KR20130039453A - 광섬유 격자 기반 방사선량계 및 그를 구비하는 방사선량 모니터링 시스템 - Google Patents
광섬유 격자 기반 방사선량계 및 그를 구비하는 방사선량 모니터링 시스템 Download PDFInfo
- Publication number
- KR20130039453A KR20130039453A KR1020110104006A KR20110104006A KR20130039453A KR 20130039453 A KR20130039453 A KR 20130039453A KR 1020110104006 A KR1020110104006 A KR 1020110104006A KR 20110104006 A KR20110104006 A KR 20110104006A KR 20130039453 A KR20130039453 A KR 20130039453A
- Authority
- KR
- South Korea
- Prior art keywords
- optical fiber
- fiber grating
- grating
- radiation
- dosimeter
- Prior art date
Links
- 239000013307 optical fiber Substances 0.000 title claims abstract description 206
- 230000005855 radiation Effects 0.000 claims abstract description 126
- 230000000737 periodic effect Effects 0.000 claims abstract description 24
- 238000005259 measurement Methods 0.000 claims abstract description 23
- 230000008859 change Effects 0.000 claims abstract description 21
- 238000000034 method Methods 0.000 claims description 35
- 238000012544 monitoring process Methods 0.000 claims description 21
- 239000000835 fiber Substances 0.000 claims description 10
- 238000001039 wet etching Methods 0.000 claims description 9
- 238000005253 cladding Methods 0.000 claims description 7
- 239000000203 mixture Substances 0.000 claims description 7
- 229920000642 polymer Polymers 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 5
- 239000005387 chalcogenide glass Substances 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 3
- 238000001459 lithography Methods 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 239000000075 oxide glass Substances 0.000 claims description 3
- 239000004033 plastic Substances 0.000 claims description 3
- 229920003023 plastic Polymers 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims description 3
- 238000001771 vacuum deposition Methods 0.000 claims description 3
- 238000005516 engineering process Methods 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims description 2
- 230000035945 sensitivity Effects 0.000 abstract description 9
- 230000003287 optical effect Effects 0.000 abstract description 8
- 238000004519 manufacturing process Methods 0.000 description 12
- 238000000411 transmission spectrum Methods 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 230000008901 benefit Effects 0.000 description 5
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 4
- 239000004926 polymethyl methacrylate Substances 0.000 description 4
- 239000010949 copper Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- -1 for example Substances 0.000 description 3
- 230000031700 light absorption Effects 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 3
- 239000004038 photonic crystal Substances 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 238000010891 electric arc Methods 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000000752 ionisation method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910001369 Brass Inorganic materials 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 229910052689 Holmium Inorganic materials 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 206010034960 Photophobia Diseases 0.000 description 1
- 229910052778 Plutonium Inorganic materials 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 229910052777 Praseodymium Inorganic materials 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 229910052775 Thulium Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 210000003298 dental enamel Anatomy 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 125000001153 fluoro group Chemical group F* 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- KJZYNXUDTRRSPN-UHFFFAOYSA-N holmium atom Chemical compound [Ho] KJZYNXUDTRRSPN-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000012432 intermediate storage Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 208000013469 light sensitivity Diseases 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000002925 low-level radioactive waste Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- OYEHPCDNVJXUIW-UHFFFAOYSA-N plutonium atom Chemical compound [Pu] OYEHPCDNVJXUIW-UHFFFAOYSA-N 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000012857 radioactive material Substances 0.000 description 1
- 239000002901 radioactive waste Substances 0.000 description 1
- 238000001959 radiotherapy Methods 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 1
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
- FRNOGLGSGLTDKL-UHFFFAOYSA-N thulium atom Chemical compound [Tm] FRNOGLGSGLTDKL-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/02—Dosimeters
- G01T1/06—Glass dosimeters using colour change; including plastic dosimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J2003/425—Reflectance
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
도 2는 도 1에 도시된 방사선량계를 제조하기 위한 장치를 개략적으로 도시한 도면이다.
도 3은 도 1에 도시된 방사선량계의 광섬유 격자의 공진파장을 표현하는 투과 스펙트럼 그래프이다.
도 4a 및 도 4b는 도 1에 도시된 방사선량계의 광섬유 격자의 방사선 조사량에 따른 공진파장의 투과 스펙트럼 변화를 나타낸 그래프이다.
도 5는 본 발명의 다른 실시예에 따른 광섬유 격자 기반 방사선량계의 개략적인 단면도이다.
도 6은 본 발명의 또 다른 실시예에 따른 광섬유 격자 기반 방사선량계의 개략적인 단면도이다.
도 7은 도 1, 도 5 또는 도 6의 광섬유 격자 기반 방사선량계가 적용된 방사선량 모니터링 시스템의 구성을 개략적으로 도시한 도면이다.
110 : 코어 120 : 클래딩
150 : 열/인장력 제공 장치 160 : 인장력 제공부
170 : 열 제공부
Claims (10)
- 방사선 조사에 의해 광섬유 격자의 공진파장 이동을 관측하여 방사선량을 측정하는 광섬유 격자 기반 방사선량계에 있어서,
광섬유에 구조적 변화를 발생시킴으로써 광섬유에 주기적인 격자 패턴을 형성하고, 상기 격자 패턴을 통해 주기적인 굴절률 변화가 발생되는 광섬유 격자를 포함하는, 광섬유 격자 기반 방사선량계.
- 제1항에 있어서,
상기 광섬유에 구조적 변화를 발생시키기 위하여, 광섬유에 열 및 인장력을 가하는 마이크로 테이퍼링(micro tapering) 기술, 상기 광섬유를 상호 다른 반대 방향으로 비트는 비틀림 기술, 또는 상기 광섬유의 표면을 주기적으로 습식 식각하는 기술이 적용되는 광섬유 격자 기반 방사선량계.
- 제2항에 있어서,
상기 광섬유에 구조적 변화를 발생시키기 위해 상기 마이크로 테이퍼링 기술이 적용되는 경우 열/인장력 제공 장치가 구비되며,
상기 열/인장력 제공 장치는,
상기 광섬유의 양단을 고정하며, 상호 이격 가능하여 상기 광섬유에 인장력을 제공하는 인장력 제공부; 및
상기 광섬유에 부분적으로 열을 가하는 열 제공부를 포함하며,
상기 인장력 제공부를 통해 상기 광섬유를 늘리면서 동시에 상기 열 제공부를 통해 상기 광섬유에 열을 가함으로써 상기 광섬유를 마이크로 테이퍼링시키는 광섬유 격자 기반 방사선량계.
- 제2항에 있어서,
상기 광섬유에 가해지는 마이크로 테이퍼링 횟수에 기초하여 상기 광섬유의 코어 모드 및 클래딩 모드 간의 효율이 결정되는 광섬유 격자 기반 방사선량계.
- 제1항에 있어서,
상기 광섬유 격자 기반 방사선량계는 상기 광섬유 격자가 새겨진 길이에 따라 국소 지역의 방사선량을 측정하는 국소형 센서로 적용되거나, 복수의 광섬유 격자가 직렬 또는 병렬 연결된 분포형 센서로 적용 가능한 광섬유 격자 기반 방사선량계.
- 제1항에 있어서,
상기 광섬유 격자 제작에 사용되는 상기 광섬유는 산화물 유리(oxide glass), 할로젠화물 유리(halide glass), 칼코겐화물 유리(chalcogenide glass) 또는 플라스틱으로 제작되는 광섬유 격자 기반 방사선량계.
- 제1항에 있어서,
상기 광섬유 격자 제작에 사용되는 상기 광섬유는 재질, 조성물의 종류 및 첨가량을 선택적으로 조절함으로써 방사선량 측정 범위를 조절하는 광섬유 격자 기반 방사선량계.
- 제2항에 있어서,
상기 광섬유에 구조적 변화를 발생시키기 위해 습식 식각 기술이 적용 시, 상기 광섬유가 고정된 기판 위에 폴리머를 코팅하고 노광 기술(lithography)을 이용하여 상기 광섬유의 표면 위에 주기적 구조의 폴리머를 형성하거나 주기적 패턴을 갖는 마스크를 상기 광섬유 표면에 부착하고 진공 증착 기술을 이용하여 상기 광섬유의 표면 위에 주기적인 구조의 금속을 형성하고 상기 광섬유 표면을 주기적으로 습식 식각하는, 광섬유 격자 기반 방사선량계.
- 광섬유에 구조적 변화를 발생시킴으로써 주기적인 굴절률 변화가 발생되는 광섬유 격자를 구비하는 광섬유 격자 기반 방사선량계;
상기 광섬유 격자 기반 방사선량계가 장착되고 방사선량 측정 대상물에 인접하게 설치되는 광섬유에 광을 제공하는 광원;
상기 광섬유를 통과한 광의 파장을 측정하는 파장 측정부; 및
상기 방사선량 측정 대상물로부터 누출 가능한 방사선량을 원격 및 실시간으로 모니터링하는 모니터링부;
를 포함하는 방사선량 모니터링 시스템.
- 제9항에 있어서,
상기 광섬유 격자 기반 방사선량계는 상기 광섬유의 길이 방향을 따라 직렬로 복수 개 배치되는 방사선량 모니터링 시스템.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020110104006A KR101329455B1 (ko) | 2011-10-12 | 2011-10-12 | 광섬유 격자 기반 방사선량계 및 그를 구비하는 방사선량 모니터링 시스템 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020110104006A KR101329455B1 (ko) | 2011-10-12 | 2011-10-12 | 광섬유 격자 기반 방사선량계 및 그를 구비하는 방사선량 모니터링 시스템 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20130039453A true KR20130039453A (ko) | 2013-04-22 |
KR101329455B1 KR101329455B1 (ko) | 2013-11-15 |
Family
ID=48439636
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020110104006A KR101329455B1 (ko) | 2011-10-12 | 2011-10-12 | 광섬유 격자 기반 방사선량계 및 그를 구비하는 방사선량 모니터링 시스템 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR101329455B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20190029416A (ko) * | 2017-09-11 | 2019-03-20 | 한국전자통신연구원 | 펄스 레이저 장치 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2851319B2 (ja) | 1989-09-22 | 1999-01-27 | 三菱重工業株式会社 | 放射線計測装置の放射線検出部 |
KR101169207B1 (ko) * | 2009-07-16 | 2012-07-26 | 한국과학기술연구원 | 혼합 가스의 성분 검출 장치 및 방법 |
-
2011
- 2011-10-12 KR KR1020110104006A patent/KR101329455B1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20190029416A (ko) * | 2017-09-11 | 2019-03-20 | 한국전자통신연구원 | 펄스 레이저 장치 |
Also Published As
Publication number | Publication date |
---|---|
KR101329455B1 (ko) | 2013-11-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Cheymol et al. | High level gamma and neutron irradiation of silica optical fibers in CEA OSIRIS nuclear reactor | |
O'Keeffe et al. | A review of optical fibre radiation dosimeters | |
Fernandez et al. | Real-time fibre optic radiation dosimeters for nuclear environment monitoring around thermonuclear reactors | |
Kalnins et al. | Radiation dosimetry using optically stimulated luminescence in fluoride phosphate optical fibres | |
JP5735605B2 (ja) | 光ファイバブラッググレーティングセンサを温度と放射線量センサとして同時に具現する装置及びその方法 | |
Sporea et al. | Online tests of an optical fiber long-period grating subjected to gamma irradiation | |
Sporea et al. | Radiation effects in optical materials and photonic devices | |
Fernandez et al. | Long-term radiation effects on fibre Bragg grating temperature sensors in a low flux nuclear reactor | |
KR101329455B1 (ko) | 광섬유 격자 기반 방사선량계 및 그를 구비하는 방사선량 모니터링 시스템 | |
Park et al. | Evaluation of the Detection Efficiency of LYSO Scintillator in the Fiber‐Optic Radiation Sensor | |
Lu et al. | Gamma ray radiation induced visible light absorption in P-doped silica fibers at low dose levels | |
Butov et al. | Optical fiber sensor for deformation monitoring of fuel channels in industrial nuclear reactors | |
Berghmans et al. | Fiber Bragg grating sensors in nuclear environments | |
KR101348568B1 (ko) | 고분자 화합물 기반 광섬유 방사선량계 및 그를 구비한 방사선량 모니터링 시스템 | |
Cho et al. | Ultraviolet light sensor based on an azobenzene-polymer-capped optical-fiber end | |
CN107631796B (zh) | 一种光纤辐照监测装置及监测方法 | |
EP3507622B1 (en) | A method of indirectly measuring the radioactivity of radioactive material | |
Stajanca | POF and Radiation Sensing | |
KR101669271B1 (ko) | 방사선 선량의 측정 방법 | |
Alfeeli et al. | Performance of randomly distributed holes optical fibers under low dose gamma-ray irradiation | |
KR101308270B1 (ko) | 고분자 화합물이 충진된 광섬유 기반 방사선량계 | |
Sporea et al. | Test of optical fibers under electron beam irradiation | |
Guo et al. | Remote and real-time low dose rate gamma radiation measurement using NaI (Tl) based fiber optic sensor | |
Kopp et al. | Chiral fiber sensors | |
Lee et al. | Optical fibers, light-guides, and light transmission |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20111012 |
|
PA0201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20121217 Patent event code: PE09021S01D |
|
AMND | Amendment | ||
PG1501 | Laying open of application | ||
E601 | Decision to refuse application | ||
PE0601 | Decision on rejection of patent |
Patent event date: 20130830 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20121217 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |
|
AMND | Amendment | ||
PX0901 | Re-examination |
Patent event code: PX09011S01I Patent event date: 20130830 Comment text: Decision to Refuse Application Patent event code: PX09012R01I Patent event date: 20130417 Comment text: Amendment to Specification, etc. |
|
PX0701 | Decision of registration after re-examination |
Patent event date: 20131030 Comment text: Decision to Grant Registration Patent event code: PX07013S01D Patent event date: 20131002 Comment text: Amendment to Specification, etc. Patent event code: PX07012R01I Patent event date: 20130830 Comment text: Decision to Refuse Application Patent event code: PX07011S01I Patent event date: 20130417 Comment text: Amendment to Specification, etc. Patent event code: PX07012R01I |
|
X701 | Decision to grant (after re-examination) | ||
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20131107 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20131107 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
FPAY | Annual fee payment |
Payment date: 20161004 Year of fee payment: 4 |
|
PR1001 | Payment of annual fee |
Payment date: 20161004 Start annual number: 4 End annual number: 4 |
|
LAPS | Lapse due to unpaid annual fee | ||
PC1903 | Unpaid annual fee |
Termination category: Default of registration fee Termination date: 20180818 |