KR200380970Y1 - Inspection device of infrared ray cut off filter for small size optical instrument - Google Patents

Abstract

The present invention relates to a device for inspecting an infrared cut filter used in a small optical device, and in the surface inspection step of a product for inspecting a surface of a product which is a step before completion of the infrared cut filter in the manufacturing process of the infrared cut filter, There is a problem in that the worker takes a long time as the user picks up the products one by one using a hand or a tool and performs the inspection work using the naked eye or a microscope, and the productivity is also poor because workability is also poor.

Therefore, the present invention provides a surface inspection step of the disc, a coating film inspection step of the disc, a primary cutting process of the disc, a secondary cutting process of the disc, a step of confirming the dimensions of the product, a surface cleaning step of the product, In manufacturing the finished infrared cut filter through the surface inspection step of the product,

In order to be used in the surface inspection step of the product to form a plurality of through-holes 111, 121 to maintain a constant interval in the form of a grid on the upper surface of the stepped portion 111a on the upper inner surface of the through-holes 111, 121 ) (A) and a pair of plate members 110 and 120 having holes 112 and 122 formed at one side and the other corner of the upper surface, and the holes 112 of the plate members 110 and 120. According to the configuration of the inspection device consisting of the fixing pin 200 to be fitted to the 122, when inspecting both surfaces of the product through the surface inspection step of the product, a plurality of products (for each through hole 111 of the plate material 110 One side of the product 300 is visually or microscopically inspected in a state in which the 300 is fitted to each other, and then the other plate material is formed so that the through holes 111 and 121 face each other while facing each other. 120 overlapping, and the fixing pin 200 in the holes 112 and 122 of the plate 110 and the other plate 120 that is matched at this time After the installation, the plate 110 and the other plate 120 is overlaid together, remove the fixing pin 200 and the upper plate 110 and then moved to the through hole 121 of the other plate 120 The opposite surface of the 300 can also be inspected using the naked eye and a microscope, so that a large number of products 300 can be inspected quickly and accurately to further improve the accuracy and efficiency of the inspection.

Description

Inspection device of infrared ray cut off filter for small size optical instrument

The present invention relates to an infrared cut filter used in a compact optical device, and more particularly, in the surface inspection step of the product for inspecting the surface of the infrared cut filter in the process of manufacturing the infrared cut filter, at the same time a large number of infrared cut off The inspection device of the infrared cut filter used in the small optics that can inspect the filter surface and can inspect both surfaces of the infrared cut filter accurately and quickly to further improve the accuracy and efficiency of the inspection work. will be.

In general, an optical instrument forms an image of an object in space by using reflection, refraction, absorption, interference, and diffraction, which are characteristics of light radiated from the sun or an electric light, or emit radiation emitted from an object. It is a device to analyze and study the properties of the object.

To broadly classify such optical devices, such as glasses, binoculars, telescopes, microscopes and the like for the purpose of enhancing the visual power of the eye; For the purpose of recording and reproducing images produced by lenses such as cameras, movies, televisions, video cameras, projectors, etc .; For optical measurement of rangefinders, transits, interferometers, altimeters, spectrometers, lens meters, etc .; Such as fiber scopes, gastroscopes, and the like can be classified into optical fiber bundles such as image propagation, information transmission, and the like. The scope and application of such optical devices are being developed in various fields.

In such optics, image recognition optics aimed at recording and reproducing images generated by the lens are various as mentioned above, such as camcorders, digital cameras, PDAs, surveillance cameras, car cameras, image cams, mobile phone cameras, and the like. In addition, a digital imager rather than an analog type is used, and as the digital imager, a complementary metal oxide semiconductor (CMOS) or a solid state imaging device (CCD) is used.

Recently, as image-related components such as CMOS and CCD, which are digital imagers, have been gradually miniaturized, image recognition optical devices have been miniaturized, making it easy to carry, and a small digital camera is incorporated into a mobile phone.

In addition, the digital imager is equipped with an infrared ray cut off filter (infrared ray cut off filter), which transmits only visible light (Visible) reaching the digital imager to convert the optical image information into an electrical signal Infrared rays reflect or absorb to prevent infrared rays from reaching the digital imager CCD or CMOS, and the thickness is mainly made of 0.05mm and 0.4mm or more, and the shape of the digital imager is installed. Depending on the shape of the installation part of the product, it is made in round or square and other various shapes.

On the other hand, looking at the process of manufacturing the infrared cut filter as described above,

A surface inspection step of the disc for checking whether the disc surface of the infrared cut filter has scratches or foreign matters attached thereto;

Coating film inspection step of the original film to inspect the peeling phenomenon of the coating film using a strong adhesive tape;

A primary cutting processing step of the disc for processing the disc into the least amount;

A secondary cutting processing step of the disc to be processed into a plurality of products, which are the previous stages of the finished product, to meet the shape and dimensions to make the equalized disc;

Confirming the dimensions of the product to confirm the overall dimensions of the product made through the secondary cutting;

A surface cleaning step of the product for removing foreign matters and dusts on both surfaces of the product;

Inspecting the surface of the product by visual inspection or by using a microscope according to the specification of the product;

After that, the finished infrared cut filter is made.

On the other hand, if you look at the surface inspection step of the product during the manufacturing process of the infrared cut filter as described above, the product surface that passes the surface cleaning step of the product using the incandescent lamp or three wavelengths to visually inspect or require high specifications In this case, the test is carried out precisely using a 40x microscope.

However, if you look at the product surface inspection step as described above, the operator picked up each product that passed the cleaning step by hand or tool one by one using the naked eye or a microscope after inspecting one surface of the product. If not, the opposite surface of the product is also visually inspected under a microscope, and if there is no problem on both surfaces of the product, it moves to the next step to become a finished product which is an infrared cut filter.

Therefore, when inspecting a plurality of products in the manner described above not only consumes a lot of work time according to the inspection work, but also poor workability, the accuracy and efficiency of the work is reduced, there is a problem that the productivity is reduced.

Therefore, the object of the present invention is to solve the above problems, and can inspect a large number of product surfaces at the same time by using an inspection device, and can improve the workability by accurately and effectively inspecting both surfaces of the product. The present invention provides a device for inspecting an infrared cut filter, which is used in a compact optical device, in which productivity can be further improved while working time is shortened.

The purpose of the present invention is to examine both surfaces of the infrared cut filter in the process of manufacturing the infrared cut filter,

A plurality of through holes are respectively formed in a lattice form on the upper surface of the pair of plates, and a stepped portion is formed on the upper inner surface of the through holes, and holes are formed at one side and the other edge of the upper surface of the plate, and as the holes. After the inspection device is configured so that a pair of fixing pins can be fitted, the infrared cut filter is inserted into each through hole of the plate, and then one surface of the infrared cut filter can be inspected by visual or microscope. .

When the surface opposite to the infrared cutoff filter is inspected, the other sheet overlaps the upper surface of the sheet into which the infrared cutoff filter is inserted so that the through hole and the hole of the sheet are aligned with the through holes and the hole of the other sheet. Insert the retaining pin into the top plate, turn the two overlapping plates together, remove the upper plate and inspect the opposite surface of the infrared cut-off filter that has been transferred to the through hole of the other plate below to further improve the accuracy and efficiency of the inspection operation. As can be achieved.

Hereinafter, with reference to the accompanying drawings, the technical configuration and operation effects as a preferred embodiment that can effectively achieve the features of the present invention as follows.

That is, Figure 1 is a perspective view illustrating an inspection device according to the present invention, Figure 2 is a perspective view illustrating the main portion of the infrared cut filter is installed on the plate of the inspection device according to the present invention, Figure 3 is an inspection according to the present invention 4 is a cross-sectional view illustrating a state in which another plate overlaps the upper surface of the plate of the inspection apparatus according to the present invention, Figure 4b is a test according to the present invention FIG. 4C is a cross-sectional view illustrating a state in which another plate is superimposed on the upper surface of the apparatus, and FIG. 4C is a cross-sectional view illustrating a state in which a plate positioned at the top is lifted after the plate and the other plate superposed on each other are rotated 180 degrees according to FIG. 4B.

As exemplified in the present invention, the present invention provides a surface inspection step of a disc, a coating film inspection step of a disc, a primary cutting process of a disc, a secondary cutting process of a disc, a step of confirming a dimension of a product, and a surface of a product. In constructing the inspection device used in the surface inspection step of the product during the manufacturing process to the infrared cut filter that is the finished product through the cleaning step and the surface inspection step of the product,

A plurality of through holes 111 and 121 are respectively formed in a lattice form on the upper surface of the pair of plate members 110 and 120, but the stepped portions 111 a and 121 a are disposed above the inner surface of the through holes 111 and 121. And a pair of fixing pins 200 may be inserted into the holes 112 and 122 by forming holes 112 and 122 at opposite sides of the upper surface of the plate 110 and 120. It is characterized by an inspection device.

In the drawings, reference numerals 113 and 123 denote display units that make it easy to determine the overlapping direction when the plates 110 and 120 overlap each other, and 300 is a product before completion of the infrared cut filter. to be.

The present invention is to produce a plurality of infrared cut filter having a constant dimension and shape through the various stages of the infrared cut filter, in the step of finally inspecting both surfaces of the infrared cut filter at the same time a large number of infrared cut filter This allows for accurate, quick and effective inspection.

On the other hand, the manufacturing process of the infrared cut filter, as mentioned above, the surface inspection step of the original plate, the coating film inspection step of the original plate, the first cutting processing step of the original plate, the second cutting processing step of the original plate, and confirm the dimensions of the product In the step, the surface cleaning step of the product, and the surface inspection step of the product is a finished infrared cut filter.

That is, after the disk of a certain size for the production of infrared cut filter is received, it is classified and stored according to the type or thickness of the coating, and when the order comes in, the quantity of the disk required for the order is moved to the surface inspection step of the disk. In the surface inspection step of the disc, 60W incandescent lamps or three wavelengths are used to check for the presence of scratches, contamination or foreign matters that may occur on the surface of the disc.

Then, the disc that passed the surface inspection step of the disc is subjected to a coating film inspection step of the disc to examine the state of the coating film coated on the disc surface, the coating film inspection step of the disc was attached to the disc surface with a strong adhesive tape It is to determine whether the coating film is peeled off from the original plate while removing it, and typically five or more points of the original plate are selected and inspected.

Since the original plate passed through the coating film inspection step of the original plate is subjected to the first cutting processing step of the original plate, which is to divide the appropriate size to facilitate the processing of the original plate, where the number of parts divided into more waste It is preferable to divide the food into a minimum number of pieces.

As described above, the original plate divided by the primary cutting process of the original plate is moved to the secondary cutting process of the original plate and processed into the original plate according to the ordered size and shape. 300).

As described above, the plurality of products 300 made by the second cutting process of the original plate are processed according to the ordered dimensions, and after the dimension inspection through the dimension checking step of the product, the surface of the product 300 goes through the various steps. It is moved to the surface cleaning step of the product to remove foreign matters that get on the surface.

In the surface cleaning step of the product 300, one surface of the product 300 is first cleaned by using cloth and acetone to remove contaminants, etc., on one surface of the product 300, and then optical The cleaning operation on one surface of the product 300 is completed through the secondary cleaning to remove the foreign matter or dust generated by the primary cleaning using the tissue.

In addition, since the opposite surface of the product 300 is also cleaned through the first cleaning process and the second cleaning process in the same manner as one surface of the product 300, both surfaces of the plurality of products 300 are cleaned through this process. will be.

As such, after both surfaces of the product 300 are cleaned, the surface of each product 300 is visually inspected once again, or in the case of the high specification product 300, the product is precisely inspected using the microscope 400. The surface inspection step will be performed.

However, in the product surface inspection step, the inspection of the surface of the product 300 by using the naked eye or microscope 400 in the state of picking up each of the product 300 using a hand or a tool. It takes a long time according to work, workability is also not easy, there was a problem that the productivity is reduced in the end.

Therefore, the present invention forms a pair of plate members 110 and 120 having a plurality of through-holes 111 and 121 formed on the upper surface thereof, and then uses the same to accurately and quickly and easily surface the surface of a large number of products 300. It is intended to be inspected.

That is, Figure 1 illustrates the configuration of the inspection apparatus used in the surface inspection step of the product according to the present invention, a plurality of through holes 111, 121 on the upper surface of a pair formed in a grid shape while maintaining a constant interval Plate 110 (120) is formed, wherein the size of the through-holes 111 and 121 is composed of a size and shape to which the product 300 can be fitted, the of the through-holes 111 and 121 When the product 300 is fitted into the through holes 111 and 121 as the stepped portions 111a and 121a on which the edge of the product 300 is seated are formed on the inner surface, the product 300 penetrates. The upper surface of the product 300 and the surface of the plate 110, 120 is the same position or the upper surface of the plate 110, 120 of the product 300 without being inserted too deep into the ball (111) 121 The surface can be positioned low.

Here, when the through holes 111 and 121 formed in the plate members 110 and 120 are formed by penetrating the upper and lower surfaces of the plate members 110 and 120, they are formed in the through holes 111 and 121. When the surface of the installed product 300 is inspected by the naked eye or the microscope 400, the surface of the product 300 can be inspected more accurately when there is no surface visible through the product 300. Even if the bottom surface of the through-holes 111 and 121 are configured to be clogged so that the bottom surface is maintained at a constant interval not close to the product 300, the inspection of the product 300 is not greatly disturbed.

In addition, the shape of the through-holes 111 and 121 may be formed differently according to the shape of the infrared cut-off filter to be manufactured, and when the shape of the infrared cut-off filter installed in the optical device is circular as shown in the illustrated drawings. The through-holes 111 and 121 are also formed in a circular shape, and in the case of a triangle or a quadrangle, the through-holes 111 and 121 are also formed in a triangle or a quadrangle. Through holes 111 and 121 may be formed to be.

Meanwhile, FIG. 2 illustrates a state in which a plurality of products are placed on the upper surface of the plate according to the present invention and each product is fitted into the through-holes of the plate, respectively, and the operator has a plurality of products on the upper surface of the plate 110. When the plate member 110 is tilted and shaked slightly in the state of placing the product 300, the product 300 is inserted into each through hole 111 formed in the plate member 110, and the upper surface of the inner surface of the through hole 111 is formed. The product 300 is fixed to the stepped portion 111a formed in the seat.

After the product 300 is fitted into the through hole 111 of the plate 110 as described above, the surface of the product 300 is visually inspected on one surface of the product 300 as illustrated in FIG. 3. If there is a foreign matter or dust, etc., one surface of the product 300 may be cleaned again by applying the cleaning step of the product as in the previous step. In this case, when the product 300 requires high precision It will be inspected using a microscope (400) of 40 magnification.

In this way, if one surface of the product 300 inserted and installed in the plate 110 is inspected by the naked eye or the microscope 400 and there is no abnormality, the opposite surface of the product 300 is also visually or microscope in the same manner as the one surface. (400).

Therefore, as illustrated in FIG. 4A, the other plate 120 is overlapped with the upper portion of the plate 110 installed by inserting the product 300 having only one surface inspected therein. In this case, the through hole 121 and the plate of the other plate 120 are overlapped. The through-holes 111 of 110 are to be overlapped while exactly matching each other.

In this case, the through hole 111 of the plate 110 and the through hole 121 of the other plate 120 overlap with each other when the plate 110 and the other plate 120 overlap with each other. Since the display portions 113 and 123 are formed at one side of the surface of the plate 110 and the other plate 120 so as to prevent the change, the display portions 113 and 123 may be different from the plate 110 by using the display portions 113 and 123. The plate 120 is to be matched in the correct direction so that they can be overlapped.

Meanwhile, FIG. 4B illustrates a state in which only one surface of the product is inserted into a through hole of the plate, and another plate overlaps with the upper portion of the plate. As shown in FIG. 120 so that the through-holes 111 of the plate 110 and the through-holes 121 of the other plate 120 coincide with each other, and then rotate the two overlapping plate 110 and 120 by 180 degrees. When each product 300 is located in the through hole 111 of the plate 110 is moved to the through hole 121 of the other plate 120, the two plate 110 and 120 together as described above After rotating and removing the plate 110 overlapping the upper surface of the other plate 120 as illustrated in FIG. 4C, the through hole 111 of the plate 110 is inserted into the through hole 121 of the other plate 120. Since the products 300 moved from each other are fitted into the installation, the inspection work on the surface of the product 300 is not The opposite surface can be exposed to the outside.

Therefore, the surface opposite to the product 300 is inspected by the naked eye or the microscope 400 in such a state. In this case, if the foreign material or dust is on the opposite surface of the product 300, the previous step is the product. Apply the cleaning step to clean again.

On the other hand, when overlapping the plate 110 and the other plate 120 as described above when rotated 180 degrees may overlap the plate 110 and the other plate 120 and the flow, in which case through holes of the plate 110 Since the product 300 located at 111 may not be accurately moved to the through hole 121 of the other plate 120, the plate 110 and the other plate 120 may be used as a means for preventing the flow. By forming the holes 112 and 122 at one side and the other edge, when the upper surface of the other plate 120 overlaps the upper surface of the plate 110, the hole 112 of the plate 110 and the hole of the other plate 120 Also, as the coincidence is inserted, the plate 110 and the other plate 120 are rotated together by inserting the fixing pin 200 through the matched holes 112 and 122 and then overlapping the plate 110 together. ) And the other plate 120 will be prevented from flowing during the rotation.

As described above, the preferred embodiment of the present invention has been described, but the present invention can use various changes, modifications, and equivalents, and it is clear that the above embodiments can be appropriately modified and applied in the same manner. Therefore, the above description does not limit the scope of the present invention defined by the limitations of the following utility model registration claims.

As described above, the present invention provides a pair of through-holes into which an infrared cut-off filter can be inserted in a surface inspection step of a product for inspecting both surfaces of the infrared cut-off filter in manufacturing an infrared cut-off filter for use in a small optical device. By using a sheet of material, a large number of infrared cut filters can be inspected accurately, quickly and easily at the same time, thereby improving workability and productivity.

1 is a perspective view illustrating an inspection device according to the present invention.

Figure 2 is a perspective view of the main portion illustrating a state in which the infrared cut filter is installed on the plate of the inspection device according to the present invention.

Figure 3 is a sectional view of the main portion illustrating a state in which the infrared cut filter is installed on the plate of the inspection device according to the present invention.

Figure 4a is a cross-sectional view illustrating a state in which another plate overlaps the upper surface of the plate of the inspection apparatus according to the present invention.

4B is a cross-sectional view illustrating a state in which another plate material is superposed on the plate upper surface of the inspection apparatus according to the present invention.

Figure 4c is a cross-sectional view illustrating a state in which the plate placed on the upper side after the plate and the other plate overlapped according to Figure 4b is rotated 180 degrees.

Explanation of symbols for the main parts of the drawings

110,120 plate 111,121 through hole

111a, 121a: stepped portions 112, 122: holes

200: fixing pin 300: product

Claims (4)

In constructing the inspection device of the infrared cut filter for small optics made of circular, triangular, square, hexagonal or other polygonal shape, It has a shape that matches the shape of the product 300 is made of the infrared cut filter, the upper side of the through hole 111, 121 with the stepped portion (111a) 121a is provided with a pair of plate material 110 ( 120) A device for inspecting an infrared cut filter used in a small optical device, characterized in that formed on the upper surface in the form of a plurality of grids to inspect both surfaces of the product (300). The method of claim 1, The product 300 is fitted into the through-holes 111 and 121 of the plate 110, 120, the product is fitted into the through-holes 111 and 121 through the stepped portion (111a) (121a) that the edge is caught. Compact optical, characterized in that the surface of the 300 is the same as the upper surface of the plate 110, 120 or the surface of the product 300 is configured to be located lower than the upper surface of the plate 110, 120 Inspection device for infrared cut filter used in equipment. The method of claim 1, Miniature optics characterized in that the display portion 113, 123 is formed to indicate the direction of overlapping the upper surface of the plate 110, 120 so that the pair of plate (110, 120) exactly overlap Inspection device for infrared cut filter used in equipment. The method of claim 1, The through holes 112 and 122 are formed on one side and the other edge of the pair of plate members 110 and 120 that face each other, and the pair of plate members 110 and 120 overlap each other to coincide with each other. (112) (122) the inspection device of the infrared cut filter used in the small optical device, characterized in that the fixing pin 200 is fitted.