KR20090090677A - Liquid crystal display device - Google Patents

Abstract

A liquid crystal display device for reducing moire generation and improving the viewing angle is provided to prevent the deterioration of backlight unit lightness and lifetime reduction by preventing the damage or deformation the liquid crystal display. A machine material unit supports phase protrusion and protrusion. An upper projector(20) consecutively arranges cylindrical lens. A terminal unit(21) is formed in order to minimize the damage by external shock or vibration. A light extracting surface is deflected to the front direction of the LCD panel by supplementing the lack of deflection angle. A non lens side supports the inclined exit face.

Description

Liquid crystal display {LIQUID CRYSTAL DISPLAY DEVICE}

The present invention relates to a liquid crystal display device that includes a more accurate lighting inspection structure while improving space constraints.

Recently, various flat panel display devices that can reduce weight and volume, which are disadvantages of cathode ray tubes, have emerged. Such flat panel display devices include liquid crystal display devices, field emission display devices, plasma display devices, and organic electroluminescence display devices. There is this.

Such flat panel display devices are provided in video display devices such as TVs and computer monitors to display various images and texts including a video.

Among the flat panel display devices, the liquid crystal display device may satisfy the light and small trend of electronic products, and mass production is improved, and thus it is used in many applications.

In particular, an active matrix type liquid crystal display device that drives a liquid crystal cell using a thin film transistor (TFT) has advantages of excellent image quality and low power consumption. It is rapidly developing in size and high resolution.

A manufacturing process for manufacturing an active matrix type liquid crystal display device is divided into a substrate cleaning, a substrate patterning process, an alignment film forming / rubbing process, a substrate bonding / liquid crystal injection process, an inspection process, a repair process, a mounting process, and the like.

1 is a view schematically showing a general liquid crystal display device.

As shown in FIG. 1, a general liquid crystal display device includes a display area 10 and a display area 10 in which a plurality of gate lines 11 and data lines 12 are arranged in a matrix to display an image. It is composed of a non-display area 20 is disposed at the edge of the image is not displayed.

A plurality of pixels are defined in the display area 10, and thin film transistors (not shown) for switching pixels are provided at intersections of the gate line 11 and the data line 12.

The non-display area 20 includes a data driver area 21 in which a data driver IC is mounted. In the driver region 21, a plurality of input / output pads 22b and 22a which receive signals from the outside and supply data signals to the data lines 12 of the display region 10 are disposed.

In the non-display area 20, a first test data pad 26R and a green G test data signal are provided to supply a test data signal of red color R to data lines connected to a pixel displaying red color. A second test data pad 26G for supplying data lines connected to a pixel displaying green and a third test data pad for supplying a test data signal of blue B to data lines displaying blue. 26B is disposed.

In the non-display area 20, first to third enable pads 27a, 28b, and 27c and a common electrode pad 28 are formed.

First to third switch groups Sr, Sg, and Sb are formed between the input / output pads 22b and 22a of the driver region 21. The first to third switch groups Sr, Sg, and Sb form a channel in enable signals input through the first to third enable pads 27a, 27b, and 27c from the outside, and thus, are turned off. Change to turn-on state.

When the first switch group Sr is turned on by the enable signal supplied from the first enable pad 27a, the red test data signal supplied to the first test data pad 26R is changed. The disconnection of the corresponding data lines is determined by being supplied to the data lines connected to the pixels displaying red through the first switch group Sr.

Data lines connected to the pixels displaying green and blue are disconnected in the same manner as data lines connected to the pixels displaying red.

The lighting test described above (disconnection determination of the disconnection of data lines) may be performed through electrical inspection after various signal wirings and pixel electrodes are formed on the lower substrate, and through electrical inspection and visual inspection after the substrate bonding / liquid crystal injection process. It may be practiced.

However, these general liquid crystal display devices have the following problems.

In general liquid crystal display devices, the first to third switch groups Sr, Sg, and Sb for testing are formed in a driver region in which a driver IC is to be mounted, and thus, the size of the driver IC is recently reduced. That is, in the general liquid crystal display device, the space in which the first to third switch groups Sr, Sg, and Sb for the test for lighting are formed gradually decreases, thereby causing a large space limitation.

An object of the present invention is to provide a liquid crystal display device that can improve the difficulty of the lighting test of the liquid crystal display device due to space constraints.

Liquid crystal display device according to an embodiment of the present invention,

A display area formed by crossing a plurality of gate lines and data lines; A non-display area electrically connected to the gate lines and the data lines to form a gate pad and a data pad supplied with a scan signal and a data signal; And an inspection unit formed at both sides of the gate lines and the data lines to supply a test scan signal and a test data signal to both sides of the gate lines and the data lines.

According to the present invention, switches made of transistors can be formed with a smaller capacity than the conventional one so that the size of the driver IC can be reduced. Since the switch capacity when using two switches can be smaller than when using one switch, the size can be reduced with the smaller capacity. Therefore, the present invention has the effect that the size of the driver IC can be reduced and the difficulty caused by space limitation can be improved.

In addition, the present invention is a structure that can determine the disconnection failure of all areas of the gate lines and data lines, it is possible to improve the space constraint and at the same time more accurate lighting test.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

2 is a schematic view of a liquid crystal display according to an exemplary embodiment of the present invention.

As shown in FIG. 2, the liquid crystal display according to the exemplary embodiment may be divided into a display area 110 in which an image is displayed and a non-display area 120 disposed at a side of the display area 110. Lose.

The display area 110 includes a plurality of pixels (not shown) defined by a plurality of gate lines G1 through Gn, data lines RD1 through RDm, GD1 through GDm, and BD1 through BDm, and the gate lines. A thin film transistor (not shown) is formed in each of the intersections of (G1 to Gn) and the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm to switch the pixels (not shown).

Outside the display area 110, the first switch group SW1 connected to the gate lines G1 to Gn, and the second to connected to the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm. Fourth switch group SW2, SW3, SW4 is formed.

In the non-display area 120, data input / output pads 122b and 122a, in which a driver IC is mounted and supply driving signals supplied from the outside, are respectively supplied to the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm. Gate input pads 123a and 123b to which scan signals are supplied.

In the non-display area 120, first and second test gate pads 125a and 125b to which a test scan signal is supplied from the outside to determine whether the gate lines G1 to Gn are disconnected, and the first and second test lines. Second enable pads 129a and 129b are formed.

In the non-display area 120, first to third test data pads 126R to which a test data signal is supplied from the outside to determine whether a disconnection is present in the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm. , 126G, 126B, and third to fifth enable pads 127a, 127b, and 127c are formed.

The first and second test gate pads 125a and 125b are electrically connected to the gate lines G1 to Gn.

The first test data pad 126R is electrically connected to the red data lines RD1 to RDm connected to the pixels displaying red by the second switch group SW2.

The second test data pad 126G is electrically connected to the green data lines GD1 to GDm connected to the pixel displaying green by the third switch group SW3.

The third test data pad 126B is electrically connected to the blue data lines BD1 to BDm connected to the pixel displaying blue by the fourth switch group SW4.

The first and second enable pads 129a and 129b are electrically connected to control terminals (gate terminals) of the first switch group SW1.

The third to fifth enable pads 127a, 127b, and 127c are electrically connected to control terminals (gate terminals) of the second to fourth switch groups SW2, SW3, and SW4.

The first switch group SW1 forms a channel between the source and the drain by the enable signals supplied through the first and second enable pads 129a and 129b, and the first and second test gate pads Scan signals supplied from 125a and 125b are sequentially supplied to the gate lines G1 to Gn.

The second switch group SW2 forms a channel between the source and the drain by the enable signal supplied through the third enable pad 127a, and is provided for the test supplied through the first test data pad 126R. The data signal is supplied to the red data lines RD1 to RDm.

The third switch group SW3 forms a channel between the source and the drain by the enable signal supplied through the fourth enable pad 127b, and the test switch supplied through the second test data pad 126G. The data signal is supplied to the green data lines GD1 to GDm.

The fourth switch group SW4 forms a channel between the source and the drain by the enable signal supplied through the fifth enable pad 127c, and the test switch supplied through the third test data pad 126B. The data signal is supplied to the blue data lines BD1 to BDm.

In the lighting test method of the liquid crystal display according to the exemplary embodiment, the first switch group SW1 is turned on by an enable signal input from the first and second enable pads 129a and 129b. The test scan signals, which are changed and supplied through the first and second test gate pads 125a and 125b, are sequentially supplied to the gate lines G1 to Gn through the first switch group SW1.

Then, the second to fourth switch groups SW2, SE3, and SW4 are turned on by the enable signals input from the second to fifth enable pads 127a, 127b, and 127c. Test data signals supplied through the first to third test data pads 126R, 126G, and 126B are transmitted through the data lines RD1 to RDm and GD1 through the second to fourth switch groups SW2, SW3, and SE4. To GDm, BD1 to BDm). In this case, the test data signal is supplied to pixels corresponding to the thin film transistor turned on by the scan signal.

In the lighting test of the liquid crystal display according to the exemplary embodiment of the present invention, the gate lines G1 to Gn and the data lines RD1 to RDm and GD1 are formed by the test scan signal and the test data signal in the same manner as described above. To GDm, and BD1 to BDm).

In the liquid crystal display according to the exemplary embodiment of the present invention described above, the first to fourth switch groups SW1 to SW4 for inspection are provided on the outer side of the display area 110 so that the size of the driver IC may be reduced. In this way, it is possible to improve the difficulty of the lighting test due to the space constraint even if the distance between the input / output pads 122b and 122a is narrowed by the size of the driver IC.

The liquid crystal display according to the exemplary embodiment has a structure corresponding to a trend of decreasing the size of the driver IC, but the wirings from the gate input pads 123a and 123b to the first node N1 and data. The wirings from the output pad 122a to the second node N2 have a structure in which disconnection failure is difficult to determine.

3 is a schematic view of a liquid crystal display according to another exemplary embodiment of the present invention.

As shown in FIG. 3, the liquid crystal display according to another exemplary embodiment of the present invention is divided into a display area 210 and a non-display area 220.

In the display area 210, gate lines G1 to Gn and data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm cross each other.

The non-display area 220 includes a driver area 221 in which a driver IC (not shown) is mounted, and a driving signal supplied from the outside by the driver IC is input to the gate lines G1 to Gn and the data line. Gate input pads 223a and 223b and data input / output pads 222b and 222a output to the fields RD1 to RDm, GD1 to GDm, and BD1 to BDm are formed. In the present invention, the gate input pads 223a and 223b are formed outside the driver region 221, but are not limited thereto and may be formed inside the driver region 221.

The display area 210 and the non-display area 220 determine whether the gate lines G1 to Gn and the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm are disconnected before the driver IC is mounted. An inspection unit is formed.

The inspection unit may be formed in the non-display area 220 and may include first to third test data pads 226R, 226G, and 226B to which a test data signal is supplied from the outside, and first to third test signals to be supplied from the outside. Fourth test gate pads 225a, 225b, 225c, and 225d.

The inspection unit includes a first switch group SW1 formed between the first and third test gate pads 225a and 225b and the first and second gate pads 223a and 223b of the non-display area 220, and data input. And third to fifth switch groups SW3, SW4, and SW5 formed between the output pads 222b and 222a.

The inspection unit is connected to the second switch group SW2 connected to the ends of the gate lines G1 to Gn of the display area 210 and the ends of the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm. And sixth to eighth switch groups SW6, SW7, and SW8.

The inspection unit is electrically connected to the control terminals (gate terminals) of the first and second switch groups SW1 and SW2 so that a channel is formed between the source and the drain of the first and second switch groups SW1 and SW2. First to fourth enable pads 229a, 229b, 229c, and 229d to supply the enable signal.

The inspection unit may be electrically connected to a control terminal (gate terminal) of the third to eighth switch groups SW3 to SW8 to form a channel between the source and the drain of the third to eighth switch groups SW3 to SW8. And a fifth enable pad 227 for supplying an enable signal.

In the present invention, the enable signal for forming a channel between the source and the drain of the third to eighth switch groups SW3 to SW8 is provided through the fifth enable pad 227, but is not limited thereto. Third and sixth switch groups SW3 and SW6 formed at both sides of the red data lines RD1 to RDm connected to the pixels displaying red, and the green data lines GD1 connected to the pixels displaying green. To the fourth and seventh switch groups SW4 and SW7 formed at both sides of the second through GDm, and the fifth and eighth switch groups formed at both sides of the blue data lines BD1 to BDm connected to the pixels displaying blue. The enable pads may be individually formed to individually turn on the SW5 and SW8.

According to another exemplary embodiment of the present invention, a lighting test method of a liquid crystal display device includes first and second switch groups SW1 and SW2 based on enable signals supplied through first to fourth enable pads 229a to 229d. Is turned on and the test scan signal supplied through the first to fourth test gate pads 225a to 225d passes through the gate lines G1 through the first and second switch groups SW1 and SW2. To Gn).

Then, the third to eighth switch groups SW3 to SW8 are turned on by the enable signal input from the fifth enable pad 227, and the first to third test data pads 226R, The test data signal supplied through 226G and 226B is supplied to the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm through the third to eighth switch groups SW3 to SW8.

The lighting test of the liquid crystal display according to another exemplary embodiment of the present invention is a test scan to both sides of the gate lines G1 to Gn and the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm as described above. The signal and the test data signal are supplied to determine whether the gate lines G1 to Gn and the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm are disconnected.

In the liquid crystal display according to the exemplary embodiment described above, the mounting process for mounting the driver IC is performed after the inspection process is completed. Here, in the case of a substrate determined to be defective in the inspection process, the substrate may be restored through a repair process, or a substrate that cannot be restored may be discarded.

The liquid crystal display device according to another embodiment of the present invention has a structure that meets the trend of decreasing the size of the driver IC can improve the space constraint according to the size of the driver IC. In more detail, the first to eighth switch groups SW1 to SW8 made of the transistor of the present invention may be formed with a smaller capacitance than in the related art. Since the switch capacity when using two switches can be smaller than when using one switch, the size can be reduced to a smaller capacity. You lose. Therefore, the present invention can reduce the size of the driver IC and improve the difficulty due to space limitation.

In the liquid crystal display according to the exemplary embodiment described above, the wirings from the gate pads 123a and 123b of FIG. 2 to the first node N1 of the liquid crystal display according to the exemplary embodiment of the present invention. And a problem in which disconnection failure of the wirings from the data output pad (122a in FIG. 2) to the second node (N2 in FIG. 2) is impossible to be solved. That is, the present invention provides a test scan signal and a test data signal to both sides of the gate lines G1 to Gn and the data lines RD1 to RDm, GD1 to GDm, and BD1 to BDm, thereby preventing disconnection failure. It has the advantage of being able to accurately determine.

Those skilled in the art will appreciate that various changes and modifications can be made without departing from the technical spirit of the present invention. Therefore, the technical scope of the present invention should not be limited to the contents described in the detailed description of the specification but should be defined by the claims.

1 is a view schematically showing a general liquid crystal display device.

2 is a schematic view of a liquid crystal display according to an exemplary embodiment of the present invention.

3 is a schematic view of a liquid crystal display according to another exemplary embodiment of the present invention.

Claims (8)

A display area formed by crossing a plurality of gate lines and data lines; A non-display area electrically connected to the gate lines and the data lines to form a gate pad and a data pad supplied with a scan signal and a data signal; And And an inspection unit configured to supply a test scan signal and a test data signal to both sides of the gate lines and the data lines to both sides of the gate lines and the data lines. According to claim 1, The inspection unit, Test gate pads supplied with the test scan signal for determining whether the gate line is disconnected; A first switch group connected between the gate pad and the test gate pad; And And a second switch group connected to one side of the gate lines to correspond to the first switch group. The method of claim 2, And an enable pad connected to a control terminal of the first and second switch groups, the enable pad being supplied with an enable signal for turning on or off the first and second switch groups. Device. According to claim 1, The inspection unit, Test data pads to which the test data signal for determining disconnection of the data line is supplied; Third to fifth switch groups respectively connected between the data pad and the test data pad; And And a sixth to eighth switch group connected to one side of the data lines to correspond to the third to fifth switch groups, respectively. The method of claim 4, wherein And the third and sixth switch groups are formed on data lines connected to pixels of which red is displayed among the data lines. The method of claim 4, wherein And the fourth and seventh switch groups are formed on data lines connected to pixels of which green is displayed among the data lines. The method of claim 4, wherein And the fifth and eighth switch groups are formed on data lines connected to pixels of which blue is displayed among the data lines. The method of claim 4, wherein And an enable pad connected to a control terminal of the third to eighth switch groups, the enable pad being supplied with an enable signal for turning on or turning off the third to eighth switch groups. .

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