KR20040010091A - Apparatus and Method for Registering Multiple Three Dimensional Scan Data by using Optical Marker - Google Patents

Abstract

PURPOSE: An apparatus and a method for automatically aligning 3D data are provided to automatically align 3D data without making damage to an object by using a non-contact type marker. CONSTITUTION: An apparatus for automatically aligning 3D data includes a marker generating section(12), a projection section(16), an image obtaining section(18), a driving section(20), a moving mechanism(22), an image input section(24), a marker control section(26), a projection control section(28), a microprocessor(30) and a buffer(32). The marker generating section(12) forms a pattern on an object(10) to be measured such that the image obtaining section(18) recognizes the pattern. The marker generating section(12) has plural marker output parts(14). The projection section(16) includes a light source, a pattern film and a lens so as to project predetermined patterns on the surface of the object(10).

Description

3D measurement data automatic alignment device using optical marker and its method {Apparatus and Method for Registering Multiple Three Dimensional Scan Data by using Optical Marker}

The present invention relates to an automatic alignment apparatus and method for three-dimensional measurement data using an optical marker, and more particularly, after obtaining the three-dimensional measurement data by measuring the shape of the three-dimensional measurement object at various positions and angles, these three-dimensional The present invention relates to an automatic alignment apparatus and method for three-dimensional measurement data using an optical marker for automatically aligning a relative position of measurement data in one coordinate system.

In general, the optical three-dimensional measuring apparatus was able to obtain three-dimensional data of the surface only for the area visible by the three-dimensional measuring apparatus when measuring a predetermined measurement object. Therefore, in order to measure other areas of the object that the 3D measuring device cannot see, the measuring object must be rotated or moved, or the measuring device itself is moved to position the visible part to be viewed. In addition, in order to obtain complete 3D data through the measurement data, a process of measuring a 3D measurement object in various directions and angles and arranging these data in one coordinate system is performed.

In this case, the reason for aligning to one coordinate system is generally defined based on a coordinate system in which each measurement data is fixed to the measuring device. In order to photograph an object from different angles, the 3D measuring device is moved to a different position and angle. This is because the 3D data measured at the moved position is defined in the coordinate system moved with the 3D measuring apparatus, and the data photographed at different positions are defined in different coordinate systems.

In order to match the coordinate system, it is necessary to know the amount of movement of the measuring device. The method of calculating the movement amount is a method of finding an absolute movement amount by moving the measuring device using a numerically controlled device and measured data information. There is a way to calculate the amount that the measuring device has moved with the bay. In the case of calculating the amount of movement of the measuring device using only the measured data information as described in the latter, the measurement data should be measured so that the measurement data overlap each other, and when the user overlaps each other in the measurement data measured at different angles. A corresponding point is input and coordinate transformation is performed so that the input corresponding points match each other.

At this time, the operation of manually inputting the corresponding points for the overlapping portions of the measurement data may cause an error when the corresponding points are input, depending on the operator, especially when there is no characteristic shape on the object surface. do. In addition, if the object is large in size and complex in shape, it is necessary to repeatedly perform tens to hundreds of measurements by changing the angle and position of the three-dimensional measuring device. May be accumulated, and incorrect alignment may be frequently performed due to a mistake of an operator or an incorrect corresponding point may be missed.

In order to compensate for the above drawbacks, it is possible to attach a small object capable of marking a marker or a target to a surface of a measuring object to be measured in recent years, thereby recognizing the marking of the marker or target. Therefore, a method of helping an operator input an accurate correspondence point has been developed. Furthermore, a technology for automating recognition of a correspondence point through an image processing algorithm has been developed.

That is, FIG. 1 is an exemplary view showing a state for attaching a conventional marker marker to a measurement object and measuring in three dimensions, in which the entire surface of the measurement object 2 having a predetermined three-dimensional shape is shown. A plurality of markers 4 are irregularly attached to each other, and the surface of the measurement object 2 to which each marker 4 is attached is repeatedly photographed to overlap each region.

When a plurality of pieces of measurement data are acquired by photographing the surfaces of the measurement objects 2 with the plurality of markers 4 attached thereto, a plurality of measurement data are acquired, and a corresponding point recognition process is performed by the markers 4 between the measurement data by a worker's hand. This is as shown in FIG.

As shown in FIG. 2, when the first and second measurement data I1 and I2 photographing regions overlapping the surface of the measurement object 2 are obtained, the first measurement data I1 is obtained. And the operator can search for a common number between the marker image data M1 and M2 included in the second measurement data I2 and match each other as a corresponding point, thereby aligning each measurement data.

On the other hand, a technique for automating the recognition of the corresponding point is to insert a different pattern to each marker, find a unique marker through the image processing, and to use the method to automatically arrange the different measurement data based on them.

However, in the case of the conventional point recognition technology of the measurement data using the marker, since the marker occupies a certain volume physically with respect to the measurement object, when the marker is attached to the surface of the measurement object, the part of the measurement object is obscured. The part covered by the marker has the disadvantage of being lost from the measurement data.

In this case, the data lost in the part where the marker was used can be estimated by filling in the interpolation method later, or the marker can be removed and measured again to acquire the measurement data of the lost part again. This not only takes a lot but also has a disadvantage of poor measurement accuracy.

SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and an object thereof is to use three-dimensional data measured at different angles without losing a measuring part of a measurement object by using an optically generated non-contact marker. It is an object of the present invention to provide an automatic alignment apparatus and method for three-dimensional measurement data using an optical marker that enables automatic alignment.

1 is a view showing an exemplary state for measuring a three-dimensional measurement by attaching a conventional marker marker to the measurement object,

FIG. 2 is a diagram illustrating a state in which different measurement data are arranged using a sticker marker as a reference mark;

3 is a view showing the configuration of an automatic alignment device for three-dimensional measurement data using an optical marker according to a first embodiment of the present invention;

4A to 4C are views illustrating a state in which two-dimensional image data is obtained by using an optical marker and a state in which three-dimensional measurement data is obtained by using a pattern pattern according to the first embodiment of the present invention. ,

5 is a diagram illustrating a state in which a two-dimensional position of a marker is extracted from two-dimensional image data obtained by turning on and off an optical marker according to a first embodiment of the present invention.

6 is a diagram illustrating a state in which the three-dimensional position of the marker is extracted from the lens center of the camera and the two-dimensional position of the marker;

7A and 7B are diagrams exemplarily illustrating an operation of obtaining a pair of markers by comparing triangles in different image data according to the first embodiment of the present invention;

8A to 8D are diagrams exemplarily illustrating a conversion operation of matching pairs of triangles at different positions in a triangle comparison in different image data according to the first embodiment of the present invention;

9 is a diagram illustrating an operation of obtaining a pair of markers by obtaining a virtual marker from different image data according to a first embodiment of the present invention;

10A and 10B are flowcharts for explaining an operation of a method for automatically aligning three-dimensional measurement data using an optical marker according to a first embodiment of the present invention;

FIG. 11 is a diagram illustrating a configuration of an apparatus for automatically arranging three-dimensional measurement data using an optical marker according to a second embodiment of the present invention; FIG.

12 is a flowchart for explaining an operation of a method for automatically aligning 3D measurement data using an optical marker according to a second embodiment of the present invention;

FIG. 13 is a flowchart for explaining an operation of a method for automatically aligning three-dimensional measurement data using an optical marker according to a third embodiment of the present invention;

14 is a view showing the configuration of an automatic alignment device for three-dimensional measurement data using an optical marker according to a fourth embodiment of the present invention;

15 is a view showing the configuration of an automatic alignment device for three-dimensional measurement data using an optical marker according to a fifth embodiment of the present invention;

16 is a view showing the configuration of an automatic alignment device for three-dimensional measurement data using an optical marker according to a sixth embodiment of the present invention;

17A and 17B are flowcharts for explaining an operation of a method for automatically aligning three-dimensional measurement data using an optical marker according to a sixth embodiment of the present invention;

18 is a diagram for explaining an error when aligning measurement data by a reference coordinate system;

19 is a diagram for explaining an error when aligning measurement data by an absolute coordinate system;

20 is a view showing the configuration of an automatic alignment device for three-dimensional measurement data using an optical marker according to a seventh embodiment of the present invention;

21A and 21B are flowcharts for explaining an operation of a method for automatically arranging three-dimensional measurement data using an optical marker according to a seventh embodiment of the present invention;

FIG. 22 is a diagram illustrating an example of an image obtained by using the large area image acquisition unit shown in FIG. 20;

FIG. 23 is a diagram illustrating an example of an image obtained by using the large area image acquisition unit and the image acquisition unit shown in FIG. 20;

24 is a view showing the configuration of an automatic alignment device for three-dimensional measurement data using an optical marker according to an eighth embodiment of the present invention;

25A and 25B are flowcharts for explaining an operation of an automatic alignment method of 3D measurement data using an optical marker according to an eighth embodiment of the present invention;

FIG. 26A is a diagram showing an example of an image obtained by using the pair of large area image acquisition units shown in FIG. 24;

FIG. 26B is a diagram showing an example of an image obtained by using the pair of large area image acquisition units and the image acquisition unit shown in FIG. 20;

27 is a schematic diagram for explaining the principle of the eighth embodiment of the present invention;

28 is a view showing the configuration of an automatic alignment device for three-dimensional measurement data using an optical marker according to a ninth embodiment of the present invention;

29 is a flowchart for explaining an operation of an automatic alignment method for 3D measurement data using an optical marker according to a ninth embodiment of the present invention;

30 is a flowchart for explaining an operation of a method for automatically aligning three-dimensional measurement data using an optical marker according to a tenth embodiment of the present invention;

31 is a diagram showing the configuration of the marker generating apparatus according to the eleventh embodiment of the present invention.

<Description of the symbols for the main parts of the drawings>

10: measurement object, 12: marker generator,

14: marker output, 16: projection,

18: image acquisition unit, 20: moving drive unit,

22: moving mechanism, 24: video input,

26: marker flashing control unit, 28: projection control unit,

30: microprocessor, 32: buffer.

According to the apparatus of the present invention to achieve the above object, in the three-dimensional data measuring device for aligning the three-dimensional measurement data obtained by photographing at various angles from a predetermined measurement object, a plurality of optical markers to the measurement object Optical marker generating means for projecting onto the surface of the object, three-dimensional projection means for projecting a pattern on the surface of the measurement object for three-dimensional measurement of the measurement object, and a marker projected by the optical marker generating means from the measurement object Image acquisition means for acquiring a two-dimensional image including a three-dimensional measurement data of a measurement object projected by the three-dimensional projection means, and a two-dimensional image and a three-dimensional measurement obtained by the image acquisition means; The three-dimensional position of the marker is extracted from the relationship with the data, and three from the position of the marker by each three-dimensional measurement data. Provided is an automatic alignment apparatus for three-dimensional measurement data using an optical marker, characterized in that the control means for performing a calculation to find the relative position of the dimensional measurement data.

According to the method according to the present invention to achieve the above object, the step of moving the image acquisition means to a position suitable for acquiring an image of a specific area of the measurement object, and the optical marker is driven by flashing the marker generating means Acquiring a two-dimensional image of a specific area of the measurement object on which the optical marker is projected by the image acquisition means, and causing a pattern pattern to be projected on the surface of the measurement object by the three-dimensional projection means; Acquiring three-dimensional measurement data of a specific region of the measurement object on which the pattern pattern is projected by the acquiring means; and three-dimensional position of the marker from the relationship between the two-dimensional image acquired by the image acquiring means and the three-dimensional measurement data. And extract the relative position of the three-dimensional measurement data from the position of the marker by each three-dimensional measurement data. Arthur provides a three-dimensional measurement data using a self-aligning manner, it characterized in that the optical markers consisting step of aligning each of the measurements.

Hereinafter, a first embodiment of the present invention configured as described above will be described in detail with reference to the accompanying drawings.

That is, FIG. 3 is a diagram illustrating a configuration of an apparatus for automatically arranging three-dimensional measurement data using an optical marker according to a first embodiment of the present invention.

As shown in FIG. 3, the apparatus for automatically arranging three-dimensional measurement data according to the first embodiment of the present invention includes a marker generator 12, a projection unit 16, an image acquisition unit 18, and a movement driver 20. , A moving mechanism 22, an image input unit 24, a marker blinking control unit 26, a projection control unit 28, a microprocessor 30, and a buffer 32.

The marker generator 12 is for projecting a pattern that can be recognized by the image acquisition unit 18 on the surface of the measurement target 10 to be optically measured, which is a front surface facing the measurement target 10. A plurality of marker outputs 14 are provided so that a plurality of optical markers are projected simultaneously with mutually irregular irradiation directions.

The plurality of marker output units 14 of the marker generator 12 preferably apply a laser pointer capable of projecting a plurality of red dots on the surface of the measurement object 10. In this case, it is possible to easily grasp the position of the point projected on the surface of the measurement object 10 in the image acquired by the image acquisition unit 18 such as a camera.

Here, the marker generator 12 is not limited to the laser pointer, and may fix a relative position between the measurement object to be measured and the corresponding marker generator 12 during the measurement, and the same position on the surface of the measurement object 10. The markers may be repeated to make the markers appear or disappear, and the optical depth may be so deep that any optical markers may be applied so that the markers may be well focused on the surface of the measurement object 10.

The marker generator 12 allows a plurality of optical markers to be arranged along the object periphery so that the optical markers are evenly projected on the surface of the measurement object 10, and the number of the optical markers is the size and measurement area of the measurement object 10. Can be changed according to. In addition, the marker generator 12 may be arranged such that a plurality of markers in various directions of the measurement object 10 in order to project the optical marker on the entire surface of the measurement object 12, the image acquisition unit During imaging by (18), it is fixed so that there is no relative movement with the measurement object 10.

In the same figure, the projection unit 16 projects a predetermined pattern or laser stripes on the surface of the measurement object 10 so that three-dimensional data can be obtained. This is performed by projecting a spatially coded light using a projection device such as an LCD projector onto the surface of the measurement object 10 or by projecting a laser light onto the surface of the measurement object 10 and performing 3D data through the image acquisition unit 18. As it can be obtained.

Here, the projection unit 16 preferably employs a slide projector, an electronic LCD projector, or a laser diode capable of projecting a laser stripe, which includes a light source capable of projecting a predetermined pattern, a pattern film, and a lens. The provided pattern film is transferred between the light source and the lens by a predetermined conveying means so that a series of stripes are projected onto the measurement object 10.

The pattern film is made of, for example, a film in which a stripe pattern having a plurality of sections such as five is printed in a horizontal direction. In addition, the pattern film of the projection unit 16 is a Korean Patent Application No. 2002-10839 filed by the applicant on February 28, 2002 (name of the invention: three-dimensional measuring apparatus and method using a multi-stripe pattern) As shown in, it is also possible to apply a film of the form in which a plurality of stripes are formed in each section. It is also possible to use a measuring device using a laser stripe.

In addition, since the projection unit 16 may damage the measurement data when the marker is projected onto the measurement object 10 at the time when the three-dimensional measurement is made in the optical 16-dimensional measurement, the marker during the measurement Is preferably not projected onto the measurement object 10.

The image acquisition unit 18 includes an image sensor capable of receiving an image, such as a CCD camera or a CMOS camera, and projects the marker from the marker generator 12 onto the surface of the measurement object 10 by an optical method. In this case, the image is obtained by photographing the image.

The image acquisition unit 18 may be provided as a separate camera with respect to the projection unit 16, but it is preferable to be integrated with the projection unit 16 to be embedded therein, which is projected from the optical marker. Since not only the acquisition of the 2D image but also the 3D image projected from the projection unit 16 can be obtained, not only the configuration of the equipment can be simplified, but also a separate calibration by using the same image acquisition means. It is possible to match an arbitrary point in the two-dimensional image with a corresponding point in the three-dimensional measurement data without correction.

Here, the image acquisition unit 18 is two-dimensional image data for each surface area of the measurement target 10 in synchronization with the flashing period of the optical marker of the marker generator 12 and the flashing period of the projection unit 16. And it is obtained by photographing the three-dimensional measurement data, as shown in Figures 4a to 4c.

As shown in FIG. 4A, when the marker generator 12 is turned on in the image acquisition unit 18 and a plurality of laser markers are projected onto the surface of the measurement object 10, a plurality of optical laser markers are provided. First image data 40 obtained by capturing a predetermined region of the measurement object on which RM is irregularly projected is obtained.

Next, as illustrated in FIG. 4B, the image acquisition unit 18 may turn off the marker generator 12 so that the laser marker is not projected on the surface of the measurement object 10. Second image data 42 consisting of only the image of 10) is obtained.

In addition, as illustrated in FIG. 4C, the image acquisition unit 18 may measure the object from the projection unit 16 while the marker generator 12 is turned off so that the laser marker is not projected onto the measurement object 10. 3D measurement data obtained by the stripe projected on (10) is obtained, which is obtained by the first to fifth stripes (PT1 to PT5) in which five sections are present at different intervals by the pattern film. The dimensional images are acquired in the form of first to fifth measurement data 44a to 44e which are photographed sequentially.

Here, although five intervals of the pattern film to be employed in the present invention is set to exist, the present invention is not limited thereto, and it is possible to increase the number to five or more.

The movement driver 20 may connect the projection unit 16 and the image acquisition unit 18 to the measurement object 10 in order to acquire an image of the measurement object 10 by driving control of the microprocessor 30. Drive to relatively move relative to the

The movement mechanism 22 is a structure for moving the projection unit 16 and the image acquisition unit 18 in a predetermined direction with respect to the measurement object 10 by receiving power from the driving of the movement driver 20. Equipped with.

Here, in the present invention, it is possible to move the projection unit 16 and the image acquisition unit 18 by the electric drive by applying the movement driver 20, the operator by manually operating the movement mechanism 22 It is also possible to be able to move arbitrarily.

In the same figure, the image input unit 24 is for receiving image data acquired from the image acquisition unit 18, and the marker flashing control unit 26 is controlled by the microprocessor 30, the marker generator ( The optical marker of 12) will blink.

The projection control unit 28 controls the feeding speed and the feeding direction of the pattern film constituting the projection unit 16 and controls the blinking of the light source projecting the pattern film.

The microprocessor 30 runs a dedicated software program for analyzing the measurement data acquired from the measurement object 10 and automatically aligning the measurement data with one coordinate system, at various angles from the image acquisition unit 18. The photographed 2D image data and the 3D measurement data are respectively inputted through the image input unit 24 and analyzed to perform calculation processing for automatically aligning the measured data photographed at various angles in one coordinate system.

Here, as shown in FIG. 5, the microprocessor 30 markers the first image data 40 including the laser marker RM and the second image data 42 not including the laser marker. Image processing 46 is performed to obtain the extracted third image data 46 only by the laser marker RM.

In this state, as illustrated in FIG. 6, the microprocessor 30 has a relationship between the camera lens center 50 of the image acquisition unit 18 and the two-dimensional image data 52 from which the position of the optical marker is extracted. By obtaining the three-dimensional coordinate value corresponding to the marker position by the bar, the coordinate values (a, b, c) for any three markers from the camera lens center 50 of the image acquisition unit 18 ) And the three-dimensional coordinate values (a ', b') corresponding to the positions of the markers by estimating arbitrary three-dimensional coordinate values (a ', b', c ') on the three-dimensional measurement data 54 positioned in a straight line. ', C') can be obtained.

When the projection unit 16 and the image acquisition unit 18 are integrated and installed together, the 3D coordinate value of the pixel corresponding to the position of the marker can be directly obtained, but the image acquisition unit 18 When the projection unit 16 is installed separately, the three-dimensional coordinate value corresponding to the marker may be obtained by performing calibration (coordinate system correction) between the projection unit 16 and the image acquisition unit 18. Through the above steps, the three-dimensional coordinate data of the position where the marker is located in the three-dimensional measurement data obtained from various angles can be known.

At this time, it is preferable that four to five markers are included in one measurement data, and two adjacent measurement data preferably include three or more common markers. This is because not only three or more points are required to define a unique position of the coordinate system in the three-dimensional space, but also a requirement for finding a corresponding marker to be described later.

In the present invention, when using the optical marker through the marker generator 12, it is also possible to use a different pattern for each marker so that the markers can be distinguished from each other. However, in this case, since the tens or hundreds of marker output units 14 must be able to project markers of different shapes, the construction and manufacture of the equipment may be complicated.

In the present invention, the microprocessor 30 in the relative position between the markers calculated from the respective three-dimensional measurement data in order to automatically align the three-dimensional measurement data of the adjacent area obtained by the continuous shooting of the measurement object 10 Information can be used to distinguish markers from each other. For example, if there are three points in space formed by markers, they can be used to form a triangle. In general, a triangle consisting of three different points has a different shape. By comparing, triangles can be distinguished from each other, and by using them, markers corresponding to the vertices of the triangle can be distinguished from each other. The process is described in more detail below.

That is, as shown in FIGS. 7A and 7B, when one measurement data 60 has M points obtained from the marker and the other measurement data 62 has N points obtained from the marker, generally one measurement data 60, may be configured to _N C ₃ different triangle _{M 3} C of each other, it is possible to configure the other triangle, and the other measured data (62). After constructing these triangles, a total of _M C ₃ × _N C ₃ comparisons are performed to find matching pairs of triangles.

First, as shown in FIG. 7A, in the microprocessor 30, a plurality of triangles T1 and T2 are formed by a point obtained by a marker included in one measurement data 60, and other measurement data ( A plurality of triangles T3 and T4 are formed by the points obtained by the markers included in 62).

Then, as shown in Fig. 7B, the microprocessor 30 matches a pair of triangles that coincide with each other in each of the triangles T1, T2 (T3, T4) obtained from the markers of the respective measurement data 60,62. (Ie T1 and T3).

Here, there may be various methods for determining whether the triangles coincide with each other, but by comparing the lengths of the sides, it is possible to find a pair of triangles. That is, the lengths of the three sides (a1, a2, a3) (b1, b2, b3) are obtained for each of the two triangles (T1, T3) to be compared, and if the lengths of each side are the same and the order of each side is the same, It is judged by a triangle.

First, the lengths of each side are arranged in descending order to find all three sides of the same triangle. If at least two such triangles are detected, the order of each side is examined, and the counterclockwise direction of the longest side of each triangle is examined. By comparing the lengths of the sides, triangles whose lengths coincide with each other are judged as pairs.

As described above, after distinguishing the corresponding markers from each measurement data, the measurement data is moved so that these markers are located at the same point in one coordinate system, and the measurement data 60 is used as the reference coordinate. Apply a transformation that matches a triangle in the reference coordinate system with the same triangle in other measurement data.

In other words, the transformation of matching two triangles at different positions is as shown in Figs. 8A to 8D.

As shown in FIG. 8A, when two triangles are congruent to each other and different positions are given, information on corresponding vertices and sides is already obtained while finding the congruence of the triangles.

As shown in FIG. 8B, a transformation is performed to match the positions of one vertex in two triangles. The reference coordinate system of one triangle is set to A, and the coordinate system B of the other triangles is set to A. As the process is performed, the relational expression of the translation matrix T is shown in Equation 1 below.

T = T (A1-B1)

Then, as shown in FIG. 8C, a rotation transformation is performed to match the sides including the matching vertices for the two triangles, and the rotation transformation matching any two vectors sharing a point is rotated. Equation 2 representing the matrix R1 is performed.

R1 = R (Θ1)

As described above, when the rotation transformation is performed, as shown in FIG. 8D, the relationship of the rotation matrix R2 for matching the same to one vertex is represented by Equation 3 below.

R2 = R2 (Θ2)

As described above, after making the coincident side as the axis of rotation and repairing at one vertex not included in the side, the rotation between the two segments allows the two triangles to coincide. Transform Matrix) (M) can be expressed as Equation 4 below.

In addition, one point (P) of the measurement data that each triangle was included can be moved to a new position by the following equation (5).

On the other hand, the microprocessor 30 is to perform a task to more accurately fit the data after adjusting the measurement data to the reference of the marker by the conversion based on the congruence of the triangle as described above, the marker Because the size of is not a mathematical point, some errors may occur, so the position of each other is adjusted based on the mesh data, not the marker data. This is called registering, and this process makes it possible to link each measurement data more accurately.

In the case where the predetermined point group data A is to be matched to the coordinate system of the specific point group data B, it is adjusted to the coordinate system of B by forcibly moving and rotating transformation A. At this time, if n points of A to be matched are P = {p _i } and corresponding points of B are Q = {x _i }, the minimum distances corresponding to P and Q can be minimized. The squared method is used to calculate the translation and rotational transformations, and to apply those transformations to A. Therefore, the average distance between the point group data A and B represented by P and Q is minimized, and the corresponding distance is found and the moving and rotational transformations are applied until the average distance of P and Q falls within the tolerance.

As a method of obtaining the corresponding point pairs described above, the point B closest to the normal point of each point A is obtained and these two points are used as the point pairs.

A transformation for minimizing the distance between two corresponding points, respectively, is obtained by using the least square method, and a function thereof is shown in Equation 6 below.

Q is a state vector of the register, and Q = [Q _R | Q _T ] ² . Q _R is a quaternion vector, where Q _R = [q ₀ q ₁ q ₂ q ₃ ] ^t (q≥0, q ₀ ² + q ₁ ² + q ₂ ² + q ₃ ² = 1) Q _T is a translation vector, which corresponds to Q _T = [q ₄ q ₅ q ₆ ] ^t .

In Equation 6, f (Q) represents the mean squared distance with x _i when R (Q _R ) and Q _T transform are applied to pi, and at this time, R (Q _R ) and We find Q _T by the least-squares method.

In Equation 6, R (Q _R ) may be represented by a 3 × 3 rotation matrix, which is defined by Equation 7 below.

In addition, in the case of defining a set P of measurement data as P = {pi} and defining a reference data set X as X = {xi}, the center volume of P and X is It is defined by the following formula (8).

In addition, a cross-covariance matrix (Σ _px ) of P and X is defined by Equation 9 below.

Here, a column vector (Δ) is formed using a Cyclic Components of the Anti-symmetric Matrix (A _ij ), which is a symmetric 4 × 4 matrix Q (Σ _px ). It is to be determined, as defined by the following equation (10).

Where I ₃ is a 3 × 3 identity matrix.

In the above equation, Q _T is an eigenvector corresponding to the maximum eigenvalue of Q (Σ _px ), and the quaternion (q ₀ , q ₁ ,) using the eigenvector value. q ₂ , q ₃ ) is obtained and substituted into Equation 7 to obtain a rotation transformation. On the other hand, Q _T (q ₄ , q ₅ , q ₆ ) can be obtained from Equation 11 below to adjust the volume center using R (Q _R ) obtained from Equation 7 described above.

As a result, the final matrix value is as shown in Equation 12 below.

In the microprocessor 30, when the corresponding markers are distinguished for the remaining three-dimensional measurement data obtained from the image acquisition unit 18, the microprocessor 30 moves the measurement data 60 as a reference coordinate. Get a matrix to allow for automatic sorting.

On the other hand, unlike the method shown in Figs. 8a to 8d, as a method of moving the measurement data after finding a congruent triangle, a method of matching the coordinate system using the least square method is used.

Since there is information on the corresponding vertices while determining whether the two triangles are congruent, if P and X correspond to the corresponding vertices in Equation 6, the optimum rotation and shift matrix T is given by Equation 13 below. Will be available.

The equation for moving the matrix as shown in Equation 13 above by applying the point group data P to match with the coordinate system is defined by Equation 14 below.

On the other hand, in the case of a method of finding a pair of triangles in the microprocessor 30, three or more markers should be included in an overlapping area of each measurement data, but when two markers exist in each measurement data, the measurement becomes difficult. In this case, it is possible to perform the differentiation of markers in other ways.

That is, since each measurement data including markers has three-dimensional shape information, it is possible to distinguish them even by using only two markers. As shown in FIG. 9, one measurement having overlapping regions is shown. If data 64 is formed of two points in space by two markers RM1 and RM2, and the other measurement data 66 is formed of two points in space by two markers RM3 and RM4, respectively, By using a vector perpendicular to each point, it is possible to distinguish different markers by comparing two points and two vectors for each measurement data 64 and 66 with each other.

On the other hand, when the number of markers projected for each measurement data is large and the arrangement of the markers is uniform, the microprocessor 30 may also find a wrong pair. In this case, an additional reference point is created and compared using a marker and three-dimensional data. For example, if there are three common points, a triangle is formed from these points, a perpendicular line perpendicular to the triangle is drawn at the center of gravity of the triangle, and the fourth reference point can be obtained by finding the intersection point of the water line and the three-dimensional data. . Then, the marker or the average vertical vector information of the surface of the object around the marker can be used to find a match.

If there are only two common points in the measurement data, draw a straight line that forgets these two points, draw a circle on a plane perpendicular to the straight line at the midpoint of the straight line, and find the intersection of the circle and the measured data. A fifth reference point can be obtained.

According to a preferred embodiment of the present invention, in addition to the method described above, it is possible to adopt and use any method for automatically performing alignment of three-dimensional measurement data by making additional reference points around the marker. .

In FIG. 3, the buffer 32 registers the marker information newly obtained by the automatic alignment process for the three-dimensional measurement data of the microprocessor 30 in each register.

Next, an operation according to the first embodiment of the present invention made as described above will be described in detail with reference to the flowcharts of FIGS. 10A and 10B.

First, in a state in which a predetermined measurement target 10 is seated on the marker generator 12 side, the microprocessor 30 drives the movement driver 20 to operate the movement mechanism 22, thereby projecting the projection portion 16. ) Is moved to a position suitable for the measurement of the measurement object (10) (step S10).

In this state, the microprocessor 30 controls the marker blinking control unit 26 to turn on the plurality of marker output units 14 included in the marker generator 12 to display a plurality of surfaces on the surface of the measurement object 10. The marker is projected irregularly (step S11).

In the state where the optical marker from the marker generator 12 is projected onto the measurement object 10, the image acquisition unit 18 photographs a specific area of the measurement object 10 to include the two-dimensional image including the optical marker. When obtaining the, the microprocessor 30 receives the 2D image data acquired by the image acquisition unit 18 through the image input unit 24 (step S12).

Then, the microprocessor 30 controls the marker blinking control unit 26 so that the marker generator 12 is turned off so that the optical marker cannot be projected onto the measurement object 10 (step S13). In this state, when the same region of the measurement object 10 is taken from the image acquisition unit 18 to acquire a 2D image not including the optical marker, the 2D image data is received through the image input unit 24. (Step S14).

In addition, the microprocessor 30 controls the projection control unit 28 to operate the projection unit 16 while the marker generator 12 is turned off so that the optical marker is not projected. ), A predetermined pattern (for example, a stripe pattern of multiple sections or multiple stripe patterns each having different intervals) for three-dimensional measurement is projected onto the surface of the measurement object 10.

In this case, when the image acquisition unit 18 photographs the measurement object 10 on which the pattern pattern is projected to obtain three-dimensional measurement data, the microprocessor 30 transmits the three-dimensional measurement data through the image input unit 24. Is input (step S15).

In this state, the microprocessor 30 extracts the two-dimensional position of the marker by image processing the two-dimensional image data including the optical marker and the two-dimensional image data not including the marker (step S16).

Then, the microprocessor 30 uses coordinates extracted from the 2D image data and coordinate values of any three markers in the 2D image data from the center of the camera lens of the image acquisition unit 18. By estimating an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker is found (step S17).

On the other hand, the microprocessor 30 determines whether the register of the buffer 32 is empty (step S18).

As a result of the determination, if it is determined that the register of the buffer 32 is not empty, the previous three-dimensional measurement data registered in the register of the buffer 32 with respect to the three-dimensional position of the marker found in step S17 (that is, the current By comparing the markers according to the three-dimensional measurement data of the () and the overlapping markers are searched (step S19).

When the marker is matched by comparing the optical marker included in the current three-dimensional measurement data with the marker registered in the register of the buffer 32 by the searching process of the marker as described above, the microprocessor 30 ) Obtains a matrix for movement from the positions of the paired markers in each of the three-dimensional measurement data (step S20), and uses the position of the three-dimensional measurement data registered in the register of the buffer 32 as a reference coordinate system. The measurement data of is moved (step S21).

As a result, the microprocessor 30 registers the newly found marker from the current measurement data into the register of the buffer 32 and aligns it with another marker in the previous measurement data (step S22).

Then, the microprocessor 30 determines whether or not automatic alignment with respect to the three-dimensional measurement data obtained for the measurement object 10 has been completed (step S23).

As a result of the determination, when it is determined that the automatic alignment of the three-dimensional measurement data obtained from the measurement object 10 is not completed, the control proceeds to the step S10 and the movement mechanism under the drive by the movement driver 20 ( 22) is operated to repeatedly perform the process from step S10 to step S22 while moving the projection unit 16 and the image acquisition unit 18 to a suitable position.

Next, a second embodiment of the present invention will be described in detail with reference to the accompanying drawings.

That is, FIG. 11 is a view showing the configuration of an apparatus for automatically arranging three-dimensional measurement data using an optical marker according to a second embodiment of the present invention. In the second embodiment of the present invention, the same functions as those of the first embodiment and The same reference numerals are assigned to the components that perform the operations, and detailed description thereof will be omitted.

3D measurement data automatic alignment apparatus according to the second embodiment of the present invention is a marker generator 70, the projection unit 16, the image acquisition unit 18, the movement driver 20, the movement mechanism 22, the image The input part 24, the marker individual flashing control part 74, the projection control part 28, the microprocessor 76, and the buffer 32 are comprised.

The marker generator 70 is for projecting a pattern that can be recognized by the image acquisition unit 18 on the surface of the measurement object 10 to be optically measured, which is a front surface facing the measurement object 10. A plurality of marker outputs 72 are provided for projecting a plurality of optical markers over a mutually irregular irradiation direction.

The marker generator 70 acquires the image from the image acquisition unit 18 by sequentially lighting the plurality of marker output units 72 up to the 1st to the Nth one by one under the control of the individual marker blinking controller 74. Each different image is projected by one different marker.

The marker individual flashing control unit 74 controls the plurality of marker output units 72 provided in the marker generator 70 to be sequentially and individually blinked and controlled in a predetermined order by the control of the microprocessor 76. do.

The microprocessor 76 receives and analyzes two-dimensional image data and three-dimensional measurement data photographed at various angles from the image obtaining unit 18 through the image input unit 24 to analyze the measured data photographed at various angles. The calculation process for automatically aligning to one coordinate system is performed. This is performed by setting the image photographed in the state where all the markers are turned off in the image acquisition unit 18 as the base image, and sequentially from 1st to Nth. As a result, a plurality of images photographed while the markers are turned on are compared, respectively, and the two-dimensional positions of the markers are searched and extracted.

Next, the microprocessor 76 compares the two-dimensional measurement data from which the position of the marker is extracted with the three-dimensional measurement data to search for the three-dimensional position of the marker, and searches for a paired marker to move accordingly. The function of obtaining the matrix and the function of moving the 3D measurement data to the reference coordinate system are performed in the same manner as the function shown in the first embodiment of the present invention.

Next, an operation according to another embodiment of the present invention made as described above will be described in detail with reference to the flowchart of FIG. 12.

First, in a state where a predetermined measurement target 10 is seated on the marker generator 70 side, the microprocessor 76 drives the movement driver 20 to operate the movement mechanism 22, thereby projecting the projection portion 16. ) Is moved to a position suitable for the measurement of the measurement object (10) (in step S30).

In this state, the microprocessor 76 acquires the image data photographed from the image acquisition unit 18 as the base image, while turning off all the optical markers from the marker generator 70.

Next, the microprocessor 76 controls the marker individual blink control unit 74 to light the first designated marker output unit 72 among the plurality of marker output units 72 provided in the marker generator 70. The first marker is projected onto the surface of the measurement object 10 (step S31), and the image captured by the image acquisition unit 18 is obtained as first image data (step S32).

In addition, the microprocessor 76 controls the marker individual flashing control unit 74 to designate the Nth, i.e., the second, designated marker in a predetermined order among the plurality of marker output units 72 of the marker generator 70. The output unit is turned on so that the second optical marker is projected onto the measurement object 10 (step S33), and the image captured by the image acquisition unit 18 is acquired as the Nth, that is, the second image data (step S34). ).

In this state, the microprocessor 76 determines whether the marker included in the image photographed in the step is the last marker among a plurality of predetermined markers (step S35).

As a result of the determination, when it is determined that the marker included in the image photographed by the image acquisition unit 18 is not the last marker among a plurality of markers, the operations of the step S33 and the step S34 are repeatedly performed to perform the marker generator 70. A plurality of marker outputs 72) are sequentially turned on in order of 3, 4, ... Nth order so that the optical marker is projected onto the measurement object 10, and each marker is turned on individually. The individual images captured by the image acquisition unit 18 are acquired as 3, 4, ... Nth images.

On the other hand, when the microprocessor 76 determines that the marker included in the image acquired from the image acquisition unit 76 is the last marker, the marker generator 70 is turned off so that the optical marker is not projected. The projection control unit 28 is controlled to operate the projection unit 16, and a predetermined pattern (for example, a stripe pattern or a multi-stripe pattern of a plurality of sections each having different intervals) for the three-dimensional measurement from the projection unit 16. This is projected onto the surface of the measurement object 10.

At this time, when the image acquisition unit 18 photographs the measurement object 10 on which the pattern pattern is projected, and acquires the 3D measurement data, the microprocessor 76 transmits the 3D measurement data through the image input unit 24. Is input (step S36).

Meanwhile, the microprocessor 76 compares the first to Nth image data photographed with the first to Nth markers sequentially and individually turned on with the basic images obtained with the markers unlit, respectively. By searching the stepped area formed by the optical marker, the two-dimensional position of each marker can be easily extracted (step S37).

Then, the microprocessor 76 detects the three-dimensional position of the marker by comparing the two-dimensional position of the marker extracted by the comparison of the two-dimensional image with the three-dimensional measurement data, and the three-dimensional position of the marker. The paired markers are retrieved from each of the adjacently photographed image data to obtain a moving matrix accordingly, and the three-dimensional measurement data is moved to the reference coordinate system (step S38).

On the other hand, the microprocessor 76 determines whether the automatic alignment of the three-dimensional measurement data obtained for the measurement object 10 is completed (step S39).

As a result of the determination, when it is determined that the automatic alignment of the three-dimensional measurement data obtained from the measurement object 10 is not completed, the control returns to the step S30 to move the control mechanism under the drive by the movement driving unit 20 ( 22 is operated to repeatedly execute the process from step S30 to step S38 while moving the projection unit 16 and the image acquisition unit 18 to a suitable position.

Next, a third embodiment of the present invention will be described in detail with reference to the accompanying drawings.

That is, the configuration of the 3D measurement data automatic alignment device according to the third embodiment of the present invention is the same as the component shown in FIG.

However, in the second embodiment of the present invention, when the N markers are individually projected by the marker generator 70, the N images must be taken separately, but in the third embodiment, the marker generator 70 The number of times the image is taken can be reduced to log ₂ (N + 1) by grouping and lighting the generated N markers in groups to binarize them.

The marker individual flashing control unit 74 divides the plurality of marker output units 72 installed in the marker generating unit 70 into groups for binarization under the control of the microprocessor 76, and markers corresponding to the groups. Control to selectively light only the output section.

The marker individual flashing control unit 74 may use 16 markers to binarize the markers when 16 markers are generated, for example, the number of the marker output units 72 installed in the marker generator 70 is 16. It is set by dividing it into four groups redundantly.

That is, the markers included in the first group correspond to the ninth to sixteenth markers, and the markers included in the second group correspond to the fifth to eighth markers, the thirteenth to sixteenth markers, and the third group. Included markers correspond to 3,4,7,8,11,12,15,16 markers, and markers included in the fourth group are even (2,4,6,8,10,12,14, The sixth) corresponds to the marker, this relationship is as shown in Table 1 below.

One 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 First video 0 0 0 0 0 0 0 0 One One One One One One One One 2nd video 0 0 0 0 One One One One 0 0 0 0 One One One One 3rd video 0 0 One One 0 0 One One 0 0 One One 0 0 One One 4th video 0 One 0 One 0 One 0 One 0 One 0 One 0 One 0 One

"0" indicates that the marker is turned off, and "1" indicates that the marker is turned on.

As shown in Table 1, the first marker is always off, while the 16th marker is always lit so that all markers have their own unique lighting values.

The microprocessor 76 controls the marker individual flashing control unit 76 so that the markers divided by preset groups are sequentially turned on, and the number corresponding to the number of groups of markers acquired through the image acquisition unit 18. By comparing the image data of the two-dimensional position of the marker is extracted.

Herein, when the microprocessor 76 sequentially lights up 16 markers by group as shown in Table 1 to acquire first to fourth image data, the microprocessor 76 recognizes the tenth marker as a binary number "1001". In addition, 16 different unique IDs, that is, two-dimensional position values, may be detected for the 16 markers, such as to recognize the marker 13 as the binary "1100". At this time, since the first marker is always turned off, the marker 1 cannot be used and a total of 15 markers can be used.

Accordingly, if 10 image data is acquired, 1024 different unique IDs can be distinguished, and 1023 markers can be substantially used.

In addition, the microprocessor 76 compares the two-dimensional measurement data from which the position of the marker is extracted with the three-dimensional measurement data to search for the three-dimensional position of the marker, and searches for a paired marker to obtain a moving matrix accordingly. The function of obtaining and the function of moving the three-dimensional measurement data to the reference coordinate system are performed in the same manner as the function shown in the first embodiment of the present invention.

Next, an operation according to the third embodiment of the present invention made as described above will be described in detail with reference to the flowchart of FIG.

First, as shown in Table 1, there are 16 marker output units 72 installed in the marker generator 70 to project a total of 16 markers, and a total of four two-dimensional image data are acquired by the image acquisition unit 18. Acquisition will be described as an example.

First, in a state where a predetermined measurement target 10 is seated on the marker generator 70 side, the microprocessor 76 drives the movement driver 20 to operate the movement mechanism 22, thereby projecting the projection portion 16. ) Is moved to a position suitable for the measurement of the measurement object (10) (step S40).

In this state, the microprocessor 76 controls the marker individual flashing control unit 74 so that the markers (9th to 16th markers) included in the first group among the group-specific markers preset by the marker generator 70 are set. The marker output unit 72 is turned on to be projected (step S41), and the first image data photographed by the image acquisition unit 18 is acquired through the image input unit 24 (step S42).

Next, the microprocessor 76 controls the marker individual flashing control unit 74 so that the marker 5 included in the Nth group, that is, the second group, among the group-specific markers preset by the marker generating unit 70. The marker output unit 72 is turned on so as to project the first to eighth, thirteenth to sixteenth) (step S43), and the N-th image data photographed by the image acquisition unit 18, that is, the second image data Acquisition (step S44).

At this time, the microprocessor 76 determines whether the group of the markers included in the image data obtained in the step is the last of the preset groups (step S45).

As a result of the determination, when the microprocessor 76 determines that the group of the markers included in the image data acquired from the image acquisition unit 18 is not the last group, the microprocessor 76 proceeds to step S43 again and performs the process from step S44. By repeatedly performing, the third group of markers (3, 4, 7, 8, 1, 12, 15, 16th marker) is turned on and the third image data is acquired, and then the fourth group of markers (2, 4th, 6th, 8th, 10th, 12th, 14th, and 16th markers) are turned on to obtain fourth image data.

Meanwhile, when it is determined that the group of markers included in the image data acquired from the image acquisition unit 18 is the last group according to the determination result of step S45, the marker generator 70 is turned off to project the optical marker. In the non-state state, the projection control unit 28 is controlled to operate the projection unit 16, and predetermined pattern patterns for three-dimensional measurement (for example, stripes patterns of plural sections having different intervals from the projection unit 16). Or multiple stripes pattern) is projected onto the surface of the measurement object 10.

In this case, when the image acquisition unit 18 photographs the measurement object 10 on which the pattern pattern is projected to obtain 3D measurement data, the microprocessor 76 may transmit the 3D measurement data through the image input unit 24. Is input (step S46).

Then, the microprocessor 76 compares the binarization information for the first to Nth images, that is, the first to fourth image data, acquired from the image acquisition unit 18, namely, the unique ID of each marker. , The two-dimensional position is extracted (step S47).

On the other hand, the microprocessor 76 detects the three-dimensional position of the marker by comparing the two-dimensional position and the three-dimensional measurement data of the marker extracted by comparing the binary data of the two-dimensional image data, and the three of such markers The paired markers are searched for in the adjacent image data obtained from the dimensional position to obtain a moving matrix accordingly, and the 3D measurement data is moved to the reference coordinate system (step S48).

On the other hand, the microprocessor 76 determines whether the automatic alignment of the three-dimensional measurement data obtained for the measurement object 10 is completed (step S49).

As a result of the determination, if it is determined that the automatic alignment of the three-dimensional measurement data obtained from the measurement object 10 is not completed, the control returns to the step S40 and the movement mechanism (under the drive by the movement driver 20) 22) is operated to repeat the process from step S40 to step S48 while moving the projection unit 16 and the image acquisition unit 18 to a suitable position.

Next, a fourth embodiment of the present invention will be described in detail with reference to the accompanying drawings.

The configuration of the apparatus for automatically arranging three-dimensional measurement data according to a fourth embodiment of the present invention is as shown in FIG. 14, and as shown in the drawing, the measurement object 10, the projection unit 16, and image acquisition. The unit 18, the movement driver 20, the movement mechanism 22, the image input unit 24, the projection control unit 28, the buffer 32, the marker generator 80, the marker individual flashing control unit 84, the micro It is configured to include a processor (86).

Here, the same reference numerals are assigned to components that perform the same functions and operations as those of the first embodiment shown in FIG. 3, and detailed description thereof will be omitted to avoid duplicate descriptions.

The marker generator 80 is for projecting a pattern that can be recognized by the image acquisition unit 18 on the surface of the measurement target 10 to be optically measured, which is a front surface facing the measurement target 10. A plurality of marker outputs 82 are provided to allow a plurality of optical markers to be projected with mutually irregular irradiation directions.

The marker generator 80 is configured to selectively blink a plurality of marker output units 82 under the control of the marker individual flashing controller 84.

The marker individual flashing controller 84 individually controls the flashing of the plurality of marker output units 82 provided in the marker generator 80 under the control of the microprocessor 86.

The microprocessor 86 runs a dedicated software program for analyzing the measurement data obtained from the measurement object 10 and automatically aligning the measurement data with one coordinate system, at various angles from the image acquisition unit 18. The photographed 2D image data and the 3D measurement data are respectively inputted and analyzed through the image input unit 24, and an operation for automatically arranging the measured data photographed at various angles into a single coordinate system is performed. The operation procedure is the same as that of the microprocessor operation in the first embodiment described above.

However, the microprocessor 86 according to the fourth exemplary embodiment of the present invention acquires two-dimensional image data and three-dimensional measurement data of one region of the measurement object 10 and performs calculation processing on the other. When the marker generator 80 is turned on to acquire the 2D image data and the 3D measurement data for the area, the markers projected on the area where the image and the measurement data have already been acquired are repeatedly repeated at a predetermined period (for example, about 0.5 seconds). On the other hand, the marker projected onto the remaining area controls the marker individual flashing control unit 84 to maintain the lighting state.

Alternatively, the marker projected on the area where the image and the measurement data have already been acquired may be kept on while the marker projected on the remaining area may be repeatedly blinked at a predetermined period.

In this way, by varying the flashing state of the marker projected on the area where the image and the measurement data have already been acquired and the marker projected on the remaining area, the examiner in charge of the measurement visualizes the area where the image and the measurement data have been acquired and the remaining area. It can be easily confirmed, and it is possible to facilitate the measurement through this.

Next, a fifth embodiment of the present invention will be described in detail with reference to the accompanying drawings.

The configuration of the apparatus for automatically arranging three-dimensional measurement data according to a fifth embodiment of the present invention is as shown in FIG. 15, and as shown in the drawing, the measurement object 10, the projection unit 16, and image acquisition. Unit 18, movement driver 20, movement mechanism 22, image input unit 24, projection control unit 28, buffer 32, marker generator 90, and marker individual flashing / color control unit 94 And a microprocessor 96.

Here, the same reference numerals are assigned to components that perform the same functions and operations as those of the first embodiment shown in FIG. 3, and detailed description thereof will be omitted to avoid duplicate descriptions.

The marker generator 90 is for projecting a pattern that can be recognized by the image acquisition unit 18 on the surface of the measurement target 10 to be optically measured, which is a front surface facing the measurement target 10. A plurality of marker output sections 92 are provided to allow a plurality of optical markers to be projected with mutually irregular irradiation directions.

Here, the marker generator 90 is configured such that each marker output unit 92 selectively switches at least two different colors of light under the control of the individual blinker / color controller 94 to irradiate the light. have. For example, the marker output unit 92 may be configured to include light sources of at least two or more different colors and selectively turn on the light sources to selectively generate light of different colors.

The marker individual flashing / color control unit 94 controls the blinking and individual colors of the plurality of marker output units 92 provided in the marker generator 90 by the control of the microprocessor 96.

The microprocessor 96 runs a dedicated software program for analyzing the measurement data acquired from the measurement object 10 and automatically aligning the measurement data with one coordinate system, and at various angles from the image acquisition unit 18. The photographed 2D image data and the 3D measurement data are respectively inputted and analyzed through the image input unit 24 to perform arithmetic processing for automatically aligning the measured data photographed at various angles in a single coordinate system. The operation procedure is the same as that of the microprocessor operation in the first embodiment described above.

However, the microprocessor 96 according to the fifth embodiment of the present invention acquires two-dimensional image data and three-dimensional measurement data of one region of the measurement object 10 and performs calculation processing on the other. When the marker generator 90 is turned on to acquire two-dimensional image data and three-dimensional measurement data for an area, the colors of the markers projected on the area where the image and the measurement data have already been acquired and the markers projected on the remaining area are projected differently. The marker individual flashing / color control unit 94 is controlled.

In this way, by differentiating the color of the marker projected on the area where the image and the measurement data have already been acquired and the marker projected on the remaining area, the examiner in charge of the measurement visually checks the area where the image and the measurement data have been acquired and the remaining area. It can be easily confirmed, and this facilitates measurement convenience.

Next, a sixth embodiment of the present invention will be described in detail with reference to the accompanying drawings.

The configuration of the apparatus for automatically arranging three-dimensional measurement data according to the sixth embodiment of the present invention is as shown in FIG. 16, and as shown in the same drawing, the measurement object 10, the marker generator 12, and the projection unit. 16, image acquisition unit 18, image input unit 24, marker flashing control unit 26, projection control unit 28, buffer 32, rotation table 100, rotation drive unit 102, rotation mechanism ( 104, microprocessor 106.

Here, the same reference numerals are assigned to components that perform the same functions and operations as those of the first embodiment shown in FIG. 3, and detailed description thereof will be omitted to avoid duplicate descriptions.

The rotary table 100 has a structure that can be rotated while the measurement object 10 is placed on the upper plate, and a plurality of marker generators 12 are provided together with the measurement object 10 at the outer circumference of the upper plate. It is fixed so that it can be rotated integrally.

The rotation drive unit 102 performs a drive for rotating the rotary table 100 by a target angle by the drive control of the microprocessor 106, the rotation mechanism 104 is driven to drive the rotation drive unit 102. It receives the power according to the structure has a structure for rotating the rotary table 100 by a target angle.

In this case, in the sixth embodiment of the present invention, the case in which the rotary table 100 is rotated by the electric drive using the rotary drive unit 102 as described above will be described as an example. However, the rotary mechanism 104 is manually described. It is also possible to configure so that the operator can be moved arbitrarily.

In addition, as long as the system capable of moving while the marker generator and the measurement target are fixed, anything other than the rotary table 100 may be possible.

The microprocessor 106 runs a dedicated software program for analyzing the measurement data obtained from the measurement object 10 and automatically aligning the measurement data with one coordinate system, and at various angles from the image acquisition unit 18. The photographed 2D image data and the 3D measurement data are respectively inputted and analyzed through the image input unit 24 to perform arithmetic processing for automatically aligning the measured data photographed at various angles in a single coordinate system. The operation procedure is the same as that of the microprocessor operation in the first embodiment described above.

However, the microprocessor 106 according to the sixth embodiment of the present invention acquires the two-dimensional image data and the three-dimensional measurement data for any one area of the measurement object 10 and performs a calculation process on the other. When the 2D image data and the 3D measurement data of the area are to be obtained, the rotation driver 102 is controlled to rotate the rotation table 100.

Now, the operation of the apparatus for automatically arranging three-dimensional measurement data according to the sixth embodiment of the present invention configured as described above will be described in detail with reference to the flowcharts of FIGS. 17A and 17B.

First, in a state in which the measurement object 10 is seated on the top plate of the rotary table 10, the microprocessor 106 drives the rotary driver 102 to operate the rotary mechanism 104, thereby rotating the rotary table 100. ) Is rotated at a predetermined angle to rotate the measurement object 10 to a position suitable for measurement (step S50).

In this state, the microprocessor 106 controls the marker blinking control unit 26 to turn on the plurality of marker output units 14 provided in the marker generator 12 so that the microprocessor 106 controls a plurality of markers on the surface of the measurement object 10. The marker is projected irregularly (step S51).

In the state where the optical marker from the marker generator 12 is projected onto the measurement object 10, the image acquisition unit 18 photographs a specific area of the measurement object 10 to include the two-dimensional image including the optical marker. When obtaining the, the microprocessor 106 receives the 2D image data acquired by the image acquisition unit 18 through the image input unit 24 (step S52).

Then, the microprocessor 106 controls the marker blinking control unit 26 so that the marker generator 12 is turned off so that the optical marker cannot be projected onto the measurement object 10 (step S53). In this state, when the same region of the measurement object 10 is taken from the image acquisition unit 18 to acquire a 2D image not including the optical marker, the 2D image data is received through the image input unit 24. (Step S54).

In addition, the microprocessor 106 controls the projection control unit 28 to operate the projection unit 16 while the marker generator 12 is turned off so that the optical marker is not projected. ), A predetermined pattern (for example, a stripe pattern of multiple sections or multiple stripe patterns each having different intervals) for three-dimensional measurement is projected onto the surface of the measurement object 10.

At this time, when the image acquisition unit 18 photographs the measurement object 10 on which the pattern pattern is projected to obtain three-dimensional measurement data, the microprocessor 106 transmits the three-dimensional measurement data through the image input unit 24. Is input (step S55).

In this state, the microprocessor 106 image-processes the 2D image data including the optical marker and the 2D image data not including the marker to extract the 2D position of the marker (step S56).

The microprocessor 106 then uses the markers extracted from the two-dimensional image data and coordinate values for any three markers in the two-dimensional image data from the camera lens center of the image acquisition unit 18. By estimating an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker is found (step S57).

On the other hand, the microprocessor 106 determines whether the register of the buffer 32 is empty (step S58).

As a result of the determination, if it is determined that the register of the buffer 32 is not empty, the microprocessor 106 determines the previous three-dimensional registration in the register of the buffer 32 with respect to the three-dimensional position of the marker found in step S57. By comparing markers according to the measurement data (that is, data overlapping with the current three-dimensional measurement data), the markers to be matched with each other are searched (step S59).

When the marker is matched by comparing the optical marker included in the current three-dimensional measurement data with the marker registered in the register of the buffer 32 by the searching process of the marker as described above, the microprocessor 106 ) Obtains the position transformation matrix for movement from the position of the paired markers in each of the three-dimensional measurement data (step S60), and the position of the three-dimensional measurement data registered in the register of the buffer 32 as a reference coordinate system. To move the current measurement data (step S61).

As a result, the microprocessor 106 registers the newly found marker from the current measurement data in the register of the buffer 32 to align it with another marker in the previous measurement data (step S62).

Then, the microprocessor 106 determines whether the automatic alignment of the three-dimensional measurement data obtained for the measurement object 10 is completed (step S63).

As a result of the determination, when it is determined that the automatic alignment of the three-dimensional measurement data obtained from the measurement object 10 is not completed, the microprocessor 106 returns to the step S50 and rotates by the rotation driver 102. By operating the mechanism 104 to rotate the rotary table 100 by a predetermined angle, the two-dimensional image and the three-dimensional measurement through the projection unit 16 and the image acquisition unit 18 with respect to another measurement area of the measurement object 10. Enable data acquisition.

Thereafter, the control unit 106 repeatedly executes the processes from step S50 to step S62.

As described above, the sixth embodiment of the present invention is configured to move the measurement object, and the measurement object is relatively smaller in size than the first embodiment of the present invention configured to move the projection unit and the image acquisition unit. Suitable for acquiring and sorting dimensional measurement data.

At this time, the marker generator and the measurement object should not have a relative movement until the measurement is completed, the marker generator is fixed to the rotating table to prevent the relative movement.

On the other hand, the alignment method using the reference coordinate system used in the embodiments of the present invention described above, the alignment of the three-dimensional measurement data of the previous measurement area stored in the register of the buffer when the three-dimensional measurement data is aligned as the reference coordinate system Since the three-dimensional measurement data of the newly measured area is moved and pasted, the larger the number of measurement areas is, the larger the number of measurement areas is. Can be very large.

For example, (a) and (b) of FIG. 18 show data obtained by measuring different adjacent measurement areas having overlapping boundaries with respect to the same measurement object, respectively. Data obtained through the image acquisition unit has an error value as shown by the solid line.

Accordingly, when one of the measurement data in FIGS. 18A and 18B is used as the reference coordinate system, the other data is moved and pasted to the reference coordinate system. Since the error values between the measurement data are added to each other, the measurement data having the larger error value is obtained as shown in the solid line shown in FIG.

That is, there is a concern that the error becomes larger as the number of measurement areas increases because the area to be measured is wide.

Thus, in the seventh and eighth embodiments of the present invention, a method of aligning the position of three-dimensional measurement data with an absolute coordinate system rather than a reference coordinate system is proposed.

Here, in the absolute coordinate system, unlike the reference coordinate system, three-dimensional position data of the entire measurement area of the measurement object is used, and an error value of the overall measurement data is an image acquisition device that acquires an image of the entire measurement area of the measurement object. It will not be out of the error range of.

For example, suppose that (a) and (b) of FIG. 19 each represent data obtained by measuring adjacent different measurement areas having overlapping boundaries with respect to the same measurement object, as shown in (c) of FIG. 19. When the measurement data of (a) and (b) of FIG. 19 are moved and pasted to the absolute coordinate system, as shown in FIG. 19 (d), the measurement data is obtained by adding the error range of the absolute coordinate system and the error range of the measuring device. Since the value does not deviate, it is possible to prevent the error from being amplified due to the precision problem of the image acquisition unit as described above.

First, a seventh embodiment of the present invention will be described in detail with reference to the accompanying drawings.

The configuration of the apparatus for automatically arranging three-dimensional measurement data according to the seventh embodiment of the present invention is as shown in FIG. 20, and as shown in the drawing, the measurement object 10, the marker generator 12, and the projection unit. 16, the image acquisition unit 18, the movement driver 20, the movement mechanism 22, the marker flashing control unit 26, the projection control unit 28, the buffer 32, the large area image acquisition unit 110, The image input unit 112, the second moving driver 114, the second moving mechanism 116, the microprocessor 118, and the reference object 120 are configured to be included.

Here, the same reference numerals are given to components that perform the same functions and operations as those of the first embodiment shown in FIG. 3, and detailed descriptions thereof will be omitted to avoid overlapping descriptions.

The large area image acquisition unit 110 includes an image sensor capable of receiving an image, such as a CCD camera or a CMOS camera, and projects the marker from the marker generator 12 to the surface of the measurement object 10 by an optical method. In this case, the image is obtained by capturing the image. The image is acquired separately from the image acquisition unit 10 and obtained by capturing the image of the entire measurement area of the measurement object 10.

Here, it is preferable that the large area image acquisition unit 110 employ an image sensor having a relatively higher precision than the image acquisition unit 10 that acquires the image of the segmented measurement area.

The image input unit 112 is for receiving image data obtained from the image acquisition unit 18 and the large area image acquisition unit 110.

The second movement driver 114 performs a drive for relatively moving the large area image acquisition unit 110 with respect to the measurement object 10 by driving control of the microprocessor 118. The mechanism 116 has a structure for moving the large area image acquisition unit 110 in a predetermined direction with respect to the measurement object 10 by receiving power from the driving of the second movement driver 114.

Here, in the seventh embodiment of the present invention, the second moving driver 114 may be applied to move the large area image acquisition unit by electric driving, but the operator may operate the second moving mechanism 116 manually. It is also possible to allow arbitrary to be moved.

The microprocessor 118 may measure the two or more optical markers from the marker generator 12 on the surface of the measurement object 10 and are photographed in two or more directions from the large-area image acquisition unit 110. A three-dimensional position of each marker of the entire measurement target region is obtained from the image data of the reference object 120 and the reference object 120, and the arithmetic processing is performed to set the three-dimensional position of each marker to the absolute coordinate system.

In addition, the microprocessor 118 receives and analyzes two-dimensional image data and three-dimensional measurement data photographed at various angles from the image acquisition unit 18 through the image input unit 112, and analyzes them on the measurement target 10. And arithmetic processing for aligning the measurement data photographing the various subdivided measurement areas to the above absolute coordinate system.

The reference object 120 is a predetermined shape object in which dimension information about its size is previously input to the microprocessor 118. The reference object 120 is disposed adjacent to the measurement object 10 and is disposed through the large area image acquisition unit 110. The image is acquired together with the measurement object 10.

The operation of the 3D measurement data automatic alignment device according to the seventh embodiment of the present invention configured as described above will now be described in detail with reference to the flowcharts of FIGS. 21A and 21B.

First, in a state in which a predetermined measurement object 10 is disposed on the marker generator 12 side and the reference object 120 is disposed at a predetermined point adjacent to the measurement object 10, the microprocessor 118 moves the second moving driver. By driving 114 to operate the movement mechanism 116, the large area image acquisition unit 110 is moved to a position suitable for the measurement of the measurement object 10.

Next, the microprocessor 118 controls the marker blinking control unit 26 to light the plurality of marker output units 14 provided in the marker generator 12 so that a plurality of markers irregularly appear on the surface of the measurement object 10. Projection is made (step S70).

In the state where the optical marker from the marker generator 12 is projected onto the measurement object 10, the entire measurement object of the measurement object 10 including the reference object 120 through the large area image acquisition unit 18. When the 2D image including the optical marker is acquired by capturing an area, the microprocessor 118 receives the 2D image data acquired by the large area image acquisition unit 110 through the image input unit 112. (Step S71).

For reference, FIG. 22 illustrates an example of an image including the entire measurement target area and the reference object 120 of the measurement object 10 acquired by the large area image acquisition unit 110. Reference numeral RM denotes an optical marker projected onto the surface of the measurement object 10, and reference numeral BI denotes an image acquired by the large area image acquisition unit 110.

Next, the microprocessor 118 drives the second movement driver 114 to operate the movement mechanism 116 to move the large area image acquisition unit 110 to another position at a position suitable for the measurement of the measurement object 10. It moves (step S72).

In addition, the microprocessor 118 controls the large-area image acquisition unit 18 at the moved other point to capture the entire measurement target area of the measurement target 10 including the reference object 120, thereby performing the operation S71. In operation S73, a two-dimensional image including an optical marker is acquired in a different direction from the image input unit 112.

Next, the microprocessor 118 controls the marker blinking control unit 26 to turn off the marker generator 12, thereby preventing the optical marker from being projected onto the measurement object 10 (step S74).

The microprocessor 118 combines the respective two-dimensional images of the entire area to be measured in different directions obtained through the large area image acquisition unit 110 and knows in advance of the reference object 120 included in the image. The calculation is performed based on the dimension in which the three-dimensional position of each marker included in the entire measurement target area is calculated (step S75).

Then, the microprocessor 118 registers the calculated three-dimensional position of each marker in the register of the buffer 32 (step S76).

Next, as the microprocessor 118 drives the movement driver 20 to operate the movement mechanism 22, the microprocessor 118 integrates the image acquisition unit 18 integrated with the projection unit 16 to measure the measurement object 10. It is moved to a suitable position (step S77).

In this state, the microprocessor 118 controls the marker blinking control unit 26 to turn on the plurality of marker output units 14 provided in the marker generator 12 to display the plurality of markers on the surface of the measurement object 10. Is projected irregularly (step S78).

In the state where the optical marker from the marker generator 12 is projected onto the measurement object 10, the image acquisition unit 18 subdivides the entire area of the measurement object of the measurement object 10 (see FIG. 23 "). NI ”) to obtain a two-dimensional image including an optical marker, the microprocessor 108 receives the two-dimensional image data obtained by the image acquisition unit 18 through the image input unit 112 (Step S79).

Then, the microprocessor 108 controls the marker blinking control unit 26 so that the marker generator 12 is turned off so that the optical marker cannot be projected onto the measurement object 10 (step S80), and the image in that state. When the same region of the measurement object 10 is photographed from the acquirer 18 to acquire a 2D image not including the optical marker, the 2D image data is received through the image input unit 112 (step S81). ).

In addition, the microprocessor 108 controls the projection control unit 28 to operate the projection unit 16 while the marker generator 12 is turned off so that the optical marker is not projected. From a predetermined pattern (for example, a stripe pattern or a multi-stripe pattern of a plurality of sections each having a different interval) for three-dimensional measurement is projected onto the surface of the measurement object 10.

In this case, when the image acquisition unit 18 acquires the 3D measurement data by capturing the measurement object 10 on which the pattern pattern is projected, the microprocessor 108 inputs the 3D measurement data through the image input unit 112. (Step S82).

In this state, the microprocessor 108 extracts the two-dimensional position of the marker by image processing the two-dimensional image data including the optical marker and the two-dimensional image data not including the marker (step S83).

In addition, the microprocessor 108 may use coordinates extracted from the two-dimensional image data and coordinate values of any three markers in the two-dimensional image data from the camera lens center of the image acquisition unit 18. By estimating any three-dimensional coordinate values on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker is found (step S84).

Next, the microprocessor 108 compares the three-dimensional positions of the markers found in the step S84 with the three-dimensional positions of the markers stored in the register of the buffer 32 in the step S76, that is, they are paired with each other. Searches for the same marker (step S85).

When a marker that is paired is found by comparing the optical marker included in the current three-dimensional measurement data with the marker registered in the register of the buffer 32 by the searching process of the marker as described above, the microprocessor 108 Obtains a position transformation matrix for movement from the positions of the paired markers in each of the three-dimensional measurement data (step S86), and moves the current measurement data to the position transformation matrix and is registered in the register of the buffer 32. The three-dimensional position of the marker is set in the absolute coordinate system and aligned in this absolute coordinate system (step S87).

Next, the microprocessor 108 determines whether the automatic alignment of the three-dimensional measurement data acquired for the measurement object 10 is completed, that is, the three-dimensional measurement data of the subdivided area of the measurement object area of the measurement object 10. It is determined whether are all aligned (step S88).

As a result of the determination, when it is determined that the automatic alignment of the three-dimensional measurement data obtained from the measurement object 10 is not completed, the microprocessor 108 returns to the step S77 and drives the movement driver 20 to move. By operating the mechanism 22, the procedure from step S77 to step S88 is repeatedly executed while moving the projection unit 16 and the image acquisition unit 18 to a position suitable for measuring an area not yet measured. .

In the seventh embodiment, the large area image acquisition unit for acquiring the image of the entire measurement target area and the image acquisition unit for acquiring the subdivided measurement area are separately provided as an example. The image may be configured to acquire both an image of the entire measurement target region and an image of the segmented measurement region.

Next, an eighth embodiment of the present invention will be described in detail with reference to the accompanying drawings.

The configuration of the apparatus for automatically arranging three-dimensional measurement data according to an eighth embodiment of the present invention is as shown in FIG. 24, and as shown in the same drawing, the measurement object 10, the marker generator 12, and the projection unit. 16, the image acquisition unit 18, the movement drive unit 20, the movement mechanism 22, the marker flashing control unit 26, the projection control unit 28, the buffer 32, a pair or multiple large area image acquisition unit 130, 132, an image input unit 134, and a microprocessor 136.

Here, the same reference numerals are assigned to components that perform the same functions and operations as those of the first embodiment shown in FIG. 3, and detailed description thereof will be omitted to avoid duplicate descriptions.

The pair of large area image acquisition units 130 and 132 each include an image sensor capable of receiving an image, such as a CCD camera or a CMOS camera. The image is obtained by photographing a target area, which is called a stereo vision.

Here, it is preferable that each of the large area image acquisition units 130 and 132 employ an image sensor having a relatively higher precision than the image acquisition unit 10 that acquires the image of the segmented measurement area.

The image input unit 134 is for receiving image data obtained from the image acquisition unit 18 and the large area image acquisition unit 130 and 132.

The microprocessor 136 may measure a plurality of optical markers from the marker generator 12 on the surface of the measurement object 10, and may be photographed in different directions from the large area image acquisition units 130 and 132. The three-dimensional position of each marker of the entire measurement target area is obtained from the image data of (10), and the three-dimensional position of the marker obtained from the image obtained by the large-area image acquisition unit 130,132 is used as absolute coordinates.

In addition, the microprocessor 136 receives and analyzes the two-dimensional image data and the three-dimensional measurement data photographed at various angles from the image acquisition unit 18 through the image input unit 134, and analyzes them on the measurement target 10. And arithmetic processing for aligning the measurement data photographing the various subdivided measurement areas to the above absolute coordinate system.

This method is the same process as registering the different objects in the above-described first embodiment, except that the target object is an absolute coordinate previously obtained.

The operation of the 3D measurement data automatic alignment device according to the eighth embodiment of the present invention configured as described above will now be described in detail with reference to the flowcharts of FIGS. 25A and 25B.

First, in a state in which a predetermined measurement object 10 is disposed on the marker generator 12 side, the microprocessor 136 controls the marker blinking control unit 26 so that a plurality of marker output units provided in the marker generator 12 ( 14) is turned on so that a plurality of markers are irregularly projected on the surface of the measurement object 10 (step S90).

In the state where the optical marker from the marker generator 12 is projected onto the measurement target 10, the entire measurement target region of the measurement target 10 is different from each other through the large-area image acquisition unit 130 and 132. When the two-dimensional image including the optical marker is obtained by superimposing, the microprocessor 118 acquires the two-dimensional image data acquired by the large-area image acquisition units 130 and 132 through the image input unit 134, respectively. It is input (step S91).

For reference, FIG. 26 illustrates an example of an image of the entire measurement target area of the measurement target 10 acquired by the large area image acquisition unit 130 or 132. In the same figure, reference numeral “RM” denotes It is an optical marker projected on the surface of the measurement object 10, reference numeral "BI-1" denotes an image obtained by the large area image acquisition unit 132, reference numeral "BI-2" denotes a large area image acquisition unit ( An image obtained by the method 130).

Then, the microprocessor 136 controls the marker blinking control unit 26 to turn off the marker generator 12, thereby preventing the optical marker from being projected onto the measurement object 10 (step S92).

The microprocessor 136 performs calculation based on two-dimensional image information of the entire measurement target region in different directions obtained through the large-area image acquisition units 130 and 132, thereby marking each marker included in the entire measurement target region. The three-dimensional position of is calculated (step S93).

That is, in step S93, the distance between the large area image acquisition units 130 and 132 is fixed invariably, and the distance information is stored in the microprocessor 136, so that a pair of large area image acquisition units 130 and 132 are used. By calculating the relationship between the position of) and the position of each marker projected on the measurement target 10 by triangulation, the three-dimensional position of each marker can be obtained.

Then, the microprocessor 136 registers the calculated three-dimensional position of each marker in the register of the buffer 32 (step S94).

Next, as the microprocessor 136 drives the movement driver 20 to operate the movement mechanism 22, the microprocessor 136 integrates the image acquisition unit 18 integrated with the projection unit 16 to measure the measurement object 10. It is moved to a suitable position (step S95).

In this state, the microprocessor 136 controls the marker blinking control unit 26 to turn on the plurality of marker output units 14 provided in the marker generator 12 to display the plurality of markers on the surface of the measurement object 10. Is projected irregularly (step S96).

In the state where the optical marker from the marker generator 12 is projected onto the measurement object 10, the image acquisition unit 18 subdivides the entire area of the measurement object 10 of the measurement object 10 (see FIG. 27 "). NI ”) to acquire a 2D image including an optical marker, the microprocessor 136 receives the 2D image data acquired by the image acquisition unit 18 through the image input unit 134. (Step S97).

Then, the microprocessor 136 controls the marker blinking control unit 26 so that the marker generator 12 is turned off so that the optical marker is not projected onto the measurement object 10 (step S98), and the image in that state. When the same region of the measurement object 10 is photographed from the acquirer 18 to acquire a 2D image not including the optical marker, the 2D image data is received through the image input unit 112 (step S99). ).

In addition, the microprocessor 136 controls the projection control unit 28 to operate the projection unit 16 while the marker generator 12 is turned off so that the optical marker is not projected. From a predetermined pattern (for example, a stripe pattern or a multi-stripe pattern of a plurality of sections each having a different interval) for three-dimensional measurement is projected onto the surface of the measurement object 10.

At this time, when the image acquisition unit 18 photographs the measurement object 10 on which the pattern pattern is projected to acquire 3D measurement data, the microprocessor 136 inputs the 3D measurement data through the image input unit 112. It is received (step S100).

In this state, the microprocessor 136 image-processes the 2D image data including the optical marker and the 2D image data not including the marker to extract the 2D position of the marker (step S101).

In addition, the microprocessor 136 uses the marker extracted from the two-dimensional image data and coordinate values of any three markers in the two-dimensional image data from the camera lens center of the image acquisition unit 18. By estimating an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker is found (step S102).

Next, the microprocessor 136 compares the three-dimensional positions of the markers found in the step S102 with the three-dimensional positions of the markers stored in the register of the buffer 32 in the step S94, that is, they are paired with each other. Searches for the same marker (step S103).

When the marker is matched by comparing the optical marker included in the current three-dimensional measurement data with the marker registered in the register of the buffer 32 by the searching process of the marker as described above, the microprocessor 136 Obtains a position transformation matrix for movement from the positions of the paired markers in each of the three-dimensional measurement data (step S104), and moves the current measurement data to the position transformation matrix and is registered in the register of the buffer 32. The three-dimensional position of the marker is set in the absolute coordinate system and aligned in this absolute coordinate system (step S105).

Next, the microprocessor 136 determines whether the automatic alignment of the three-dimensional measurement data acquired for the measurement object 10 is completed, that is, the three-dimensional measurement data of the subdivided area of the measurement object area of the measurement object 10. It is determined whether are all aligned (step S106).

As a result of the determination, when it is determined that the automatic alignment of the three-dimensional measurement data obtained from the measurement object 10 is not completed, the microprocessor 108 returns to the step S95 and drives the movement driver 20 to move. By operating the mechanism 22, the procedure from step S95 to step S106 is repeatedly executed while moving the projection unit 16 and the image acquisition unit 18 to a position suitable for measuring an area not yet measured. .

In the eighth embodiment, a pair of large-area image acquisition units for acquiring images of the entire measurement target region and an image acquisition unit and a marker generator for acquiring subdivided measurement regions are separately described. As another modified embodiment of the present invention, a pair of the large area image acquisition unit and the marker generator may be integrally configured. In this configuration, the pair of the large area image acquisition units may be positioned in accordance with the area in which the optical marker generated by the marker generator is projected. There is no need to set a value, which can make it easier to use.

As another modified embodiment of the eighth embodiment, a pair of large area image acquisition unit and an image acquisition unit may be integrally configured. In this configuration, an area where absolute coordinates can be obtained may be somewhat smaller and the precision may be higher. While it may be slightly degraded, when a plurality of subdivided measurement areas are acquired, the number of images of the subdivided measurement area may be reduced, that is, the number of scans may be reduced by not overlapping boundary portions for each image.

For reference, the principle of the eighth embodiment of the present invention will be described in detail as follows.

The geometric model of the large-area image acquisition unit 130, 132 provided in the eighth embodiment of the present invention has a structure in which two cameras look at one object, and various shapes depending on the application field 27 shows a structure in which two cameras are arranged in parallel.

In FIG. 27, the variable is defined as follows.

『X: coordinate of the position to get,

b: base line distance between camera centers

f: camera's focal length

A, B: image plane acquired from each camera

X ₁ , X _r : Coordinates on the image with respect to the image of the coordinate X to be obtained from the origin of each image plane.

P, Q: lens center of each camera 』

In FIG. 27, a method of obtaining coordinates X of a position to be obtained from a stereo image is shown in Equations 15 and 16 below.

Next, a ninth embodiment of the present invention will be described with reference to the accompanying drawings.

In the ninth embodiment of the present invention, in order to obtain a two-dimensional image and three-dimensional measurement data for the entire measurement target area of the measurement object by arranging a plurality of projection unit, image acquisition unit and marker generator around the measurement object Automatic alignment of three-dimensional measurement data using optical markers, which eliminates the need to move the projection unit and the image acquisition unit and acquires two-dimensional images and three-dimensional measurement data with a single scan. The configuration for the device is presented.

FIG. 28 is a diagram illustrating a configuration of an apparatus for automatically arranging three-dimensional measurement data using an optical marker according to a ninth embodiment of the present invention. As can be seen from the drawings, the third embodiment according to the ninth embodiment of the present invention is described. The automatic dimensional measurement data alignment device includes N marker generators 142, M projection units 146, L image acquisition units 148, an image input unit 150, a projection control unit 152, a marker blinking control unit ( 154, microprocessor 156, and buffer 158.

The N marker generators 142 are for projecting a pattern that can be recognized by the image acquisition unit 148 on the surface of the measurement target 10 to be optically measured, which is directed toward the measurement target 10. A plurality of marker outputs 144 are provided so that a plurality of optical markers are projected simultaneously with mutually irregular irradiation directions over the entire surface.

As illustrated in FIG. 28, the N marker generators 142 direct the measurement objects 10 at regular intervals about the measurement object 10, but are projected from the respective marker generators 142. The region of is arranged to cover the entire region to be measured of the measurement object 10.

The M projection units 146 project predetermined patterns or laser stripes on the surface of the measurement object 10 so that three-dimensional data can be obtained. This is a three-dimensional data through the image acquisition unit 148 by projecting the spatially coded light on the surface of the measurement object 10 by using a projection device such as an LCD projector or by projecting the laser light on the surface of the measurement object 10. It can be obtained.

As shown in FIG. 28, the M projection units 146 orient the measurement objects 10 at regular intervals about the measurement object 10, and project the spatial coding from the projections 146. The regions of the light thus arranged are arranged to cover all the regions to be measured of the measurement object 10.

The L image acquisition units 148 are made of an image sensor capable of receiving an image, such as a CCD camera or a CMOS camera, and project the markers from the marker generator 142 to the surface of the measurement object 10 in an optical manner. In this case, the corresponding images are photographed and acquired.

Each of the L image acquisition units 148 is not provided as a separate camera for each of the projection units 146, but is preferably integrated with and integrated into the individual projection units 146.

As illustrated in FIG. 28, the L image acquisition units 148 may orient the measurement object 10 at regular intervals about the measurement object 10, respectively. The photographing area is arranged to cover the entire area to be measured of the measurement object 10.

The image input unit 150 is for receiving image data acquired from the L image acquisition units 148, respectively, and the projection control unit 152 is a transfer speed of the pattern film constituting the M projection unit 146 In addition to controlling the conveying direction, the flashing period of the light source projecting the pattern film is controlled.

The marker blinking controller 154 periodically blinks the optical markers of the N marker generators 142 under the control of the microprocessor 156.

The microprocessor 156 extracts the three-dimensional position of the marker for each region from the two-dimensional image and the three-dimensional measurement data acquired by the M projection units 146 and the L image acquisition units 148, respectively. Computation process of retrieving the position conversion matrix by the paired markers from the three-dimensional positions of the overlapped markers by the overlapping regions, and converting and aligning the position of each three-dimensional measurement data by the obtained position transformation matrix. Perform

The buffer 158 stores data necessary for arithmetic processing of the microprocessor 156 and result data.

The operation of the 3D measurement data automatic alignment device according to the ninth embodiment of the present invention configured as described above will now be described in detail with reference to the flowchart of FIG. 29.

First, the measurement object 10 is placed at an appropriate measurement position, and the N marker generators 142, the M projection units 146, and the L image acquisition units 148 are respectively centered on the measurement object 10. In the arranged state, the microprocessor 156 controls the marker blinking control unit 154 to light up each marker output unit 144 included in the N marker generators 142 and to display a plurality of surfaces on the surface of the measurement object 10. The marker of is projected irregularly (step S110).

In the state where the optical marker from the marker generator 142 is projected onto the measurement object 10, each of the L image acquisition units 148 photographs the measurement target area of the measurement object 10 to include the optical marker. When the 2D image is acquired, the microprocessor 156 receives the L 2D image data acquired from the L image acquisition units 148 through the image input unit 150 (step S111).

Then, the microprocessor 156 controls the marker blinking control unit 154 so that the N marker generators 142 are turned off so that the optical marker is not projected onto the measurement object 10 (step S112), and in that state If L 2D images without the optical marker are acquired by photographing the same area of the measurement object 10 from each of the L image acquisition units 148, the L 2D image data is inputted to the image input unit 150. It is received through (step S113).

In addition, the microprocessor 156 operates the M projection units 146 by controlling the projection control unit 152 in a state where the N marker generators 142 are turned off and the optical markers are not projected. From the projection unit 146, a predetermined pattern of patterns (e.g., a plurality of sections of stripes or multiple stripes of patterns having different intervals) is projected onto the surface of the measurement object 10.

At this time, when the L image acquisition units 148 acquire the L three-dimensional measurement data by capturing the measurement object 10 on which the pattern pattern is projected, the microprocessor 156 uses the L image acquisition unit 150 to acquire L three-dimensional measurement data. 3D measurement data is received (step S114).

In this state, the microprocessor 156 image-processes the two-dimensional image data including the optical marker and the two-dimensional image data not including the marker to extract the two-dimensional position of the marker (step S115).

The microprocessor 106 then uses the markers extracted from the two-dimensional image data to coordinate values for any three markers in the two-dimensional image data from the camera lens center of each of the L image acquisition units 148. By estimating an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line with each other, the three-dimensional position of the markers for each L three-dimensional measurement data is found (step S116).

Next, the microprocessor 156 searches the paired markers by comparing the three-dimensional positions of the markers for each of the L three-dimensional measurement data found in step S116 (step S117).

When the paired markers are found by the searching process of the markers as described above, the microprocessor 156 obtains a position transformation matrix for movement from the positions of the paired markers in the respective three-dimensional measurement data (step S118), the current measurement data is moved and aligned by the obtained position transformation matrix using any one of the L three-dimensional measurement data as the reference coordinate system (step S119).

Next, a tenth embodiment of the present invention will be described with reference to the accompanying drawings.

Herein, in the tenth embodiment of the present invention, the hardware configuration is the same as the ninth embodiment, but the operation process is configured differently.

Therefore, the tenth embodiment of the present invention is based on the hardware configuration of the ninth embodiment shown in FIG. 28 described above, and the operation thereof will be described in detail with reference to the flowchart of FIG.

First, a reference object of which dimensions are known in advance is placed at a suitable measurement position, and N marker generators 142, M projection units 146, and L image acquisition units 148 are placed around the reference object, respectively. do. In this case, the reference object may be manufactured separately for calibration, or may be an actual measurement object if the dimension is known in advance.

In this state, the microprocessor 156 controls the marker blink control unit 154 to light up each marker output unit 144 provided in the N marker generators 142 so that a plurality of markers are irregular on the surface of the reference object. (Step S120).

Next, the microprocessor 156 performs a calibration operation for obtaining a correlation between the L image acquisition units 148 and the reference object (step S121), and a detailed operation process thereof will be described in detail.

In step S121, since the optical markers from the N marker generators 142 are projected onto the reference object, the optical markers are photographed by photographing the measurement target region of the measurement target 10 in each of the L image acquisition units 148. When the 2D image including the 2D image is obtained, the microprocessor 156 receives the L 2D image data obtained from the L image acquisition unit 148 through the image input unit 150.

Then, the microprocessor 156 controls the projection control unit 152 to operate the M projections 146, and from the M projections 146, a predetermined pattern of patterns for each three-dimensional measurement. (E.g., a multi-striped stripe pattern or a multi-stripe pattern each having a different interval) is projected onto the surface of the reference object.

At this time, when the L image acquisition units 148 acquire the L three-dimensional measurement data by photographing the reference object on which the pattern pattern is projected, the microprocessor 156 measures the L three-dimensional measurements through the image input unit 150. You will receive data.

In this state, the microprocessor 156 uses the two-dimensional position of the marker including the optical marker and the dimension information of the reference object known in advance, and the two-dimensional image data from the camera lens center of each of the L image acquisition units 148. By estimating an arbitrary three-dimensional coordinate value on the three-dimensional measurement data positioned in a straight line with the coordinate value of the three random markers in E, the three-dimensional position of the markers for each of the L three-dimensional measurement data is found.

Next, the microprocessor 156 searches the paired markers by comparing the three-dimensional positions of the markers for each of the L three-dimensional measurement data, and moves from the positions of the paired markers in the respective three-dimensional measurement data. Find the position transformation matrix for.

The microprocessor 156 registers the obtained position conversion matrix in the register of the buffer 158, thereby completing the calibration operation of step S121.

When the calibration operation of step S121 is completed as described above, the reference object is removed and the measurement object 10 is placed in place of the reference object, and the microprocessor 156 controls the marker blinking control unit 154 to control N pieces. The marker generator 142 is turned off to prevent the optical marker from being projected onto the measurement object 10 (step S122).

In this state, when each of the L image acquisition units 148 captures the measurement target region of the measurement object 10 and acquires L two-dimensional images not including the optical marker, the L two-dimensional image data are acquired. The image is input through the input unit 150 (step S123).

In addition, the microprocessor 156 operates the M projection units 146 by controlling the projection control unit 152 in a state where the N marker generators 142 are turned off and the optical markers are not projected. From the projection unit 146, a predetermined pattern of patterns (e.g., a plurality of sections of stripes or multiple stripes of patterns having different intervals) is projected onto the surface of the measurement object 10.

At this time, when the L image acquisition units 148 acquire the L three-dimensional measurement data by capturing the measurement object 10 on which the pattern pattern is projected, the microprocessor 156 uses the L image acquisition unit 150 to acquire L three-dimensional measurement data. 3D measurement data is received (step S124).

Next, the microprocessor 156 reads the position transformation matrix obtained by the calibration of step S121 from the register of the buffer 158, and sets the position of any one of the L three-dimensional measurement data as a reference coordinate system. The current measurement data is moved and aligned by the position conversion matrix read from the register of the buffer 158 (step S125).

Subsequently, when the measurement is performed on another measurement object or the measurement is performed on the same measurement object again, the calibration operation from step S121 to step S123 is omitted, and the position conversion stored in the register of the buffer 158 is omitted. Since the three-dimensional measurement data is arranged by the matrix, the work time is shortened.

However, if necessary, the calibration operation from step S121 to step S123 may be performed at every measurement, which can be easily changed according to the intention of the operator or the configuration of the system.

Next, an eleventh embodiment of the present invention will be described.

An eleventh embodiment of the present invention presents another embodiment of the marker generator and its peripheral apparatus (hereinafter collectively referred to as "marker generator") used in the first to tenth embodiments of the present invention described above.

As shown in FIG. 31, the marker generating apparatus according to the eleventh embodiment of the present invention includes a plurality of light sources 160 on the X axis, a flashing control unit 162 on the X axis, and an X configured to be rotatable about the hinge axis. Axis of polygon mirror member 164 (Polygon Mirror), X-axis rotation drive unit 166, X-axis rotation mechanism 168, Y-axis multiple light source 170, Y-axis flashing control unit 172, The Y-axis polygon mirror member 174 configured to be rotatable about the hinge axis, the Y-axis rotation drive unit 176, and the Y-axis rotation mechanism 178 are configured to be included.

The plurality of light sources 160 of the X axis generate a beam having excellent straightness such as a laser and emit to the reflective surface of the polygon mirror member 164 of the X axis. For example, a laser pointer or the like may be used. The flashing control unit 162 of the X axis controls the light sources 160 on the X axis by control from a microprocessor (not shown).

The polygonal mirror member 164 of the X-axis has a plurality of reflecting surfaces and rotates by the rotation mechanism 168 of the X-axis and transmits a plurality of beams emitted from the plurality of light sources 160 to the plurality of reflecting surfaces. And the light is reflected on the surface of the measurement region of the measurement object OB.

The X-axis rotation driver 166 performs a drive for rotating the polygon mirror member 164 of the X-axis in one direction by the drive control of the microprocessor, and the rotation mechanism 168 of the X-axis is the X-axis rotation driver ( 166 has a structure for rotating the polygon mirror member 164 of the X-axis in one direction by receiving the power according to the drive.

The plurality of light sources 170 of the Y axis generate beams having excellent straightness such as a laser to emit to the reflective surface of the polygon mirror member 174 of the Y axis. For example, a laser pointer or the like may be used, and the Y axis blinks. The control unit 172 controls the respective light sources 170 on the Y axis to blink by control from a microprocessor (not shown).

The polygonal mirror member 174 of the Y-axis has a plurality of reflecting surfaces, and is driven by the rotation mechanism 178 of the Y-axis to transmit a plurality of beams emitted from the plurality of light sources 170 to the plurality of reflecting surfaces. And the light is reflected on the surface of the measurement region of the measurement object OB.

The Y-axis rotation driver 176 performs a drive for rotating the polygon mirror member 174 of the Y-axis in one direction by the drive control of the microprocessor, and the rotation mechanism 178 of the Y-axis is the Y-axis rotation driver ( 176 has a structure for rotating the polygon mirror member 174 of the Y-axis in one direction by receiving the power according to the drive.

Now, an operation process of the marker generator according to the eleventh embodiment of the present invention configured as described above will be described in detail.

First, driving power is applied from the X-axis rotation driver 166 and the X-axis rotation driver 176 to the X-axis rotation mechanism 168 and the Y-axis rotation mechanism 178 by a control signal from the microprocessor, and the X-axis The rotation mechanism 168 and the Y-axis rotation mechanism 178 are driven by driving power applied from the X-axis rotation driver 166 and the Y-axis rotation driver 176, respectively, so that the polygon mirror members 164 of the X-axis and the Y-axis are 164, Rotate 174).

In addition, the X-axis blinking control unit 162 and the Y-axis blinking control unit 172 light up the light source 160 on the X axis and the light source 170 on the Y axis by the control signals from the microprocessor, respectively. Beams generated from the plurality of light sources 160 and 170 are incident on the reflecting surfaces of the X-axis polygon mirror member 164 and the Y-axis polygon mirror member 174, respectively.

Beams incident on the reflecting surfaces of the X-axis polygon mirror member 164 and the Y-axis polygon mirror member 174 from the light sources 160 and 170 of the X-axis and the Y-axis are polygon mirror members 164 of the X-axis and the Y-axis, respectively. 174 is reflected from each reflecting surface and projected onto the surface of the measurement object OB.

At this time, the polygon mirror members 164 and 174 of the X-axis and the Y-axis are rapidly rotated so that the angles of the reflecting surfaces are different. The surface of the object OB has a plurality of beams in the X-axis and Y-axis, respectively. Lines are formed, and each intersection where the lines of the X-axis and the Y-axis cross each other becomes an individual optical marker RM.

For example, assuming that there are m light sources 160 on the X axis and n light sources 170 on the Y axis, m * n intersections may be formed on the surface of the measurement object OB, and these m * n intersections Since each of the optical markers RM, it is possible to generate a relatively large number of optical markers using a smaller number of light sources.

Embodiments according to the present invention as described above are not limited to the above, without departing from the technical gist of the appended claims within the scope obvious to those of ordinary skill in the art Of course, it can be modified and changed in various ways.

As described above, according to the present invention, the three-dimensional measurement data obtained at different angles and positions are automatically aligned, and the conventional method uses a marker having a volume such as a printed paper sticker or a magnet for image recognition for image recognition. Whereas the relative position of the different measurement data is to be found, the surface of the measurement object is covered by the marker at the part where the marker is located, so that the measurement data is lost or distorted at the part where the marker is present, whereas in the present invention, Since it is possible to find the relative position of the different measurement data by using the optical marker does not have a volume, there is an effect that the measurement data is not lost due to the marker even in the part where the marker of the object to be measured.

In addition, since the optical marker according to the present invention does not require a process of attaching or removing a marker to a measurement object, measurement of three-dimensional data can be quickly performed, and it is convenient to use, and safe to a measurement object that may be damaged. It can be used semi-permanently.

Claims (39)

In the three-dimensional data measuring apparatus for aligning the three-dimensional measurement data obtained by photographing at various angles from a predetermined measurement object, Optical marker generating means for projecting a plurality of optical markers onto the surface of the measurement object; Three-dimensional projection means for projecting a pattern on the surface of the measurement object for three-dimensional measurement of the measurement object; Image acquisition means for acquiring a two-dimensional image including a marker projected by the optical marker generating means from the measurement object, and acquiring three-dimensional measurement data of the measurement object projected by the three-dimensional projection means; A three-dimensional position of the marker is extracted from the relation between the two-dimensional image and the three-dimensional measurement data acquired by the image acquisition means, and a operation for finding a relative position of the three-dimensional measurement data from the three-dimensional position of the marker is performed. Automatic alignment device for three-dimensional measurement data using an optical marker, characterized in that consisting of a control means for performing. The apparatus of claim 1, wherein the three-dimensional projection means and the image acquisition means are configured to be fixedly integrated with each other. The apparatus of claim 2, further comprising: a movement driving unit driven by the control of the control means, and the three-dimensional projection means and the image acquisition means relatively moved with respect to the measurement object by receiving power from the driving of the movement driving unit. Automatic alignment device for three-dimensional measurement data using an optical marker, characterized in that further comprises a movement mechanism for performing the operation. The apparatus of claim 1, further comprising: a marker blink control means for periodically blinking and controlling a marker generated by the marker generating means according to the control of the control means; The control means causes the optical marker to be turned on by the marker blinking control means so that the image acquisition means first acquires a two-dimensional image including the marker from a specific region of the measurement object, and the optical marker is turned off to measure the optical marker. Automatic alignment device for three-dimensional measurement data using an optical marker, characterized in that for controlling to obtain a two-dimensional image without the marker from the same region of the object secondary. The method of claim 4, wherein the three-dimensional position of the marker, the control means compares the difference between the two-dimensional image containing the optical marker and the two-dimensional image without the marker obtained for the same area of the measurement object Automatic alignment device for three-dimensional measurement data using an optical marker characterized in that found by. 2. The apparatus according to claim 1, further comprising marker individual flashing control means for controlling the plurality of optical markers of the marker generating means to be lit individually and sequentially in a predetermined order according to the control of the control means; The control means sets the image data photographed in the unlit state of all the markers as the basic image data, and compares the image data photographed by the number corresponding to the number of optical markers from the image acquisition means with the basic image to the two-dimensional position of the marker. 3D measurement data automatic alignment device using an optical marker, characterized in that made to extract. 2. The apparatus of claim 1, further comprising marker individual flashing control means for controlling individual flashing of a plurality of optical markers of the marker generating means according to the control of the control means; The control means distinguishes between an optical marker indicating a previously photographed area and an optical marker indicating a next area when the marker generating means is turned on to control the lighting of the marker generating means for capturing an area after capturing image data through the image obtaining means. Automatic alignment device for three-dimensional measurement data using an optical marker, characterized in that for controlling the individual blink control means to blink. The method of claim 1, wherein the marker generating means is configured to generate an optical marker by a plurality of multi-color light emitting elements capable of selectively switching colors to emit light and to control individual light emission colors and flickering of the multi-color light emitting elements. It further comprises a marker individual flashing and color control means, The control means includes an optical marker indicating an area already photographed and an image not yet photographed when photographing the image data through the image obtaining means and then lighting the marker generating means to control another area. Automatic alignment device for three-dimensional measurement data using an optical marker, characterized in that for controlling the individual blinking and color control means to generate a different color of the marker. According to claim 1, In order to binarize a plurality of optical markers of the marker generating means according to the control of the control means by dividing in a predetermined order and set for each group, a plurality of markers included in each group are sequentially turned on It further comprises a marker individual flashing control means for controlling; The control means retrieves the binarization information by the group-specific markers included in the plurality of image data obtained by the number corresponding to the number of groups of markers from the image acquisition means, and extracts a two-dimensional position as a unique ID of each marker. 3D measurement data automatic alignment device using an optical marker, characterized in that made. 2. The apparatus according to claim 1, further comprising a projection control section for controlling the pattern pattern projection state of the three-dimensional projection means under the control of the control means; And the control means controls the optical marker of the marker generating means not to be generated when projecting the pattern from the three-dimensional projection means by the projection control unit. The apparatus of claim 1, wherein the marker generating means is disposed in a fixed state so as not to move relative to a measurement object to be measured. 12. The automatic alignment of measurement data using an optical marker according to claim 11, wherein the marker generating means is fixedly arranged in a rotation table on which a measurement object is placed. The apparatus of claim 1, wherein the marker generating means is configured so that a plurality of laser markers are irregularly projected onto the surface of the measurement object. The method of claim 1, wherein the image acquisition means acquires two-dimensional images and three-dimensional measurement data for a common measurement area of the measurement object, And the control means is configured to determine the three-dimensional position of the marker by at least two or more feature points included in the two-dimensional image and the three-dimensional measurement data. The method of claim 14, wherein the image acquisition means acquires a plurality of two-dimensional images and three-dimensional measurement data so that the surface of the measurement object overlap each other, The control means is configured to search for a paired marker for each overlapping area from the three-dimensional position of the marker, obtain a matrix for movement by the paired marker, and move each measurement data to the reference coordinate system. Automatic 3D measurement data sorting device using markers. 2. The apparatus of claim 1, wherein a plurality of the image acquisition means, the three-dimensional projection means, and the marker generating means are respectively arranged around a measurement object, The control means extracts the three-dimensional positions of the markers for each region from the two-dimensional images and the three-dimensional measurement data respectively obtained by the plurality of image acquisition means, and pairs each region overlapping each other from the three-dimensional positions of the extracted markers. Auto-align three-dimensional measurement data using an optical marker, wherein the markers are searched to obtain a position transformation matrix by paired markers, and the positions of each three-dimensional measurement data are converted and aligned by the obtained position transformation matrix. Device. 17. The optical marker according to claim 16, wherein the control means stores the obtained position conversion matrix, and at the next measurement, converts and aligns the position of each three-dimensional measurement data by the stored position conversion matrix. Automatic 3D measurement data sorting device. The method of claim 1, wherein the image acquiring means acquires a plurality of two-dimensional images from a plurality of points in advance knowing a section distance with respect to the entire measurement target area on the measurement target surface, and the entire measurement target area on the measurement target surface. It is configured to obtain a plurality of two-dimensional image and three-dimensional measurement data so that the boundary area of each region overlap each other for a plurality of measurement areas that are finely divided, The control means calculates a three-dimensional position of each marker by calculating a plurality of two-dimensional image information of the entire measurement target area acquired through the image acquisition means and distance information between the known measurement point in advance. Set the three-dimensional position of the marker in the absolute coordinate system, and then extract the three-dimensional position of the marker for each region from the two-dimensional image and the three-dimensional measurement data of each subdivided measurement region, and overlap each other from the three-dimensional position of the extracted marker. Search for markers paired with each other to obtain a position transformation matrix by the paired markers, and move the position of each three-dimensional measurement data by the obtained position transformation matrix to align the optical markers with the absolute coordinate system. Automatic 3D measurement data sorting device. 19. The apparatus of claim 18, wherein the image acquiring means comprises a plurality of large area measuring devices for acquiring an image of the entire measurement target area separately from the measuring device for acquiring an image of the subdivided measurement area. Measuring apparatus is an automatic alignment device for three-dimensional measurement data using an optical marker, characterized in that spaced apart from each other by a predetermined interval is fixed. 20. The optical marker generating means according to any one of claims 1 to 19, A light source generating a plurality of direct rays arranged in the X-axis direction, A light source for generating a plurality of direct rays arranged in the Y-axis direction, A polygon mirror member of the X-axis reflecting the direct light generated from the X-axis light source and projecting onto the surface of the measurement object; A polygonal mirror member of the Y-axis reflecting the direct light generated from the Y-axis light source and projecting onto the surface of the measurement object; A rotation mechanism for rotating the polygon mirror members of the X and Y axes, respectively; And a light source blinking controller configured to control the blinking of the light sources of the X and Y axes. Moving the image acquisition means to a position suitable for acquiring an image of a specific region of the measurement object; Flashing the marker generating means to cause the optical marker to be projected onto the surface of the measurement object, and acquiring a two-dimensional image of a specific area of the measurement object to which the optical marker is projected by the image acquisition means; Allowing the three-dimensional projection means to project the pattern on the surface of the measurement object, and acquiring the three-dimensional measurement data of a specific area of the measurement object on which the pattern pattern is projected by the image acquisition means; Extract the three-dimensional position of the marker from the relationship between the two-dimensional image and the three-dimensional measurement data obtained by the image acquisition means, and find the relative position of the three-dimensional measurement data from the position of the marker by each three-dimensional measurement data Automatic alignment method of three-dimensional measurement data using an optical marker, characterized in that consisting of the step of aligning the measurement data. The method of claim 21, wherein the acquiring of the 2D image of the specific region of the measurement object by the image acquisition means comprises: Firstly acquiring a two-dimensional image including a marker from a specific region of a measurement object in the image acquisition means by turning on the optical marker in the marker generating means; Automatically aligning the three-dimensional measurement data using an optical marker, characterized in that the optical marker is turned off so as to obtain a two-dimensional image without the marker from the same region of the measurement object. The method of claim 22, wherein the 2D image is processed by image processing a 2D image including a marker primarily obtained for the same region of the measurement object and a 2D image not including the secondary acquired marker. 3D measurement data automatic alignment method using an optical marker, characterized in that the extraction. The method of claim 21, wherein the acquiring of the 2D image of the specific region of the measurement object by the image acquisition means comprises: Acquiring a basic image by photographing a specific area of a measurement object with all optical markers turned off; Causing the plurality of optical markers to be individually and sequentially projected in a predetermined order in the marker generating means, and separately photographing the images in the image obtaining means for each projection state of the individual and sequential markers; Automatically aligning the 3D measurement data using the optical marker, characterized in that for extracting the two-dimensional position of the marker by comparing each image data photographed in the number corresponding to the number of the optical marker with the base image data Way. The method of claim 21, wherein the acquiring of the 2D image of the specific region of the measurement object by the image acquisition means comprises: Dividing a plurality of optical markers of the marker generating means by a predetermined group for binarization, and sequentially lighting the optical markers for each group; And retrieving the binarization information by the group-specific markers included in the plurality of image data obtained by the number corresponding to the number of groups of the optical markers, and extracting a two-dimensional position as a unique ID of each marker. 3D measurement data automatic alignment method using an optical marker. The method of claim 21, wherein the obtaining of the three-dimensional measurement data for a specific area of the measurement object to which the pattern pattern is projected by the image acquisition means, And the optical marker is not generated by the marker generating means when the pattern pattern is projected by the three-dimensional projection means. The method of claim 21, wherein the step of extracting the three-dimensional position of the marker from the relationship between the two-dimensional image and the three-dimensional measurement data obtained by the image acquisition means, The three-dimensional position of the marker is estimated by estimating the coordinate value for any three markers in the two-dimensional image data from the camera lens center of the image acquisition means and the arbitrary three-dimensional coordinate values on the three-dimensional measurement data located in a straight line. Automatic alignment of three-dimensional measurement data using an optical marker, characterized in that made to find. The method of claim 21, wherein the step of aligning each measurement data by finding a relative position of the three-dimensional measurement data from the position of the marker by each of the three-dimensional measurement data, Searching for paired markers for each region of adjacent three-dimensional measurement data obtained to overlap each other from three-dimensional positions of the markers; Obtaining a position transformation matrix for alignment of each three-dimensional measurement data by means of paired markers, A method of automatically aligning three-dimensional measurement data using an optical marker, comprising: moving and aligning each measurement data by the obtained position conversion matrix using one measurement data of each three-dimensional measurement data as a reference coordinate system. . The method of claim 28, wherein the searching of the paired markers for each area of the 3D measurement data comprises: Automated three-dimensional measurement data using an optical marker characterized in that the adjacent measurement data is found by finding a matched pair using the average vertical vector information around the marker or the marker together with the relative three-dimensional positional information of the marker in space. How to sort. The method of claim 28, wherein the searching of the paired markers for each area of the 3D measurement data comprises: A method of automatically aligning three-dimensional measurement data using an optical marker, characterized in that to find a pair of markers by selecting an additional reference point around the marker among three-dimensional data with relative three-dimensional positional information of the marker. The method of claim 28, wherein the searching of the paired markers for each area of the 3D measurement data comprises: Using the relative position information between the markers from each of the three-dimensional measurement data, a triangle is formed by three spatial points formed by the marker, the lengths of the sides of the triangle are obtained, and the sides are arranged in descending order, and the lengths of the sides are shown. And comparing the order to find the pairs of markers. The method of claim 28, wherein the step of moving and aligning each measurement data by using the one-dimensional measurement data as a reference coordinate system, Performing a transformation of matching vertex positions on the basis of the triangle of the reference coordinate system based on the information of the vertices and sides of the triangle by three points formed by the markers of the respective measurement data; Performing a rotation transformation to match each side sharing a matched vertex position; A method of automatically aligning three-dimensional measurement data using an optical marker, comprising rotating a vertex not included in a matching side as a rotation axis to a vertex of a reference coordinate system to match each triangle. 22. The method of claim 21, further comprising: acquiring a plurality of two-dimensional images from a plurality of points on the surface of the object to be measured in advance with respect to the entire region to be measured; And calculating the three-dimensional position of each marker by calculating the distance information between the measurement points known in advance, and setting the calculated three-dimensional position of each marker to an absolute coordinate system. The step of aligning each measurement data by finding the relative position of the three-dimensional measurement data from the position of the marker by each of the three-dimensional measurement data, for each area of the adjacent three-dimensional measurement data obtained to overlap each other from the three-dimensional position of the marker Searching for a pair of markers; obtaining a position transformation matrix for aligning each of the three-dimensional measurement data by the paired markers; and moving each measurement data by the obtained position transformation matrix to the absolute coordinate system. Automatic alignment method of three-dimensional measurement data using an optical marker, characterized in that comprising the step of aligning. 22. The apparatus of claim 21, wherein the optical marker indicating a previously photographed area is periodically blinked when the marker generating means is controlled to light up after photographing the image data through the image capturing means. 3D measurement data automatic alignment method using an optical marker, characterized in that. 23. The apparatus of claim 22, wherein an optical marker indicating an already photographed area and an area not yet photographed when photographing image data through the image capturing means and lighting the marker generating means in order to photograph another area are indicated. Automatic alignment method of the three-dimensional measurement data using the optical marker, characterized in that the control to generate different colors of the optical marker. Arranging a plurality of image acquisition means, three-dimensional projection means, and marker generating means, respectively, around the measurement object; Flashing the plurality of marker generating means to project the optical marker onto the surface of the measurement object, and obtaining a two-dimensional image of a specific area of the measurement object onto which the optical marker is projected by the plurality of image acquisition means; , Causing the plurality of three-dimensional projection means to project the pattern on the surface of the measurement object, and acquiring three-dimensional measurement data for a specific area of the measurement object onto which the pattern pattern is projected by the plurality of image acquisition means; ; Extracting the three-dimensional position of each marker from the relationship between each two-dimensional image and the three-dimensional measurement data obtained by the plurality of image acquisition means, and from the position of the marker by each three-dimensional measurement data Automatic alignment method of the three-dimensional measurement data using an optical marker, characterized in that consisting of the steps of aligning each measurement data by finding a relative position. Arranging a plurality of image acquisition means, three-dimensional projection means, and marker generating means, respectively, around the measurement object; By flashing the plurality of marker generating means to project a plurality of optical markers to the reference object, and to control the plurality of image acquisition means and three-dimensional projection means to control the two-dimensional image and three-dimensional measurement data for the reference object And extract the three-dimensional positions of the markers for each region from each of the obtained two-dimensional images and the three-dimensional measurement data, and search for the paired markers for each overlapping region from the three-dimensional positions of the extracted markers. A calibration step of obtaining a position transformation matrix by the markers to be used, The plurality of image acquisition means respectively acquires a two-dimensional image of a specific area of the measurement object, and in the plurality of three-dimensional projection means such that a pattern pattern is projected on the surface of the measurement object, and the plurality of image acquisition means Acquiring three-dimensional measurement data for a specific area of the measurement object onto which the pattern pattern is projected at; And aligning the three-dimensional measurement data by the position transformation matrix obtained in the calibration step. 38. The method of claim 37, wherein the calibrating is performed every time before acquiring the two-dimensional image and the three-dimensional data of the measurement object. 38. The optical marker according to claim 37, wherein the calibration step is configured to use the position transformation matrix obtained in the first calibration step even when the first calibration is performed only once and the three-dimensional measurement data for the next measurement object is aligned. 3D measurement data automatic alignment method using.