KR20040073104A - Method and Apparatus for inspecting pixel of Display - Google Patents

Abstract

PURPOSE: A method and an apparatus for inspecting pixels of a display device are provided to accurately obtain voltage and pixel capacity of gate lines, data lines, and an individual pixel, and accurately inspect inferiority and a position of each pixel. CONSTITUTION: A transistor(130) connected with a target pixel area(140) to be inspected is operated through related gate lines(111). The target pixel area is charged into predetermined pixel capacity by a pixel voltage through related data lines(121) of the transistor connected with the target pixel area to be inspected. The charged pixel capacity is inputted to amplifying circuit parts(150) installed inside or outside of a display device. The pixel capacity of the target pixel area is amplified into a predetermined level by the amplifying circuit parts so that the pixel capacity is inspected.

Description

Method for inspecting pixel of display device and inspection device {Method and Apparatus for inspecting pixel of Display}

The present invention relates to a method and a device for inspecting the normal or defective of each pixel provided in the display device, and more particularly, to input a pixel capacity charged in each pixel area to the amplifier and to raise the input signal to a predetermined level. The present invention relates to a pixel inspection method and an inspection apparatus of a display apparatus for determining whether or not normality of pixels installed in a display panel is detected.

In general, a display device is a device that outputs image information input through a camera or image information recorded on a storage medium such as a disk on a screen. The beginning of a display device, a screen display device, is a Cathode Ray Tube (CRT) developed by Braun, Germany. Cathode ray tubes (CRTs) have been firmly positioned in television displays and computer monitors for over 100 years of display history.

Hereinafter, a description will be briefly given of a display device which is widely used including a cathode ray tube.

First, the cathode ray tube (CRT) will be described. In the television screen, an electron beam emitted from the electron gun portion is moved one line from the upper left to the lower right of the screen and collides with the fluorescent film applied to the screen to form an image of 30 frames per second. In total, 525 scan lines are scanned in 1/30 second to form an image frame. Therefore, every 30 frames of video information is transmitted every second, which is why it appears as a dynamic image in the human field of view.

Cathode ray tubes (CRTs) enable electron beam emission and scanning so that images are displayed as described above on televisions or computer monitors. That is, the cathode ray tube (CRT) emits an electric signal in the form of an electron beam and impinges on the fluorescent film of the screen, and reproduces the image by using the optical property that the excited electrons are excited and emitted from the fluorescent film to return to the original energy level. It is a display device.

In the cathode ray tube (CRT), a certain magnetic field is formed through the deflection yoke, and when the electron beam passes through the magnetic field, the direction of travel is converted into electromagnetic force to reach the fluorescent film coated on the screen of the cathode ray tube in the order of scanning.

Cathode ray tubes (CRTs) are still widely used as display devices for color television receivers, radar devices and video door phones, and are leading display technology. However, with the development of portable information and communication devices, the display of light weight, thin film, and low power consumption has recently been subjected to strong challenges in the display market.

The excellent display characteristics of cathode ray tubes (CRTs) include high resolution, fast response speed, wide viewing angle and color gamut, and low production cost compared to display performance. It also has the disadvantage of using.

Therefore, a flat panel display device having improved screen characteristics while overcoming disadvantages of the cathode ray tube (CRT) display, particularly large and thick weaknesses, has been developed and used as a display device in various fields.

Examples of flat panel display devices include liquid crystal displays (LCDs), plasma display panels (PDPs), organic electroluminescent displays (ELDs), and field emission displays (FEDs). Etc. can be mentioned.

In liquid crystal displays, TFT-LCD (Thin Film Transister-Liquid Crystal Display), which uses a thin film transistor as a switching element of a pixel, is recently used in a personal digital assistant (PDA), a PC monitor, and the like. And shown in FIG. 2.

As shown in FIG. 1, a TFT (Thin Film Transitor) LCD having an active matrix structure is formed by injecting a liquid crystal, which is an intermediate material between a solid and a liquid, between two thin glass plates. It is a display device using a kind of light switching phenomenon to display an image through the contrast generated by changing the arrangement of the liquid crystal molecules by the voltage difference of the common electrode).

In the TFT-LCD panel, each pixel includes a TFT (thin film transistor) having a gate terminal and a source terminal respectively connected to a gate line and a data line of a matrix structure, and a drain terminal of the TFT as shown in FIG. 2. And a liquid crystal layer injected between the pixel electrode, the common electrode formed on the color filter substrate corresponding to the TFT array substrate, and the substrate.

When a drive IC (not shown) connected to a signal processor (not shown) for digitally processing an image signal applies a TFT turn-on signal to a gate terminal through a gate line, the TFT is turned on and operated. A predetermined voltage corresponding to the image data is input to the source terminal of the TFT through the data line, and a pixel voltage is formed between the pixel electrode and the common electrode to change the arrangement state of the liquid crystal injected into the liquid crystal layer.

Liquid crystal is a kind of organic compound which is liquid on the outer surface but optically anisotropic crystal and becomes liquid crystal in a certain temperature range. Therefore, equivalently, each liquid crystal cell may be interpreted as a capacitor having a predetermined pixel capacity.

In order to induce the direction of the liquid crystal, passages for aligning the liquid crystal in a predetermined direction are formed in an alignment layer of a thin organic film made of polyimide, and when the liquid crystal contacts the surface of the alignment layer, the liquid crystal molecules are aligned. Arranged parallel to the passageway. The alignment films provided on both sides are arranged to be distorted by 90 degrees to each other, so that the alignment directions of liquid crystal molecules are continuously twisted by 90 degrees, and the incident light travels along the liquid crystal molecules.

3 is a backlight unit (Backlight Unit, not shown) which is composed of a CCFL (Cold Cathode Fluorescent Lamps) lamp of the TFT-LCD, a reflecting plate, a light guide plate and the like to irradiate planar light with uniform brightness to the LCD panel; The liquid crystal and the alignment layer forming the pixels of the panel with the light emitted through the panel are illustrated.

When the signal voltage corresponding to the image data is applied to the liquid crystal by using the TFT, the liquid crystal is twisted 90 degrees, and is vertically aligned in one direction so that the light goes straight. The incident light is determined by the twist and looseness of the liquid crystal. The polarizers are attached to the glass plates on both sides to collect the light passing through the liquid crystal in one direction. do.

A more detailed description of the configuration and operation of the TFT LCD and other display devices mentioned above will be omitted since it is a general technique to those skilled in the art.

In the display devices configured as described above, defects may be generated by impurities or various phenomena generated in the process. In this case, the pixels become poor, and therefore, the image cannot be displayed preferably, and the image quality characteristics deteriorate as a whole. Therefore, if a clear screen is not obtained and a defective pixel or line is generated, the product cannot be used.

As a method of determining whether each pixel of the conventional display device is normal or defective with a defect, a method of mainly reading a charge value, that is, a pixel capacity, charged in one pixel by using a probe. For example.

That is, in the display device having a data line and a gate line having a right angle to the data line, defect inspection of each pixel is performed by turning on a TFT through the gate line and applying a tester signal voltage corresponding to image data to the data line. The pixel is charged with the pixel capacity.

At this time, the charge value charged in the pixel capacitor is obtained by using a charge voltage or a sustain voltage value that maintains the pixel capacitor, thereby measuring pixel defects such as a short circuit and a disconnection, and a location of a fault.

However, the probe method of measuring the charging current or the holding voltage using the probe is tens of times larger than the pixel charging capacity of the additional probe charging capacity or other measuring device. When the noise component such as the capacitance of the measuring device and the probe itself is removed from the capacitance, the finally obtained pixel capacitance is relatively small.

In some cases, an amplifier may be included inside the measuring device, but this also requires amplification of the pixel capacity before input to the measuring device because it is difficult to avoid the influence of the capacitance of the measuring device itself.

Therefore, it is difficult to acquire pure pixel capacity, and thus there is a problem in that it is impossible to detect whether a pixel is defective or not.

In addition, in the method of visual inspection by the operator after assembling the display panel, it is possible to check whether there is a pixel defect, but in the case of obtaining a coordinate of a defective position for repairing a bad pixel, use a waveform generator to form a cross or a dot. To generate a random cursor and the operator to directly move the direction key to check the bad coordinates, in this method there is a problem that the inspection time is long and the work speed and efficiency is reduced.

In addition, when inspecting using a ccd camera after assembling the panel, the position of a bad pixel can be obtained during pixel inspection. However, since external noise components interfere with the video signal of the camera, the inspection output of the camera is reduced. There is a problem that the degradation is difficult to check the defects and the darkening of the inspection unit is required. In addition, the detection force is very inferior to visual inspection, and the coordinate detection output is inferior to the method using the waveform generator, which makes it difficult to be practical.

Therefore, in the field of display apparatuses, which are increasing in demand along with the development of today's wireless communication and electronic technology capable of acquiring various information in various fields accurately and quickly, the pixels of display apparatuses capable of solving these problems can be solved. There is a need for a method of inspecting and developing a test apparatus that can be used in these methods.

In order to solve the above problems, the present invention provides an amplifier circuit unit including an amplifier inside or outside an effective display area of a display panel, and applies a signal to each pixel capacitor and a line capacitor in a semiconductor memory method. The purpose of the present invention is to provide a method for inspecting a pixel of a display device that can easily detect a normal or defective or defective position of a pixel without being affected by a measuring apparatus such as a conventional tester by amplifying and measuring a predetermined level through an amplifying circuit unit. have.

Another object of the present invention is to provide a pixel inspection device of a display apparatus, in which an amplification circuit portion is installed on a probe to amplify and output the charging capacity or a predetermined signal voltage value of a pixel at a predetermined level so that the probe can be directly used in the implementation of the pixel inspection method. have.

In addition, another object of the present invention is to provide a display device including an amplification circuit unit installed inside or outside the display panel itself to amplify the pixel capacity charged in each pixel region to a predetermined level and output the result to an external pixel detection device. .

1 is a schematic configuration diagram of an LCD that is an example of a flat panel display device.

2 is an equivalent circuit diagram of FIG. 1.

3 is a view showing an operating state of a liquid crystal in the display device of FIG.

4 is a schematic block diagram of a display device according to the present invention;

5 is a schematic circuit diagram of a display device according to the present invention;

FIG. 6 is a schematic circuit diagram of an amplifier circuit part installed in FIG. 5; FIG.

7 is a schematic block diagram of a pixel inspection device of a display device according to the present invention;

<Description of the symbols for the main parts of the drawings>

100: display device 101: panel

110: gate line driver 111: gate line

120: data line driver 121: data line

130: transistor 140: pixel region

150: amplification circuit unit 200: display pixel inspection device

210: main body 210: probe

250: amplification circuit section

The pixel inspection method and the pixel inspection method according to the inspection apparatus of the present invention, a plurality of gate lines and data lines, and transistors arranged to be connected to the gate line and the data line on and off, respectively, the data line through the transistor In the method for inspecting the normal or bad pixel of a display device comprising a plurality of pixel areas for receiving an image data signal from the display device and outputting an image,

Operating a transistor connected to a target pixel region to be inspected through an associated gate line; Charging the target pixel region to a predetermined pixel capacity with a pixel voltage through an associated data line of a transistor connected to the target pixel region to be inspected; Inputting a pixel capacitor charged in the target pixel region into an amplifier circuit unit installed inside or outside the display device; And inspecting the pixel capacity of the target pixel region amplified by the amplification circuit unit to a predetermined level and returned.

In addition, the pixel inspection method of the display device of the present invention further comprises the step of determining the normal or bad pixel by comparing the pixel capacity returned from the target pixel region using the reference charge capacity of the normal pixel. It features.

In addition, the pixel inspection method of the present invention is characterized in that the amplifying circuit portion is installed directly on the panel of the display device.

In addition, the pixel inspection method of the present invention,

It is another additional feature to determine whether the pixel is normal or defective by using the following equation (where CI _S : supply capacitance, CL _L : line capacitance, C _DM : parasitic capacitance, CN _S : pixel reference capacitance). , CP _R : Return capacity, n: Number of pixels to be lit during pixel inspection, m: Number of actual lit pixels)

In addition, the pixel inspection method of the display device of the present invention, wherein

When the value of m, which is the actual number of illuminated pixels calculated through M, is n = n, all the pixels to be lit are judged to be normal, and when 0 ≦ m <n, at least one or more of the n pixels to be examined It is another additional feature that it is determined that an open occurs at, and it is determined that a short occurs in the pixel when n <0.

In addition, the pixel inspection apparatus according to the pixel inspection method and the inspection apparatus of the display device of the present invention, the amplifying circuit portion is amplified to a predetermined level when the pixel capacitance charged in each pixel area of the display device is detected at a predetermined point. Including a probe to be installed, characterized in that it is used directly in the pixel inspection method of the display device.

In addition, the pixel inspection device of the display device of the present invention, the amplification circuit is configured at the end of the probe probe contacting the test panel to amplify a predetermined voltage and the charging capacity input to the pixel region, the gate line or the data line. It features.

In addition, the display device according to the pixel inspection method of the present invention includes a plurality of gate lines and data lines through which a predetermined signal flows from a driver for selecting each pixel to display an image signal; A transistor disposed on / off in connection with the gate line and the data line, respectively; A plurality of pixel areas receiving an image data signal from a data line through the transistor and outputting an image; In the case of determining whether the pixel is normal or defective, the amplification circuit unit amplifies the pixel capacity charged in the pixel region to a predetermined level and outputs the result to an external pixel detection device.

In addition, the display device according to the pixel inspection method of the present invention is characterized in that the amplifying circuit portion is configured to amplify a predetermined voltage and the charging capacity input to the pixel region, the gate line or the data line.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

4 is a schematic block diagram of a display device used in the present embodiment, and FIG. 5 is a schematic circuit diagram of the display device.

As shown in FIG. 4, an amplifying circuit 150 is installed inside the panel 101 of the display apparatus 100, and the pixel inspecting apparatus 200 of the display apparatus is inspected to inspect the pixels of the display apparatus 100. Is also provided. The pixel inspecting apparatus 200 is provided with a probe 220 which detects a signal corresponding to the pixel capacitance amplified to a predetermined level from the measurement main body 210 and the amplifying circuit unit 150.

A person of ordinary skill in the art may have some information on the principle of reading or writing data in a semiconductor memory, that is, a pixel array structure of a display device is regarded as a cell structure of a memory, or If the entire display panel is recognized as a memory having one large size, the present invention will be more readily understood through the detailed description described herein.

Briefly explaining the principle of a semiconductor memory, for example, a DRAM cell comprises a transistor and a capacitor for storing data bits. When the transistor is activated, the capacitor is accessed to write data to or read data from it.

Many memory cells are typically arranged in rows and columns to form a memory array, where the rows are generally referred to as wordlines and the columns are referred to as bitlines. One or more such arrays make up the DRAM chip.

In the known folded bitline structure, the bitlines are divided into pairs and each pair is connected to a sense amplifier. One bit line is referred to as the actual bit line and the other bit line is referred to as the complementary bit line. The sense amplifiers are connected to sense and amplify data signals from selected memory cells. When a word line is selected and activated, the activated word line and the cell group connected to the bit line are selected and one bit line of the pair of bit lines is connected to the selected word line.

The voltage change of the bit line is detected and amplified by the sense amplifier, and the amplified signal is put back into the storage cell to restore the signal value to the original voltage value. In this way, all the cells selected by the word line are refreshed (refer to the DRAM; it is necessary to periodically vent data stored in the capacitor due to leakage current in DRAM) and at the same time the output of the sense amplifier is sent to the decoder according to the operation of the row. Will print

As illustrated in FIG. 5, the display apparatus 100 includes a plurality of gate lines connected to the data line driver 120, the gate line driver 110, and the drivers 110 and 120 to cross each other in a matrix structure. 111 and a data line 121, a gate terminal and a source terminal are respectively connected to the gate line 111 and the data line 121 to display an image through the transistor 130 arranged for each pixel, and the transistor 130. And a pixel area 140.

The pixel region 140 is a portion for outputting image data from each pixel to the screen, with one pole connected to the drain terminal of the transistor 130 and the other pole connected to the common terminal Vcom. The pixel region 140 is represented by a capacitor having a pixel capacitance CP _S in an equivalent circuit.

Each pixel is connected to the amplifying circuit unit 150. The amplifying circuit unit 150 may be selectively installed inside or outside the pixels constituting the panel 101, and preferably the signal of the pixel region 140 is satisfactorily provided. In order to be detected, the panel 101 may be disposed and installed in an appropriate position in consideration of the configuration of the panel 101 and various chips and electrical elements of the substrate.

A schematic circuit configuration of the amplifying circuit unit 150 is shown in FIG. The transistor 130 is schematically represented as a switching element and configured to receive a signal corresponding to the pixel capacitance. The first amplifier is composed of a buffer amplifier having unity gain and its output value is input to the non-inverting terminal of the second amplifier. The amplifier circuit unit 150 is not limited to FIG. 6 and may be modified by those skilled in the art in various forms.

Hereinafter, the present embodiment will be described with reference to the drawings by applying to the display device configured as described above.

First, the output signal of the gate driver 110 is input to the gate terminal of the transistor 130 disposed in the pixel through G1, which is the first gate line 121. The transistor 130 is operated by being turned on at a turn-on voltage higher than or equal to a threshold voltage. In FIG. 5, all transistors connected to the first gate line 121 are operated.

Next, an image data signal driven by the data driver 120 through the data line 121 connected to the source terminal of the target pixel to be examined in the first gate line G1 is connected to the pixel region 140 through the drain terminal. Is reached, the charging current and the pixel voltage VP _S are applied to the capacitor of the pixel region 140 to charge the predetermined pixel capacitor CP _S.

In the present exemplary embodiment, as the image data signal is applied to the first data line D1, pixels formed by the first gate line G1 and the first data line D1 are detected as normal or defective.

Next, the gate voltage of the transistor 130 is converted into a turn-off voltage, the transistor 130 is turned off to keep the pixel capacitor CP _S constant, and then the transistor 130 is turned on again.

Next, the predetermined pixel capacitance CP _S of the pixel region 140 charged in the above process is returned, and the returned pixel capacitance CP _S is input to the amplifying circuit unit 150 to obtain a gain ratio of the amplifying circuit unit 150. As a result, the signal is amplified and output at a predetermined level.

Next, the amplified transfer capacity CP _S may be detected through the pixel inspection apparatus 200 having the probe 220 of the display apparatus or an appropriate detecting means, and the normal or the defective, i.e., disconnection, short circuit, or the like may be detected. Will be.

In this case, preferably, the signal value output through the amplifying circuit unit 150 is compared based on the reference pixel capacitance of a normal pixel, and more preferably, a comparison means including a comparator is provided to automatically determine whether there is an abnormality.

In the case of determining whether an abnormality is caused by continuously charging a plurality of pixels, the position of the pixel determined to be defective is related to the gate line 111 and the data line 121 connected to the transistor 130 that is turned on / off and The number of lines can be easily identified since it is already known.

On the other hand, when there are a plurality of pixels that require a tester, that is, a plurality of pixels to be turned on, the return capacitance returned to the amplifying circuit unit 150 and the supply capacitance supplied to each pixel can be expressed by the following equation. .

[Equation 1]

[Equation 2]

(Equation 1 and Equation 2, CI _S : supply capacitance, CL _L : line capacitance, C _DM : parasitic capacitance, CN _S : pixel reference capacitance, CP _R : return capacitance, n: pixel to be lit during pixel inspection Number, m: the number of actual lighting pixels.)

At this time, the number of m actually lit may be expressed by Equation 3 below from Equation 1 and Equation 2 above.

[Equation 3]

Each variable is the same as defined in the above equations. Here, the pixel defect detection relates to the case where the gate line 111 and the data line 121 associated with the target pixel at a specific position are opened one by one (n = 1), that is, when the pixel capacity of the target pixel is returned and detected. Equation 1 and Equation (2) to obtain the return capacity and supply capacity it is possible to calculate the value of m through the equation (3).

Therefore, if m = 1, the target pixel may be determined to be normal. This is because the pixel to be turned on and the pixel actually lit are the same. Next, if m = 0, the target pixel does not turn on, and therefore, it may be determined that open failure, that is, disconnection occurs. Next, if m <0, it can be determined that a short failure, that is, a short circuit.

In the above process, when n is greater than 1, that is, when the return capacity and the supply capacity are calculated by applying the same to a plurality of target pixels simultaneously, all pixels to be lit when m = n are returned to normal. In the case of 0≤m <n, it is determined that an open occurs in at least one or more pixels among all n pixels to be inspected, and when n <0, a short occurs in the pixels. It can also be judged.

Similarly, for the lighting of a plurality of pixels, the position of the pixel defect can be accurately determined by the on / off combination of the sequential gate line 111 and the data line 121.

In the case where the lighting of a specific pixel is performed in the middle gray gray scale, it is preferable to apply CN _S as the reference pixel capacitance in the middle gray scale in the above equations.

It is also possible to easily detect continuous pixel defects without using the above equation. That is, the difference between the total sum of the pixel capacities detected by the amplifying circuit unit 150 in the data line 121 and the reference capacities of the normal pixels is obtained, and when the difference exceeds one reference pixel capacities, one or more pixel defects are found. It can be seen that.

In this case, the defective pixel position on the data line 121 can be accurately determined by sequentially turning on / off the gate line 111.

In addition, in the case of a pixel defect that continues from the specific number of the gate line 111 to the last number of the gate line 111, it may be estimated that the data line 121 is an open defect.

In addition, when the inspected pixel defect positions show a continuous form at the same gate line number, the open defect of the gate line 111 can be estimated similarly by sequentially measuring the charge capacity of the data line on the corresponding gate line 111. .

In addition, as described above, the short failure between the lines, as described above, the continuity of the pixel failure occurrence position also occurs in the short generation between the data line 121 and the gate line 111 and between the data line 121 and the gate line 111. By using the difference between the charging capacity and the reference capacity, the short defect of the line and its defective position can be measured.

Meanwhile, FIG. 7 relates to an apparatus for inspecting pixels of the display apparatus according to the present invention. Unlike FIG. 4 to FIG. 6, the amplification circuit unit 150 is installed in the display apparatus 100. The device has a configuration in which the amplifying circuit unit 250 is integrally installed on the probe 220 which is the probe. Preferably, the amplifying circuit unit 250 is a probe probe portion in contact with the panel to be inspected to accurately amplify a predetermined voltage and a charging capacity input to the pixel region 140 or the gate line 111 or the data line 121. Be configured at the end.

The pixel inspection apparatus of the display device having the above configuration may enter the target pixel to be probed, input the signal to the amplifier circuit 250, and measure the value.

The display device according to the pixel inspection method and inspection apparatus of the present invention and the pixel inspection apparatus of the display apparatus that can be used directly in the implementation of the inspection method, the separate description of the operation and the The description has been made in parallel and the descriptions above are deemed to be readily apparent to those skilled in the art.

The present invention has been described through the above embodiments, but the present invention is not limited to the above embodiments, and various modifications can be made within the scope of the technical idea of the claims and drawings of the present invention. And it will be apparent to those skilled in the art that the present invention may be easily implemented through the detailed description of the present specification.

When the pixel inspection method and the inspection apparatus of the present invention are employed in the display technology field, the amplification circuit unit has a voltage and pixel capacity applied to each small pixel in tens of tens of the display probe or tester system. Amplification can be detected by amplifying the signal at a predetermined level, thereby accurately calculating the voltage and pixel capacitance of the gate line, the data line, and the individual pixels.

In addition, it is possible to reduce the interference or influence of an external measuring device such as a tester through the accurately detected pixel capacity, which has the advantage of inspecting defects and positions of each pixel quickly and accurately.

Therefore, fault detection of the display device is easy, and whether or not pixel defects of the display device can be measured in real time in a process operation, thereby improving overall image quality characteristics.

Claims (9)

A plurality of gate lines and data lines, and transistors arranged to be connected to the gate lines and the data lines, respectively, on / off, and a plurality of pixel regions receiving image data signals from the data lines through the transistors and outputting images. In the method for inspecting the normal or bad pixel of the configured display device, Operating a transistor connected to a target pixel region to be inspected through an associated gate line; Charging the target pixel region to a predetermined pixel capacity with a pixel voltage through an associated data line of a transistor connected to the target pixel region to be inspected; Inputting a pixel capacitor charged in the target pixel region into an amplifier circuit unit installed inside or outside the display device; And inspecting the pixel capacity of the target pixel region which is amplified to a predetermined level by the amplifying circuit unit and outputted. The display apparatus of claim 1, further comprising determining whether the pixel is normal or defective by comparing the pixel capacitance returned from the target pixel region by using the reference charging capacitance of the normal pixel. Pixel inspection method. The method of claim 1, wherein the amplifying circuit unit is directly installed in a panel of the display device. The pixel inspection method of claim 1, wherein the normal or defective pixel is determined using the following equation. (Where CI _S : supply capacity, CL _L : line capacity, C _DM : parasitic capacity, CN _S : pixel reference capacity, CP _R : return capacity, n: number of pixels to be lit during pixel inspection, m: number of actual lit pixels ) The method of claim 4, wherein If the value of m, which is the actual number of illuminated pixels calculated through M, is equal to m = n, all pixels to be lit are judged to be normal, and when 0≤m <n, at least one or more pixels among all n pixels to be inspected. It is determined that an open occurs at, and when n <0, a short is generated in the pixel. Including a probe installed at a predetermined point so that the pixel capacity is amplified to a predetermined level when detecting the pixel capacity charged in each pixel area of the display device, it is used directly in the pixel inspection method of the display device of claim 1 Pixel inspection device of the display device. The display apparatus of claim 6, wherein the amplifying circuit unit is configured at an end portion of the probe probe contacting the test panel to amplify a predetermined voltage and a charging capacity input to the pixel region, the gate line, or the data line. Pixel inspection device. A plurality of gate lines and data lines into which a predetermined signal flows from a driver which selects each pixel to display an image signal; A transistor disposed on / off in connection with the gate line and the data line, respectively; A plurality of pixel areas receiving an image data signal from a data line through the transistor and outputting an image; And amplifying circuit unit for amplifying the pixel capacity charged in the pixel region to a predetermined level and outputting the pixel capacitor charged in the pixel region to an external pixel detecting apparatus when determining whether the pixel is normal or defective. The display apparatus of claim 8, wherein the amplifying circuit unit is configured to amplify a predetermined voltage and a charging capacity input to the pixel region, the gate line, or the data line.