KR20080056065A - Buffer layer comprising compounds having diaza spirobifluorene core structure and electronic device comprising the buffer layer - Google Patents
Buffer layer comprising compounds having diaza spirobifluorene core structure and electronic device comprising the buffer layer Download PDFInfo
- Publication number
- KR20080056065A KR20080056065A KR1020060128859A KR20060128859A KR20080056065A KR 20080056065 A KR20080056065 A KR 20080056065A KR 1020060128859 A KR1020060128859 A KR 1020060128859A KR 20060128859 A KR20060128859 A KR 20060128859A KR 20080056065 A KR20080056065 A KR 20080056065A
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- South Korea
- Prior art keywords
- group
- substituted
- carbon atoms
- unsubstituted
- buffer layer
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- MXFYTFWFFAMILY-UHFFFAOYSA-N spiro[fluorene-1,1'-indeno[1,2-d]pyridazine] Chemical group C12(N=NC=C3C4=CC=CC=C4C=C13)C=CC=C1C3=CC=CC=C3C=C12 MXFYTFWFFAMILY-UHFFFAOYSA-N 0.000 title claims description 10
- 150000001875 compounds Chemical class 0.000 title 1
- 239000000463 material Substances 0.000 claims abstract description 32
- 125000001072 heteroaryl group Chemical group 0.000 claims abstract description 16
- 125000004404 heteroalkyl group Chemical group 0.000 claims abstract description 8
- 125000004446 heteroarylalkyl group Chemical group 0.000 claims abstract description 6
- 125000005553 heteroaryloxy group Chemical group 0.000 claims abstract description 6
- 239000000126 substance Substances 0.000 claims abstract description 6
- 125000004104 aryloxy group Chemical group 0.000 claims abstract description 5
- 125000004405 heteroalkoxy group Chemical group 0.000 claims abstract description 4
- 125000000592 heterocycloalkyl group Chemical group 0.000 claims abstract description 4
- 125000004432 carbon atom Chemical group C* 0.000 claims description 46
- 125000000217 alkyl group Chemical group 0.000 claims description 32
- 125000003118 aryl group Chemical group 0.000 claims description 21
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 14
- 125000001424 substituent group Chemical group 0.000 claims description 13
- 239000010409 thin film Substances 0.000 claims description 13
- 125000003545 alkoxy group Chemical group 0.000 claims description 10
- -1 screen printing Substances 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 9
- 239000011248 coating agent Substances 0.000 claims description 8
- 238000000576 coating method Methods 0.000 claims description 8
- 125000005842 heteroatom Chemical group 0.000 claims description 8
- 125000003277 amino group Chemical group 0.000 claims description 6
- 238000004528 spin coating Methods 0.000 claims description 6
- 150000007860 aryl ester derivatives Chemical group 0.000 claims description 5
- 125000003739 carbamimidoyl group Chemical group C(N)(=N)* 0.000 claims description 5
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 5
- 125000004093 cyano group Chemical group *C#N 0.000 claims description 5
- 125000000753 cycloalkyl group Chemical group 0.000 claims description 5
- 125000005843 halogen group Chemical group 0.000 claims description 5
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 5
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 claims description 5
- 125000003710 aryl alkyl group Chemical group 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 238000003618 dip coating Methods 0.000 claims description 4
- 125000005907 alkyl ester group Chemical group 0.000 claims description 3
- 238000005266 casting Methods 0.000 claims description 2
- 125000005343 heterocyclic alkyl group Chemical group 0.000 claims description 2
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- 229910052799 carbon Inorganic materials 0.000 abstract description 17
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- 239000007924 injection Substances 0.000 abstract description 10
- ICPSWZFVWAPUKF-UHFFFAOYSA-N 1,1'-spirobi[fluorene] Chemical group C1=CC=C2C=C3C4(C=5C(C6=CC=CC=C6C=5)=CC=C4)C=CC=C3C2=C1 ICPSWZFVWAPUKF-UHFFFAOYSA-N 0.000 abstract description 8
- 125000004185 ester group Chemical group 0.000 abstract description 8
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- 125000003107 substituted aryl group Chemical group 0.000 abstract 3
- 125000000547 substituted alkyl group Chemical group 0.000 abstract 2
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- 230000015572 biosynthetic process Effects 0.000 description 6
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- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 4
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- SVTBMSDMJJWYQN-UHFFFAOYSA-N 2-methylpentane-2,4-diol Chemical compound CC(O)CC(C)(C)O SVTBMSDMJJWYQN-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical group N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
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- DKGAVHZHDRPRBM-UHFFFAOYSA-N Tert-Butanol Chemical compound CC(C)(C)O DKGAVHZHDRPRBM-UHFFFAOYSA-N 0.000 description 2
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- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
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- PUPZLCDOIYMWBV-UHFFFAOYSA-N (+/-)-1,3-Butanediol Chemical compound CC(O)CCO PUPZLCDOIYMWBV-UHFFFAOYSA-N 0.000 description 1
- DEUGOISHWHDTIR-UHFFFAOYSA-N (1-hydroxy-5,5-dimethylhexyl) 2-methylpropanoate Chemical compound C(C(C)C)(=O)OC(CCCC(C)(C)C)O DEUGOISHWHDTIR-UHFFFAOYSA-N 0.000 description 1
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- YJUVFJKHTNWDNU-UHFFFAOYSA-N 9,9-bis(2-ethylhexyl)fluorene Chemical compound C1=CC=C2C(CC(CC)CCCC)(CC(CC)CCCC)C3=CC=CC=C3C2=C1 YJUVFJKHTNWDNU-UHFFFAOYSA-N 0.000 description 1
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 1
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- 150000001242 acetic acid derivatives Chemical class 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
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- 150000002576 ketones Chemical class 0.000 description 1
- DLEDOFVPSDKWEF-UHFFFAOYSA-N lithium butane Chemical compound [Li+].CCC[CH2-] DLEDOFVPSDKWEF-UHFFFAOYSA-N 0.000 description 1
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- IFLREYGFSNHWGE-UHFFFAOYSA-N tetracene Chemical compound C1=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C21 IFLREYGFSNHWGE-UHFFFAOYSA-N 0.000 description 1
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- NHDIQVFFNDKAQU-UHFFFAOYSA-N tripropan-2-yl borate Chemical compound CC(C)OB(OC(C)C)OC(C)C NHDIQVFFNDKAQU-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D471/00—Heterocyclic compounds containing nitrogen atoms as the only ring hetero atoms in the condensed system, at least one ring being a six-membered ring with one nitrogen atom, not provided for by groups C07D451/00 - C07D463/00
- C07D471/02—Heterocyclic compounds containing nitrogen atoms as the only ring hetero atoms in the condensed system, at least one ring being a six-membered ring with one nitrogen atom, not provided for by groups C07D451/00 - C07D463/00 in which the condensed system contains two hetero rings
- C07D471/04—Ortho-condensed systems
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- H—ELECTRICITY
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Abstract
Description
도 1은 본 발명의 제조예 1에서 합성한 Flu-SPNB-Flu의 흡광도 및 PL 스펙트럼이고,1 is an absorbance and PL spectrum of Flu-SPNB-Flu synthesized in Preparation Example 1 of the present invention,
도 2는 본 발명의 제조예 1에서 합성한 Flu-SPNB-Flu의 열중량분석 (Thermogravimetry Analysis) 그래프이고,2 is a thermogravimetry analysis graph of Flu-SPNB-Flu synthesized in Preparation Example 1 of the present invention,
도 3은 본 발명의 제조예 1에서 합성한 Flu-SPNB-Flu의 시차주사열량 (Differential Scanning Calorimetry) 그래프이고,Figure 3 is a differential scanning calorimetry (Differential Scanning Calorimetry) graph of Flu-SPNB-Flu synthesized in Preparation Example 1 of the present invention,
도 4는 본 발명의 실시예 1에서 제조된 다이오드-유사 장치(hole-only device)의 구조이며,4 is a structure of a diode-like device (hole-only device) manufactured in Example 1 of the present invention,
도 5는 실시예 1 및 비교예 1의 다이오드-유사 장치의 전류-전압 특성 곡선이다.5 is a current-voltage characteristic curve of the diode-like device of Example 1 and Comparative Example 1. FIG.
<도면의 주요 부분에 대한 부호의 설명> <Explanation of symbols for the main parts of the drawings>
1: ITO(Indium Tin Oxide)1: Indium Tin Oxide (ITO)
2: 버퍼층(buffer layer)2: buffer layer
3: 유기 반도체층 3: organic semiconductor layer
4: Au4: Au
본 발명의 구현예들은 디아자 스피로바이플루오렌 코어 구조를 갖는 물질을 포함하는 버퍼층 및 상기 버퍼층을 포함하는 전자소자에 관한 것으로, 보다 상세하게는 질소 원자가 고리 내에 포함된 디아자 스피로바이플루오렌(SPN, diaza spirobifluorene) 구조를 코어로 함유하는 신규한 버퍼 물질로 이루어져 전하 주입 및 전하이동성을 개선시킬 수 있는 버퍼층 및 상기 버퍼층을 포함하는 전자소자에 관한 것이다.Embodiments of the present invention relate to a buffer layer including a material having a diaza spirobifluorene core structure and an electronic device including the buffer layer, and more particularly, to a diaza spirobifluorene having a nitrogen atom included in a ring ( The present invention relates to a buffer layer made of a novel buffer material containing a diaza spirobifluorene (SPN) structure as a core and capable of improving charge injection and charge mobility, and an electronic device including the buffer layer.
유기소재 기반 소자기술은 대면적 플렉시블 디스플레이 등의 분야에서 Si 기반 전자소자 분야를 보완할 있는 새로운 기술로 떠오르고 있다. 활발한 연구가 수행되고 있는 OTFT(유기 박막 트랜지스터, Organic Thin Film Transistor)는 Si-based TFTs 의 집적도와 성능을 요구하지 않은 분야에서 TFT 기술은 경쟁력이 충분하다 할 수 있다. Organic material-based device technology is emerging as a new technology to complement the Si-based electronic device in the field of large-area flexible display. OTFT (Organic Thin Film Transistor), in which active research is being conducted, can be considered to have sufficient competitiveness in TFT technology in fields that do not require the integration and performance of Si-based TFTs.
OTFT는 Amorphous Si TFT에 비해 인프라 비용이 1/3 수준에 불과하며, 유기기판에 비해 조작이 용이하고 연속공정이 가능하여, 기존 TFT와 비교하여 공정비용 의 절감 효과가 상당할 것으로 기대되고 있다. OTFT가 디스플레이 후면(backplane)으로 적용되기 위해서는 고 이동도를 가지는 유기반도체의 설계 및 합성, 소자 설계 및 공정 기술 개발을 통한 OTFT 특성 향상이 요구된다. Compared to amorphous Si TFTs, OTFTs cost only 1/3 of the infrastructure cost, and are easier to operate and can be processed continuously compared to organic substrates. In order for OTFT to be applied as a backplane of a display, it is required to improve OTFT characteristics through design and synthesis of organic semiconductors having high mobility, device design, and process technology development.
TFT의 특성은 전자 또는 정공 주입과 이동에 의해 결정된다. 전극과 반도체 층의 contact 저항이 없어 전자 또는 정공이 채널 층에 효과적으로 주입되어 그 전자나 정공이 채널층에서 빠르게 이동하는 것이 이상적이다. 오믹 컨택(Ohmic contact) 형성이 용이한 Si-based FET와 달리, contact 저항이 OTFT 특성 저하의 주요 원인이다. 일반적으로 불순물 농도가 낮은 반도체층 또는 전하 수송층에 금속이 접촉되면 접촉면에 전위 장벽이 형성되기 때문에 저항치가 높아진다. 원리적으로 전위 장벽의 높이는 전극과 반도체층 또는 전하 수송층 간의 에너지 레벨의 불일치 및 접합의 상태에 따라 형성된다. The characteristics of the TFT are determined by electron or hole injection and movement. Since there is no contact resistance between the electrode and the semiconductor layer, it is ideal that electrons or holes are effectively injected into the channel layer so that the electrons or holes move quickly in the channel layer. Unlike Si-based FETs that are easy to form ohmic contacts, contact resistance is a major cause of OTFT degradation. In general, when a metal contacts a semiconductor layer or a charge transport layer having a low impurity concentration, a resistance barrier is formed because a potential barrier is formed on the contact surface. In principle, the height of the potential barrier is formed according to the state of the junction and the mismatch of energy levels between the electrode and the semiconductor layer or the charge transport layer.
전극 표면과 반도체층 또는 전하 수송층 간의 접촉 저항을 줄이기 위하여 사용되는 종래의 전극 표면의 처리방법에는 자기조립단분자막(Self-Assembled Monolayer, SAM)의 사용, 버퍼층(buffer layer)의 활용 등이 있다. 그 중 버퍼층(buffer layer)은 전극과 반도체층 또는 전하 수송층 사이에 접촉 저항을 줄여주는 물질을 포함하는 층을 적층하는 기술로서 주로 유기박막 트랜지스터(OTFT)나 유기 다이오드(OELD)에 적용할 수 있다. Conventional electrode surface treatment methods used to reduce the contact resistance between the electrode surface and the semiconductor layer or the charge transport layer include the use of a self-assembled monolayer (SAM), the use of a buffer layer. Among them, the buffer layer is a technology for stacking a layer containing a material that reduces contact resistance between an electrode and a semiconductor layer or a charge transport layer, and is mainly applicable to an organic thin film transistor (OTFT) or an organic diode (OELD). .
이러한 버퍼층 물질로서 트리페닐 아민 유도체(triphenyl amine derivatives)와 같이 진공 공정으로 필름 형성이 가능한 저분자 반도체 또는 폴리(3,4-에틸렌디옥시티오펜) 폴리(스티렌설페이트)(poly(3,4-ethylenedioxythioph ene) poly(styrenesulfonate))와 같이 용액 공정이 가능한 산-적층된 전도성 고분자(acid-doped conducting polymers)를 사용해 왔다. As such a buffer layer material, a low-molecular semiconductor or poly (3,4-ethylenedioxythiophene) poly (styrene sulfate) (poly (3,4-ethylenedioxythiophene) capable of forming a film by a vacuum process such as triphenyl amine derivatives acid-doped conducting polymers have been used that allow solution processing such as poly (styrenesulfonate).
비용 절감을 위해 용액 공정이 가능한 버퍼층 물질이 필요하나, 산-적층된 전도성 고분자(acid-doped conducting polymers)를 버퍼층 물질로 사용하면 산-도판트(acid-dopant)가 채널층 (transporting layer)으로 확산(diffusion) 되어 소자의 안정성을 저해하는 문제점이 있다. 따라서, 용액공정이 가능하고 산-불순물(acid-dopant)을 사용하지 않는 버퍼층 물질의 개발에 대한 요구가 지속되고 있다.A buffer layer material is required for solution processing to reduce costs, but acid-doped conducting polymers can be used as buffer layer material when acid-doped conducting polymers are used as the buffer layer material. There is a problem that the diffusion (diffusion) to inhibit the stability of the device. Therefore, there is a continuing need for the development of buffer layer materials that are capable of solution processing and that do not use acid-dopants.
본 발명은 이러한 기술적 요구에 부응하기 위한 것으로, 본 발명의 일 양상은 고리 내에 질소 원자가 포함된 디아자 스피로바이플루오렌 코어 구조를 갖는 신규한 버퍼 물질을 포함하여 전하의 주입 및 이동성을 개선시킬 수 있는 버퍼층(buffer layer)에 관한 것이다.The present invention addresses this technical need, and one aspect of the present invention includes a novel buffer material having a diaza spirobifluorene core structure containing nitrogen atoms in a ring to improve charge injection and mobility. It is about a buffer layer.
본 발명의 다른 양상은 상기 버퍼층을 포함하는 전자소자에 관한 것이다.Another aspect of the invention relates to an electronic device comprising the buffer layer.
본 발명의 일구현예는 하기 화학식 1로 표시되는 SPN 코어 구조를 가지는 물질을 포함하는 버퍼층(buffer layer)에 관한 것이다.One embodiment of the present invention relates to a buffer layer (buffer layer) including a material having a SPN core structure represented by the following formula (1).
[화학식 1][Formula 1]
상기 식에서,Where
R1 및 R2는 각각 독립적으로 치환 또는 비치환된 탄소수 1 내지 30의 알킬기, 치환 또는 비치환된 탄소수 1 내지 30의 헤테로알킬기, 치환 또는 비치환된 탄소수 1 내지 30의 알콕시기, 치환 또는 비치환된 탄소수 1 내지 30의 헤테로알콕시기, 치환 또는 비치환된 탄소수 6 내지 30의 아릴기, 치환 또는 비치환된 탄소수 6 내지 30의 아릴알킬기, 치환 또는 비치환된 탄소수 6 내지 30의 아릴옥시기, 치환 또는 비치환된 탄소수 2 내지 30의 헤테로아릴기, 치환 또는 비치환된 탄소수 2 내지 30의 헤테로아릴알킬기, 치환 또는 비치환된 탄소수 2 내지 30의 헤테로아릴옥시기, 치환 또는 비치환된 탄소수 5 내지 20의 사이클로알킬기, 치환 또는 비치환된 탄소수 2 내지 30의 헤테로사이클로알킬기, 치환 또는 비치환된 탄소수 1 내지 30의 알킬에스테르기, 치환 또는 비치환된 탄소수 1 내지 30의 헤테로알킬에스테르기, 치환 또는 비치환된 탄소수 6 내지 30의 아릴에스테르기 및 치환 또는 비치환된 탄소수 2 내지 30의 헤테로아릴에스테르기로 이루어진 군으로부터 선택된다. R 1 and R 2 are each independently a substituted or unsubstituted alkyl group having 1 to 30 carbon atoms, a substituted or unsubstituted heteroalkyl group having 1 to 30 carbon atoms, a substituted or unsubstituted alkoxy group having 1 to 30 carbon atoms, substituted or unsubstituted Substituted heteroalkoxy group having 1 to 30 carbon atoms, substituted or unsubstituted aryl group having 6 to 30 carbon atoms, substituted or unsubstituted arylalkyl group having 6 to 30 carbon atoms, substituted or unsubstituted aryloxy group having 6 to 30 carbon atoms , Substituted or unsubstituted heteroaryl group having 2 to 30 carbon atoms, substituted or unsubstituted heteroarylalkyl group having 2 to 30 carbon atoms, substituted or unsubstituted heteroaryloxy group having 2 to 30 carbon atoms, substituted or unsubstituted carbon atoms 5-20 cycloalkyl group, substituted or unsubstituted heterocycloalkyl group having 2 to 30 carbon atoms, substituted or unsubstituted alkyl ester group having 1 to 30 carbon atoms, substituted or unsubstituted A is selected from 1 to 30 carbon atoms in the heterocyclic alkyl ester group, a substituted or unsubstituted aryl ester group of a ring having 6 to 30 carbon atoms and a substituted or unsubstituted hetero group, an aryl ester of a ring containing 2 to 30 carbon atoms.
본 발명의 구현예에서 사용하는 버퍼 물질은 상기 화학식 1에서 보는 바와 같이, 비공유 전자쌍을 갖는 질소 원자를 고리 내에 함유하며 컨쥬게이티드된 구조 를 갖는 SPN(diaza spirobifluorene)을 물질의 중심, 즉 코어 구조로 함유한다. 따라서 이러한 버퍼 물질을 포함하는 버퍼층을 전자 소자의 전극 표면에 적용하는 경우, 전극과 반도체층 또는 전하 수송층 사이의 전하 주입 및 전하 이동성을 개선시켜 전자 소자의 전기적 특성을 향상시킬 수 있다.As shown in Formula 1, the buffer material used in the embodiment of the present invention contains a diaza spirobifluorene (SPN) having a conjugated structure in a ring containing a nitrogen atom having a non-covalent electron pair in a ring, ie, a core structure of the material. It contains. Therefore, when the buffer layer including the buffer material is applied to the electrode surface of the electronic device, the electrical properties of the electronic device may be improved by improving charge injection and charge mobility between the electrode and the semiconductor layer or the charge transport layer.
이때, 상기 화학식 1에서, R1 및 R2는 각각 독립적으로 치환 또는 비치환된 탄소수 6 내지 30의 아릴기, 또는 치환 또는 비치환된 탄소수 2 내지 30의 헤테로아릴기로서, 상기 아릴기 또는 헤테로아릴기를 이루는 고리들이 서로 융합되어 있는 것이 바람직하며, 상기 아릴기 또는 헤테로아릴기에 치환된 치환기는 탄소수 1 내지 10의 선형 또는 분지형 알킬기, 과플루오로화 알킬기, 할로겐 원자, 히드록시기, 니트로기, 아미노기, 시아노기, 알콕시기, 아미디노기, 및 카르복실기로 이루어진 군으로부터 선택된 1종 이상인 것이 바람직하다.In this case, in Formula 1, R 1 and R 2 are each independently a substituted or unsubstituted aryl group having 6 to 30 carbon atoms, or a substituted or unsubstituted heteroaryl group having 2 to 30 carbon atoms, wherein the aryl group or hetero It is preferable that the rings forming the aryl group are fused with each other, and the substituent substituted with the aryl group or the heteroaryl group may be a linear or branched alkyl group having 1 to 10 carbon atoms, a perfluorinated alkyl group, a halogen atom, a hydroxy group, a nitro group, or an amino group. It is preferable that it is at least 1 type selected from the group which consists of a cyano group, an alkoxy group, an amidino group, and a carboxyl group.
구체적으로, 상기 버퍼 물질은 하기 화학식 2로 표시될 수 있으며, 더욱 구체적으로는 하기 화학식 3 내지 화학식 5 로 표시될 수 있다. 그러나 반드시 이에 한정되는 것은 아니다.Specifically, the buffer material may be represented by the following Chemical Formula 2, and more specifically, may be represented by the following Chemical Formulas 3 to 5. However, it is not necessarily limited thereto.
[화학식 2][Formula 2]
상기 식에서 R은 각각 독립적으로 탄소수 1 내지 10의 선형 또는 분지형 알킬기, 과플루오로화 알킬기, 수소 원자, 할로겐 원자, 히드록시기, 니트로기, 아미노기, 시아노기, 알콕시기, 아미디노기 및 카르복실기로 이루어진 군으로부터 선택된다. 이때, 바람직하게는 적어도 1개의 R이 탄소수 4 내지 10의 선형 또는 분지형 알킬기 또는 과플루오로화 알킬기인 것이 좋다.In the formula, each R independently consists of a linear or branched alkyl group having 1 to 10 carbon atoms, a perfluorinated alkyl group, a hydrogen atom, a halogen atom, a hydroxyl group, a nitro group, an amino group, a cyano group, an alkoxy group, an amidino group and a carboxyl group. Selected from the group. In this case, it is preferable that at least one R is a linear or branched alkyl group or a perfluorinated alkyl group having 4 to 10 carbon atoms.
[화학식 3][Formula 3]
[화학식 4][Formula 4]
[화학식 5][Formula 5]
한편 상기 화학식들에서, 치환기인 알킬기의 구체적인 예로는 선형 또는 분지형으로서 메틸, 에틸, 프로필, 이소부틸, sec-부틸, tert-부틸, 펜틸, iso-아밀, 헥실 등을 들 수 있고, 상기 알킬기에 포함되어 있는 하나 이상의 수소 원자는 탄소수 1 내지 10의 알킬기, 할로겐 원자, 히드록시기, 니트로기, 아미노기, 시아노기, 알콕시기, 아미디노기, 히드라진기, 또는 카르복실기로 치환될 수 있다.Meanwhile, in the above formulas, specific examples of the alkyl group which is a substituent include methyl, ethyl, propyl, isobutyl, sec-butyl, tert-butyl, pentyl, iso-amyl, hexyl, and the like as the linear or branched alkyl group. One or more hydrogen atoms included in the may be substituted with an alkyl group having 1 to 10 carbon atoms, a halogen atom, a hydroxyl group, a nitro group, an amino group, a cyano group, an alkoxy group, an amidino group, a hydrazine group, or a carboxyl group.
상기 헤테로알킬기는, 상기 알킬기의 주쇄 중의 탄소원자 중 하나 이상, 바람직하게는 1 내지 5개의 탄소원자가 O, S, N, P 등과 같은 헤테로 원자로 치환된 것을 의미한다.The heteroalkyl group means that at least one carbon atom in the main chain of the alkyl group, preferably 1 to 5 carbon atoms is substituted with a hetero atom such as O, S, N, P and the like.
상기 아릴기는 하나 이상의 방향족 고리를 포함하는 카보사이클 방향족 시스템을 의미하며, 상기 고리들은 펜던트 방법으로 함께 부착되거나 또는 융합(fused)될 수 있다. 아릴기의 구체적인 예로는 페닐, 나프틸, 테트라히드로나프틸 등과 같은 방향족 그룹을 들 수 있고, 상기 아릴기 중 하나 이상의 수소 원자는 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다.By aryl group is meant a carbocycle aromatic system comprising at least one aromatic ring, which rings may be attached or fused together in a pendant manner. Specific examples of the aryl group include aromatic groups such as phenyl, naphthyl, tetrahydronaphthyl and the like, and one or more hydrogen atoms in the aryl group may be substituted with the same substituents as in the alkyl group.
상기 헤테로아릴기는 N, O, P 또는 S 중에서 선택된 1, 2 또는 3개의 헤테로 원자를 포함하고, 나머지 고리 원자가 C인 고리원자수 5 내지 30의 고리 방향족 시스템을 의미하며, 상기 고리들은 펜던트 방법으로 함께 부착되거나 또는 융합(fused)될 수 있다. 그리고 상기 헤테로아릴기 중 하나 이상의 수소 원자는 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다.The heteroaryl group means a ring aromatic system having 5 to 30 ring atoms containing 1, 2 or 3 hetero atoms selected from N, O, P or S, and the remaining ring atoms are C, and the rings are pendant. It can be attached or fused together. At least one hydrogen atom of the heteroaryl group may be substituted with the same substituent as in the alkyl group.
상기 알콕시기는 라디칼-O-알킬을 말하고, 이때 알킬은 위에서 정의된 바와 같다. 구체적인 예로는 메톡시, 에톡시, 프로폭시, 이소부틸옥시, sec-부틸옥시, 펜틸옥시, iso-아밀옥시, 헥실옥시 등을 들 수 있고, 상기 알콕시기 중 하나 이상의 수소 원자는 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다.Said alkoxy group refers to a radical-O-alkyl, wherein alkyl is as defined above. Specific examples include methoxy, ethoxy, propoxy, isobutyloxy, sec-butyloxy, pentyloxy, iso-amyloxy, hexyloxy, and the like. At least one hydrogen atom of the alkoxy group may be selected from the alkyl group. Substituent with the same substituent as the case may be sufficient.
상기 헤테로알콕시기는 1개 이상의 헤테로 원자 예를 들어 산소, 황 또는 질소가 알킬 사슬 내에 존재할 수 있다는 것을 제외하면 본질적으로 상기 알콕시의 의미를 가지며, 예를 들면 CH3CH2OCH2CH2O-, C4H9OCH2CH2OCH2CH2O- 및 CH3O(CH2CH2O)nH 등이다.The heteroalkoxy group has essentially the meaning of said alkoxy, except that one or more heteroatoms such as oxygen, sulfur or nitrogen may be present in the alkyl chain, for example CH 3 CH 2 OCH 2 CH 2 O—, C 4 H 9 OCH 2 CH 2 OCH 2 CH 2 O- and CH 3 O (CH 2 CH 2 O) n H and the like.
상기 아릴알킬기는 상기 정의된 바와 같은 아릴기에서 수소원자 중 일부가 저급알킬, 예를 들어 메틸, 에틸, 프로필 등과 같은 라디칼로 치환된 것을 의미한다. 예를 들어 벤질, 페닐에틸 등이 있다. 상기 아릴알킬기 중 하나 이상의 수소 원자는 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다.The arylalkyl group means that some of the hydrogen atoms in the aryl group as defined above are substituted with radicals such as lower alkyl, for example methyl, ethyl, propyl and the like. For example benzyl, phenylethyl and the like. At least one hydrogen atom of the arylalkyl group may be substituted with the same substituent as in the alkyl group.
상기 헤테로아릴알킬기는 헤테로아릴기의 수소 원자 일부가 저급 알킬기로 치환된 것을 의미하며, 헤테로아릴알킬기 중 헤테로아릴에 대한 정의는 상술한 바와 같다. 상기 헤테로아릴알킬기 중 하나 이상의 수소 원자는 상기 알킬기의 경우 와 마찬가지의 치환기로 치환가능하다.The heteroarylalkyl group means that a part of the hydrogen atoms of the heteroaryl group is substituted with a lower alkyl group, and the definition of heteroaryl in the heteroarylalkyl group is as described above. At least one hydrogen atom of the heteroarylalkyl group may be substituted with the same substituent as in the alkyl group.
상기 아릴옥시기는 라디칼-O-아릴을 말하고, 이때 아릴은 위에서 정의된 바와 같다. 구체적인 예로서 페녹시, 나프톡시, 안트라세닐옥시, 페난트레닐옥시, 플루오레닐옥시, 인데닐옥시 등이 있고, 아릴옥시기 중 하나 이상의 수소 원자는 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다.Said aryloxy group refers to a radical-O-aryl, wherein aryl is as defined above. Specific examples include phenoxy, naphthoxy, anthracenyloxy, phenanthrenyloxy, fluorenyloxy, indenyloxy, and the like, and at least one hydrogen atom in the aryloxy group may be substituted with the same substituent as in the alkyl group. Do.
상기 헤테로아릴옥시기는 라디칼-O-헤테로아릴을 말하며, 이때 헤테로아릴은 위에서 정의된 바와 같다.Said heteroaryloxy group refers to a radical-O-heteroaryl, wherein heteroaryl is as defined above.
상기 헤테로아릴옥시기의 구체적인 예로서, 벤질옥시, 페닐에틸옥시기 등이 있고, 헤테로아릴옥시기 중 하나 이상의 수소 원자는 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다.Specific examples of the heteroaryloxy group include benzyloxy, phenylethyloxy group and the like, and at least one hydrogen atom of the heteroaryloxy group may be substituted with the same substituent as in the alkyl group.
상기 사이클로알킬기는 탄소원자수 5 내지 30의 1가 모노사이클릭 시스템을 의미한다. 상기 사이클로알킬기 중 적어도 하나 이상의 수소 원자는 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다.The cycloalkyl group refers to a monovalent monocyclic system having 5 to 30 carbon atoms. At least one hydrogen atom of the cycloalkyl group may be substituted with the same substituent as in the alkyl group.
상기 헤테로사이클로알킬기는 N, O, P 또는 S 중에서 선택된 1, 2 또는 3개의 헤테로원자를 포함하고, 나머지 고리원자가 C인 고리원자수 5 내지 30의 1가 모노사이클릭 시스템을 의미한다. 상기 사이클로알킬기 중 하나 이상의 수소 원자는 상기 알킬기의 경우와 마찬가지의 치환기로 치환가능하다.The heterocycloalkyl group refers to a monovalent monocyclic system having 5 to 30 ring atoms containing 1, 2 or 3 heteroatoms selected from N, O, P or S, and the remaining ring atoms are C. At least one hydrogen atom of the cycloalkyl group may be substituted with the same substituent as in the alkyl group.
상기 알킬에스테르기는 알킬기와 에스테르기가 결합되어 있는 작용기를 의미하며, 이때 알킬기는 상기 정의한 바와 같다.The alkyl ester group means a functional group to which an alkyl group and an ester group are bonded, wherein the alkyl group is as defined above.
상기 헤테로알킬에스테르기는 헤테로알킬기와 에스테르기가 결합되어 있는 작용기를 의미하며, 이때 헤테로알킬기는 상기 정의한 바와 같다.The heteroalkyl ester group means a functional group to which a heteroalkyl group and an ester group are bonded, wherein the heteroalkyl group is as defined above.
상기 아릴에스테르기는 아릴기와 에스테르기가 결합되어 있는 작용기를 의미하며, 이때 아릴기는 상기 정의한 바와 같다.The aryl ester group means a functional group having an aryl group and an ester group bonded thereto, wherein the aryl group is as defined above.
상기 헤테로아릴에스테르기는 헤테로아릴기와 에스테르기가 결합되어 있는 작용기를 의미하며, 이때 헤테로아릴기는 상기에서 정의한 바와 같다.The heteroaryl ester group means a functional group having a heteroaryl group and an ester group bonded thereto, wherein the heteroaryl group is as defined above.
상기 아미노기는 -NH2, -NH(R) 또는 -N(R')(R'')을 의미하며, R'과 R"은 서로 독립적으로 탄소수 1 내지 10의 알킬기이다.The amino group means —NH 2 , —NH (R) or —N (R ′) (R ″), wherein R ′ and R ″ are each independently an alkyl group having 1 to 10 carbon atoms.
이러한 버퍼 물질을 포함하는 본 발명의 구현예에 의한 버퍼층은, 종래 당업계에서 공지되어 있는 통상의 방법에 따라 박막 형태로 형성될 수 있다.The buffer layer according to the embodiment of the present invention including such a buffer material may be formed into a thin film according to a conventional method known in the art.
즉, 구체적으로 예를 들면, 상기 버퍼 물질을 적절한 유기 용매에 용해시켜 통상의 코팅 또는 증착방법에 의해 박막으로 형성할 수 있다.Specifically, for example, the buffer material may be dissolved in a suitable organic solvent to form a thin film by a conventional coating or deposition method.
이때, 상기 유기 용매로는 당업자가 구체적인 버퍼 물질의 구조 및 종류에 따라 용해도가 높은 용매를 적절히 선택하여 결정할 수 있으며, 예를 들면 메틸알콜, 에틸알콜, n-프로필알콜, 이소프로필알콜, n-부틸알콜, sec-부틸알콜, t-부틸알콜, 이소부틸알콜, 디아세톤알콜을 포함하는 알콜류; 아세톤, 메틸에틸케톤, 메틸이소부틸케톤을 포함하는 케톤류; 에틸렌글리콜, 디에틸렌글리콜, 트리에틸렌글리콜, 프로필렌글리콜, 부틸렌글리콜, 헥실렌글리콜, 1,3-프로판디올, 1,4-부탄디올, 1,2,4-부탄트리올, 1,5-펜탄디올, 1,2-헥산디올, 1,6-헥산디올을 포함하는 글 리콜류; 에틸렌글리콜 모노메틸 에테르, 트리에틸렌글리콜 모노에틸 에테르를 포함하는 글리콜 에테르류; 프로필렌 글리콜 모노메틸 에테르 아세테이트(PGMEA)를 포함하는 글리콜 에테르 아세테이트류; 에틸아세테이트, 부톡시에톡시 에틸 아세테이트(butoxyethoxy ethyl acetate) 부틸 카르비톨 아세테이트(BCA), 디하이드로터피네올 아세테이트(dihydroterpineol acetate; DHTA)를 포함하는 아세테이트류; 터피네올류; 트리메틸 펜탄디올 모노이소부티레이트(Trimethyl pentanediol monoisobutyrate; TEXANOL); 디클로로에텐(DCE); 클로로벤젠; 자일렌(xylene); 및 N-메틸-2-피롤리돈(NMP) 등을 각각 단독으로 또는 2종 이상 혼합하여 사용할 수 있으나, 이에 한정되는 것은 아니다.In this case, as the organic solvent, a person skilled in the art can appropriately select and determine a solvent having high solubility according to the structure and type of a specific buffer material. For example, methyl alcohol, ethyl alcohol, n-propyl alcohol, isopropyl alcohol, n- Alcohols including butyl alcohol, sec-butyl alcohol, t-butyl alcohol, isobutyl alcohol, diacetone alcohol; Ketones including acetone, methyl ethyl ketone and methyl isobutyl ketone; Ethylene glycol, diethylene glycol, triethylene glycol, propylene glycol, butylene glycol, hexylene glycol, 1,3-propanediol, 1,4-butanediol, 1,2,4-butanetriol, 1,5-pentane Glycols including diol, 1,2-hexanediol, 1,6-hexanediol; Glycol ethers including ethylene glycol monomethyl ether and triethylene glycol monoethyl ether; Glycol ether acetates including propylene glycol monomethyl ether acetate (PGMEA); Acetates including ethyl acetate, butoxyethoxy ethyl acetate butyl carbitol acetate (BCA), dihydroterpineol acetate (DHTA); Terpineols; Trimethyl pentanediol monoisobutyrate (TEXANOL); Dichloroethene (DCE); Chlorobenzene; Xylene; And N-methyl-2-pyrrolidone (NMP) and the like can be used alone or in combination of two or more, but is not limited thereto.
또한 상기 버퍼층의 형성방법으로는 스핀코팅(spin coating), 딥코팅(dip coating), 롤코팅(roll coating), 스크린 코팅(screen coating), 분무코팅(spray coating), 스핀 캐스팅(spin casting), 흐름코팅(flow coating), 스크린 인쇄(screen printing), 잉크젯(ink jet), 드롭캐스팅(drop casting) 또는 진공 증착 방법 등을 이용할 수 있으나, 역시 이에 한정되는 것은 아니다.In addition, the buffer layer may be formed by spin coating, dip coating, roll coating, screen coating, spray coating, spin casting, Flow coating, screen printing, ink jet, drop casting, or vacuum deposition may be used, but is not limited thereto.
상기 버퍼 물질의 첨가량은 당업자가 용도 및 경우에 따라 적절히 선택하여 결정할 수 있으며, 바람직하게는 용매 100 중량부에 대하여 0.01 내지 10 중량부의 함량으로 첨가할 수 있다. 박막 형성 실험시 버퍼 물질의 농도가 10 wt%를 초과하면 농도가 너무 진하여 균일한 박막을 형성하는 것이 어렵다.The addition amount of the buffer material can be determined by those skilled in the art as appropriately selected according to the use and the case, and preferably in an amount of 0.01 to 10 parts by weight based on 100 parts by weight of the solvent. In the thin film formation experiment, if the concentration of the buffer material exceeds 10 wt%, the concentration is too thick to form a uniform thin film.
이러한 과정을 통해 형성되는 버퍼층은 0.1 nm 내지 100 nm 범위의 두께를 가질 수 있으나, 반드시 이에 한정되는 것은 아니며, 당업자가 용도 및 경우에 따라 적절히 조절할 수 있다.The buffer layer formed through this process may have a thickness in the range of 0.1 nm to 100 nm, but is not necessarily limited thereto, and those skilled in the art may appropriately adjust it according to the use and the case.
본 발명의 다른 구현예는 상기 버퍼층을 포함하는 전자 소자에 관한 것이다.Another embodiment of the invention relates to an electronic device comprising the buffer layer.
구체적으로, 본 발명의 다른 구현예는 상기 버퍼층을 전극 표면 상에 포함하는 전자 소자를 제공한다.Specifically, another embodiment of the present invention provides an electronic device including the buffer layer on the electrode surface.
상기한 본 발명의 일 구현예에 따른 버퍼층을 전극 표면 상에 적층하게 되면, 전극과 반도체층 또는 전하 수송층 계면 간의 접촉 저항치를 줄일 수 있어 캐리어인 전자나 정공의 주입 및 각 층간의 전하이동이 촉진되는 효과를 가져올 수 있으며, 그 결과 이를 포함하는 전자 소자는 우수한 전기적 특성을 나타낸다.When the buffer layer according to the embodiment of the present invention is stacked on the electrode surface, the contact resistance between the electrode and the semiconductor layer or the charge transport layer interface can be reduced, so that the injection of electrons or holes as carriers and the charge transfer between the layers are promoted. The effect is that the resulting electronic device exhibits excellent electrical properties.
본 발명의 구현예에서, 전자 소자란 고체 내 전자의 전도를 이용한 전자부품을 일컫는 말로서, 본 발명의 구현예에서 사용가능한 전자 소자의 예로는 OTFT(유기 박막 트랜지스터, Organic Thin Film Transistor), OLED(유기 발광 다이오드, Organic light emitting diodes), 태양전지(solar cell), 유기 광전 변환 소자(Organic phoyovoltaic) 등을 들 수 있으나, 반드시 이에 한정되는 것은 아니다.In an embodiment of the present invention, an electronic device refers to an electronic component using conduction of electrons in a solid, and examples of the electronic device usable in the embodiment of the present invention include OTFT (Organic Thin Film Transistor), OLED ( Organic light emitting diodes, organic light emitting diodes, solar cells, organic photoelectric conversion devices, and the like, but are not necessarily limited thereto.
구체적으로, 본 발명의 일 구현예에 따른 버퍼층을 유기박막 트랜지스터에 적용하는 경우, 상기 유기박막 트랜지스터는 기판, 게이트 전극, 게이트 절연막, 소스/드레인 전극, 버퍼층(buffer layer) 및 유기 반도체층을 포함하며, 이 때 상기 버퍼층이 게이트 전극 또는 소스/드레인 전극 상에 형성된 구조를 가질 수 있다.Specifically, when the buffer layer according to the embodiment of the present invention is applied to the organic thin film transistor, the organic thin film transistor includes a substrate, a gate electrode, a gate insulating film, a source / drain electrode, a buffer layer, and an organic semiconductor layer. In this case, the buffer layer may have a structure formed on the gate electrode or the source / drain electrode.
상기 유기박막 트랜지스터는 통상의 바텀 컨택, 탑 컨택 또는 탑 게이트 등의 구조를 가질 수 있고, 나아가 목적을 저해하지 않는 범위 내에서 변형된 구조를 가질 수 있다.The organic thin film transistor may have a structure such as a normal bottom contact, a top contact or a top gate, and may have a structure modified within a range that does not impair the purpose.
또한, 본 발명의 구현예에 따른 전자소자에서, 버퍼층을 제외한 나머지 구성 소자는 본 발명이 속하는 기술분야에서 통상 사용되는 재료 및 형성방법을 통해 형성될 수 있다.In addition, in the electronic device according to the embodiment of the present invention, the remaining components other than the buffer layer may be formed through materials and formation methods commonly used in the art.
예를 들어, 유기박막 트랜지스터의 경우, 상기 기판으로는 유리, 실리콘, 플라스틱 등을 사용할 수 있으며, 상기 게이트 전극 또는 소스/드레인 전극으로는 통상 사용되는 금속이나 전도성 고분자 또는 금속 산화물을 사용할 수 있다. 구체적으로는 금(Au), 은(Ag), 알루미늄(Al), 니켈(Ni), 몰리브덴(Mo), 텅스텐(W), 인듐틴산화물(ITO), 폴리티오펜(polythiophene), 폴리아닐린(polyaniline), 폴리아세틸렌(polyacetylene), 폴리피롤(polypyrole), 폴리페닐렌비닐렌(polyphenylene vinylene), PEDOT(polyethylenedioxythiophene)/PSS(polystyrenesulfonate) 혼합물, ITO(Indium-tin oxide), IZO(Indium-zinc oxide) 등을 예로 들 수 있으나, 이에 한정되지는 않는다.For example, in the case of an organic thin film transistor, glass, silicon, plastic, or the like may be used as the substrate, and a metal, a conductive polymer, or a metal oxide that is commonly used may be used as the gate electrode or the source / drain electrode. Specifically, gold (Au), silver (Ag), aluminum (Al), nickel (Ni), molybdenum (Mo), tungsten (W), indium tin oxide (ITO), polythiophene, polyaniline (polyaniline) ), Polyacetylene, polypyrole, polyphenylene vinylene, PEDOT (polyethylenedioxythiophene) / PSS (polystyrenesulfonate) mixture, ITO (Indium-tin oxide), IZO (Indium-zinc oxide) For example, but is not limited thereto.
또한 상기 게이트 절연막으로는 통상의 폴리올레핀, 폴리비닐, 폴리아크릴레이트, 폴리스티렌, 폴리우레탄, 폴리이미드, 폴리비닐페놀 및 이들의 유도체와 같은 유기물, SiNx(0<x<4), SiO2 및 Al2O3와 같은 무기물 등을 사용할 수 있으며, 상기 유기 반도체층으로는 펜타센, 테트라센, 구리 프탈로시아닌, 폴리티오펜, 폴리아닐 린, 폴리아세틸렌, 폴리피롤, 폴리페닐렌비닐렌 및 이들의 유도체 등을 사용할 수 있으나, 이에 한정되지 않는다.In addition, the gate insulating film may be a conventional organic material such as polyolefin, polyvinyl, polyacrylate, polystyrene, polyurethane, polyimide, polyvinylphenol and derivatives thereof, SiN x (0 <x <4), SiO 2 and Al. Inorganic materials such as 2 O 3, and the like, and the organic semiconductor layer may include pentacene, tetracene, copper phthalocyanine, polythiophene, polyaniline, polyacetylene, polypyrrole, polyphenylenevinylene, derivatives thereof, and the like. May be used, but is not limited thereto.
한편, 본 발명의 일 구현예에 따른 버퍼층을 유기 발광 다이오드에 적용하는 경우에는, 상기 유기 발광 다이오드는 기판 상의 양극, 버퍼층, 발광층(EML), 전자수송층(ETL), 음극을 포함하는 구조를 가질 수 있다. 역시 상기 버퍼층을 제외한 나머지 구성소자는 본 발명이 속하는 기술분야에서 통상 사용되는 재료 및 방법을 이용하여 형성될 수 있다. Meanwhile, when the buffer layer according to the embodiment of the present invention is applied to an organic light emitting diode, the organic light emitting diode has a structure including an anode, a buffer layer, an emission layer (EML), an electron transport layer (ETL), and a cathode on a substrate. Can be. Also, the remaining components except for the buffer layer may be formed using materials and methods commonly used in the art.
이하에서, 본 발명을 실시예를 들어 상세히 설명하나, 이들 실시예는 단지 본 발명을 설명하기 위한 것으로, 본 발명의 보호범위를 제한하는 것으로 해석되어서는 안 된다. Hereinafter, the present invention will be described in detail with reference to Examples, but these Examples are only for illustrating the present invention, and should not be construed as limiting the protection scope of the present invention.
제조예Production Example 1: One: FluFlu -- SPNBSPNB -- FluFlu 의 합성Synthesis of
1-1: 9,9-1-1: 9,9- BISBIS (2-(2- ethylhexylethylhexyl )-9H-) -9H- fluorenefluorene -2--2- ylbromoicylbromoic acidacid ( ( BFBBFB )의 합성) Synthesis
BFB를 합성하기 위해서 2-bromo-9H-fluorene (5g, 20.4mmol), t-BuOK (5.7 g, 50mmol) 을 DMF에 녹인 후에 2-ethyhexyl bromide (8ml, 44.9mmol)를 부가하였다. 40oC를 유지하면서 12시간 동안 반응시킨 뒤, 에틸 에테르(ethyl ether)와 증류수를 이용하여 추출을 하고, 반응에 참여 하지 않은 2-ethyhexyl bromide를 진공증류를 통해서 제거하였다. 정제를 위해서 컬럼 크로마토그래픽을 이용하였으며 전개용매는 석유 에테르(petroleum ether)로 하여 BF-EH 8.5g (88%) 얻었다.To synthesize BFB, 2-bromo-9H-fluorene (5 g, 20.4 mmol) and t-BuOK (5.7 g, 50 mmol) were dissolved in DMF, followed by addition of 2-ethyhexyl bromide (8 ml, 44.9 mmol). After reacting for 12 hours while maintaining 40 o C, extraction was performed using ethyl ether and distilled water, and 2-ethyhexyl bromide that was not involved in the reaction was removed by vacuum distillation. Column chromatography was used for purification and the developing solvent was petroleum ether, obtaining 8.5 g (88%) of BF-EH.
이어 BE-EH (5g, 10.6mmol)을 THF에 녹인 후 -78oC하에서 n-BuLi (2.5M in hexane) 5ml을 30분 동안 천천히 부가하였으며 -78oC로 유지하면서 1시간 동안 교반한 후에 트리이소프로필 보레이트(triisopropyl borate) (2.97mL, 12.9mmol)를 부가하였다. 12시간 동안 상온에서 반응시킨 뒤, 반응 종료 후에 에틸 에테르와 증류수로 추출하였으며, 전개용매 petroleum ether/ethyl acetate로 컬럼 크로마토그래피를 이용하여 정제 하였으며 BFB 3.2g(69%)을 얻었다.Following BE-EH (5g, 10.6mmol) was added slowly to the (2.5M in hexane) n-BuLi 5ml under -78 o C was dissolved in THF for 30 minutes while maintaining a -78 o C After stirring for 1 hour Triisopropyl borate (2.97 mL, 12.9 mmol) was added. After reacting at room temperature for 12 hours, after completion of the reaction, the mixture was extracted with ethyl ether and distilled water, and purified by column chromatography with developing solvent petroleum ether / ethyl acetate to obtain 3.2 g (69%) of BFB.
1-2: 1-2: FluFlu -- SPNBSPNB -- FluFlu 의 합성Synthesis of
BFB (0.45 g, 1.03 mmol)와 SPNB (0.2 g, 0.42 mmol)를 30 mL의 톨루엔에 녹이고, Pd(PPh3)4 (20 mg)와 2.0 M Na2CO3 (4.2 mmol)를 첨가한 후 90 ℃에서 24시간 동안 교반하였다. 얻어진 반응 혼합물을 냉각시켜 석유 에테르로 추출, MgSO4로 건조, 용매 제거하고 남은 물질을 petroleum ether/ethyl acetate 4:1 를 전개용매로 하여 컬럼 크로마토그래픽을 이용하여 정제하여 Flu-SPNB-Flu 0.3 g (64%) 흰색의 고체를 얻었다.BFB (0.45 g, 1.03 mmol) and SPNB (0.2 g, 0.42 mmol) were dissolved in 30 mL of toluene, Pd (PPh 3 ) 4 (20 mg) and 2.0 M Na 2 CO 3 (4.2 mmol) was added and stirred at 90 ° C for 24 h. The obtained reaction mixture was cooled, extracted with petroleum ether, dried over MgSO 4 , and the solvent was removed. The remaining material was purified by column chromatography using petroleum ether / ethyl acetate 4: 1 as a developing solvent, and 0.3 g of Flu-SPNB-Flu was added. (64%) A white solid was obtained.
제조된 Flu-SPNB-Flu의 흡광도 및 PL 스펙트럼을 도 1에 표시하였으며, Flu-SPNB-Flu의 열중량분석 (Thermogravimetry Analysis) 그래프 및 시차주사열량 (Differential Scanning Calorimetry) 그래프를 각각 도 2 및 도 3에 나타내었다.Absorbance and PL spectra of the prepared Flu-SPNB-Flu are shown in FIG. 1, and a thermogravimetry analysis graph and a differential scanning calorimetry graph of Flu-SPNB-Flu are shown in FIGS. 2 and 3, respectively. Shown in
실시예Example 1: One: FluFlu -- SPNBSPNB -- FluFlu 버퍼층을Buffer layer 포함하는 다이오드-유사 장치의 제조 Fabrication of Including Diode-Like Devices
도 4와 같이, 상기 제조예 1에 의해 합성된 SPN 코어 구조를 갖는 Flu-SPNB-Flu 1 mM를 자일렌(Xylene)에 녹여 패턴형성된 ITO glass(1)에 스핀 코팅 방법으로 1000rpm에서 10 nm 두께로 버퍼층(2)을 형성했다. 그런 뒤, 펜타센을 10-6 Torr 진공에서 열증착하여 70 nm 두께의 유기 반도체층(3)을 형성하고 Au(4)를 70 nm 두께로 열증착하여 다이오드-유사 장치(diode-like device)를 만들었다. 상기 다이오드-유사 장치는 hole-only device로서 전극의 work function를 고려하였을 때 전자 주입은 매우 적다.As shown in FIG. 4, 1 nm of Flu-SPNB-Flu having the SPN core structure synthesized according to Preparation Example 1 was dissolved in xylene and formed into a
비교예Comparative example 1 One
상기 실시예 1에서 버퍼층이 없는 것만을 제외하고 동일한 방법으로 다이오드-유사 장치(diode-like device)를 만들었다. A diode-like device was made in the same manner as in Example 1 except that there was no buffer layer.
상기 실시예 1 및 비교예 1의 다이오드-유사 장치에 대해 각각 전류-전압 특성을 측정하여 도 5에 나타내었다. 향후 넓은 면적의 디스플레이(large area display)용 후면(bankplane)에서 사용될 가능성이 있는 ITO 에서 채널층으로의 정공 주입 효과를 확인 하기 위해서 ITO 에 (+)전극, Au에 (-) 전극을 연결하고 전압 을 증가시키면서 전류의 변화를 확인하였다. The current-voltage characteristics of the diode-like devices of Example 1 and Comparative Example 1 were measured, respectively, and are shown in FIG. 5. In order to confirm the effect of hole injection into the channel layer from ITO, which is likely to be used in bankplane for large area display in the future, connect positive electrode to positive electrode and negative electrode to Au. The change of the current was confirmed while increasing.
도 5를 참조하면, SPN 코어를 갖는 물질을 포함하는 버퍼층이 있는 실시예 1의 경우에는 비교예 1의 버퍼층이 없을 때와 비교하여 전압이 10V인 경우 전류가 50배 증가하였다. 이로부터 상기 SPN 코어를 갖는 물질을 포함하는 버퍼층을 통하여 ITO와 펜타센의 접합(adhesion)이 향상되고, 버퍼층과 펜타센의 에너지 레벨을 일치시킴으로써 전하 주입(injection) 및 이동(transport)이 향상되었음을 알 수 있다. Referring to FIG. 5, in the case of Example 1 having a buffer layer including a material having an SPN core, the current increased by 50 times when the voltage was 10V compared to when the buffer layer of Comparative Example 1 was not present. From this, the adhesion of ITO and pentacene was improved through the buffer layer including the material having the SPN core, and the charge injection and transport were improved by matching the energy level of the buffer layer and pentacene. Able to know.
이상에서 살펴본 바와 같이 본 발명의 바람직한 실시예를 참고로 본 발명에 대해 상세히 설명하였으나, 이들은 단지 예시적인 것이 불과하며, 본 발명이 속하는 기술분야에서 통상의 지식을 가진 자라면 이로부터 다양한 변형 및 균등한 다른 실시예가 가능하다는 점을 이해할 것이다. 따라서, 본 발명의 진정한 기술적 보호 범위는 첨부된 특허청구범위의 기술적 사상에 의하여 정해져야 할 것이다.Although the present invention has been described in detail with reference to the preferred embodiments of the present invention as described above, these are merely exemplary, and those skilled in the art to which the present invention pertains various modifications and equivalents therefrom. It will be appreciated that one other embodiment is possible. Therefore, the true technical protection scope of the present invention will be defined by the technical spirit of the appended claims.
본 발명의 구현예들에 따른 디아자 스피로바이플루오렌 코어 구조를 갖는 물질을 포함하는 버퍼층은 질소 원자가 고리 내에 포함된 디아자 스피로바이플루오렌(SPN, diaza spirobifluorene) 구조를 코어로 함유하는 신규한 버퍼 물질을 포함하여 본 발명의 구현예들에 따른 버퍼층을 포함하는 전자소자에서 전하 주입(carrier injection) 및 전하이동(transport)을 향상시켜 전자소자의 효율을 향 상시킬 수 있다.A buffer layer comprising a material having a diaza spirobifluorene core structure according to embodiments of the present invention is a novel structure containing a diaza spirobifluorene (SPN) structure containing a nitrogen atom in its core. In the electronic device including the buffer layer according to the embodiments of the present invention, including the buffer material, the efficiency of the electronic device may be improved by improving carrier injection and transport.
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