KR20080090102A - A terminal of a socket for a memory module - Google Patents
A terminal of a socket for a memory module Download PDFInfo
- Publication number
- KR20080090102A KR20080090102A KR1020070033188A KR20070033188A KR20080090102A KR 20080090102 A KR20080090102 A KR 20080090102A KR 1020070033188 A KR1020070033188 A KR 1020070033188A KR 20070033188 A KR20070033188 A KR 20070033188A KR 20080090102 A KR20080090102 A KR 20080090102A
- Authority
- KR
- South Korea
- Prior art keywords
- contact
- memory module
- terminal
- socket
- pin
- Prior art date
Links
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2103/00—Two poles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
- H01R24/20—Coupling parts carrying sockets, clips or analogous contacts and secured only to wire or cable
Landscapes
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
Description
1 is a perspective view showing an example of a memory module socket according to the present invention;
2 is an enlarged perspective view of the main portion of the present invention;
Figure 3 is a longitudinal sectional view showing a state of use of the present invention.
4 is a perspective view illustrating an example of a terminal used in a conventional memory module socket.
Figure 5 is a longitudinal cross-sectional view showing a state of use of FIG.
※ Explanation of codes for main parts of drawing
10: memory module
11 substrate 12 contact
13: memory chip
20: socket housing
21: memory coupling groove 22: terminal fixing groove
23: connecting pin
30: terminal
31: contact contact portion 311: locking piece
312: engaging projection 32: pin contact
321: contact protrusion 322: fixing protrusion
The present invention relates to a socket for a memory module test, and more particularly, to a terminal of a socket for a memory module test in which a terminal is fabricated by integrally processing a contact contact part and a pin contact part by bending.
In general, a detachable memory module is used in a personal computer, a server computer, a notebook computer and the like for easy expansion of the memory capacity.
As shown in FIG. 4, the memory module has a plurality of
In addition, after the assembly of the memory module is completed in the process of manufacturing the
The memory module test socket has a recessed
As shown in FIGS. 5 to 6, the
However, the conventional terminal as described above had a problem in that the contact surface with the contact was not uniform due to the burr generated by the shearing force during press working. There was a problem of deterioration.
In addition, the terminal as described above has a problem in that the quality of the product is poor because the plating is not properly made on the sharp surface generated by the burr when performing a post-process, such as plating on the product, due to the sharp surface generated at this time There was also a problem that the scratches occur in the memory module, and as a result of having a large number of terminals manufactured separately and each terminal inserted into the socket housing manually by inserting one by one, there was also a problem that the assembly is very poor.
In addition, the terminal as described above has a problem that the contact surface is easily deformed or spaced as the pin contact portion and the connection pin is connected by the fitting coupling, resulting in poor contact.
Accordingly, the present invention has been made in order to solve the conventional problems as described above, the object is that the terminal used for the test socket of the memory module is processed by the contact contact portion and the pin contact portion integrally produced by bending. It is in a ship.
In addition, an object of the present invention is to simplify the operation of inserting the terminal inside the socket housing and at the same time to prevent the contact contact portion is separated out of the socket housing.
In addition, an object of the present invention is to ensure that the contact contact portion is firmly fixed to the inside of the socket housing.
In addition, an object of the present invention is to make the pin contact portion elastically in close contact with the connecting pin.
It is also an object of the present invention to prevent the pin contact portion from moving inside the socket housing.
In order to achieve the above object, the present invention is a terminal fixed to the inside of the socket housing to which the memory module is coupled in contact with the contacts of the memory module, the upper side is bent in an S-shape the outer surface of the contact of the memory module And a contact portion contacting the contact portion; and a pin contact portion extending downwardly vertically by integrally bending the lower end of the contact contact portion so that the outer surface of the connection pin to be connected to the circuit board is in contact with one side thereof. .
In addition, the contact contact portion; is characterized in that the engaging piece bent to be fixed to the inside of the socket housing at the upper end is formed.
In addition, it characterized in that the engaging projection is fixed to the inside of the socket housing to the outside of the contact contact portion is formed.
In addition, the one side of the pin contact portion is bent to elastic contact with the connecting pin is characterized in that the contact protrusion protruding.
In addition, the outer side of the pin contact portion is characterized in that the fixing projections are fixed to the inside of the socket housing formed.
Hereinafter, preferred embodiments of the present invention will be described in more detail with reference to the accompanying drawings.
1 is a perspective view showing an example of a memory module socket according to the present invention, Figure 2 is an enlarged perspective view of the main part of the present invention, Figure 3 is a longitudinal cross-sectional view showing a state of use of the present invention, as shown The present invention relates to a test socket of a
The
The
The
The
The
Accordingly, the
In addition, the upper end of the
In addition, the rear side of the
In addition, the
As described above, the present invention allows the terminal to be integrally processed by the contact contact portion and the pin contact portion by bending, thereby maintaining a more uniform contact surface than the terminal manufactured by the conventional press working method. Not only the contactability is excellent, but also it is possible to manufacture by connecting a plurality of terminals integrally has the effect of improving the assembly.
In addition, the present invention is to facilitate the operation of inserting the terminal inside the socket housing by forming a locking piece at the end of the contact contact portion and at the same time to prevent the contact contact portion from being separated out of the socket housing, when removing the memory module from the socket The terminal can be prevented from being pushed out of the socket housing, thereby increasing the reliability of the socket, and having the effect of stably repetitive coupling and detachment of the memory module.
In addition, the present invention by forming a locking projection on the outside of the contact contact portion to securely fixed to the inside of the socket housing, the terminal is prevented from moving inside the socket housing to achieve a stable and smooth connection with the memory module Have.
In addition, the present invention by forming a contact protrusion in the pin contact portion to be elastically in close contact with the connecting pin, so that even when the impact and vibration is applied from the outside, the terminal and the connecting pin to maintain a stable connection state do.
In addition, the present invention forms a fixing projection on the pin contact portion to prevent the pin contact portion from moving inside the socket housing, the terminal is more firmly fixed to the inside of the socket housing is more stable and smoothly connected to the terminal of the memory module Will have an effect.
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070033188A KR20080090102A (en) | 2007-04-04 | 2007-04-04 | A terminal of a socket for a memory module |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070033188A KR20080090102A (en) | 2007-04-04 | 2007-04-04 | A terminal of a socket for a memory module |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20080090102A true KR20080090102A (en) | 2008-10-08 |
Family
ID=40151488
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070033188A KR20080090102A (en) | 2007-04-04 | 2007-04-04 | A terminal of a socket for a memory module |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20080090102A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200109492A (en) * | 2019-03-13 | 2020-09-23 | 주식회사 오킨스전자 | Vertical gender for semiconductor test and manufacturing method thereof |
-
2007
- 2007-04-04 KR KR1020070033188A patent/KR20080090102A/en not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200109492A (en) * | 2019-03-13 | 2020-09-23 | 주식회사 오킨스전자 | Vertical gender for semiconductor test and manufacturing method thereof |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application |