KR20110103878A - Dielectric ceramic composition and electronic component - Google Patents

Abstract

It is to provide a dielectric ceramic composition having high relative dielectric constant and alternating current breakdown voltage, low dielectric loss, and good temperature characteristics and sinterability.
(Ba _{1 -uvw} , Ca _u , Mg _v , Sr _w ) A dielectric ceramic composition having a main component represented by the composition formula of _α (Ti _{1 -x} , Zr _x ) 0 ₃ , nickel oxide, cerium oxide, and manganese oxide U is 0.20 to 0.27 in the composition formula, v in the composition formula is 0.018 to 0.049, w in the composition formula is 0.004 to 0.018, x in the composition formula is 0.118 to 0.149, and α in the composition formula is 0.95 to 1.02. The nickel oxide is contained 0.03 to 0.4 parts by weight based on 100 parts by weight of the main component, the cerium oxide is contained 0.03 to 0.4 parts by weight based on 100 parts by weight of the main component, and the manganese oxide is contained in 100 parts by weight of the main component. A dielectric ceramic composition containing from 0.03 to 0.4 parts by weight.

Description

Dielectric Ceramic Composition and Electronic Component {DIELECTRIC CERAMIC COMPOSITION AND ELECTRONIC COMPONENT}

The present invention relates to dielectric ceramic compositions and electronic components.

In recent years, with the high performance of the rapidly progressing electrical equipment, the miniaturization and complexity of electrical circuits are also rapidly progressing. Therefore, further miniaturization and high performance are required for electronic components. In other words, a dielectric ceramic composition and an electronic component having a high dielectric constant and a high alternating current breakdown voltage are required to maintain the electrostatic capacity even in miniaturization while maintaining good temperature characteristics.

BACKGROUND ART Conventionally, what is disclosed in Patent Document 1 is known as a high-k dielectric ceramic composition widely used as a magnetic capacitor, a multilayer capacitor, a high frequency capacitor, a high voltage capacitor, and the like. This patent document 1 has a barium titanate whose composition formula is represented by (Ba _{1 - x} Ca _x ) (Ti _{1 - y} Zr _y ) 0 ₃ (wherein 0.10 <x ≦ 0.25 and 0 <y ≦ 0.25). Dielectric ceramic compositions are disclosed.

Further, Patent Document 2 includes a barium titanate whose composition formula is represented by (Ba _{1 - x} Ca _x ) (Ti _{1 - y} Zr _y ) 0 ₃ (where 0 <x ≦ 0.25 and 0 <y ≦ 0.25). Also disclosed is a dielectric ceramic composition containing Y ₂ O ₃ , MgO, and Al ₂ O ₃ .

However, in such a conventional high dielectric constant dielectric ceramic composition, when the relative dielectric constant is set to 3000 or more, it is difficult to reduce the dielectric loss and to secure a high AC breakdown voltage of 6 kV / mm or more.

Patent Document 1: Japanese Unexamined Patent Publication No. 2003-104774 Patent Document 2: Japanese Unexamined Patent Publication No. 2003-109430

This invention is made | formed in view of such a situation, and the objective is to provide the dielectric ceramic composition with high dielectric constant and alternating current breakdown voltage, low dielectric loss, and favorable temperature characteristic and sinterability. Moreover, an object of this invention is to provide the electronic component which has a dielectric layer comprised with such a dielectric ceramic composition.

MEANS TO SOLVE THE PROBLEM As a result of earnestly examining in order to achieve the said objective, the present inventors discovered that the said objective can be achieved by making a composition of a dielectric ceramic composition into a specific component, and making these ratio into a predetermined range, The invention has been completed.

That is, the dielectric ceramic composition according to the present invention, which solves the above problems, includes a main component represented by the composition formula of (Ba _{1 -uvw} , Ca _u , Mg _v , Sr _w ) _α (Ti _{1 -x} , Zr _x ) 0 ₃ ; A dielectric ceramic composition having nickel oxide, cerium oxide and manganese oxide,

U in the said composition formula is 0.20-0.27,

V in the said composition formula is 0.018-0.049,

W in the said composition formula is 0.004-0.018,

X in the said composition formula is 0.118-0.149,

Α in the composition formula is 0.95 to 1.02,

0.03 to 0.4 parts by weight of nickel nickel based on 100 parts by weight of the main component,

0.03 to 0.4 parts by weight of cerium oxide based on 100 parts by weight of the main component,

A dielectric ceramic composition containing 0.03 to 0.4 parts by weight of the manganese oxide based on 100 parts by weight of the main component.

According to the present invention, it is possible to provide a dielectric ceramic composition having high relative dielectric constant and alternating current breakdown voltage, low dielectric loss, and good temperature characteristics and sinterability. Moreover, according to this invention, the dielectric ceramic composition which can prevent the thermal runaway at room temperature can be provided. Specifically, thermal runaway at room temperature can be prevented by setting the Curie temperature of the dielectric ceramic composition to 20 ° C. or lower.

Here, thermal runaway is a phenomenon in which the temperature cannot be controlled by the positive feedback that the heat generation causes another heat generation.

An electronic component according to an embodiment of the present invention has a dielectric layer composed of the dielectric ceramic composition.

The electronic component according to the embodiment of the present invention is not particularly limited, but may be a single plate ceramic capacitor, a through capacitor, a multilayer ceramic capacitor, a piezoelectric element, a chip inductor, a chip varistor, a chip thermistor, a chip resistor, or other surface mount (SMD). A chip type electronic component is illustrated.

The present invention can provide a dielectric ceramic composition having high relative dielectric constant and alternating current breakdown voltage, low dielectric loss, and good temperature characteristics and sinterability. Moreover, this invention can provide the electronic component which has a dielectric layer comprised with such a dielectric ceramic composition.

1: (A) is a front view of the ceramic capacitor which concerns on one Embodiment of this invention, and FIG. 1 (B) is a side sectional view of the ceramic capacitor which concerns on one Embodiment of this invention.
2 is a perspective view of a through-type capacitor according to an embodiment of the present invention.
3 is a graph showing the relationship of relative dielectric constant with respect to the temperature of the dielectric ceramic composition according to the embodiment of the present invention.

EMBODIMENT OF THE INVENTION Hereinafter, embodiment of this invention is described based on embodiment shown in drawing.

Ceramic Capacitors (2)

As shown in Fig. 1A, the ceramic capacitor 2 according to the embodiment of the present invention includes a dielectric layer 10, a pair of terminal electrodes 12 and 14 formed on the opposite surface thereof, and the terminal electrode. It has the structure which has the lead terminals 6 and 8 connected to 12 and 14, respectively, and these are covered by the protective resin 4. As shown in FIG. Although the shape of the ceramic capacitor | condenser 2 may be suitably determined according to an objective and a use, it is preferable that it is a disc shaped capacitor | condenser in which the dielectric layer 10 becomes disk shape. Moreover, what is necessary is just to determine the size suitably according to an objective and a use, Usually, diameter is about 5-20 mm, Preferably it is about 5-15 mm.

The thickness of the dielectric layer 10 is not specifically limited, What is necessary is just to determine suitably according to a use etc., Preferably it is 0.3-2 mm. By setting the thickness of the dielectric layer 10 in such a range, it can utilize suitably for a high pressure application.

The terminal electrodes 12 and 14 are made of a conductive material. As a electrically conductive material used for the terminal electrodes 12 and 14, Cu, Cu alloy, Ag, Ag alloy, In-Ga alloy etc. are mentioned, for example.

Dielectric layer 10

The dielectric layer 10 of the ceramic capacitor 2 is made of the dielectric ceramic composition according to the embodiment of the present invention.

The dielectric ceramic composition according to the embodiment of the present invention comprises a main component represented by a composition formula of (Ba _{1 -uvw} , Ca _u , Mg _v , Sr _w ) _α (Ti _{1 -x} , Zr _x ) 0 ₃ , nickel oxide, Dielectric ceramic composition having cerium oxide and manganese oxide.

U in the said composition formula shows the ratio of Ca, The range is 0.20 to 0.27, Preferably it is 0.22 to 0.24. By containing Ca in this range, the dielectric constant is improved, the dielectric loss is lowered, and the temperature characteristics tend to be good.

V in the said composition formula shows the ratio of Mg, The range is 0.018-0.049, Preferably it is 0.028-0.03. By containing Mg in this range, relative dielectric constant, alternating current breakdown voltage, and sinterability will improve, and it will become the tendency for temperature characteristics to become favorable.

W in the said composition formula shows the ratio of Sr, The range is 0.004-0.018, Preferably it is 0.015-0.017. By containing Sr in this range, temperature characteristics become good and a dielectric loss tends to fall.

X in the said composition formula shows the ratio of Zr, The range is 0.118-0.149, Preferably it is 0.13-0.14. By containing Zr in this range, dielectric loss will fall, alternating current breakdown voltage will improve, and temperature characteristics will become favorable.

(Alpha) in the said composition formula is 0.95-1.02, More preferably, it is 1.01-1.015. By setting α in this range, the dielectric constant and the sinterability are improved, and the dielectric loss and the Curie temperature tend to be lowered.

In the dielectric ceramic composition according to the embodiment of the present invention, the nickel oxide is contained 0.03 to 0.4 parts by weight with respect to 100 parts by weight of the main component, preferably 0.05 to 0.3 parts by weight, more preferably 0.1 to 0.2 parts by weight. do. When nickel oxide is contained in this range, it will tend to improve relative permittivity, alternating current breakdown voltage, and sinterability.

The dielectric ceramic composition according to the embodiment of the present invention contains cerium oxide in an amount of 0.03 to 0.4 parts by weight with respect to 100 parts by weight of the main component, preferably 0.05 to 0.3 parts by weight, more preferably 0.1 to 0.2 parts by weight. do. By containing cerium oxide in this range, a temperature characteristic becomes favorable, an alternating current breakdown voltage and a dielectric constant improve, and a dielectric loss tends to fall.

The dielectric ceramic composition according to the embodiment of the present invention contains manganese oxide in an amount of 0.03 to 0.4 parts by weight with respect to 100 parts by weight of the main component, preferably 0.05 to 0.3 parts by weight, more preferably 0.1 to 0.2 parts by weight. do. By containing manganese oxide in this range, the dielectric constant, the alternating current breakdown voltage, and the sintering property are improved, and the dielectric loss tends to be lowered.

Hereinafter, nickel oxide, cerium oxide, or manganese oxide is used as a "subcomponent."

Manufacturing Method of Ceramic Capacitor 2

Next, the manufacturing method of the ceramic capacitor 2 is demonstrated.

First, a dielectric ceramic composition powder is formed in which the dielectric layer 10 shown in FIG. 1 is formed after firing.

Prepare the raw material of the main ingredient and the raw material of each sub ingredient. As the materials of the main component, there may be mentioned Ba, Ca, Mg, Sr, Ti, materials which become oxides by the oxides and / or calcination of Zr or the like of these composite oxides, e.g., barium carbonate (BaCO ₃ ), Calcium carbonate (CaCO ₃ ), magnesium carbonate (MgCO ₃ ), strontium carbonate (SrCO ₃ ), titanium oxide (TiO ₂ ), zirconium oxide (ZrO ₂ ), nickel oxide (NiO), cerium oxide (CeO ₂ ), Manganese oxide (MnO) etc. can be used. In addition, for example, various compounds which become oxides or titanium compounds after firing, such as hydroxides, can also be used. In that case, content may be changed suitably so that the number of elements of a metal element may match.

Moreover, although the raw material of a main component may be manufactured by the solid-phase method, and may be manufactured by liquid phase methods, such as a hydrothermal synthesis method and an oxalate method, it is preferable to manufacture by the solid-phase method from a manufacturing cost viewpoint.

It does not specifically limit as a raw material of each subcomponent, According to the above-mentioned oxide and complex oxide of each subcomponent, or various compounds which become these oxides or a complex oxide by baking, for example, carbonate, nitrate, hydroxide, an organometallic compound, etc. suitably It can be selected and used.

As a method for producing a dielectric ceramic composition according to an embodiment of the present invention, first, a raw material of a main component or a raw material of a main component and a subcomponent are blended and wet-mixed using a ball mill made of zirconium oxide or the like. When mix | blending a subcomponent at this time, each subcomponent may be mix | blended so that it may become the composition of said dielectric ceramic composition, and only a part may be mix | blended and the remaining subcomponent may be added after calcining.

A calcined powder can be obtained by granulating the obtained mixture and calcining the molded product obtained by molding in an air atmosphere. As calcining conditions, for example, the calcining temperature is preferably 1000 to 1300 ° C, more preferably 1150 to 1250 ° C, and the calcining time is preferably 0.5 to 4 hours. Further, the raw material of the main component and the raw material of the subcomponent may be separately calcined, and then mixed to obtain a dielectric ceramic composition powder.

Then, the obtained calcined powder is roughly ground. Here, the subcomponent is added in combination with the raw material of the subcomponent added before the calcination to form the above-mentioned dielectric ceramic composition.

The calcined powder or the calcined powder and the raw material of the subcomponent are wet-pulverized by a ball mill or the like, further mixed and dried to obtain a dielectric ceramic composition powder. As described above, by producing the dielectric ceramic composition powder by the solid phase method, it is possible to reduce the manufacturing cost while realizing desired characteristics.

Next, an appropriate amount of a binder is added to the obtained dielectric ceramic composition powder, and the granulated product obtained by granulation is compression molded into a disc shape having a predetermined size to obtain a green molded body. Then, by firing the obtained green molded body, a sintered body of the dielectric ceramic composition is obtained. Moreover, although it does not specifically limit as conditions of baking, Preferably holding temperature is 1200-1400 degreeC, More preferably, it is 1280-1360 degreeC, It is preferable to make baking atmosphere into air.

The terminal electrodes are printed on the main surface of the obtained sintered body of the dielectric ceramic composition and baked as necessary to form the terminal electrodes 12 and 14. Thereafter, the lead terminals 6 and 8 are bonded to the terminal electrodes 12 and 14 by soldering or the like, and finally, the element body is covered with the protective resin 4 to thereby cover FIGS. 1A and 1. A single plate ceramic capacitor as shown in (B) is obtained.

The ceramic capacitor of the present invention thus produced is mounted on a printed board or the like through the lead terminals 6 and 8 and used for various electronic devices.

As mentioned above, although embodiment of this invention was described, this invention is not limited to this embodiment at all, It is a matter of course that it can implement in various different aspects within the range which does not deviate from the summary of this invention.

In the above-mentioned embodiment, although the single-layer ceramic capacitor whose dielectric layer is single layer was illustrated as the electronic component which concerns on this invention, the electronic component which concerns on this invention is not limited to a single-plate ceramic capacitor, Comprising: The said dielectric ceramic composition is included. The multilayer ceramic capacitor produced by the conventional printing method or the sheet method using the dielectric paste and electrode paste which are mentioned may be sufficient.

For example, the dielectric layer 210 of the through capacitor 22 shown in FIG. 2 may be produced using the above dielectric ceramic composition. The through-type capacitor 22 has a dielectric layer 210, individual electrodes 212a and 212b that are isolated from each other on one surface of the dielectric layer 210, and a common electrode 214 formed on the opposing surface of the individual electrodes. In the dielectric layer 210, the individual electrodes 212a and 212b and the common electrode 214, two through holes 216a and 216b are formed.

The dielectric layer 210 can be manufactured in the same manner as the dielectric layer 10 of the ceramic capacitor 2 described above. In addition, the through holes 216a and 216b of the dielectric layer 210 can be formed when compression molding a granulated body of dielectric ceramic composition powder.

<Examples>

EMBODIMENT OF THE INVENTION Hereinafter, although this invention is demonstrated based on a more detailed Example, this invention is not limited to these Examples.

Sample 1

As raw materials of the main components, BaCO ₃ , CaCO ₃ , MgCO ₃ , SrCO ₃ , TiO ₂ and ZrO ₂ were prepared, respectively. Further, as a material of the sub-component, it was prepared NiO, CeO _2, MnCO _3, respectively. Then, these prepared raw materials were weighed so as to have the composition shown in Sample 1 of Table 1, and the mixed solution was subjected to wet mixing and stirring for 3 hours using a ball mill, and after dehydration and drying, calcined at 1170 to 1210 ° C. The reaction was made.

Then, this was roughly ground, finely ground with a pot mill, dehydrated and dried, and polyvinyl alcohol (PVA) was added thereto as an organic binder, and granulated and granulated to obtain granular powder. This granulated powder was molded at a pressure of 300 MPa to form a disk shaped molded article having a diameter of 16.5 mm and a thickness of 1.15 mm.

The obtained molded object was fired in the air at around 1350 ° C. to obtain a magnetic body. The baking electrode was formed on both surfaces of the thus obtained magnetic body by silver (Ag) paste, and the lead wire was soldered to this to obtain a magnetic capacitor. Table 3 shows the results of measuring the relative dielectric constant, dielectric loss, alternating current breakdown voltage, Curie temperature, temperature characteristics, and sinterability of the sample thus obtained.

(Dielectric constant (ε))

The relative dielectric constant ε is a capacitance measured under a condition of a frequency of 1 kHz and an input signal level (measured voltage) of 1.OVrms at a reference temperature of 20 ° C with a digital LCR meter (4274A manufactured by Agilent Technologies) with respect to the capacitor sample. It was calculated from (there is no unit). It is preferable that the relative dielectric constant is higher, and in this example, 3000 or more is considered to be good.

(Dielectric loss (tanδ))

The dielectric loss tan δ was measured under a condition of a frequency of 1 kHz and an input signal level (measured voltage) of 1.OVrms with a digital LCR meter (4274A manufactured by Agilent Technologies) at a reference temperature of 20 ° C for the capacitor sample. The lower the dielectric loss, the better, and in this example, 0.5% or less was considered good.

(AC breakdown voltage (AC-Eb))

The AC breakdown voltage (AC-Eb) gradually applied an alternating current electric field at 100 V / s to both ends of the capacitor with respect to the sample of the capacitor, and measured the electric field value at the time when the leakage current of 100 mA flowed as the AC breaking electric field. It is preferable that the alternating current breakdown electric field is higher, and in this example, 6.OkV / mm or more is considered to be good.

Curie temperature (Cp)

The relationship of the dielectric constant with respect to the temperature when the atmospheric temperature of a capacitor | condenser sample was changed to -40-100 degreeC was graphed, and the inflection point was made into Curie temperature (Cp). In addition, the dielectric constant was measured by the said method. If the Curie temperature is higher than room temperature, thermal runaway may occur when the condenser is used at room temperature. Therefore, in the present Example, 20 degrees C or less was made into the preferable range. Moreover, about the sample 1 and the sample 41s, the graph which shows the change of the dielectric constant in the range of -40-100 degreeC is shown in FIG.

(Temperature characteristic (TC))

With respect to the capacitor sample, the capacitance was measured at a frequency of 1 kHz and an input signal level (measured voltage) of 1 Vrms with a digital LCR meter (4284A manufactured by YHP) at -25 ° C and 85 ° C. The change rate (unit:%) of the capacitance in -25 degreeC and 85 degreeC with respect to the capacitance of was computed. In the present embodiment, ΔC / C20 is + 20% to -55% as the preferred range, and when this range is satisfied at both -25 ° C and 85 ° C, &quot; ○ &quot; × ”.

(Sintering)

About the obtained sintered compact, the sintered compact density was computed from the dimension and the weight of the sintered compact after baking, and what made the thing whose sintered compact density is 5.2 g / cm <^3> or more (circle) and less than 5.2 g / cm <^3> was made into x. Here, because it is a reference to 5.2g / cm ³ less than, 5.2g / cm ³ less than when discarding the strength of the substrate is significantly reduced.

Sample 2 ~ 61

Except weighed to the composition shown in Samples 2 to 61 (Tables 1 and 2), after obtaining each capacitor sample in the same manner as Sample 1, the relative dielectric constant, dielectric loss, AC breakdown voltage, Curie temperature, temperature characteristics and sinterability Evaluated. The results are shown in Table 3 or 4.

From samples 1-12, it was confirmed that the sinterability was good when the α in the composition formula was 0.95 to 1.02 (samples 1, 3 to 11), and when the α exceeded 1.020 (sample 2). In addition, it was confirmed that the relative dielectric constant and the dielectric loss and the Curie temperature were lowered when the α in the composition formula was 0.95 to 1.02 (samples 1 and 3 to 11) and the α was less than 0.95 (sample 12). .

From samples 1 and 13 to 21, when u in the composition formula is 0.20 to 0.27 (samples 1 and 14 to 20), the relative dielectric constant is higher and dielectric loss is lower than that when u exceeds 0.27 (sample 13). I could confirm that. Moreover, when u in a composition formula is 0.20 <= u <0.27 (samples 1, 14-20), it was confirmed that temperature characteristics become favorable compared with the case where u is less than 0.20 (sample 21).

From samples 1 and 22 to 26, the relative dielectric constant is high and the sinterability is good when v in the composition formula is 0.018 to 0.049 (samples 1 and 23 to 25), and when v exceeds 0.048 (sample 22). I could confirm it. Moreover, when v in the composition formula was 0.018 to 0.049 (samples 1 and 23 to 25), it was confirmed that the AC breakdown voltage was higher and the temperature characteristics were better than when v was less than 0.018 (sample 26).

From samples 1 and 27-33, when w in a composition formula was 0.004-0.018 (samples 1 and 28-32), it was confirmed that temperature characteristics become favorable compared with the case where w exceeds 0.018 (sample 27). Moreover, it was confirmed that the dielectric loss is lower when w in the composition formula is 0.004 to 0.018 (samples 1 and 28 to 32), and when w is less than 0.004 (sample 33).

From samples 1 and 34 to 41, when x in the composition formula is 0.118 to 0.149 (sample 35 to 40), compared with the case where x exceeds 0.149 (sample 34), the AC breakdown voltage becomes higher and the temperature characteristic becomes better. I could confirm it. In addition, when x in the composition formula is 0.118 to 0.149 (sample 35 to 40), and when x is less than 0.118 (sample 41), the alternating current breakdown voltage is higher, the temperature characteristics are better, and the dielectric loss is lowered. I could confirm it.

From samples 1 and 42 to 48, the content of nickel oxide is 0.03 to 0.4 parts by weight based on 100 parts by weight of the main component (samples 1 and 43 to 47), compared with the case of exceeding 0.4 parts by weight of nickel oxide (sample 42). It was confirmed that the relative dielectric constant and the alternating current breakdown voltage were increased, and the sinterability was good. When the content of nickel oxide is 0.03 to 0.4 parts by weight based on 100 parts by weight of the main component (samples 1 and 43 to 47), the relative dielectric constant and alternating current are compared to when the content of nickel oxide is less than 0.03 parts by weight (sample 48). It was confirmed that the breakdown voltage was increased.

From the sample 1, 49-55, when content of cerium oxide is 0.03-0.4 weight part with respect to 100 weight part of main components (sample 50-54), compared with the case where content of cerium oxide exceeds 0.4 weight part (sample 49), It was confirmed that the dielectric constant is high, the dielectric loss is low, and the temperature characteristics are good. Moreover, when content of cerium oxide is 0.03-0.4 weight part with respect to 100 weight part of main components (sample 50-54), an AC breakdown voltage becomes high compared with the case where content of cerium oxide is less than 0.03 weight part (sample 55), It was confirmed that the temperature characteristics were good.

From the samples 1 and 56 to 60, when the content of manganese oxide is 0.03 to 0.4 parts by weight based on 100 parts by weight of the main component (samples 1 and 57 to 59), compared to the case where the content of manganese oxide exceeds 0.4 parts by weight (sample 56). The dielectric constant, dielectric breakdown voltage, and dielectric loss were lowered. Moreover, when the content of manganese oxide is 0.03 to 0.4 parts by weight with respect to 100 parts by weight of the main component (samples 1 and 57 to 59), the relative dielectric constant is higher and the sinterability is higher than that when the content of manganese oxide is less than 0.03 parts by weight (sample 60). It confirmed that it became favorable.

The composition of the main component is 0.20 to 0.27, v is 0.018 to 0.049, w is 0.004 to 0.018, x is 0.118 to 0.149, and α is 0.95 to 1.02. ), Relative permittivity and alternating current breakdown voltage were lowered, dielectric loss was increased, and sinterability was deteriorated.

In addition, it can be seen from Fig. 3 (A) that Sample 1 has a Curie temperature of −10 ° C. and exceeds −10 ° C. and the relative dielectric constant decreases with an increase in temperature. In this way, when the Curie temperature is low at −10 ° C., the relative dielectric constant decreases with the increase of the temperature in the vicinity of room temperature (20 ° C.). As a result, even if the sample generates heat by alternating current electric field application, the relative dielectric constant decreases and heat generation is suppressed, thereby avoiding positive feedback that the heat generation causes another heat generation, thereby preventing thermal runaway.

On the other hand, from Fig. 3 (B), the sample 41s has a Curie temperature of 35 ° C., and the relative dielectric constant increases with temperature rise at 35 ° C. or lower, and the dielectric constant decreases with temperature rise at 35 ° C. or higher. there was. As described above, when the Curie temperature is high at 35 ° C, the relative dielectric constant increases up to the Curie temperature with the increase of the temperature in the vicinity of room temperature 20 ° C. Thereby, since the dielectric constant does not fall even if a sample generates heat by alternating current electric field application, there is a possibility that the heat generation becomes a positive feedback state that causes another heat generation and thermal runaway.

2 Single Plate Ceramic Capacitors 4 Protective Resin
6, 8 lead terminals, 10 dielectric layers
12, 14 Terminal Electrodes 22 Through Capacitor
210 dielectric layer 212a, 212b discrete electrodes
214 common electrode 216a, 216b through hole

Claims (2)

(Ba _{1 -uvw} , Ca _u , Mg _v , Sr _w ) A dielectric ceramic composition having a main component represented by the composition formula of _α (Ti _{1 -x} , Zr _x ) 0 ₃ , nickel oxide, cerium oxide, and manganese oxide as,
U in the said composition formula is 0.20-0.27,
V in the said composition formula is 0.018-0.049,
W in the said composition formula is 0.004-0.018,
X in the said composition formula is 0.118-0.149,
Α in the composition formula is 0.95 to 1.02,
0.03 to 0.4 parts by weight of nickel nickel based on 100 parts by weight of the main component,
0.03 to 0.4 parts by weight of cerium oxide based on 100 parts by weight of the main component,
A dielectric ceramic composition containing 0.03 to 0.4 parts by weight of the manganese oxide based on 100 parts by weight of the main component. An electronic component having a dielectric layer composed of the dielectric ceramic composition according to claim 1.

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