KR20130021103A - Exposure system and exposure method using the system - Google Patents
Exposure system and exposure method using the system Download PDFInfo
- Publication number
- KR20130021103A KR20130021103A KR1020110083428A KR20110083428A KR20130021103A KR 20130021103 A KR20130021103 A KR 20130021103A KR 1020110083428 A KR1020110083428 A KR 1020110083428A KR 20110083428 A KR20110083428 A KR 20110083428A KR 20130021103 A KR20130021103 A KR 20130021103A
- Authority
- KR
- South Korea
- Prior art keywords
- film
- curvature
- pattern forming
- mask
- exposure system
- Prior art date
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2014—Contact or film exposure of light sensitive plates such as lithographic plates or circuit boards, e.g. in a vacuum frame
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/213—Exposing with the same light pattern different positions of the same surface at the same time
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
Abstract
The present invention relates to an exposure system and an exposure method using the same, and more particularly, a light emitting part, a film conveying part that adheres to a surface thereof and is bent in an ellipse or a part thereof, and is bent in the same curvature as the above curvature. And a pattern forming portion configured to transmit the light emitted from the light emitting portion to the curved film at the above curvature to form a polarization pattern, thereby forming a polarization pattern while continuously unwinding the film wound on the roll. The present invention relates to an exposure system capable of minimizing meandering and enabling uniform exposure to a wider area and contributing to increased production quality and efficiency, and to an exposure method using the same.
Description
The present invention relates to an exposure system for continuously forming a polarization pattern and an exposure method using the same.
The exposure system continuously unwinds the film rolled on the roll, and irradiates light on the unwinded portion after coating and drying to form a polarization pattern. As the exposure system releases and moves the film, meandering and shaking of the film occur, which causes irregularities in the polarization pattern formed on the film.
Films with irregular polarization patterns have poor polarization performance, causing problems that also significantly degrade the performance of 3D displays attached thereto. Therefore, the search for a method for regularly forming the exposure pattern on the film is required.
Previous exposure systems have been unsuitable for continuous processes, such as, for example, Japanese Patent Laid-Open Publication No. 2003-40674, or there is a limit that the exposure area of the mask is narrow and the efficiency is lowered.
In addition, when the exposure area is a curved surface, the exposure amount which passes through the mask and reaches the exposure area is considered to be a non-uniform factor causing irregular polarization patterns, and the exposure area must be flat.
An object of the present invention is to provide an exposure system and an exposure method using the same that can minimize the shaking and meandering of the film when forming a continuous polarization pattern.
An object of the present invention is to provide an exposure system capable of uniform exposure over a wider area and an exposure method using the same.
1. light emitting unit; A film transfer part in which the film adheres to the surface thereof and moves while being bent at the curvature of the ellipse or a part thereof; And a pattern forming unit configured to be bent at the same curvature as the curvature above, and to transmit light emitted from the light emitting unit to the film curved at the above curvature to form a polarization pattern.
2. The exposure system according to the above 1, wherein the film transfer unit is an elliptical roller.
3. The exposure system according to the above 1, wherein the film transfer unit is a plurality of circular rollers spaced apart by a trajectory having a curvature of an ellipse or a part thereof.
4. The exposure system according to the above 1, wherein the film transfer unit is a plurality of circular rollers disposed adjacent to the trajectory having a curvature of an ellipse or a portion thereof.
5. The exposure system according to the above 3 or 4, the film transfer unit further includes a support roller at the bottom of the plurality of circular rollers.
6. The exposure system according to the above 1, wherein the pattern forming unit comprises a mask.
7. The system of claim 1, wherein the pattern forming unit comprises a mask and a polarizer.
8. In the above 6 or 7, wherein the pattern forming unit further comprises an internal pressure control chamber to allow the mask or mask and the polarizer is configured to be curved to the curvature of the ellipse or a portion thereof.
9. In the above 6 or 7, wherein the mask is in the form of a quadrilateral with four sides, one side and the opposite side is fixedly connected to the pattern forming portion, except for these two sides a pair of two opposite sides are patterns Exposure system not fixed to the forming part.
10. The exposure system according to the above 9, wherein the curvature of the mask can be adjusted by a fixing device that can adjust the distance between two sides of the mask fixed to the pattern forming portion.
11. The exposure system according to the above 1, wherein the distance between the pattern forming unit and the film conveying unit is constant.
12. The exposure system according to the above 1, wherein the surface of the film transfer unit is antireflective or scattering-free.
13. The exposure system according to the above 1, wherein the surface of the film transfer part is formed with an adhesive layer or an anti-slip layer.
14. In the above 1, the first reflector for reflecting the light output from the light emitting unit; A condenser that collects and transmits the light reflected by the first reflector; And a second reflecting portion for reflecting light transmitted from the light collector to the pattern forming portion.
15. bringing the film into close contact with the film conveying portion and bending the film to a curvature of an ellipse or a portion thereof; And irradiating light to the film bent at the curvature to form a polarization pattern on the film by irradiating light through a pattern forming unit configured to be bent at the same curvature as the above curvature.
16. In the above 15, the film conveying portion is an elliptical roller, a plurality of circular rollers spaced apart by a trajectory having an ellipse or a portion thereof, or a plurality of circular rollers disposed adjacent to a trajectory having a curvature of an ellipse or a portion thereof. Exposure method.
17. The method according to the above 16, wherein the film transfer unit further comprises a support roller at the bottom of the plurality of circular rollers.
18. The exposure method according to the above 15, wherein the pattern forming unit comprises a mask, or a mask and a polarizer.
19. The exposure method according to the above 15, wherein the pattern forming unit maintains the curvature by the internal pressure control chamber.
20. The exposure method according to the above 15, wherein the light irradiated through the pattern forming unit is uniformly incident on the bent film with the curvature above.
The exposure system and method of the present invention can minimize the shaking and meandering of the film during continuous polarization pattern formation by allowing the film to be conveyed to be brought in close contact with the film conveying portion.
According to the exposure system and method of the present invention, the curvature of the pattern forming portion and the film conveying portion are matched to make the distance between them uniform, so that light is uniformly incident on the contact surface of the film, and more uniform exposure and pattern formation are possible. .
The exposure system and method of the present invention transfer the film to which the film conveying part is in close contact with the curvature of an ellipse or a part thereof, and in other cases (for example, when the film is brought in close contact with the curvature of a circle or part thereof, as usual) Extensive areas of exposure and pattern formation per unit time are possible compared to the case of transferring the film to rolls arranged in a straight line.
In addition, the exposure system and method of the present invention can minimize the loss of light generated by the reflection and scattering of light incident on the surface when the surface of the film transfer part is antireflected and scattered, and the light of the intended intensity and amount is closely adhered. It can be applied on the film to form a uniform and accurate polarization pattern.
In addition, the film conveying part of the present invention can be easily implemented by placing a plurality of circular rollers spaced apart or adjacent to the trajectory having a curvature of an ellipse or a part thereof to add a support roll in a double or multiple shape to the bottom of the plurality of circular rollers. In this case, more stable system operation is possible.
1 shows an example of an exposure system of the present invention.
2 shows examples of the film conveying part of the present invention.
3 shows an example of the pattern forming portion of the present invention.
The present invention consists of a light emitting part, a film conveying part that is in close contact with the surface and bent at the curvature of an ellipse or a part thereof, and is bent at the same curvature as the above curvature, and the light emitted from the light emitting part is curved at the above curvature. By including a pattern forming portion that transfers to the film to form a polarization pattern, even when forming the polarization pattern while continuously unwinding the film wound on the roll, it is possible to minimize the shaking and meandering of the film. The present invention relates to an exposure system and an exposure method using the same, which can contribute to an increase in production quality and efficiency.
Hereinafter, the present invention will be described in detail.
The exposure system of the present invention can be configured, for example, as in FIG. The exposure system of FIG. 1 is a system for forming a polarization pattern by irradiating light to the polarizing film F for 3D displays.
In the exposure system according to the present exemplary embodiment, the
The
The
The
The
An adhesive layer or an anti-slip layer may be formed on the surface of the film conveying part if necessary to convey the film in close contact. If sufficient tension is applied to the film to be transported, a separate layer for adhesion may not be formed.
The
The
Light transmitted from the
In addition, the curved surface of the
The detailed structure of the
As shown in FIG. 3, the
The
The
In detail, the
The
The distance between the curved surface of the
Up to now, the preferred embodiment has been described in detail with reference to an exposure system for uniformly irradiating light with the film F in close contact with the cylindrical
In the present embodiment, it is assumed that light is transmitted from the
Through an optical system of a type different from that of the type shown in FIG. 1, it is possible to implement light to be transmitted from the
In addition, although it is assumed that the curved surface of the
Meanwhile, in the above embodiment, it is assumed that the curved surfaces of the
In addition, in the above embodiment, the film F is assumed to be the elliptical roller
In addition, in the above embodiment, the
In addition, in the above embodiment, the
In addition, in the above embodiment, the curved surface of the portion including the
For example, the radius of curvature of the mask can be implemented to be adjusted by a fixing device that can adjust the distance between two sides of the mask fixed to the pattern forming portion.
The exposure system assumed in the above embodiment is a system for forming a polarization pattern on the polarizing film for 3D display. However, the technical idea of the present invention is also applicable to the case of forming a pattern on a film other than the polarizing film for 3D display.
In addition, although the preferred embodiment of the present invention has been shown and described above, the present invention is not limited to the specific embodiments described above, but the technical field to which the invention belongs without departing from the spirit of the invention claimed in the claims. Of course, various modifications can be made by those skilled in the art, and these modifications should not be individually understood from the technical spirit or the prospect of the present invention.
110: lamp 120: reflector-1
130: condenser 140: reflector-2
150: pattern forming unit 151: chamber
153: polarizer 155: polarizer fixing portion
157: mask fixing portion 159: mask
160: film transfer unit
Claims (20)
A film transfer part in which the film adheres to the surface thereof and moves while being bent at the curvature of the ellipse or a part thereof; And
And a pattern forming part configured to be bent at the same curvature as the curvature and to transmit the light emitted from the light emitting part to the curved film at the curvature to form a polarization pattern.
And irradiating light to the film bent at the curvature to form a polarization pattern on the film by irradiating light through a pattern forming unit configured to be bent at the same curvature as the curvature.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020110083428A KR20130021103A (en) | 2011-08-22 | 2011-08-22 | Exposure system and exposure method using the system |
JP2013524807A JP5695197B2 (en) | 2010-09-29 | 2011-09-28 | Exposure system |
CN201180046322.4A CN103119519B (en) | 2010-09-29 | 2011-09-28 | Exposure system |
PCT/KR2011/007166 WO2012044077A2 (en) | 2010-09-29 | 2011-09-28 | Light-exposure system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020110083428A KR20130021103A (en) | 2011-08-22 | 2011-08-22 | Exposure system and exposure method using the system |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20130021103A true KR20130021103A (en) | 2013-03-05 |
Family
ID=48174131
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020110083428A KR20130021103A (en) | 2010-09-29 | 2011-08-22 | Exposure system and exposure method using the system |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20130021103A (en) |
-
2011
- 2011-08-22 KR KR1020110083428A patent/KR20130021103A/en not_active Application Discontinuation
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