KR20040009528A - Apparatus for testing common coil short - Google Patents

Apparatus for testing common coil short Download PDF

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Publication number
KR20040009528A
KR20040009528A KR1020020043514A KR20020043514A KR20040009528A KR 20040009528 A KR20040009528 A KR 20040009528A KR 1020020043514 A KR1020020043514 A KR 1020020043514A KR 20020043514 A KR20020043514 A KR 20020043514A KR 20040009528 A KR20040009528 A KR 20040009528A
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South Korea
Prior art keywords
comparator
ferrite
coil
signal
oscillation
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KR1020020043514A
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Korean (ko)
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김은호
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엘지이노텍 주식회사
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Priority to KR1020020043514A priority Critical patent/KR20040009528A/en
Publication of KR20040009528A publication Critical patent/KR20040009528A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/72—Testing of electric windings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/40—Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices

Abstract

PURPOSE: An apparatus for inspecting short circuit of coils is provided to reduce a time for measurement and to enhance the reliability by inspecting the short circuit for all kinds of coils. CONSTITUTION: An apparatus for inspecting short circuit of coils includes a ferrite, an LC oscillation circuit(110), an amplifier(120), a comparator(130), and a display. The ferrite is formed with an U-shaped bar having an open upper end portion. The LC oscillation circuit(110) includes an inductor formed at one side of the ferrite and a capacitor connected to the inductor. The amplifier(120) is used for amplifying an oscillation signal of the LC oscillation circuit(110). The comparator(130) is used for comparing an output signal of the amplifier(120) to the reference signal. The display is turned on or off by an output signal of the comparator(130).

Description

범용 코일단락 검사장치{APPARATUS FOR TESTING COMMON COIL SHORT}General Purpose Coil Short Inspection System {APPARATUS FOR TESTING COMMON COIL SHORT}

본 발명은 검사장치에 관한 것으로, 상세하게는 여러 종류의 코일의 단락 여부를 손쉽게 확인할 수 있는 범용 코일단락 검사장치에 관한 것이다.The present invention relates to an inspection apparatus, and more particularly, to a general-purpose coil short circuit inspection apparatus that can easily check whether or not a short circuit of various types of coils.

일반적으로 현재 제품으로 사용중인 코일뭉치에는 솔레노이드형 코일과 팬케익형 코일의 6종류가 있다.In general, there are six kinds of coil bundles currently used as products: solenoid coils and pancake coils.

이러한 코일은 제품에 적용하기 전에 단락 여부를 검사하는 데, 이러한 단락 검사는 측정자가 직접 각 코일의 저항 및 절연 저항을 각각 측정하여 그 단락 여부를 판단하기 때문에 측정 시간이 과다하게 소비되고, 신뢰성에 문제가 있다.These coils are inspected for shorts before they are applied to the product. These short-circuit tests directly measure the resistance and insulation resistance of each coil and determine whether they are short-circuited, resulting in excessive measurement time and reliability. there is a problem.

따라서 본 발명의 목적은 상기와 같은 문제점을 해결하기 위한 것으로, 어떠한 형태의 코일도 손쉽게 단락 여부를 검사할 수 있는 범용 코일단락 검사장치를 제공함으로써 측정자에게 편의를 제공하고, 측정 시간을 줄이며, 신뢰성을 높이도록 하는데 있다.Therefore, an object of the present invention is to solve the above problems, by providing a general-purpose coil short circuit inspection apparatus that can easily check whether any type of coil short-circuited, to provide convenience to the operator, reduce the measurement time, reliability To raise the

도 1은 본 발명에 따른 범용 코일단락 검사장치의 구성을 개략적으로 나타낸 블록도1 is a block diagram schematically showing the configuration of a general-purpose coil short circuit inspection apparatus according to the present invention

도 2는 본 발명에 따른 범용 코일단락 검사장치중 페라이트의 구성을 나타낸 단면도2 is a cross-sectional view showing the configuration of a ferrite among the general-purpose coil short inspection apparatus according to the present invention

<도면중 주요부분에 대한 부호의 설명><Description of the symbols for the main parts of the drawings>

1 : 코일101 : 페라이트1: coil 101: ferrite

110 : LC 발진회로120 : 증폭기110: LC oscillation circuit 120: amplifier

130 : 비교기140 : 표시부130: comparator 140: display unit

C1 : 커패시터D1 : LEDC1: Capacitor D1: LED

L1 : 인덕터Q1 : 트랜지스터L1: Inductor Q1: Transistor

상기와 같은 목적을 달성하기 위한 본 발명의 특징은,Features of the present invention for achieving the above object,

코일의 단락 여부를 검사하는 검사장치에 있어서,In the inspection device for inspecting the short circuit of the coil,

상기 코일과 교차가 가능하도록 상단부가 개구된 U자 막대형으로 형성된 페라이트와,A ferrite formed in a U-shaped bar having an upper end opened to cross the coil;

상기 페라이트에서 교번 자속이 발생하도록 상기 페라이트의 일측에 인덕터가 권선되고, 상기 인덕터와 커패시터가 전기적으로 연결되어 상기 인덕터와 커패시터의 충방전에 의해 발진을 일으키는 LC 발진회로와,An LC inductor circuit wound on one side of the ferrite so that alternating magnetic flux is generated in the ferrite, and the inductor and the capacitor are electrically connected to each other to generate an oscillation by charging and discharging of the inductor and the capacitor;

상기 LC 발진회로로부터 출력되는 발진 신호를 증폭시키는 증폭기와,An amplifier for amplifying the oscillation signal output from the LC oscillation circuit;

상기 증폭기로부터 출력되는 신호를 기준 신호와 비교하여 기준 신호보다 출력 신호가 작으면 신호를 출력하는 비교기와,A comparator for comparing the signal output from the amplifier with a reference signal and outputting a signal if the output signal is smaller than the reference signal;

상기 비교기로부터 출력되는 신호에 따라 스위칭되어 점등되는 표시부를 포함하는 것을 특징으로 한다.And a display unit which is switched on and lit according to the signal output from the comparator.

여기에서 상기 표시부는,Here, the display unit,

상기 비교기의 출력 신호에 따라 스위칭되는 트랜지스터와,A transistor switched according to the output signal of the comparator;

상기 트랜지스터의 스위칭에 따라 점등되는 LED로 구성된다.It consists of an LED that is turned on in accordance with the switching of the transistor.

여기에서 또한 상기 비교기의 어느 하나의 입력단에는,Here, also at any one input terminal of the comparator,

기준 신호의 레벨을 가변시키는 가변 저항이 접속된다.A variable resistor for varying the level of the reference signal is connected.

여기에서 또 상기 페라이트는,Here again the ferrite,

자속을 집중시키도록 개구된 일끝단이 내측 수직방향으로 연장 형성된다.One end opened to concentrate the magnetic flux is formed extending in the inner vertical direction.

이하, 본 발명에 의한 범용 코일단락 검사장치의 구성을 도 1 및 도 2를 참조하여 상세하게 설명하기로 한다.Hereinafter, the configuration of a general-purpose coil short test apparatus according to the present invention will be described in detail with reference to FIGS. 1 and 2.

도 1은 본 발명에 따른 범용 코일단락 검사장치의 구성을 개략적으로 나타낸 블록도이고, 도 2는 본 발명에 따른 범용 코일단락 검사장치중 페라이트의 구성을 나타낸 단면도이다.1 is a block diagram schematically showing the configuration of a general-purpose coil short test apparatus according to the present invention, Figure 2 is a cross-sectional view showing the configuration of a ferrite among the general-purpose coil short test apparatus according to the present invention.

도 1 및 도 2를 참조하면, 본 발명에 따른 범용 코일단락 검사장치(100)는, 페라이트(101)와, LC 발진회로(110)와, 증폭기(120)와, 비교기(130)와, 표시부(140)로 구성된다.1 and 2, the general-purpose coil short circuit inspection apparatus 100 according to the present invention includes a ferrite 101, an LC oscillation circuit 110, an amplifier 120, a comparator 130, and a display unit. 140.

페라이트(101)는 도 2에 도시된 바와 같이 코일(1)과 교차가 가능하도록 상단부가 개구된 U자 막대형으로 형성되고, 개구된 일끝단이 내측 수직방향으로 연장 형성된다. 여기에서 페라이트(ferrite)는 α철을 조직상으로 페라이트라 하며 라틴어의 철(ferrum)에서 딴 것으로, 그 성분은 거의 순철과 같으며, 0.85%C이하의 강에서 프리 페라이트로서 존재하며, 연하고 전연성이 크며 강자성체이다.As shown in FIG. 2, the ferrite 101 is formed in a U-shaped bar having an upper end opened to cross the coil 1, and one open end thereof extends in the inner vertical direction. Here, ferrite (ferrite) is a ferritic structure of α-iron and is derived from Latin ferrum, and its composition is almost the same as pure iron, and is present as preferrite in steel below 0.85% C. It is malleable and ferromagnetic.

LC 발진회로(110)는 페라이트(101)에서 교번 자속이 발생하도록 페라이트(101)의 일측에 인덕터(L1)가 권선되고, 인덕터(L1)와 커패시터(C1)가 전기적으로 연결되어 인덕터(L1)와 커패시터(C1)의 충방전에 의해 발진을 일으킨다.In the LC oscillation circuit 110, an inductor L1 is wound around one side of the ferrite 101 so that an alternating magnetic flux is generated in the ferrite 101, and the inductor L1 and the capacitor C1 are electrically connected to each other. And oscillation by charging and discharging of the capacitor C1.

증폭기(120)는 LC 발진회로(110)로부터 출력되는 발진 신호를 증폭시키며, 비교기(130)는 증폭기(120)로부터 출력되는 신호를 기준 신호와 비교하여 기준 신호보다 출력 신호가 작으면 신호를 출력한다. 여기에서 비교기(130)의 비반전단자에는 코일의 종류에 따라 기준 신호의 레벨을 가변시킬 수 있도록 가변 저항(VR1)이 접속되는 것이 바람직하다.The amplifier 120 amplifies the oscillation signal output from the LC oscillation circuit 110, and the comparator 130 compares the signal output from the amplifier 120 with a reference signal and outputs a signal when the output signal is smaller than the reference signal. do. Here, it is preferable that the variable resistor VR1 is connected to the non-inverting terminal of the comparator 130 so that the level of the reference signal can be varied according to the type of the coil.

표시부(140)는 비교기(130)의 출력 신호에 따라 스위칭되도록 비교기의 출력단에 베이스가 연결되고, 전원 공급단(Vcc)에 컬렉터가 연결되고, 그라운드에 에미터가 연결되는 트랜지스터(Q1)와, 트랜지스터(Q1)의 스위칭에 따라 점등되도록 전원 공급단(Vcc)에 애노드가 연결되고, 트랜지스터(Q1)의 컬렉터에 캐소드가 연결되는 LED(D1)로 구성된다. 도면중 미설명 부호인 R1, Q2는 증폭기(120)가 동작하기 위한 필수 소자인 저항과, 트랜지스터이고, R2는 LC 발진회로(110)가 발진을 유지하기 위한 저항이며, C3, R3는 DC 옵셋 제거를 위한 콘덴서와, 저항이고, D2는 비교기(130)의 비반전 단자로 +신호만이 인가시키는 다이오드이며, D3는 트랜지스터(Q1)로 과전류, 과전압이 입력되면 도통되어 트랜지스터(Q1)를 보호하는 다이오드이다.The display unit 140 includes a transistor Q1 having a base connected to the output terminal of the comparator so as to be switched according to the output signal of the comparator 130, a collector connected to the power supply terminal Vcc, and an emitter connected to the ground, An anode is connected to the power supply terminal Vcc so as to be turned on according to the switching of the transistor Q1, and an LED D1 is connected to the collector of the transistor Q1. In the drawings, reference numerals R1 and Q2 denote resistors that are essential elements for the amplifier 120 to operate, transistors, and R2 denotes resistors for maintaining the oscillation of the LC oscillator 110. C3 and R3 denote DC offsets. A capacitor for removal and a resistor, D2 is a diode to apply only a + signal to the non-inverting terminal of the comparator 130, and D3 is energized when overcurrent and overvoltage are input to the transistor Q1 to protect the transistor Q1. It is a diode.

이하 본 발명에 따른 범용 코일단락 검사장치의 동작을 도 1 및 도 2를 참조하여 상세하게 설명하면 다음과 같다.Hereinafter, the operation of the general-purpose coil short inspection apparatus according to the present invention will be described in detail with reference to FIGS. 1 and 2.

먼저 LC 발진회로(110)의 충방전에 의해 발진이 발생하면 사인파 형태의 발진이 발생하고, 이 발진이 LC 발진회로(110)의 인덕터(L1)에 인가되면 인덕터(L1)에는 자속이 발생하고, 자속에 의해 페라이트(101)에는 교번자속이 발생한다.First, when oscillation occurs due to charging and discharging of the LC oscillation circuit 110, a sinusoidal oscillation occurs. When the oscillation is applied to the inductor L1 of the LC oscillation circuit 110, a magnetic flux is generated in the inductor L1. The alternating magnetic flux is generated in the ferrite 101 by the magnetic flux.

그러면 LC 발진회로(110)로부터 출력되는 신호는 증폭기(120)를 통해 비교기(130)로 입력되는데, 비교기(130)로 LC 발진회로(110)의 출력 신호가 비교기(130)의 기준 신호보다 커서 트랜지스터(Q1)는 오프상태를 유지하고, 이로 인해 LED(D1)도 오프상태를 유지한다.Then, the signal output from the LC oscillator circuit 110 is input to the comparator 130 through the amplifier 120, the output signal of the LC oscillator circuit 110 to the comparator 130 is larger than the reference signal of the comparator 130 Transistor Q1 remains off, which causes LED D1 to remain off as well.

이러한 상태에서 교번 자속이 존재하는 공간 즉, 자계 내에 도 2와 같이 코일을 놓고 코일(1)을 상하로 움직이면 코일(1)에는 전자 유도 법칙에 의해 유도 기전력이 발생한다. 이때 만약 코일(1)이 단락되어 있다면 코일(1)에는 전류가 흐르게 된다.In this state, when the coil is placed in the space where the alternating magnetic flux exists, that is, as shown in FIG. 2 and the coil 1 is moved up and down, the induced electromotive force is generated in the coil 1 by the law of electromagnetic induction. At this time, if the coil 1 is short-circuited, current flows through the coil 1.

코일(1)이 단락되어 코일(1)에 전류가 흐르게 되면, 이 전류로 인해 암페어의 오른나사 법칙과 같이 코일(1) 주위에도 자속이 발생한다.When the coil 1 is short-circuited and an electric current flows in the coil 1, a magnetic flux generate | occur | produces also around the coil 1 by the law of the right screw of amperage by this electric current.

이때 코일(1)을 상하로 이동하고 있기 때문에 자속에 의해 LC 발진회로(110)의 인덕터(L1)에 원래의 방향과 반대 방향의 유도 기전력이 발생하고, 이로 인해 LC 발진회로(110)의 전류가 감소하게 된다.At this time, since the coil 1 is moving up and down, induced electromotive force in the opposite direction to the original direction is generated in the inductor L1 of the LC oscillation circuit 110 by the magnetic flux, which causes the current of the LC oscillation circuit 110 to flow. Will decrease.

이로 인해 비교기(130)로 입력되는 신호가 기준 신호보다 작아져 트랜지스터(Q1)가 턴-온되고, 이로 인해 LED(D1)가 점등되어 코일(1)의 단락을 측정자에게 알린다.As a result, the signal input to the comparator 130 is smaller than the reference signal, so that the transistor Q1 is turned on, so that the LED D1 is turned on to inform the measurer of the short circuit of the coil 1.

한편 코일(1)이 단락되지 않았으면 코일(1)에는 전류가 흐르지 않게되고, 코일(1) 주위에도 자속이 발생되지 않으며, LC 발진회로(110)의 인덕터(L1)에도 유도 기전력이 발생하지 않게 되어 LC 발진회로(110)의 전류가 감소하지 않게 된다.On the other hand, if the coil 1 is not shorted, no current flows in the coil 1, no magnetic flux is generated around the coil 1, and no induced electromotive force is generated in the inductor L1 of the LC oscillation circuit 110. As a result, the current of the LC oscillation circuit 110 does not decrease.

그리하여 비교기(130)로 입력되는 신호가 기준 신호보다 크기 때문에 트랜지스터(Q1)가 턴-오프 상태를 유지하고 있고, 이로 인해 LED(D1)가 오프 상태를 유지한다.Thus, since the signal input to the comparator 130 is larger than the reference signal, the transistor Q1 maintains the turn-off state, which causes the LED D1 to maintain the off state.

따라서 여러 종류의 코일을 페라이트에 왕복만시키면 단락 여부를 LED를 통해 손쉽게 확인할 수 있다.Therefore, it is easy to check whether a short circuit is made by LED by simply reciprocating various coils to ferrite.

이상에서 설명한 바와 같이 본 발명에 따른 범용 코일단락 검사장치에 의하면, 어떠한 형태의 코일도 손쉽게 단락 여부를 검사할 수 있음으로써 측정자에게 편의를 제공하고, 측정 시간을 줄이며, 신뢰성을 높일 수 있다.As described above, according to the general-purpose coil short circuit inspection apparatus according to the present invention, the coil of any type can be easily inspected for short-circuit, thereby providing convenience to the operator, reducing measurement time, and increasing reliability.

Claims (4)

코일의 단락 여부를 검사하는 검사장치에 있어서,In the inspection device for inspecting the short circuit of the coil, 상기 코일과 교차가 가능하도록 상단부가 개구된 U자 막대형으로 형성된 페라이트와,A ferrite formed in a U-shaped bar having an upper end opened to cross the coil; 상기 페라이트에서 교번 자속이 발생하도록 상기 페라이트의 일측에 인덕터가 권선되고, 상기 인덕터와 커패시터가 전기적으로 연결되어 상기 인덕터와 커패시터의 충방전에 의해 발진을 일으키는 LC 발진회로와,An LC inductor circuit wound on one side of the ferrite so that alternating magnetic flux is generated in the ferrite, and the inductor and the capacitor are electrically connected to each other to generate an oscillation by charging and discharging of the inductor and the capacitor; 상기 LC 발진회로로부터 출력되는 발진 신호를 증폭시키는 증폭기와,An amplifier for amplifying the oscillation signal output from the LC oscillation circuit; 상기 증폭기로부터 출력되는 신호를 기준 신호와 비교하여 기준 신호보다 출력 신호가 작으면 신호를 출력하는 비교기와,A comparator for comparing the signal output from the amplifier with a reference signal and outputting a signal if the output signal is smaller than the reference signal; 상기 비교기로부터 출력되는 신호에 따라 스위칭되어 점등되는 표시부를 포함하는 것을 특징으로 하는 범용 코일단락 검사장치.And a display unit which is switched on and switched on in accordance with the signal output from the comparator. 제 1 항에 있어서,The method of claim 1, 상기 표시부는,The display unit, 상기 비교기의 출력 신호에 따라 스위칭되는 트랜지스터와,A transistor switched according to the output signal of the comparator; 상기 트랜지스터의 스위칭에 따라 점등되는 LED로 구성되는 것을 특징으로 하는 범용 코일단락 검사장치.General-purpose coil short circuit inspection device, characterized in that consisting of the LED is turned on in accordance with the switching of the transistor. 제 1 항에 있어서,The method of claim 1, 상기 비교기의 어느 하나의 입력단에는,At any one input terminal of the comparator, 기준 신호의 레벨을 가변시키는 가변 저항이 접속되는 것을 특징으로 하는 범용 코일단락 검사장치.A general-purpose coil short circuit inspection device, characterized in that a variable resistor for varying the level of the reference signal is connected. 제 1 항에 있어서,The method of claim 1, 상기 페라이트는,The ferrite is, 자속을 집중시키도록 개구된 일끝단이 내측 수직방향으로 연장 형성되는 것을 특징으로 하는 범용 코일단락 검사장치.A general-purpose coil short circuit inspection device, characterized in that one end opened to concentrate the magnetic flux is formed extending in the inner vertical direction.
KR1020020043514A 2002-07-24 2002-07-24 Apparatus for testing common coil short KR20040009528A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060116594A (en) * 2005-05-10 2006-11-15 오현택 The device and method which inspect the coil of an electrical equipment utilizing electromagnetic induction theory
KR100971733B1 (en) * 2008-05-28 2010-07-26 한국철도공사 Pantograph type variable safe railing
KR20190037656A (en) * 2017-09-29 2019-04-08 주식회사 엘지화학 Apparatus and method for diagnosis relay welding

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060116594A (en) * 2005-05-10 2006-11-15 오현택 The device and method which inspect the coil of an electrical equipment utilizing electromagnetic induction theory
KR100971733B1 (en) * 2008-05-28 2010-07-26 한국철도공사 Pantograph type variable safe railing
KR20190037656A (en) * 2017-09-29 2019-04-08 주식회사 엘지화학 Apparatus and method for diagnosis relay welding

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