KR20090088109A - Delay line in dll circuit - Google Patents
Delay line in dll circuit Download PDFInfo
- Publication number
- KR20090088109A KR20090088109A KR1020080013464A KR20080013464A KR20090088109A KR 20090088109 A KR20090088109 A KR 20090088109A KR 1020080013464 A KR1020080013464 A KR 1020080013464A KR 20080013464 A KR20080013464 A KR 20080013464A KR 20090088109 A KR20090088109 A KR 20090088109A
- Authority
- KR
- South Korea
- Prior art keywords
- delay
- unit
- nand gate
- output signal
- bit
- Prior art date
Links
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H03K5/135—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of time reference signals, e.g. clock signals
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
- H03L7/0812—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used
- H03L7/0814—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used the phase shifting device being digitally controlled
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/083—Details of the phase-locked loop the reference signal being additionally directly applied to the generator
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
Abstract
Description
The present invention relates to a delay locked loop (DLL) circuit, and more particularly, to a delay line of a DLL circuit.
Typically, DLL circuits are used to provide an internal clock that is time-phased relative to a reference clock obtained by converting an external clock. The DLL circuit is used to solve the problem that the internal clock utilized in the semiconductor integrated circuit is delayed through the clock buffer and the transmission line, thereby causing a phase difference with the external clock, thereby increasing the output data access time. The DLL circuit performs a function of controlling the phase of the internal clock to be a predetermined time ahead of the external clock in order to increase the effective data output interval.
The DLL circuit has a feedback loop structure, and a delay line for generating a delay clock by delaying a reference clock transmitted from a clock input buffer in response to a delay control signal, and delay elements existing in an output path of the delay clock. A replica delayer for generating a feedback clock by delaying the delayed clock with a delay modeled by a delay amount of the delayed amount; a phase sensing unit configured to generate a phase sensing signal by comparing and detecting a phase of the reference clock and the feedback clock; And a delay controller configured to generate the delay control signal in response to the phase detection signal.
The delay line may include a plurality of unit delays connected in series, and determine a delay time with respect to the reference clock according to the number of unit delays of the delay control signal, which is implemented as a plurality of digital signals. However, each of the unit delays included in the delay line had the same amount of delay. Therefore, when the input reference clock is a low frequency, a situation in which more delay time may be provided than in the case of a high frequency may occur, and thus, a large number of unit delay units have to be provided. As a result, the area occupied by the delay line was not small, which caused a reduction in the area margin of the DLL circuit seeking high integration. In addition, there was a technical limitation that it is not easy to reduce the time required for the delay lock operation of the DLL circuit.
SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and there is a technical problem to provide a delay line of a DLL circuit which reduces the occupied area and improves the area efficiency.
In addition, another object of the present invention is to provide a delay line of a DLL circuit that reduces the time required to complete a delay lock and more efficiently supports a high speed operation of a semiconductor integrated circuit.
Delay line of the DLL circuit according to an embodiment of the present invention for achieving the above technical problem, the first delay unit having a plurality of unit delay connected in series; And a second delay unit having a plurality of unit delay units connected in series and connected in series with the first delay unit, wherein the plurality of unit delay units provided in the first delay unit include: Each of the plurality of unit delay units provided has a larger delay amount.
In addition, the delay line of the DLL circuit according to another embodiment of the present invention includes a plurality of serially connected unit delayer for delaying the reference clock in response to each bit of the delay control signal of the plurality of bits to output a delay clock, Each of the plurality of unit delay units has a different delay amount, and a smaller unit delay unit is closer to the output terminal of the delay clock.
Delay line of the DLL circuit of the present invention, by setting a differential delay time to a plurality of unit delay, it is possible to perform a delay operation for a low frequency clock with only a small number of unit delay delay to reduce the occupied area have.
In addition, the delay line of the DLL circuit of the present invention has the effect of reducing the time required for the completion of the delay fixing to support the high speed operation of the semiconductor integrated circuit more efficiently.
Hereinafter, with reference to the accompanying drawings will be described in detail a preferred embodiment of the present invention.
1 is a block diagram showing the configuration of a delay line of a DLL circuit according to an embodiment of the present invention.
As shown, the delay line of the DLL circuit according to an embodiment of the present invention includes a
The
A total of n + m unit delays UD1 <1: n> and UD2 <1: m> provided in the
By the above-described configuration, the
However, in the present invention, the unit delay units UD1 <1: n> provided in the
In the above description, the delay time of each unit delay unit UD1 <1: n> in the
FIG. 2 is a configuration diagram of the unit delay unit shown in FIG. 1, and since the n + m unit delay units UD1 <1: n> and UD2 <1: m> are configured in the same form, any one unit The description of the delay unit UD1 <i> is shown to replace the description of the remaining unit delay unit.
As illustrated, the unit delay unit UD1 <i> may include a first NAND gate ND1 that receives a corresponding bit dlycnt <i> and the reference clock clk_ref among the delay control signals; A second NAND gate ND2 that receives the output signal of the first NAND gate ND1 and the output signal of the previous unit delay unit UD1 <i-1>; A third NAND gate ND3 receiving the output signal of the second NAND gate ND2 and an external supply power supply VDD; And a resistor element R for delaying the third NAND gate ND3 by a predetermined time.
Although not illustrated, the unit delay unit UD1 <1> provided at the front end of the n + m unit delay units UD1 <1: n> and UD2 <1: m> may have a unit in front of it. Since there is no output signal of the retarder, it is preferable to receive the external power supply VDD instead.
Further, the unit delay unit UD2 <m> provided at the rearmost end of the n + m unit delay units UD1 <1: n> and UD2 <1: m> may be configured to receive the delay clock clk_dly. Will print.
The resistance element R is provided so that each unit delay unit has a predetermined delay time, and as described above, the resistance element R is designed to have a differential resistance value in each delay unit unit or in each unit delay unit. Such a configuration of the unit delay unit allows the delay line to complete the delay fixing operation faster than the delay operation for the low frequency clock, and can have fewer unit delay units.
3A and 3B are timing diagrams for explaining the operation of the delay line of the DLL circuit shown in FIG.
FIG. 3A illustrates a process of changing the phase of the delayed clock clk_dly when the reference clock clk_ref is a high frequency clock, and FIG. 3B illustrates the delayed clock when the reference clock clk_ref is a low frequency clock. A process of changing the phase of (clk_dly) is shown.
The delay line generates the delay clock clk_dly by changing the delay value in a relatively small unit when the reference clock clk_ref is a high frequency clock. On the other hand, when the reference clock clk_ref is a low frequency clock, the delay line generates the delay clock clk_dly by changing the delay value in a relatively large unit.
As such, the delay line may perform a faster delay operation when the reference clock clk_ref is a low frequency clock. This results in only a smaller number of unit delays in the delay line.
As described above, the delay line of the DLL circuit of the present invention includes a unit delayers having a large delay value in an area that operates only when a low frequency clock is input, and an area that operates regardless of the frequency of an input clock. Has unit delays with small delay values. With this arrangement, it is possible to support a reduced locking time at the time of input of the low frequency clock. In addition, since it is possible to perform a normal operation even with only a relatively small unit delay compared to the prior art, there is an advantage that can support the high integration implementation of the semiconductor integrated circuit. In addition, by having only a small number of unit delays, it is possible to reduce the current consumed by the delay line and further improve the power efficiency of the entire DLL circuit.
As such, those skilled in the art will appreciate that the present invention can be implemented in other specific forms without changing the technical spirit or essential features thereof. Therefore, the above-described embodiments are to be understood as illustrative in all respects and not as restrictive. The scope of the present invention is shown by the following claims rather than the detailed description, and all changes or modifications derived from the meaning and scope of the claims and their equivalents should be construed as being included in the scope of the present invention. do.
1 is a block diagram showing the configuration of a delay line of a DLL circuit according to an embodiment of the present invention;
2 is a configuration diagram of a unit delay unit shown in FIG. 1;
3A and 3B are timing diagrams for explaining the operation of the delay line of the DLL circuit shown in FIG.
<Description of the symbols for the main parts of the drawings>
10: first delay unit 20: second delay unit
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080013464A KR20090088109A (en) | 2008-02-14 | 2008-02-14 | Delay line in dll circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080013464A KR20090088109A (en) | 2008-02-14 | 2008-02-14 | Delay line in dll circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20090088109A true KR20090088109A (en) | 2009-08-19 |
Family
ID=41206884
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080013464A KR20090088109A (en) | 2008-02-14 | 2008-02-14 | Delay line in dll circuit |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20090088109A (en) |
-
2008
- 2008-02-14 KR KR1020080013464A patent/KR20090088109A/en not_active Application Discontinuation
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109074332B (en) | Apparatus for controlling latency on an input signal path | |
US7915939B2 (en) | Duty cycle correction apparatus and semiconductor integrated circuit having the same | |
KR101046227B1 (en) | DLD circuit | |
KR100639616B1 (en) | Delay locked loop in semiconductor memory device and its clock locking method | |
US8018257B2 (en) | Clock divider and clock dividing method for a DLL circuit | |
US7605622B2 (en) | Delay locked loop circuit | |
US7710171B2 (en) | Delayed locked loop circuit | |
US7944260B2 (en) | Clock control circuit and a semiconductor memory apparatus having the same | |
US7098712B2 (en) | Register controlled delay locked loop with reduced delay locking time | |
US20100213991A1 (en) | Delay-locked loop circuit and method for synchronization by delay-locked loop | |
KR100911197B1 (en) | Data Output Circuit in Semiconductor Memory Apparatus | |
JPH10171774A (en) | Semiconductor integrated circuit | |
KR101062741B1 (en) | DLL circuit and its control method | |
US20080284473A1 (en) | Phase synchronous circuit | |
US20140062552A1 (en) | Dll circuit and delay-locked method using the same | |
US8081021B2 (en) | Delay locked loop | |
KR20110134197A (en) | Voltage controlled delay line and delay locked loop circuit and multi-phase clock generator using the voltage controlled delay line | |
KR100845804B1 (en) | Circuit and method for controlling clock in semiconductor memory apparatus | |
US6867626B2 (en) | Clock synchronization circuit having bidirectional delay circuit strings and controllable pre and post stage delay circuits connected thereto and semiconductor device manufactured thereof | |
KR20060135234A (en) | Dll device | |
KR20090088109A (en) | Delay line in dll circuit | |
KR100915820B1 (en) | Pulse Generating Circuit and Duty Cycle Correcting Apparatus with the Same | |
KR101053523B1 (en) | Delay device of semiconductor integrated circuit and its control method | |
US7633832B2 (en) | Circuit for outputting data of semiconductor memory apparatus | |
KR100800138B1 (en) | DLL device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application |