JP4226550B2 - Three-dimensional measurement data automatic alignment apparatus and method using optical markers - Google Patents

Description

次に、図８cに図示した通り、二つの三角形に対して一致させた頂点が含まれた辺を一致させる回転変換を行なう時、一点を共有する任意の二つのベクトルを一致させる回転変換は回転行列(R1)を表す数式２のように行なわれる。
【００６０】
【数２】

上記の通り、回転変換を行うと、図8dに図示した通りになり、これを一つの頂点に一致させるための回転行列(R2)の関係は下記の数式3の通りである。
【００６１】
【数３】

上記の通り、一致する辺を回転軸にしてその辺に含まれない一つの頂点から垂線を下ろした後、二つの線分間の角に回転させると、二つの三角形を一致させることができ、これを変換行列(Transform Matrix)(M)で整理すると下記の数式４の通りである。
【００６２】
【数４】

また、各三角形が含まれていた測定データの一つの点(P)は、下記の数式５によって新しい位置への移動が可能となる。
【００６３】
【数５】

一方、前記マイクロプロセッサー(30)は、上記の通り、三角形の合同を根拠に行われる変換によっていくつかの測定データをマーカーの基準に合わせた後、より正確にデータを合わせるための作業を行なうが、マーカーの大きさが数学的な点ではないため、多少の誤差が発生することがあり、マーカーのデータではないメッシュデータを根拠に相互間の位置を調整する。これをレジスタリング(registering)と言い、このような過程を通じて各測定データをより正確に一つの座標系に合わせることができる。
【００６４】
所定の点群データＡを点群データＢの座標系に合わせようとする場合、Ａを強制移動及び回転変換(Rigid Body Tranformation)させることで、Ｂの座標系に合わせることになる。この時、一致させるべきＡのｎ個の点をP=[p_i]、これに対応するＢの点を Q=[x_i]であるとすると、それぞれ対応されるＰ,Ｑの距離を最小限にできる最小自乗法を利用して移動、回転変換を求め、そのような変換をＡに適用する。従って、Ｐ,Ｑnの対辺となる点群データＡとＢの平均距離は最小になり、上記の対応点を探して移動、回転変換を求めて適用することを、Ｐ,Ｑの平均距離が公差内に入るまで繰り返すようになる。
【００６５】
上記の対応される点双を求める方式としては、それぞれのＡ点の法線方向に最も近いＢの点を求めてこの二点を点双とする。
【００６６】
それぞれ対応する二点間の距離を最小にする変換を最小自乗法を用いて求めるようになるところ、それに対する関数は下記の数式6の通りである。
【００６７】
【数６】

ここでQは、レジスタリングの状態ベクトル(State Vector)であり、Q=[Q_R｜Q_T]²になる。但し、Q_Rは四元数ベクトル(Quaternion Vector)で、これは Q_R=[q₀q₁q₂q₃]^t(q>=0, q₀ ² + q₁ ² + q₂ ² + q₃ ²=1)に当たる。Q_Tは平衡移動ベクトル(Translation Vector)で、これは Q_T=[q₄q₅q₆]^tに該当する。
【００６８】
前記数式６でf(Q)はpiにR(Q_R)とQ_T変換を適用した時、x_iとの自乗平均距離を表し、この時、f(Q)を最小化できるR(Q_R)とQ_Tを最小自乗法によって求めるのである。
【００６９】
前記数学式６でR(Q_R)は、3×3回転行列で表すことができ、これは下記の数式７によって定義される。
【数７】

【００７０】
また、測定データの集合(P)をP=[pi]と定義し、基準となるデータ集合(X)をX=[xi]と定義した場合、PとXの中心体積(Center of Mass)は、下記の数式８によって定義される。
【００７１】
【数８】

また、PとXの相互共分散行列(Cross-Covariance Matrix)(Σ_px)は、下記の数式９によって定義される。
【００７２】
【数９】

ここでは、非対称行列の循環成分(Cyclic Components of the Anti-symmetric Matrix)(A_ij)を利用し、列ベクトル(Column Vector)(Δ)を形成し、これをもって対称の4 ×4の行列であるQ(Σ_px)を求めるところ、下記の数式10のように定義される。
【００７３】
【数１０】

ここで、I₃は3×3の恒等行列(Identity Matrix)である。
【００７４】
前記数式で、Q_TはQ(Σ_px)の最大固有値(Maximum Eigenvalue)に対応する固有ベクトル(Eigen Vector)であり、その固有ベクトル値を用いて四元数(Quaternion)(q₀,q₁,q₂,q₃)を求め、前記数式７に代入して回転変換を求める。一方、Q_T(q₄,q₅,q₆)は前記数式７から求めたR(Q_R)を使用し、体積中心を合わせるため、下記の数式１１から求めることができる。
【００７５】
【数１１】

その結果、最終的に表される行列値は下記の数式１２の通りである。
【００７６】
【数１２】

前記マイクロプロセッサー(30)では、前記映像獲得部(18)から獲得される残りの三次元測定データに対してもそれぞれ対応されるマーカーの区別が行なわれると、上記一つの測定データ(60)を基準座標として移動のための行列を求めて自動的に整列できるようにする。
【００７７】
一方、図8aまたは図8dに図示されたような方式とは異なり、合同になる三角形を探した後に測定データを移動させる方式としては、前記最小自乗法を用いて座標系を一致させる方式を利用することとなる。
【００７８】
これは二つの三角形の合同可否を求めながら対応する頂点の情報があるので、前記数学式６でP,Xをそれぞれ対応する頂点であるというと、最適の回転、移動変換行列(T)は下記した数式１３によって求めることができる。
【００７９】
【数１３】

前記数学式１３のような行列を座標系に一致させようとする点群データ(P)を適用して移動させるための等式は、下記の数式１４によって定義される。
【００８０】
【数１４】

一方、前記マイクロプロセッサー(30)では、三角形の対を探す方法の場合、各測定データが重なる領域に三つ以上のマーカーが含まれなければならないものの、各測定データに二つのマーカーが存在する場合には測定しにくくなっており、この時は別の方式でマーカーの区別ができるようにする。
【００８１】
すなわち、マーカーを含んでいるそれぞれの測定データには三次元形象情報があるため、二つのマーカーだけを利用しても区別が可能になり、図9に図示した通り、それぞれ重なる領域を持つ一つの測定データ(64)が二つのマーカー(RM1,RM2)によって空間上における二つの点が形成され、異なる測定データ(66)が二つのマーカー(RM3,RM4)によって空間上における二つの点が形成されていると、それぞれの点から垂直したベクトルを利用すれば、各測定データ(64)(66)ごとの二つの点と二つのベクトルを相互比較することで、異なるマーカーを区別することができる。
【００８２】
一方、前記マイクロプロセッサー(30)では、各測定データに対して投影されるマーカーの数が多く、マーカーの配置が均一になっている場合、組を間違える場合も発生し得る。このような場合には、マーカーと二次元データを用い、追加的な基準点を生成して比較する。例えば、三つの共通点がある場合は、これらの点で三角形を構成し、三角形の重さの中心で三角形に垂直な垂線をひいた後、その垂線と三次元データとの交点を求めると第4の基準点が得られる。その後、マーカーまたは、マーカーの周囲から物体表面の平均垂直ベクトル情報を利用し、それぞれ一致する対を探すことができる。
【００８３】
また、測定データに二つの共通された点だけある場合には、これらの二点を繋げる直線をひいて、その直線の中点で直線と垂直である平面に円を描いた後、その円と測定データとの交点を求めると、第4、第5の基準点が得られる。
【００８４】
本発明の望ましい実施例によると、上記で説明した方法の以外にも、マーカー周囲で追加的な基準点を作って三次元測定データの整列を自動的に行なういかなる方法を採択しても使用できるようになっていることは勿論である。
【００８５】
図3で、前記バッファ(32)は前記マイクロプロセッサー(30)の三次元測定データに対する自動整列処理によって新しく求められるマーカー情報を各レジスターに登録させることになる。
【００８６】
次に、上記のように行われる本発明の第１実施例による動作について、図10a及び図10bのフローチャートを参照しながら詳しく説明する。
【００８７】
まず、マーカー発生器(12)側に所定の測定対象物(10)が安着された状態で、マイクロプロセッサー(30)は移動駆動部(20)を駆動し、移動メカニズム(22)を作動させることによって投影部(16)と一体化した映像獲得部(18)を前記測定対象物(10)の測定に適した位置へと移動させるようになる(段階S10)。
【００８８】
その状態で、前記マイクロプロセッター(30)は、マーカー 点滅制御部(26)を制御し、マーカー発生器(12)に備えられた複数のマーカー出力部(14)を点灯させ、前記測定対象物(10)の表面に複数のマーカーが不規則的に投影されるようにする(段階S11)。
前記マーカー発生器(12)からの光学式マーカーが測定対象物(10)に投影されている状態で、映像獲得部(18)で前記測定対象物(10)の特定領域を撮影し、光学式マーカーが含まれた二次元映像を獲得すると、前記マイクロプロセッター(30)は映像入力部(24)を通じて前記映像獲得部(18)で獲得された二次元映像データが入力されることになる(段階S12)。
【００８９】
次に、前記マイクロプロセッサー(30)は、前記マーカー点滅制御部(26)を制御して前記マーカー発生器(12)が消燈され、光学式マーカーが測定対象物(10)に投影されないようにし(段階S13)、その状態で映像獲得部(18)から測定対象物(10)の同一の領域を撮影し、光学式マーカーが含まれていない二次元映像を獲得すると、その二次元映像データを映像入力部(24)を通じて入力されるようになる(段階S14)。
【００９０】
また、前記マイクロプロセッサー(30)は、前記マーカー発生器(12)が消燈され、光学式マーカーが投影されていない状態で、投影制御部(28)を制御して投影部(16)を動作させるようになり、その投影部(16)から三次元測定のための模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記測定対象物(10)の表面に投影される。
【００９１】
この時、映像獲得部(18)で模様パターンが投影された測定対象物(10)を撮影して三次元測定データを獲得すると、前記マイクロプロセッサー(30)は映像入力部(24)を通じて三次元測定データを入力してもらうこととなる(段階S15)。
【００９２】
その状態で、前記マイクロプロセッサー(30)は、光学式マーカーが含まれた二次元映像データとマーカーが含まれていない二次元映像データとを映像処理し、マーカーの二次元位置を抽出する(段階S16)。
【００９３】
その次に、前記マイクロプロセッサー(30)は、二次元映像データから抽出されたマーカーを用いて前記映像獲得部(18)のカメラのレンズ中心から二次元映像データでの任意の三つのマーカーに対する座標値と、一直線に位置する三次元測定データ上における任意の三次元座標値を推定することにより、当該マーカーの三次元の位置を探すようになる(段階S17)。
【００９４】
一方、前記マイクロプロセッサー(30)は、バッファ(32)のレジスターが空いているか否かを判断する(段階S18)。
【００９５】
前記判断の結果、前記バッファ(32)のレジスターが空いていないと判断されると、前記段階S17で探したマーカーの三次元位置に対し、前記バッファ(32)のレジスターに登録された以前の三次元測定データ(すなわち、現在の三次元測定データと重なるデータ)によるマーカーを比較し、互いに対となるマーカーを検索するようになる(段階S19)。
【００９６】
上記のようなマーカーの検索処理によって現在の三次元測定データに含まれたマーカーと、バッファ(32)のレジスターに登録されているマーカーとの比較によって組になるマーカーを探し出すと、前記マイクロプロセッサー(30)は、三次元測定データで組となるマーカーの位置から移動のための行列を求めるようになり(段階S20)、前記バッファ(32)のレジスターに登録された三次元測定データの位置を基準座標系にし、現在の測定データを移動させるようになる(段階S21)。
【００９７】
その結果、前記マイクロプロセッサー(30)は、現在の測定データから新しく探したマーカーをバッファ(32)のレジスターに登録させ、以前の測定データに異なるマーカーと整列させるようになる(段階S22)。
【００９８】
次に、前記マイクロプロセッサー(30)は、前記測定対象物(10)に対して獲得された三次元測定データに対する自動整列が完了したかどうかを判断する(段階S23)。
【００９９】
前記判断の結果、前記測定対象物(10)から獲得した三次元測定データに対する自動整列が完了されていないと判断するようになれば、制御が前記段階S10へ進行し、前記移動駆動部(20)による駆動の下で移動メカニズム(22)が作動されながら、投影部(16)と映像獲得部(18)を適した位置へ移動させながら前記段階S10から段階S22までの過程を繰り返して実行することとなる。
【０１００】
次に、添付図面を参照し、本発明の第２実施例について詳しく説明する。
【０１０１】
すなわち、図11は、本発明の第２実施例による光学式マーカーを用いた三次元測定データ自動整列装置に対する構成を示した図面であり、本発明の第２実施例で前記第1実施例と同一の機能及び動作を行う構成要素に対しては同一の参照符号を与えながら、それに関する詳しい説明は省略する。
【０１０２】
本発明の第2実施例による三次元測定データ自動整列装置は、マーカー発生器(70)と、投影部(16)、映像獲得部(18)、移動駆動部(20)、移動メカニズム(22)、映像入力部(24)、マーカー個別点滅制御部(74)、投影制御部(28)、マイクロプロセッサー(76)、バッファ(32)で構成される。
【０１０３】
前記マーカー発生器(70)は、光学的に測定しようとする測定対象物(10)の表面に映像獲得部(18)が認識できる模様を投影するためのもので、これは前記測定対象物(10)を指向する全面にわたって複数の光学式マーカーを相互不規則的な調査方向で投影されるようにする複数のマーカー出力部(72)が設置されている。
【０１０４】
前記マーカー発生器(70)は、前記マーカー個別点滅制御部(74)の制御により、１〜N番目まである複数のマーカー出力部(72)を順次的に1個ずつ個別点灯させ、前記映像獲得部(18)から獲得される各映像ごとに異なる1個ずつのマーカーが投影されるようにする。
【０１０５】
前記マーカー個別点滅制御部(74)は、前記マイクロプロセッサー(76)の制御によって前記マーカー発生器(70)に備えられた複数のマーカー出力部(72)を既に決められた順番によってそれぞれ順次的に、かつ個別的に点滅制御する。
【０１０６】
前記マイクロプロセッサー(76)は、前記映像獲得部(18)から様々な角度で撮影された二次元映像データと三次元測定データを、映像入力部(24)を通じてそれぞれ入力され、それを分析して様々な角度で撮影された測定データを一つの座標系に自動的に整列するための演算処理を行うものの、これは前記映像獲得部(18)で全てのマーカーが消燈された状態で撮影した映像を基本映像に設定し、１番目〜N番目まで順次的にマーカーが点灯された状態で撮影された複数個の映像をそれぞれ比較し、各マーカーの二次元の位置を検索して抽出する。
【０１０７】
その次に、前記マイクロプロセッサー(76)はマーカーの位置が抽出された二次元測定データと三次元測定データとを比較し、マーカーの三次元の位置を検索する機能と対になるマーカーを検索し、それに従う移動行列を求める機能及び、三次元測定データを基準座標系へ移動させる機能が本発明の第１実施例で表れた機能と同じように進められるようにする。
【０１０８】
続いて、上記の通り行われた本発明の異なる実施例による動作について、図12のフローチャートを参照して詳しく説明する。
【０１０９】
まず、マーカー発生器(70)側に所定の測定対象物が安着された状態で、マイクロプロセッサー(76)は移動駆動部(20)を駆動し、移動メカニズム(22)を作動させることで、投影部(16)と一体化された映像獲得部(18)を前記測定対象物(10)の測定に適した位置へ移動させる(段階S30)。
【０１１０】
その状態で、前記マイクロプロセッサー(76)は前記マーカー発生器(70)からの光学式マーカーが全部消燈されるようにし、前記映像獲得部(18)から撮影される映像データを基本映像として獲得することになる。
【０１１１】
次に、前記マイクロプロセッサー(76)は、マーカー個別点滅制御部(74)を制御し、マーカー発生器(70)に備えられた複数のマーカー出力部(72)の中で１番目に指定されたマーカー出力部(72)を点灯させ、前記測定対象物(10)の表面に１番目のマーカーが投影されるようにし(段階S31)、前記映像獲得部(18)から撮影される映像を１番目の映像データとして獲得する(段階S32)ことになる。
【０１１２】
また、前記マイクロプロセッサー(76)は前記マーカー個別点滅制御部(74)を制御し、前記マーカー発生器(70)の複数のマーカー出力部(72)のうち、既に決められた順番に従い、Ｎ番目、すなわち、２番目に指定されたマーカー出力部が点灯され、２番目の光学式マーカーが測定対象物(10)に投影されるようにし(段階S33)、前記映像獲得部(18)から撮影される映像をＮ番目、すなわち、２番目の映像データとして獲得する(段階S34)ようになる。
【０１１３】
その状態で、前記マイクロプロセッサー(76)は、前記段階で撮影された映像に含まれたマーカーが前もって指定された複数のマーカーのうち、最後のマーカーか否かを判断する(段階S35)。
【０１１４】
前記判断の結果、前記映像獲得部(18)から撮影された映像に含まれたマーカーが複数のマーカーの中で最後のマーカーではないと判断されたら、前記段階S33と、段階S34の動作を繰り返し実行して前記マーカー発生器(70)の複数のマーカー出力部(72)が3、4、…Ｎ番目というように順次的に、かつ個別的に点灯して光学式マーカーが測定対象物(10)に投影されるようにし、それぞれのマーカーが個別的に点灯されるごとに映像獲得部(18)から撮影された個別的な映像を3、4、…Ｎ番目の映像として獲得する。
【０１１５】
一方、前記マイクロプロセッサー(76)では、前記映像獲得部(76)から獲得された映像に含まれたマーカーが最後のマーカーであると判断するようになると、前記マーカー発生器(70)が消燈され、光学式マーカーが投影されていない状態で投影制御部(28)を制御し、投影部(16)を動作させるようになり、その投影部(16)から三次元測定のための所定の模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記測定対象物(10)の表面に投影される。
【０１１６】
この時、前記映像獲得部(18)で模様パターンが投影された測定対象物(10)を撮影し、三次元測定データを獲得すると、前記マイクロプロセッサー(76)は映像入力部(24)を通じて三次元測定データが入力されることになる(段階S36)。
【０１１７】
一方、前記マイクロプロセッサー(76)は、１番目〜Ｎ番目のマーカーが順次的に、かつ個別的に消灯された状態で撮影された１番目〜Ｎ番目の映像データをマーカーが消灯された状態で獲得した基本映像とそれぞれ比較することにより、また光学式マーカーによって形成される経た領域を検索することで、マーカーの二次元の位置が容易に抽出できる(段階S37)。
【０１１８】
次に、前記マイクロプロセッサー(76)では、二次元映像の比較によって抽出されたマーカーの二次元の位置と三次元測定データを比較することによってマーカーの三次元の位置が検出でき、そのような三次元の位置から隣接して撮影されたそれぞれの映像データから対になるマーカーを検索し、それによる移動行列を求め、三次元測定データを基準座標系に移動するようになる(段階S38)。
【０１１９】
一方、前記マイクロプロセッサー(76)は、前記測定対象物(10)に対して獲得された三次元測定データに対する自動整列が完了されたか否かを判断する(段階S39)。
【０１２０】
前記判断の結果、前記測定対象物(10)から獲得された三次元測定データに対する自動整列が完了されていないと判断すると、制御が前記段階S30へ再進行させ、前記移動駆動部(20)による駆動下で移動メカニズム(22)が作動しながら投影部(16)と映像獲得部(18)を適した位置へ移動させながら、前記段階S30から段階S38までの過程を繰り返して実行するようになる。
【０１２１】
次に、添付図面を参照し、本発明の第３実施例について詳しく説明する。
【０１２２】
すなわち、本発明の第３実施例による二次元測定データ自動整列装置の構成は、図11に図示した構成要素と同一である。
【０１２３】
但し、本発明の第2実施例では、マーカー発生部(70)でＮ個のマーカーをそれぞれ個別的に投影した時、Ｎ個の映像を個別的に撮影すべきであるものの、第３実施例ではマーカー発生部(70)で発生されるＮ個のマーカーを二進化のため、グループ別に分けて点灯させることによって映像を撮影する回数がlog₂(N+1)に減少する。
【０１２４】
前記マーカー個別点滅制御部(74)は、マイクロプロセッサー(76)の制御によってマーカー発生部(70)に設置された複数のマーカー出力部(72)を二進化のためにそれぞれのグループ別に分割し、そのグループに該当するマーカーの出力部だけを選択的に点灯させる制御を行う。
【０１２５】
前記マーカー個別点滅制御部(74)は、例えば前記マーカー発生部(70)に設置されたマーカー出力部(72)の個数が16個で、合計16のマーカーが発生可能な場合、マーカーの二進化のために16のマーカーを四つのグループに重複的に分割して設定する。
【０１２６】
すなわち、１番目のグループに含まれるマーカーは9番目〜16番目のマーカーに該当し、２番目のグループに含まれるマーカーは5番目〜8番目マーカーと、13番目〜6番目マーカーに該当し、3番目のグループに含まれるマーカーは、3,4,7,8,11,12,15,16番目マーカー、4番目のグループに含まれるマーカーは偶数番目(2,4,6,8,12,14,16)マーカーに該当するところ、このような関係は下記の表１の通りである。
【０１２７】
【表１】

但し、“0”はマーカーの消燈を表し、“1”はマーカーの点灯を表す。
上記の表1で示した通り、１番目のマーカーは常に消燈状態が維持される反面、16番目のマーカーは常に点灯状態が維持されるようにし、全てのマーカーがそれぞれ固有の点灯値を持つようになる。
【０１２８】
前記マイクロプロセッサー(76)は前記マーカー個別点滅制御部(76)を制御し、既に設定されたグループ別に分割されたマーカーが順次的に点灯できるようにし、映像獲得部(18)を通じて獲得されたマーカーのグループ数に対応する数の映像データを比較してマーカーの二次元の位置を抽出する。
【０１２９】
ここで前記マイクロプロセッサー(76)は、表１のように16のマーカーをグループ別に順次的に点灯し、第１映像〜第４映像データを獲得する場合、１０番目のマーカーを二進数“1001”として認識し、13番マーカーを二進数 “1100”として認識するのと同じように、16個のマーカーに対して16の異なる固有のID、すなわち、二次元の位置値が検出することができるようになる。この際、1番マーカーは、常に消燈されている状態を維持しているため、実際に使えないようになり、実質的には合計15のマーカーが使用できる。
【０１３０】
従って、もし10の映像データを獲得するとしたら、1024の異なる固有のIDを区別することができるようになり、実質的に1023のマーカーの使用が可能である。
【０１３１】
また、前記マイクロプロセッサー(76)は、マーカーの位置が抽出された二次元測定データと三次元測定データを比較し、マーカーの三次元の位置を検索する機能と、組となるマーカーを検索してそれによる移動行列を求める機能及び、三次元測定データを基準座標系へ移動させる機能が、本発明の第1実施例で示された機能と同一に進行されるようにする。
【０１３２】
続いて、上記の通りに行われた本発明の第3実施例による動作について、図13のフローチャートを参照し詳しく説明する。
【０１３３】
まず、上記の表1に示した通り、マーカー発生器(70)に設置されたマーカー出力部(72)が16個存在し、計16のマーカーを投影し、映像獲得部(18)で合計四つの二次元映像データを獲得することを一例として挙げて説明する。
【０１３４】
まず、マーカー発生器(70)側に所定の測定対象物(10)が安着された状態で、マイクロプロセッサー(76)は移動駆動部(20)を駆動し、移動メカニズム(22)を作動させることで投影部(16)と一体化された映像獲得部(18)を前記測定対象物(10)の測定に適した位置へ移動させるようになる(段階S40)。
【０１３５】
その状態で、マイクロプロセッサー(76)は、マーカー個別点滅制御部(74)を制御し、前記マーカー発生部(70)で前もって設定されたグループ別マーカーのうち、１番目のグループに含まれたマーカー(9番目〜16番目マーカー)が投影できるように、マーカー出力部(72)を点灯させることになり(段階S41)、映像獲得部(18)で撮影される第1映像データを映像入力部(24)を通じて獲得することになる(段階S42)。
【０１３６】
次に、前記マイクロプロセッサー(76)は、前記マーカー個別点滅制御部(74)を制御して前記マーカー発生部(70)で予め設定されたグループ別マーカーのうち、N番目のグループ、すなわち、２番目のグループに含まれたマーカー(5番目〜8番目、13番目〜16番目)が投影できるようにマーカー出力部(72)を点灯させるようになり(段階S43)、前記映像獲得部(18)で撮影されれる第N映像データ、すなわち、第2映像データを獲得することになる(段階S44)。
【０１３７】
この際、前記マイクロプロセッサー(76)は、前記段階で獲得された映像データに含まれたマーカーのグループが前もって設定されたグループの中で最後なのかどうかを判断する(段階S45)。
【０１３８】
前記判断の結果、前記マイクロプロセッサー(76)は映像獲得部(18)から獲得された映像データに含まれたマーカーのグループが最後のグループでないと判断するようになると、前記段階S43へ再進行して段階S44までの過程を繰り返して行うことによって、3番目グループのマーカー(3,4,7,8,1,12,15,16番目のマーカー)を点灯させて第3映像データを獲得してから、4番目グループのマーカー(2,4,6,8,10,12,14,16番目のマーカー)を点灯させて第4映像データを獲得する。
【０１３９】
一方、前記段階S45の判断結果によって前記映像獲得部(18)から獲得された映像データに含まれたマーカーのグループが最後のグループであると判断するようになると、前記マーカー発生器(70)が消燈され、光学式マーカーが投影されていない状態で投影制御部(28)を制御し、投影部(16)を動作させることになり、その投影部(16)から三次元測定のための所定の模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記測定対象物(10)の表面に投影される。
【０１４０】
この際、前記映像獲得部(18)で模様パターンが投影された測定対象物(10)を撮影し、三次元測定データを獲得すると、前記マイクロプロセッサー(76)は映像入力部(24)を通じて三次元測定データが入力されることになる(段階S46)。
【０１４１】
次に、前記ミクロプロセッサー(76)は、前記映像獲得部(18)で獲得された１番目〜N番目の映像、すなわち、第1映像〜第4映像データによる二進化情報を比較し、各マーカーの固有ID、すなわち、二次元位置を抽出するようになる(段階S47)。
【０１４２】
一方、前記マイクロプロセッサー(76)では二次元映像データの二進化データの比較によって抽出されたマーカーの二次元位置と、三次元測定データを比較することによってマーカーの三次元位置を検出し、そのマーカーの三次元の位置から隣接して撮影されたそれぞれの映像データで組となるマーカーを検索し、それによる移動行列を求めるようになり、三次元測定データを基準座標系へ移動するようになる(段階S47)。
【０１４３】
一方、前記マイクロプロセッサー(76)は、前記測定対象物(10)に対して獲得された三次元測定データに対する自動行列の完了の可否を判断する(段階S49)。
【０１４４】
前記判断の結果、前記測定対象物(10)から獲得された三次元測定データに対する自動整列が完了していないと判断されると、制御が前記段階S40へ再進行して前記移動駆動部(20)による駆動下で移動メカニズム(22)が作動しながら、投影部(16)と映像獲得部(18)を適した位置へと移動させながら前記段階S40から段階S48までの過程を繰り返して実行するようになる。
【０１４５】
以下、本発明の第４実施例について、添付図面を参照して詳しく説明する。
【０１４６】
本発明の第４実施例による三次元測定データ自動整列装置の構成は、図14に図示した通りであり、同図面に図示されているように、測定対象物(10)、投影部(16)、映像獲得部(18)、移動駆動部(20)、移動メカニズム(22)、映像入力部(24)、投影制御部(28)、バッファ(32)、マーカー発生器(80)と、マーカー個別点滅制御部(84)、マイクロプロセッサー(86)を含めて構成される。
【０１４７】
ここで、図３に図示された第１実施例の構成と同一の機能及び動作を行う構成要素については同一の参照符号を与えている。また重複された記載を避けるために、各構成要素に関する具体的な説明は省略する。
【０１４８】
前記マーカー発生器(80)は、光学的に測定しようとする測定対象物(10)の表面に映像獲得部(18)が認識できる模様を投影するためのもので、これは前記測定対象物(10)を指向する全面にかけて複数の光学式マーカーを相互不規則的な調査方向をもって投影できるようにする複数のマーカー出力部(82)が設置されている。
【０１４９】
前記マーカー発生器(80)は、前記マーカー個別点滅制御部(84)の制御によって複数のマーカー出力部(82)を選択的に点滅駆動できるように構成されている。
【０１５０】
前記マーカー個別点滅制御部(84)は、前記マイクロプロセッサー(86)の制御により、前記マーカー発生器(80)に備えられた複数のマーカー出力部(82)を個別的に点滅制御する。
【０１５１】
前記マイクロプロセッサー(86)は、測定対象物(10)から獲得された測定データを分析して一つの座標系に自動的に整列させるための専用のソフトウェアプログラムを駆動させた状態で、前記映像獲得部(18)から様々な角度で撮影された二次元映像データと三次元測定データを映像入力部(24)を通じてそれぞれ入力してもらい、それを分析して様々な角度から撮影された測定データを一つの座標系に自動的に整列するための演算処理を行うものの、これに対する具体的な動作過程は上記の第1実施例でのマイクロプロセッサーの動作過程と同一である。
【０１５２】
但し、本発明の第4実施例に従うマイクロプロセッサー(86)は、測定対象物(10)のある一方の領域に対する二次元映像データと三次元測定データを獲得し、これに対する演算処理を行った後、異なる領域に対する二次元映像データと三次元測定データを獲得するためにマーカー発生器(80)を点灯させる時、既に映像及び測定データを獲得した領域に投影されたマーカーは、所定周期(例えば、0.5秒程度)に繰り返して点滅させる反面、残りの領域に投影されたマーカーは点灯状態を維持できるようにマーカー個別点滅制御部(84)を制御する。
【０１５３】
また、逆に既に映像及び測定データを獲得した領域に投影したマーカーは、点灯状態を維持させる反面、残りの領域に投影されたマーカーは所定周期に繰り返して点滅させるようにすることも可能である。
【０１５４】
このように、既に映像及び測定データを獲得した領域に投影されたマーカーと、残りの領域に投影されたマーカーの点滅状態を異なるようにすることで、測定を担当する試験者と映像及び測定データを獲得した領域と残りの領域を肉眼で確認しやすく、これを通じて測定の利便性を図ることができる。
【０１５５】
次に添付された図面を参照しながら、本発明の第５実施例について詳しく説明する。
【０１５６】
本発明の第５実施例による三次元測定データ自動整列装置の構成は、図15で図示した通りであり、同図面に図示された通り、測定対象物(10)、投影部(16)、映像獲得部(18)、移動駆動部(20)、移動メカニズム(22)、映像入力部(24)、投影制御部(28)、バッファ(32)、マーカー発生器(90)と、マーカー個別点滅/色相制御部(94)、マイクロプロセッサー(96)を含めて構成される。
【０１５７】
ここで、図３に図示した第1実施例の構成と同一機能及び、動作を行う構成要素に対しては同一の参照符号を与え、重複された記載を避けるため具体的な説明は省略する。
【０１５８】
前記マーカー発生器(90)は、光学的に測定しようとする測定対象物(10)の表面に映像獲得部(18)が認識できる模様を投影するためのもので、これは前記測定対象物(10)を指向する全面にわたり、複数の光学式マーカーを相互不規則的な調査方向をもって投影できるようにする複数のマーカー出力部(92)が設置されている。
【０１５９】
ここで、前記マーカー発生器は、マーカー個別点滅/色相制御部(94)の制御によって各マーカー出力部(92)が最小限2種類以上のそれぞれ異なる色の光を選択的に転換して調査できるように構成されている。例えば、マーカー出力部(92)ごとに最小二つ以上の異なる色の光源を具備し、これらの光源を選択的に点灯することで、それぞれ異なる色相の光を発生するように構成できる。
【０１６０】
前記マーカー個別点滅/色相制御部(94)は、前記マイクロプロセッサー(96)の制御によって前記マーカー発生器(90)に備えられた複数のマーカー出力部(92)の点滅及び個別的な色相を制御することになる。
【０１６１】
前記マイクロプロセッサー(96)は、測定対象物(10)から獲得された測定データーを分析して一つの座標系に自動的に整列させるための専用のソフトウェアプログラムを駆動させた状態で、前記映像獲得部(18)から様々な角度で撮影された二次元映像データと三次元測定データを一つの座標系に自動に整列するための演算処理を行うものの、これに対する具体的な動作過程は上記の第1実施例でのマイクロプロセッサーの動作過程と同一である。
【０１６２】
但し、本発明の第５実施例によるマイクロプロセッサー(96)は、測定対象物(10)のある一つの領域に対する二次元映像データと三次元測定データを獲得し、これに対する演算処理を行った後、異なる領域に対する二次元映像データと三次元測定データを獲得するためにマーカー発生器(90)を点灯させるときに、既に映像及び測定データを獲得した領域に投影されたマーカーと残りの領域に投影されたマーカーの色が異なって投影されるようにマーカー個別点滅/色相制御部(94)を制御する。
【０１６３】
従って、既に映像及び測定データを獲得して領域に統制されたマーカーと残りの領域に投影されたマーカーを異なる色にすることで測定を担当する試験者が映像及び測定データを獲得した領域と残りの領域を肉眼で確認しやすく、これを通じて測定の利便性を図ることができる。
【０１６４】
次に、本発明の第６実施例について、添付された図面を参照し、詳しく説明する。
本発明の第６実施例による三次元測定データ自動整列装置の構成は、図16に図示した通りで、同図面に図示したように、測定対象物(10)、マーカー発生器(12)、投影部(16)、映像獲得部(18)、映像入力部(24)、マーカー点滅制御部(26)、投影制御部(28)、バッファ(32)、回転テーブル(100)、回転駆動部(102)、回転メカニズム(104)、マイクロプロセッサー(106)を含んで構成される。
【０１６５】
ここで、図３に図示された第１実施例の構成と同一の機能及び動作を行う構成要素については、同一の参照符号を与えた。また重複記載を避けるため、これらの構成要素に対する具体的な説明は省略する。
【０１６６】
前記回転テーブル(100)は、その上部板に測定対象物(10)を乗せた状態で、回動が可能な構造でなしていると同時に、前記上部板の外周部に複数のマーカー発生器(12)が測定対象物(10)と共に回転できるように固定、設置されている。
【０１６７】
前記回転駆動部(102)は、前記マイクロプロセッサー(106)の駆動制御により、回転テーブル(100)を目標角度ほど回転させるための駆動を行い、前記回転メカニズム(104)は回転駆動部(102)の駆動による動力を受け、回転テーブル(100)を目標角度ほど回転させるための構造を備えている。
【０１６８】
この際、本発明の第６実施例では、上記のように回転駆動部(102)を用いて、回転テーブル(100)を電気的な駆動で回転させるようになっている場合を例にして説明するが、回転メカニズム(104)を手動で操作し、操作者が任意的に移動させることができるように構成することも可能である。
【０１６９】
また回転テーブル(100)に限らず、マーカー発生器と測定対象が固定された状態で一緒に回転することができるのであれば、いかなる装置が適用されてもよい。
【０１７０】
前記マイクロプロセッサー(106)は、測定対象物(10)から獲得された測定データを分析し、一つの座標系に自動的に整列させるための専用のソフトウェアプログラムを駆動させた状態で、前記映像獲得部(18)から様々な角度で撮影された二次元映像データと三次元測定データを映像入力部(24)を通じて入力してもらい、それを分析し、様々な角度で撮影された測定データを一つの座標系に自動的に整列させるための演算処理を行うが、これに対する具体的な動作過程は上記の第１実施例でのマイクロプロセッサー動作過程と同じである。
【０１７１】
但し、本発明の第６実施例によるマイクロプロセッサー(106)は、測定対象物(10)のある一方の領域に関する二次元映像データと三次元測定データを獲得し、これに対する演算処理を行った後、他の領域に関する二次元映像データと三次元測定データを獲得しようとする時、回転テーブル(100)を回転させるように回転駆動部(102)を制御することになる。
【０１７２】
以下は、上記のように構成された本発明の第６実施例による三次元測定データ自動整列装置の動作過程について添付の図17a及び図17bのフローチャートを参照し、詳しく説明する。
【０１７３】
まず、回転テーブル(100)の上部板に測定対象物(10)が安着された状態で、マイクロプロセッサー(106)は回転駆動部(102)を駆動し、回転メカニズム(104)を作動させることにより、回転テーブル(100)を所定の角度に回転させ、測定対象物(10)を測定に適した位置へと回転させるようになる(段階S50)。
【０１７４】
そのような状態で、前記マイクロプロセッサー(106)はマーカー点滅制御部(26)を制御し、マーカー発生器(12)に具備されている複数のマーカー出力部(14)を点灯させ、前記測定対象物(10)の表面に複数のマーカーが不規則的に投影されるようにする(段階S51)。
【０１７５】
前記マーカー発生器(12)からの光学式マーカーが測定対象物(10)に投影されている状態で、映像獲得部(18)で前記測定対象物(10)の特定の領域を撮影し、光学式マーカーが含まれた二次元映像を獲得するようになると、前記マイクロプロセッサー(106)は映像入力部(24)を通じ、前記映像獲得部(18)から獲得された二次元映像データを入力してもらうことになる(段階S52)。
【０１７６】
その次に、前記マイクロプロセッサー(106)は前記マーカー点滅制御部(26)を制御し、前記マーカー発生器(12)が消灯され、光学式マーカーが測定対象物(10)に投影されないようにし(段階S53)、その状態で映像獲得部(18)で測定対象物(10)の同一領域を撮影し、光学式マーカーが含まれていない二次元映像を獲得すると、その二次元映像データを映像入力部(24)を通じて入力されることになる(段階S54)。
【０１７７】
また、前記マイクロプロセッサー(106)は前記マーカー発生器(12)が消灯され、光学式マーカーが投影されない状態で、投影制御部(28)を制御し、投影部(16)を動作させるようになり、その投影部(16)から三次元測定のための所定の模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記測定対象物(10)の表面に投影される。
【０１７８】
この際、映像獲得部(18)で模様パターンが投影された測定対象物(10)を撮影し、三次元測定データを獲得すると、前記マイクロプロセッサー(106)は映像入力部(24)を通じて三次元測定データが入力されることになる(段階S55)。
【０１７９】
そのような状態で、前記マイクロプロセッサー(106)は光学式マーカーが含まれた二次元映像データとマーカーが含まれていない二次元映像データを映像処理し、マーカーの二次元の位置を抽出するようになる(段階S56)。
【０１８０】
その次に、前記マイクロプロセッサー(106)は二次元映像データから抽出されたマーカーを用い、前記映像獲得部(18)のカメラのレンズ中心から二次元映像データでの任意の三つのマーカーに対する座標値と、一直線に位置する三次元測定データ上における任意の三次元の座標値を推定することにより、当該マーカーの三次元の位置を探すようになる(段階S57)。
【０１８１】
一方、前記マイクロプロセッサー(106)はバッファ(32)のレジスターが空いているか否かを判断する(段階S58)。
【０１８２】
前記判断の結果、前記バッファ(32)のレジスターが空いていないと判断されれば、マイクロプロセッサー(106)は上記の段階S57で探したマーカーの三次元の位置に対し、前記バッファ(32)のレジスターに登録された以前の三次元測定データ(すなわち、三次元測定データと重なるデータ)によるマーカーを比較し、相互組になるマーカーを検索することになる(段階S59)。
【０１８３】
上記のようなマーカーの検索処理により、現在の三次元測定データに含まれる光学式マーカーとバッファ(32)のレジスターに登録されたマーカーとの比較によって組となるマーカーを探すことができるようになると、前記マイクロプロセッサー(106)はそれぞれの三次元測定データで、対となるマーカーの位置から移動のための位置変換行列を求めるようになり(段階S60)、前記バッファ(32)のレジスターに登録された三次元測定データの位置を基準座標系とし、現在の測定データを移動させるようになる(段階S61)。
【０１８４】
その結果、前記マイクロプロセッサー(106)は現在の測定データから新しく探したマーカーをバッファ(32)のレジスターに登録させ、以前の測定データに異なるマーカーと整列させることになる(段階S62)。
【０１８５】
次に、前記マイクロプロセッサー(106)は前記測定対象物(10)に対し、獲得された三次元測定データにおける自動整列が完了されたか否かを判断する(段階S63)。
【０１８６】
前記判断の結果、前記測定対象物(10)から獲得された三次元測定データにおける自動整列が完了されていないと判断されれば、マイクロプロセッサー(106)は前記段階S50に戻り、前記回転駆動部(102)によって回転メカニズム(104)を作動させ、回転テーブル(100)を所定の角度ほど回転させることで、測定対象物(10)の他の測定領域に対し、投影部(16)と映像獲得部(18)を通じ、二次元映像及び三次元測定データを獲得することができるようにする。
【０１８７】
その後、制御部(106)は上記の段階S50から段階S62までの過程を反復的に実行するようになる。
【０１８８】
上記の通り、本発明の第６実施例は、測定対象物が移動するように構成されたもので、前記投影部と映像獲得部が移動するように構成されている本発明の第１実施例と比べ、相対的に大きさが小さい測定対象物から三次元測定データを獲得及び整列するのに適している。
【０１８９】
この際、マーカー発生器と測定対象物は測定が完了されるまで相対的な動きがあってはいけないので、回転テーブルにマーカー発生器を固定し、相対的な動きを防止した構造で構成した。
【０１９０】
一方、上記の本発明の実施例で使われた基準座標系を用いた整列方式は、三次元測定データの整列時、バッファのレジスターに保存されている、その以前の測定領域の三次元測定データの位置を基準座標系とし、新しく測定された領域の三次元測定データの位置を移動させて付けていく方式なので、測定対象物が大きくて測定領域の個数が多くなればなるほど映像獲得部の精密度による微細な誤差が増幅され、誤差値がかなり大きくなるおそれがある。
【０１９１】
例えば、図18の(a)と(b)は、同一の測定対象物に対し、境界部位が重なる隣接したそれぞれ異なる測定領域を測定したデータを示したもので、点線で表れた部分が測定対象物の実際のデータとすると、映像獲得部を通じて得られるデータは実線で表示された部分のように誤差値をもつようになる。
【０１９２】
これにより、図18の(a)及び(b)の測定データのうち、ある一つを基準座標系とし、この基準座標系にあと一つのデータを移動させて付けていくと、図18の(a)及び(b)の各測定データ間の誤差値が加わるので、図18の(c)に図示した実線のように誤差値が大きくなった測定データを得ることになる。
【０１９３】
すなわち、測定すべき領域が多くなると、誤差が生じるおそれが高まる。
【０１９４】
上記の問題を解決するために、本発明の第７及び第８実施例では、三次元測定データの位置を基準座標系ではない絶対座標系に整列する方法が提示される。
【０１９５】
ここで、絶対座標系は基準座標系とは違って、測定対象物の全体測定領域に対する三次元位置データが用いられるところ、全体測定データの誤差値は測定対象物の全体測定領域に対し、映像を獲得する映像獲得装置の誤差範囲を超えないようになる。
【０１９６】
例えば、図19の(a)と(b)を、同一の測定対象物に対し、境界部位が重なる隣接したそれぞれ異なる測定領域を測定したデータを示したものとした場合、図19の(c)に図示したような絶対座標系に上記の図19の(a)と(b)の測定データを移動させて付けると、図19の(d)に図示したように測定データは絶対座標系の誤差範囲と測定装置の誤差範囲を合わせた値を超えないようになるので、前記で説明した通り、映像獲得部の精密度によって誤差が増幅されるのを防止することができる。
【０１９７】
まず、添付された図面を参照し、本発明の第７実施例について詳しく説明する。
【０１９８】
本発明の第７実施例による三次元測定データ自動整列装置の構成は、図20に図示した通りで、同図面に図示したように、測定対象物(10)、マーカー発生器(12)、投影部(16)、映像獲得部(18)、移動駆動部(20)、移動メカニズム(22)、マーカー点滅制御部(26)、投影制御部(28)、バッファ(32)、大領域映像獲得部(110)、映像入力部(112)、第2移動駆動部(114)、第2移動メカニズム(116)、マイクロプロセッサー(118)、基準物体(120)を含んで構成される。
【０１９９】
ここで、図３に図示された第１実施例の構成と同一の機能及び動作を行う構成要素については、同一の参照符号を与えた。また、重複記載を避けるため、各構成要素に対する具体的な説明は省略する。
【０２００】
前記大領域映像獲得部(110)は、CCDカメラやCMOSカメラなどのように映像を受信することのできる映像センサーになっており、マーカー発生器(12)から測定対象物(10)の表面に光学的な方法でマーカーを投影すると、それによる映像を撮影して獲得することになるが、映像獲得部(10)とは別個に備えられ、測定対象物(10)の全体測定領域の映像を撮影して獲得することになる。
【０２０１】
ここで、大領域映像獲得部(110)は、細分化された測定領域の映像を獲得する映像獲得部(10)より相対的に精密度の高い映像センサーを採用することが望ましい。
【０２０２】
前記映像入力部(112)は、映像獲得部(18)及び大領域映像獲得部(110)から獲得された映像データが入力されるためのものである。
【０２０３】
前記第2移動駆動部(114)は、前記マイクロプロセッサー(118)の駆動制御により、映像獲得部(110)を測定対象物(10)に対して相対的に移動させるための駆動を行い、前記第2移動メカニズム(116)は、前記第2駆動部(114)の駆動による動力を受け、大領域映像獲得部(110)を測定対象物(10)に対し、一定の方向へ移動させるための構造を備えている。
【０２０４】
本発明の第７実施例では、第2移動駆動部(114)を適用し、大領域映像獲得部(110)を電気的な駆動によって移動させることができるようになっているが、第2移動メカニズム(116)を手動で操作し、操作者が任意的に移動できるようにすることも可能である。
【０２０５】
前記マイクロプロセッサー(118)は、マーカー発生器(12)から複数の光学式マーカーを測定対象物(10)の表面に投影させた状態で、大領域映像獲得部(110)から二つ以上の異なる方向で撮影された測定対象物(10)と基準物体(120)の映像データにより、測定対象の全体領域における各マーカーに対する三次元の位置を求め、求められた各マーカーの三次元の位置を絶対座標系に設定する演算処理を行う。
【０２０６】
これと共に、マイクロプロセッサー(118)は、映像獲得部(18)から様々な角度で撮影された二次元映像データと三次元測定データとを映像入力部(112)を通じ、それぞれ入力されそれを分析し、測定対象物(10)に対し、細分化された測定領域を撮影した様々な測定データを上記の絶対座標系に整列するための演算処理を行う。
【０２０７】
前記基準物体(120)は、マイクロプロセッサー(118)に既にその大きさに対する寸法情報が入力されている所定の形象の物体として、測定対象物(10)と隣接して配置され、大領域映像獲得部(110)を通じて測定対象物(10)と共に、その映像が獲得される。
【０２０８】
以下は、上記のように構成された本発明の第７実施例による三次元測定データ自動整列装置の動作過程について添付の図21a及び図21bのフローチャートを参照し、詳しく説明しようとする。
【０２０９】
まず、マーカー発生器(12)に測定対象物(10)を配置し、この測定対象物(10)に隣接した所定の地点に基準物体(120)を配置した状態でマイクロプロセッサー(118)は第2移動駆動部(114)を駆動し、移動メカニズム(116)を作動させることで、大領域映像獲得部(110)を測定対象物(10)の測定に適した位置へと移動させる。
【０２１０】
次に、マイクロプロセッサー(118)はマーカー点滅制御部(26)を制御し、マーカー発生器(12)に備えられている複数のマーカー出力部(14)を点灯させ、測定対象物(10)の表面に複数のマーカーが不規則的に投影されるようにする(段階S70)。
【０２１１】
前記マーカー発生器(12)からの光学式マーカーが測定対象物(10)に投影されている状態で、大領域映像獲得部(110)を通じ、基準物体(120)が含まれる測定対象物(10)の全体測定対象領域を撮影し、光学式マーカーが含まれた二次元映像を獲得するようになると、前記マイクロプロセッサー(118)は映像入力部(112)を通じ、前記大領域映像獲得部(110)から獲得された二次元映像データが入力されることになる(段階S71)。
【０２１２】
参考的として、図22には大領域映像獲得部(110)によって獲得される測定対象物(10)の全体測定対象領域と基準物体(120)が含まれる映像に対する一例を図示したものである。そして、同図面で参照符号の"RM"は測定対象物(10)の表面に投影された光学式マーカーを表し、参照符号の"BI"は大領域映像獲得部(110)によって獲得される映像を表す。 次に、マイクロプロセッサー(118)は第2移動駆動部(114)を駆動し、移動メカニズム(116)を作動させることで、大領域映像獲得部(110)を測定対象物(10)の測定に適した位置である他の地点へと移動させる(段階S72)。
【０２１３】
そして、マイクロプロセッサー(118)は上記の移動された他の地点で大領域映像獲得部(110)を制御し、基準物体が含まれる測定対象物(10)の全体測定対象領域を撮影することにより、前記段階S71とは異なる方向から光学式マーカーが含まれた二次元映像を獲得し、これを映像入力部(112)を通じて入力されることになる(段階S73)。
【０２１４】
次に、マイクロプロセッサー(118)は、マーカー点滅制御部(26)を制御し、前記マーカー発生器(12)を消灯させることで、光学式マーカーが測定対象物に投影されないようにする(段階S74)。
【０２１５】
マイクロプロセッサー(118)は大領域映像獲得部(110)を通じて獲得されたそれぞれ異なる方向の測定対象の全体領域に関するそれぞれの二次元映像を組み合わせると同時に、この映像に含まれている基準物体(120)の既に知っている寸法によって演算を行い、全体測定対象領域に含まれている各マーカーの三次元の位置を算出する(段階S75)。
そして、 マイクロプロセッサー(118)は上記の算出された各マーカーの三次元の位置をバッファ(32)のレジスターに登録する(段階S76)。
【０２１６】
次に、マイクロプロセッサー(118)は移動駆動部(20)を駆動し、移動メカニズム(22)を作動させることにより、投影部(16)と一体化された映像獲得部(18)を前記測定対象物(10)の測定に適した位置へと移動させるようになる(段階S77)。
【０２１７】
その状態で、マイクロプロセッサー(118)はマーカー点滅制御部(26)を制御し、マーカー発生器(12)に具備された複数のマーカー出力部(14)を点灯させ、前記測定対象物(10)の表面に複数のマーカーが不規則的に投影されるようにする(段階S78)。
【０２１８】
前記マーカー発生器(12)からの光学式マーカーが測定対象物(10)に投影されている状態で、映像獲得部(18)で前記測定対象物(10)の全体測定対象領域のうち、細分化された領域(図23の"NI"参照)を撮影し、光学式マーカーが含まれた二次元映像を獲得するようになると、マイクロプロセッサー(118)は映像入力部(112)を通じて前記映像獲得部(18)から獲得された二次元映像データが入力されることになる(段階S78)。
【０２１９】
次に、前記マイクロプロセッサー(118)は、マーカー点滅制御部(26)を制御し、マーカー発生器(12)が消灯され、光学式マーカーが測定対象物(10)に投影されないようにし(段階S80)、その状態で映像獲得部(18)から測定対象物(10)の同一領域を撮影し、光学式マーカーが含まれていない二次元映像を獲得すると、その二次元映像データを映像入力部(112)を通じて入力されることになる(段階S81)。
【０２２０】
また、前記マイクロプロセッサー(118)は、前記マーカー発生器(12)が消灯され、光学式マーカーが投影されない状態で、投影制御部(28)を制御し、投影部(16)を動作させるようになり、その投影部(16)から三次元測定のための所定の模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記測定対象物(10)の表面に投影される。
【０２２１】
この際、映像獲得部(18)で模様パターンが投影された測定対象物(10)を撮影し、三次元測定データを獲得すると、マイクロプロセッサー(118)は映像入力部(112)を通じて三次元測定データを入力してもらうことになる(段階S82)。
【０２２２】
そのような状態で、前記マイクロプロセッサー(118)は光学式マーカーが含まれた二次元映像データとマーカーが含まれていない二次元映像データを映像処理し、マーカーの二次元の位置を抽出するようになる(段階S83)。
【０２２３】
それと共に、前記マイクロプロセッサー(118)は二次元映像データから抽出されたマーカーを用い、前記映像獲得部(18)のカメラのレンズ中心から二次元映像データでの任意の三つのマーカーに対する座標値と、一直線に位置する三次元測定データ上における任意の三次元の座標値を推定することにより、当該マーカーの三次元の位置を探すこととなる(段階S84)。
【０２２４】
次に、マイクロプロセッサー(118)は上記の段階S84で探したマーカーの三次元の位置と、上記の段階S76でバッファ(32)のレジスターに保存したマーカーの三次元の位置を比較し合い互いに対になる、すなわち、それぞれ三次元の位置が同一のマーカーを検索する(段階S85)。
【０２２５】
上記のようなマーカーの検索処理により、現在の三次元測定データに含まれる光学式マーカーとバッファ(32)のレジスターに登録されたマーカーとの比較によって対となるマーカーを探すことができるようになると、前記マイクロプロセッサー(118)はそれぞれの三次元測定データのうち、 対となるマーカーの位置から移動のための位置変換行列を求めるようになる(段階S86)。この位置変換行列に現在の測定データを移動させる一方、バッファ(32)のレジスターに登録されたマーカーの三次元の位置を絶対座標系に設定し、この絶対座標系に整列する(段階S87)。
【０２２６】
次に、マイクロプロセッサー(118)は前記測定対象物(10)に対し、獲得された三次元測定データにおける自動整列が完了されたか否か、すなわち、測定対象物(10)の測定対象領域のうち、細分化された領域の三次元データが全て整列されたかを判断する(段階S88)。
【０２２７】
前記判断の結果、前記測定対象物(10)から獲得された三次元測定データにおける自動整列が完了されていないと判断されると、マイクロプロセッサー(106)は前記段階S50に戻り、移動駆動部(20)を駆動し、移動メカニズム(22)を作動させることで、まだ測定されていない領域を測定するのに適した位置へ投影部(16)と映像獲得部(18)を移動させながら、上記の段階S77から段階S88までの過程を反復的に行うようになる。
【０２２８】
前記第７実施例で、全体測定対象領域の映像を獲得する大領域映像獲得部と、細分化された測定領域の映像を獲得する映像獲得部とを別個に備えて構成した場合を例に挙げて説明したが、映像獲得部の一つを用いて全体測定対象領域の映像及び細分化された測定領域の映像を全部獲得するように構成することも可能である。
【０２２９】
次に、本発明の第８実施例について添付された図面を参照し、詳しく説明する。
【０２３０】
本発明の第８実施例による三次元測定データ自動整列装置の構成は、図24に図示した通りで、同図面に図示したように、測定対象物(10)、マーカー発生器(12)、投影部(16)、映像獲得部(18)、移動駆動部(20)、移動メカニズム(22)、マーカー点滅制御部(26)、投影制御部(28)、バッファ(32)、一組又は複数の大領域映像獲得部(130、132)、映像入力部(134)、マイクロプロセッサー(136)を含んで構成される。
【０２３１】
ここで、図３に図示された第１実施例の構成と同一の機能及び動作を行う構成要素については、同一の参照符号を与えた。そして、重複記載を避けるため、これに対する具体的な説明は省略する。
【０２３２】
前記一組の大領域映像獲得部(130、132)は、それぞれCCDカメラやCMOSカメラなどのように映像を受信することのできる映像センサーになっていると同時に、相互の設定距離ほど離隔、固定されており、それぞれ異なる角度で同一の測定対象領域に対して撮影を行い、映像を獲得する方法で、いわゆるステレオビジョン(Stereo Vision)と呼ばれている。
【０２３３】
ここで、各大領域映像獲得部(130、132)は、細分化された測定領域の映像を獲得する映像獲得部(10)より相対的に精密度の高い映像センサーを採用することが望ましい。
【０２３４】
前記映像入力部(134)は、映像獲得部(18)及び大領域映像獲得部(130、132)から獲得された映像データを入力してもらうためのものである。
【０２３５】
前記マイクロプロセッサー(136)は、マーカー発生器(12)から複数の光学式マーカーを測定対象物(10)の表面に投影させた状態で大領域映像獲得部(130、132)から異なる方向で撮影された測定対象物(10)の映像データにより、測定対象の全体領域における各マーカーに対する三次元の位置を求め、この大領域映像獲得部(130、132)によって得た映像から再び得られたマーカーの三次元の位置を絶対座標に使用する。
【０２３６】
これと共に、マイクロプロセッサー(136)は、映像獲得部(18)から様々な角度で撮影された二次元映像データと三次元測定データとを映像入力部(134)を通じ、それぞれ入力され、それを分析し、測定対象物(10)に対し細分化された測定領域を撮影した測定データを上記の絶対座標系に整列するための演算処理を行う。
【０２３７】
この方法は、上記の第１実施例での相互異なるオブジェクトをレジスタリングすることと同じ過程であり、対象オブジェクトが既に求めておいた絶対座標ということだけが違うだけである。
【０２３８】
以下は、上記のように構成された本発明の第８実施例による三次元測定データ自動整列装置の動作過程について添付の図25a及び図25bのフローチャートを参照し、詳しく説明する。
【０２３９】
まず、マーカー発生器(12)に所定の測定対象物(10)を配置した状態でマイクロプロセッサー(136)はマーカー点滅制御部(26)を制御し、マーカー発生器(12)に備えられている複数のマーカー出力部(14)を点灯させ、測定対象物(10)の表面に複数のマーカーが不規則的に投影されるようにする(段階S90)。
【０２４０】
前記マーカー発生器(12)からの光学式マーカーが測定対象物(10)に投影されている状態で、大領域映像獲得部(130、132)を通じて測定対象物(10)の全体測定対象領域をそれぞれ異なる方向から撮影し、光学式マーカーが含まれた二次元映像を重畳して獲得するようになると、マイクロプロセッサー(118)は映像入力部(134)を通じ、前記大領域映像獲得部(130、132)から獲得された二次元映像データをそれぞれ入力されることになる(段階S91)。
【０２４１】
参考的として、図26には大領域映像獲得部(130、132)によって獲得される測定対象物(10)の全体測定対象領域の映像に対する一例を図示したのである。そして、同図面で参照符号の"RM"は測定対象物(10)の表面に投影された光学式マーカーを表し、参照符号の"BI"は大領域映像獲得部(130、132)によって獲得される映像を表す。
【０２４２】
次に、マイクロプロセッサー(136)はマーカー点滅制御部(26)を制御し、マーカー発生器(12)を消灯させることで、光学式マーカーが測定対象物に投影されないようにする(段階S92)。
【０２４３】
マイクロプロセッサー(136)は大領域映像獲得部(130、132)を通じて獲得されたそれぞれ異なる方向の測定対象の全体領域に関する二次元映像情報により、演算を行い、全体測定対象領域に含まれている各マーカーの三次元の位置を算出する(段階S93)。
【０２４４】
すなわち、上記の段階S93で、大領域映像獲得部(130、132)間の距離は固定的で不変なものであり、その距離情報はマイクロプロセッサー(136)に保存されているので、一組の大領域映像獲得部(130、132)の位置と測定対象物(10)に投影された各マーカーの位置間における関係を三角測量法により演算することで、各マーカー間の三次元の位置が求められる。
【０２４５】
そして、 マイクロプロセッサー(136)は前記算出された各マーカーの三次元の位置をバッファ(32)のレジスターに登録する(段階S94)。
【０２４６】
次に、マイクロプロセッサー(136)は移動駆動部(20)を駆動し、移動メカニズム(22)を作動させることにより、投影部(16)と一体化された映像獲得部(18)を前記測定対象物(10)の測定に適した位置へと移動させるようになる(段階S95)。
【０２４７】
その状態で、マイクロプロセッサー(136)はマーカー点滅制御部(26)を制御し、マーカー発生器(12)に備えられた複数のマーカー出力部(14)を点灯させ、前記測定対象物(10)の表面に複数のマーカーが不規則的に投影されるようにする(段階S96)。
【０２４８】
前記マーカー発生器(12)からの光学式マーカーが測定対象物(10)に投影されている状態で、映像獲得部(18)で前記測定対象物(10)の全体測定対象領域のうち、細分化された領域(図2７の"NI"参照)を撮影し、光学式マーカーが含まれた二次元映像を獲得するようになると、マイクロプロセッサー(136)は映像入力部(134)を通じて前記映像獲得部(18)から獲得された二次元映像データが入力されることになる(段階S97)。
【０２４９】
次に、前記マイクロプロセッサー(136)はマーカー点滅制御部(26)を制御し、マーカー発生器(12)が消灯され、光学式マーカーが測定対象物(10)に投影されないようにし(段階S98)、その状態で映像獲得部(18)で測定対象物(10)の同一領域を撮影し、光学式マーカーが含まれていない二次元映像を獲得すると、その二次元映像データを映像入力部(24)を通じて入力されることになる(段階S99)。
【０２５０】
また、前記マイクロプロセッサー(136)は前記マーカー発生器(12)が消灯され、光学式マーカーが投影されない状態で、投影制御部(28)を制御し、投影部(16)を動作させるようになり、その投影部(16)から三次元測定のための所定の模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記測定対象物(10)の表面に投影される。
【０２５１】
この際、映像獲得部(18)で模様パターンが投影された測定対象物(10)を撮影し、三次元測定データを獲得すると、前記マイクロプロセッサー(136)は映像入力部(112)を通じて三次元測定データが入力されることになる(段階S100)。
【０２５２】
そのような状態で、前記マイクロプロセッサー(136)は光学式マーカーが含まれた二次元映像データとマーカーが含まれていない二次元映像データを映像処理し、マーカーの二次元の位置を抽出するようになる(段階S101)。
【０２５３】
それと共に、前記マイクロプロセッサー(136)は二次元映像データから抽出されたマーカーを用い、前記映像獲得部(18)のカメラのレンズ中心から二次元映像データでの任意の三つのマーカーに対する座標値と、一直線に位置する三次元測定データ上における任意の三次元の座標値を推定することにより、当該マーカーの三次元の位置を探すことになる(段階S102)。
【０２５４】
次に、マイクロプロセッサー(136)は上記の段階S102で探したマーカーの三次元の位置と上記の段階S94で、バッファ(32)のレジスターに保存したマーカーの三次元の位置を比較し、相互組になる、すなわち、三次元の位置が同一であるマーカーを検索する(段階S103)。
【０２５５】
上記のようなマーカーの検索処理により、現在の三次元測定データに含まれる光学式マーカーとバッファ(32)のレジスターに登録されたマーカーとの比較によって対となるマーカーを探すことができるようになると、前記マイクロプロセッサー(136)はそれぞれの三次元測定データで、対となるマーカーの位置から移動のための位置変換行列を求めるようになる(段階S104)。この位置変換行列に現在の測定データを移動させる一方、バッファ(32)のレジスターに登録されたマーカーの三次元の位置を絶対座標系に設定し、この絶対座標系に整列する(段階S105)。
【０２５６】
次に、マイクロプロセッサー(136)は前記測定対象物(10)に対し、獲得された三次元測定データにおける自動整列が完了されたか否かを判断する(段階S106)。
【０２５７】
前記判断の結果、前記測定対象物(10)から獲得された三次元測定データにおける自動整列が完了されていないと判断すると、マイクロプロセッサー(136)は前記段階S95に戻り、移動駆動部(20)を駆動し、移動メカニズム(22)を作動させることで、まだ測定されていない領域を測定するのに適した位置へ投影部(16)と映像獲得部(18)を移動させながら、上記の段階S95から段階S106までの過程を反復的に行うようになる。
【０２５８】
前記第８実施例で、全体測定対象領域の映像を獲得する一組の大領域映像獲得部と、細分化された測定領域の映像を獲得する映像獲得部及びマーカー発生器とを別個に構成した場合を例を挙げて説明したが、これに対する変形実施例として、一組の大領域映像獲得部とマーカー発生器を一体に構成することも可能である。だが、このように構成する場合、マーカー発生器で発生する光学式マーカーが投影される領域に合わせ、一組の大領域映像獲得部の位置値を設定する作業が不要になり、より簡単に使用できる。
【０２５９】
前記第８実施例におけるもう一つの異なる変形実施例として、一組の大領域映像獲得部と映像獲得部とを一体に構成することも可能であるが、このように構成する場合、絶対座標が得られる領域が多少小さくなるおそれもあり、精密度も多少低下するおそれもある反面、細分化された測定領域の映像を複数個獲得する時、各映像別に境界部位を重畳しなくても細分化された測定領域の映像を獲得する回数、すなわち、スキャンの回数を減少させることが可能となる。
【０２６０】
参考に、上記の本発明の第８実施例の原理について、付け加えて説明すると、以下の通りである。
【０２６１】
上記の本発明の第８実施例に具備された大領域映像獲得部(130、132)の幾何学的なモデルは、２台のカメラが一つの物体を眺めているような構造を持っていると同時に、応用分野によって様々な形態を表しているが、図27には２台のカメラが平行に配置されている構造を表した。
【０２６２】
上記の図27で、変数は次のように定義される。
【０２６３】
『X : 求めようとする位置の座標、
b : カメラ中心間の距離(base line distance)
f : カメラ焦点の長さ(camera's focal length)
A, B : 各カメラで獲得するイメージ面(image plane)
X₁, X_r : 各イメージ面の原点から求めようとする座標Ｘの像に対するイメージ像の座標
P, Q : 各カメラのレンズ中心(lens center)』
上記の図27で、ステレオ(stereo)映像から求めようとする位置の座標(X)を得る方法は、以下の数学式15及び16に示した通りである。
【０２６４】
【数１５】

【０２６５】
【数１６】

次に、本発明の第９実施例について添付された図面を参照し、説明する。
【０２６６】
この本発明の第９実施例では、投影部と映像獲得部及びマーカー発生器を、測定対象物を中心に複数個を配置することで、測定対象物の測定対象の全体領域における二次元映像及び三次元測定データを獲得するために投影部と映像獲得部を移動させる必要がなく、一回のスキャンで二次元映像及び三次元測定データを獲得することが可能であり、作業が簡単で所要時間を短縮することが可能な光学式マーカーを用いた三次元測定データ自動整列装置に対する構成について提示する。
【０２６７】
図28は、本発明の第９実施例による光学式マーカーを用いた三次元測定データ自動整列装置に対する構成を示した図面で、同図面を参照すると分かるように、本発明の第９実施例による三次元測定データ自動整列装置は、Ｎ個のマーカー発生器(142)と、Ｍ個の投影部(146)、Ｌ個の映像獲得部(148)、映像入力部(150)、投影制御部(152)、マーカー点滅制御部(154)、マイクロプロセッサー(156)、バッファ(158)で構成される。
【０２６８】
前記Ｎ個のマーカー発生器(142)は、光学的に測定しようとする測定対象物(10)の表面に映像獲得部(148)が認識できる模様を投影したもので、これには前記測定対象物(10)を指向する全面にわたり、複数の光学式マーカーがそれぞれ不規則的な調査方向を持って同時に投影されるようにする複数のマーカー出力部(144)が設置されている。
【０２６９】
前記Ｎ個のマーカー発生器(142)は、図28に図示した通り、測定対象物(10)を中心に一定の間隔で測定対象物(10)を指向する一方、各マーカー発生器(142)から投影される光学式マーカーの領域が測定対象物(10)の測定対象の全体領域を包括することができるように配置される。
【０２７０】
前記M個の投影部(146)は、測定対象物(10)の表面に対し、三次元データが獲得できるように所定の模様及びレーザーストライプを投影する。これはLCDプロジェクターのような投影装置を用いて空間符号化された光を測定対象物(10)の表面に投影したり、レーザー光を測定対象物(10)の表面に投影したりし、映像獲得部(148)を通じて三次元データとして獲得することができるようにしている。
【０２７１】
前記M個の投影部(146)は、図28に図示した通り、測定対象物(10)を中心に一定の間隔で測定対象物(10)を指向する一方、各投影部(146)から投影される空間符号化された光の領域が測定対象物(10)の測定しようとする全ての領域を包括することができるように配置される。
【０２７２】
前記L個の映像獲得部(148)は、CCDカメラやCMOSカメラなどのように、映像を受信することのできる映像センサーで成り立ち、マーカー発生器(142)から測定対象物(10)の表面に光学的な方法でマーカーを投影すると、それによる映像をそれぞれ撮影して獲得するようになる。
【０２７３】
前記L個の映像獲得部(148)の各々は、前記各投影部(146)に対し、別途のカメラとして設置されているわけでなく、個々の投影部(146)と内臓一体化することが望ましい。
そして、前記L個の映像獲得部(148)は、図28に図示した通り、測定対象物(10)を中心に一定の間隔で測定対象物(10)を指向する一方、各映像獲得部(148)の撮影領域が測定対象物(10)が測定しようとする全体領域を包括することができるように配置される。
【０２７４】
前記映像入力部(150)は、L個の映像獲得部(148)からそれぞれ獲得された映像データを入力してもらうためのものであり、前記投影制御部(152)はＭ個の投影部(146)を構成するパターンフィルムの移送速度と移送方向を制御すると共に、パターンフィルムを投影する光源の点滅周期を制御する。
【０２７５】
前記マーカー点滅制御部(154)は、マイクロプロセッサー(156)の制御により、Ｎ個のマーカー発生器(142)それぞれの光学式マーカーを周期的に点滅させるようになる。
前記マイクロプロセッサー(156)は、Ｍ個の投影部(146)及びＬ個の映像獲得部(148)により、それぞれ獲得された二次元映像と三次元測定データから各領域別のマーカーの三次元の位置を抽出し、この抽出されたマーカーの三次元の位置からそれぞれ重なる領域別に組となるマーカーを検索する。対となるマーカーによって位置変換行列を求めると同時に、求められた位置変換行列によって各三次元測定データの位置を変換して整列する演算処理を行う。
【０２７６】
前記バッファ(158)は、マイクロプロセッサー(156)の演算処理に必要なデータや結果データなどを保存する。
【０２７７】
以下は、上記のように構成された本発明の第９実施例による三次元測定データ自動整列装置の動作過程について、添付の図25a及び図25bのフローチャートを参照し、詳しく説明する。
【０２７８】
まず、適当な位置に測定対象物(10)を配置し、この測定対象物(10)を中心にＮ個のマーカー発生器(142)とＭ個の投影部(146)及びＬ個の映像獲得部(148)をそれぞれ配置した状態で、マイクロプロセッサー(156)はマーカー点滅制御部(154)を制御し、マーカー発生器(142)に備えられている複数のマーカー出力部(144)を点灯させ、測定対象物(10)の表面に複数のマーカーが不規則的に投影されるようにする(段階S110)。
【０２７９】
前記マーカー発生器(142)からの光学式マーカーが測定対象物(10)に投影されている状態で、Ｌ個の映像獲得部(148)それぞれで測定対象物(10)の測定対象領域を撮影し、光学式マーカーが含まれた二次元映像を獲得するようになると、マイクロプロセッサー(156)は映像入力部(150)を通じてＬ個の映像獲得部(148)から獲得された二次元映像データが入力されることになる(段階S111)。
【０２８０】
次に、マイクロプロセッサー(156)はマーカー点滅制御部(154)を制御し、Ｎ個のマーカー発生器(142)が消灯され、光学式マーカーが測定対象物(10)に投影されないようにし(段階S112)、その状態でＬ個の映像獲得部(148)それぞれで測定対象物(10)の同一領域を撮影し、光学式マーカーが含まれていない二次元映像を獲得すると、このＬ個の二次元映像データを映像入力部(150)を通じて入力されることになる(段階S113)。
【０２８１】
また、前記マイクロプロセッサー(156)はＮ個のマーカー発生器(142)が消灯され、光学式マーカーが投影されない状態で、投影制御部(152)を制御し、Ｍ個の投影部(146)を動作させるようになり、そのＭ個の投影部(146)からそれぞれの三次元測定のための所定の模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記測定対象物(10)の表面に投影される。
【０２８２】
この際、Ｌ個の映像獲得部(148)で模様パターンが投影された測定対象物(10)を撮影し、Ｌ個の三次元測定データを獲得すると、マイクロプロセッサー(156)は映像入力部(150)を通じてＬ個の三次元測定データが入力されることになる(段階S114)。
【０２８３】
そのような状態で、マイクロプロセッサー(156)は光学式マーカーが含まれた二次元映像データとマーカーが含まれていない二次元映像データを映像処理し、マーカーの二次元の位置を抽出するようになる(段階S115)。
【０２８４】
次に、マイクロプロセッサー(156)は二次元映像データから抽出されたマーカーを用い、Ｌ個の映像獲得部(148)それぞれのカメラのレンズ中心から二次元映像データでの任意の三つのマーカーに対する座標値と、一直線に位置する三次元測定データ上における任意の三次元の座標値を推定することにより、Ｌ個の三次元測定データ別のマーカーの三次元の位置を探すことになる(段階S116)。
【０２８５】
次に、マイクロプロセッサー(156)は上記の段階S116で探したＬ個の各三次元測定データ別のマーカーの三次元の位置を比較し、互いに対になるマーカーを検索するようになる(段階S117)。
【０２８６】
上記のようなマーカーの検索処理により、対となるマーカーを探すことができるようになると、前記マイクロプロセッサー(156)はそれぞれの三次元測定データで、対となるマーカーの位置から移動のための位置変換行列を求めるようになり(段階S118)、Ｌ個の三次元測定データのうち、ある一つの位置を基準座標系にし、上記の求められた位置変換行列により、現在の測定データを移動させて整列するようになる(段階S119)。
【０２８７】
次に、添付された図面を参照し、本発明の第１０実施例について説明する。
【０２８８】
この本発明の第１０実施例は、上記の第９実施例とハードウェアの構成は同じであるが、その動作過程の構成は異なる。
【０２８９】
従って、本発明の第１０実施例は、図28に図示されている第９実施例のハードウェアの構成を基にし、その動作過程については図30のフローチャートを参照し、詳しく説明する。
【０２９０】
まず、適当な位置に既に寸法が分かっている基準物体を配置し、この基準物体を中心にN個のマーカー発生器(142)とM個の投影部(146)及びL個の映像獲得部(148)をそれぞれ配置する。この際、基準物体は別途にキャリブレーションのために製作されたか、既に寸法が分かっている場合であれば、実際の測定対象物になり得る。
【０２９１】
この状態で、マイクロプロセッサー(156)はマーカー点滅制御部(154)を制御し、Ｎ個のマーカー発生器(142)に備えられたそれぞれのマーカー出力部(14)を点灯させ、基準物体の表面に複数のマーカーが不規則的に投影されるようにする(段階S120)。
【０２９２】
次に、マイクロプロセッサー(156)はＬ個の映像獲得部(148)と基準物体間の相関関係を求めるキャリブレーション作業を行うようになるが(段階S121)、これに対する具体的な動作過程について詳しく説明する。
【０２９３】
上記の段階S121において、Ｎ個のマーカー発生器(142)からの光学式マーカーが基準物体に投影されているところ、Ｌ個の映像獲得部(148)それぞれで測定対象物(10)の測定対象領域を撮影し、光学式マーカーが含まれた二次元映像を獲得するようになると、マイクロプロセッサー(156)は映像入力部(150)を通じてＬ個の映像獲得部(148)から獲得されたＬ個の二次元映像データが入力されることになる。
【０２９４】
次に、マイクロプロセッサー(156)は投影制御部(152)を制御し、Ｍ個の投影部(146)を動作させるようになり、そのＭ個の投影部(146)からそれぞれの三次元測定のための所定の模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記基準物体の表面に投影される。
【０２９５】
この際、Ｌ個の映像獲得部(148)で模様パターンが投影された基準物体を撮影し、Ｌ個の三次元測定データを獲得すると、マイクロプロセッサー(156)は映像入力部(150)を通じてＬ個の三次元測定データが入力されることになる。
【０２９６】
その状態で、マイクロプロセッサー(156)は光学式マーカーが含まれたマーカーの二次元の位置と既に知っている基準物体の寸法情報を用いて、Ｌ個の映像獲得部(148)それぞれのカメラのレンズ中心から二次元映像データでの任意の三つのマーカーに対する座標値と、一直線に位置する三次元測定データ上における任意の三次元の座標値を推定することにより、Ｌ個の各三次元データ別マーカーの三次元の位置を探すようになる。
【０２９７】
次に、マイクロプロセッサー(156)は前記Ｌ個の各三次元測定データ別のマーカーの三次元の位置を比較し、 互いに対となるマーカーを検索する。そして、それぞれの三次元測定データで、対となるマーカーの位置から移動のための位置変換行列を求める。
マイクロプロセッサー(156)は、上記求められた位置変換行列をバッファ(158)のレジスターに登録するようになり、これで段階S121のキャリブレーション作業が完了される。
上記のように、段階S121のキャリブレーション作業が完了されると、基準物体を除去し、基準物体があった場所に測定対象物(10)を配置することとなり、マイクロプロセッサー(156)はマーカー点滅制御部(154)を制御し、N個のマーカー発生器(142)が消灯され、光学式マーカーが測定対象物(10)に投影されないようにする(段階S122)。
【０２９８】
この状態で、Ｌ個の映像獲得部(148)ぞれぞれで測定対象物(10)の測定対象領域を撮影し、光学式マーカーが含まれていないＬ個の二次元映像を獲得すると、この二次元映像データを映像入力部(150)を通じて入力されることになる(段階S123)。
【０２９９】
また、マイクロプロセッサー(156)はＮ個のマーカー発生器(142)が消灯され、光学式マーカーが投影されない状態で、投影制御部(152)を制御し、Ｍ個の投影部(146)を動作させるようになり、そのＭ個の投影部(146)からそれぞれの三次元測定のための所定の模様パターン(例えば、間隔の異なる複数区間のストライプパターン又は多重ストライプパターン)が前記測定対象物(10)の表面に投影される。
【０３００】
この際、Ｌ個の映像獲得部(148)で模様パターンが投影された測定対象物(10)を撮影し、Ｌ個の三次元測定データを獲得すると、マイクロプロセッサー(156)は映像入力部(150)を通じてＬ個の三次元測定データが入力されることになる(段階S124)。
次に、マイクロプロセッサー(156)は、前記段階(S121)のキャリブレーションによって求められた位置変換行列をバッファ(158)のレジスターから読み込み、Ｌ個の三次元測定データのうち、ある一つの位置を基準座標系にし、前記バッファ(158)のレジスターから読み込んだ位置変換行列により、現在の測定データを移動させて整列するようになる(段階S125)。
【０３０１】
後で、他の測定対象物に対して測定を行ったり、同一の測定対象物に対して再び測定を行う際は、上記の段階S121から段階S123までのキャリブレーション作業が省略となり、バッファ(158)のレジスターに保存されている位置変換行列によって三次元測定データを整列するようになるので、作業時間が短縮される。
【０３０２】
但し、必要により、測定するごとに上記の段階S121から段階S123までのキャリブレーション作業を行うことも可能であり、これは作業者の意図やシステムの構成によって容易に変更して実施することができる。
【０３０３】
次に、本発明の第１１実施例について説明する。
【０３０４】
本発明の第１１実施例は、上記の本発明の第１実施例か第１０実施例で用いられるマーカー発生器及びその周辺装置(以下、「マーカー発生装置」という)の異なる実施例を提示する。
【０３０５】
本発明の第１１実施例によるマーカー発生装置は、図31に図示した通り、Ｘ軸の複数個の光源(160)と、Ｘ軸の点滅制御部(162)、ヒンジ軸を中心に回転ができるように構成されたX軸の多角形のポリゴンミラー(164)(Polygon Mirror)、Ｘ軸の回転駆動部(166)、Ｘ軸の回転メカニズム(168)と、Ｙ軸の複数個の光源(170)、Ｙ軸の点滅制御部(172)、ヒンジ軸を中心に回転ができるように構成されたＹ軸の多角形のポリゴンミラー(174)、Ｙ軸の回転駆動部(166)と、Ｙ軸の回転メカニズム(178)を含んで構成される。
【０３０６】
前記Ｘ軸の複数個の光源(160)は、レーザーなどの直進性が優れているビーム (beam)を発生させ、Ｘ軸の多角形のポリゴンミラー(164)の反射面に発散することで、例えば、レーザーポイントなどが使用できる。そして、前記Ｘ軸の点滅制御部(162)はマイクロプロセッサー(図示していない)からの制御により、Ｘ軸の各光源(160)を点滅制御する。
【０３０７】
Ｘ軸の多角形のポリゴンミラー(164)は、複数個の反射面を具備し、Ｘ軸の回転メカニズム(168)によって回転駆動しながら、複数個の光源(160)から発散されてくる複数個のビームを上記の複数個の反射面によって反射させ、測定対象物(OB)の測定領域に投影する。
【０３０８】
前記Ｘ軸の回転駆動部(166)は、マイクロプロセッサーの駆動制御により、Ｘ軸の多角形のポリゴンミラー(164)を一方向に回転させるための駆動を行い、前記Ｘ軸の回転メカニズム(168)はＸ軸の回転駆動部(166)の駆動による動力を受け、Ｘ軸の多角形のポリゴンミラー(164)を一方向に回転させるための構造を備えている。
【０３０９】
前記Ｙ軸の複数個の光源(170)はレーザーなどの直進性が優れているビームを発生し、Ｙ軸の多角形のポリゴンミラー(174)の反射面へ発散するもので、例えば、レーザーポイントなどが用いられる。そして、Ｙ軸の点滅制御部(172)はマイクロプロセッサー(図示していない)からの制御により、Ｙ軸の複数個の光源(170)を点滅制御する。
【０３１０】
前記Ｙ軸の多角形のポリゴンミラー(174)は、複数個の反射面を具備し、Ｙ軸の回転メカニズム(178)によって回転駆動しながら、複数個の光源(170)から発散されてくる複数個のビームを上記の複数個の反射面によって反射させ、測定対象物(OB)の測定領域に投影する。
【０３１１】
前記Ｙ軸の回転駆動部(176)は、マイクロプロセッサーの駆動制御により、Ｙ軸の多角形のポリゴンミラー(174)を一方向に回転させるための駆動を行い、前記Ｙ軸の回転メカニズム(178)はＹ軸の回転駆動部(166)の駆動による動力を受け、Ｙ軸の多角形のポリゴンミラー(174)を一方向に回転させるための構造を備えている。
【０３１２】
以下、上記のように構成された本発明の第１１実施例によるマーカー発生装置の動作過程について、詳しく説明することとする。
【０３１３】
まず、マイクロプロセッサーからの制御信号により、Ｘ軸の回転駆動部(166)及びＹ軸の回転駆動部(176)からの駆動電源がＸ軸の回転メカニズム(168)及びＹ軸の回転メカニズム(178)に認可され、Ｘ軸の回転メカニズム(168)及びＹ軸の回転メカニズム(178)はそれぞれＸ軸の回転駆動部(166)及びＹ軸の回転駆動部(176)から認可される駆動電源によって駆動され、Ｘ軸及びＹ軸の多角形のポリゴンミラー(164、174)を回転させる。
【０３１４】
これと共に、マイクロプロセッサーからの制御信号により、Ｘ軸の点滅制御部(162)及びＹ軸の点滅制御部(172)がそれぞれＸ軸の光源(160)とＹ軸の光源(170)を点灯させることにより、Ｘ軸及びＹ軸の複数個の光源(160、170)から発生されたビームがＸ軸の多角形のポリゴンミラー(164)及びＹ軸の多角形のポリゴンミラー(174)の反射面に入射される。
【０３１５】
前記Ｘ軸及びＹ軸の光源(160、170)から、それぞれＸ軸の多角形のポリゴンミラー(164)及びＹ軸の多角形のポリゴンミラー(174)の反射面に入射されるビームは、 Ｘ軸及びＹ軸の多角形のポリゴンミラー(164、174)の各反射面から反射され、測定対象物(OB)の表面に投影される。
【０３１６】
この際、前記Ｘ軸及びＹ軸の多角形のポリゴンミラー(164、174)は、それぞれ速く回転し、反射面の角度が異なるようになることで、 測定対象物(OB)の表面にはＸ軸及びＹ軸にそれぞれ多数個のビームによるラインが形成されると同時に、Ｘ軸及びＹ軸のラインが交差するそれぞれの交点が個々の光学式マーカー(RM)となる。
【０３１７】
例えば、Ｘ軸の光源(160)がｍ個であり、Ｙ軸の光源(170)がｎ個であると仮定すると、測定対象物(OB)の表面にはm * n個の交点が形成されることが可能であり、これらのm * n個の交点がそれぞれ光学式マーカー(RM)になるので、より少ない数の光源を用いて相対的に多い数の光学式マーカーを発生させることができるのである。
【０３１８】
上記のような本発明による実施例は上述したものに限らず、本発明が属する技術分野で通常の知識を持っている者に自明の範囲内で添付した特許請求の範囲に記載された技術の要旨を超えない限りで、色々と訂正及び変更して実施することができるということは勿論である。
【図面の簡単な説明】
【０３１９】
【図１】従来のステッカー式のマーカーを測定の対象物に付着させ、三次元的に測定するための状態を例示的に示した図である。
【図２】ステッカー式のマーカーを基準標識とし、相互の異なる測定データを整列する状態を例示的に示した図である。
【図３】本発明の第1実施例による光学式マーカーを用いた三次元測定データ自動整列装置に対する構成を示した図である。
【図４ａ】本発明の望ましい第１実施例により、光学式マーカーを用いて二次元映像データを獲得する状態と、パターン模様を用いて三次元測定データを獲得する状態を例示的に示した図である。
【図４ｂ】本発明の望ましい第１実施例により、光学式マーカーを用いて二次元映像データを獲得する状態と、パターン模様を用いて三次元測定データを獲得する状態を例示的に示した図である。
【図４ｃ】本発明の望ましい第１実施例により、光学式マーカーを用いて二次元映像データを獲得する状態と、パターン模様を用いて三次元測定データを獲得する状態を例示的に示した図である。
【図５】本発明の望ましい第１実施例により、光学式マーカーの点灯と消灯を通じて獲得される二次元映像データからマーカーの二次元位置を抽出する状態を例示的に示した図である。
【図６】カメラのレンズ中心とマーカーの二次元位置からマーカーの三次元位置を抽出する状態を例示的に示した図である。
【図７ａ】本発明の望ましい第１実施例により、相互の異なる映像データでの三角形の比較を通じてマーカーの対を求める動作を例示的に示した図である。
【図７ｂ】本発明の望ましい第１実施例により、相互の異なる映像データでの三角形の比較を通じてマーカーの対を求める動作を例示的に示した図である。
【図８ａ】本発明の望ましい第１実施例により、相互の異なる映像データでの三角形の比較において、異なる位置にある三角形の対を一致させる変換動作を例示的に示した図である。
【図８ｂ】本発明の望ましい第１実施例により、相互の異なる映像データでの三角形の比較において、異なる位置にある三角形の対を一致させる変換動作を例示的に示した図である。
【図８ｃ】本発明の望ましい第１実施例により、相互の異なる映像データでの三角形の比較において、異なる位置にある三角形の対を一致させる変換動作を例示的に示した図である。
【図８ｄ】本発明の望ましい第１実施例により、相互の異なる映像データでの三角形の比較において、異なる位置にある三角形の対を一致させる変換動作を例示的に示した図である。
【図９】本発明の望ましい第１実施例により、互いに異なる映像データで仮想的なマーカーを求めることで、マーカーの対を求める動作を例示的に示した図である。
【図１０ａ】本発明の第１実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図１０ｂ】本発明の第１実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図１１】本発明の第２実施例による光学式マーカーを用いた三次元測定データ自動整列装置における構成を示した図である。
【図１２】本発明の第２実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図１３】本発明の第３実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図１４】本発明の第４実施例による光学式マーカーを用いた三次元測定データ自動整列装置における構成を示した図である。
【図１５】本発明の第５実施例による光学式マーカーを用いた三次元測定データ自動整列装置における構成を示した図である。
【図１６】本発明の第６実施例による光学式マーカーを用いた三次元測定データ自動整列装置における構成を示した図である。
【図１７ａ】本発明の第６実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図１７ｂ】本発明の第６実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図１８】基準座標系により、測定データを整列する時の誤差を説明するための図である。
【図１９】絶対座標系により、測定データを整列する時の誤差を説明するための図である。
【図２０】本発明の第７実施例による光学式マーカーを用いた三次元測定データ自動整列装置における構成を示した図である。
【図２１ａ】本発明の第７実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図２１ｂ】本発明の第７実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図２２】図２０に図示した大領域の映像獲得部を用いて得ることのできる映像の一例を図示した図である。
【図２３】図２０に図示した大領域の映像獲得部及び映像獲得部を用いて得ることのできる映像の一例を図示した図である。
【図２４】本発明の第８実施例による光学式マーカーを用いた三次元測定データ自動整列装置における構成を示した図である。
【図２５ａ】本発明の第８実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図２５ｂ】本発明の第８実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図２６ａ】図２４に図示した一組みの大領域の映像獲得部を用いて得ることのできる映像の一例を図示した図である。
【図２６ｂ】図２０に図示した一組みの大領域の映像獲得部及び映像獲得部を用いて得ることのできる映像の一例を図示した図である。
【図２７】本発明の第８実施例の原理について説明するための概略図である。
【図２８】本発明の第９実施例による光学式マーカーを用いた三次元測定データ自動整列装置における構成を示した図である。
【図２９】本発明の第９実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図３０】本発明の第１０実施例による光学式マーカーを用いた三次元測定データ自動整列方法における動作を説明するためのフローチャートである。
【図３１】本発明の第１１実施例によるマーカー発生装置における構成を示した図面である。
【符号の説明】
【０３２０】
10:測定対象物、 12:マーカー発生器、
14:マーカー出力部、 16:投影部、
18:映像獲得部、 20:移動駆動部、
22:移動メカニズム、 24:映像入力部、
26:マーカー点滅制御部、 28:投影制御部
30:マイクロプロセッサー、 32:バッファ（Buffer）【Technical field】
[0001]
  The present invention relates to an apparatus and method for automatically aligning three-dimensional measurement data using an optical marker. More specifically, the present invention relates to a three-dimensional measurement by measuring the shape of a three-dimensional measurement object at various positions and angles. The present invention relates to a three-dimensional measurement data automatic alignment apparatus and method using an optical marker for automatically aligning the relative positions of these three-dimensional measurement data in one coordinate system after obtaining the data. .
[Background]
[0002]
  In general, when measuring a predetermined measurement object, the optical three-dimensional measuring apparatus can obtain surface three-dimensional data only in an area that can be seen by the three-dimensional measuring apparatus.
[0003]
  Therefore, in order to measure other regions of the object that cannot be seen by the three-dimensional measuring apparatus, the measurement object is rotated or moved, or the part to be measured is moved by moving the measuring apparatus itself. It must be measured after being positioned so that it can be seen. Also, in order to obtain perfect 3D data through such measurement data, the process of measuring 3D measurement objects in various directions and angles and aligning these data in one coordinate system and synthesizing them. Should be done.
[0004]
  In this case, the reason for aligning in one coordinate system is generally defined based on the coordinate system in which each measurement data is fixed to the measuring device, but it is a three-dimensional measurement to photograph an object from different angles. When the device is moved to a different position and angle, the 3D data measured at the moved position is defined in the coordinate system together with the 3D measurement device, and the data taken at different positions is defined in the different coordinate system. It is because it has been.
[0005]
  In order to match such coordinate systems, the amount of movement of the measuring device must be known, and the amount of movement can be calculated by moving the measuring device using a numerically controlled device. There are a method of finding an absolute movement amount and a method of calculating an amount of movement of the measuring device based only on measured data. When calculating the amount of movement of the measuring device using only the measured data, such as the latter, when measuring an object, the measurement data should be measured so that they overlap each other. Corresponding points are input at the overlapping portions of the measured data, and coordinate conversion is performed so that the input corresponding points coincide.
[0006]
  At this time, in the operation of manually inputting corresponding points for the overlapping portions in the measurement data, an error may occur when the corresponding points are input by the operator. In particular, if there is no characteristic figure on the surface of the object, more errors will occur. Also, if the object is large and its shape is complicated, it is necessary to repeat measurements from several tens to several hundreds of times while changing the angle and position of the three-dimensional measuring device, so the operator inputs corresponding points. As time increases, errors due to manual operations accumulate frequently, due to an operator's mistake, corresponding points are input incorrectly, or incorrect alignment occurs due to the accumulation of corresponding points. become.
[0007]
  To compensate for the above drawbacks, it is possible to attach a small object that can be marked, recently called a marker or target, to the surface of the object to be measured. Thus, a method for recognizing a marker or a target mark and helping an operator to input an appropriate corresponding point has been developed. Moreover, a technology for automating the recognition of corresponding points through video processing algorithms has been developed.
That is, FIG. 1 is a diagram illustrating a state in which a conventional sticker-type marker is attached to a measurement object and is measured three-dimensionally. In the drawing, the measurement object has a predetermined three-dimensional shape. A plurality of markers (4) are randomly attached along the entire surface of the object (2), and at the same time, the surface of the measurement object (2) to which each marker (4) is attached is attached to each region. I will shoot repeatedly so that they overlap.
[0008]
  When the surface of the measurement object (2) to which a plurality of markers (4) are attached is photographed so as to overlap and it is possible to acquire a plurality of measurement data, the markers ( Recognize corresponding points according to 4). This is as illustrated in FIG.
[0009]
  As shown in FIG. 2, when the first and second measurement data (I1, I2) obtained by imaging the overlapping area on the surface of the measurement object (2) are acquired, the first measurement data (I1 ) And the second measurement data (I2), the operator searches for numbers that are common between (M1) and (M2) of the marker video data, and matches each as a corresponding point. The data can be arranged.
[0010]
  On the other hand, in the case of technology that automates the recognition of corresponding points, use a method that puts different patterns into each marker, searches for unique markers through video processing, and automatically aligns different measurement data based on these markers. There is also.
DISCLOSURE OF THE INVENTION
[Problems to be solved by the invention]
[0011]
  In the case of the corresponding point recognition technology for measurement data using a conventional marker, since the marker occupies a certain physical volume with respect to the measurement object, the measurement object becomes attached to the surface of the measurement object. A part of the surface can only be obstructed, and the part obstructed by the marker has the disadvantage of being lost from the measurement data.
[0012]
  In such a case, the data lost in the part where the marker was found is interpolated later, and it is estimated and filled, or the measurement data of the lost part is measured after removing the marker and measuring again. Although there is a method to acquire again, all of these methods have the disadvantage that not only a lot of work time is required but also the precision of the measurement is lowered.
[Means for Solving the Problems]
[0013]
  The present invention is for solving the above-mentioned problems, and its purpose is to use a non-contact marker that can be optically generated without losing the measurement portion of the measurement object. It is an object of the present invention to provide a three-dimensional measurement data automatic alignment apparatus and method using an optical marker that can automatically align three-dimensional data measured at different angles.
[0014]
[Means for Solving the Problems]
  In a preferred embodiment, the present invention provides a measurementFixed objectTheShooting at various anglesAcquired byAlign 3D measurement dataMakeIn the three-dimensional data measuring apparatus, optical marker generating means for projecting a plurality of optical markers onto the surface of the measurement object, and a pattern pattern on the surface of the measurement object for three-dimensional measurement of the measurement object And a three-dimensional projection means for projecting the measurement objectAbove2D image including the marker projected by the optical marker generating meansGetAnd projected by the three-dimensional projection means.The3D measurement data of the measurement objectGetAnd a video acquisition means for performingGetFrom the relationship between the two-dimensional image and the three-dimensional measurement dataAboveControl means for extracting a three-dimensional position of a marker and performing an operation of searching for a relative position of the three-dimensional measurement data from the three-dimensional position of the marker;Under the control of the control means, in order to binarize the plurality of markers in the optical marker generating means, a plurality of the markers included in each group are sequentially set by overlapping division according to a predetermined order. Individual flashing control means for controlling lighting automatically, the control means for each group included in a plurality of video data acquired by the video acquisition means in a number corresponding to the number of groups of the markers There is provided a three-dimensional measurement data automatic alignment device using an optical marker, wherein binary information by the marker is searched and a two-dimensional position is extracted as a unique ID in each marker.
[0015]
  In order to achieve the above object, according to the method of the present invention, the step of moving the image acquisition means to a position suitable for acquiring the image of the specific area of the measurement object, and the blinking of the marker generation means Driving the optical marker onto the surface of the measurement object, and acquiring a two-dimensional image of the specific area of the measurement object on which the optical marker is projected by the image acquisition unit; A pattern is projected onto the surface of the measurement object, and three-dimensional measurement data for a specific area of the measurement object on which the pattern is projected by the image acquisition unit is acquired and acquired by the image acquisition unit. The 3D position of the marker is extracted from the relationship between the 2D image and the 3D measurement data, and the 3D measurement data is extracted from the marker position of each 3D measurement data. Locate the relative position, it provides a three-dimensional measurement data automatic alignment method using an optical marker and its characterized by comprising at the stage of aligning each measurement data.
【The invention's effect】
[0016]
  According to the present invention, it is for automatically aligning three-dimensional measurement data obtained from different angles and positions, and the conventional method is such as a paper sticker or magnet printed with a pattern for image recognition. The relative position of different measurement data is searched using markers with a volume, the surface of the measurement object is blocked by the marker at the part where the marker is present, and the measurement data is lost at the part where the marker is present On the other hand, in the present invention, the relative position of different measurement data is searched using an optical marker that does not have a physical volume. There is an effect that measurement data is not lost by the marker even in a portion where the marker is present.
[0017]
  In addition, since the optical marker according to the present invention does not require a process of attaching or removing the marker to / from the measurement object, three-dimensional measurement data can be measured quickly. Therefore, it is very convenient to use, safe for measuring objects that may be damaged, and can be used semipermanently.
BEST MODE FOR CARRYING OUT THE INVENTION
[0018]
  Hereinafter, the first embodiment of the present invention configured as described above will be described in detail with reference to the accompanying drawings.
[0019]
  That is, FIG. 3 is a view illustrating a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a first embodiment of the present invention.
[0020]
  As shown in FIG. 3, the 3D measurement data automatic alignment apparatus according to the first embodiment of the present invention includes a marker generator (12), a projection unit (16), a video acquisition unit (18), and a movement drive unit (20 ), A moving mechanism (22), a video input unit (24), a marker blinking control unit (26), a projection control unit (28), a microprocessor (30), and a buffer (32).
[0021]
  The marker generator (12) is for projecting a pattern that can be recognized by the image acquisition unit (18) on the surface of the measurement object (10) to be optically measured. A plurality of marker output sections (14) are provided so that a plurality of optical markers are projected simultaneously with mutually irregular investigation directions over the entire surface directed to the measurement object (10).
[0022]
  The plurality of marker output units (14) of the marker generator (12) preferably apply laser points capable of projecting a plurality of red points on the surface of the measurement object (10). When the laser point like this is applied, it is possible to easily grasp the position of the point projected on the surface of the measurement object (10) from the image acquired by the image acquisition unit (18) such as a camera. Become.
[0023]
  Here, the marker generator (12) is not limited to the laser point, and can fix the relative position between the measurement target to be measured and the marker generator (12) during measurement. It is possible to repeat the step of making the marker appear or disappear at the same position on the surface of the measurement object (10). Further, any optical marker that has a deep optical depth and can be successfully focused on the surface of the measurement object (10) may be applied.
[0024]
  The marker generator (12) is arranged so that a plurality of optical markers can be arranged along the periphery of the object so that the optical markers are evenly projected onto the surface of the measurement object (10). The number of can be changed according to the size of the measurement object (10) and the measurement region. In addition, the marker generator (12) is capable of projecting an optical marker onto the entire surface of the measurement object (10), so that a plurality of the measurement objects (10) are arranged in various directions. It is desirable to be able to position the object, and it is fixed so that there is no relative movement with respect to the measurement object (10) during photographing by the image acquisition unit (18).
[0025]
  In the drawing, the projection unit (16) projects a predetermined pattern or laser stripe on the surface of the measurement object (10) so that three-dimensional data can be acquired. This is because the spatially encoded light is projected onto the surface of the measurement object (10) using a projection device such as an LCD projector, or the laser light is projected onto the surface of the measurement object (10), and the image is It can be acquired as three-dimensional data through the acquisition unit (18).
[0026]
  Here, the projection unit (16) employs a slide projector or an electronic LCD projector composed of a light source capable of projecting a predetermined pattern, a pattern film and a lens, or a laser diode capable of projecting a laser stripe. Preferably, a series of stripes are projected onto the measurement object (10) while the pattern film having the stripes is transferred between the light source and the lens by a predetermined transfer means.
[0027]
  In short, the pattern film is composed of a film in which a stripe pattern having a plurality of sections such as five is printed in the horizontal direction. In addition, the pattern film of the projection unit (16) was obtained by the applicant on February 28, 2002.In KoreaFiledKoreaPatent Document No. 2002-10839 (Title of Invention: Three-dimensional Measuring Device and Method Using Multiple Stripe Patterns), a film having a form in which multiple stripes are formed for each section, Also good.
[0028]
  The same can be said for a measuring apparatus using a laser stripe.
[0029]
  In addition, when the projection unit (16) optically performs a three-dimensional measurement, when the marker is projected onto the measurement object (10) at the time when the three-dimensional measurement is performed, the measurement data is damaged. For this reason, it is desirable to prevent the marker from being projected onto the measurement object (10) while the measurement is performed.
[0030]
  The image acquisition unit (18) is composed of an image sensor capable of receiving an image, such as a CCD camera or a CMOS camera, and optically moves from the marker generator (12) to the surface of the measurement object (10). If a marker is projected by the method, the resulting image is captured and acquired.
[0031]
  The video acquisition unit (18) can be installed as a separate camera with respect to the projection unit (16), but it is desirable that the video acquisition unit (18) is integrated with the projection unit (16). This is not only to acquire the 2D image projected from the optical marker, but also to acquire the 3D image projected from the projection unit (16), so that the configuration of the equipment is simplified. In addition, by using the same image acquisition means, any point in the 2D image and the corresponding point on the 3D measurement data can be matched without a separate calibration (calibration system correction) work. It becomes possible.
[0032]
  Here, the image acquisition unit (18) is synchronized with the blinking cycle of the marker generator (12) with respect to the optical marker and the blinking cycle of the projection unit (16), and is applied to each surface region of the measurement object (10). On the other hand, 2D video data and 3D measurement data are captured and acquired, which is the same as that shown in FIG. 4a or 4c.
[0033]
  As shown in FIG.4a, in the image acquisition unit (18), the marker generator (12) is turned on, and a plurality of laser markers are projected onto the surface of the measurement object (10). The first image data (40) obtained by photographing a predetermined area of the measurement object on which the optical laser marker (RM) is irregularly projected is acquired.
[0034]
  Next, as shown in FIG.4b, the image acquisition unit (18) is in a state where the marker generator (12) is turned off and no laser marker is projected on the surface of the measurement object (10). The second image data (42) consisting only of the image of the measurement object (10) is acquired.
[0035]
  Further, as shown in FIG. 4c, the image acquisition unit (18) is the projection unit (18) in a state where the marker generator (12) is turned off and no laser marker is projected onto the measurement target (10). The three-dimensional measurement data by the stripe projected on the measurement object (10) from 16) is captured and acquired. This is because the first to fifth measurement data (44a to 44e) are obtained by sequentially capturing three-dimensional images of the first to fifth stripes (PT1 to PT5) in which five sections exist at different intervals depending on the pattern film. Will be acquired in the form of
[0036]
  Here, the present invention is exemplarily set so that there are five sections of the pattern film to be employed, but the present invention is not limited thereto, and there may be five or more patterns.
[0037]
  The movement drive unit (20) is configured to measure the projection unit (16) and the image acquisition unit (18) in order to acquire an image of the measurement object (10) by driving control of the microprocessor (30). A drive for moving the object (10) relatively is performed.
[0038]
  The movement mechanism (22) has power transmitted by driving the movement drive unit (20), and the projection unit (16) and the image acquisition unit (18) are fixed to the measurement object (10). A structure for moving in the direction is provided.
[0039]
  Here, in the present invention, the movement drive unit (20) is applied, and the projection unit (16) and the image acquisition unit (18) can be moved by electrical drive. ) Can be manually operated so that the operator can arbitrarily move it.
In the drawing, the video input unit (24) is for receiving video data acquired from the video acquisition unit (18), and a marker blinking control unit (26) is connected to the microprocessor (30). ) Causes the optical marker of the marker generator (12) to blink.
[0040]
  The projection control unit (28) controls the transfer speed and transfer direction of the pattern film constituting the projection unit (16), and controls the blinking of the light source that projects the pattern film.
[0041]
  The microprocessor (30) analyzes the measurement data acquired from the measurement object (10) and drives the video acquisition in a state where a dedicated software program for automatically aligning the measurement data in one coordinate system is driven. Two-dimensional video data and three-dimensional measurement data photographed at various angles from the unit (18) are input through the video input unit (24), and the measurement data photographed at various angles are analyzed into one Arithmetic processing for automatically aligning with the coordinate system is performed.
[0042]
  Here, as shown in FIG. 5, the microprocessor (30) includes first video data (40) including a laser marker (RM) and second video data (42) not including a laser marker. On the other hand, video processing for searching for the position of the marker is performed, and the third video data (46) from which only the laser marker (RM) is extracted is acquired.
[0043]
  In this state, as shown in FIG. 6, the microprocessor (30) is a two-dimensional image data (52) in which the lens center (50) of the camera of the image acquisition unit (18) and the position of the optical marker are extracted. The three-dimensional coordinate value corresponding to the marker position can be acquired by the relationship between the coordinate value for any three markers from the lens center (50) of the camera of the image acquisition unit (18). Corresponds to the position of the marker by estimating an arbitrary 3D coordinate value (a ', b', c ') on the 3D measurement data (54) located in line with (a, b, c) Three-dimensional coordinate values (a ′, b ′, c ′) can be obtained.
[0044]
  When the projection unit (16) and the image acquisition unit (18) are integrated and installed together, the three-dimensional coordinate value of the pixel corresponding to the marker position can be obtained immediately, but the image acquisition When the unit (18) is installed separately from the projection unit (16), by performing calibration (calibration: coordinate system correction) between the projection unit (16) and the video acquisition unit (18), A three-dimensional coordinate value corresponding to the marker can be obtained. Through the above-described steps, the three-dimensional coordinate value at the position where the marker is located can be known through the three-dimensional measurement data obtained at various angles.
[0045]
  At this time, it is preferable that 4 to 5 or more markers are included in one measurement data, and it is preferable that two adjacent measurement data include three or more common markers.
[0046]
  This is because, in order to define a unique position in the coordinate system in the three-dimensional space, not only three or more points are required, but also a matter required when searching for a corresponding marker described later.
[0047]
  In the present invention, when an optical marker is used through the marker generator (12), it is possible to use a different pattern for each marker so that the markers can be distinguished. However, in such a case, since tens or hundreds of marker output units (14) must be able to project markers with different patterns, the configuration and production of the equipment may be complicated. is there.
[0048]
  In the present invention, since the microprocessor (30) automatically aligns the three-dimensional measurement data of the adjacent region acquired by continuous imaging of the measurement object (10), it is calculated from the respective three-dimensional measurement data. The relative position information between markers is used so that the markers can be distinguished.
[0049]
  For example, if there are three points on the space formed by the markers, one triangle can be constructed using them. Generally, triangles formed by three different points are different from each other. Therefore, each triangle can be distinguished by comparing the inner angle of the triangle and the length of the side. Then, using this, it is possible to distinguish each marker corresponding to the vertex of the triangle. This process will be described in more detail as follows.
[0050]
  That is, as shown in FIGS. 7a and 7b, one measurement data (60) has M points obtained from the marker, and the other measurement data (62) has N points obtained from the marker. If there is a point, the measurement data (60)_MC_ThreeCan be composed of different triangles, other measurement data (62)_MC_ThreeA number of different triangles can be constructed. Total after composing these triangles_MC_Three×_NC_ThreeFind matching triangle pairs through each comparison.
[0051]
  First, as shown in FIG. 7a, in the microprocessor (30), a plurality of triangles (T1, T2) are formed by points obtained by markers included in one measurement data (60), and other measurements are performed. A plurality of triangles (T3, T4) are formed by the points obtained by the markers included in the data (62).
[0052]
  Next, as shown in FIG. 7b, the microprocessor (30) is a pair of triangles that match with each triangle (T1, T2) (T3, T4) obtained from the markers of each measurement data (60, 62). To find out.
[0053]
  Here, there are various methods for determining whether or not each triangle matches, but a pair of triangles can be searched for by comparing the lengths of the sides. That is, for the two triangles (T1, T3) to be compared, the lengths of the three sides (a1, a2, a3) (b1, b2, b3) are obtained, and the lengths of the sides are all the same. If the order of each side is the same, it can be determined that the triangles match.
[0054]
  First, the length of each side is arranged in descending order, and when a triangle having all three sides of the same length is found, if at least two such triangles are detected, the order of each side is checked. Thus, by comparing the lengths of the longest sides of each triangle in the counterclockwise direction, it is determined that the triangles having the same length are matched.
[0055]
  As described above, after distinguishing the corresponding markers in each measurement data, the measurement data is moved so that these markers can be located at the same point in one coordinate system. The data (60) is used as a reference coordinate, and is moved by applying a transformation that matches the same triangle included in the measurement data different from the triangle in the reference coordinate system.
[0056]
  That is, the transformation for matching two triangles at different positions is as shown in FIGS. 8a to 8d.
[0057]
  As shown in FIG. 8a, when two triangles having the same position and different positions are given, information on the corresponding vertices and sides is already acquired while obtaining the congruence of the triangles.
[0058]
  As shown in FIG. 8b, a process is performed in which two triangles are converted to match the position of one vertex, the reference coordinate system for one triangle is set to A, and the coordinate system B of the remaining triangles is matched to A. The relational expression of the translation matrix (T) corresponding thereto is as shown in Equation 1 below.
[0059]
[Expression 1]

  Next, as shown in FIG. 8c, when performing a rotation transformation that matches the edges containing the matched vertices for two triangles, the rotation transformation that matches any two vectors that share a point is a rotation. This is performed as shown in Equation 2 representing the matrix (R1).
[0060]
[Expression 2]

  As described above, when rotation conversion is performed, the result is as shown in FIG. 8d, and the relationship of the rotation matrix (R2) for making this coincide with one vertex is as shown in Equation 3 below.
[0061]
[Equation 3]

  As described above, if you drop the perpendicular from one vertex that is not included in the corresponding side as the rotation axis and then rotate it to the corner between the two line segments, you can match the two triangles. Is expressed by the following equation (4).
[0062]
[Expression 4]

  In addition, one point (P) of the measurement data in which each triangle is included can be moved to a new position by the following formula 5.
[0063]
[Equation 5]

  On the other hand, as described above, the microprocessor (30), as described above, adjusts some measurement data to the marker reference by conversion performed on the basis of congruence of triangles, and then performs an operation for more accurately matching the data. Since the size of the marker is not a mathematical point, some errors may occur, and the positions of the markers are adjusted based on mesh data that is not marker data. This is called registering, and each measurement data can be more accurately adjusted to one coordinate system through such a process.
[0064]
  When the predetermined point cloud data A is to be matched with the coordinate system of the point cloud data B, A is forcedly moved and rotated (Rigid Body Tranformation) to match the coordinate system of B. At this time, n points of A to be matched are P = [p_i], The point of B corresponding to this is Q = [x_i], The moving and rotating transformations are obtained by using the least square method capable of minimizing the corresponding P and Q distances, and such transformations are applied to A. Accordingly, the average distance between the point cloud data A and B on the opposite sides of P and Qn is minimized, and the average distance between P and Q is a tolerance for finding the corresponding point and finding the movement and rotation transformation to apply. Repeat until inside.
[0065]
  As a method for obtaining the corresponding point bi, the point B closest to the normal direction of each point A is obtained, and these two points are made point bi.
[0066]
  A transformation that minimizes the distance between two corresponding points is obtained using the method of least squares, and the function for the transformation is as shown in Equation 6 below.
[0067]
[Formula 6]

  Where Q is the registering state vector, Q = [Q_R｜ Q_T]²become. However, Q_RIs a Quaternion Vector, which is Q_R= [q₀q₁q₂q_Three]^t(q> = 0, q₀ ² + q₁ ² + q₂ ² + q_Three ²= 1). Q_TIs the translation vector, which is Q_T= [q_Fourq_Fiveq₆]^tIt corresponds to.
[0068]
  In the above Equation 6, f (Q) is pi to R (Q_R) And Q_TX when applying transformation_iR (Q that can minimize f (Q) at this time_R) And Q_TIs obtained by the method of least squares.
[0069]
  In Equation 6, R (Q_R) Can be represented by a 3 × 3 rotation matrix, which is defined by Equation 7 below.
[Expression 7]

[0070]
  If the set of measurement data (P) is defined as P = [pi] and the reference data set (X) is defined as X = [xi], the center volume of P and X is the center of mass. , Defined by Equation 8 below.
[0071]
[Equation 8]

  Also, the cross-covariance matrix of P and X (Σ_px) Is defined by Equation 9 below.
[0072]
[Equation 9]

  Here, Cyclic Components of the Anti-symmetric Matrix (A_ij) To form a column vector (Δ), which is a symmetric 4 × 4 matrix Q (Σ_px) Is defined as Equation 10 below.
[0073]
[Expression 10]

  Where I_ThreeIs a 3 × 3 identity matrix.
[0074]
  In the above formula, Q_TIs Q (Σ_px) Is the eigenvector corresponding to the maximum eigenvalue, and the quaternion (q₀, q₁, q₂, q_Three) And is substituted into Equation 7 to obtain a rotational transformation. Meanwhile, Q_T(q_Four, q_Five, q₆) Is R (Q obtained from Equation 7 above._R) To match the volume center, it can be obtained from the following equation (11).
[0075]
## EQU11 ##

  As a result, the finally represented matrix value is as shown in Equation 12 below.
[0076]
[Expression 12]

  In the microprocessor (30), when the corresponding markers are also distinguished from each of the remaining three-dimensional measurement data acquired from the video acquisition unit (18), the one measurement data (60) is obtained. A matrix for movement is obtained as a reference coordinate so that it can be automatically aligned.
[0077]
  On the other hand, unlike the method shown in FIG. 8a or 8d, as a method of moving measurement data after searching for congruent triangles, a method of matching coordinate systems using the least square method is used. Will be.
[0078]
  Since there is information on the corresponding vertices while determining whether or not the two triangles can be congruent, the optimal rotation and movement transformation matrix (T) is expressed as It can be obtained by the following equation 13.
[0079]
[Formula 13]

  An equation for moving by applying the point cloud data (P) which attempts to make the matrix like the mathematical formula 13 coincide with the coordinate system is defined by the following mathematical formula 14.
[0080]
[Expression 14]

  On the other hand, in the microprocessor (30), in the case of the method of searching for a triangle pair, three or more markers must be included in the area where each measurement data overlaps, but there are two markers in each measurement data It is difficult to measure, and at this time, it is possible to distinguish the markers by another method.
[0081]
  That is, since each measurement data including a marker has three-dimensional shape information, it is possible to distinguish even if only two markers are used. As shown in FIG. The measurement data (64) forms two points on the space with two markers (RM1, RM2), and the different measurement data (66) forms two points on the space with two markers (RM3, RM4). If a vector perpendicular to each point is used, different markers can be distinguished by comparing the two points and the two vectors for each measurement data (64) (66).
[0082]
  On the other hand, in the microprocessor (30), when the number of markers projected for each measurement data is large and the arrangement of the markers is uniform, there is a possibility that the set is wrong. In such a case, an additional reference point is generated and compared using the marker and the two-dimensional data. For example, if there are three common points, a triangle is formed by these points, a perpendicular perpendicular to the triangle is drawn at the center of the weight of the triangle, and then the intersection of the perpendicular and the three-dimensional data is obtained. 4 reference points are obtained. Thereafter, using the marker or the average vertical vector information of the object surface from around the marker, a matching pair can be searched for.
[0083]
  If there are only two common points in the measurement data, draw a straight line connecting these two points, draw a circle on a plane perpendicular to the straight line at the midpoint of the straight line, and then When the intersection with the measurement data is obtained, the fourth and fifth reference points are obtained.
[0084]
  According to a preferred embodiment of the present invention, in addition to the method described above, any method can be used that automatically creates a reference point around the marker and automatically aligns the three-dimensional measurement data. It goes without saying that this is the case.
[0085]
  In FIG. 3, the buffer 32 registers the marker information newly obtained by the automatic alignment process for the three-dimensional measurement data of the microprocessor 30 in each register.
[0086]
  Next, the operation according to the first embodiment of the present invention performed as described above will be described in detail with reference to the flowcharts of FIGS. 10a and 10b.
[0087]
  First, in a state where a predetermined measurement object (10) is seated on the marker generator (12) side, the microprocessor (30) drives the movement drive unit (20) and activates the movement mechanism (22). Accordingly, the image acquisition unit (18) integrated with the projection unit (16) is moved to a position suitable for the measurement of the measurement object (10) (step S10).
[0088]
  In this state, the microprocessor (30) controls the marker blinking control unit (26), turns on the plurality of marker output units (14) provided in the marker generator (12), and the measurement object A plurality of markers are irregularly projected on the surface of (10) (step S11).
In a state where the optical marker from the marker generator (12) is projected onto the measurement object (10), a specific area of the measurement object (10) is photographed by the image acquisition unit (18), and the optical type When acquiring the 2D image including the marker, the microprocessor 30 receives the 2D image data acquired by the image acquisition unit 18 through the image input unit 24. Step S12).
[0089]
  Next, the microprocessor (30) controls the marker blinking control unit (26) so that the marker generator (12) is extinguished so that the optical marker is not projected onto the measurement object (10). (Step S13), in that state, the same area of the measurement object (10) is photographed from the image acquisition unit (18), and when acquiring a 2D image not including the optical marker, the 2D image data is obtained. The video is input through the video input unit (24) (step S14).
[0090]
  Further, the microprocessor (30) operates the projection unit (16) by controlling the projection control unit (28) in a state where the marker generator (12) is turned off and no optical marker is projected. From the projection unit (16), a pattern pattern for three-dimensional measurement (for example, a stripe pattern of multiple sections with different intervals or a multiple stripe pattern) is projected onto the surface of the measurement object (10). .
[0091]
  At this time, if the image acquisition unit (18) captures the measurement object (10) on which the pattern pattern is projected and acquires the three-dimensional measurement data, the microprocessor (30) passes through the image input unit (24). Measurement data will be input (step S15).
[0092]
  In that state, the microprocessor (30) performs image processing on the 2D video data including the optical marker and the 2D video data not including the marker, and extracts the 2D position of the marker (step). S16).
[0093]
  Next, the microprocessor (30) uses the markers extracted from the two-dimensional video data, and coordinates for any three markers in the two-dimensional video data from the camera lens center of the video acquisition unit (18). By estimating the value and an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker is searched (step S17).
[0094]
  On the other hand, the microprocessor (30) determines whether or not the register of the buffer (32) is free (step S18).
[0095]
  As a result of the determination, if it is determined that the register of the buffer (32) is not free, the previous tertiary registered in the register of the buffer (32) with respect to the three-dimensional position of the marker searched in step S17. The markers based on the original measurement data (that is, the data that overlaps the current three-dimensional measurement data) are compared to search for a pair of markers (step S19).
[0096]
  When the marker search process as described above finds a marker to be paired by comparing the marker included in the current three-dimensional measurement data with the marker registered in the register of the buffer (32), the microprocessor ( 30) comes to obtain a matrix for movement from the position of the marker paired with the three-dimensional measurement data (step S20), the position of the three-dimensional measurement data registered in the register of the buffer (32) as a reference The current measurement data is moved to the coordinate system (step S21).
[0097]
  As a result, the microprocessor (30) registers the newly searched marker from the current measurement data in the register of the buffer (32), and aligns the previous measurement data with a different marker (step S22).
[0098]
  Next, the microprocessor (30) determines whether or not the automatic alignment for the three-dimensional measurement data acquired for the measurement object (10) is completed (step S23).
[0099]
  As a result of the determination, if it is determined that the automatic alignment with respect to the three-dimensional measurement data acquired from the measurement object (10) is not completed, the control proceeds to step S10, and the movement driving unit (20 ) The movement mechanism (22) is operated under the drive of), and the process from step S10 to step S22 is repeated while moving the projection unit (16) and the image acquisition unit (18) to suitable positions. It will be.
[0100]
  Next, a second embodiment of the present invention will be described in detail with reference to the accompanying drawings.
[0101]
  That is, FIG. 11 is a view showing a configuration for a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a second embodiment of the present invention. The second embodiment of the present invention is the same as the first embodiment. The same reference numerals are given to components performing the same functions and operations, and detailed descriptions thereof are omitted.
[0102]
  A three-dimensional measurement data automatic alignment device according to a second embodiment of the present invention includes a marker generator (70), a projection unit (16), an image acquisition unit (18), a movement drive unit (20), and a movement mechanism (22). A video input unit (24), a marker individual blinking control unit (74), a projection control unit (28), a microprocessor (76), and a buffer (32).
[0103]
  The marker generator (70) is for projecting a pattern that can be recognized by the image acquisition unit (18) on the surface of the measurement object (10) to be optically measured, which is the measurement object ( A plurality of marker output units (72) are provided so that a plurality of optical markers are projected in mutually irregular investigation directions over the entire surface directed to 10).
[0104]
  The marker generator (70) controls the marker individual blinking control unit (74) to sequentially illuminate a plurality of marker output units (72) from 1 to Nth one by one, and acquire the video A different marker is projected for each video acquired from the section (18).
[0105]
  The individual marker blinking control unit (74) sequentially controls a plurality of marker output units (72) included in the marker generator (70) according to a predetermined order under the control of the microprocessor (76). And blink control individually.
[0106]
  The microprocessor (76) receives two-dimensional video data and three-dimensional measurement data photographed at various angles from the video acquisition unit (18) through the video input unit (24) and analyzes them. Although calculation processing is performed to automatically align measurement data photographed at various angles into one coordinate system, this was performed with all the markers being extinguished by the image acquisition unit (18). A video is set as a basic video, and a plurality of videos shot in a state where the markers are sequentially turned on from the first to the Nth are respectively compared, and a two-dimensional position of each marker is searched and extracted.
[0107]
  Next, the microprocessor (76) compares the two-dimensional measurement data from which the marker position is extracted with the three-dimensional measurement data, and searches for a marker that is paired with the function of searching for the three-dimensional position of the marker. The function for obtaining the movement matrix and the function for moving the three-dimensional measurement data to the reference coordinate system are advanced in the same manner as the function shown in the first embodiment of the present invention.
[0108]
  Subsequently, the operation according to the different embodiment of the present invention performed as described above will be described in detail with reference to the flowchart of FIG.
[0109]
  First, in a state where a predetermined measurement object is seated on the marker generator (70) side, the microprocessor (76) drives the movement drive unit (20) and operates the movement mechanism (22), The image acquisition unit (18) integrated with the projection unit (16) is moved to a position suitable for the measurement of the measurement object (10) (step S30).
[0110]
  In that state, the microprocessor (76) makes all the optical markers from the marker generator (70) disappear, and acquires the video data taken from the video acquisition unit (18) as a basic video. Will do.
[0111]
  Next, the microprocessor (76) controls the marker individual blink control unit (74), and is designated first among the plurality of marker output units (72) provided in the marker generator (70). The marker output unit (72) is turned on so that the first marker is projected on the surface of the measurement object (10) (step S31), and the first image captured from the image acquisition unit (18) is displayed. As video data (step S32).
[0112]
  Further, the microprocessor (76) controls the individual marker blinking control unit (74), and in accordance with a predetermined order among the plurality of marker output units (72) of the marker generator (70). That is, the second designated marker output unit is turned on, and the second optical marker is projected onto the measurement object (10) (step S33), and is photographed from the image acquisition unit (18). Is acquired as the Nth video data, that is, the second video data (step S34).
[0113]
  In this state, the microprocessor (76) determines whether or not the marker included in the image captured in the step is the last marker among a plurality of markers specified in advance (step S35).
[0114]
  As a result of the determination, if it is determined that the marker included in the image captured from the image acquisition unit (18) is not the last marker among the plurality of markers, the operations of Step S33 and Step S34 are repeated. When executed, the plurality of marker output units (72) of the marker generator (70) are lit sequentially and individually such as 3, 4,..., Nth, and the optical markers are measured (10 ), And each time the respective markers are individually lit, the individual video shot from the video acquisition unit (18) is acquired as the third, fourth,..., Nth video.
[0115]
  On the other hand, when the microprocessor (76) determines that the marker included in the video acquired from the video acquisition unit (76) is the last marker, the marker generator (70) is turned off. The projection control unit (28) is controlled in a state in which the optical marker is not projected, and the projection unit (16) is operated, and the projection unit (16) starts a predetermined pattern for three-dimensional measurement. A pattern (for example, a stripe pattern or a multiple stripe pattern of a plurality of sections with different intervals) is projected onto the surface of the measurement object (10).
[0116]
  At this time, when the measurement object (10) on which the pattern pattern is projected is photographed by the image acquisition unit (18) and the three-dimensional measurement data is acquired, the microprocessor (76) receives the tertiary through the image input unit (24). The original measurement data is input (step S36).
[0117]
  On the other hand, the microprocessor (76) reads the first to Nth video data taken with the first to Nth markers sequentially and individually turned off, with the markers turned off. The two-dimensional position of the marker can be easily extracted by comparing with the acquired basic image and searching for the region formed by the optical marker (step S37).
[0118]
  Next, the microprocessor (76) can detect the three-dimensional position of the marker by comparing the two-dimensional position of the marker extracted by comparing the two-dimensional images with the three-dimensional measurement data. A paired marker is searched from each video data photographed adjacently from the original position, a movement matrix is obtained thereby, and the three-dimensional measurement data is moved to the reference coordinate system (step S38).
[0119]
  On the other hand, the microprocessor (76) determines whether or not the automatic alignment for the three-dimensional measurement data acquired for the measurement object (10) has been completed (step S39).
[0120]
  As a result of the determination, if it is determined that automatic alignment with respect to the three-dimensional measurement data acquired from the measurement object (10) is not completed, the control proceeds to step S30, and the movement drive unit (20) The process from step S30 to step S38 is repeated while moving the projection unit (16) and the image acquisition unit (18) to suitable positions while the movement mechanism (22) is operating under driving. .
[0121]
  Next, a third embodiment of the present invention will be described in detail with reference to the accompanying drawings.
[0122]
  That is, the configuration of the two-dimensional measurement data automatic alignment apparatus according to the third embodiment of the present invention is the same as the components shown in FIG.
[0123]
  However, in the second embodiment of the present invention, when N markers are individually projected by the marker generator (70), N images should be taken individually, but the third embodiment Then, since the N markers generated in the marker generator (70) are binarized, the number of times that images are shot by lighting them separately for each group is log₂Decrease to (N + 1).
[0124]
  The marker individual blinking control unit (74) divides a plurality of marker output units (72) installed in the marker generation unit (70) by the control of the microprocessor (76) for each group for binarization, Control is performed to selectively light only the output part of the marker corresponding to the group.
[0125]
  The marker individual blinking control unit (74) is, for example, the number of marker output units (72) installed in the marker generation unit (70) is 16, and when a total of 16 markers can be generated, the marker binarization For this purpose, 16 markers are divided into four groups and set.
[0126]
  That is, the markers included in the first group correspond to the ninth to sixteenth markers, the markers included in the second group correspond to the fifth to eighth markers, and the thirteenth to sixth markers, 3 The markers in the 4th group are the 3rd, 4th, 7th, 8th, 11th, 12th, 15th and 16th markers, and the 4th group is the even number (2,4,6,8,12,14 , 16) Corresponding to the marker, such a relationship is as shown in Table 1 below.
[0127]
[Table 1]

  However, “0” indicates that the marker is turned off, and “1” indicates that the marker is turned on.
As shown in Table 1 above, the first marker is always kept in the extinguished state, while the 16th marker is always kept in the lit state, and all markers have their own lit values. It becomes like this.
[0128]
  The microprocessor (76) controls the marker individual blinking control unit (76) so that the markers divided into groups already set can be sequentially turned on, and the markers acquired through the image acquisition unit (18). The number of video data corresponding to the number of groups is compared to extract the two-dimensional position of the marker.
[0129]
  Here, as shown in Table 1, the microprocessor (76) sequentially turns on the 16 markers for each group, and when acquiring the first video to the fourth video data, the tenth marker is represented by the binary number “1001”. 16 different IDs, that is, two-dimensional position values can be detected for 16 markers in the same way as the 13th marker is recognized as binary “1100”. become. At this time, since the first marker is kept in a state of being extinguished, it becomes impossible to actually use it, and a total of 15 markers can be used substantially.
[0130]
  Therefore, if 10 video data are acquired, 1024 different unique IDs can be distinguished, and 1023 markers can be used substantially.
[0131]
  Further, the microprocessor (76) compares the two-dimensional measurement data from which the marker position is extracted with the three-dimensional measurement data, and searches for a marker to be paired with a function for searching for the three-dimensional position of the marker. The function for obtaining the movement matrix and the function for moving the three-dimensional measurement data to the reference coordinate system are made to proceed in the same way as the function shown in the first embodiment of the present invention.
[0132]
  Next, the operation according to the third embodiment of the present invention performed as described above will be described in detail with reference to the flowchart of FIG.
[0133]
  First, as shown in Table 1 above, there are 16 marker output units (72) installed in the marker generator (70), a total of 16 markers are projected, and a total of four markers are projected by the video acquisition unit (18). The acquisition of two two-dimensional video data will be described as an example.
[0134]
  First, in a state where a predetermined measurement object (10) is seated on the marker generator (70) side, the microprocessor (76) drives the movement drive unit (20) and activates the movement mechanism (22). Thus, the image acquisition unit (18) integrated with the projection unit (16) is moved to a position suitable for the measurement of the measurement object (10) (step S40).
[0135]
  In this state, the microprocessor (76) controls the marker individual blinking control unit (74), and the marker included in the first group among the group-specific markers set in advance by the marker generation unit (70). The marker output unit (72) is turned on so that the (9th to 16th markers) can be projected (step S41), and the first video data captured by the video acquisition unit (18) is input to the video input unit ( 24) (step S42).
[0136]
  Next, the microprocessor (76) controls the marker individual blinking control unit (74) to select the Nth group among the group-specific markers preset by the marker generation unit (70), that is, 2 The marker output unit (72) is turned on so that the markers (5th to 8th, 13th to 16th) included in the second group can be projected (step S43), and the image acquisition unit (18) Thus, the Nth video data captured in step S44, that is, the second video data is acquired (step S44).
[0137]
  At this time, the microprocessor 76 determines whether the marker group included in the video data acquired in the step is the last group set in advance (step S45).
[0138]
  As a result of the determination, when the microprocessor (76) determines that the marker group included in the video data acquired from the video acquisition unit (18) is not the last group, the process proceeds to step S43. By repeating the process up to step S44, the third group of markers (3,4,7,8,1,12,15,16th markers) is turned on to acquire the third video data. Then, the fourth group of markers (2, 4, 6, 8, 10, 12, 14, 16 and 16th markers) is turned on to acquire the fourth video data.
[0139]
  Meanwhile, when it is determined that the marker group included in the video data acquired from the video acquisition unit (18) is the last group according to the determination result of the step S45, the marker generator (70) The projection control unit (28) is controlled and the projection unit (16) is operated in a state in which the optical marker is not projected and the projection unit (16) is operated. Are projected onto the surface of the measurement object (10).
[0140]
  At this time, when the measurement object (10) on which the pattern pattern is projected is photographed by the image acquisition unit (18) and the three-dimensional measurement data is acquired, the microprocessor (76) receives the tertiary through the image input unit (24). The original measurement data is input (step S46).
[0141]
  Next, the microprocessor (76) compares binarization information based on the first to Nth images acquired by the image acquisition unit (18), that is, the first image to the fourth image data. The unique ID, that is, the two-dimensional position is extracted (step S47).
[0142]
  On the other hand, the microprocessor (76) detects the three-dimensional position of the marker by comparing the two-dimensional position of the marker extracted by the comparison of the two-dimensional data of the two-dimensional video data with the three-dimensional measurement data. Search for markers that are paired with each video data photographed adjacently from the three-dimensional position, and obtain a movement matrix by that, and move the three-dimensional measurement data to the reference coordinate system ( Step S47).
[0143]
  Meanwhile, the microprocessor (76) determines whether or not the automatic matrix for the three-dimensional measurement data acquired for the measurement object (10) can be completed (step S49).
[0144]
  As a result of the determination, if it is determined that the automatic alignment with respect to the three-dimensional measurement data acquired from the measurement object (10) is not completed, the control proceeds again to the step S40, and the movement drive unit (20 ) While the movement mechanism (22) is operating under the drive of), the process from step S40 to step S48 is repeated while moving the projection unit (16) and the image acquisition unit (18) to suitable positions. It becomes like this.
[0145]
  Hereinafter, a fourth embodiment of the present invention will be described in detail with reference to the accompanying drawings.
[0146]
  The configuration of the three-dimensional measurement data automatic alignment apparatus according to the fourth embodiment of the present invention is as shown in FIG. 14, and as shown in the drawing, the measurement object (10), the projection unit (16) , Video acquisition unit (18), movement drive unit (20), movement mechanism (22), video input unit (24), projection control unit (28), buffer (32), marker generator (80), marker individually The flashing control unit (84) and the microprocessor (86) are included.
[0147]
  Here, the same reference numerals are given to components that perform the same functions and operations as the configuration of the first embodiment shown in FIG. In addition, in order to avoid repeated descriptions, a specific description regarding each component is omitted.
[0148]
  The marker generator (80) is for projecting a pattern that can be recognized by the image acquisition unit (18) on the surface of the measurement object (10) to be optically measured, which is the measurement object ( A plurality of marker output sections (82) are provided so that a plurality of optical markers can be projected with mutually irregular investigation directions over the entire surface directed to 10).
[0149]
  The marker generator (80) is configured to selectively blink and drive the plurality of marker output units (82) under the control of the marker individual blinking control unit (84).
[0150]
  The marker individual blinking control unit (84) individually blinks and controls the plurality of marker output units (82) included in the marker generator (80) under the control of the microprocessor (86).
[0151]
  The microprocessor (86) acquires the image while driving a dedicated software program for analyzing the measurement data acquired from the measurement object (10) and automatically aligning it in one coordinate system. Two-dimensional video data and three-dimensional measurement data photographed at various angles from the unit (18) are input through the video input unit (24) and analyzed to obtain measurement data photographed from various angles. Although arithmetic processing for automatically aligning in one coordinate system is performed, the specific operation process is the same as the operation process of the microprocessor in the first embodiment.
[0152]
  However, the microprocessor (86) according to the fourth embodiment of the present invention acquires 2D video data and 3D measurement data for one region of the measurement object (10), and performs arithmetic processing on this. When the marker generator (80) is turned on in order to acquire 2D image data and 3D measurement data for different areas, the marker projected on the area where the image and measurement data have already been acquired has a predetermined period (e.g., On the other hand, the marker individual blinking control unit (84) is controlled so that the marker projected on the remaining area can be kept in the lighting state.
[0153]
  Conversely, the marker projected on the area where the video and measurement data have already been acquired maintains the lighting state, while the marker projected on the remaining area can be repeatedly blinked at a predetermined cycle. .
[0154]
  In this way, by changing the blinking state of the marker projected on the area where the video and measurement data have already been acquired and the marker projected on the remaining area, the tester in charge of the measurement and the video and measurement data It is easy to visually confirm the area where the image is acquired and the remaining area, and the convenience of measurement can be achieved through this.
[0155]
  Next, a fifth embodiment of the present invention will be described in detail with reference to the accompanying drawings.
[0156]
  The configuration of the three-dimensional measurement data automatic alignment apparatus according to the fifth embodiment of the present invention is as shown in FIG. 15, and as shown in FIG. 15, the measurement object (10), the projection unit (16), the image Acquisition unit (18), movement drive unit (20), movement mechanism (22), video input unit (24), projection control unit (28), buffer (32), marker generator (90), marker individual flashing / It includes a hue control unit (94) and a microprocessor (96).
[0157]
  Here, the same reference numerals are given to components performing the same functions and operations as the configuration of the first embodiment illustrated in FIG. 3, and a detailed description thereof is omitted to avoid redundant description.
[0158]
  The marker generator (90) is for projecting a pattern that can be recognized by the image acquisition unit (18) on the surface of the measurement object (10) to be optically measured, which is the measurement object ( A plurality of marker output sections (92) are provided so that a plurality of optical markers can be projected with mutually irregular investigation directions over the entire surface directed to 10).
[0159]
  In this case, the marker generator can selectively investigate light of two or more different colors at least by each marker output unit (92) under the control of the individual blinking / hue control unit (94). It is configured as follows. For example, each marker output unit (92) can include at least two light sources of different colors, and selectively turn on these light sources to generate light of different hues.
[0160]
  The marker individual blinking / hue control unit (94) controls blinking and individual hues of a plurality of marker output units (92) included in the marker generator (90) by the control of the microprocessor (96). Will do.
[0161]
  The microprocessor (96) acquires the image while driving a dedicated software program for analyzing the measurement data acquired from the measurement object (10) and automatically aligning it in one coordinate system. Although the calculation process for automatically aligning the two-dimensional image data and the three-dimensional measurement data photographed at various angles from the unit (18) into one coordinate system is performed, the specific operation process for this is described above. The operation process of the microprocessor in one embodiment is the same.
[0162]
  However, the microprocessor (96) according to the fifth embodiment of the present invention obtains 2D image data and 3D measurement data for a certain area of the measurement object (10), and performs arithmetic processing on the data. When turning on the marker generator (90) to acquire 2D image data and 3D measurement data for different areas, the projected marker and the remaining area are projected on the area where the image and measurement data have already been acquired. The marker individual blinking / hue control unit (94) is controlled so that the color of the marked marker is projected differently.
[0163]
  Therefore, the tester who is in charge of measurement has acquired the video and measurement data, and the marker projected on the remaining area and the marker projected on the remaining area have different colors. This area can be easily confirmed with the naked eye, and the convenience of measurement can be achieved through this area.
[0164]
  Next, a sixth embodiment of the present invention will be described in detail with reference to the accompanying drawings.
The configuration of the three-dimensional measurement data automatic alignment apparatus according to the sixth embodiment of the present invention is as shown in FIG. 16, and as shown in the drawing, the measurement object (10), the marker generator (12), the projection Unit (16), video acquisition unit (18), video input unit (24), marker blinking control unit (26), projection control unit (28), buffer (32), rotation table (100), rotation drive unit (102 ), A rotation mechanism (104), and a microprocessor (106).
[0165]
  Here, the same reference numerals are given to components that perform the same functions and operations as the configuration of the first embodiment shown in FIG. Moreover, in order to avoid duplication, the concrete description with respect to these components is omitted.
[0166]
  The rotary table (100) is configured to be rotatable with the measurement object (10) placed on the upper plate, and at the same time, a plurality of marker generators ( 12) is fixed and installed so that it can rotate with the object to be measured (10).
[0167]
  The rotation driving unit (102) performs driving for rotating the rotation table (100) by a target angle by driving control of the microprocessor (106), and the rotation mechanism (104) is a rotation driving unit (102). And a structure for rotating the rotary table (100) by a target angle.
[0168]
  At this time, in the sixth embodiment of the present invention, the case where the rotary table (100) is rotated by electrical drive using the rotary drive unit (102) as described above will be described as an example. However, the rotation mechanism (104) may be manually operated so that the operator can arbitrarily move it.
[0169]
  In addition to the rotary table (100), any device may be applied as long as the marker generator and the measurement target can be rotated together in a fixed state.
[0170]
  The microprocessor (106) analyzes the measurement data acquired from the measurement object (10), and drives the image acquisition in a state where a dedicated software program for automatically aligning in one coordinate system is driven. Two-dimensional video data and three-dimensional measurement data photographed at various angles from the unit (18) are input through the video input unit (24), analyzed, and the measurement data photographed at various angles are integrated. Arithmetic processing for automatically aligning the two coordinate systems is performed. The specific operation process is the same as the microprocessor operation process in the first embodiment.
[0171]
  However, the microprocessor (106) according to the sixth embodiment of the present invention obtains 2D video data and 3D measurement data related to one area of the measurement object (10), and performs arithmetic processing on this data. When the 2D video data and the 3D measurement data relating to other regions are to be acquired, the rotation driving unit (102) is controlled to rotate the rotation table (100).
[0172]
  Hereinafter, an operation process of the three-dimensional measurement data automatic alignment apparatus according to the sixth embodiment of the present invention configured as described above will be described in detail with reference to the flowcharts of FIGS. 17a and 17b.
[0173]
  First, with the measurement object (10) seated on the upper plate of the turntable (100), the microprocessor (106) drives the rotation drive unit (102) and operates the rotation mechanism (104). Thus, the rotary table (100) is rotated to a predetermined angle, and the measurement object (10) is rotated to a position suitable for measurement (step S50).
[0174]
  In such a state, the microprocessor (106) controls the marker blinking control unit (26), turns on the plurality of marker output units (14) provided in the marker generator (12), and the measurement object A plurality of markers are irregularly projected on the surface of the object (10) (step S51).
[0175]
  In a state where the optical marker from the marker generator (12) is projected onto the measurement object (10), a specific region of the measurement object (10) is photographed by the image acquisition unit (18), and the optical When the 2D image including the expression marker is acquired, the microprocessor (106) inputs the 2D image data acquired from the image acquisition unit (18) through the image input unit (24). (Step S52).
[0176]
  Next, the microprocessor (106) controls the marker blinking control unit (26), the marker generator (12) is turned off so that the optical marker is not projected onto the measurement object (10) ( In step S53), in that state, the image acquisition unit (18) captures the same area of the measurement object (10) and acquires a 2D image that does not include an optical marker. It is input through the section (24) (step S54).
[0177]
  The microprocessor (106) controls the projection control unit (28) and operates the projection unit (16) in a state where the marker generator (12) is turned off and no optical marker is projected. A predetermined pattern for three-dimensional measurement (for example, a stripe pattern or a multiple stripe pattern of a plurality of sections with different intervals) is projected from the projection unit (16) onto the surface of the measurement object (10).
[0178]
  At this time, when the measurement object (10) on which the pattern pattern is projected is photographed by the image acquisition unit (18) and the three-dimensional measurement data is acquired, the microprocessor (106) passes through the image input unit (24). Measurement data is input (step S55).
[0179]
  In such a state, the microprocessor (106) processes the two-dimensional image data including the optical marker and the two-dimensional image data not including the marker, and extracts the two-dimensional position of the marker. (Step S56).
[0180]
  Next, the microprocessor (106) uses a marker extracted from the two-dimensional video data, and coordinates values for any three markers in the two-dimensional video data from the camera lens center of the video acquisition unit (18). Then, by estimating an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker is searched (step S57).
[0181]
  Meanwhile, the microprocessor (106) determines whether or not the register of the buffer (32) is free (step S58).
[0182]
  As a result of the determination, if it is determined that the register of the buffer (32) is not free, the microprocessor (106), with respect to the three-dimensional position of the marker searched in the above step S57, the buffer (32). The markers based on the previous three-dimensional measurement data registered in the register (that is, the data overlapping with the three-dimensional measurement data) are compared to search for markers that are in pairs (step S59).
[0183]
  When the marker search process as described above is performed, it becomes possible to search for a marker to be paired by comparing the optical marker included in the current three-dimensional measurement data with the marker registered in the register of the buffer (32). The microprocessor (106) obtains a position transformation matrix for movement from the position of a pair of markers with each three-dimensional measurement data (step S60), and is registered in the register of the buffer (32). The current measurement data is moved using the position of the three-dimensional measurement data as a reference coordinate system (step S61).
[0184]
  As a result, the microprocessor (106) registers the newly searched marker from the current measurement data in the register of the buffer (32), and aligns the previous measurement data with a different marker (step S62).
[0185]
  Next, the microprocessor (106) determines whether or not the automatic alignment in the acquired three-dimensional measurement data has been completed for the measurement object (10) (step S63).
[0186]
  As a result of the determination, if it is determined that automatic alignment in the three-dimensional measurement data acquired from the measurement object (10) is not completed, the microprocessor (106) returns to the step S50, and the rotation driving unit By operating the rotation mechanism (104) by (102) and rotating the rotary table (100) by a predetermined angle, the image acquisition with the projection unit (16) is performed for other measurement areas of the measurement object (10). Through the unit (18), 2D images and 3D measurement data can be acquired.
[0187]
  Thereafter, the control unit (106) repeatedly executes the processes from step S50 to step S62.
[0188]
  As described above, the sixth embodiment of the present invention is configured so that the measurement object moves, and the first embodiment of the present invention is configured such that the projection unit and the image acquisition unit move. Compared to, it is suitable for acquiring and aligning three-dimensional measurement data from a measurement object having a relatively small size.
[0189]
  At this time, since the marker generator and the measurement object must not move relative to each other until the measurement is completed, the marker generator is fixed to the rotary table to prevent relative movement.
[0190]
  On the other hand, the alignment method using the reference coordinate system used in the embodiment of the present invention described above is the 3D measurement data of the previous measurement area stored in the buffer register when the 3D measurement data is aligned. The position of the image is taken as the reference coordinate system, and the position of the three-dimensional measurement data in the newly measured area is moved and attached, so the larger the object to be measured and the larger the number of measurement areas, the more precise the image acquisition unit A minute error due to the degree is amplified, and the error value may become considerably large.
[0191]
  For example, (a) and (b) in FIG. 18 show data obtained by measuring different adjacent measurement regions with overlapping boundary parts with respect to the same measurement object, and the portion indicated by a dotted line is the measurement object. Assuming actual data of an object, the data obtained through the video acquisition unit has an error value as shown by a solid line.
[0192]
  Accordingly, one of the measurement data of (a) and (b) of FIG. 18 is set as a reference coordinate system, and another data is moved to the reference coordinate system and attached, Since an error value between the measurement data of a) and (b) is added, measurement data having an increased error value as shown by the solid line in FIG. 18C is obtained.
[0193]
  That is, as the area to be measured increases, the risk of errors increases.
[0194]
  In order to solve the above problem, in the seventh and eighth embodiments of the present invention, a method for aligning the position of the three-dimensional measurement data in an absolute coordinate system other than the reference coordinate system is presented.
[0195]
  Here, unlike the reference coordinate system, the absolute coordinate system uses three-dimensional position data for the entire measurement area of the measurement object, and the error value of the entire measurement data is an image for the entire measurement area of the measurement object. The error range of the video acquisition device that acquires the video is not exceeded.
[0196]
  For example, when (a) and (b) in FIG. 19 show data obtained by measuring different measurement areas adjacent to each other with the boundary portion overlapping for the same measurement object, (c) in FIG. If the measurement data in Fig. 19 (a) and (b) above are moved and attached to the absolute coordinate system as shown in Fig. 19, the measurement data is an error in the absolute coordinate system as shown in Fig. 19 (d). Since the combined value of the range and the error range of the measuring device is not exceeded, as described above, it is possible to prevent the error from being amplified by the precision of the video acquisition unit.
[0197]
  First, the seventh embodiment of the present invention will be described in detail with reference to the accompanying drawings.
[0198]
  The configuration of the three-dimensional measurement data automatic alignment apparatus according to the seventh embodiment of the present invention is as shown in FIG. 20, and as shown in FIG. 20, the measurement object (10), the marker generator (12), the projection Unit (16), video acquisition unit (18), movement drive unit (20), movement mechanism (22), marker blinking control unit (26), projection control unit (28), buffer (32), large area video acquisition unit (110), a video input unit (112), a second movement drive unit (114), a second movement mechanism (116), a microprocessor (118), and a reference object (120).
[0199]
  Here, the same reference numerals are given to components that perform the same functions and operations as the configuration of the first embodiment shown in FIG. Moreover, in order to avoid duplication, the concrete description with respect to each component is abbreviate | omitted.
[0200]
  The large area image acquisition unit (110) is an image sensor that can receive images, such as a CCD camera or a CMOS camera, and is placed on the surface of the measurement object (10) from the marker generator (12). When the marker is projected by an optical method, a video is captured and acquired.However, it is provided separately from the video acquisition unit (10), and an image of the entire measurement area of the measurement object (10) is obtained. You will win by shooting.
[0201]
  Here, it is desirable that the large-area video acquisition unit (110) employs a video sensor with higher precision than the video acquisition unit (10) that acquires the video of the subdivided measurement area.
[0202]
  The video input unit (112) is used to input video data acquired from the video acquisition unit (18) and the large area video acquisition unit (110).
[0203]
  The second movement drive unit (114) performs driving for moving the image acquisition unit (110) relative to the measurement object (10) by the drive control of the microprocessor (118), and The second movement mechanism (116) receives power from the driving of the second drive unit (114), and moves the large area image acquisition unit (110) relative to the measurement target (10) in a certain direction. It has a structure.
[0204]
  In the seventh embodiment of the present invention, the second movement drive unit (114) is applied so that the large area image acquisition unit (110) can be moved by electrical drive. It is also possible to manually operate the mechanism (116) so that the operator can arbitrarily move it.
[0205]
  The microprocessor (118) has two or more different from the large area image acquisition unit (110) in a state where a plurality of optical markers are projected from the marker generator (12) onto the surface of the measurement object (10). Using the video data of the measurement object (10) and reference object (120) photographed in the direction, the three-dimensional position for each marker in the entire area of the measurement object is obtained, and the obtained three-dimensional position of each marker is absolute Performs calculation processing set in the coordinate system.
[0206]
  At the same time, the microprocessor (118) inputs the 2D video data and the 3D measurement data taken at various angles from the video acquisition unit (18) through the video input unit (112) and analyzes them. The measurement object (10) is subjected to arithmetic processing for aligning various measurement data obtained by photographing the subdivided measurement area in the absolute coordinate system.
[0207]
  The reference object (120) is arranged adjacent to the measurement object (10) as a predetermined shape object whose dimension information for the size has already been input to the microprocessor (118), and acquires a large area image. The image is acquired together with the measurement object (10) through the section (110).
[0208]
  Hereinafter, an operation process of the three-dimensional measurement data automatic alignment apparatus according to the seventh embodiment of the present invention configured as described above will be described in detail with reference to the flowcharts of FIGS. 21a and 21b.
[0209]
  First, the measurement object (10) is arranged on the marker generator (12), and the microprocessor (118) is placed in a state where the reference object (120) is arranged at a predetermined point adjacent to the measurement object (10). 2 By driving the movement drive unit (114) and operating the movement mechanism (116), the large area image acquisition unit (110) is moved to a position suitable for measurement of the measurement object (10).
[0210]
  Next, the microprocessor (118) controls the marker blinking control unit (26), turns on the plurality of marker output units (14) provided in the marker generator (12), and sets the measurement target (10). A plurality of markers are irregularly projected on the surface (step S70).
[0211]
  In a state where the optical marker from the marker generator (12) is projected onto the measurement object (10), the measurement object (10) including the reference object (120) is passed through the large-area image acquisition unit (110). ) To capture a two-dimensional image including an optical marker, the microprocessor (118) passes through the image input unit (112) and the large region image acquisition unit (110). ) Is acquired (step S71).
[0212]
  For reference, FIG. 22 illustrates an example of an image including the entire measurement target region of the measurement target (10) acquired by the large region video acquisition unit (110) and the reference object (120). In the drawing, reference numeral “RM” represents an optical marker projected on the surface of the measurement object (10), and reference numeral “BI” represents an image acquired by the large area image acquisition unit (110). Represents. Next, the microprocessor (118) drives the second movement drive unit (114) and operates the movement mechanism (116), so that the large area image acquisition unit (110) is used to measure the measurement object (10). Move to another point which is a suitable position (step S72).
[0213]
  Then, the microprocessor (118) controls the large area image acquisition unit (110) at the other point moved as described above, and shoots the entire measurement target area of the measurement target (10) including the reference object. Then, a two-dimensional image including the optical marker is obtained from a different direction from step S71, and this is input through the image input unit (112) (step S73).
[0214]
  Next, the microprocessor (118) controls the marker blinking control unit (26) to turn off the marker generator (12) so that the optical marker is not projected onto the measurement object (step S74). ).
[0215]
  The microprocessor (118) combines the two-dimensional images related to the whole area of the measurement target in different directions acquired through the large-area image acquisition unit (110), and at the same time, the reference object (120) included in the image. Is calculated based on the already known dimensions, and the three-dimensional position of each marker included in the entire measurement target region is calculated (step S75).
The microprocessor (118) registers the calculated three-dimensional position of each marker in the register of the buffer (32) (step S76).
[0216]
  Next, the microprocessor (118) drives the movement drive unit (20) and activates the movement mechanism (22), thereby bringing the image acquisition unit (18) integrated with the projection unit (16) into the measurement object. The object (10) is moved to a position suitable for measurement (step S77).
[0217]
  In that state, the microprocessor (118) controls the marker blinking control unit (26), turns on the plurality of marker output units (14) provided in the marker generator (12), and the measurement object (10) A plurality of markers are irregularly projected on the surface of (step S78).
[0218]
  With the optical marker from the marker generator (12) being projected onto the measurement object (10), the image acquisition unit (18) subdivides the entire measurement object area of the measurement object (10). When the imaged area (see “NI” in FIG. 23) is photographed and a 2D image including an optical marker is acquired, the microprocessor (118) acquires the image through the image input unit (112). The 2D video data acquired from the unit (18) is input (step S78).
[0219]
  Next, the microprocessor (118) controls the marker blinking control unit (26), the marker generator (12) is turned off, and the optical marker is not projected onto the measurement object (10) (step S80). ), In that state, the same area of the measurement object (10) is photographed from the video acquisition unit (18), and when acquiring a 2D video that does not include an optical marker, the 2D video data is transferred to the video input unit ( 112) (step S81).
[0220]
  The microprocessor (118) controls the projection control unit (28) and operates the projection unit (16) in a state where the marker generator (12) is turned off and no optical marker is projected. Thus, a predetermined pattern for three-dimensional measurement (for example, a stripe pattern or a multiple stripe pattern of a plurality of sections with different intervals) is projected from the projection unit (16) onto the surface of the measurement object (10).
[0221]
  At this time, when the measurement object (10) on which the pattern pattern is projected is photographed by the image acquisition unit (18) and the three-dimensional measurement data is acquired, the microprocessor (118) performs the three-dimensional measurement through the image input unit (112). Data is input (step S82).
[0222]
  In such a state, the microprocessor (118) performs image processing on the two-dimensional image data including the optical marker and the two-dimensional image data not including the marker, and extracts the two-dimensional position of the marker. (Step S83).
[0223]
  At the same time, the microprocessor (118) uses the markers extracted from the two-dimensional video data, and coordinates values for any three markers in the two-dimensional video data from the camera lens center of the video acquisition unit (18). Then, by estimating an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker is searched (step S84).
[0224]
  Next, the microprocessor (118) compares the three-dimensional position of the marker found in the above step S84 with the three-dimensional position of the marker stored in the register of the buffer (32) in the above step S76, and compares them. That is, a marker having the same three-dimensional position is searched for (step S85).
[0225]
  When the marker search process as described above is performed, it becomes possible to search for a paired marker by comparing the optical marker included in the current three-dimensional measurement data with the marker registered in the register of the buffer (32). The microprocessor 118 obtains a position conversion matrix for movement from the position of the pair of markers in each of the three-dimensional measurement data (step S86). While moving the current measurement data to this position conversion matrix, the three-dimensional position of the marker registered in the register of the buffer (32) is set in the absolute coordinate system and aligned with this absolute coordinate system (step S87).
[0226]
  Next, the microprocessor (118) determines whether or not the automatic alignment in the acquired three-dimensional measurement data has been completed for the measurement object (10), that is, out of the measurement object region of the measurement object (10). Then, it is determined whether or not all the three-dimensional data of the subdivided regions are aligned (step S88).
[0227]
  As a result of the determination, if it is determined that the automatic alignment in the three-dimensional measurement data acquired from the measurement object (10) is not completed, the microprocessor (106) returns to the step S50, and the movement drive unit ( 20) and actuating the moving mechanism (22) to move the projection unit (16) and the image acquisition unit (18) to a position suitable for measuring an area that has not yet been measured. The process from step S77 to step S88 is repeated.
[0228]
  In the seventh embodiment, an example is described in which a large area image acquisition unit that acquires an image of the entire measurement target area and a video acquisition unit that acquires an image of a subdivided measurement area are separately provided. As described above, it is also possible to configure so as to acquire all the images of the entire measurement target region and the subdivided measurement region using one of the image acquisition units.
[0229]
  Next, an eighth embodiment of the present invention will be described in detail with reference to the accompanying drawings.
[0230]
  The configuration of the three-dimensional measurement data automatic alignment apparatus according to the eighth embodiment of the present invention is as shown in FIG. 24. As shown in the drawing, the measurement object (10), marker generator (12), projection Unit (16), video acquisition unit (18), movement drive unit (20), movement mechanism (22), marker blinking control unit (26), projection control unit (28), buffer (32), one set or a plurality of A large area video acquisition unit (130, 132), a video input unit (134), and a microprocessor (136) are included.
[0231]
  Here, the same reference numerals are given to components that perform the same functions and operations as the configuration of the first embodiment shown in FIG. And in order to avoid duplication, the concrete explanation for this is omitted.
[0232]
  The pair of large area image acquisition units (130, 132) are image sensors that can receive images, such as CCD cameras and CMOS cameras, respectively, and at the same time, are separated and fixed by a set distance from each other. This is a so-called stereo vision (Stereo Vision) method in which the same measurement target area is photographed at different angles and an image is acquired.
[0233]
  Here, it is desirable that each large area image acquisition unit (130, 132) employs an image sensor with higher precision than the image acquisition unit (10) that acquires the image of the subdivided measurement area.
[0234]
  The video input unit (134) is for receiving the video data acquired from the video acquisition unit (18) and the large area video acquisition unit (130, 132).
[0235]
  The microprocessor (136) is photographed in different directions from the large area image acquisition unit (130, 132) in a state where a plurality of optical markers are projected from the marker generator (12) onto the surface of the measurement object (10). Using the video data of the measured object (10), the three-dimensional position for each marker in the entire area of the measurement object is obtained, and the marker obtained again from the video obtained by this large area video acquisition unit (130, 132) The 3D position of is used for absolute coordinates.
[0236]
  At the same time, the microprocessor (136) inputs two-dimensional video data and three-dimensional measurement data taken at various angles from the video acquisition unit (18) through the video input unit (134) and analyzes them. Then, a calculation process for aligning the measurement data obtained by photographing the subdivided measurement area with respect to the measurement object (10) in the absolute coordinate system is performed.
[0237]
  This method is the same process as registering different objects in the first embodiment, and only the absolute coordinates that the target object has already obtained are different.
[0238]
  Hereinafter, an operation process of the three-dimensional measurement data automatic alignment apparatus according to the eighth embodiment of the present invention configured as described above will be described in detail with reference to the flowcharts of FIGS. 25a and 25b.
[0239]
  First, the microprocessor (136) controls the marker blinking control unit (26) in a state where a predetermined measurement object (10) is arranged on the marker generator (12), and is provided in the marker generator (12). The plurality of marker output units (14) are turned on so that the plurality of markers are irregularly projected on the surface of the measurement object (10) (step S90).
[0240]
  With the optical marker from the marker generator (12) being projected onto the measurement object (10), the entire measurement target area of the measurement object (10) is measured through the large area image acquisition unit (130, 132). When shooting from different directions and superimposing and acquiring a two-dimensional image including an optical marker, the microprocessor (118) passes through the video input unit (134), the large area image acquisition unit (130, The two-dimensional video data acquired from step 132) is input (step S91).
[0241]
  For reference, FIG. 26 shows an example of an image of the entire measurement target region of the measurement target (10) acquired by the large region video acquisition unit (130, 132). In the drawing, the reference symbol “RM” represents an optical marker projected on the surface of the measurement object (10), and the reference symbol “BI” is acquired by the large area image acquisition unit (130, 132). Represents a video.
[0242]
  Next, the microprocessor (136) controls the marker blinking control unit (26) to turn off the marker generator (12) so that the optical marker is not projected onto the measurement object (step S92).
[0243]
  The microprocessor (136) performs calculations based on the two-dimensional video information about the whole area of the measurement target in different directions acquired through the large area video acquisition unit (130, 132), and includes each of the measurement target areas. The three-dimensional position of the marker is calculated (step S93).
[0244]
  That is, in the above step S93, the distance between the large area image acquisition units (130, 132) is fixed and invariant, and the distance information is stored in the microprocessor (136). By calculating the relationship between the position of the large area image acquisition unit (130, 132) and the position of each marker projected on the measurement object (10) by triangulation, the three-dimensional position between each marker is obtained. It is done.
[0245]
  The microprocessor (136) registers the calculated three-dimensional position of each marker in the register of the buffer (32) (step S94).
[0246]
  Next, the microprocessor (136) drives the movement drive unit (20) and operates the movement mechanism (22), thereby moving the image acquisition unit (18) integrated with the projection unit (16) to the measurement target. The object (10) is moved to a position suitable for measurement (step S95).
[0247]
  In that state, the microprocessor (136) controls the marker blinking control unit (26), turns on the plurality of marker output units (14) provided in the marker generator (12), and the measurement object (10) A plurality of markers are irregularly projected on the surface (step S96).
[0248]
  With the optical marker from the marker generator (12) being projected onto the measurement object (10), the image acquisition unit (18) subdivides the entire measurement object area of the measurement object (10). When the captured area (see “NI” in FIG. 27) is captured and a 2D image including an optical marker is acquired, the microprocessor 136 acquires the image through the image input unit 134. The 2D video data acquired from the unit (18) is input (step S97).
[0249]
  Next, the microprocessor (136) controls the marker blinking control unit (26), the marker generator (12) is turned off, and the optical marker is not projected onto the measurement object (10) (step S98). In this state, the image acquisition unit (18) captures the same region of the measurement object (10) and acquires a 2D image that does not include the optical marker. ) (Step S99).
[0250]
  The microprocessor (136) controls the projection control unit (28) and operates the projection unit (16) in a state where the marker generator (12) is turned off and no optical marker is projected. A predetermined pattern for three-dimensional measurement (for example, a stripe pattern or a multiple stripe pattern of a plurality of sections with different intervals) is projected from the projection unit (16) onto the surface of the measurement object (10).
[0251]
  At this time, when the measurement object (10) on which the pattern pattern is projected is photographed by the image acquisition unit (18) and the three-dimensional measurement data is acquired, the microprocessor (136) passes through the image input unit (112) to the three-dimensional. Measurement data is input (step S100).
[0252]
  In such a state, the microprocessor (136) processes the two-dimensional video data including the optical marker and the two-dimensional video data not including the marker, and extracts the two-dimensional position of the marker. (Step S101).
[0253]
  At the same time, the microprocessor (136) uses the markers extracted from the two-dimensional video data, and the coordinate values for any three markers in the two-dimensional video data from the camera lens center of the video acquisition unit (18); Then, by estimating an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker is searched (step S102).
[0254]
  Next, the microprocessor (136) compares the three-dimensional position of the marker found in the above step S102 with the three-dimensional position of the marker stored in the register of the buffer (32) in the above-mentioned step S94, and calculates the mutual combination. That is, a marker having the same three-dimensional position is searched (step S103).
[0255]
  When the marker search process as described above is performed, it becomes possible to search for a paired marker by comparing the optical marker included in the current three-dimensional measurement data with the marker registered in the register of the buffer (32). The microprocessor (136) obtains a position conversion matrix for movement from the position of the pair of markers with each three-dimensional measurement data (step S104). While moving the current measurement data to this position conversion matrix, the three-dimensional position of the marker registered in the register of the buffer (32) is set in the absolute coordinate system and aligned with this absolute coordinate system (step S105).
[0256]
  Next, the microprocessor (136) determines whether or not the automatic alignment in the acquired three-dimensional measurement data is completed for the measurement object (10) (step S106).
[0257]
  As a result of the determination, if it is determined that the automatic alignment in the three-dimensional measurement data acquired from the measurement object (10) is not completed, the microprocessor (136) returns to the step S95, and the movement drive unit (20) And moving the projection mechanism (16) and the image acquisition unit (18) to positions suitable for measuring an area that has not yet been measured by operating the movement mechanism (22). The process from S95 to step S106 is repeated.
[0258]
  In the eighth embodiment, a set of large area image acquisition units for acquiring images of the entire measurement target area, and an image acquisition unit and marker generator for acquiring subdivided measurement area images are configured separately. The case has been described by way of example, but as a modified embodiment to this, it is also possible to integrally configure a set of large area video acquisition unit and marker generator. However, when configured in this way, it is not necessary to set the position value of a set of large area video acquisition parts according to the area where the optical marker generated by the marker generator is projected, making it easier to use. it can.
[0259]
  As another different modified example of the eighth embodiment, a set of large area image acquisition unit and image acquisition unit can be integrated, but in this case, the absolute coordinates are Although the obtained area may be somewhat smaller and the accuracy may be somewhat degraded, when acquiring multiple images of the subdivided measurement area, it is subdivided without overlapping the boundary part for each image. It is possible to reduce the number of times of acquiring the image of the measured area, that is, the number of scans.
[0260]
  For reference, the principle of the eighth embodiment of the present invention will be additionally described as follows.
[0261]
  The geometric model of the large area image acquisition unit (130, 132) provided in the eighth embodiment of the present invention has a structure in which two cameras look at one object. At the same time, although various forms are represented depending on the application field, FIG. 27 shows a structure in which two cameras are arranged in parallel.
[0262]
  In FIG. 27 above, the variables are defined as follows:
[0263]
        “X: The coordinates of the position to be obtained,
          b: Distance between camera centers (base line distance)
          f: camera's focal length
          A, B: Image plane acquired by each camera
          X₁, X_r : Image image coordinates relative to the image of coordinate X to be obtained from the origin of each image plane
          P, Q: Lens center of each camera
  In FIG. 27, the method of obtaining the coordinates (X) of the position to be obtained from the stereo image is as shown in the following mathematical formulas 15 and 16.
[0264]
[Expression 15]

[0265]
[Expression 16]

Next, a ninth embodiment of the present invention will be described with reference to the accompanying drawings.
[0266]
  In the ninth embodiment of the present invention, a plurality of projection units, image acquisition units, and marker generators are arranged around the measurement object, so that the two-dimensional image and the whole area of the measurement object of the measurement object It is not necessary to move the projection unit and image acquisition unit to acquire 3D measurement data, and it is possible to acquire 2D images and 3D measurement data with a single scan. A configuration for an automatic alignment apparatus for three-dimensional measurement data using an optical marker that can shorten the time is presented.
[0267]
  FIG. 28 is a view showing a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a ninth embodiment of the present invention. As can be seen from the drawing, according to the ninth embodiment of the present invention. The three-dimensional measurement data automatic alignment device includes N marker generators (142), M projection units (146), L video acquisition units (148), video input units (150), projection control units ( 152), a marker blinking control unit (154), a microprocessor (156), and a buffer (158).
[0268]
  The N marker generators (142) project a pattern that can be recognized by the image acquisition unit (148) on the surface of the measurement object (10) to be optically measured. A plurality of marker output units (144) are provided over the entire surface directed to the object (10) so that the plurality of optical markers are projected simultaneously with irregular survey directions.
[0269]
  As shown in FIG. 28, the N marker generators (142) direct the measurement object (10) at regular intervals around the measurement object (10), while the marker generators (142). The area of the optical marker projected from is arranged so that the entire area of the measurement object of the measurement object (10) can be covered.
[0270]
  The M projection units (146) project a predetermined pattern and laser stripe on the surface of the measurement object (10) so that three-dimensional data can be acquired. This is done by projecting spatially encoded light onto the surface of the measurement object (10) using a projection device such as an LCD projector, or projecting laser light onto the surface of the measurement object (10). It can be acquired as three-dimensional data through an acquisition unit (148).
[0271]
  As shown in FIG. 28, the M projection units (146) direct the measurement object (10) at a predetermined interval around the measurement object (10), while projecting from each projection unit (146). The region of the spatially encoded light to be measured is arranged so as to cover all the regions to be measured of the measurement object (10).
[0272]
  The L image acquisition units (148) are composed of image sensors capable of receiving images, such as a CCD camera and a CMOS camera, from the marker generator (142) to the surface of the measurement object (10). When the marker is projected by an optical method, the resulting image is captured and acquired.
[0273]
  Each of the L video acquisition units (148) is not installed as a separate camera for each projection unit (146), and can be integrated with each projection unit (146). desirable.
The L video acquisition units (148), as shown in FIG. 28, direct the measurement target (10) at a fixed interval around the measurement target (10), while each video acquisition unit ( 148) is arranged so that the entire area to be measured by the object to be measured (10) can be covered.
[0274]
  The video input unit (150) is for receiving video data respectively acquired from L video acquisition units (148), and the projection control unit (152) is M projection units (150). 146) and the blinking cycle of the light source that projects the pattern film are controlled.
[0275]
  The marker blinking control unit (154) periodically blinks the optical markers of the N marker generators (142) under the control of the microprocessor (156).
The microprocessor (156) uses the M projection units (146) and the L image acquisition units (148) to obtain a 3D marker for each region from the acquired 2D images and 3D measurement data. A position is extracted, and a marker that is a set is searched for each overlapping region from the three-dimensional position of the extracted marker. At the same time as obtaining the position conversion matrix by the pair of markers, the calculation processing for converting and aligning the positions of the respective three-dimensional measurement data by the obtained position conversion matrix is performed.
[0276]
  The buffer (158) stores data necessary for arithmetic processing of the microprocessor (156), result data, and the like.
[0277]
  Hereinafter, an operation process of the three-dimensional measurement data automatic alignment apparatus according to the ninth embodiment of the present invention configured as described above will be described in detail with reference to the flowcharts of FIGS. 25a and 25b.
[0278]
  First, a measurement object (10) is placed at an appropriate position, and N marker generators (142), M projection units (146), and L images are acquired around the measurement object (10). The microprocessor (156) controls the marker blinking control unit (154) and turns on the plurality of marker output units (144) provided in the marker generator (142) with the respective units (148) arranged. A plurality of markers are irregularly projected on the surface of the measurement object (10) (step S110).
[0279]
  In a state where the optical marker from the marker generator (142) is projected onto the measurement object (10), the measurement target region of the measurement object (10) is photographed by each of the L image acquisition units (148). When the 2D image including the optical marker is acquired, the microprocessor 156 receives the 2D image data acquired from the L image acquisition units 148 through the image input unit 150. It will be input (step S111).
[0280]
  Next, the microprocessor (156) controls the marker blinking control unit (154) so that the N marker generators (142) are turned off so that the optical marker is not projected onto the measurement object (10) (steps). S112) When the same region of the measurement object (10) is photographed by each of the L image acquisition units (148) in that state, and a two-dimensional image not including the optical marker is acquired, the L two images are acquired. The dimensional video data is input through the video input unit 150 (step S113).
[0281]
  The microprocessor (156) controls the projection control unit (152) in a state in which the N marker generators (142) are turned off and no optical marker is projected, and the M projection units (146) are controlled. A predetermined pattern for each three-dimensional measurement (for example, a stripe pattern or a multiple stripe pattern of a plurality of sections with different intervals) is obtained from the M projection units (146). Projected on the surface of 10).
[0282]
  At this time, when the measurement object (10) on which the pattern pattern is projected is photographed by the L image acquisition units (148) and L three-dimensional measurement data is acquired, the microprocessor (156) causes the video input unit ( 150 pieces of L three-dimensional measurement data are input (step S114).
[0283]
  In such a state, the microprocessor (156) processes the two-dimensional image data including the optical marker and the two-dimensional image data not including the marker, and extracts the two-dimensional position of the marker. (Step S115).
[0284]
  Next, the microprocessor (156) uses the markers extracted from the 2D image data, and coordinates for any three markers in the 2D image data from the lens center of each of the L image acquisition units (148). By estimating the value and an arbitrary three-dimensional coordinate value on the three-dimensional measurement data located in a straight line, the three-dimensional position of the marker for each of the L pieces of three-dimensional measurement data is searched (step S116). .
[0285]
  Next, the microprocessor (156) compares the three-dimensional positions of the markers for each of the L pieces of three-dimensional measurement data found in step S116, and searches for a pair of markers (step S117). ).
[0286]
  When it becomes possible to search for a pair of markers by the marker search process as described above, the microprocessor (156) determines the position for movement from the position of the pair of markers in each three-dimensional measurement data. A transformation matrix is obtained (step S118), and one position among the L three-dimensional measurement data is set as a reference coordinate system, and the current measurement data is moved by the obtained position transformation matrix. They are aligned (step S119).
[0287]
  Next, a tenth embodiment of the present invention will be described with reference to the accompanying drawings.
[0288]
  The tenth embodiment of the present invention has the same hardware configuration as the ninth embodiment, but the operation process is different.
[0289]
  Accordingly, the tenth embodiment of the present invention is based on the hardware configuration of the ninth embodiment shown in FIG. 28, and the operation process will be described in detail with reference to the flowchart of FIG.
[0290]
  First, a reference object whose dimensions are already known is arranged at an appropriate position, and N marker generators (142), M projection units (146), and L image acquisition units (centered on this reference object) 148) is arranged. At this time, the reference object can be an actual measurement object if it is separately manufactured for calibration or if the dimensions are already known.
[0291]
  In this state, the microprocessor (156) controls the marker blinking control unit (154) to turn on the respective marker output units (14) provided in the N marker generators (142), and the surface of the reference object. A plurality of markers are irregularly projected on the screen (step S120).
[0292]
  Next, the microprocessor (156) performs a calibration operation for obtaining the correlation between the L image acquisition units (148) and the reference object (step S121). The specific operation process is described in detail. explain.
[0293]
  In the above-described step S121, when the optical markers from the N marker generators (142) are projected onto the reference object, each of the L image acquisition units (148) measures the measurement object (10). When the region is photographed and a two-dimensional image including the optical marker is acquired, the microprocessor (156) acquires the L images acquired from the L image acquisition units (148) through the image input unit (150). 2D video data is input.
[0294]
  Next, the microprocessor (156) controls the projection control unit (152) to operate the M projection units (146). From the M projection units (146), the three-dimensional measurement is performed. A predetermined pattern (for example, a stripe pattern or a multiple stripe pattern of a plurality of sections having different intervals) is projected onto the surface of the reference object.
[0295]
  At this time, when the reference object on which the pattern pattern is projected is captured by the L image acquisition units (148) and L three-dimensional measurement data is acquired, the microprocessor (156) passes through the image input unit (150). Three pieces of three-dimensional measurement data are input.
[0296]
  In this state, the microprocessor (156) uses the two-dimensional position of the marker including the optical marker and the dimensional information of the reference object that is already known, and uses each of the L image acquisition units (148) for each camera. By estimating the coordinate values for any three markers in the two-dimensional video data from the lens center and the arbitrary three-dimensional coordinate values on the three-dimensional measurement data located in a straight line, each of the L pieces of three-dimensional data is estimated. Finds the 3D position of the marker.
[0297]
  Next, the microprocessor (156) compares the three-dimensional positions of the L markers for each of the three-dimensional measurement data, and searches for a pair of markers. Then, a position conversion matrix for movement is obtained from the position of the paired marker with each three-dimensional measurement data.
The microprocessor (156) registers the obtained position conversion matrix in the register of the buffer (158), thereby completing the calibration operation in step S121.
As described above, when the calibration operation in step S121 is completed, the reference object is removed, the measurement object (10) is placed where the reference object was, and the microprocessor (156) blinks the marker. The controller (154) is controlled to turn off the N marker generators (142) so that the optical marker is not projected onto the measurement object (10) (step S122).
[0298]
  In this state, when the measurement target area of the measurement target (10) is photographed by each of the L video acquisition units (148) and L two-dimensional video not including the optical marker is acquired, The 2D video data is input through the video input unit 150 (step S123).
[0299]
  The microprocessor (156) controls the projection control unit (152) and operates the M projection units (146) in a state where the N marker generators (142) are turned off and no optical marker is projected. From the M projection units (146), predetermined pattern patterns for three-dimensional measurement (for example, stripe patterns or multiple stripe patterns of a plurality of sections having different intervals) are obtained from the measurement object (10 ) Projected onto the surface.
[0300]
  At this time, when the measurement object (10) on which the pattern pattern is projected is photographed by the L image acquisition units (148) and L three-dimensional measurement data is acquired, the microprocessor (156) causes the video input unit ( 150 pieces of L three-dimensional measurement data are input (step S124).
Next, the microprocessor (156) reads the position conversion matrix obtained by the calibration in the step (S121) from the register of the buffer (158), and selects one position among the L three-dimensional measurement data. Based on the position transformation matrix read from the register of the buffer (158) in the reference coordinate system, the current measurement data is moved and aligned (step S125).
[0301]
  Later, when performing measurement on another measurement object or performing measurement again on the same measurement object, the calibration work from the above-described steps S121 to S123 is omitted, and the buffer (158 ), The three-dimensional measurement data is aligned by the position conversion matrix stored in the register of FIG.
[0302]
  However, if necessary, it is possible to carry out the calibration work from the above-described step S121 to step S123 for each measurement, which can be easily changed depending on the operator's intention and the system configuration. .
[0303]
  Next, an eleventh embodiment of the present invention will be described.
[0304]
  The eleventh embodiment of the present invention presents a different embodiment of the marker generator and its peripheral device (hereinafter referred to as “marker generator”) used in the first embodiment or the tenth embodiment of the present invention. .
[0305]
  As shown in FIG. 31, the marker generator according to the eleventh embodiment of the present invention can rotate around a plurality of X-axis light sources (160), an X-axis blinking control unit (162), and a hinge axis. X-axis polygon polygon mirror (164) (Polygon Mirror), X-axis rotation drive unit (166), X-axis rotation mechanism (168), and Y-axis light sources (170 ), Y-axis blinking control unit (172), Y-axis polygon mirror (174) configured to be able to rotate around the hinge axis, Y-axis rotation drive unit (166), Y-axis The rotation mechanism (178) is included.
[0306]
  The plurality of X-axis light sources (160) generate a beam having excellent linearity, such as a laser, and diverge on the reflection surface of the polygon mirror (164) of the X-axis polygon. For example, a laser point can be used. The X-axis blinking control unit 162 controls blinking of each X-axis light source 160 by control from a microprocessor (not shown).
[0307]
  The X-axis polygonal polygon mirror (164) has a plurality of reflecting surfaces, and a plurality of light beams diverge from the plurality of light sources (160) while being rotated by the X-axis rotation mechanism (168). Are reflected by the plurality of reflecting surfaces and projected onto the measurement region of the measurement object (OB).
[0308]
  The X-axis rotation drive unit (166) drives the X-axis polygon mirror (164) to rotate in one direction under the control of the microprocessor, and the X-axis rotation mechanism (168). ) Is provided with a structure for rotating the X-axis polygonal polygon mirror (164) in one direction by receiving power from the drive of the X-axis rotation drive unit (166).
[0309]
  The plurality of light sources (170) on the Y axis generate a beam such as a laser that has excellent straightness and diverge to the reflecting surface of the polygon mirror (174) on the Y axis. Etc. are used. The Y-axis blinking control unit 172 controls blinking of the plurality of Y-axis light sources 170 by control from a microprocessor (not shown).
[0310]
  The Y-axis polygonal polygon mirror (174) has a plurality of reflecting surfaces, and is radiated from a plurality of light sources (170) while being rotated by a Y-axis rotation mechanism (178). Each beam is reflected by the plurality of reflecting surfaces and projected onto the measurement region of the measurement object (OB).
[0311]
  The Y-axis rotation drive unit (176) drives the Y-axis polygon polygon mirror (174) to rotate in one direction under the control of the microprocessor, and the Y-axis rotation mechanism (178). ) Is provided with a structure for rotating the Y-axis polygonal polygon mirror (174) in one direction by receiving power from the drive of the Y-axis rotation drive unit (166).
[0312]
  Hereinafter, an operation process of the marker generator according to the eleventh embodiment of the present invention configured as described above will be described in detail.
[0313]
  First, in response to a control signal from the microprocessor, drive power from the X-axis rotation drive unit (166) and the Y-axis rotation drive unit (176) is changed to the X-axis rotation mechanism (168) and the Y-axis rotation mechanism (178). The X-axis rotation mechanism (168) and the Y-axis rotation mechanism (178) are controlled by the drive power source approved by the X-axis rotation drive unit (166) and the Y-axis rotation drive unit (176), respectively. Driven, the polygon mirrors (164, 174) of the X-axis and Y-axis polygons are rotated.
[0314]
  At the same time, the X-axis blinking control unit 162 and the Y-axis blinking control unit 172 turn on the X-axis light source 160 and the Y-axis light source 170 in accordance with a control signal from the microprocessor. As a result, the beams generated from the plurality of X-axis and Y-axis light sources (160, 170) are reflected from the X-axis polygon polygon mirror (164) and the Y-axis polygon mirror (174). Is incident on.
[0315]
  The beams incident from the X-axis and Y-axis light sources (160, 170) to the reflecting surfaces of the X-axis polygonal polygon mirror (164) and the Y-axis polygonal polygon mirror (174) are: It is reflected from the respective reflecting surfaces of the polygonal mirrors (164, 174) of the polygon of the axis and the Y axis, and projected onto the surface of the measurement object (OB).
[0316]
  At this time, the polygonal mirrors (164, 174) of the X-axis and Y-axis rotate fast, and the angle of the reflection surface is different, so that the surface of the measurement object (OB) has X At the same time, lines of a large number of beams are formed on the axis and the Y axis, and at the same time, each intersection where the lines of the X axis and the Y axis intersect becomes an individual optical marker (RM).
[0317]
  For example, assuming that there are m X-axis light sources (160) and n Y-axis light sources (170), m * n intersection points are formed on the surface of the measurement object (OB). Since each of these m * n intersections becomes an optical marker (RM), a relatively large number of optical markers can be generated using a smaller number of light sources. It is.
[0318]
  The embodiments according to the present invention as described above are not limited to the above-described ones, but the techniques described in the scope of claims attached within the scope obvious to those who have ordinary knowledge in the technical field to which the present invention belongs. Of course, various modifications and changes can be made without departing from the gist.
[Brief description of the drawings]
[0319]
FIG. 1 is a diagram exemplarily showing a state in which a conventional sticker type marker is attached to an object to be measured and three-dimensional measurement is performed.
FIG. 2 is a diagram exemplarily showing a state in which different measurement data are aligned using a sticker type marker as a reference marker.
FIG. 3 is a diagram illustrating a configuration for a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a first embodiment of the present invention.
FIG. 4A is a diagram illustrating a state of acquiring 2D image data using an optical marker and a state of acquiring 3D measurement data using a pattern according to a first preferred embodiment of the present invention. It is.
FIG. 4B is a diagram illustrating a state of acquiring 2D image data using an optical marker and a state of acquiring 3D measurement data using a pattern according to a first preferred embodiment of the present invention. It is.
FIG. 4c is a diagram illustrating a state in which two-dimensional image data is acquired using an optical marker and a state in which three-dimensional measurement data is acquired using a pattern according to a first preferred embodiment of the present invention. It is.
FIG. 5 is a view exemplarily showing a state in which a two-dimensional position of a marker is extracted from two-dimensional image data acquired through turning on and off of an optical marker according to a first preferred embodiment of the present invention.
FIG. 6 is a diagram exemplarily showing a state in which a three-dimensional position of a marker is extracted from a camera lens center and a two-dimensional position of the marker.
FIG. 7A is a diagram illustrating an operation of obtaining a pair of markers through comparison of triangles with different video data according to a first preferred embodiment of the present invention.
FIG. 7B is a diagram illustrating an operation of obtaining a pair of markers through a comparison of triangles with different video data according to the first preferred embodiment of the present invention.
FIG. 8A is a diagram exemplarily showing a conversion operation for matching a pair of triangles at different positions in a comparison of triangles with different video data according to the first preferred embodiment of the present invention;
FIG. 8B is a diagram exemplarily showing a conversion operation for matching a pair of triangles at different positions in a comparison of triangles with different video data according to the first preferred embodiment of the present invention;
FIG. 8c is a diagram exemplarily showing a conversion operation for matching a pair of triangles at different positions in a comparison of triangles with different video data according to a first preferred embodiment of the present invention;
FIG. 8D is a diagram exemplarily showing a conversion operation for matching a pair of triangles at different positions in a comparison of triangles with different video data according to the first preferred embodiment of the present invention;
FIG. 9 is a diagram exemplarily showing an operation for obtaining a marker pair by obtaining a virtual marker from different video data according to a first preferred embodiment of the present invention;
FIG. 10a is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the first embodiment of the present invention;
FIG. 10b is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the first embodiment of the present invention;
FIG. 11 is a diagram showing a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a second embodiment of the present invention.
FIG. 12 is a flowchart for explaining an operation in a three-dimensional measurement data automatic alignment method using an optical marker according to a second embodiment of the present invention.
FIG. 13 is a flowchart for explaining an operation in a three-dimensional measurement data automatic alignment method using an optical marker according to a third embodiment of the present invention.
FIG. 14 is a diagram illustrating a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a fourth embodiment of the present invention.
FIG. 15 is a diagram showing a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a fifth embodiment of the present invention.
FIG. 16 is a diagram showing a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a sixth embodiment of the present invention.
FIG. 17a is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the sixth embodiment of the present invention;
FIG. 17b is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the sixth embodiment of the present invention;
FIG. 18 is a diagram for explaining an error when aligning measurement data using a reference coordinate system;
FIG. 19 is a diagram for explaining an error when aligning measurement data using an absolute coordinate system.
FIG. 20 is a diagram illustrating a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a seventh embodiment of the present invention.
FIG. 21a is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the seventh embodiment of the present invention;
FIG. 21b is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the seventh embodiment of the present invention;
22 is a diagram illustrating an example of an image that can be obtained using the large-area image acquisition unit illustrated in FIG. 20;
FIG. 23 is a diagram illustrating an example of a large-area image acquisition unit and an image that can be obtained using the image acquisition unit illustrated in FIG. 20;
FIG. 24 is a view showing a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to an eighth embodiment of the present invention.
FIG. 25a is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the eighth embodiment of the present invention;
FIG. 25b is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the eighth embodiment of the present invention;
26A is a diagram illustrating an example of an image that can be obtained using the set of large area image acquisition units illustrated in FIG. 24. FIG.
FIG. 26B is a diagram illustrating an example of a video that can be obtained using the set of large area video acquisition units and the video acquisition unit illustrated in FIG. 20;
FIG. 27 is a schematic view for explaining the principle of an eighth embodiment of the present invention.
FIG. 28 is a diagram showing a configuration of a three-dimensional measurement data automatic alignment apparatus using an optical marker according to a ninth embodiment of the present invention.
FIG. 29 is a flowchart for explaining an operation in the three-dimensional measurement data automatic alignment method using the optical marker according to the ninth embodiment of the present invention.
FIG. 30 is a flowchart for explaining an operation in a three-dimensional measurement data automatic alignment method using an optical marker according to a tenth embodiment of the present invention.
FIG. 31 is a view showing a configuration of a marker generating device according to an eleventh embodiment of the present invention.
[Explanation of symbols]
[0320]
10: measurement object, 12: marker generator,
14: Marker output section, 16: Projection section,
18: Video acquisition unit, 20: Mobile drive unit,
22: Movement mechanism, 24: Video input section,
26: Marker blinking control unit, 28: Projection control unit
30: Microprocessor, 32: Buffer

Claims (27)

In alignment causes the three-dimensional data measuring device three-dimensional measurement data obtained by photographing the measurement target object at different angles,
Optical marker generating means for projecting a plurality of optical markers onto the surface of the measurement object;
Three-dimensional projection means for projecting a pattern on the surface of the measurement object for three-dimensional measurement of the measurement object;
Acquires the two-dimensional image including the projected markers by said optical marker generating means from the measurement object, the image obtaining means for obtaining a three-dimensional measurement data of the measurement object projected by the three-dimensional projection means ,
Extracting a three-dimensional position of the marker from the relationship between the acquired two-dimensional image and the three-dimensional measurement data by said image obtaining means, a relative of the three-dimensional measurement data from the three-dimensional position of the marker A control means for performing an operation for searching for a position;
Under the control of the control means, in order to binarize the plurality of markers in the optical marker generating means, the plurality of markers included in each group are sequentially set by overlapping and dividing according to a predetermined order. Marker individual blink control means for controlling lighting automatically
Have
The control means searches the binarization information by the marker for each group included in a plurality of video data acquired in the number corresponding to the number of groups of the marker by the video acquisition means, and is unique to each marker Extract 2D position as ID
A three-dimensional measurement data automatic alignment apparatus using an optical marker. Wherein A three-dimensional projection means and the image acquisition means, the three-dimensional measurement data automatic alignment apparatus using an optical marker according to claim 1, characterized in that configured to be mutually fixedly integrated . A movement drive unit driven under the control of the control means;
Accept power by driving the transfer drive unit, a moving means for the pre-Symbol dimensional projection means and said image obtaining means is relatively moved with respect to the measurement object
The three-dimensional measurement data automatic alignment device using the optical marker according to claim 2, further comprising: It said marker generating means, the three-dimensional measurement data automatically using optical markers according to claim 1, characterized in that it is arranged in a state of being fixed to each other so as not to relative motion with the measurement object Alignment device. 5. The three-dimensional measurement data automatic alignment apparatus using an optical marker according to claim 4, wherein a plurality of the marker generating means are fixed and arranged on a rotary table on which the measurement object is placed. Said marker generating means, the three-dimensional measurement data automatic alignment apparatus using an optical marker according to claim 1, characterized in that make irregularly projecting a plurality of laser markers to the surface of the object to be measured . In a three-dimensional data measurement device that aligns three-dimensional measurement data acquired by photographing a measurement object at various angles,
And optical marker generating means for projecting a plurality of optical markers on the surface of the object,
Three-dimensional projection means for projecting a pattern on the surface of the measurement object for three-dimensional measurement of the measurement object;
Image acquisition means for acquiring a two-dimensional image including a marker projected by the optical marker generating means from the measurement object, and acquiring three-dimensional measurement data of the measurement object projected by the three-dimensional projection means; ,
A three-dimensional position of a marker is extracted from the relationship between the two-dimensional image acquired by the image acquisition means and the three-dimensional measurement data, and the relative position of the three-dimensional measurement data is extracted from the three-dimensional position of the marker. Control means for performing an operation for searching for
Have
It said image acquisition means, common measurement region in the measurement object relative to acquire the two-dimensional image and the three-dimensional measurement data,
The control unit may distinguish referring to each marker a reference point that is generated based on at least two of the markers are included in the two-dimensional image the three-dimensional measurement data Automatic alignment device for 3D measurement data using optical markers. It said image acquisition means, the surface of the object is acquired a plurality of the two-dimensional image and the three-dimensional measurement data so as to overlap each by region,
Wherein the control means searches the marker of mutually overlap each region pair from the three-dimensional position in the marker to obtain the matrix for moving the marker of the pair moves each measurement data to the reference coordinate system A three-dimensional measurement data automatic alignment apparatus using the optical marker according to claim 7. In a three-dimensional data measurement device that aligns three-dimensional measurement data acquired by photographing from various angles at a measurement object,
Optical marker generating means for projecting a plurality of optical markers onto the surface of the measurement object;
For three-dimensional measurement on the measurement object, and a three-dimensional projection means for projecting a pattern pattern to the surface of the object,
It acquires the two-dimensional image including the projected markers by the marker generating means from the measurement object, the image obtaining means for obtaining a three-dimensional measurement data of the measurement target projected by the three-dimensional projection means,
A three-dimensional position of a marker is extracted from the relationship between the two-dimensional image acquired by the image acquisition means and the three-dimensional measurement data, and the relative position of the three-dimensional measurement data is extracted from the three-dimensional position of the marker. Control means for performing an operation for searching for
A plurality are arranged around the image obtaining means and the three-dimensional projection means and the marker generating means and said measured object, respectively,
The control unit extracts a three-dimensional position of each region marker from the two-dimensional image and the three-dimensional measurement data respectively acquired by the plurality of image acquisition units, and mutually extracts the three-dimensional position of the extracted marker. Find the marker to be paired by regions overlapping, to derive a position transformation matrix by the marker to be paired, the optical markers, wherein the aligning and converts the position of each three-dimensional measurement data by the position transformation matrix The three-dimensional measurement data automatic alignment device used. Wherein said control means stores the previous SL-position location transformation matrix to claim 9, next time measurement is characterized in that aligning and converts the position of each three-dimensional measuring data by the stored position transformation matrix A three-dimensional measurement data automatic alignment apparatus using the described optical marker. The image acquisition means acquires a plurality of two-dimensional images from a plurality of points whose section distances are known with respect to the entire region of the measurement target among the surface of the measurement target, and among the surfaces of the measurement target It is configured to acquire a plurality of 2D images and 3D measurement data so that boundary portions for each region are superimposed on each other for a plurality of measurement regions obtained by subdividing the entire measurement target region,
It said control means calculates a plurality of two-dimensional image information for the entire area to be measured acquired by the image acquiring means calculates the distance information between the known measurement points, the three-dimensional position of each marker In addition, after setting the calculated three-dimensional position of each marker in the absolute coordinate system, the three-dimensional position of each area-specific marker is obtained from the subdivided two-dimensional video and three-dimensional measurement data. Extract and search for a paired marker for each overlapping region from the three-dimensional position of the extracted marker, derive a position transformation matrix by the paired marker, and position of each three-dimensional measurement data by the position transformation matrix The apparatus for automatically aligning three-dimensional measurement data using an optical marker according to claim 1, wherein the apparatus is configured to move and align with the absolute coordinate system. The video acquisition means includes a plurality of large area measurement devices that acquire video in the entire area of the measurement target, separately from the measurement apparatus that acquires the video of the subdivided measurement area,
12. The three-dimensional measurement data automatic alignment device using an optical marker according to claim 11, wherein the large area measurement devices are spaced apart from each other at regular intervals, and the intervals are not changed . The optical marker generating means includes
A light source for generating direct light arranged in a plurality in the X-axis direction;
A light source for generating direct light arranged in a plurality in the Y-axis direction;
An X-axis polygon mirror that reflects direct light generated from the X-axis light source and projects it onto the surface of the measurement object;
A Y-axis polygon mirror that reflects direct light generated from the Y-axis light source and projects it onto the surface of the measurement object;
Rotating means for rotating the X-axis and Y-axis polygon mirrors, respectively.
10. The optical marker according to claim 1 , comprising: a light source blinking control unit that controls blinking with respect to the light sources of the X axis and the Y axis. The three-dimensional measurement data automatic alignment device used. Moving the image acquisition means to a position suitable for acquiring an image in a specific region of the measurement object;
Flash drives marker generating means, as a marker of the optical is projected on the surface of the measuring object, the video acquisition unit, wherein the optical marker to obtain a two-dimensional image with respect to a particular region of the measurement object projected Stages,
A pattern pattern is projected onto the surface of the measurement object by a three-dimensional projection means, and three-dimensional measurement data for a specific region of the measurement object on which the pattern pattern is projected by the image acquisition means; ,
It said extracting three-dimensional position of the marker from the relationship between the the acquired two-dimensional image the three-dimensional measurement data by the image acquisition means, relative to the three-dimensional measurement data from the position of the marker by the three-dimensional measuring data Locating each measurement data by searching for a specific position, and
The step of obtaining a two-dimensional image with respect to a particular region of the measurement target by the image acquisition means,
For binarization of the plurality of optical markers in the marker generating means, overlap divided already by-determined groups, the step of sequentially lighting the optical markers by group,
A step of searching for binarization information by markers for each group included in a plurality of video data acquired in a number corresponding to the number of groups of the optical markers, and extracting a two-dimensional position as a unique ID in each marker And a three-dimensional measurement data automatic alignment method using an optical marker. In the step of obtaining a three-dimensional measurement data for a particular region of the measurement object pattern pattern is projected by said image acquisition means, when projecting the pattern pattern in the three-dimensional projection means, said marker generating means said marker The three-dimensional measurement data automatic alignment method using the optical marker according to claim 14, wherein the three-dimensional measurement data is automatically controlled. In the step of extracting the 3D position of the marker from the relationship between the 2D image acquired by the image acquisition means and the 3D measurement data,
By estimating the arbitrary three-dimensional coordinate values in the three-dimensional measurement data located in line with the coordinate values for any of the three of the markers from the lens center of the camera in the two-dimensional image data of said image acquisition unit, the corresponding marker The three-dimensional position is searched. The three-dimensional measurement data automatic alignment method using the optical marker according to claim 14. Moving the image acquisition means to a position suitable for acquiring an image in a specific region of the measurement object;
Flash drives marker generating means, as a marker of the optical is projected to the surface of the object, the video acquisition unit, a two-dimensional image with respect to a particular region of the measurement object optical marker is projected The stage of acquisition,
A pattern pattern is projected on the surface of the measurement object by the three-dimensional projection means, and three-dimensional measurement data for a specific region of the measurement object on which the pattern pattern is projected by the image acquisition means;
Extracting a three-dimensional position of the marker from the relationship between the two-dimensional video and three-dimensional measurement data obtained by the image obtaining means, a relative three-dimensional measuring data from the position of the markers definitive in respective three-dimensional measurement data Locating each measurement data by searching for a position;
Step of aligning the respective measurement data, looking for relative positions of the three-dimensional measurement data from the position of the three-dimensional measurement data definitive marker is
A step of searching for a pair of markers for each region of the adjacent three-dimensional measurement data so as to overlap each other from the three-dimensional position of the marker;
And deriving the position transformation matrix for alignment of the respective three-dimensional measurement data by marker of the pair,
Using one of the three-dimensional measurement data as a reference coordinate system, and moving and aligning each measurement data according to the derived position transformation matrix. 3D measurement data automatic alignment method. In the step of searching for a pair of markers for each region of the three-dimensional measurement data, the markers coincide with each other using the average vertical vector information around the marker or the marker together with the relative three-dimensional position information in the marker space. The method for automatically arranging three-dimensional measurement data using an optical marker according to claim 17, wherein adjacent measurement data is searched by searching for a pair. In the step of searching for a pair of markers for each region of the three-dimensional measurement data, an additional reference around the marker is included in the three-dimensional data together with relative three-dimensional position information in the marker space. The method of automatically aligning three-dimensional measurement data using an optical marker according to claim 17, wherein a pair of markers is searched by selecting a point. In the step of searching for a pair of markers for each region of the three-dimensional measurement data, relative position information between the markers from the respective three-dimensional measurement data is used, and three points on the space formed by the markers are used. Forming a triangle, determining a length of a side of the triangle, arranging the length of each side in descending order, and searching for a pair of markers by comparing the length and order of each side. A three-dimensional measurement data automatic alignment method using the optical marker according to claim 17. The step of moving and aligning each measurement data using the one three-dimensional measurement data as a reference coordinate system includes the steps of:
Based on information about the vertices and sides of the triangle formed by the three points formed by the markers of each measurement data, performing a conversion to match the positions of the vertices with reference to the triangle of the reference coordinate system;
Performing a rotation transformation to match each side sharing the position of the matched vertex;
The optical marker according to claim 17, further comprising: rotating a vertex that is not included in the matching side to a vertex of the reference coordinate system using the matching side as a rotation axis, and matching each triangle. 3D measurement data automatic alignment method using Moving the image acquisition means to a position suitable for acquiring an image in a specific region of the measurement object;
Flash drives marker generation unit, as a marker of the optical is projected to the surface of the object, the video acquisition unit, wherein the marker to obtain a two-dimensional image with respect to a particular region of the measurement object projected Stages,
A pattern pattern is projected on the surface of the measurement object by the three-dimensional projection means, and three-dimensional measurement data for a specific region of the measurement object on which the pattern pattern is projected by the image acquisition means;
The three-dimensional position of the marker is extracted from the relationship between the two-dimensional image acquired by the image acquisition means and the three-dimensional measurement data, and the relative position of the three-dimensional measurement data is determined from the marker position based on each three-dimensional measurement data. Searching and aligning each measurement data,
Of the surface of the measurement object, obtaining a plurality of two-dimensional images from a plurality of points whose section distance is known with respect to the entire area of the measurement object;
Calculating a plurality of two-dimensional image information for the entire region to be measured and distance information between the known measurement points, calculating a three-dimensional position of each marker, and calculating the tertiary of each calculated marker Setting the original position to an absolute coordinate system, and
The step of searching for the relative position of the three-dimensional measurement data from the positions of the markers based on the respective three-dimensional measurement data and aligning the respective measurement data,
Searching for a pair of markers for each adjacent 3D measurement data area acquired so as to overlap each other from the 3D position of the marker,
Derives the position transformation matrix for alignment of the respective three-dimensional measurement data by the marker forming a pair, by a position conversion matrix issued conductor, having the steps of aligning the absolute coordinate system by moving the measurement data 3D measurement data automatic alignment method using optical markers characterized by Moving the image acquisition means to a position suitable for acquiring an image in a specific region of the measurement object;
Stage flash drives marker generating means, as a marker of the optical is projected on the surface of the measuring object, the video acquisition unit, wherein the marker to obtain a two-dimensional image with respect to a particular region of the measurement object projected When,
A pattern pattern is projected on the surface of the measurement object by the three-dimensional projection means, and three-dimensional measurement data for a specific region of the measurement object on which the pattern pattern is projected by the image acquisition means;
The three-dimensional position of the marker is extracted from the relationship between the two-dimensional image acquired by the image acquisition means and the three-dimensional measurement data, and the relative position of the three-dimensional measurement data is determined from the marker position based on each three-dimensional measurement data. Locating and aligning each measurement data, and
After image data is captured by the image acquisition means, when the marker generating means is controlled to be turned on in order to capture another area, the optical marker that indicates the previously captured area is periodically flashed. A three-dimensional measurement data automatic alignment method using an optical marker, characterized in that Moving the image acquisition means to a position suitable for acquiring an image in a specific region of the measurement object;
Stage flash drives marker generating means, as a marker of the optical is projected on the surface of the measuring object, the video acquisition unit, wherein the marker to obtain a two-dimensional image with respect to a particular region of the measurement object projected When,
A pattern pattern is projected on the surface of the measurement object by the three-dimensional projection means, and three-dimensional measurement data for a specific region of the measurement object on which the pattern pattern is projected by the image acquisition means;
The three-dimensional position of the marker is extracted from the relationship between the two-dimensional image acquired by the image acquisition means and the three-dimensional measurement data, and the relative position of the three-dimensional measurement data is determined from the marker position based on each three-dimensional measurement data. Locating and aligning each measurement data, and
The step of acquiring a two-dimensional image for a specific region of the measurement object by the image acquisition means,
Illuminating the marker with the marker generating means, and temporarily acquiring a two-dimensional image including the marker from a specific region of the measurement object with the image acquiring means;
A step of off the optical marker to obtain a two-dimensional image that does not contain the marker from the same region of the measurement target secondarily,
Have
After shooting the image data by the image acquisition means, when the lighting control said marker generating means for taking other areas, and an optical marker that instructs the previously captured area, the area not yet captured A method of automatically aligning three-dimensional measurement data using an optical marker, wherein the hue is different from that of the optical marker to be indicated. Centering on the measurement object, arranging a plurality of image acquisition means, three-dimensional projection means and marker generation means,
The plurality of marker generating means is controlled to blink to project a plurality of optical markers onto the measurement object, and the plurality of image acquisition means and three-dimensional projection means are controlled to provide a two-dimensional image for the measurement object. 3D measurement data is acquired, 3D positions of markers for each region are extracted from the acquired 2D images and 3D measurement data, and the 3D positions of the extracted markers overlap each other. A calibration stage that searches for a pair of markers by region and derives a position transformation matrix by the pair of markers,
With each to obtain the two-dimensional image with respect to a particular region of the measurement object by the plurality of image acquisition means, the surface pattern pattern of the measurement target in the plurality of three-dimensional projection means is to be projected, said plurality a step of pattern pattern is respectively acquires the three-dimensional measurement data for a particular region of the measurement target projected by the image acquisition means,
Aligning the three-dimensional measurement data with a position transformation matrix derived in the calibration step; and a three-dimensional measurement data automatic alignment method using an optical marker. The automatic calibration of 3D measurement data using an optical marker according to claim 25, wherein the calibration step is sequentially performed prior to acquiring a 2D image and 3D data for the measurement object. Alignment method. The calibration step is performed only once, and when the 3D measurement data for the next measurement object is aligned, the position transformation matrix derived in the calibration step performed first is used. A three-dimensional measurement data automatic alignment method using the optical marker according to claim 25.

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