KR20110025539A - Liquid crystal display device and manufacturing method and lighting inspection method thereof - Google Patents

Abstract

PURPOSE: A liquid crystal display device, a manufacturing method and a lamp inspection method without needing an inspection device are provided to reduce cost for lighting inspection without adding the inspection device. CONSTITUTION: First to third sub pixels in a data driving circuit(350) include respectively different colors. First to third gate lines are respectively connected to first to third sub pixels. A data line is connected to first to third data lines. A gate transistor is connected to first to third gate lines. A data transistor is connected to the data line. A gate terminal of the gate transistor receives a control signal.

Description

Liquid crystal display device and manufacturing method and lighting inspection method {Liquid crystal display device and manufacturing method and lighting inspection method

The present invention relates to a liquid crystal display device, and more particularly, to a liquid crystal display device, a manufacturing method thereof, and a lighting inspection method.

As the information society develops, the demand for display devices for displaying images is increasing in various forms. Recently, liquid crystal displays (LCDs), plasma display panels (PDPs), organic fields Various flat display devices such as organic light emitting diodes (OLEDs) are being utilized.

Among these flat panel display devices, liquid crystal display devices are widely used because they have advantages of miniaturization, light weight, thinness, and low power driving.

In general, a liquid crystal display device is manufactured by bonding an array substrate located below and a color filter substrate located above with a liquid crystal layer interposed therebetween. The lighting test is performed on the liquid crystal display device manufactured as described above. In order to perform the lighting test, the array substrate is provided with a test pad and a test transistor.

1 is a view schematically showing a conventional liquid crystal display device in which a lighting test is performed.

As shown in FIG. 1, a plurality of gate lines GL and a plurality of data lines DL are formed on the array substrate AS. In the display area AA, a plurality of red (R), green (G), and blue (B) subpixels SP are arranged. The R, G, and B subpixels SP constituting the unit pixel P are arranged in a vertical direction. Such an arrangement structure is called a vertical stripe arrangement structure.

The gate driving circuit 10 is formed in the non-display area NA of the array substrate AS. The gate driving circuit 10 is formed in the process of manufacturing the array substrate AS. The gate driver circuit 10 directly formed on the array substrate AS is called a gate in panel (GIP) gate driver circuit. The gate driving circuit 10 scans a plurality of gate lines GL sequentially.

The data driver circuit 50 is disposed outside the array substrate AS. The data driver circuit 50 outputs a data signal for displaying an image to a corresponding subpixel SP.

In order to perform the lighting test for the liquid crystal display device as described above, an inspection transistor (TTD) and an inspection pad are configured in the array substrate AS, and an inspection gate control for controlling the gate driving circuit 10 is also provided. The circuit 15 is provided outside the array substrate AS.

The inspection transistor TTD is connected to the data line DL. As the test pad, a test control signal pad PTDC and a test data signal pad PTD are configured. The test control signal pad PTDC and the test data signal pad PTD are connected to the gate terminal and the source terminal of the test transistor TTD, respectively. On the other hand, during the lighting test, the pins provided in the lighting probe auto probe device come into contact with the corresponding test control signal pad PTDC and the test data signal pad PTD.

The lighting test for the conventional liquid crystal display device is performed as follows. The inspection gate control circuit 15 outputs control signals to the gate driver circuit 10, whereby the gate driver circuit 10 sequentially scans a plurality of gate lines GL.

On the other hand, the auto probe outputs a test control signal and a test data signal, respectively, and these signals are transmitted to the test transistor (TTD) via the test control signal pad (PTDC) and the test data signal pad (PTD). . Accordingly, the inspection data signal is written to the subpixels SP through the plurality of data wires DL.

As described above, in the lighting test for the conventional liquid crystal display device, the gate driving circuit 10 is used for the lighting test. For this reason, the R subpixel row lines, the G subpixel row lines, and the B subpixel row lines are turned on every vertical period. As a result, each of the R subpixel row lines, the G subpixel row lines, and the B subpixel row lines cannot be individually turned on, so that a lighting test for each of red, green, and blue cannot be performed. Therefore, it is difficult to detect lighting failures for each of red, green, and blue.

In addition, since the gate driving circuit 10 is used for the lighting inspection, the inspection gate control circuit 15 for driving the gate driving circuit 10 during the lighting inspection should be separately provided. As a result, the lighting inspection cost increases and the lighting inspection equipment becomes complicated.

The present invention has a problem to provide a liquid crystal display device capable of performing a lighting test for each of red, green, and blue.

In addition, the present invention has another problem to provide a liquid crystal display device that can reduce the lighting inspection cost by not adding a lighting inspection equipment separately.

In order to achieve the above object, the present invention is a liquid crystal display device comprising a first to third sub-pixel formed in the display area, arranged along each of the three adjacent row lines to emit different colors A first to third gate wirings formed on the array substrate in a row line direction and connected to the first to third subpixels; A data line extending from the array substrate in a column line direction and connected to the first to third subpixels; First to third inspection gate transistors formed in the non-display area of the array substrate and connected to each of the first to third gate lines and the drain terminal; An inspection data transistor formed in the non-display area of the array substrate and connected to the data line and the drain terminal, wherein the gate terminals of the first to third inspection gate transistors apply independent control signals to each other; It provides a liquid crystal display device configured to receive.

The gate driving circuit may further include a gate driver circuit connected to the first to third gate wirings to output a gate signal, and a data driver circuit connected to the data wiring to output a data signal. The switching transistor may include a switching transistor connected to the corresponding gate wiring and the data wiring.

The gate driving circuit may be formed on the array substrate.

Each of the first to third inspection gate transistors is formed at one end of a corresponding gate wiring, and one end of the gate wiring to which each of the first to third inspection gate transistors is formed is connected to the gate driving circuit. It can be the end of.

The gate driver circuit includes first and second gate driver circuits formed on both sides of the display area, wherein the first gate driver circuit is connected to an odd gate wiring, and the second gate driver circuit is connected to an even gate wiring. Can be.

The first to third gate wirings may be disposed in plural, and each of the first to third inspection gate transistors may be connected to at least one of the plurality of first to third gate wirings.

First to third inspection gate control pads formed in the non-display area of the array substrate and connected to gate terminals of the first to third inspection gate transistors; An inspection gate pad formed in a non-display area of the array substrate and connected to a source terminal of the first to third inspection gate transistors; An inspection data control pad formed in the non-display area of the array substrate and connected to the gate terminal of the inspection data transistor; The apparatus may further include an inspection data pad formed in the non-display area of the array substrate and connected to the source terminal of the inspection data transistor.

The different colors may be red, green, or blue.

In another aspect, the present invention is a manufacturing method of a liquid crystal display device comprising first to third sub-pixels formed in the display area and arranged along each of three adjacent row lines to emit different colors, Forming first to third gate wirings on the array substrate, the first to third gate wirings extending in a row line direction and connected to each of the first to third subpixels; Forming a data line on the array substrate, the data line extending in a column line direction and connected to the first to third subpixels; Forming first to third inspection gate transistors in the non-display area of the array substrate, the first to third inspection gate transistors being connected to each of the first to third gate lines and the drain terminal; And forming an inspection data transistor connected to the data line and the drain terminal in a non-display area of the array substrate, wherein the gate terminals of the first to third inspection gate transistors provide independent control signals. Provided is a method of manufacturing a liquid crystal display device configured to be applied.

Forming a gate driving circuit connected to the first to third gate wirings to output a gate signal in a non-display area of the array substrate; The method may further include forming a switching transistor connected to the corresponding gate line and the data line in each of the first to third subpixels.

Forming first to third inspection gate control pads in the non-display area of the array substrate, the first to third inspection gate control pads being connected to gate terminals of the first to third inspection gate transistors; Forming an inspection gate pad connected to a source terminal of the first to third inspection gate transistors in a non-display area of the array substrate; Forming an inspection data control pad connected to a gate terminal of the inspection data transistor in a non-display area of the array substrate; The method may further include forming an inspection data pad connected to a source terminal of the inspection data transistor in the non-display area of the array substrate.

The first to third inspection gate control signals generated from the lighting inspection apparatus, the inspection gate signal, the inspection gate signal, the inspection data control signal, and the inspection data signal, respectively; And applying lighting to the inspection gate pad, the inspection data control pad, and the inspection data pad to perform a lighting inspection, wherein the first to third inspection gate control signals are independent control signals. Can be.

In another aspect, the present invention provides a display device comprising: first to third sub-pixels formed in a display area and arranged along each of three adjacent row lines to emit different colors; First to third gate wirings extending in a row line direction on the array substrate and connected to each of the first to third subpixels; In the lighting test method of the liquid crystal display device including a data wiring extending in the column line direction on the array substrate and connected to the first to third sub-pixels, the first to third gates in the non-display area of the array substrate; Forming first to third inspection gate transistors connected to each of the wirings and the drain terminals; Forming an inspection data transistor connected to the data line and the drain terminal in a non-display area of the array substrate; Applying each of the first to third inspection gate control signals generated from the lighting inspection apparatus to the gate terminal of the first to third inspection gate transistors; Applying a test gate signal generated from the lighting test apparatus to a source terminal of the first to third test gate transistors; Applying a test data control signal generated from the lighting test apparatus to a gate terminal of the test data transistor; And applying a test data signal generated from the lighting test apparatus to a source terminal of the test data transistor, wherein the first to third test gate control signals are control signals independent of each other. Provide inspection methods.

Forming first and third inspection gate control pads connected to gate terminals of the first and third inspection gate transistors in a non-display area of the array substrate; Forming an inspection gate pad connected to a source terminal of the first to third inspection gate transistors in a non-display area of the array substrate; Forming an inspection data control pad connected to a gate terminal of the inspection data transistor in a non-display area of the array substrate; And forming an inspection data pad connected to a source terminal of the inspection data transistor in a non-display area of the array substrate, the first to third inspection gate control signals generated from the lighting inspection apparatus; The inspection gate signal, the inspection data control signal, and the inspection data signal are each of the first to third inspection gate control pads, the inspection gate pad, the inspection data control pad, It may be applied to the inspection data pad.

In the present invention, when the R, G, and B subpixels are arranged in a vertical stripe structure, inspection transistors for driving them separately from each other are connected to the corresponding gate wirings. Accordingly, in the lighting test, the R, G, and B subpixels may be individually lit, and thus the lighting test may be performed for each of red, green, and blue.

In addition, as in the prior art, an inspection gate control circuit or the like for driving the gate driving circuit is not required separately during the lighting inspection. Therefore, the lighting inspection cost is reduced and the lighting inspection equipment can be simplified.

Further, the inspection transistor and the inspection pad are not removed even after the lighting inspection, and can be left in the completed liquid crystal display device. Accordingly, after the lighting test, a separate cutting process for removing the inspection transistor may be omitted.

Hereinafter, with reference to the drawings will be described embodiments of the present invention.

2 is a view schematically showing a liquid crystal display device according to an embodiment of the present invention, Figure 3 is a view showing a test transistor and a test pad of the liquid crystal display device according to an embodiment of the present invention, Figure 4 FIG. 5 is a diagram schematically illustrating a subpixel of a liquid crystal display according to an exemplary embodiment of the present invention.

As shown, the liquid crystal display device 100 according to the embodiment of the present invention, the liquid crystal panel 200, the gate driver circuit 300, the data driver circuit 350, the inspection transistor, the inspection The pad part PTA is included. The backlight 400 is provided below the liquid crystal panel 200 to supply light to the liquid crystal panel 200.

The liquid crystal panel 200 includes an array substrate (AS) and a color filter substrate (not shown) facing each other, and a liquid crystal layer (not shown) filled between the two substrates. The liquid crystal panel 200 defines a display area AA for displaying an image and a non-display area NA around the display area AA.

In the array substrate AS, a plurality of gate lines GL extending in a row direction and a plurality of data lines DL extending in a column direction are formed on the first substrate. The gate line GL and the data line DL cross each other to define a plurality of subpixels SP.

In each subpixel SP, a switching transistor T connected to the gate line and the data line GL and DL is formed. The switching transistor T is connected to the pixel electrode. Meanwhile, a common electrode is formed corresponding to the pixel electrode, and an electric field is formed between the pixel electrode and the common electrode to drive the liquid crystal. The pixel electrode, the common electrode, and the liquid crystal positioned between these electrodes constitute a liquid crystal capacitor Clc. On the other hand, each subpixel SP further includes a storage capacitor Cst, which stores a data voltage applied to the pixel electrode until the next frame.

The plurality of subpixels SP includes R, G, and B subpixels SP that emit red, green, and blue light, respectively. The unit pixel P includes neighboring R, G, and B subpixels SP. Meanwhile, in the embodiment of the present invention, the R, G, and B subpixels SP constituting the unit pixel P are arranged in a vertical stripe structure. That is, the R, G, and B subpixels SP are disposed in the vertical direction. Further, in each row line, subpixels SP that emit the same light are arranged. Hereinafter, for convenience of description, the row lines in which the R, G, and B subpixels SP are disposed may be referred to as R row lines, B row lines, and G row lines, respectively. The gate lines GL positioned in the R, G, and B row lines may be referred to as R, G, and B gate lines GL, respectively.

On the other hand, in the embodiment of the present invention, the case is arranged in the order of the R, G, B row line along the column direction as an example, the order of these row lines may be arranged in another order as an example.

Meanwhile, in the color filter substrate, a black matrix, a color filter, and a common electrode may be formed on the second substrate facing the first substrate. The black matrix may be formed to correspond to the gate line GL, the data line DL, and the switching transistor T. As the color filter, R, G, and B color filters corresponding to each of the R, G, and B subpixels SP may be used. The common electrode may be formed on the black matrix and the color filter. On the other hand, the color filter substrate having such a configuration as an example, at least one of the black matrix, the color filter, the common electrode may be configured on the array substrate. For example, in the case where a liquid crystal display device driven by an in-plane switching (IPS) method is used, the common electrode is formed on the array substrate.

The gate driving circuit 310 sequentially scans the plurality of gate lines GL. During each scan period, an on level gate signal is supplied to the selected gate wiring GL. When the on-level gate signal is applied during the scan period, the switching transistor T is turned on. In response thereto, the data signal is input to the corresponding subpixel SP to emit light of the corresponding color.

The gate driving circuit 310 operating as described above may be directly formed in the non-display area NA of the array substrate AS in a process of forming an array element such as a switching transistor T in the display area AA. have. As such, the gate driving circuit 310 directly formed on the array substrate AS is called a GIP type gate driving circuit. As such, as the gate driver circuit 310 is formed at the same time as the array element is formed, the process of connecting the separate gate driver circuit IC to the liquid crystal panel 200 may be omitted.

On the other hand, as the gate driving circuit 310, a driving circuit other than the GIP method may be used. For example, a COG gate driving circuit in which the driving IC is directly attached to the array substrate AS may be used. In addition, a gate driving circuit in which a driving IC is connected to the liquid crystal panel 200 through a flexible film may be used.

The data driver circuit 350 is connected to the data wiring DL to output the data signal to the data wiring DL. The data signal output as described above is input to the subpixel SP connected to the scanned gate wiring GL. In the embodiment of the present invention, since the R, G, and B subpixels SP are arranged in the vertical direction, the data driving circuit 350 alternately outputs the R, G, and B data signals every horizontal period.

The data driving circuit 350 operating as described above may be manufactured in the form of a driving IC, mounted directly on the array substrate AS, or connected to the liquid crystal panel 200 through a flexible film. Similarly to the gate driving circuit 310 of the GIP method, the data driving circuit 350 may be directly formed in the non-display area NA of the array substrate AS in the process of forming the array element.

The gate driver circuit 310 and the data driver circuit 350 control the operations of the R, G, and B subpixels SP in displaying an image through the display area AA. The gate driver circuit 310 and the data driver circuit 350 are turned off during the lighting test of the liquid crystal display device 100 according to the embodiment of the present invention and are not used for the lighting test. .

In the embodiment of the present invention, the lighting inspection is performed by connecting the inspection transistor to the gate wiring GL and the data wiring DL and applying the inspection signal to the inspection transistor through the inspection pad. This will be described in more detail.

The inspection transistor includes an inspection data transistor TDT connected to the data line DL, and first to third inspection gate transistors TTG1 to TTG3 connected to the gate line GL. The inspection transistor is formed in the non-display area NA of the array substrate AS. On the other hand, the inspection transistor may be formed in the process of forming the switching transistor.

The inspection data transistor TDT may be configured to correspond to each of the data lines DL. The drain terminal of the inspection data transistor TDD is connected to the corresponding data line DL. On the other hand, one inspection data transistor (TTD) may be configured to correspond to two or more data wiring (DL). For example, the drain terminal of the inspection data transistor (TTD) may be connected to two or more data lines DL. As such, the inspection data transistor TTD may be configured to be connected to at least one data line DL. Meanwhile, in the embodiment of the present invention, the case where the inspection data transistor TDD is connected to each of the data wiring DL will be described.

The inspection data transistor TTD is configured to be connected to one of both ends of the corresponding data line DL. For example, it may be configured to be connected to an end of the data line DL positioned at the output side of the data driver circuit 350. On the other hand, it may be configured to be connected to the end of the data line DL which is located on the side opposite to the output side of the data driver circuit 350.

The first to third inspection gate transistors TTG1 to TTG3 may be configured to correspond to the R, G, and B gate lines GL, respectively. That is, the first inspection gate transistor TTG1 corresponds to the R gate wiring GL, the second inspection gate transistor TTG2 corresponds to the G gate wiring GL, and the third inspection gate transistor TTG3. ) May correspond to the B gate line GL. The drain terminals of the first to third inspection gate transistors TTG1 to TTG3 are connected to the corresponding gate wiring GL. Each of the first to third inspection gate transistors TTG1 to TTG3 may be configured to correspond to two or more R, G, and B gate wirings GL. For example, the drain terminal of the first inspection gate transistor TTG1 may be connected to two or more R gate lines GL. The drain terminal of the second inspection gate transistor TTG2 may be connected to two or more G gate lines GL. In addition, the drain terminal of the third inspection gate transistor TTG3 may be connected to two or more B gate lines GL. As such, the inspection gate transistor TTG may be configured to be connected to at least one corresponding gate line GL. Meanwhile, in the embodiment of the present invention, the case where the inspection gate transistor TTG is connected to each of the corresponding gate wiring GL will be described.

The inspection gate transistor TTG is configured to be connected to one of both ends of the corresponding gate wiring GL. For example, the gate driving circuit 310 may be configured to be connected to an end of the gate wiring GL positioned at the output side of the gate driving circuit 310. On the other hand, it may be configured to be connected to the end of the gate wiring GL which is located on the side opposite to the output side of the gate driving circuit 310.

The inspection pad portion PTA includes an inspection data pad PTD, an inspection data control pad PTDC, an inspection gate pad PTG, and first to third inspection gate control pads PTGC1 to PTGC3. ). Such a test pad is in contact with the pins of the auto probe device, which is a lighting test device, and receives a corresponding signal during the lighting test. On the other hand, the test pad is formed in the non-display area NA of the array substrate AS. The inspection pad may be formed in the process of forming the array element.

The inspection data pad PTD and the inspection data control pad PTDC are connected to the source terminal and the gate terminal of the inspection data transistor, respectively. The inspection data pad PTD and the inspection data control pad PTDC receive the inspection data signal and the inspection data control signal from corresponding pins of the lighting inspection autoprobe device, respectively. Accordingly, each of the inspection data signal and the inspection data control signal is transmitted to each of the source terminal and the gate terminal of the inspection data transistor TMD.

The inspection data transistor TMD is turned on / off in accordance with an on / off level of the inspection data control signal. When an on-level inspection data control signal is applied, the inspection data transistor TTD is turned on so that the applied inspection data signal passes through the inspection data transistor TTD. The inspection data signal passed in this way is transferred to the corresponding subpixel SP through the data wiring DL.

The inspection gate pad PTG is connected to the source terminals of the inspection first to third inspection gate transistors TTG1 to TTG3. The first to third inspection gate control pads PTGC1 to PTGC3 are connected to gate terminals of the first to third inspection gate transistors TTG1 to TTG3, respectively. The inspection gate pad PTG receives an inspection gate signal from a corresponding pin of the lighting inspection autoprobe device. Each of the first to third inspection gate control pads PTGC1 to PTGC3 receives the first to third inspection gate control signals from corresponding pins of the lighting inspection autoprobe device. Accordingly, the test gate signal is commonly transmitted to the source terminals of the first to third test gate transistors TTG1 to TTG3. Each of the first to third inspection gate control signals is transmitted to the gate terminals of the first to third inspection gate transistors TTG1 to TTG3.

Each of the first to third inspection gate transistors TTG1 to TTG3 is turned on / off in accordance with the on / off level of the corresponding first to inspection gate control signal. When the on-level gate control signal is applied, the corresponding inspection gate transistor TTG is turned on so that the applied inspection gate signal passes through the inspection gate transistor TTG. The inspection gate signal passed in this manner is transferred to the corresponding subpixel SP through the corresponding gate wiring GL.

As described above, since the operations of the first to third inspection gate transistors TTG1 to TTG3 are controlled by different gate control signals, they may be driven independently of each other. For example, when the first inspection gate control signal is on level and the second and third inspection gate control signals are off level, the first inspection gate transistor TTG1 is turned on and the second and third inspection gates are turned on. Transistors TTG2 and TTG3 are turned off. Accordingly, the inspection gate signal input to all of the first to third inspection gate transistors TTG1 to TTG3 passes through the first inspection gate transistor TTG1, but the second and third inspection gate transistors TTG2, TTG3) will not pass. Accordingly, the inspection gate signal is transmitted to the R gate wiring GL connected to the first inspection gate transistor TTG1, and the R subpixels of the corresponding line may be turned on when the inspection gate signal is on level. do. On the other hand, since the inspection gate signal is not transmitted to the G and B gate lines GL connected to the second and third inspection gate transistors TTG2 and TTG3, respectively, the G and B subpixels SP of the corresponding line It will not turn on. As such, the first to third inspection gate transistors TTG1 to TTG3 may be driven independently of each other by corresponding first to third inspection gate control signals, and thus R, G, and B gate wirings ( GL can also be driven independently of one another. Accordingly, lighting of the R, G, and B subpixels SP may also be performed independently of each other.

On the other hand, after the inspection process is completed, since the inspection data control signal is not applied, the inspection data transistor TTD is turned off. In addition, since the inspection gate control signal is not applied after the inspection process is completed, the inspection gate transistor TTG is turned off. Therefore, when the image is displayed through the liquid crystal display device 100, the inspection data transistor TTT and the inspection gate transistor TTG do not affect the image display. In addition, the inspection pad corresponding to the inspection transistor also does not affect the image display. Accordingly, the inspection transistor and the inspection pad may be left in the liquid crystal panel 200 even after the lighting inspection. In such a case, a separate cutting process for removing the inspection transistor and the inspection pad may not be performed. Furthermore, when the inspection transistor is formed on the output side of the gate driver circuit and the data driver circuit, no cutting process is required. Therefore, the manufacturing process and the process cost can be reduced.

5 and 6, the lighting test method according to the embodiment of the present invention will be described in detail.

5 is a view schematically showing a liquid crystal display device in which a lighting test is performed according to an embodiment of the present invention, and FIG. 6 is a view illustrating waveforms and output screens of signals for lighting test according to an embodiment of the present invention. .

For the lighting test, an auto probe device 500 for lighting test is provided. The autoprobe device includes a signal generator 510 for generating inspection signals. On the other hand, the auto probe device, the test pins corresponding to the test pads are provided. For the lighting test, the test pins contact the corresponding test pads. Accordingly, during the lighting test, the test signals generated by the signal generator 510 may be applied to the test pads through the test pins.

On the other hand, during the lighting test, the backlight 400 may be driven to supply light to the liquid crystal panel 200.

During the lighting inspection, the inspection data control signal DTC has an on level. As a result, the inspection data transistor TTD is turned on. For this reason, the inspection data signal DT is applied to the data wiring DL through the inspection data transistor TDT.

On the other hand, during the lighting test, the test gate signal GT may have an on / off level alternately. During the section in which the inspection gate signal GT is on level, the inspection data signal DT is input to the subpixel SP of the row line to which the inspection gate signal GT is applied and emits light.

When the lighting test is started, first, during the first lighting test time T1, the signal generator 510 controls the first inspection gate control signal GTC1 at the on level and the second and third inspection gate controls at the off level. Generate signals GTC2 and GTC3. Accordingly, the first inspection gate transistor TTG1 is turned on, and the second and third inspection gate transistors TTG2 and TTG3 are turned off. As a result, the test gate signal GT is transferred to the R gate line GL through the first test gate transistor TTG1. On the other hand, since the second and third test gate transistors TTG2 and TTG3 are in an off state, the test gate signal GT is not transmitted to the G and B gate lines GL. Accordingly, the switching transistor T of the R subpixel SP located in the R row line is turned on, and the inspection data signal DT is input to the R subpixel SP. SP) lights up. On the other hand, since the switching transistors T of the G and B subpixels SP located in the G and B row lines are in an off state, the G and B subpixels SP are turned off. As such, since only the R subpixel SP is turned on during the first lighting inspection time T1, the red lighting inspection may be independently performed.

Next, during the second lighting inspection time T2, the signal generator 510 performs the second inspection gate control signal GTC2 at the on level and the first and third inspection gate control signals GTC1 and GTC3 at the off level. ) Accordingly, the second inspection gate transistor TTG2 is turned on, and the first and third inspection gate transistors TTG1 and TTG3 are turned off. As a result, the test gate signal GT is transferred to the G gate line GL through the second test gate transistor TTG2. On the other hand, since the first and third inspection gate transistors TTG1 and TTG3 are in an off state, the inspection gate signal GT is not transmitted to the R and B gate lines GL. Accordingly, the switching transistor T of the G subpixel SP located in the G row line is turned on, so that the inspection data signal DT is input to the G subpixel SP. SP) lights up. On the other hand, since the switching transistors T of the R and B subpixels SP located in the R and B row lines are in an off state, the R and B subpixels SP are turned off. As such, since only the G subpixel SP is turned on during the second lighting inspection time T2, the green lighting inspection may be independently performed.

Next, during the third lighting test time T3, the signal generator 510 is configured to turn on the third inspection gate control signal GTC3 at the on level and the first and second inspection gate control signals GTC1 and GCT3 at the off level. ) Accordingly, the third inspection gate transistor TTG3 is turned on, and the first and second inspection gate transistors TTG1 and TTG2 are turned off. Thus, the test gate signal GT is transmitted to the B gate line GL through the third test gate transistor TTG3. On the other hand, since the first and second inspection gate transistors TTG1 and TTG2 are in an off state, the inspection gate signal GT is not transmitted to the R and G gate lines GL. As a result, the switching transistor T of the B subpixel SP located in the B row line is turned on so that the inspection data signal DT is input to the B subpixel SP. SP) lights up. On the other hand, since the switching transistors T of the R and G subpixels SP located in the R and G row lines are in an off state, the R and G subpixels SP are turned off. As such, since only the B subpixel SP is turned on during the third lighting test time T3, the green lighting test can be performed alone.

As described above, during each of the first to third lighting inspection times T1 to T3, one of the first to third inspection gate transistors TTG1 to TTG3 is turned on and the other two are turned off. Accordingly, only one of the R, G, and B subpixels SP may be turned on, and the other two may be turned off. Therefore, the lighting test for each of the red, green, and blue can be performed separately. This makes it easy to check the lighting failure for each of the red, green, and blue.

On the other hand, in the lighting test according to the embodiment of the present invention, not only the lighting test for each of the red, green, blue, but also the lighting test for at least two or more of these mixed colors can be performed. For example, during the fourth lighting test time T4, lighting tests for white, gray, and black, in which three red, green, and blue colors are mixed, may be performed. To this end, all of the first to third inspection gate transistors TTG1 to TTG3 are operated in an on state to light up all of the R, G, and B subpixels SP. On the other hand, the level of the inspection data signal DT, that is, the gray level (gradation), is changed. For example, during the fourth lighting inspection time T4, the gray level of the inspection data signal DT is gradually decreased. Accordingly, white, gray, and black are displayed on the screen.

Although not shown, lighting tests may be performed on two mixed colors of red, green, and blue, respectively. For example, two of the first to third inspection gate transistors TTG1 to TTG3 are operated in an on state and the other is turned off. Accordingly, two of the R, G, and B subpixels SP are turned on, and the other one is turned off. Through this method, it is possible to perform a lighting test for two mixed colors of red, green, and blue.

In the above-described embodiment of the present invention, the subpixels constituting the unit pixel P are described mainly in the case where R, G, and B subpixels SP are used. On the other hand, subpixels displaying a different color, for example, cyan, magenta, and yellow subpixels, may be used as subpixels constituting the unit pixel. In such a case, lighting checks for cyan, magenta, yellow and their mixed colors may be performed separately.

Meanwhile, in the above-described embodiment of the present invention, the description has been given mainly on the case in which the subpixels SP of three different colors constituting the unit pixel P are arranged in a vertical stripe structure. Meanwhile, even when subpixels displaying four different colors, for example, R, G, B, and W (white) subpixels, constitute a unit pixel and are arranged in a vertical stripe structure, an embodiment of the present invention may be applied. Can be. In this case, a fourth inspection gate transistor is disposed in the gate wiring of the row where the white subpixels are arranged, so that the lighting inspection of the white subpixels can be performed separately.

After the lighting test as described above is performed, the modularization process may be performed to manufacture and ship the liquid crystal display as a finished product.

7 is a schematic view of a liquid crystal display according to another exemplary embodiment of the present invention. In the following description of another embodiment of the present invention, the description of the same matters as the above-described embodiment of the present invention can be omitted.

In the liquid crystal display device according to another embodiment of the present invention, the gate driving circuit is located on both sides facing the display area. For example, the first gate driver circuit 310a is connected to an odd gate gate GLO of the gate wirings, and the second gate driver circuit 310b is an even gate of the gate wirings. It is connected to the wiring GLE.

In this case, the inspection gate transistor (TTG) is configured to be connected to one of both ends of the corresponding gator wiring. For example, it may be configured to be connected to an end of the gate wiring located on the output side of the corresponding gate driving circuit. For example, the inspection gate transistor TTG connected to the odd-numbered gate line GLO may be connected to an end of the gate line GLO positioned at the output side of the first gate driver circuit 310a. The inspection gate transistor TTG connected to the even-numbered gate line GLE may be connected to an end of the gate line GLE positioned at the output side of the second gate driver circuit 310b.

In addition, regardless of the odd-numbered gate line GLO and the even-numbered gate line GLE, the gate lines positioned in the row lines displaying the same color may receive the same inspection gate control signal. For example, the odd-numbered and even-numbered R gate lines may use the first inspection gate control signal GTC1, and the odd-numbered and even-numbered G gate wirings may use the second inspection gate control signal GTC2, and the odd-numbered and even-numbered R gate wirings may be used. The first B gate wires may receive the third test gate control signal GTC3. Accordingly, the R, G, B lighting test can be performed separately.

As described above, in the embodiments of the present invention, when the R, G, and B subpixels are arranged in a vertical stripe structure, inspection transistors for driving them separately from each other are connected to the corresponding gate wirings. Accordingly, in the lighting test, the R, G, and B subpixels may be individually lit, and thus the lighting test may be performed for each of red, green, and blue.

In addition, as in the prior art, an inspection gate control circuit or the like for driving the gate driving circuit is not required separately during the lighting inspection. Therefore, the lighting inspection cost is reduced and the lighting inspection equipment can be simplified.

Further, the inspection transistor and the inspection pad are not removed even after the lighting inspection, and can be left in the completed liquid crystal display device. Accordingly, after the lighting test, a separate cutting process for removing the inspection transistor may be omitted.

Embodiment of the present invention described above is an example of the present invention, it is possible to change freely within the scope included in the spirit of the present invention. Accordingly, the invention includes modifications of the invention within the scope of the appended claims and their equivalents.

1 is a view schematically showing a conventional liquid crystal display device in which a lighting test is performed.

2 is a schematic view of a liquid crystal display device according to an embodiment of the present invention;

3 is a view illustrating a test transistor and a test pad of a liquid crystal display according to an exemplary embodiment of the present invention.

4 illustrates a subpixel of a liquid crystal display according to an exemplary embodiment of the present invention.

5 is a schematic view of a liquid crystal display device in which a lighting test is performed according to an embodiment of the present invention.

6 is a view showing a waveform and an output screen of the lighting test signal according to an embodiment of the present invention.

7 is a schematic view of a liquid crystal display device according to another embodiment of the present invention;

Description of the Related Art

310: gate driver circuit 350: data driver circuit

TTG1 to TTG3: first to third inspection gate transistors

TTD: Inspection Data Transistor

PTGC1 to PTGC3: first to third inspection gate control pads

PTG: Inspection Gate Pad

PTDC: Inspection Data Control Pad

PTD: Inspection Data Pad

P: Pixel

SP: Subpixel

Claims (14)

A liquid crystal display device comprising: first to third subpixels formed in a display area and arranged along each of three neighboring row lines to emit different colors; First to third gate interconnections formed on the array substrate in a row line direction and connected to the first to third subpixels; A data line extending from the array substrate in a column line direction and connected to the first to third subpixels; First to third inspection gate transistors formed in the non-display area of the array substrate and connected to each of the first to third gate lines and the drain terminal; An inspection data transistor formed in the non-display area of the array substrate and connected to the data line and the drain terminal; Gate terminals of the first to third inspection gate transistors are configured to receive control signals independent of each other. LCD display device. The method of claim 1, A gate driver circuit connected to the first to third gate wirings to output a gate signal, and a data driver circuit connected to the data wirings to output a data signal, Each of the first to third subpixels includes a switching transistor connected to a corresponding gate line and a data line. LCD display device. The method of claim 2, And the gate driving circuit is formed on the array substrate. The method of claim 3, wherein Each of the first to third inspection gate transistors is formed at one end of a corresponding gate wiring line, One end of the gate wiring in which each of the first to third inspection gate transistors is formed is one end of the side connected to the gate driving circuit. LCD display device. The method of claim 4, wherein The gate driving circuit includes first and second gate driving circuits formed on both sides of the display area, The first gate driver circuit is connected to the odd-numbered gate wirings, and the second gate driver circuit is connected to the even-numbered gate wirings. LCD display device. The method of claim 1, The first to third gate wirings are arranged in plurality, Each of the first to third inspection gate transistors is connected to at least one of the plurality of first to third gate wires. LCD display device. The method of claim 1, First to third inspection gate control pads formed in the non-display area of the array substrate and connected to gate terminals of the first to third inspection gate transistors; An inspection gate pad formed in a non-display area of the array substrate and connected to a source terminal of the first to third inspection gate transistors; An inspection data control pad formed in the non-display area of the array substrate and connected to the gate terminal of the inspection data transistor; And an inspection data pad formed in the non-display area of the array substrate and connected to a source terminal of the inspection data transistor. LCD display device. The method of claim 1, The different colors are red, green, and blue liquid crystal display device. A manufacturing method of a liquid crystal display device comprising first to third sub-pixels formed in a display area and arranged along each of three adjacent row lines to emit different colors. Forming first to third gate wirings on the array substrate, the first to third gate wirings extending in a row line direction and connected to each of the first to third subpixels; Forming a data line on the array substrate, the data line extending in a column line direction and connected to the first to third subpixels; Forming first to third inspection gate transistors in the non-display area of the array substrate, the first to third inspection gate transistors being connected to each of the first to third gate lines and the drain terminal; Forming a test data transistor connected to the data line and the drain terminal in a non-display area of the array substrate, Gate terminals of the first to third inspection gate transistors are configured to receive control signals independent of each other. Liquid crystal display device manufacturing method. The method of claim 9, Forming a gate driving circuit connected to the first to third gate wirings to output a gate signal in a non-display area of the array substrate; Forming a switching transistor connected to each of the first and third subpixels, the gate and data lines corresponding to each other; Liquid crystal display device manufacturing method. The method of claim 9, Forming first to third inspection gate control pads in the non-display area of the array substrate, the first to third inspection gate control pads being connected to gate terminals of the first to third inspection gate transistors; Forming an inspection gate pad connected to a source terminal of the first to third inspection gate transistors in a non-display area of the array substrate; Forming an inspection data control pad connected to a gate terminal of the inspection data transistor in a non-display area of the array substrate; And forming an inspection data pad connected to a source terminal of the inspection data transistor in a non-display area of the array substrate. Liquid crystal display device manufacturing method. The method of claim 11, The first to third inspection gate control signals generated from the lighting inspection apparatus, the inspection gate signal, the inspection gate signal, the inspection data control signal, and the inspection data signal, respectively; Applying to the inspection gate pad, the inspection data control pad, and the inspection data pad to perform a lighting inspection; The first to third inspection gate control signals are independent control signals. Liquid crystal display device manufacturing method. First to third subpixels formed in the display area and arranged along each of three neighboring row lines to emit different colors; First to third gate wirings extending in a row line direction on the array substrate and connected to each of the first to third subpixels; In the lighting test method of the liquid crystal display device extending in the column line direction on the array substrate, and including a data wiring connected to the first to third sub-pixel, Forming first to third inspection gate transistors in the non-display area of the array substrate, the first to third inspection gate transistors being connected to each of the first to third gate lines and the drain terminal; Forming an inspection data transistor connected to the data line and the drain terminal in a non-display area of the array substrate; Applying each of the first to third inspection gate control signals generated from the lighting inspection apparatus to the gate terminal of the first to third inspection gate transistors; Applying a test gate signal generated from the lighting test apparatus to a source terminal of the first to third test gate transistors; Applying a test data control signal generated from the lighting test apparatus to a gate terminal of the test data transistor; Applying a test data signal generated from the lighting test apparatus to a source terminal of the test data transistor; The first to third inspection gate control signals are independent control signals. How to check the lighting of LCD. The method of claim 13, Forming first to third inspection gate control pads in the non-display area of the array substrate, the first to third inspection gate control pads being connected to the gate terminals of the first to third inspection gate transistors; Forming an inspection gate pad connected to a source terminal of the first to third inspection gate transistors in a non-display area of the array substrate; Forming an inspection data control pad connected to a gate terminal of the inspection data transistor in a non-display area of the array substrate; Forming an inspection data pad connected to a source terminal of the inspection data transistor in a non-display area of the array substrate; Each of the first to third inspection gate control signals, the inspection gate signal, the inspection data control signal, and the inspection data signal generated from the lighting inspection apparatus is the first to third inspection gate control pads. And applied to the inspection gate pad, the inspection data control pad, and the inspection data pad. How to check the lighting of LCD.

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