KR20070005036A - X-ray cone beam ct scanner comprising 2-dimensinal reference detector and chollimator for reference detector - Google Patents

X-ray cone beam ct scanner comprising 2-dimensinal reference detector and chollimator for reference detector Download PDF

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KR20070005036A
KR20070005036A KR1020050059951A KR20050059951A KR20070005036A KR 20070005036 A KR20070005036 A KR 20070005036A KR 1020050059951 A KR1020050059951 A KR 1020050059951A KR 20050059951 A KR20050059951 A KR 20050059951A KR 20070005036 A KR20070005036 A KR 20070005036A
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detector
ray
reference detector
dimensional
collimator
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KR100718671B1 (en
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박정병
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(주)디알젬
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G01N21/5907—Densitometers
    • G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD

Abstract

A high resolution cone beam X-ray CT scanner is provided to improve the space decomposition ability by reflecting measurement information of a reference detector on a CT image calculation. A high resolution cone beam X-ray CT scanner includes an X-ray tube, a collimator, a two-dimensional main detector, a two-dimensional reference detector(41), and a collimator(61) for the reference detector. The main detector is selected from a two-dimensional curved surface detector(30) or a planar detector. The reference detector selects a photo diode, a CMOS, or a CCD as a part. A X-ray beam is vertically illuminated to a detection surface of the two dimensional reference detector.

Description

2차원 참조검출기 및 참조 검출기용 콜리메이터를 포함하는 고해상도 콘빔 엑스선 단층 촬영 장치 {X-ray Cone Beam CT scanner comprising 2-dimensinal reference detector and chollimator for reference detector}High resolution cone beam x-ray tomography apparatus including a two-dimensional reference detector and a collimator for a reference detector {X-ray Cone Beam CT scanner comprising 2-dimensinal reference detector and chollimator for reference detector}

도 1은 종래의 엑스선 단층촬영장치에 대하여 주요 부품을 중심으로 개략적으로 도시한 것이고, 1 is a schematic view showing the main components of the conventional X-ray tomography apparatus,

10: 엑스선관,10: X-ray tube,

11: 엑스선 초점,11: x-ray focus,

20: 1차원 주 검출기, 20: one-dimensional main detector,

50 : 팬빔 엑스선,50: fan beam x-rays,

60 : 주 콜리메이터,60: primary collimator,

70 : 조사야(Field of View),70: field of view,

80 : 회전중심,80: center of rotation,

도 2는 1차원 또는 2차원 검출기의 구조와 팬빔 또는 콘빔의 엑스선 빔의 모양에 따른 단층촬영장치의 종류를 설명하기 위한 도면이고, 2 is a view for explaining the type of tomography apparatus according to the structure of the one-dimensional or two-dimensional detector and the shape of the X-ray beam of the fan beam or cone beam,

30: 2차원 곡면형 주 검출기,30: two-dimensional curved main detector,

31: 2차원 평면형 주 검출기,31: two-dimensional planar main detector,

51, 52: 콘빔 엑스선,51, 52: cone beam x-rays,

도 3은 종래의 참조 검출기를 이용한 엑스선 초점의 움직임을 보상하는 기술을 설명하기 위한 도면이고, 3 is a view for explaining a technique for compensating for the movement of the X-ray focus using a conventional reference detector,

40: 1차원 참조 검출기,40: one-dimensional reference detector,

61 : 참조 검출기용 콜리메이터,61: collimator for reference detector,

도 4는 도 3을 Y-Z평면에서 나타낸 도면이며, 4 is a view showing the 3 in the YZ plane,

90: 참조검출기에 조사되는 엑스선 빔,90: the X-ray beam irradiated to the reference detector,

도 5는 콘빔 형태의 엑스선 빔과 2차원 엑스선 검출기를 사용할 경우, 2차원 참조검출기를 사용하여 초점 움직임의 정보를 획득하여 엑스선 초점의 움직임을 보상하기 위한 원리를 설명하기 위한 도면이고, 5 is a view for explaining a principle for compensating for the movement of the X-ray focus by acquiring the focus movement information using a two-dimensional reference detector when using a cone beam X-ray beam and a two-dimensional X-ray detector,

41: 2차원 참조 검출기,41: two-dimensional reference detector,

이다.to be.

본 발명은 2차원 참조검출기(41) 및 참조 검출기용 콜리메이터(61)를 포함하는 고해상도 콘빔 엑스선 단층 촬영 장치 또는 볼륨 엑스선 단층 촬영 장치에 관한 것이다.The present invention relates to a high resolution cone beam x-ray tomography apparatus or a volume x-ray tomography apparatus including a two-dimensional reference detector 41 and a collimator 61 for a reference detector.

일반적으로 엑스선 단층촬영장치에는 피사체를 고정하고 엑스선관과 검출기를 회전시키는 방법(갠트리 회전방식)과 엑스선관과 검출기는 고정하고 피사체를 회전시키는 방법(피사체 회전방식)이 적용되고 있다. 갠트리 회전 방식의 엑스선 단층촬영장치(1)의 경우 엑스선관(10)과 엑스선 검출기(20)가 회전 갠트리(12)에 탑재되고 회전중심(80)을 중심으로 회전하는 구조를 가진다. 회전 갠트리(12)는 고정부(11)와 베어링으로 체결되고 고정부는 지지부(13)에 체결되어 있다. 피사체(6)는 조사야(70)에 해당되는 개구부내에 위치시키도록 되어 있다.In general, the X-ray tomography apparatus has a method of fixing a subject and rotating an X-ray tube and a detector (gantry rotation method) and a method of fixing the X-ray tube and detector and rotating the subject (subject rotation method). In the case of the gantry rotating X-ray tomography apparatus 1, the X-ray tube 10 and the X-ray detector 20 are mounted on the rotating gantry 12 and have a structure that rotates about the rotation center 80. The rotary gantry 12 is fastened to the fixed part 11 and the bearing, and the fixed part is fastened to the support part 13. The subject 6 is located in the opening corresponding to the irradiation field 70.

회전하는 동안 검출기(20)는 하나의 신호조합(set)을 얻게 되는데 일반적으로 1회전에서 수 백 번 이상 신호를 측정하여 하나의 신호조합을 얻는다. 이때 하나 하나의 신호 측정을 뷰(View)라고 하며 검출기가 1차원 배열구조일 경우, 하나의 신호조합의 크기는 검출기의 수와 뷰의 수의 곱이 되고 이것을 시노그램(Sinogram)이라 한다.During rotation, the detector 20 obtains one signal set, which is typically measured several hundred times in one revolution to obtain one signal combination. In this case, one signal measurement is called a view, and when the detector has a one-dimensional array structure, the size of one signal combination is a product of the number of detectors and the number of views, which is called a sinogram.

한편, 엑스선의 발생원리를 살펴보면 엑스선관 내부에 있는 양극 금속물질에 전자가 부딪히게 되어 전자의 운동에너지가 빛 에너지로 변환되면서 발생되는 것이다. 이때 전자가 양극 타켓에 부딪히는 작은 면적을 초점(spot)이라고 한다. 그런데 엑스선이 발생되고 있는 과정에서 이 초점은 고정되어 있는 것이 아니라 불규칙하게 조금씩 움직이게 된다. 그 움직임은 축적되는 열로 인한 양극의 팽창과 요동(wobbling)에 기인하는 것으로 알려져 있다. 이와 같은 초점의 불규칙한 움직임이 있게 되면 단층영상에서 공간분해능의 저하를 가져오게 되는 것이다. On the other hand, looking at the generation principle of the X-rays are electrons hit the anode metal material inside the X-ray tube is generated when the kinetic energy of the electrons is converted into light energy. In this case, the small area where the electron hits the anode target is called a spot. However, in the process of generating X-rays, the focus is not fixed but moves irregularly little by little. The movement is known to be due to the expansion and wobbling of the anode due to the accumulated heat. Such irregular movement of the focus results in a decrease in spatial resolution in the tomography image.

갠트리 회전 방식의 엑스선 단층촬영장치는 도 2에 도시되고 있는 바와 같이 팬빔(fan beam)의 엑스선(50)과 1차원 배열검출기(20)로 구성된 단층촬영장치(100), 콘빔(cone beam)의 엑스선(51)과 곡면형 2차원 검출기(30)로 구성된 콘빔 단층촬영장치(200) 그리고 콘빔의 엑스선(52)과 평면형 2차원 검출기(31)로 구성된 콘빔 단층촬영장치(300)로 구분할 수 있다. As shown in FIG . 2 , the gantry rotation type X-ray tomography apparatus includes a tomography apparatus 100 and a cone beam composed of an X-ray 50 of a fan beam and a one-dimensional array detector 20. It can be divided into a cone beam tomography apparatus 200 composed of an X-ray 51 and a curved two-dimensional detector 30, and a cone beam tomography apparatus 300 composed of an X-ray 52 of a cone beam and a planar two-dimensional detector 31. .

상기 1차원적으로 배열된 구조의 검출기(Single Row Detector Assembly)와 팬빔(Fan Beam)의 엑스선을 이용한 엑스선 단층촬영장치(Single row Detector Computed Tomography : SDCT)는 오랜 동안 사용되어 온 방법으로서, 일반적으로 1회전에 의하여 획득한 하나의 신호조합으로 부터 한장의 단층영상을 획득하게 된다. 상기 SDCT의 경우, 엑스선 초점의 불규칙한 움직임으로 인한 화질 저하를 개선하기 위한 기술은 있었다. 이 기술은 도 3 및 도 4에 나타낸 바와 같이 1차원 검출기인 참조 검출기(40)와 콜리메이터(61)을 이용하여 Z축 상으로 엑스선 초점의 이동변화를 관측하여 주 콜리메이터(60)을 통과한 엑스선이 주 검출기(20)에 손실 없이 입사되도록 주 콜리메이터(60)를 제어하는 것이었다.The single row detector assembly and the single row detector computed tomography (SDCT) using the X-ray of a fan beam have been used for a long time. One tomography image is acquired from one signal combination obtained by one rotation. In the case of the SDCT, there has been a technique for improving image quality deterioration due to irregular movement of the X-ray focus. This technique uses X-rays passing through the main collimator 60 by observing a change in the X-ray focal point on the Z-axis using the reference detector 40 and the collimator 61, which are one-dimensional detectors, as shown in FIGS . 3 and 4 . The main collimator 60 was controlled so as to enter the main detector 20 without loss.

최근 엑스선 단층촬영장치는, 상술한 바와 같이, 2차원 검출기와 두꺼운 팬빔(51)이나 Cone Beam 또는 사각뿔 모양의 엑스선(52)을 이용한 MDCT(Multi row Detector CT), CBCT(Cone Beam CT), VCT(Volume CT)가 개발되어 사용되고 있다. 이 경우 하나의 신호조합(set)으로 부터 획득 할 수 있는 단층영상의 수는 2차원 검출기의 Z축 방향으로 배열된 줄의 수에 비례하게 된다. Recently, X-ray tomography apparatus, as described above, MDCT (Multi row Detector CT), CBCT (Cone Beam CT), VCT using a two-dimensional detector and a thick fan beam 51, a cone beam or a square pyramid X-ray 52 (Volume CT) has been developed and used. In this case, the number of tomographic images that can be obtained from one signal set is proportional to the number of lines arranged in the Z-axis direction of the two-dimensional detector.

이와 같은 2차원 검출기가 적용된 엑스선 단층촬영장치의 경우, 엑스선 초점 의 불규칙한 움직임에 의한 초점의 공간상 변위에 대한 정보를 X, Y, Z축 모두에 대하여 알아야 2차원 단층영상을 재구성할 때 공간분해능 저하를 해결할 수 있지만 아직 그러한 기술은 없다. In the case of the X-ray tomography apparatus using the 2D detector, the spatial resolution of the focus due to the irregular movement of the X-ray focus needs to be known to all the X, Y, and Z axes to reconstruct the 2D tomography. The degradation can be resolved but there is no such technique yet.

이에, 본 발명자들은 참조검출기를 종래의 1차원 검출기가 아닌 2차원 검출기를 적용하여 시간에 따른 엑스선관의 초점의 불규칙한 움직임을 X,Y,Z 3차원적으로 각 뷰별로 획득하고, 이를 단층 영상 재구성 과정에 반영하여 공간 분해능을 향상시켜 피사체의 보다 미세한 구조를 확인할 수 있음을 확인함으로써 본 발명을 완성하였다.Accordingly, the present inventors apply a reference detector to a two-dimensional detector instead of a conventional one-dimensional detector to acquire irregular movements of the focal point of the X-ray tube over time in each of three views in X, Y, and Z, and tomography images. The present invention was completed by confirming that the finer structure of the subject can be confirmed by improving spatial resolution by reflecting the reconstruction process.

본 발명의 목적은 참조검출기를 종래의 1차원 검출기가 아닌 2차원 검출기를 적용하여 시간에 따른 엑스선관의 초점의 불규칙한 움직임을 X,Y,Z 3차원 적으로 각 뷰별로 획득하여 단층영상 재구성 과정에 반영하여 공간분해능을 향상시키는 것이다.An object of the present invention is to apply a reference detector to a two-dimensional detector instead of a conventional one-dimensional detector to acquire irregular movement of the focal point of the X-ray tube with respect to each view in X, Y, and Z three-dimensional views. This is to reflect the spatial resolution to improve.

상기 목적을 달성하기 위하여,In order to achieve the above object,

본 발명은 2차원 주검출기, 2차원 참조검출기(41) 및 참조 검출기용 콜리메이터(61)를 포함하는 고해상도 엑스선 단층 촬영 장치를 제공한다.The present invention provides a high resolution X-ray tomography apparatus including a two-dimensional main detector, a two-dimensional reference detector 41 and a collimator 61 for a reference detector.

이하, 본 발명을 상세히 설명한다.Hereinafter, the present invention will be described in detail.

본 발명은 2차원 주검출기, 2차원 참조검출기(41) 및 참조 검출기용 콜리메이터(61)를 포함하는 고해상도 엑스선 단층 촬영 장치를 제공한다. 상기 주 검출기는 2차원 곡면 검출기(30) 또는 평면형 검출기(31)로부터 선택되는 것을 특징으로 하는 것이 바람직하다. 또한, 2차원 참조 검출기는 포토 다이오드 또는 CMOS 또는 CCD를 부품으로 선택하는 것이 바람직하며, 2차원 참조 검출기(41)의 검출면과 입사하는 엑스선 빔(90)이 수직으로 이루어지는 구조인 것이 더욱 바람직하다.The present invention provides a high resolution X-ray tomography apparatus including a two-dimensional main detector, a two-dimensional reference detector 41 and a collimator 61 for a reference detector. Preferably, the main detector is selected from a two-dimensional curved detector 30 or a planar detector 31. In addition, it is preferable that the two-dimensional reference detector is selected as a photodiode, CMOS, or CCD as a component, and more preferably, a structure in which the detection surface of the two-dimensional reference detector 41 and the incident X-ray beam 90 are perpendicular to each other. .

또한, 본 발명은 상기 2차원 참조 검출기를 이용하여 엑스선 빔의 강도를 각 뷰 별로 측정하여 보정하는 방법을 제공한다.In addition, the present invention provides a method of measuring and correcting the intensity of an X-ray beam for each view using the two-dimensional reference detector.

도 5는 엑스선 검출기, 엑스선관, 엑스선 빔, 콜리메이터, 참조검출기 등을 중심으로 본 고안를 설명하기 위한 전체 외형도이다. 5 is an overall outline for explaining the present invention around the X-ray detector, X-ray tube, X-ray beam, collimator, reference detector, and the like.

일반적인 엑스선 단층촬영장치와 같이 엑스선 빔(51)은 엑스선관(10)내의 엑스선 초점(11)에서 방사되어 주 콜리메이터(60)을 통과하여 주 검출기(30)에 입사되고 상기 모든 부품들은 회전중심(80)으로 회전하는 구조에서, 본 고안은, 2차원 참조 검출기(41), 참조 검출기용 콜리메이터(61)가 부가적으로 구비함을 특징으로 한다.Like a typical X-ray tomography apparatus, the X-ray beam 51 is radiated from the X-ray focal point 11 in the X-ray tube 10 and passes through the main collimator 60 to enter the main detector 30, and all the components are rotated at the center of rotation ( In the structure of rotating to 80, the present invention is characterized in that the two-dimensional reference detector 41, the collimator 61 for the reference detector is additionally provided.

2차원 엑스선 검출기(30, 31)가 적용된 콘빔 단층촬영장치의 경우, 콘빔영상재구성알고리듬(Cone beam reconstruction algorithm)은 초점(11)과 검출기(30, 31)간의 상대적인 3차원 공간 정보가 중요하게 작용하는 원리를 가지고 있다. 따라서 초점(11)이 고정되어 있으면 문제가 없지만 앞서 서술한 바와 같이 필연적으로 엑스선 초점(11)은 움직이게 된다. In the case of the cone beam tomography apparatus to which the two-dimensional X-ray detectors 30 and 31 are applied, the three-dimensional spatial information between the focus 11 and the detectors 30 and 31 is important for the cone beam reconstruction algorithm. Has the principle of Therefore, if the focus 11 is fixed, there is no problem, but as described above, the X-ray focus 11 necessarily moves.

상기 초점(11)의 공간상의 움직임의 정보를 측정하기 위하여 도 5에서 도시된 바와 같이 참조 검출기용 콜리메이터(61)과 2차원 참조 검출기(41)을 배치시킨다. 배치방법은 참조용 검출기(41)의 면과 입사되는 엑스선 빔(90)이 수직이 되도록 하는 것이 좋다. 또한 참조 검출기용 콜리메이터(61)에 뚫린 구멍은 검출기(41)의 검출기 픽셀의 피치를 고려하여 작은 원형이 바람직하다. 이러한 상황에서 엑스선 초점(11)이 움직이게 되면 원형의 엑스선 빔(90)이 조사되는 위치도 움직이게 되어 참조검출기(41)에서 그 정보를 측정할 수 있게 되는 것이다.As shown in FIG . 5 , the collimator 61 and the two-dimensional reference detector 41 for arranging the spatial motion of the focus 11 are arranged. The arrangement method may be such that the surface of the reference detector 41 is perpendicular to the incident X-ray beam 90. In addition, the hole drilled in the collimator 61 for the reference detector is preferably a small circle in consideration of the pitch of the detector pixel of the detector 41. In this situation, when the X-ray focus 11 moves, the position where the circular X-ray beam 90 is irradiated also moves, so that the information can be measured by the reference detector 41.

본 발명에서는 피사체를 고정하고 엑스선관과 검출기를 회전하는 갠트리 회전방식의 엑스선 단층촬영장치를 예를 들어 도시하였으나 이에 한정하는 것이 아니며, 당해 기술 분야에 알려진 피사체 회전 방식 및 피사체 이동회전 방식 또한 본 발명의 범주에 속함은 명백하다 하겠다. In the present invention, the gantry rotation type X-ray tomography apparatus for fixing the subject and rotating the X-ray tube and the detector, for example, but not limited to this, subject rotation method and subject movement rotation method known in the art also Being in the category of is obvious.

상술한 바와 같이 본 고안에 따른 2차원 참조검출기와 참조 검출기용 콜리메이터를 이용하면, 시간에 따른 엑스선 초점의 공간상의 움직임을 2차원 참조 검출기를 통하여 측정하게 되어 이 정보를 단층영상 재구성 계산에 반영하면 공간분해능을 향상 시키는 효과를 갖는다.As described above, when the two-dimensional reference detector and the collimator for the reference detector according to the present invention are used, the spatial movement of the X-ray focus over time is measured through the two-dimensional reference detector, and the information is reflected in the tomographic reconstruction calculation. It has the effect of improving spatial resolution.

Claims (5)

엑스선관, 콜리메이터, 2차원 주검출기, 2차원 참조검출기(41) 및 참조 검출기용 콜리메이터(61)를 포함하는 고해상도 엑스선 단층 촬영 장치.A high-resolution X-ray tomography apparatus comprising an X-ray tube, a collimator, a two-dimensional main detector, a two-dimensional reference detector (41), and a collimator for a reference detector (61). 제 1항에 있어서, 주 검출기는 2차원 곡면 검출기(30) 또는 평면형 검출기(31)로부터 선택되는 것을 특징으로 하는 엑스선 단층 촬영 장치.The X-ray tomography apparatus according to claim 1, wherein the main detector is selected from a two-dimensional curved detector (30) or a planar detector (31). 제 1항에 있어서, 참조 검출기는 포토 다이오드 또는 CMOS 또는 CCD를 부품으로 선택하는 것을 특징으로 하는 엑스선 단층 촬영 장치.The X-ray tomography apparatus of claim 1, wherein the reference detector selects a photodiode, a CMOS, or a CCD as a component. 제 1항에 있어서, 2차원 참조 검출기(41)의 검출면과 입사하는 엑스선 빔(90)이 수직으로 이루어지는 구조인 것을 특징으로 하는 엑스선 단층 촬영 장치.The X-ray tomography apparatus according to claim 1, wherein the X-ray tomography apparatus has a structure in which the detection surface of the two-dimensional reference detector is perpendicular to the incident X-ray beam. 제 1항의 2차원 참조 검출기를 이용하여 엑스선 빔의 강도를 각 뷰 별로 측정하여 보정하는 방법.The method of claim 1, by measuring the intensity of the X-ray beam for each view using the two-dimensional reference detector.
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