KR20090128913A - Texturing apparatus and method for solar battery silicon board - Google Patents
Texturing apparatus and method for solar battery silicon board Download PDFInfo
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- KR20090128913A KR20090128913A KR1020080054893A KR20080054893A KR20090128913A KR 20090128913 A KR20090128913 A KR 20090128913A KR 1020080054893 A KR1020080054893 A KR 1020080054893A KR 20080054893 A KR20080054893 A KR 20080054893A KR 20090128913 A KR20090128913 A KR 20090128913A
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- 238000000034 method Methods 0.000 title claims abstract description 94
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 57
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 57
- 239000010703 silicon Substances 0.000 title claims abstract description 57
- 239000000758 substrate Substances 0.000 claims abstract description 109
- 239000007789 gas Substances 0.000 claims abstract description 81
- 239000012495 reaction gas Substances 0.000 claims abstract description 41
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 22
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 18
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 9
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 9
- 239000001301 oxygen Substances 0.000 claims abstract description 9
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 claims description 49
- 239000003054 catalyst Substances 0.000 claims description 49
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims description 21
- 229910052731 fluorine Inorganic materials 0.000 claims description 21
- 239000011737 fluorine Substances 0.000 claims description 20
- 238000001312 dry etching Methods 0.000 claims description 17
- 238000005530 etching Methods 0.000 claims description 3
- 238000009616 inductively coupled plasma Methods 0.000 claims description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 2
- 239000000126 substance Substances 0.000 abstract description 11
- 230000003197 catalytic effect Effects 0.000 abstract 7
- 239000004065 semiconductor Substances 0.000 description 11
- 238000002310 reflectometry Methods 0.000 description 6
- 238000011437 continuous method Methods 0.000 description 5
- 239000000376 reactant Substances 0.000 description 5
- 125000004122 cyclic group Chemical group 0.000 description 3
- 230000003213 activating effect Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- FMWMEQINULDRBI-UHFFFAOYSA-L copper;sulfite Chemical compound [Cu+2].[O-]S([O-])=O FMWMEQINULDRBI-UHFFFAOYSA-L 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 150000002221 fluorine Chemical class 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 239000011669 selenium Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic System
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
- H01L31/02363—Special surface textures of the semiconductor body itself, e.g. textured active layers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Abstract
Description
본 발명은 태양전지용 실리콘 기판의 텍스처링 장치 및 그 방법에 관한 것으로, 구체적으로는 텍스처링 공정 중 발생하는 기판 표면의 손상을 방지하고, 반사율을 효과적으로 줄일 수 있는 태양전지용 실리콘 기판의 텍스처링 장치 및 그 방법에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a texturing apparatus and method for a silicon substrate for a solar cell, and more particularly, to a texturing apparatus and method for a silicon substrate for a solar cell, which can prevent damage to a surface of a substrate generated during a texturing process and effectively reduce reflectance. It is about.
일반적으로 태양전지(solar battery)는 태양에너지를 전기에너지로 변환할 목적으로 제작된 광전지로서, 금속과 반도체의 접촉면 또는 반도체의 PN접합에 빛이 조사(照射)되면 광전효과에 의해 광기전력이 일어나는 원리를 이용한 전지이다. 이러한 태양전지의 종류에는 금속과 반도체의 접촉을 이용한 셀렌광전지, 아황산구리 광전지 등과 반도체 PN접합을 이용한 실리콘광전지 등이 있다.In general, a solar battery is a photovoltaic cell manufactured for converting solar energy into electrical energy. When light is irradiated on a contact surface of a metal and a semiconductor or a PN junction of a semiconductor, photovoltaic power is generated by a photoelectric effect. It is a battery using the principle. Examples of such solar cells include selenium photovoltaic cells using metal and semiconductor contacts, copper sulfite photovoltaic cells, and silicon photovoltaic cells using semiconductor PN junctions.
상술한 바와 같은 다양한 종류의 태양전지 중 반도체 PN접합을 이용한 태양전지는 실리콘에 보론(B)을 첨가한 P형 실리콘 반도체의 표면에 인(P)을 확산시켜 N형 실리콘 반도체층이 형성된 구조로 이루어진다. 이러한 구조에 빛이 입사되면 반도체 내의 전자(-)와 정공(+)이 여기되어 반도체 내부를 자유로이 이동하는 상태 가 되고, 자유로이 이동하던 전자(-)와 정공(+)이 PN접합에 의해 생긴 전계에 들어오면 전자(-)는 N형 반도체로, 정공(+)은 P형 반도체로 이동함으로써 전력을 생산한다.Among the various types of solar cells described above, a solar cell using a semiconductor PN junction has a structure in which an N-type silicon semiconductor layer is formed by diffusing phosphorus (P) on the surface of a P-type silicon semiconductor in which boron (B) is added to silicon. Is done. When light enters the structure, electrons (-) and holes (+) in the semiconductor are excited to move freely inside the semiconductor, and the freely moving electrons (-) and holes (+) are generated by PN junctions. The electrons (-) move to the N-type semiconductor, and the holes (+) move to the P-type semiconductor.
한편, 최근에는 태양전지의 효율을 높이기 위하여 기판 표면을 텍스처링(texturing)하여 빛의 흡수를 극대화시키는 방법이 사용되고 있는 데, 이러한 텍스처링 방법으로는 플라즈마 식각을 이용한 방법, 기계적 스크라이빙(scribing) 방법 및 포토리소그라피를 이용한 방법 등이 있다.Recently, in order to increase the efficiency of solar cells, a method of maximizing light absorption by texturing the surface of a substrate has been used. Such texturing methods include plasma etching and mechanical scribing. And photolithography.
이 중에서 플라즈마 식각을 이용한 방법은 포토레지스트를 도포해 패턴을 형성한 후 플라즈마를 이용하여 식각하고 마스크 레이어를 제거하는 방법으로, 작업시간이 오래 걸리며 고가의 진공장비가 필요하기 때문에 상업적 이용 가능성이 적다.Among them, the plasma etching method is a method of applying a photoresist to form a pattern, followed by etching using a plasma and removing a mask layer, which requires a long time and requires expensive vacuum equipment, so it is less commercially available. .
또한, 기계적 스크라이빙 방법은 기판의 표면에 그루브(groove)를 형성하고 화학적인 식각을 이용하여 텍스처링하는 방법으로, 이 또한 작업시간이 오래 걸리기 때문에 상업적인 생산이 어렵고 박막에 적용하기 어려운 문제가 있다.In addition, the mechanical scribing method is a method of forming a groove on the surface of the substrate and texturing using chemical etching, which also takes a long time, making it difficult to commercially produce and apply to thin films. .
또한, 포토리소그라피를 이용한 방법은 산화막이 있는 기판에 포토레지스트를 도포하여 패턴을 형성하고 이를 이방성/등방성 식각 방법을 통해 텍스처링하는 방법으로 가격이 너무 비싼 공정이기 때문에 다결정 태양전지 제작에 상업적으로 적용하기 힘들다.In addition, the method using photolithography is a method that forms a pattern by applying a photoresist on the substrate with an oxide film and texturing it through anisotropic / isotropic etching method, which is too expensive to commercially apply to the production of polycrystalline solar cells Hard.
본 발명은 상술한 제반 문제점을 해결하기 위한 것으로서 텍스처링 공정 중 발생하는 기판 표면의 손상을 방지하고, 반사율을 효과적으로 줄일 수 있는 태양전지용 실리콘 기판의 텍스처링 장치 및 그 방법을 제공하는데 그 목적이 있다.SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and an object thereof is to provide a texturizing apparatus and method for fabricating a silicon substrate for a solar cell, which can prevent damage to the surface of a substrate generated during a texturing process and effectively reduce reflectance.
또한, 본 발명의 다른 목적은 텍스처링 작업시간을 단축할 수 있으며, 작업 시 소요되는 인력 및 비용을 절감하여 상업적으로 이용 가능성이 높은 태양전지용 실리콘 기판의 텍스처링 장치 및 그 방법을 제공하는데 있다.In addition, another object of the present invention is to provide a texturing apparatus and method of the silicon substrate for solar cells, which can shorten the texturing work time, reduce the manpower and cost required during the work and commercially available.
상술한 목적을 달성하기 위한 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 장치는, 기판 스테이지가 마련되는 챔버와, 불소성분을 포함한 반응가스를 챔버로 공급하는 제1공급관과, 상기 제1공급관 상에 마련되어 반응가스를 플라즈마화하는 제1원격플라즈마발생기를 포함한다. 즉, 상기 제1원격플라즈마발생기를 통해 플라즈마화된 반응가스(불소성분을 포함한 반응가스)에 기판의 표면을 노출하여 건식 식각한다.According to another aspect of the present invention, a texturing apparatus for a silicon substrate for a solar cell according to the present invention includes a chamber in which a substrate stage is provided, a first supply pipe for supplying a reaction gas containing a fluorine component to the chamber, and the first supply pipe on the first supply pipe. And a first remote plasma generator configured to convert the reaction gas into plasma. That is, dry etching is performed by exposing the surface of the substrate to a reaction gas (reaction gas containing a fluorine component) that is plasmaized through the first remote plasma generator.
상술한 구성으로 이루어진 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 장치는 반응가스를 이용한 화학적 건식 식각 효율을 향상시키기 위하여 다양한 종류의 촉매를 사용할 수 있다.The texturing apparatus of the silicon substrate for a solar cell according to the present invention having the above-described configuration may use a variety of catalysts to improve the chemical dry etching efficiency using the reaction gas.
이를 위해서는 산소 및 질소성분을 포함한 제1촉매가스를 챔버로 공급하는 제2공급관과, 상기 제2공급관 상에 마련되어 상기 제1촉매가스를 플라즈마화하는 제2원격플라즈마발생기를 더 포함하여 구성될 수 있다. 또한, 산화질소성분을 포함한 제2촉매가스를 챔버로 직접 공급하는 제3공급수단을 더 포함하여 구성될 수 있다.To this end, it may further include a second supply pipe for supplying a first catalyst gas containing oxygen and nitrogen components to the chamber, and a second remote plasma generator provided on the second supply pipe for plasmalizing the first catalyst gas. have. In addition, it may further comprise a third supply means for supplying a second catalyst gas containing a nitrogen oxide component directly to the chamber.
한편, 반응가스를 이용한 화학적 건식 식각 효율을 향상시키기 위한 또 따른 장치인, 기판 스테이지의 내부에 마련되는 하부전극, 하부전극에서 상향으로 소정 간격 이격되는 상부전극, 상기 상부 및 하부전극에 고주파 전원을 공급하는 전원공급수단을 더 포함하여 구성될 수 있다.Meanwhile, another device for improving the chemical dry etching efficiency using the reaction gas, a lower electrode provided inside the substrate stage, an upper electrode spaced upwardly from the lower electrode by a predetermined interval, and a high frequency power source is applied to the upper and lower electrodes. It may further comprise a power supply means for supplying.
여기서 상기 반응가스는 상술한 바와 같이 불소성분을 포함하는 가스로 F2, NF3 중 하나 이상, 그리고 N2, O2, N2O, NO2 중 하나 이상이 조합된 가스인 것이 바람직하다. 또한, 상기 제1촉매가스는 산소 및 질소성분을 포함한 가스로 N2, O2, N2O, NO2를 포함하며, 상기 제2원격플라즈마발생기를 통해 플라즈마화되어 챔버로 공급되는 것이 바람직하다. 또한, 상기 제2촉매가스는 산화질소성분을 포함한 가스로 NXOX, Ar 중 하나 이상이 조합된 가스이며, 제3공급수단을 통해 챔버로 직접 공급되는 것이 바람직하다.Here, the reaction gas is a gas containing a fluorine component as described above, at least one of F 2 , NF 3 , and at least one of N 2 , O 2 , N 2 O, and NO 2 are preferably combined. The first catalyst gas may include N 2 , O 2 , N 2 O, and NO 2 as a gas including oxygen and nitrogen, and may be supplied to a chamber by being plasmaized through the second remote plasma generator. . In addition, the second catalyst gas is a gas containing a nitrogen oxide component, a gas in which one or more of N X O X and Ar are combined, and is preferably supplied directly to the chamber through a third supply means.
본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법은 텍스처링 공정 중 발생하는 기판 표면의 손상을 방지하고 반사율을 효과적으로 줄일 수 있도록 불소성분을 포함한 반응가스를 사용한다. 즉, 불소성분을 포함한 반응가스를 플라즈마화하여 생성된 제1라디칼에 기판의 표면을 노출하여 화학적 건식 식각을 한다.The texturing method of the silicon substrate for a solar cell according to the present invention uses a reaction gas containing a fluorine component to prevent damage to the surface of the substrate generated during the texturing process and effectively reduce the reflectance. That is, chemical dry etching is performed by exposing the surface of the substrate to the first radical generated by plasma-forming a reaction gas containing a fluorine component.
여기서 본 발명은 화학적 건식 식각 효율을 향상시키기 위하여 다양한 종류의 촉매를 사용할 수 있는 데, 제1라디칼과 산소 및 질소성분을 포함한 제1촉매가 스를 플라즈마화하여 생성된 제2라디칼에 기판의 표면을 노출하여 건식 식각하거나, 제1라디칼과 산화질소성분을 포함한 제2촉매가스에 기판의 표면을 노출하여 건식 식각할 수 있다. 또한, 제1 및 제2라디칼과 제2촉매가스에 기판의 표면을 노출하여 건식 식각할 수 있다.Herein, the present invention may use various types of catalysts to improve chemical dry etching efficiency, wherein the surface of the substrate is formed on the second radical generated by plasmalizing the first catalyst gas including the first radical and oxygen and nitrogen components. The dry etching may be performed by exposing the surface of the substrate to the second catalyst gas including the first radical and the nitrogen oxide component. In addition, dry etching may be performed by exposing the surface of the substrate to the first and second radicals and the second catalyst gas.
한편, 텍스처링 효율 및 속도를 향상시킬 수 있도록 기판의 상부 및 하부에 고주파 전원을 인가하여 챔버 내부에서 플라즈마를 추가로 발생한다. 이때, 고주파 전원을 이용한 플라즈마 발생방법은 기판의 상부 및 하부에 모두 고주파 전원을 인가하는 연속적 방법과, 기판의 상부 및 하부 중 어느 일측에만 고주파 전원을 인가하는 단계적 방법과, 기판의 상부 및 하부에 교번하여 고주파 전원을 인가하는 순환적 방법이 있다.Meanwhile, high-frequency power is applied to the upper and lower portions of the substrate to further improve the texturing efficiency and speed, thereby further generating plasma inside the chamber. At this time, the plasma generation method using a high frequency power supply is a continuous method of applying a high frequency power to both the top and bottom of the substrate, a stepwise method of applying a high frequency power to only one side of the top and bottom of the substrate, and the top and bottom of the substrate There is a cyclic method of alternately applying high frequency power.
본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 장치 및 방법은 기판을 용액에 침지시키지 아니하고 플라즈마화된 반응가스(불소성분을 포함한 반응가스)에 기판을 노출하여 건식 식각함으로써 텍스처링 공정 중 발생하는 기판 표면의 손상을 방지하고, 반사율을 효과적으로 줄일 수 있다.According to the present invention, an apparatus and method for texturing a silicon substrate for a solar cell is performed by dry etching by exposing the substrate to a plasmaized reaction gas (reaction gas containing a fluorine component) without immersing the substrate in a solution. It can prevent damage and reduce the reflectance effectively.
또한, 불소성분을 포함한 반응가스 이외에 산소 및 질소성분을 포함한 제1촉매가스 및 산화질소성분을 포함한 제2촉매가스를 사용함으로써 화학적 건식 식각 효율이 향상되어 텍스처링 작업시간을 단축할 수 있으며, 그에 따라 작업 시 소요되는 인력 및 비용을 절감되는바 상업적으로 이용 가능성이 높다.In addition, by using the first catalyst gas containing the oxygen and nitrogen components and the second catalyst gas containing the nitrogen oxide components in addition to the reaction gas containing the fluorine component, the chemical dry etching efficiency is improved, thereby reducing the texturing work time. It is highly commercially available because it saves manpower and money in the work.
첨부된 도면을 참조하여 본 발명에 따른 실시예를 상세히 설명한다.With reference to the accompanying drawings will be described embodiments of the present invention;
도 1은 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 장치를 도시하는 개략도이다.1 is a schematic view showing a texturing apparatus for a silicon substrate for solar cell according to the present invention.
도 1에 도시된 바와 같이, 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 장치는 크게 챔버(110)와, 상기 챔버(110)로 반응가스 및 촉매가스를 공급하기 위한 가스공급수단(120~140)으로 구성된다.As shown in FIG. 1, the texturing apparatus for a silicon substrate for a solar cell according to the present invention includes a chamber 110 and a
상기 가스공급수단(120~140)에 대해 먼저 살펴보면, 챔버(110)의 내부로 반응가스, 제1 및 제2촉매가스를 주입하기 위한 수단으로, 반응가스가 주입되는 제1공급수단(120)과, 제1촉매가스가 주입되는 제2공급수단(130)과, 제2촉매가스가 주입되는 제3공급수단(140)을 포함한다. 이때, 상기 반응가스와 제1촉매가스는 플라즈마화된 상태로 챔버(110)에 공급되고, 상기 제2촉매가스는 플라즈마화되지 않은 상태로 챔버(110)에 직접 공급된다.Looking at the gas supply means 120 ~ 140 first, means for injecting the reaction gas, the first and second catalyst gas into the interior of the chamber 110, the first supply means 120 is injected reaction gas And a second supply means 130 into which the first catalyst gas is injected, and a third supply means 140 into which the second catalyst gas is injected. In this case, the reaction gas and the first catalyst gas are supplied to the chamber 110 in a plasma state, and the second catalyst gas is directly supplied to the chamber 110 in a non-plasma state.
이를 위한 각 가스공급수단(120~140)의 구성을 살펴보면, 상기 제1공급수단(120)은 반응가스를 공급하는 제1공급관(122)과 상기 제1공급관(122) 상에 마련되는 제1원격플라즈마발생기(124)로 구성되고, 상기 제2공급수단(130)은 제1촉매가스를 공급하는 제2공급관(132)과 상기 제2공급관(132) 상에 마련되는 제2원격플라즈마발생기(134)로 구성된다. 또한, 상기 제3공급수단(140)은 제2촉매가스를 공급하는 파이프이다.Looking at the configuration of each gas supply means (120 ~ 140) for this purpose, the first supply means 120 is a
여기서 상기 반응가스는 실리콘 기판(이하 기판이라고 함, 150)의 화학적 건식 식각을 위한 가스로 불소성분을 포함하는 가스이다. 또한, 상기 제1 및 제2촉 매가스는 화학적 건식 식각 효율을 향상시키기 위한 가스로 상기 제1촉매가스는 산소 및 질소성분을 포함한 가스이고, 상기 제2촉매가스는 산화질소성분을 포함한 가스이다. 일례로, 상기 반응가스는 F2, NF3 중 하나 이상, 그리고 N2, O2, N2O, NO2 중 하나 이상이 조합된 가스인 것이 바람직하고, 상기 제1촉매가스는 N2, O2, N2O, NO2를 포함하는 것이 바람직하며, 상기 제2촉매가스는 NXOX, Ar 중 하나 이상이 조합된 가스인 것이 바람직하다.Here, the reaction gas is a gas for chemical dry etching of a silicon substrate (hereinafter, referred to as a substrate) 150 and includes a fluorine component. In addition, the first and second catalyst gas is a gas for improving chemical dry etching efficiency, the first catalyst gas is a gas containing oxygen and nitrogen components, the second catalyst gas is a gas containing nitrogen oxide components. . In one example, the reaction gas is preferably a combination of one or more of F 2 , NF 3 , and one or more of N 2 , O 2 , N 2 O, NO 2 , the first catalyst gas is N 2 , It is preferable to include O 2 , N 2 O, NO 2 , and the second catalyst gas is preferably a gas in which one or more of N X O X and Ar are combined.
한편, 반응가스 및 제1촉매가스를 플라즈마화하기 위한 제1 및 제2원격플라즈마발생기(124,134)는 발생된 제1 및 제2라디칼을 원격으로 챔버(110)에 공급한다. 따라서 상술한 제1 및 제2원격플라즈마발생기(124,134)는 발생된 제1 및 제2라디칼을 기판(150)에 직접 쏘지 아니하므로 텍스처링 공정 중 발생하는 기판(150) 표면의 손상을 방지할 수 있다.Meanwhile, the first and second
다른 한편, 상기 제1 및 제2원격플라즈마발생기(124,134)는 토로이달(toroidal) 타입으로 제1 및 제2공급관(122,132) 내에서 유도자기장을 발생하고, 이에 따른 2차 유도전류가 제1 및 제2원격플라즈마발생기(124,134)의 내부에 형성됨으로써 고밀도 플라즈마를 발생시킨다. 이와 같이, 본 발명은 토로이달 타입의 원격플라즈마발생기를 사용하고 있지만, 반드시 이에 한정되는 것은 아니며 마이크로웨이브(microwave) 타입 및 유도결합플라즈마(Inductively Coupled Plasma; ICP) 타입 등과 같이 다양한 종류의 원격플라즈마발생기가 적용될 수 있음은 물론이다.On the other hand, the first and second remote plasma generator (124,134) is a toroidal type (toroidal) generates an induction magnetic field in the first and second supply pipe (122,132), the secondary induction current according to the first and second The high density plasma is generated by being formed inside the second
본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 장치의 다른 구성요소인 챔버(110)는 기판(150)의 텍스처링 공정이 수행되는 부분으로 그 내부에 소정의 반응공간(112)이 형성된다. 그리고 상기 반응공간(112)에는 기판(150)이 안착 및 고정되는 기판 스테이지(114)가 마련되며, 상기 기판 스테이지(114)의 내부에는 하부전극(116d)이 마련된다. 또한, 상기 하부전극(116d)에서 상향으로 소정 간격 이격되는 위치에는 상부전극(116u)이 마련된다.The chamber 110, which is another component of the texturing apparatus of the silicon substrate for solar cell according to the present invention, is a portion where the texturing process of the
이때, 상기 상부 및 하부전극(116u,116d)은 도전성 부재로 제작되고 고주파 전원을 공급하는 전원공급수단(118u,118d)과 연결된다. 따라서 상기 상부 및 하부전극(116u,116d)에 고주파 전원이 인가되면 그들(116u,116d) 사이의 전기장 영역에서 이온입자들이 가속화되어 주입된 가스를 이온화시켜 플라즈마가 발생된다. 즉, 상기 챔버(110)의 내부에서 플라즈마가 추가로 발생하게 되는바, 텍스처링 효율 및 속도를 향상시킬 수 있다.In this case, the upper and
상술한 상부 및 하부전극(116u,116d)을 이용하여 플라즈마를 발생하는 방법에는 연속적 방법, 단계적 방법 및 순환적 방법이 있다. 이 중에서 연속적 방법은 상기 상부 및 하부전극(116u,116d)에 고주파 전원을 인가하는 방법이고, 단계적 방법은 상부 및 하부전극(116u,116d) 중 어느 하나에만 고주파 전원을 인가하는 방법이며, 순환적 방법은 상부 및 하부전극(116u,116d)에 고주파 전원을 교번하여 인가하는 방법이다.The above-described method for generating plasma using the upper and
한편, 상기 기판(150)을 기판 스테이지(114)에 안착 및 고정하는 방법에는 척킹(chucking) 공구를 이용하는 기계적인 방법, 기판 스테이지(114)에 진공홀을 형성하여 진공력을 이용하는 방법 및 하부전극(116d)에 전원을 인가하여 흡착하는 방법이 있으며, 사용자의 필요 및 장치의 구조에 따라 어느 하나를 적용하여 사용할 수 있음은 물론이다.Meanwhile, a method of mounting and fixing the
도 2 내지 도 4는 상술한 구성에 의한 태양전지용 실리콘 기판의 텍스처링 장치를 이용한 텍스처링 방법을 도시하는 도면이다. 이를 참조하여 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법의 여러 실시예를 살펴보면 다음과 같다.2 to 4 are diagrams showing a texturing method using a texturing apparatus for a silicon substrate for a solar cell according to the above configuration. Looking at the various embodiments of the texturing method of the silicon substrate for solar cells according to the present invention with reference to this.
제1실시예First embodiment
본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법 중 제1실시예는 불소성분을 포함하는 반응가스를 이용하여 화학적 건식 식각공정을 진행한다. 이와 같이, 불소성분을 포함하는 라디칼에 실리콘 기판(150)이 노출되면 불소성분과 실리콘성분이 서로 결합하여 실리콘성분 사이의 결합을 약화시키고, 제거가 용이한 반응물인 SiF4의 생성을 촉진하여 기판(150)의 텍스처링 속도를 향상시킬 수 있기 때문이다.A first embodiment of the method for texturing a silicon substrate for a solar cell according to the present invention performs a chemical dry etching process using a reaction gas containing a fluorine component. As such, when the
도 2를 참조하여 그 과정을 살펴보면, 제1공급관(122)을 통해 공급되는 반응가스를 제1원격플라즈마발생기(124)에서 플라즈마화한다. 그리고 이때 발생된 제1라디칼을 챔버(110)로 주입하여, 챔버(110)의 내부에 마련된 기판(150)이 제1라디칼에 노출되게 함으로써 기판(150)의 표면을 텍스처링 한다.Looking at the process with reference to Figure 2, the reaction gas supplied through the
이때, 사용되는 반응가스는 F2, NF3 중 하나 이상, 그리고 N2, O2, N2O, NO2 중 하나 이상이 조합된 가스로, F2/N2/O2, F2/N2O, F2/NO2, F2/N2/O2/Ar, F2/N2O/Ar, F2/NO2/Ar, NF3/N2/O2, NF3/N2O, NF3/NO2, NF3/N2/O2/Ar, NF3/N2O/Ar, NF3/NO2/Ar를 포함한다. 그리고 상기 반응가스를 이용하여 생성한 제1라디칼은 불소(F) 라디칼 또는 불소 라디칼과 산화질소(NXOX) 라디칼이 혼합된 형태이다.At this time, the reaction gas used is a combination of one or more of F 2 , NF 3 , and one or more of N 2 , O 2 , N 2 O, NO 2 , F 2 / N 2 / O 2 , F 2 / N 2 O, F 2 / NO 2 , F 2 / N 2 / O 2 / Ar, F 2 / N 2 O / Ar, F 2 / NO 2 / Ar, NF 3 / N 2 / O 2 , NF 3 / N 2 O, NF 3 / NO 2 , NF 3 / N 2 / O 2 / Ar, NF 3 / N 2 O / Ar, NF 3 / NO 2 / Ar. In addition, the first radical generated using the reaction gas is in a form in which a fluorine (F) radical or a fluorine radical and a nitrogen oxide (N X O X ) radical are mixed.
제2실시예Second embodiment
본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법 중 제2실시예는 불소성분을 포함하는 반응가스와 산소 및 질소성분을 포함하는 제1촉매가스를 이용하여 화학적 건식 식각공정을 진행한다. 이러한 제2실시예는 불소성분을 포함하는 라디칼 이외에 산화질소성분을 포함하는 라디칼을 추가로 사용함으로써 반응물인 SiF4의 생성을 더욱 촉진하여 기판(150)의 텍스처링 속도를 급격히 향상시킬 수 있다.A second embodiment of the method for texturing a silicon substrate for a solar cell according to the present invention performs a chemical dry etching process using a reaction gas containing a fluorine component and a first catalyst gas containing oxygen and nitrogen components. In this second embodiment, by further using a radical containing a nitric oxide component in addition to the radical including a fluorine component, it is possible to further promote the generation of the reactant SiF 4 , thereby rapidly increasing the texturing speed of the
도 3에 도시된 바와 같이, 제1공급관(122)을 통해 공급되는 반응가스를 제1원격플라즈마발생기(124)에서 플라즈마화하여 제1라디칼을 생성하고, 그와 동시에 제2공급관(132)을 통하여 제1촉매가스를 제2원격플라즈마발생기(134)에서 플라즈마화하여 제2라디칼을 생성한다. 그리고 이렇게 생성된 제1 및 제2라디칼을 챔버(110)에 주입하여, 챔버(110)의 내부에 마련된 기판(150)이 제1 및 제2라디칼에 노출되게 함으로써 기판(150)의 표면을 텍스처링 한다.As shown in FIG. 3, the reaction gas supplied through the
이때, 사용되는 반응가스는 제1실시예와 동일한 F2, NF3 중 하나 이상, 그리 고 N2, O2, N2O, NO2 중 하나 이상이 조합된 가스이이고, 상기 제1촉매가스는 N2, O2, N2O, NO2를 포함하는 산화질소성분을 포함하는 가스이다. 그리고 상기 반응가스를 이용하여 생성한 제1라디칼은 불소(F) 라디칼 또는 불소 라디칼과 산화질소(NXOX) 라디칼이 혼합된 형태이고, 제1촉매가스를 이용하여 생성한 제2라디칼은 산화질소(NXOX) 라디칼이다.In this case, the reaction gas used is a gas in which one or more of F 2 and NF 3 , and one or more of N 2 , O 2 , N 2 O, and NO 2 are combined as the first embodiment, and the first catalyst gas is used. Is a gas containing a nitrogen oxide component including N 2 , O 2 , N 2 O, and NO 2 . The first radical generated using the reaction gas is in the form of a fluorine (F) radical or a mixture of fluorine radicals and nitrogen oxides (N X O X ) radicals, and the second radical generated using the first catalyst gas It is a nitrogen oxide (N X O X ) radical.
제3실시예Third embodiment
본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법 중 제3실시예는 불소성분을 포함하는 반응가스와 산화질소성분을 포함하는 제2촉매가스를 이용하여 화학적 건식 식각공정을 진행한다. 이러한 제2실시예는 불소성분을 포함하는 라디칼 이외에 산화질소성분을 포함하는 라디칼을 추가로 사용함으로써 반응물인 SiF4의 생성을 더욱 촉진하여 기판(150)의 텍스처링 속도를 급격히 향상시킬 수 있다.A third embodiment of the method for texturing a silicon substrate for a solar cell according to the present invention performs a chemical dry etching process using a reaction gas containing a fluorine component and a second catalyst gas containing a nitrogen oxide component. In this second embodiment, by further using a radical containing a nitric oxide component in addition to the radical including a fluorine component, it is possible to further promote the generation of the reactant SiF 4 , thereby rapidly increasing the texturing speed of the
도 4를 참조하여 그 과정을 살펴보면, 제1공급관(122)을 통해 공급되는 반응가스를 제1원격플라즈마발생기(124)에서 플라즈마화하여 제1라디칼을 생성한다. 그리고 이렇게 생성된 제1라디칼과 제4공급수단(140)을 통하여 공급된 제2촉매가스를 챔버(110)에 주입하여, 챔버(110)의 내부에 마련된 기판(150)이 제1라디칼 및 제2촉매가스에에 노출되게 함으로써 기판(150)의 표면을 텍스처링 한다.Looking at the process with reference to Figure 4, the reaction gas supplied through the
이때, 사용되는 반응가스는 제1실시예와 동일한 F2, NF3 중 하나 이상, 그리 고 N2, O2, N2O, NO2 중 하나 이상이 조합된 가스이이고, 상기 제2촉매가스는 NXOX, Ar 중 하나 이상이 조합된 가스이다.In this case, the reaction gas used is a gas in which at least one of F 2 and NF 3 , and at least one of N 2 , O 2 , N 2 O, and NO 2 are combined as the first embodiment, and the second catalyst gas is used. Is a gas in which at least one of N X O X and Ar is combined.
제4실시예Fourth embodiment
본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법 중 제4실시예는 상술한 제1 내지 제3실시예를 기본으로 한다. 즉, 제1 내지 제3실시예 중에서 필요에 따라 선택된 하나를 실시하는 과정에서 챔버(110)의 내부에 고주파 전원을 인가하여 플라즈마를 추가로 발생한다(도 5참조).A fourth embodiment of the texturing method of a silicon substrate for a solar cell according to the present invention is based on the first to third embodiments described above. That is, the plasma is additionally generated by applying high frequency power to the inside of the chamber 110 in the process of performing one selected from the first to third embodiments as needed (see FIG. 5).
이때, 고주파 전원을 인가하여 플라즈마를 발생하는 방법에는 연속적 방법, 단계적 방법 및 순환적 방법이 있다. 이 중에서 연속적 방법은 상기 상부 및 하부전극(116u,116d)에 고주파 전원을 인가하는 방법이고, 단계적 방법은 상부 및 하부전극(116u,116d) 중 어느 하나에만 고주파 전원을 인가하는 방법이며, 순환적 방법은 상부 및 하부전극(116u,116d)에 고주파 전원을 교번하여 인가하는 방법이다.At this time, a method of generating a plasma by applying a high frequency power source includes a continuous method, a step method and a cyclic method. Among them, the continuous method is a method of applying a high frequency power to the upper and
이와 같이 챔버(110)의 내부에서 플라즈마를 추가로 발생할 경우 제1 및 제2라디칼 및 제2촉매가스를 활성화하여 기판(150)의 텍스처링 효율 및 속도를 향상시킬 수 있다.As such, when the plasma is further generated inside the chamber 110, the texturing efficiency and speed of the
상술한 바와 같이 제1 내지 제4실시예에 따라 진행되는 태양전지용 실리콘 기판의 텍스처링 방법은 제1 및 제2라디칼, 제2촉매가스를 기판에 직접 접촉시키기 아니하고 제1 및 제2라디칼, 제2촉매가스에 기판을 노출하여 화학적 건식 식각함으로써 텍스처링 공정 중 발생하는 기판 표면의 손상을 방지할 수 있다.As described above, the method of texturing a silicon substrate for a solar cell according to the first to fourth embodiments includes the first and second radicals and the second and second radicals and the second catalyst gas without directly contacting the substrate. By exposing the substrate to the catalyst gas and chemically dry etching, damage to the surface of the substrate generated during the texturing process can be prevented.
또한, 불소 라디칼 또는 불소 라디칼과 산화질소 라디칼은 실리콘 기판(150)의 실리콘 성분과 결합하여 실리콘 사이의 결합을 약화시키고 제거가 용이한 반응물인 SiF4의 생성을 촉진시키므로 기판(150)의 텍스처링 속도를 향상시킬 수 있다. 특히, 제2 및 제3실시예와 같이 산화질소 라디칼 및 산화질소가스를 사용할 경우 반응물인 SiF4의 생성을 더욱 촉진하여 기판(150)의 텍스처링 속도를 급격히 향상시킬 수 있으며, 제4실시예와 같이 챔버(110)의 내부에서 플라즈마를 추가로 발생할 경우 제1 및 제2라디칼 및 제2촉매가스를 활성화하여 기판(150)의 텍스처링 효율 및 속도를 향상시킬 수 있다.In addition, the fluorine radical or the fluorine radical and the nitrogen oxide radical binds to the silicon component of the
한편, 상술한 제1 내지 제4실시예를 이용하여 기판(150)을 텍스처링하는 과정에서 상기 기판(150)의 온도는 25~300℃를 유지하는 것이 바람직하다. 또한, 상술한 제1 내지 제4실시예는 텍스처링의 방향성과 무관하므로 단결정 및 다결정 실리콘 기판을 모두 사용할 수 있다.Meanwhile, in the process of texturing the
도 6은 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 시 제1실험예에 따른 반사도의 변화를 나타낸 그래프이다.6 is a graph showing a change in reflectivity according to the first experimental example when texturing a silicon substrate for a solar cell according to the present invention.
상기 제1실험예는 제1실시예에 예시된 방법을 이용한 기판(도 1의 150)의 텍스처링 시 산화질소가스의 유량비에 따른 반사도의 변화를 실험한 것이다. 이때의 실험조건을 살펴보면, 사용된 기판(150)은 단결정 기판이고, 반응가스와 제1 및 제2촉매가스는 Ar 등의 성분을 포함한다. 또한, 반응가스와 제1 및 제2촉매가스에 포함된 NF3의 유량은 2100~2700sccm이고 NO의 유량은 700~900sccm이며, 공정압력은 3Torr, 공정온도는 100℃, 텍스처링 시간은 1분으로 설정하였다.In the first experimental example, the change of reflectivity according to the flow rate ratio of the nitric oxide gas during texturing of the substrate (150 of FIG. 1) using the method illustrated in the first embodiment was tested. Looking at the experimental conditions at this time, the
그 실험결과 도 6의 그래프와 같은 결과(기판의 반사율)를 얻을 수 있는 데, 그래프에 나타난 바와 같이 NF3의 유량은 2400sccm, NO의 유량은 800sccm인 상태에서 가장 낮은 반사율(%)을 얻을 수 있다.As a result, as shown in the graph of FIG. 6, the results (substrate reflectance) can be obtained. As shown in the graph, the lowest reflectance (%) can be obtained at a flow rate of 2400 sccm for NF 3 and 800 sccm for NO. have.
도 7은 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 시 제2실험예에 따른 반사도의 변화를 나타낸 그래프이다.7 is a graph showing a change in reflectivity according to the second experimental example during texturing of the silicon substrate for a solar cell according to the present invention.
상기 제2실험예는 제1실험예 중 반사율이 가장 낮은 조건, 즉 NF3의 유량은 2400sccm, NO의 유량은 800sccm인 조건에서 텍스처링 시간에 따른 반사도 변화를 실험한 것이다.In the second experimental example, the reflectivity change according to the texturing time was tested under the condition of the lowest reflectance among the first experimental examples, that is, the flow rate of NF 3 is 2400sccm and the flow rate of NO is 800sccm.
그 실험결과 도 7의 그래프와 같이 텍스처링 시간이 늘어날수록 더 낮은 반사율(%)을 얻을 수 있다.As a result of the experiment, as the texturing time increases as shown in the graph of FIG. 7, a lower reflectance (%) can be obtained.
본 발명의 바람직한 실시예에 따른 태양전지용 실리콘 기판의 텍스처링 장치의 구성 및 그를 이용한 텍스처링 방법을 상기한 설명 및 도면에 따라 도시하였지만, 이는 예를 들어 설명한 것에 불과하며 본 발명의 기술적 사상을 벗어나지 않는 범위 내에서 다양한 변화 및 변경이 가능하다는 것을 이 분야의 통상적인 기술자들은 잘 이해할 수 있을 것이다.Although the configuration of the texturing apparatus and the texturing method using the same of the silicon substrate for a solar cell according to the preferred embodiment of the present invention is shown in accordance with the above description and drawings, but this is only an example and the scope does not depart from the spirit of the present invention. It will be apparent to those skilled in the art that various changes and modifications can be made therein.
도 1은 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 장치를 도시하는 개략도.1 is a schematic view showing a texturing apparatus for a silicon substrate for a solar cell according to the present invention.
도 2는 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법 중 제1실시예를 도시하는 도면.2 is a view showing a first embodiment of the texturing method of the silicon substrate for solar cells according to the present invention.
도 3은 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법 중 제2실시예를 도시하는 도면.3 is a view showing a second embodiment of the texturing method of the silicon substrate for solar cells according to the present invention.
도 4는 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법 중 제3실시예를 도시하는 도면.4 is a view showing a third embodiment of the texturing method of the silicon substrate for solar cells according to the present invention.
도 5는 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 방법 중 제4실시예를 도시하는 도면.5 is a view showing a fourth embodiment of the texturing method of the silicon substrate for solar cells according to the present invention.
도 6은 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 시 산화질소가스의 유량비에 따른 반사도 변화를 나타낸 그래프.Figure 6 is a graph showing the change in reflectivity according to the flow rate of nitric oxide gas during texturing of the silicon substrate for solar cells according to the present invention.
도 7은 본 발명에 의한 태양전지용 실리콘 기판의 텍스처링 시 중 텍스처링 시간에 따른 반사도 변화를 나타낸 그래프.7 is a graph showing a change in reflectivity according to texturing time during texturing of a silicon substrate for a solar cell according to the present invention.
*도면의 주요 부분에 대한 부호의 설명** Description of the symbols for the main parts of the drawings *
110: 챔버 120: 제1공급수단110: chamber 120: first supply means
130: 제2공급수단 140: 제3공급수단130: second supply means 140: third supply means
150: 기판150: substrate
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