 130 and the second projector 110_2 is closer to the sensor 130 than to the case where only one projector 1 is used conventionally Can be placed far away. However, the present invention is not limited thereto, and the first projector 110_1 and the second projector 110_2 may have different distances based on the sensor.

In FIG. 3, the two projectors are located on the left side of the sensor 130, but the present invention is not limited thereto. That is, the two projectors may be positioned on the right side with respect to the sensor 130. Alternatively, the two projectors may be positioned one on the left and one on the right, respectively, with respect to the sensor 130. In this case, distances from the sensor 130 to the respective projectors may be different from each other.

In the case of the first pattern added to the first structured light and the second pattern added to the second structured light, the size and shape of the pattern constituting the pattern may not be limited to each other. The first pattern and the second pattern may be applied in different forms.

Referring to FIG. 2 again, the sensor 130 may sense the first structured light and the second structured light reflected by the object 200 (S120).

As shown in FIG. 3, the sensor 130 can detect the structured light projected on the object 200 from the first projector 110_1 and the second projector 110_2. The sensor 130 may image the detected pattern of the structured light, and transmit the pattern to the controller 150.

Referring again to FIG. 2, the controller 150 compares the three-dimensional depth of the object according to the change of the pattern in at least one of the sensed first structural light and the second structured light, Can be calculated [S130].

The predetermined reference image refers to a structure in which the structured light is projected from the first projector 110_1 and the second projector 110_2 with respect to an arbitrary reference plane and the structured light reflected from the reference plane is sensed by the sensor 130, It can mean one image.

To describe this in detail, FIG. 4 shows a method of measuring three-dimensional depth using structured light according to an example.

4, b means a baseline, which is the distance between the projector 10 and the lens 20 in the sensor 20, 50. The reference plane 30 refers to the reference plane for measuring the depth of a specific object. ZO corresponds to the distance between the device 100 for calculating the three-dimensional shape of the object and the reference plane 30, and can be predetermined.

f is the focal length and corresponds to the distance between the lens 20 in the sensor 20, 50 and the image plane 50 of the imaging device. The light projected from the projector 10 flows through the lens 20 and is converted into an electric image signal in the image pickup apparatus. The imaging device can be applied to any device capable of converting light such as a charge-coupled device (CCD) into a video signal.

Referring to FIG. 4, in order to obtain the reference image, the structured light is projected onto the reference surface 30, which is separated by a predetermined distance ZO from the projector 10. The projected structured light is reflected by the reference surface 30 and is detected by the sensors 20 and 50.

An image of the pattern of the structured light projected on the reference plane 30 becomes the reference image. In this case, the reference image may be generated in advance and stored in the memory 170.

In order to measure the three-dimensional depth of the object 40, structured light having the same pattern as that used when acquiring the reference image may be projected onto the object 40. In FIG. 4, the object 40 is shown as a single surface, but this is for convenience of explanation. In fact, the structured light will be projected on each surface of the object 40.

When the structured light reflected by the object 40 is acquired as an image by the sensors 20 and 50, the controller 150 measures the positional shifts of the corresponding patterns in the obtained image with reference to the reference image . The movement of the pattern corresponds to d in Fig. 4, which means disparity corresponding to k points of the object 40 with reference to the reference image.

According to an example, it can be seen that the relation of D / b = (ZO-ZK) / ZO, d / f = D / ZK is obtained by using the resemblance of triangle in FIG. The above two equations can be summarized as follows.

 As described above, in the above equation (1), f is a focal length, b is a base line, and ZO is a distance to the reference plane 30. Thus, if the parallax d for an arbitrary point k of the object 40 is measured in the acquired image, the 3D depth ZK, which is the distance to the object 40, can be calculated. By performing such an operation on the surface of the object 40, the three-dimensional shape of the object 40 can be calculated.

Referring again to FIG. 3, the control unit 150 controls the first projector 110_1 to irradiate the structured light projected from the first projector 110_1 with an image (reference image) of the first pattern reflected from the reference plane, Can be compared with each other. The control unit 150 may calculate the three-dimensional depth of the object 200 by measuring the movement of the reference image and the corresponding patterns in the first pattern image reflected by the object 200. [

Similarly, the control unit 150 can compare the second pattern image (reference image) reflected from the reference plane with the second pattern image reflected from the object 200 with respect to the structured light projected from the second projector 110_2. The control unit 150 may calculate the three-dimensional depth of the object 200 by measuring the positional shift of the corresponding pattern in the reference image and the second pattern image reflected by the object 200. [

Dimensional depth of the object 200 by projecting the structured light from each of the projectors 110_1 and 110_2, the controller 150 can calculate the three-dimensional depth using Equation (1). Hereinafter, the effects of calculating the three-dimensional depth using projectors having different positions from each other will be described with reference to Figs. 5A and 5B.

5A is a graph showing a relationship (curve PO) between the three-dimensional depth ZK of the object and the time difference d in the case of using only one projector (see the projector 1 in Fig. 3). The characteristic of the curve PO is determined by the predetermined values in the above equation (1).

First, the concept of depth resolution will be described. The depth resolution indicating the degree to which the three-dimensional depth is calculated can be understood as the number of pixels in the image plane 50 that can be expressed with respect to the unit length in the Z direction (see FIG. 4).

That is, when a sensor digitized by the sensor 130 for detecting structured light is used, the position shift value of the structured light pattern obtained by the image is represented by the number of pixels. Therefore, it can be said that as the same length in the Z direction is represented by a larger number of pixels, the depth resolution is larger.

From the curve PO, it can be seen that d = 0 when ZK = ZO. That is, when the object is at the distance ZO where the reference image was, d = 0 is displayed. This can be confirmed by substituting d = 0 in Equation (1).

Referring to the graph of FIG. 5A, it is meant that the object moves away from the reference plane toward the ZO point in the ZK axis. Conversely, the downward movement of the object with respect to the ZO point means that the object approaches the apparatus 100 that calculates the three-dimensional shape of the object.

In the region where ZK is larger than Z0, the slope of the curve PO gradually increases as the distance ZK becomes larger, so that the region A1 corresponding to the same d1 becomes larger. Therefore, the depth resolution described above is gradually reduced. As a result, the 3D shape of the object can not be calculated properly.

In the region where ZK is smaller than ZO, the slope of the curve PO gradually decreases as the distance ZK becomes smaller, so that the region B1 corresponding to the same d1 becomes smaller. Therefore, the depth resolution described above increases. This results in a larger value than the depth resolution required to calculate the three-dimensional shape of the object, resulting in unnecessary computation. This places unnecessary load on the system.

The fixed values of Equation 1, baseline b, focal length f, and distance ZO to the reference image can be predetermined when creating a device that computes the three-dimensional shape of the object. Accordingly, the characteristic of the curve PO is determined in advance. Therefore, the apparatus for calculating the three-dimensional shape of an object can operate at an appropriate depth resolution when an object exists at a distance adjacent to the ZO.

5B is a graph showing the relationship between the 3D depth ZK of the object and the time difference d when the first projector 110_1 and the second projector 110_2 are used according to an embodiment.

The curve PO is a curve as shown in Fig. 5A. The curve P 1 is a curve represented by a chain double-dashed line and can show characteristics of the second projector 110 _ 2. The curve P 2 is a curved line indicated by a dot-dash line, and can represent characteristics of the first projector 110 _ 1.

In the region where ZK is larger than ZO, according to the characteristic of the curve P1 in which the slope is smaller than the curve PO among the curves P1 and P2, the depth ZK represented by the same parallax d1 is reduced (decreased from A1 to A2) do.

Therefore, when the object is at a distance from the reference plane, the second projector 110_2 corresponding to the curve P1 can be used. As a result, the problem that the depth resolution decreases gradually as the distance ZK becomes larger can be solved.

In the region where ZK is smaller than ZO, according to the characteristic of the curve P2 having a larger slope than the curve PO among the curves P1 and P2, the depth ZK represented by the same parallax d1 is increased (increased from B1 to B2) do.

Therefore, when the object is closer to the reference plane, the first projector 110_1 corresponding to the curve P2 can be used. As a result, the smaller the distance ZK, the higher the depth resolution becomes, and the problem of performing unnecessary arithmetic operations can be solved.

That is, by using a suitable projector according to the position of the object, the depth resolution can be uniformly displayed over the entire distance from the apparatus 100 for calculating the three-dimensional shape of the object. Accordingly, it is possible to maintain an appropriate depth resolution regardless of the position of the object, and it is possible to reduce unnecessary operations.

FIG. 6 is a view for explaining the use of the first projector 110_1 and the second projector 110_2 according to the distance to the object, according to an embodiment of the present invention.

In FIG. 6 (a), the crossing method of the first projector 110_1 and the second projector 110_2 is shown with respect to the time axis.

The user can set an area at a predetermined distance from the apparatus 100 for calculating the three-dimensional shape of the object. According to one example, such a region may be defined according to purposes such as an application using the three-dimensional shape of the object to be calculated.

The controller 150 receives the set area and can select one projector having the most suitable depth resolution in the area. For example, when a region remote from the reference plane is set, the control unit 150 can select the second projector 110_2 having a good depth resolution at a long distance.

The control unit 150 may calculate the three-dimensional depth of the object 200 using the selected projector. In this case, as shown in FIG. 6A, the second projector 110_2 is used based on the selection time point t1 of the second projector 110_2, and the first projector 110_1 may not be used.

According to another example, the controller 150 can detect the object 200 and select one projector having the most suitable depth resolution in the region where the object 200 is sensed. For example, when the object 200 is detected at a distance from the reference plane, the controller 150 can select the second projector 110_2 having a good depth resolution at a long distance.

In this case, the control unit 150 may determine whether or not the object is detected. However, the present invention is not limited to this, and the apparatus 100 for calculating the three-dimensional shape of the object may have a separate structure for determining that the object is detected.

The control unit 150 may calculate the three-dimensional depth of the object 200 sensed using the selected projector. In this case, as shown in FIG. 6A, the second projector 110_2 is used based on the selection time point t1 of the second projector 110_2, and the first projector 110_1 may not be used.

Accordingly, it is possible to use a projector having the most suitable depth resolution according to the position of the object, thereby enabling more accurate three-dimensional depth measurement.

In addition, according to an example, the controller 150 can detect the occurrence of an event rather than the detection of the object, and select an appropriate projector. According to one example, the event may be a motion of an already sensed object. For example, when the object is a person, the controller 150 can detect movement of a person's arm and select a suitable projector according to an area where the arm moves.

FIG. 6B shows a time base in which images of two projectors are merged and used by quickly switching and using the first projector 110_1 and the second projector 110_2 in units of frames.

The control unit 150 can calculate the three-dimensional depth of the object 200 by alternately using the first projector 110_1 and the second projector 110_2 at predetermined time intervals.

The predetermined time interval may correspond to a frame unit. That is, t2 in FIG. 6B may correspond to a time interval until the image of one frame is generated by the sensor 130 with respect to the structured light projected by the second projector 110_2. Similarly, t3 may correspond to a time interval until the image of one frame is generated by the sensor 130 with respect to the structured light projected by the first projector 110_1.

The use of such a projector can be applied, for example, when the object is not known at a distance or at a near distance from the reference plane, or when the object is located at a distance and near the center around the reference plane. In such a case, the control unit 150 can rapidly convert the two projectors and merge the images by the respective projectors, whereby the three-dimensional depth can be calculated according to the most suitable depth resolution.

Through this, it is possible to utilize the most suitable depth resolution according to the distance of the object, and more accurate three-dimensional depth measurement can be made.

According to one embodiment, the first projector 110_1 and the second projector 110_2 can adjust the amount of light to be projected according to the distance from the sensor 130. [ According to one example, the light amount for each projector can be set in advance based on the position where the projector is disposed. Alternatively, according to another example, the control unit 150 may receive a user input to adjust the light amount of each projector.

When the object is located at a distance from the reference plane, the traveling path of the structured light from the projector to the sensing of the sensor is lengthened, so that the amount of light reaching the sensor may be reduced and the 3D depth calculation may become difficult.

On the contrary, when the object is closer than the reference plane, the path of the structured light projected from the projector and detected by the sensor is short, and the amount of light reaching the sensor may be too large, which may make calculation of the three-dimensional depth difficult.

As described above, in the present invention, when the object is located at a distance from the reference plane, since the second projector 110_2 is used in terms of depth resolution, the amount of light projected from the second projector 110_2 is smaller than the amount of light projected from the first projector Lt; RTI ID = 0.0 > 110_1. ≪ / RTI >

As described above, by adjusting the light amount of the projector for each operation region, it is possible to project an amount of light suitable for the distance of the object, and more accurate three-dimensional depth can be calculated.

According to one embodiment, the first projector 110_1 and the second projector 110_2 may have a first pattern added to the structured light according to the distance from the sensor 130 and at least one of a size or an interval of the pattern forming the second pattern / RTI >

 According to one example, a pattern added to the structured light for each projector in advance can be set based on the position where the projector is placed. Alternatively, according to another example, the control unit 150 may receive a user input and adjust a pattern added to the structured light for each projector.

When the object is located at a distance from the reference plane, the path of the structured light projected from the projector and sensed by the sensor becomes long, so that the pattern obtained by the sensor is too small or the distance between the patterns is too long, The depth calculation may become difficult.

On the contrary, when the object is closer than the reference plane, the movement path of the structured light projected from the projector and sensed by the sensor is short, and the pattern of the pattern obtained by the sensor is too large or the distance between the patterns is too close, The depth calculation may become difficult.

As described above, in the present invention, when the object is located at a distance from the reference plane, the second projector 110_2 is used in terms of depth resolution, so that the pattern added to the structure light projected from the second projector 110_2 can be used The patterns of the first projector 110_1 may be larger than the patterns of the first projector 110_1 and the intervals between the patterns may be adjusted to be closer to each other.

By adjusting the pattern of the projector for each operation region, it is possible to project the structured light to which the pattern suitable for the distance of the object is added, and thereby to obtain a more accurate three-dimensional depth.

FIG. 7 is a block diagram showing an apparatus 100 for calculating a three-dimensional shape of an object according to an exemplary embodiment of the present invention, including a plurality of projectors 110_1, 110_2, ..., 110_N.

The apparatus 100 for calculating the three-dimensional shape of the object may be configured to calculate the three-dimensional shape of the object based on the sensor 130 and at least one And may further include a projector.

In this case, as described above, there may be N relationship curves between the three-dimensional depth ZK of the object and the time difference d depending on the characteristics of the projectors 110_1, 110_2, ..., 110_N. The slope of the N curves can be determined according to the baseline b value, which is the distance from the sensor.

Therefore, the most suitable curve can be selected according to each distance section to the object, and the projector can be used. Through this, it is possible to increase the operation region of the apparatus for calculating the three-dimensional shape of the object and to calculate the depth of the three-dimensional object with uniform depth resolution over the entire operation region.

The above-described method for calculating the three-dimensional shape of the object according to the present invention can be provided by being recorded on a computer-readable recording medium as a program for execution on a computer.

A computer-readable recording medium includes all kinds of recording apparatuses in which data that can be read by a computer system is stored. Examples of the computer-readable recording device include a ROM, a RAM, a CD-ROM, a DVD 占 ROM, a DVD-RAM, a magnetic tape, a floppy disk, a hard disk, The computer-readable recording medium may also be distributed to networked computer devices so that computer readable code can be stored and executed in a distributed manner.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the invention. The present invention is not limited to the drawings. In addition, the embodiments described in this document may not be limitedly applied, but all or some of the embodiments may be selectively combined so that various modifications may be made.

100: a device for calculating the three-dimensional shape of an object
110_1 to 110_N: Projector 130: Sensor
150: control unit 170: memory

Claims (9)

A first projector for projecting a first structured light to which a first pattern is added onto an object;
A second projector for projecting the second structured light added with the second pattern onto the object;
A sensor for sensing the first structured light and the second structured light reflected from the object; And
A control unit for calculating a three-dimensional depth of the object according to a change in a pattern in at least one image of the first structured light and the second structured light sensed, in comparison with a predetermined reference image;
/ RTI >
Wherein the distance between the first projector and the sensor is different from the distance between the second projector and the sensor. 2. The method of claim 1,
Wherein each structured light projected from the first projector and the second projector is reflected on a reference surface at a predetermined distance from an apparatus for calculating the three-dimensional shape of the object, A device for calculating a three-dimensional shape. The apparatus of claim 1, wherein the control unit
When a region at a predetermined distance is set from a device for calculating the three-dimensional shape of the object, one projector is selected in accordance with the depth resolution in the set region, And calculating the three-dimensional depth. The apparatus of claim 1, wherein the control unit
Selecting one projector according to the depth resolution in the area where the object is sensed and calculating the three-dimensional depth of the object using the selected projector. The apparatus of claim 1, wherein the control unit
And calculating the three-dimensional depth of the object by alternately using the first projector and the second projector at predetermined time intervals. The projector according to claim 1, wherein the first projector and the second projector
And adjusting the amount of light to be projected according to the distance from the sensor. The projector according to claim 1, wherein the first projector and the second projector
And adjusting at least one of a size or an interval of a pattern constituting the first pattern and the second pattern according to a distance between the sensor and the sensor. The method according to claim 1,
Further comprising at least one projector located on the basis of the sensor, the distance to the first projector and the distance to the second projector being different from each other. Projecting the first structured light added with the first pattern onto an object;
Projecting the second structured light to which the second pattern is added at a position different from the position at which the first structured light is projected to the object;
Sensing the first structured light and the second structured light reflected from the object; And
Calculating a three-dimensional depth of the object according to a change in a pattern in at least one of the sensed first structural light and the second structured light, in comparison with a predetermined reference image;
Dimensional shape of the object.

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