KR20110101698A - Solar cell and method for manufacturing the same - Google Patents
Solar cell and method for manufacturing the same Download PDFInfo
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- KR20110101698A KR20110101698A KR1020100020902A KR20100020902A KR20110101698A KR 20110101698 A KR20110101698 A KR 20110101698A KR 1020100020902 A KR1020100020902 A KR 1020100020902A KR 20100020902 A KR20100020902 A KR 20100020902A KR 20110101698 A KR20110101698 A KR 20110101698A
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- solar cell
- electrode
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- diffusion layer
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 32
- 238000000034 method Methods 0.000 title claims description 11
- 239000000758 substrate Substances 0.000 claims abstract description 76
- 238000009792 diffusion process Methods 0.000 claims abstract description 54
- 239000012535 impurity Substances 0.000 claims abstract description 14
- 238000005530 etching Methods 0.000 claims description 9
- 210000004027 cell Anatomy 0.000 abstract description 58
- 238000005215 recombination Methods 0.000 abstract description 4
- 230000006798 recombination Effects 0.000 abstract description 4
- 238000006243 chemical reaction Methods 0.000 abstract description 3
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 abstract description 2
- 230000004044 response Effects 0.000 abstract description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 18
- 239000011574 phosphorus Substances 0.000 description 18
- 229910052698 phosphorus Inorganic materials 0.000 description 18
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 15
- 229910052710 silicon Inorganic materials 0.000 description 15
- 239000010703 silicon Substances 0.000 description 15
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 12
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 8
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 7
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- 239000002585 base Substances 0.000 description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 229910021419 crystalline silicon Inorganic materials 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 5
- 150000001875 compounds Chemical class 0.000 description 4
- 239000002019 doping agent Substances 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 229960004592 isopropanol Drugs 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 4
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 3
- 229910004205 SiNX Inorganic materials 0.000 description 3
- QVMHUALAQYRRBM-UHFFFAOYSA-N [P].[P] Chemical compound [P].[P] QVMHUALAQYRRBM-UHFFFAOYSA-N 0.000 description 3
- 229910052796 boron Inorganic materials 0.000 description 3
- 239000000969 carrier Substances 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000005368 silicate glass Substances 0.000 description 3
- 235000012431 wafers Nutrition 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- MXLMTQWGSQIYOW-UHFFFAOYSA-N 3-methyl-2-butanol Chemical compound CC(C)C(C)O MXLMTQWGSQIYOW-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- XGCTUKUCGUNZDN-UHFFFAOYSA-N [B].O=O Chemical compound [B].O=O XGCTUKUCGUNZDN-UHFFFAOYSA-N 0.000 description 1
- 239000003929 acidic solution Substances 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 239000003637 basic solution Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 230000004083 survival effect Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/02168—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells the coatings being antireflective or having enhancing optical properties for the solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
- H01L31/02363—Special surface textures of the semiconductor body itself, e.g. textured active layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Sustainable Energy (AREA)
- Photovoltaic Devices (AREA)
Abstract
A solar cell using an N-type substrate and a method of manufacturing the same are disclosed. The greatest feature of the present invention is to provide a solar cell having excellent electrical characteristics and high efficiency by minimizing the contact resistance between the electrode of the battery and the substrate by selectively doping a high concentration of N-type impurities only in the region where the electrode of the battery is to be placed. Is that. In other words, by using the N-type substrate rather than the P-type substrate, the characteristics and advantages of the N-type substrate solar cell are utilized, and the phosphorous doping concentration of the FSF layer formed on the front surface of the cell to which the sunlight is incident is lowered so that the FSF layer and the Lowers the recombination of photo-generated electron-hole pairs on the cell surface, improving the blue response of the solar cell, and also improving the Al-doped P + diffusion layer (Emi). The present invention provides a solar cell and a method of manufacturing the same, which can achieve high light conversion efficiency even at a long wavelength.
Description
The present invention relates to a solar cell using an N-type substrate and a method of manufacturing the same, and more particularly, to a low phosphorus doping concentration of a front surface field (FSF) layer formed on a front surface of a cell into which sunlight is incident. This reduces the recombination rate of the photo-generated carriers on the FSF layer and the surface, increasing cell efficiency and selectively increasing the concentration of phosphorus in the region where the electrode is placed, which prevents sunlight from penetrating into the substrate. (Phosphorus) The present invention relates to a solar cell capable of lowering contact resistance between a battery electrode and a substrate (base region) by doping, and a method of manufacturing the same.
Over the past few years, global solar cell production has grown at a level of 30% annually and has increased dramatically. The main materials used in solar cell production are bulk crystalline P-type CZ (Czochralski) monocrystalline silicon and polycrystalline silicon, accounting for more than 80% of all solar cell production. However, in general, a solar cell made of a boron-doped CZ-type silicon substrate is exposed to light or has a problem in that the performance of the solar cell is degraded during long time storage even in a dark place. Many scientists are interested in this problem and are analyzing the cause of the problem. The representative cause is the combination of boron (oxygen), which is a dopant of P-type substrate when the solar cell is exposed to light. It is known to form compounds and to destroy photo-generated carriers.
Therefore, in order to solve the problem of deterioration of solar cell performance by light, the use of a CZ substrate having a high oxygen concentration using boron as a dopant should be avoided. Therefore, when using a P-type substrate, a low oxygen concentration FZ (floating zone) wafer or a gallium doped wafer should be used. These substrates have a disadvantage in that the manufacturing cost of the crystal ingot is expensive. In recent years, the use of N-type CZ wafers doped with phosphorus has been considered.
The advantages of using an N-type CZ silicon substrate in solar cell manufacturing are as follows.
a. Avoiding the problem of deterioration of solar cell performance by the formation of compounds of boron and oxygen
b. Minority carrier life time higher than P type
c.Easy surface passivation by silicon thermal oxide film
d. High conductivity at same substrate concentration
e. Good current linearity
Due to the above advantages, the research and development of N-type crystalline silicon solar cell is actively underway, but the substrate and manufacturing technology of P-type solar cell have also been developed so that N-type solar cell is still compared with P-type solar cell. This did not achieve a high efficiency improvement. Therefore, P-type solar cells are becoming the mainstream of solar cells.
1A to 1G are cross-sectional views illustrating a solar cell manufacturing process using crystalline silicon of a representative P-type substrate, that is, a P-type substrate.
First, as shown in Fig. 1A, a P-
Next, as shown in FIG. 1E, an
2A to 2G are cross-sectional views illustrating a solar cell manufacturing process using crystalline silicon of a representative N-type substrate, that is, an N-type substrate.
First, as shown in FIG. 2A, a 0.5-3.0 Ω · cm N-
Next, as shown in FIG. 2C, a high concentration for forming a front surface field in a furnace using a POCl 3 compound as an N-type impurity source on the surface of the substrate. (10 21 / cm 3 N + diffusion layer 210). Subsequently, as illustrated in FIG. 2D, the
In manufacturing the solar cell as described above, when using the N-type substrate to emphasize again has the following advantages.
That is, it is possible to avoid the problem of deterioration of solar cell performance by the generation of boron-oxygen compound, higher survival time of minority carriers than P-type substrate, easy surface passivation by silicon thermal oxide film, high conductivity at the same substrate concentration, Advantages such as good current linearity can be taken. However, in spite of these advantages, it is inevitable to obtain higher efficiency and commercialization than the solar cell of the P-type substrate in order to lower the contact resistance of the FSF layer subjected to sunlight as shown in FIG. 2C to the metal electrode. It is formed by doping high concentration of Phosphorus, which shortens the life time of electron-hole pairs generated in the short wavelength range of solar light (e.g. 4000 ~ 5000kW) and is easily recombined. It is because it cannot contribute effectively to the output improvement of a battery. Also, as shown in FIG. 2G, the Al-doped P + diffusion layer (emitter), which is formed during heat treatment from the Al electrode on the rear surface of the substrate, is formed by absorbing and inverting a high concentration of Phosphorus diffusion layer (ie, N + diffusion layer). The emitter will contain many Phosphorus impurities and thus will not be able to produce a good P + diffusion layer. When the P + diffusion layer (emitter) has many impurities and crystal defects, the life time of the photo-generated electrons or holes is short even in the long wavelength range (e.g., 9000 1 to 11000 Å) that reaches deep into the substrate. As a result, the recombination rate of electron-holes increases, and sunlight itself does not contribute to the formation of electron-hole pairs.
Accordingly, the problem to be solved by the present invention is to utilize the characteristics and advantages of the N-type substrate-based solar cell described above using an N-type substrate rather than a P-type substrate, Low phosphorus doping concentration minimizes recombination of photo-generated electron-hole pairs on the FSF layer and cell surface, improving the blue response of solar cells In addition, by providing a high quality Al-doped P + diffusion layer (emitter) at the same time to provide a solar cell and a method of manufacturing the same that can obtain a high light conversion efficiency even at long wavelengths.
Another object of the present invention, by selectively doping a high concentration of phosphorous (Phosphorus) only in the region where the electrode of the battery will be placed to minimize contact resistance between the electrode of the battery and the substrate (base region) to excellent electrical properties And to provide a highly efficient crystalline solar cell and its manufacturing method.
The solar cell of the present invention for solving the above problems: an N-type substrate having a front and back; A front electrode formed on the front surface of the N-type substrate; An N diffusion layer formed by doping an N-type impurity of a first concentration under the front electrode; And an N + diffusion layer formed to be in contact with the front electrode by doping an N-type impurity having a second concentration higher than the first concentration at a position covered by the front electrode.
The front electrode may be a recessed electrode formed in the recessed portion of the N-type substrate.
In addition, it is preferable that the first concentration has a value of 10 19 / cm 3 or less, and the second concentration has a value of 10 20 / cm 3 or more.
In the case of the N + diffusion layer, it is preferable to have a deeper depth inside the substrate than the N diffusion layer.
The method of the present invention for manufacturing the solar cell comprises: a first step of etching an N-type substrate having a front surface and a back surface to have a texturing structure; An N diffusion layer is formed by doping N-type impurities of a first concentration on the entire surface of the N-type substrate, and a N-type impurity having a second concentration higher than the first concentration is doped only in a portion that is covered by the front electrode. Forming a diffusion layer; A third step of forming an anti-reflection film on the entire surface of the N-type substrate resulting from the second step; And a fourth step of forming a front electrode on the anti-reflection film and a rear electrode on the rear surface of the N-type substrate and heat treatment.
Here, before the forming of the N + diffusion layer, a recess may be formed only in a portion that is covered by the front electrode so that the front electrode becomes a recessed electrode.
In summary, in the present invention, a phosphor-doped N-type substrate is used as a substrate to be a base of a solar cell, and a front surface field (FSF) layer (ie, N) of a base surface on which light is incident The diffusion layer) and the contact region (that is, the N + diffusion layer) to be connected to the electrode were formed by diffusing phosphors (Phosphorus) having different concentrations. For example, the FSF layer forms a diffusion layer at a concentration of 10 19 / cm 3 or less and the diffusion layer of the contact region at a concentration of 10 20 / cm 3 or more. Here, the method of selectively forming a diffusion layer of a high concentration of contact region is a method of thermal diffusion by injecting a gas containing Phosphorus in a furnace in a conventional manner, or a spin-on dopant containing phosphorus ) And then partially heated with a laser. In addition, as shown in FIG. 4, when the contact region is etched with a laser or the like, a diffusion layer is formed and an electrode having a line width smaller than that of the horizontal electrode as shown in FIG. At the same time, the light receiving area of the battery can be widened, thereby making solar cells with excellent electrical characteristics and high efficiency.
According to the present invention described above, the contact resistance between the electrode and the substrate is minimized, thereby manufacturing a solar cell having excellent electrical characteristics and high efficiency.
1A to 1G are cross-sectional views illustrating a solar cell manufacturing process using crystalline silicon of a representative P-type based, ie, P-type substrate;
2A to 2G are cross-sectional views illustrating a solar cell manufacturing process using crystalline silicon of an exemplary N-type based, ie, N-type substrate;
3A to 3H are cross-sectional views showing a solar cell manufacturing method according to an embodiment of the present invention;
4 is a cross-sectional view showing the structure of a solar cell manufactured by a solar cell manufacturing method according to another embodiment of the present invention.
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. The following examples are only presented to understand the content of the present invention, and those skilled in the art will be capable of many modifications within the technical spirit of the present invention. Therefore, the scope of the present invention should not be construed as limited to these examples.
3A to 3H are cross-sectional views illustrating a method of manufacturing a solar cell according to an embodiment of the present invention. Referring to FIG. 3A, an N-
Another embodiment of the present invention is to form a trench by etching the contact region with a laser or the like, as shown in Figure 4 to form a high concentration N +
200: N-type silicon substrate
212 low diffusion N diffusion layer
214: high concentration of N + diffusion layer
216: high concentration N + diffusion layer formed in the depression structure
220: Phosphor-Silicate-Glass layer
230: antireflection film
240: rear electrode
250: front electrode
252: recessed front electrode
260: P type diffusion layer
Claims (6)
A front electrode formed on the front surface of the N-type substrate;
An N diffusion layer formed by doping an N-type impurity of a first concentration under the front electrode;
An N + diffusion layer formed to be in contact with the front electrode by doping an N-type impurity having a second concentration higher than the first concentration at a position covered by the front electrode;
Solar cell having a.
Etching a N-type substrate having a front surface and a back surface to have a texturing structure;
An N diffusion layer is formed by doping N-type impurities of a first concentration on the entire surface of the N-type substrate, and a N-type impurity having a second concentration higher than the first concentration is doped only in a portion that is covered by the front electrode. Forming a diffusion layer;
A third step of forming an anti-reflection film on the entire surface of the N-type substrate resulting from the second step;
A fourth step of forming a front electrode on the anti-reflection film and a rear electrode on a rear surface of the N-type substrate and heat-treating them;
Method for manufacturing a solar cell having a.
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KR1020100020902A KR20110101698A (en) | 2010-03-09 | 2010-03-09 | Solar cell and method for manufacturing the same |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101387718B1 (en) * | 2012-05-07 | 2014-04-22 | 엘지전자 주식회사 | Solar cell and method for manufactruing the same |
KR20150049213A (en) * | 2013-10-29 | 2015-05-08 | 엘지전자 주식회사 | Solar cell |
-
2010
- 2010-03-09 KR KR1020100020902A patent/KR20110101698A/en not_active Application Discontinuation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101387718B1 (en) * | 2012-05-07 | 2014-04-22 | 엘지전자 주식회사 | Solar cell and method for manufactruing the same |
US9412888B2 (en) | 2012-05-07 | 2016-08-09 | Lg Electronics Inc. | Solar cell and method for manufacturing the same |
KR20150049213A (en) * | 2013-10-29 | 2015-05-08 | 엘지전자 주식회사 | Solar cell |
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