KR20120075233A - Apparatus for imaging slab surface - Google Patents

Apparatus for imaging slab surface Download PDF

Info

Publication number
KR20120075233A
KR20120075233A KR1020100137291A KR20100137291A KR20120075233A KR 20120075233 A KR20120075233 A KR 20120075233A KR 1020100137291 A KR1020100137291 A KR 1020100137291A KR 20100137291 A KR20100137291 A KR 20100137291A KR 20120075233 A KR20120075233 A KR 20120075233A
Authority
KR
South Korea
Prior art keywords
slab
camera
reflector
angle
light
Prior art date
Application number
KR1020100137291A
Other languages
Korean (ko)
Other versions
KR101228741B1 (en
Inventor
김기원
윤종규
Original Assignee
주식회사 포스코
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 포스코 filed Critical 주식회사 포스코
Priority to KR1020100137291A priority Critical patent/KR101228741B1/en
Publication of KR20120075233A publication Critical patent/KR20120075233A/en
Application granted granted Critical
Publication of KR101228741B1 publication Critical patent/KR101228741B1/en

Links

Images

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B22—CASTING; POWDER METALLURGY
    • B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D11/00—Continuous casting of metals, i.e. casting in indefinite lengths
    • B22D11/16—Controlling or regulating processes or operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Textile Engineering (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Mechanical Engineering (AREA)

Abstract

The present invention provides a light source for irradiating light onto a slab surface, a reflector for reflecting light reflected from the surface of the slab, a camera for photographing the surface of the slab through light reflected from the reflector, and the camera. Provided is a slab surface flaw detection apparatus including an image processor for detecting a defect of the slab from the image of the slab photographed.

Description

Slab surface flaw detector {APPARATUS FOR IMAGING SLAB SURFACE}

The present invention relates to a slab surface flaw detector, and more particularly to a slab surface flaw detector that can detect the surface of the surface-scarved slab to detect defects in the slab surface.

The slab produced through the continuous casting process of the steel mill is scaled by oxidation or the like on the surface thereof, and thus undergoes a scarfing operation to remove it. Even after the scarfing operation, the slabs may have local surface defects, which are removed with a hand scarfing device or the like.

At this time, the slab surface flaw detection device is used to find the surface defects of the slab in which the scarfing operation is completed. However, according to the related art, after setting up the slab surface flaw detector, the position and angle of the camera should be changed according to the material and composition of the slab which is the flaw detection agent.

1 is a schematic diagram showing a basic configuration of a general slab surface flaw detector. As shown in FIG. 1, the general slab surface flaw detector includes a light source 20 for irradiating light to the surface of the slab 10 and a CCD camera 30 for imaging an area irradiated with light by the light source 20. ). The light irradiated from the light source 10 is reflected by the slab, and the amount of reflected light varies depending on the position of the CCD camera 30. For example, as shown in FIG. 1, the reflected light can be divided into light and dark areas,

At this time, it is preferable that the CCD camera 30 receives an appropriate amount of light from the light reflected from the surface of the slab in order to accurately detect the surface of the slab. However, since the amount of light reflected from the surface of the slab varies according to the slab material or component, as described above, the position and angle of the CCD camera 30 had to be changed according to the material or component of the slab in order to receive the appropriate light amount. . However, changing the position and angle of the CCD camera 30 is not only easy to change this setting, but also has a problem of realigning the arrangement between the respective components of the slab surface flaw detector.

The present invention provides a slab surface flaw detection apparatus that can minimize system changes when changing working conditions after installation without being constrained by the installation space.

According to an aspect of the present invention, a light source for irradiating light on the surface of the slab, a reflector for reflecting the light reflected back from the surface of the slab, a camera for imaging the surface of the slab through the light reflected from the reflecting unit; And a slab surface flaw detector including an image processor for detecting a defect of the slab from an image of the slab photographed by the camera.

In an embodiment, the surface flaw detector may include a position adjuster for horizontally moving the camera and the reflector in a direction parallel to a direction in which the slab travels, and light reflected from the surface of the slab irradiated by the light source to the camera. It may further include an angle adjuster for adjusting the angle of the reflector to face.

In an embodiment, the position adjusting unit may move the position of the camera and the reflecting unit according to the carbon content of the slab, and the angle adjusting unit may adjust the angle of the reflecting unit according to the carbon content of the slab.

The image processor may detect brightness information of an image of the slab photographed by the camera, and the position adjuster may move a position of the camera and the reflector in accordance with the brightness information. The angle of the reflector may be moved according to the brightness information.

In one embodiment, the slab surface flaw detection apparatus may further include an air purge unit to purge air to the reflecting unit to prevent contamination of the reflecting unit.

According to one embodiment of the present invention, the surface of the scarfed slab can be inspected while minimizing the positional movement of the camera.

1 is a schematic diagram showing a basic configuration of a general slab surface flaw detector.
2 is a schematic diagram of a slab surface flaw detection apparatus according to an embodiment of the present invention.

Hereinafter, a slab surface flaw detector according to an embodiment of the present invention will be described with reference to the accompanying drawings.

2 shows a schematic view of a slab surface flaw detector according to one embodiment of the present invention. As shown in FIG. 2, the slab surface flaw detector includes a light source 110 that irradiates light onto the surface of the slab 10, a reflector 120 that reflects light reflected from the surface of the slab, and a reflector. And a camera 130 for imaging the surface of the slab 10 from the light reflected from the 120.

In the slab surface flaw detector, when light is irradiated to the flaw detection point of the slab 10 which is a flaw detection object by the light source 110, this light is reflected from the surface of the slab 10 and heads to the upper part of the slab 10. The slab 10 is preferably a slab in which a scarfing operation is completed. Since the surface of the slab 10 is not a perfect planar state such as a mirror, the light irradiated onto the slab is reflected at a predetermined reflection angle according to the surface state of the slab or the like. Thus, the light reflected at the slab surface spreads and is reflected from the slab surface. The extent to which the reflected light spreads and the amount of light vary depending on the type of steel of the slab 10.

The reflected light is reflected to the camera 130 through the reflector 120, and the camera 130 may capture the surface of the slab by capturing the reflected light. Meanwhile, in one embodiment, the camera 130 may further include an image processor 160 for processing an image of the slab photographed by the camera 130 to detect a defect of the slab. In addition, since the surface of the slab photographed through the reflector 120 is an image inverting the original slab surface, the image processor 160 processes the image by inverting the image photographed by the camera 130, thereby not inverting the slab. Defects can be detected by processing an image of the surface.

The reflector 120 may be made of various materials, but a stainless steel mirror may be used that is heat resistant and has good reflection characteristics. However, the present invention is not limited thereto, and reflective parts of various materials may be used.

In addition, in one embodiment of the present invention, the position of the reflector 120 and the camera 130 may further include a position adjuster 140 for horizontally moving in a direction parallel to the advancing direction of the slab. The amount of light reflected from the surface of the slab varies depending on the location where the light spreads, and the amount of light varies depending on the state of the surface of the slab or the state of the material of the slab, so that the amount of light incident on the camera 130 through the reflector 120 may vary. In order to maintain the quantity in a constant amount, the imaging position of the slab, that is, the relative position of the reflector 120 and the camera 130 with respect to the portion of the slab to which light is radiated by the light source 110 may be varied. At this time, the light reflected from the reflector 120 may further include an angle adjuster 150 for adjusting the angle of the reflector 120 to face the camera 130. In this case, the relative positions of the reflector 120 and the camera 130 may be varied or fixed.

Meanwhile, the positions of the reflector 120 and the camera 130 and the angle of the reflector 120 may be adjusted according to the amount of carbon included in the slab 10 in one embodiment. For example, the amount of carbon included in the slab 10 is divided by sections, and the optimum reflector 120, the camera 130 position, and the angle of the reflector 120 corresponding to each section are preset. Then, by receiving information about the charged slab 10 from another device, it is determined in which case the amount of carbon contained in the corresponding slab 10 corresponds to, and in which section. Subsequently, the positions of the reflector 120 and the camera 130 and the angles of the reflector 120 are adjusted according to values set according to the corresponding section.

As such, according to the amount of carbon contained in the slab, the slab according to the state of the slab 10 is moved by moving the reflector 120 and the camera 130 to a predetermined position and adjusting the angle of the reflector 120. The flaw detection of a surface can be performed easily.

Meanwhile, instead of this, the camera 130 may adjust the positions of the reflector 120 and the camera 130 according to the amount of light received by the camera 130, and adjust the angle of the reflector 120. . For example, the brightness or the range of brightness that the image of the slab surface picked up by the camera 130 processed by the image processor 160 is preferably set in advance, and the positions of the reflector 120 and the camera 130 are adjusted. By adjusting or adjusting the angle of the reflector 120, the position of the reflector 120 and the camera 130 and the reflection so that the brightness of the image captured by the camera 130 becomes or falls within the corresponding brightness range. The angle of the part 120 may be found in real time to photograph the slab surface.

As such, by moving the reflector 120 and the camera 130 in accordance with the brightness of the image captured by the camera 130 and by adjusting the angle so that the light reflected from the reflector 120 toward the camera 130, The flaw detection of the slab surface can be easily performed. That is, even if the slab which is a flaw detection object is changed, the flaw of the surface of a slab can be detected easily by adjusting only a camera and a reflecting part.

In another embodiment of the present invention, the slab surface flaw detection device may further include an air purge unit 170 to purge the air to the reflector 120 to prevent contamination of the reflector 120. By using the air purge part, since the dust can be controlled by the reflecting part in a dusty use environment, the camera 130 can image an image of a better quality.

The present invention is not limited by the above-described embodiments and the accompanying drawings, but by the appended claims. Therefore, it will be apparent to those skilled in the art that various forms of substitution, modification, and alteration are possible without departing from the technical spirit of the present invention described in the claims, and the appended claims. Will belong to the technical spirit described in.

10 slabs
20 light source
30 cameras
110 light source
120 camera
130 reflectors
140 position adjustment
150 angle adjustment
160 image processing unit
170 air purge

Claims (5)

A light source for irradiating light onto the surface of the slab;
A reflector reflecting light reflected from the surface of the slab;
A camera for imaging the slab surface through the light reflected from the reflector; And
An image processing unit for detecting a defect of the slab from the image of the slab photographed by the camera
Including,
Slab surface flaw detector.
The method of claim 1,
A position adjusting unit which horizontally moves the camera and the reflecting unit in a direction parallel to a traveling direction of the slab; And
An angle adjuster for adjusting an angle of the reflector so that light reflected from the surface of the slab irradiated by the light source is directed to the camera.
Further comprising,
Slab surface flaw detector.
The method of claim 2,
The position adjusting unit moves the position of the camera and the reflecting unit in accordance with the carbon content of the slab,
The angle adjustment unit adjusts the angle of the reflector in accordance with the carbon content of the slab,
Slab surface flaw detector.
The method of claim 2,
The image processing unit detects brightness information of an image of the slab photographed by the camera,
The position adjusting unit moves the position of the camera and the reflecting unit according to the brightness information,
The angle adjusting unit moves the angle of the reflecting unit according to the brightness information,
Slab surface flaw detector.
The method of claim 1,
Further comprising an air purge to purge the air to the reflecting unit to prevent contamination of the reflecting unit,
Slab surface flaw detector.
KR1020100137291A 2010-12-28 2010-12-28 Apparatus for imaging slab surface KR101228741B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020100137291A KR101228741B1 (en) 2010-12-28 2010-12-28 Apparatus for imaging slab surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020100137291A KR101228741B1 (en) 2010-12-28 2010-12-28 Apparatus for imaging slab surface

Publications (2)

Publication Number Publication Date
KR20120075233A true KR20120075233A (en) 2012-07-06
KR101228741B1 KR101228741B1 (en) 2013-02-04

Family

ID=46709250

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020100137291A KR101228741B1 (en) 2010-12-28 2010-12-28 Apparatus for imaging slab surface

Country Status (1)

Country Link
KR (1) KR101228741B1 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0626841A (en) * 1991-07-19 1994-02-04 Hitachi Ltd One-dimensional scanning type surface displacement meter
JP2000065553A (en) 1998-08-24 2000-03-03 Hitachi Ltd Magnetic disc surface defect detector and frictional tester
JP3531002B2 (en) * 2000-02-23 2004-05-24 Ｊｆｅスチール株式会社 Surface inspection device
KR100928792B1 (en) * 2006-12-20 2009-11-25 주식회사 포스코 Flaw Detection Device on Slab Surface

Also Published As

Publication number Publication date
KR101228741B1 (en) 2013-02-04

Similar Documents

Publication Publication Date Title
TWI448681B (en) A method and an apparatus for simultaneous 2d and 3d optical inspection and acquisition of optical inspection data of an object
WO2003069263A3 (en) System for detecting anomalies and/or features of a surface
JP2007303829A (en) Image inspection device, and image inspection method using the image inspection device
JP2007248086A5 (en)
JP5144401B2 (en) Wafer inspection equipment
TW201140043A (en) End face inspection method for light-pervious rectangular sheets and end face inspection apparatus
KR101711849B1 (en) Method and apparatus for acquiring image of inner plane
US8625089B2 (en) Foreign matter inspection apparatus and foreign matter inspection method
JP6387381B2 (en) Autofocus system, method and image inspection apparatus
FI20000369A0 (en) Method for performing mullet photography
KR101228741B1 (en) Apparatus for imaging slab surface
WO2008119550A1 (en) Inspection apparatus and method
JP2004219358A (en) Apparatus for detecting surface flaw in billet
JP2007334423A (en) Automatic photographing device
JP4550488B2 (en) Detection optical device and defect inspection device
WO2020121784A1 (en) Workpiece inspection device and workpiece inspection method
EP1720353A3 (en) Object detection apparatus and method for a vehicle
JP2015104832A (en) Inspection device for sheet-like object
JP2010122155A (en) Method for detecting defect in plate-like body and defect detector
JP2007003332A (en) Method and detector for detecting defect on planar body side face
CN110333248A (en) The differentiating method of glass surface defects and surface dust fall
JP2002303582A (en) Thick plate surface flaw inspecting method and its device
JP5857682B2 (en) H-shaped steel flaw detection method and apparatus
JP2011117793A (en) Method and device for measuring surface properties
TWI688820B (en) Impurity removal assembly of light-transmitting thin film on mask glass substrate

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20160125

Year of fee payment: 4

FPAY Annual fee payment

Payment date: 20170120

Year of fee payment: 5

FPAY Annual fee payment

Payment date: 20180125

Year of fee payment: 6

FPAY Annual fee payment

Payment date: 20190123

Year of fee payment: 7