KR20050104981A - 박막 증착방법 및 분리된 퍼지가스 분사구를 구비하는박막 증착장치 - Google Patents
박막 증착방법 및 분리된 퍼지가스 분사구를 구비하는박막 증착장치 Download PDFInfo
- Publication number
- KR20050104981A KR20050104981A KR1020040030692A KR20040030692A KR20050104981A KR 20050104981 A KR20050104981 A KR 20050104981A KR 1020040030692 A KR1020040030692 A KR 1020040030692A KR 20040030692 A KR20040030692 A KR 20040030692A KR 20050104981 A KR20050104981 A KR 20050104981A
- Authority
- KR
- South Korea
- Prior art keywords
- gas
- injector
- thin film
- deposited
- film deposition
- Prior art date
Links
- 238000000151 deposition Methods 0.000 title abstract description 18
- 239000000463 material Substances 0.000 claims abstract description 60
- 238000010926 purge Methods 0.000 claims abstract description 54
- 238000000427 thin-film deposition Methods 0.000 claims abstract description 47
- 238000006243 chemical reaction Methods 0.000 claims abstract description 45
- 239000007789 gas Substances 0.000 claims description 247
- 239000012495 reaction gas Substances 0.000 claims description 46
- 238000002347 injection Methods 0.000 claims description 29
- 239000007924 injection Substances 0.000 claims description 29
- 238000000034 method Methods 0.000 claims description 19
- 238000007736 thin film deposition technique Methods 0.000 claims description 8
- 238000005507 spraying Methods 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 4
- 230000005855 radiation Effects 0.000 claims description 2
- 239000002994 raw material Substances 0.000 abstract description 26
- 239000010409 thin film Substances 0.000 abstract description 16
- 238000004140 cleaning Methods 0.000 abstract description 4
- 230000000694 effects Effects 0.000 abstract description 4
- 238000001179 sorption measurement Methods 0.000 abstract description 4
- 238000004904 shortening Methods 0.000 abstract description 2
- 230000008021 deposition Effects 0.000 description 13
- 230000008569 process Effects 0.000 description 8
- 239000000758 substrate Substances 0.000 description 8
- 239000002245 particle Substances 0.000 description 6
- 239000000376 reactant Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 235000012489 doughnuts Nutrition 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45574—Nozzles for more than one gas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/42—Silicides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45587—Mechanical means for changing the gas flow
- C23C16/45589—Movable means, e.g. fans
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (11)
- 반응챔버;상기 반응챔버 내에 위치되며, 피증착 물질이 안착 되는 하나 이상의 서셉터;상기 서셉터와 대향하여 설치되며 상기 피증착 물질에 제 1 가스와 제 2 가스를 분사하는 제 1 가스분사기;상기 제 1 가스분사기와 별도로 상기 제 1 가스분사기 상부에 설치되며, 상기 피증착 물질을 향하여 제 3 가스를 분사하는 제 2 가스분사기;를 포함하여 구성되는 것을 특징으로 하는 박막 증착장치.
- 제 1 항에 있어서,상기 제 1 가스분사기는,수직방향의 분사기 회전축을 중심으로 회전 가능한 구조로 구성되는 것을 특징으로 하는 박막 증착장치.
- 제 2 항에 있어서,상기 제 1 가스분사기는,상기 분사기 회전축을 따라 상기 반응챔버 내부로 인입되어 상기 반응챔버의 내벽을 향해 확장되도록 형성되며, 상기 제 1 가스인 소스가스를 분사하는 소스 가스 분사기;상기 분사기 회전축을 따라 상기 반응챔버 내부로 인입되어 상기 반응챔버의 내벽을 향해 확장되도록 형성되며, 상기 제 2 가스인 반응가스를 분사하는 반응 가스 분사기;를 포함하여 구성되는 것을 특징으로 하는 박막 증착장치.
- 제 3 항에 있어서,상기 소스 가스 분사기와 상기 반응 가스 분사기는,상호 직각을 이루며 교번되는 구조로 형성되는 것을 특징으로 하는 박막 증착장치.
- 제 1 항 내지 제 4 항 중 어느 한 항에 있어서,상기 제 2 가스 분사기는,상기 피증착 물질을 덮을 수 있는 크기로 형성되며, 상기 피증착 물질에 제 3 가스인 퍼지가스를 분사하는 구조로 형성되는 것을 특징으로 하는 박막 증착장치.
- 제 1 항 내지 제 4 항 중 어느 한 항에 있어서,상기 제 2 가스 분사기의 하부에는,등간격을 이루며 방사선 또는 격자 형태로 배열되는 복수의 퍼지가스 분사구가 형성되는 것을 특징으로 하는 박막 증착장치.
- 제 1 항 내지 제 4 항 중 어느 한 항에 있어서,상기 서셉터는,복수개로 형성되고;상기 제 2 가스 분사기는,상기 각 서셉터를 각각 일대일로 덮을 수 있는 형상으로 상기 서셉터의 개수만큼 형성되어 상기 각 서셉터의 상측에 결합되거나 또는, 상기 각 서셉터를 동시에 덮을 수 있는 형상으로 형성되어 상기 각 서셉터의 상측에 결합되는 것을 특징으로 하는 박막 증착장치.
- 제 1 항 내지 제 4 항 중 어느 한 항에 있어서,상기 제 2 가스 분사기는,상기 제 1 가스 분사기의 가스 분사속도보다 가스를 빠르게 분사하도록 구성되는 것을 특징으로 하는 박막 증착장치.
- 제 1 항 내지 제 4 항 중 어느 한 항에 있어서,상기 반응챔버는,내부의 가스를 외부로 배출시키기 위한 가스배출구가 형성되는 것을 특징으로 하는 박막 증착장치.
- 반응챔버 내의 서셉터 상에 피증착 물질을 위치시키는 단계;상기 피증착 물질 상에 제 1 가스 분사기로 제 1 가스와 제 2 가스를 교번하여 분사시키는 동시에, 상기 제 1 가스 분사기 상부에 설치되어 있는 제 2 가스 분사기로 제 3 가스를 분사시키는 단계;를 포함하는 것을 특징으로 하는 박막 증착방법.
- 제 10 항에 있어서,상기 제 1 가스는 소스가스이고,상기 제 2 가스는 반응가스이며,상기 제 3 가스는 퍼지가스인 것을 특징으로 하는 박막 증착방법.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040030692A KR100574569B1 (ko) | 2004-04-30 | 2004-04-30 | 박막 증착방법 및 분리된 퍼지가스 분사구를 구비하는박막 증착장치 |
CN2005100679282A CN1693540B (zh) | 2004-04-30 | 2005-04-28 | 沉积薄膜的方法和具有用于喷洒清洁气体的单独喷射口的薄膜沉积系统 |
US11/119,313 US20050241580A1 (en) | 2004-04-30 | 2005-04-28 | Method for depositing thin film and thin film deposition system having separate jet orifices for spraying purge gas |
TW094113792A TWI390076B (zh) | 2004-04-30 | 2005-04-29 | 用以沈積薄膜之方法及具有用於噴吹掃用之氣體之分離式噴射孔之薄膜沈積系統 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040030692A KR100574569B1 (ko) | 2004-04-30 | 2004-04-30 | 박막 증착방법 및 분리된 퍼지가스 분사구를 구비하는박막 증착장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20050104981A true KR20050104981A (ko) | 2005-11-03 |
KR100574569B1 KR100574569B1 (ko) | 2006-05-03 |
Family
ID=35185793
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020040030692A KR100574569B1 (ko) | 2004-04-30 | 2004-04-30 | 박막 증착방법 및 분리된 퍼지가스 분사구를 구비하는박막 증착장치 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20050241580A1 (ko) |
KR (1) | KR100574569B1 (ko) |
CN (1) | CN1693540B (ko) |
TW (1) | TWI390076B (ko) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101292626B1 (ko) * | 2006-09-15 | 2013-08-01 | 주성엔지니어링(주) | 기판 안치 수단 및 이를 구비하는 기판 처리 장치 |
KR101358863B1 (ko) * | 2007-12-28 | 2014-02-06 | 주성엔지니어링(주) | 박막 형성 장치 및 이를 이용한 박막 형성 방법 |
WO2014030973A1 (ko) * | 2012-08-23 | 2014-02-27 | 주성엔지니어링(주) | 기판 처리 장치 및 기판 처리 방법 |
KR20180009451A (ko) * | 2016-07-19 | 2018-01-29 | 주성엔지니어링(주) | 기판처리장치 |
KR20180051913A (ko) * | 2016-11-09 | 2018-05-17 | 주식회사 원익아이피에스 | 기판처리장치 |
KR20190070311A (ko) * | 2019-06-03 | 2019-06-20 | 주성엔지니어링(주) | 기판 처리 장치 |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070234956A1 (en) * | 2006-04-05 | 2007-10-11 | Dalton Jeremie J | Method and apparatus for providing uniform gas delivery to a reactor |
KR101464227B1 (ko) | 2007-01-12 | 2014-11-21 | 비코 인스트루먼츠 인코포레이티드 | 가스 처리 시스템 |
KR100905278B1 (ko) * | 2007-07-19 | 2009-06-29 | 주식회사 아이피에스 | 박막증착장치, 박막증착방법 및 반도체 소자의 갭-필 방법 |
KR100950076B1 (ko) | 2008-03-28 | 2010-03-26 | 주식회사 휘닉스 디지탈테크 | 에어 커튼 형태로 가스를 분사하는 박막증착장치 |
US8535445B2 (en) * | 2010-08-13 | 2013-09-17 | Veeco Instruments Inc. | Enhanced wafer carrier |
KR101625211B1 (ko) | 2010-09-17 | 2016-05-27 | 주식회사 원익아이피에스 | 박막 증착 장치 |
KR20120065841A (ko) * | 2010-12-13 | 2012-06-21 | 삼성전자주식회사 | 기판 지지 유닛과, 이를 이용한 박막 증착 장치 |
CN103511587A (zh) * | 2012-06-25 | 2014-01-15 | 绿种子材料科技股份有限公司 | 可替换齿部的齿轮结构及应用该齿轮结构的薄膜沉积系统 |
CN106030761B (zh) | 2014-01-27 | 2019-09-13 | 威科仪器有限公司 | 用于化学气相沉积系统的晶片载体及其制造方法 |
CN105990082A (zh) * | 2015-02-15 | 2016-10-05 | 盛美半导体设备(上海)有限公司 | 半导体刻蚀装置 |
CN105970188A (zh) * | 2016-07-11 | 2016-09-28 | 中山德华芯片技术有限公司 | 一种旋转圆盘式mocvd反应室的进气结构 |
US11469130B2 (en) * | 2017-06-16 | 2022-10-11 | Jusung Engineering Co., Ltd. | Substrate processing apparatus and rotating electrical connector for vacuum |
CN112490105A (zh) * | 2020-11-23 | 2021-03-12 | 长江存储科技有限责任公司 | 一种等离子体处理装置及处理方法 |
CN113725061A (zh) * | 2021-09-01 | 2021-11-30 | 长鑫存储技术有限公司 | 晶圆处理装置及方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000514136A (ja) * | 1996-06-28 | 2000-10-24 | ラム リサーチ コーポレイション | 高密度プラズマ化学蒸着装置および方法 |
KR100416308B1 (ko) * | 1999-05-26 | 2004-01-31 | 동경 엘렉트론 주식회사 | 플라즈마 처리 장치 |
US6576062B2 (en) * | 2000-01-06 | 2003-06-10 | Tokyo Electron Limited | Film forming apparatus and film forming method |
KR100458982B1 (ko) * | 2000-08-09 | 2004-12-03 | 주성엔지니어링(주) | 회전형 가스분사기를 가지는 반도체소자 제조장치 및 이를이용한 박막증착방법 |
US20060201428A1 (en) * | 2001-07-19 | 2006-09-14 | Park Young H | Shower head and method of fabricating the same |
KR100432378B1 (ko) * | 2001-08-30 | 2004-05-22 | 주성엔지니어링(주) | Hdp-cvd 장치 |
KR100473429B1 (ko) * | 2002-04-10 | 2005-03-08 | 주성엔지니어링(주) | Cvd 장치의 샤워헤드 |
KR100497748B1 (ko) * | 2002-09-17 | 2005-06-29 | 주식회사 무한 | 반도체소자 제조용 원자층 증착 장치 및 원자층 증착 방법 |
US7431772B2 (en) * | 2004-03-09 | 2008-10-07 | Applied Materials, Inc. | Gas distributor having directed gas flow and cleaning method |
-
2004
- 2004-04-30 KR KR1020040030692A patent/KR100574569B1/ko active IP Right Grant
-
2005
- 2005-04-28 CN CN2005100679282A patent/CN1693540B/zh active Active
- 2005-04-28 US US11/119,313 patent/US20050241580A1/en not_active Abandoned
- 2005-04-29 TW TW094113792A patent/TWI390076B/zh active
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101292626B1 (ko) * | 2006-09-15 | 2013-08-01 | 주성엔지니어링(주) | 기판 안치 수단 및 이를 구비하는 기판 처리 장치 |
KR101358863B1 (ko) * | 2007-12-28 | 2014-02-06 | 주성엔지니어링(주) | 박막 형성 장치 및 이를 이용한 박막 형성 방법 |
WO2014030973A1 (ko) * | 2012-08-23 | 2014-02-27 | 주성엔지니어링(주) | 기판 처리 장치 및 기판 처리 방법 |
KR20180009451A (ko) * | 2016-07-19 | 2018-01-29 | 주성엔지니어링(주) | 기판처리장치 |
KR20180051913A (ko) * | 2016-11-09 | 2018-05-17 | 주식회사 원익아이피에스 | 기판처리장치 |
KR20190070311A (ko) * | 2019-06-03 | 2019-06-20 | 주성엔지니어링(주) | 기판 처리 장치 |
Also Published As
Publication number | Publication date |
---|---|
KR100574569B1 (ko) | 2006-05-03 |
US20050241580A1 (en) | 2005-11-03 |
TWI390076B (zh) | 2013-03-21 |
CN1693540B (zh) | 2011-05-18 |
TW200609377A (en) | 2006-03-16 |
CN1693535A (zh) | 2005-11-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100574569B1 (ko) | 박막 증착방법 및 분리된 퍼지가스 분사구를 구비하는박막 증착장치 | |
US20120152172A1 (en) | Gas-discharging device and substrate-processing apparatus using same | |
KR101554334B1 (ko) | 샤워헤드 어셈블리 및 이를 구비한 박막증착장치 및 박막증착방법 | |
KR20020013383A (ko) | 회전형 가스분사기를 가지는 반도체소자 제조장치 및 이를이용한 박막증착방법 | |
KR20120065841A (ko) | 기판 지지 유닛과, 이를 이용한 박막 증착 장치 | |
TW201707057A (zh) | 基板處理裝置及方法 | |
KR20100002886A (ko) | 원자층 증착 장치 | |
KR101548347B1 (ko) | 반도체 제조에 사용되는 원자층 증착 방법 | |
KR20090021035A (ko) | 박막 증착장치 | |
KR102449791B1 (ko) | 기판 처리장치 | |
KR101907973B1 (ko) | 가스분사장치 및 이를 구비하는 기판처리장치 | |
KR20110117417A (ko) | 화학기상증착장치용 서셉터 및 이를 구비하는 화학기상증착장치 | |
KR101396462B1 (ko) | 원자층 박막 증착장치 | |
KR20230004370A (ko) | 기판 처리장치 | |
KR101493254B1 (ko) | 원자층 박막 증착장비 | |
KR20190119386A (ko) | 기판처리장치 | |
KR102461199B1 (ko) | 기판처리장치 | |
KR101123828B1 (ko) | 반도체 제조에 사용되는 원자층 증착 장치 | |
KR20030002776A (ko) | 박막 증착 장비 | |
KR20070038206A (ko) | 가스 분사 장치 | |
TWI471453B (zh) | Thin film deposition method and thin film deposition apparatus | |
KR101804126B1 (ko) | 가스분사장치 및 기판처리장치 | |
KR102293135B1 (ko) | 기판 처리장치 | |
KR101897215B1 (ko) | 가스분사장치 및 기판처리장치 | |
KR101199953B1 (ko) | 박막 형성 방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20130410 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20140402 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20150303 Year of fee payment: 10 |
|
FPAY | Annual fee payment |
Payment date: 20160303 Year of fee payment: 11 |
|
FPAY | Annual fee payment |
Payment date: 20170406 Year of fee payment: 12 |
|
FPAY | Annual fee payment |
Payment date: 20180423 Year of fee payment: 13 |
|
FPAY | Annual fee payment |
Payment date: 20190328 Year of fee payment: 14 |