KR20130061598A - Liquid crystal display device - Google Patents

Abstract

PURPOSE: A liquid crystal display device is provided to design a plurality of auto probe pads to share a plurality of top electrodes that are arranged ceaselessly to have a bar form for supplying a test signal to transistors which are connected to an auto probe pad having a bad connection, when bottom electrodes or top electrodes of the auto probe pads have defects in connection, thereby improving reliability of test process. CONSTITUTION: A liquid crystal display comprises an array substrate, multiple gate lines, multiple data lines, and a test unit. The test unit includes a switch part and an auto probe pad part. The auto probe pad part is connected to multiple transistors to be supplied with test signals. The auto probe pad part has at least two or more auto probe pad groups which are arranged in the horizontal direction. Each of the plurality of auto probe pad parts includes a plurality of transparent top electrodes(140a, 140b) ceaselessly formed in horizontal direction on a plurality of auto probe pads(OP11, OP12, OP21).

Description

[0001] LIQUID CRYSTAL DISPLAY DEVICE [0002]

The present invention relates to a liquid crystal display device that can improve the reliability of the test process.

A CRT (cathode ray tube), which is one of the widely used display devices, is mainly used for monitors such as a TV, a measurement device, and an information terminal device. However, due to the weight and size of the CRT itself, Could not respond positively to the response of

As a solution to such a problem, the liquid crystal display device has been gradually widened due to its features such as lightness, thinness, and low power consumption driving. Accordingly, the liquid crystal display device is proceeding in the direction of large-sized, thin, and low power consumption in response to the demand of the user.

2. Description of the Related Art [0002] A liquid crystal display device is a display device that displays an image by adjusting the amount of light transmitted through a liquid crystal, and is widely used because of its advantages such as thinness and low power consumption.

In the transverse electric field type liquid crystal display, a horizontal electric field is generated between the electrodes by disposing a pixel electrode and a common electrode on the same substrate. As a result, the long axis of the liquid crystal molecules is arranged in a horizontal direction with respect to the substrate, and thus has a wide viewing angle characteristic as compared with a conventional twisted nematic (TN) type liquid crystal display.

A general liquid crystal display device has a structure in which an array substrate and a color filter substrate are bonded to each other with a liquid crystal layer interposed therebetween.

Such a liquid crystal display device is manufactured by sequentially performing substrate cleaning, pattern formation, alignment layer formation, substrate bonding / liquid crystal injection, an auto-probe process, and a module process for driver IC bonding.

The auto probe process may be defined as a process of inspecting a liquid crystal panel, and configure transistors connected to signal lines at one edge of the liquid crystal panel for inspection such as disconnection, short circuit, and contact failure in each signal line. The inspection is performed by supplying a turn-on voltage to the liquid crystal panel through the transistor.

1 is a view schematically illustrating an auto probe pad and a switch unit of a general liquid crystal display.

As shown in FIG. 1, a general liquid crystal display device includes a switch unit having a plurality of transistors, and an auto probe pad unit having an auto probe pad connected to each of the transistors in one-to-one correspondence.

The switch unit has odd-numbered transistors formed side by side in the horizontal direction, and even-numbered transistors formed side by side in the horizontal direction.

The odd-numbered transistors are the first and third transistors T1 and T3, and the even-numbered transistors are the second and fourth transistors T2 and T4.

Transistors of the switch unit are simultaneously formed in forming a thin film transistor for driving pixels in the liquid crystal panel.

Auto probe pads are connected in a one-to-one correspondence with the transistors of the switch unit.

The auto probe pad has a lower electrode formed at the time of forming the gate electrode, and an upper electrode for electrically connecting the connection wirings connected to the source electrode of the thin film transistor of the switch portion to each other. Here, the upper electrode is formed on the lower electrode including a contact hole exposing the lower electrode.

However, a general liquid crystal display device has a structure in which an auto probe pad corresponds one-to-one with transistors of a switch unit and inspects a signal line connected to the transistor of the switch unit. When the lower electrode is not exposed due to a process problem at the time, there is a problem in that the corresponding signal line is poorly determined due to the poor formation of the auto probe pad even if the corresponding signal line is not defective. Accordingly, a general liquid crystal display device has a problem of lowering reliability of an inspection process due to poor formation of an auto probe pad.

An object of the present invention is to provide a liquid crystal display device which can improve the reliability of the test process.

The liquid crystal display device of the present invention,

An array substrate divided into a display area and a non-display area; A plurality of gate lines and data lines formed to intersect the display area; And an inspection unit formed in the non-display area to inspect defects of the gate line and the data line.

The inspection unit includes a switch unit having a plurality of transistors and an auto probe pad unit connected to the plurality of transistors to which a test signal is applied, wherein the auto probe pad units are divided into at least two or more auto arrays arranged in a horizontal direction. Each of the auto probe pad groups has a probe pad group, and each of the auto probe pad groups is formed to have a transparent upper electrode without disconnection so as to share all of the plurality of auto probe pads included in the auto probe pad group.

The inspection unit according to the present invention may be connected to a plurality of auto probe pads arranged horizontally so that the connection between the lower electrode and the upper electrode of any one of the auto probe pads may be caused by a seamless bar type upper electrode. The test signal is normally supplied to the transistors connected to the autoprop pad so that the reliability of the test process may be improved.

In addition, in the present invention, the first and second upper electrodes are continuously extended in the horizontal direction, thereby improving the area for connection with the first and second lower electrodes, thereby reducing the connection failure rate. It has the advantage of reducing the resistance of the upper electrode.

1 is a view schematically illustrating an auto probe pad part and a switch part of a general liquid crystal display device.
2 is a view schematically showing the structure of a liquid crystal panel of the present invention.
3 is a view showing an inspection unit according to an embodiment of the present invention.
4 is a cross-sectional view illustrating the auto probe pad taken along the line II ′ of FIG. 3.

The present invention includes an array substrate divided into a display area and a non-display area, and a plurality of gate lines and data lines formed to intersect the display area, and an inspection unit formed in the non-display area to inspect defects of the gate line and the data line. The inspection unit includes a switch unit having a plurality of transistors, and an auto probe pad unit connected to the plurality of transistors to which a test signal is applied, wherein the auto probe pad unit is divided into at least two or more auto probes arranged in a horizontal direction. Each of the auto probe pad groups has a pad group, and each of the auto probe pad groups is formed to have a transparent upper electrode without disconnection and share all of the plurality of auto probe pads included in the auto probe pad group.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Referring to the accompanying drawings, embodiments of the present invention will be described in detail.

One embodiment of the present invention is intended to enable a person skilled in the art to fully understand the technical idea of the present invention. Therefore, the present invention is not limited to the embodiments described below, and other embodiments can be added on the basis of the technical idea of the present invention.

2 is a view schematically showing the structure of a liquid crystal panel of the present invention.

As shown in FIG. 2, in the liquid crystal panel 10 of the present invention, the array substrate and the color filter substrate face each other, are bonded to each other at a predetermined interval, and the liquid crystal is interposed in the space.

The array substrate includes a display area 12 in which an image is displayed and a non-display area 13 positioned at an edge of the display area 12.

The display area 12 includes a plurality of gate lines 104 and data lines 106 that cross each other to define a pixel area, a pixel electrode 18 formed in the pixel area, a gate line 104, And a thin film transistor (TFT) formed at an intersection region of the data line 106.

Although not shown in detail, the TFT may include a gate electrode branched from the gate line 104, a source electrode branched from the data line 106, and a pixel electrode 18 spaced apart from the source electrode. And a semiconductor layer connected to the drain electrode and the gate electrode and the source / drain electrode.

In the non-display area 13, a gate link line 14 connected to the gate line 104 of the display area 12 and a data link line 16 connected to the data line 106 are formed. An inspection unit 20 is connected to the gate link line 14 and the data link line 16 to inspect whether the gate line 104 and the data line 106 are defective.

The inspection unit 20 may include a switch unit 20a in which a plurality of transistors are formed, and an auto probe pad unit 20b connected to an auto probe device for turning on the transistors of the switch unit 20a to apply a test signal. Include.

The liquid crystal panel 10 is connected to an auto probe device (not shown) through the auto probe pad unit 20b and when a signal for turning on the transistors of the switch unit 20a is applied, the gate link wiring connected to the transistor ( 14) and a power supply voltage, a ground voltage, etc. are supplied through the data link wiring 16, and the abnormality of the thin film transistor TFT in the display area 12 is checked. When the inspection is completed, the inspection unit 20 is removed and the driver IC for driving the liquid crystal panel 10 is then bonded in a tape automated bonding (TAB) or chip on glass (COG) method.

Here, the plurality of transistors located in the switch unit 20b are simultaneously formed at the time of forming the thin film transistor TFT formed in the liquid crystal panel 10.

3 is a diagram illustrating an inspection unit according to an exemplary embodiment of the present invention, and FIG. 4 is a cross-sectional view illustrating the auto probe pad cut along the line II ′ of FIG. 3.

As shown in Figure 3 and 4, the inspection unit according to an embodiment of the present invention includes a switch unit and the auto probe pad unit.

The switch unit has the odd first, third and fifth transistors T11, T13 and T15 arranged horizontally, and the even second, fourth and sixth transistors T12, T14 and T16 arranged horizontally. ).

The first, third, and fifth transistors T11, T13, and T15 and the even-numbered second, fourth, and sixth transistors T12, T14, and T16 are alternately arranged.

The first to sixth transistors T11 to T16 include one gate electrode 30 having a surface type.

Ends of the first to sixth source electrodes 111c to 116c of the first to sixth transistors T11 to T16 are formed on the gate electrode 30, and the first to sixth source electrodes 111c to 116c are formed. The ends of the first to sixth drain electrodes 111b to 116b of the first to sixth transistors T11 to T16 are formed to be spaced apart from each other.

The first, third, and fifth source electrodes 111c, 113c, and 115c of the first, third, and fifth transistors T11, T13, and T15 pass through an upper region of the gate electrode 30 to form a gate electrode. Extending to the lower region of the substrate 30, and the second, fourth and sixth source electrodes 112c, 114c, and 116c of the second, fourth, and sixth transistors T12, T14, and T16 may include the gate electrode 30. Is formed only in the upper region.

First, third and fifth drain electrodes 111b, 113b, and 115b of the first, third, and fifth transistors T11, T13, and T15 are formed only in a lower region of the gate electrode 30, and the second The second, fourth and sixth drain electrodes 112b, 114b, and 116b of the fourth and sixth transistors T12, T14, and T16 may pass through the lower region of the gate electrode 30 to pass through the gate electrode 30. It extends to the upper region.

Accordingly, ends of the first, third and fifth source electrodes 111c, 113c, and 115c of the first, third and fifth transistors T11, T13, and T15 and the first, third, and fifth drain electrodes ( The ends of 111b, 113b, and 115b are disposed to be adjacent to each other in the lower region of the gate electrode 30, and the first, third, and fifth sources of the first, third, and fifth transistors T11, T13, and T15. The first, third and fifth semiconductor layers 111a, 113a, and 118b are overlapped with the ends of the electrodes 111c, 113c, and 115c and the ends of the first, third, and fifth drain electrodes 111b, 113b, and 115b. 115a) is formed.

In addition, ends of the second, fourth, and sixth source electrodes 112c, 114c, and 116c of the second, fourth, and sixth transistors T12, T14, and T16 and the second, fourth, and sixth drain electrodes ( The ends of 112b, 114b, and 116b are disposed adjacent to each other in the upper region of the gate electrode 30, and the second, fourth, and sixth sources of the second, fourth, and sixth transistors T12, T14, and T16 are disposed. The second, fourth, and sixth semiconductor layers 112a, 114a, 116a) is formed.

The haute probe pad part may be spaced apart from the first and second auto probe pads OP11 and OP12 and the first and second auto probe pads OP11 and OP12 which are arranged in plural in a horizontal direction. And arranged third auto probe pad OP21.

A horizontal group in which the first and second auto probe pads OP11 and OP12 are arranged may be defined as a first auto probe pad group, and a horizontal group in which the third auto probe pads OP21 are arranged. May be defined as a second auto probe pad group.

The first auto probe pad OP11 may include a first lower electrode 120a formed horizontally, first and second drain electrodes 111b and 112b of the first and second transistors T11 and T12, and a first cone. The first upper electrode 140a is electrically connected through the techole 150a.

The third auto probe pad OP21 may include the second lower electrode 120b formed horizontally, and the third and fourth drain electrodes 113b and 114b of the third and fourth transistors T13 and T14 and the second cone. The second upper electrode 140b is electrically connected through the techole 150b.

That is, each of the first to third auto probe pads OP11, OP12, and OP21 of the present invention is electrically connected to the drain electrodes of two adjacent transistors.

The first and second lower electrodes 120a and 120b may be simultaneously formed when the gate electrode 30 is formed.

The first upper electrode 140a of the present invention is formed without break in the horizontal direction. That is, although not shown in the drawing, the first upper electrode 140a includes the first and second auto probe pads OP11 and OP12, and all the auto probe pads of the first auto probe pad group are shared. .

In addition, the second upper electrode 140b of the present invention may be formed without breaking in the horizontal direction.

That is, although not shown in the drawing, the second upper electrode 140b of the present invention includes a third auto probe pad part OP21, but is formed in a horizontal direction with the third auto probe pad part OP21. Share with professional pads.

The first and second upper electrodes 140a and 140b may be simultaneously formed in a transparent electrode forming process of forming a pixel electrode or a common electrode of the liquid crystal panel.

According to the present invention, the test signals input to the first to third auto probe pads OP11, OP12, and OP21 are supplied to the first to sixth transistors T11 to T16 of the switch unit, and the first to sixth transistors T11. To T16), the test signal is supplied to the corresponding signal line to determine whether the signal line is defective.

According to the present invention, any one of the first to third auto probe pads OP11, OP12, and OP21 extends without disconnection in the horizontal direction even when a poor connection between the lower electrode and the upper electrode occurs. By the structure of 140b), the test signal can be normally supplied to the transistor connected to the defective auto probe pad.

For example, when a connection failure between the first lower electrode 120a and the first upper electrode 140a of the first auto probe pad OP11 occurs, the second auto probe pad OP12 horizontally arranged The first and second transistors T11 and T12 connected to the first auto probe pad part OP11 by the shared first upper electrode 140a are normally tested using the first auto probe pad OP12. The signal can be supplied.

Therefore, the inspection unit according to the present invention is connected even if poor connection between the lower electrode and the upper electrode of any one of the auto probe pads is caused by the bar type upper electrode so that the upper electrode is shared among the auto probe pads arranged horizontally. The test signal is normally supplied to the transistors connected to the defective autoprop pad so that the reliability of the inspection process can be improved.

In addition, in the present invention, the first and second upper electrodes 140a and 140b are continuously extended in the horizontal direction, thereby improving the area for connection with the first and second lower electrodes 120a and 120b, thereby reducing the connection failure rate. It is possible to reduce the resistance of the first and second upper electrodes 140a and 140b.

In the above description, two auto probe pad groups having horizontally spaced auto probe pads spaced apart from each other and horizontally aligned with the odd first, third and fifth transistors T11, T13, and T15 arranged horizontally. Although the second and fourth transistors, the fourth and sixth transistors T12, T14, and T16, which are arranged in the same manner, are described in a limited manner, the switch units arranged in two different horizontal directions are not limited thereto. The auto probe pad group may be designed to have two or more auto probe pad groups according to a defect inspection of a data line, and the switch unit may be divided into three or more and arranged horizontally.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the invention. Therefore, the technical scope of the present invention should not be limited to the contents described in the detailed description of the specification, but should be defined by the claims.

OP11: 1st auto probe pad OP12: 2nd auto probe pad
OP21: 3rd auto probe pad 120a: 1st lower electrode
120b: second lower electrode 140a: first upper electrode
140b: second upper electrode

Claims (7)

An array substrate divided into a display area and a non-display area;
A plurality of gate lines and data lines formed to intersect the display area; And
An inspection unit formed in the non-display area and inspecting defects of the gate line and the data line,
The inspection unit includes a switch unit having a plurality of transistors, and an auto probe pad unit connected to the plurality of transistors to which a test signal is applied.
The auto probe pad unit may be divided into at least two or more auto probe pad groups arranged in a horizontal direction, and each of the auto probe pad groups may have a transparent upper electrode formed in the horizontal direction without disconnection. A liquid crystal display device sharing all the plurality of auto probe pads included in the. The method according to claim 1,
The auto probe pads arranged in each of the auto probe pad groups include a lower electrode formed when a gate line is formed and an upper electrode connected to the transistor of the switch unit through a contact hole. The method according to claim 1,
And the lower electrode extends in a horizontal direction without disconnection. The method according to claim 1,
The auto probe pad is connected to two transistors of the switch unit. 5. The method of claim 4,
And two transistors connected to one of the auto probe pads are formed in adjacent regions. The method according to claim 1,
The at least two auto probe pad groups are arranged to be spaced apart from each other at regular intervals. The method according to claim 1,
And the upper electrode is not shared between the two or more auto probe pad groups.

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